Surface profile acquisition method and device

Abstract

The invention relates to the field of surface profile acquisition, in particular to a surface profile acquisition method and equipment. The device comprises a first wheel set, a second wheel set, a deviation detection device, a distance detection device and a controller. The first wheel set and the second wheel set are used for making contact with a detected surface, the deviation detection device is used for detecting first deviation information of the first wheel set and detecting second deviation information of the second wheel set, and the distance detection device is used for detecting the moving distance of the surface profile collection equipment. The controller is used for determining first height change information of the detected surface according to the first deviation information, the first acquisition interval and the moving distance, and determining second height change information according to the second deviation information, the second acquisition interval and the moving distance; and fusing the first height change information and the second height change information to obtain a surface profile acquisition result, thereby conveniently obtaining higher-precision flatness information and levelness information of the whole detected surface.

Description

Technical Field

[0001] The present application relates to the field of surface profile acquisition, and in particular to a surface profile acquisition method and device. Background Art

[0002] The flatness of a plane or facade is an important indicator for evaluating the quality of a building. In the construction field, the flatness of a plane or facade not only has an important impact on the installation of the floor, but also affects the service life of the building. It also plays an important role in other fields, including warehousing, road transportation, rail transportation, and aerospace.

[0003] When testing the flatness of a plane or a vertical surface, a ruler method is usually used to obtain the flatness data of the tested surface (plane or vertical surface). By placing a ruler close to the tested surface, inserting a wedge-shaped feeler gauge into the gap, and reading the ground flatness related data according to the insertion degree of the wedge-shaped feeler gauge, the detection efficiency is low, it is easily disturbed by the reading of personnel, the accuracy is not high, and it is not conducive to obtaining the continuous flatness related data of the tested surface. Summary of the invention

[0004] In view of this, an embodiment of the present application provides a surface profile acquisition device and method to solve the problems in the prior art of flatness measurement, such as low detection efficiency, susceptibility to interference from human readings, low accuracy, and difficulty in obtaining continuous flatness related data.

[0005] A first aspect of an embodiment of the present application provides a surface profile acquisition device, the surface profile acquisition device comprising a first wheel group, a second wheel group, a first deviation detection device, a second deviation detection device, a distance detection device and a controller;

[0006] The first wheel set and the second wheel set are used to contact the detected surface respectively, the first deviation detection device is used to detect the first deviation information of the first wheel set, and the second deviation detection device is used to detect the second deviation information of the second wheel set;

[0007] The distance detection device is used to detect the moving distance of the surface profile acquisition device;

[0008] The controller is used to determine a first surface contour curve of the detected surface according to the first deviation information of the first wheel group, determine a second surface contour curve of the detected surface according to the second deviation information of the second wheel group, and fuse the first surface contour curve and the second surface contour curve to obtain a surface contour acquisition result, wherein the intervals between surface contour acquisition points of the first surface contour curve and the second surface contour curve are different.

[0009] In combination with the first aspect, in a first possible implementation of the first aspect, the first wheel group includes a first wheel and a second wheel for contacting the detected surface, the first wheel group is connected by a first connecting rod, the second wheel group includes a third wheel and a fourth wheel for contacting the detected surface, the second wheel group is connected by a second connecting rod, the interval of the surface contour collection points of the first surface contour curve is a first collection interval between the first wheel and the second wheel, the interval of the surface contour collection points of the second surface contour curve is a second collection interval between the third wheel and the fourth wheel, and the first collection interval is greater than the second collection interval.

[0010] In combination with the first aspect, in a second possible implementation of the first aspect, the first wheel group includes a first wheel and a second wheel for contacting the detected surface, the first wheel and the second wheel are connected by a first connecting rod, the second wheel group includes a second wheel and a third wheel for contacting the detected surface, the second wheel and the third wheel are connected by a second connecting rod, the interval of the surface contour collection points of the first surface contour curve is the first collection interval between the first wheel and the second wheel, the interval of the surface contour collection points of the second surface contour curve is the third collection interval between the second wheel and the third wheel, and the first collection interval is greater than the third collection interval.

[0011] In combination with the first aspect, in a third possible implementation of the first aspect, the first wheel group includes a first wheel and a second wheel, the second wheel group includes a second wheel, the second deviation detection device includes a distance sensor, the first wheel and the second wheel are connected by a first connecting rod, the interval of the surface contour collection points of the first surface contour curve is the first collection interval between the first wheel and the second wheel, the interval of the surface contour collection points of the second surface contour curve is the fourth collection interval between the second wheel and the distance sensor, and the first collection interval is greater than the fourth collection interval.

[0012] In combination with the third possible implementation manner of the first aspect, in a fourth possible implementation manner of the first aspect, the distance sensor is disposed on the first connecting rod;

[0013] Alternatively, the second wheel group includes a second wheel and a third wheel, the second wheel and the third wheel are connected by a second connecting rod, the second connecting rod is equipped with a second deviation detection device, the second deviation detection device includes an angle sensor and a distance sensor, the distance sensor is used to detect the distance between the distance sensor and the ground, and the angle sensor is used to detect the inclination angle of the second connecting rod.

[0014] In combination with the first aspect or the first possible implementation of the first aspect, in a fifth possible implementation of the first aspect, the surface contour acquisition device also includes a marking device, the controller is used to determine the raised position and / or recessed position that meets the preset requirements based on the determined surface contour acquisition result, and the marking device is used to mark the raised position and the recessed position.

[0015] In combination with the fifth possible implementation manner of the first aspect, in a sixth possible implementation manner of the first aspect, the surface contour acquisition equipment also includes a ground anomaly detection device, and the controller is used to control the ground anomaly detection device to perform anomaly detection on the raised position and / or the sunken position after detecting the raised position and / or the sunken position.

[0016] In combination with the first aspect, in a seventh possible implementation of the first aspect, the surface contour acquisition device also includes a mapping device, and the controller is used to obtain scene information of the detected surface through the mapping device, generate a scene map according to the scene information, and generate a contour map according to the surface contour acquisition result and the scene map.

[0017] A second aspect of the embodiments of the present application provides a surface profile acquisition method, the surface profile acquisition method being based on the surface profile acquisition device according to any one of the first aspects, the method comprising:

[0018] Acquire first deviation information of the first wheel set by the deviation detection device, and acquire second deviation information of the second wheel set;

[0019] Determine a first relative height at a position corresponding to the first collection interval of the first wheel group according to the first collection interval of the first wheel group and the first deviation information, and determine a second relative height at a position corresponding to the second collection interval of the second wheel group according to the second collection interval of the second wheel group and the second deviation information;

[0020] Obtaining a first surface profile curve according to the moving distance determined by the distance detection device and the first relative height, and obtaining a second surface profile curve according to the moving distance and the second relative height;

[0021] The first surface profile curve and the second surface profile curve are fused to obtain a surface profile acquisition result.

[0022] In combination with the second aspect, in a first possible implementation manner of the second aspect, obtaining a first surface profile curve according to the moving distance determined by the distance detection device and the first relative height includes:

[0023] Determine, according to the first relative heights of the i-th position and the i+1-th position collected by the first wheel group and in combination with the first collection interval, an i-th line segment between the i-th position and the i+1-th position;

[0024] According to the moving distance, when the first wheel group of the surface profile acquisition device acquires the i+1th position and the i+2th position, the first relative height is updated, and the i+1th line segment between the i+1th position and the i+2th position is determined according to the first relative height, and the first surface profile curve is obtained by connecting multiple line segments determined by multiple movements;

[0025] Obtaining a second surface profile curve according to the moving distance, the second collection interval and the second relative height, including:

[0026] Determine a jth line segment between the jth position and the j+1th position according to the second relative heights of the jth position and the j+1th position collected by the second wheel group and in combination with the second collection interval;

[0027] According to the moving distance, it is determined that when the third wheel group of the surface contour acquisition device moves to collect the j+1th position and the j+2th position, the second relative height is updated, and the j+1th line segment between the j+1th position and the j+2th position is determined according to the second relative height, and the second surface contour curve is obtained by connecting multiple line segments determined by multiple movements, wherein i and j are natural numbers.

[0028] A third aspect of the embodiments of the present application provides a surface profile acquisition device, the surface profile acquisition device being based on the surface profile acquisition device according to any one of the first aspects, the device comprising:

[0029] an information acquisition unit, configured to acquire first deviation information of the first wheel set through the deviation detection device, and to acquire second deviation information of the second wheel set;

[0030] a relative height determination unit, configured to determine a first relative height at a position corresponding to the first collection interval of the first wheel group according to the first collection interval of the first wheel group and the first deviation information, and to determine a second relative height at a position corresponding to the second collection interval of the second wheel group according to the second collection interval of the second wheel group and the second deviation information;

[0031] a curve determining unit, configured to obtain a first surface profile curve according to the moving distance determined by the distance detecting device and the first relative height, and to obtain a second surface profile curve according to the moving distance and the second relative height;

[0032] The fusion unit is used to fuse the first surface contour curve and the second surface contour curve to obtain a surface contour acquisition result.

[0033] The fourth aspect of an embodiment of the present application provides a detection device, comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor implements the steps of any method described in the second aspect when executing the computer program.

[0034] A fifth aspect of an embodiment of the present application provides a computer-readable storage medium, wherein the computer-readable storage medium stores a computer program, and when the computer program is executed by a processor, the steps of the method described in any one of the first aspects are implemented.

[0035] Compared with the prior art, the embodiments of the present application have the following beneficial effects: the embodiments of the present application respectively contact the inspected surface through the first wheel group and the second wheel group, obtain the deviation information of the first wheel group and the second wheel group during the movement through the deviation detection device, detect the moving distance of the first wheel group and the second wheel group during the movement through the distance detection device, determine the first height change information with a longer single detection distance during the movement according to the first deviation information and the moving distance, and compared with the detection method with more times, since the height change information can be detected with fewer times, its accuracy is higher, and the second height information with a shorter single detection distance during the movement is determined according to the second deviation information, the second acquisition interval and the moving distance, and since the first height change information fails to detect the local height change, the local height change information detected by the second height information is more accurate, and by fusing the first height information and the second height information, the flatness information and levelness information of the entire inspected surface with higher accuracy can be efficiently obtained. BRIEF DESCRIPTION OF THE DRAWINGS

[0036] In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative labor.

[0037] Figure 1 is a schematic diagram of a surface profile acquisition device provided in an embodiment of the present application;

[0038] Figure 2 is a schematic diagram of another surface profile acquisition device provided in an embodiment of the present application;

[0039] Figure 3 is a schematic diagram of another surface profile acquisition device provided in an embodiment of the present application;

[0040] Figure 4 is a schematic diagram of another surface profile acquisition device provided in an embodiment of the present application;

[0041] Figure 5 is a schematic diagram of another surface profile acquisition device provided in an embodiment of the present application;

[0042] Figure 6 is a schematic diagram of another surface profile acquisition device provided in an embodiment of the present application;

[0043] Figure 7 A schematic diagram of surface contour curve fusion provided in an embodiment of the present application;

[0044] Figure 8 It is a schematic diagram of the implementation process of a surface profile acquisition method provided in an embodiment of the present application;

[0045] Fig. 9 is a schematic diagram of a surface profile acquisition device provided in an embodiment of the present application;

[0046] Fig.10 It is a schematic diagram of a detection device provided in an embodiment of the present application. DETAILED DESCRIPTION

[0047] In the following description, specific details such as specific system structures, technologies, etc. are provided for the purpose of illustration rather than limitation, so as to provide a thorough understanding of the embodiments of the present application. However, it should be clear to those skilled in the art that the present application may also be implemented in other embodiments without these specific details. In other cases, detailed descriptions of well-known systems, devices, circuits, and methods are omitted to prevent unnecessary details from obstructing the description of the present application.

[0048] In order to illustrate the technical solution described in this application, a specific embodiment is provided below for illustration.

[0049] The flatness of a plane or facade is an important indicator for evaluating building quality and has important application value in the field of construction. For example:

[0050] In the field of precision manufacturing, excellent ground flatness can effectively reduce equipment tilt or shaking, improve the accuracy of detection data, enhance the stability of equipment operation, reduce equipment wear, improve production efficiency and improve product quality.

[0051] In the field of smart warehousing, ground flatness can effectively reduce the difficulty of robot or forklift operation and improve the production efficiency and reliability of smart warehousing.

[0052] In the field of transportation, excellent ground flatness can improve the driving quality index, enhance driving safety and driving ability, increase the service life of the road surface, and reduce noise and vibration during vehicle driving.

[0053] In the field of ground rail transit, excellent ground flatness can increase the stability of the track structure, reduce wheel-rail wear, reduce resistance and vibration, reduce maintenance costs, and make rail transit riding more comfortable.

[0054] Since surface profile acquisition is very important, it is necessary to accurately and reliably acquire the surface profile of the plane or vertical surface to be inspected. The traditional detection method usually uses a ruler for detection. The ruler is placed close to the surface to be inspected, and a wedge-shaped feeler gauge is inserted into the gap. The ground flatness related data is read by the insertion degree of the wedge-shaped feeler gauge. The operation efficiency is low, it is easily disturbed by the reading of personnel, the accuracy is not high, and it is not conducive to obtaining the continuous flatness related data of the surface to be inspected.

[0055] In order to improve the surface profile acquisition accuracy and detection convenience, the present application embodiment proposes a surface profile acquisition device, such as Figure 1 As shown, the device includes a first wheel group 101, a second wheel group 102, a deviation detection device 103 including a first deviation detection device 1031, a second deviation detection device 1032, a distance detection device 104 and a controller 105;

[0056] The first wheel set 101 and the second wheel set 102 are used to contact the detected surface respectively, the first deviation detection device is used to detect the first deviation information of the first wheel set 101, and the second deviation detection device is used to detect the second deviation information of the second wheel set 102;

[0057] The distance detection device 104 is used to detect the moving distance of the surface profile acquisition device;

[0058] The controller 105 is used to determine a first surface contour curve of the inspected surface according to the first deviation information of the first wheel set 101, determine a second surface contour curve of the inspected surface according to the second deviation information of the second wheel set 102, and fuse the first surface contour curve and the second surface contour curve to obtain a surface contour acquisition result, wherein the intervals between the surface contour acquisition points of the first surface contour curve and the second surface contour curve are different.

[0059] In a specific implementation, Figure 1 As shown, the first wheel set 101 includes a first wheel 1011 and a second wheel 1012 for contacting the detected surface, and the second wheel set 102 includes a third wheel 1021 and a fourth wheel 1022 for contacting the detected surface.

[0060] The interval between the first round 1011 and the second round 1012 is the first acquisition interval, that is, when collecting ground contour information, the height information is collected according to the first acquisition interval between the first round 1011 and the second round 1012. The interval between the third round 1021 and the fourth round 1022 is the second acquisition interval, that is, when collecting ground contour information, the height information is collected according to the second acquisition interval between the third round 1021 and the fourth round 1022. The first acquisition interval is greater than the second acquisition interval, so that the surface contour acquisition device can collect surface contour curves with different precision characteristics, including surface contour curves with high single-point positioning accuracy at a long distance and surface contour curves with high local positioning accuracy, so as to facilitate fusion to obtain a surface contour curve with higher overall accuracy.

[0061] The first wheel set 101 and the second wheel set 102 are used to contact the detected surface respectively. Figure 1 As shown, the first wheel group 101 and the second wheel group 102 can be two sets of wheel groups with independent structures on the surface profile acquisition device. The first wheel 1011 in the first wheel group 101 is connected to the second wheel 1012 through a first connecting rod, and the third wheel 1021 and the fourth wheel 1022 in the second wheel group 102 are connected through a second connecting rod. The movement between the first connecting rod and the second connecting rod is relatively independent, that is, the first connecting rod has a tilt deviation according to the height information of the first wheel 1011 and the second wheel 1012, and the second connecting rod has a tilt deviation according to the height information of the third wheel 1021 and the fourth wheel 1022. The first wheel group 101 can be used to support the surface profile acquisition device body, and the second wheel group 102 can be connected to the surface profile acquisition device body by a movable connection, or connected to the first wheel group 101, so that the distance between the second wheel group and the first wheel group is a constant distance, and the height change information at the constant distance can be collected through the second wheel group 102.

[0062] After the first wheel 1011 and the second wheel 1012 are connected by the first connecting rod, the height of the first wheel 1011 and the second wheel 1012 is different (when the detected surface is the ground or the ceiling, it is presented as a change in height, when the detected surface is a wall, it is presented as a displacement relative to the vertical plane, and this application uses ground detection as an example for illustration), which will cause the inclination angle of the first connecting rod connecting the first wheel 1011 and the second wheel 1012 to change, and the first deviation information of the first connecting rod can be detected by the first deviation detection device in the deviation detection device 103. Similarly, after the third wheel 1021 and the fourth wheel 1022 are connected by the second connecting rod, the third wheel 1021 and the fourth wheel 1022 can detect the second deviation information of the second connecting rod through the second deviation detection device in the deviation detection device 103.

[0063] The first deviation detection device and the second deviation detection device may be angle sensors. Figure 1As shown, both the first deviation detection device and the second deviation detection device are angle sensors, and the angle sensor can be used to detect the angle θ between the first connecting rod or the second connecting rod and the horizontal plane, that is, the first deviation information. Assuming that the first wheel 1011 is used as a reference, when the position of the second wheel 1012 is higher than that of the first wheel 1011, the first connecting rod is in a state of tilting to the left, and the angle between the first connecting rod and the horizontal plane can be detected by the angle sensor as the first deviation information. The positive and negative of the first deviation information can be determined by the height of the second wheel 1012 relative to the first wheel 1011. For example, when the second wheel 1012 is higher than the first wheel 1011, that is, the first connecting rod is tilted to the left, the first deviation information is a positive angle; when the second wheel 1012 is lower than the first wheel 1011, that is, the first connecting rod is tilted to the right, the first deviation information is a negative angle.

[0064] The same deviation information detection method can also be applied to the second wheel set 102, that is, the second deviation detection device can be used to detect the height of the fourth wheel 1021 relative to the third wheel 1011 to determine the positive or negative angle of the second deviation information. For example, when the fourth wheel 1022 is higher than the third wheel 1021, that is, the second connecting rod is tilted to the left, the second deviation information is a positive angle; when the fourth wheel 1022 is lower than the third wheel 1021, that is, the second connecting rod is tilted to the right, the second deviation information is a negative angle.

[0065] It is understandable that the deviation detection devices used in the first wheel group 101 and the second wheel group 102 in the embodiment of the present application are not limited in number, and the first wheel group or the second wheel group can use more than two deviation detection devices at the same time. The order of the first wheel 1011, the second wheel 1012, the third wheel 1021 and the fourth wheel 1022 can be the first wheel 1011, the second wheel 1012, the third wheel 1021 and the fourth wheel 1022, or the first wheel 1011, the third wheel 1021, the second wheel 1012 and the fourth wheel 1022. After determining the order of the wheels, it is necessary to determine the first collection interval of the first wheel group 101, the second collection interval of the second wheel group 102, and the distance between the wheels in the first wheel group 101 and the wheels in the second wheel group 102, so as to determine the position of the wheels in the second wheel group 102 relative to the wheels in the first wheel group 101. The wheels in the second wheel group 102 can be moved to the position where the first wheel group 101 has collected deviation information, or moved to a position near the position where the wheels in the first wheel group 101 have collected deviation information.

[0066] In possible implementations, such as Figure 2As shown, the first wheel group 101 includes a first wheel 1011 and a second wheel 1012 for contacting the detected surface, and the first wheel group 101 is connected by a first connecting rod, and the second wheel group 102 includes a second wheel 1012 and a third wheel 1021 for contacting the detected surface, and the second wheel 1012 and the third wheel 1021 are connected by a second connecting rod. The interval of the surface contour collection points of the first surface contour curve is the first collection interval between the first wheel 1011 and the second wheel 1012, and the interval of the surface contour collection points of the second surface contour curve is the third collection interval between the second wheel 1012 and the third wheel 1021, and the first collection interval is greater than the third collection interval.

[0067] When detecting the height relationship between the first wheel 1011 and the second wheel 1012 in the first wheel group 101, the tilt deviation of the first connecting rod can be detected by setting an angle sensor on the first connecting rod, that is, a first deviation detection device. When detecting the height relationship between the second wheel 1012 and the third wheel 1021, the tilt deviation of the second connecting rod can be detected by setting an angle sensor on the second connecting rod, that is, a second deviation detection device. After the deviation angle (the first deviation angle and the second deviation angle, respectively) is detected by the deviation detection device (including the first deviation detection device and the second deviation detection device), the relative height of the first wheel group 101 can be calculated according to the first collection interval and the first deviation angle. For example, if the first collection interval is L1 and the first deviation angle is θ1, the relative height of the first wheel group 101 is: L1*θ1. Correspondingly, if the second collection interval is L2 and the second deviation angle is θ2, the relative height of the second wheel group 102 is: L2*θ2. Among them, the line segment determined by the front wheel in the wheel group (the first wheel group and the second wheel group) relative to the rear wheel and the angle relative to the horizontal plane where the rear wheel is located can be determined according to the moving direction. If the line segment is facing upward, the angle is positive, and if the line segment is facing downward, the angle is negative. The relative height of the front wheel relative to the rear wheel can be calculated.

[0068] The first wheel set 101 can be used to support the body of the surface profile acquisition device.

[0069] The second connecting rod can rotate around the axis of the second wheel 1012. Different rotation angles are presented according to the height and other contour information of the third wheel 1021 and the detected surface. The third wheel 1021 can be located between the first wheel and the second wheel, or outside the range between the first wheel and the second wheel.

[0070] In a possible implementation, the relative height information of the third wheel 1021 may be detected by a distance sensor. Figure 3As shown, a distance sensor 1031 may be provided on the first connecting rod at a position corresponding to the third wheel 1021, for detecting the distance between the detection plane of the third wheel 1021 and the distance sensor 1031. When the third wheel 1021 is located between the first wheel 1011 and the second wheel 1012, the distance sensor 1031 is provided on the first connecting rod and is located between the first wheel 1011 and the second wheel 1012. When the third wheel 1021 is located outside the range between the first wheel 1011 and the second wheel 1012, the first connecting rod may be extended to the position corresponding to the third wheel 1021, and the distance sensor 1031 is provided at the corresponding position. The distance between the distance sensor 1031 and the second wheel 1012, or the distance between the distance sensor 1031 and the first wheel 1011 is the fourth acquisition interval.

[0071] By setting the distance sensor 1031 on the first connecting rod, or setting the distance sensor 1031 on the extension rod of the first connecting rod, since the deviation of the first connecting rod can be detected by the first deviation detection device, such as the angle deviation of the first connecting rod through the angle sensor 1031, the relative height H1 of the distance sensor 1031 relative to the second wheel 1012 or the first wheel 1011 can be calculated according to the angle deviation and the distance between the distance sensor 1031 and the second wheel 1012 or the first wheel 1011, wherein when the third wheel 1021 is higher than the second wheel 1012 or the first wheel 1011, the relative height is a positive value, otherwise it is a negative value.

[0072] When the distance detected by the distance sensor 1031 is H2 (a positive value), the height of the third wheel relative to the second wheel or the first wheel can be calculated as H3+H1-H2 in combination with the pre-calibrated standard distance H3 (a positive value). The standard distance refers to the distance detected by the distance sensor 1031 when the third wheel 1021, the second wheel 1012 and the first wheel 1011 are in the same horizontal plane.

[0073] In a possible implementation, the distance sensor 1031 can directly detect the distance between the ground and the distance sensor. Figure 4 As shown, at the location where the distance sensor 1031 is set, the distance sensor 1031 can directly detect the distance between the ground and the distance sensor 1031. At this time, the surface profile acquisition device only includes two supporting wheels (the first wheel 1011 and the second wheel 1012). Since the distance sensor 1031 is set on the first connecting rod, or on the extension line of the first connecting rod, the deviation angle between the first connecting rod and the horizontal plane can be detected by the first deviation detection device to determine the change of the distance sensor 1031 relative to the standard position, and the relative height of the corresponding position of the distance sensor 1031 relative to the second wheel 1012 or the first wheel 1011 can be obtained in combination with the collected distance.

[0074] In possible implementations, such as Figure 5 As shown, the first wheel group 101 includes a first wheel 1011 and a second wheel 1012, which are used to support the surface profile acquisition device body, and the surface profile acquisition device body can be regarded as a first connecting rod. The second wheel group 102 includes a third wheel 1021 and a fourth wheel 1022, the third wheel 1021 is connected to the second wheel 1012 through a second connecting rod, and the fourth wheel 1022 is connected to the second wheel 1012 through a third connecting rod. The second connecting rod and the third connecting rod can both rotate around the second wheel 1012, and the wheels of each wheel group will be affected by gravity or elastic force and contact the detected surface. The distance sensor 1031 is set on the second connecting rod, or on the extension line of the second connecting rod, corresponding to the position of the fourth wheel 1022, and is used to detect the height of the fourth wheel 1022 relative to the third wheel 1021. An angle sensor 1032 may be provided on the second connecting rod to detect the change in the angle of the second connecting rod relative to the horizontal plane, and the height of the distance sensor 1031 relative to the second wheel 1012 is determined in combination with the distance between the second wheel 1021 on the second connecting rod and the distance sensor 1031. The height of the fourth wheel relative to the second wheel is obtained in combination with the distance detected by the distance sensor and the standard distance detected by the distance sensor. A line segment determined by the two positions of the second wheel 1012 to the fourth wheel 1022 is determined in combination with the fourth acquisition interval of the fourth wheel 1022 relative to the second wheel 1012, that is, the fourth acquisition interval of the distance sensor 1031 relative to the second wheel 1012, and a second surface contour curve is generated through multiple line segments.

[0075] It is understandable that the distance sensor can directly detect the distance between the ground and the distance sensor. Figure 6 As shown, the third wheel 1021 is connected to the second wheel 1012 through the second connecting rod, and the distance sensor 1031 is arranged on the second connecting rod. The angle deviation between the second connecting rod and the horizontal plane is detected by the angle sensor 1032, and the deviation of the distance sensor 1031 relative to the standard position can be determined in combination with the distance detected by the distance sensor and the standard distance detected by the distance sensor, and the height of the detected point at the corresponding position of the distance sensor relative to the second wheel 1012 can be obtained.

[0076] In a possible implementation, of the two wheel groups included in the surface profile acquisition device, the first acquisition interval of the first wheel group can be an integer multiple of the third acquisition interval or the fourth acquisition interval, so that during the movement of the surface profile acquisition device, the relative height acquisition point of the second wheel group and the relative position acquisition point of the first wheel group can overlap as much as possible. Figure 1In the structure shown, the interval between the second wheel 1012 and the third wheel 1021 can be the same as the second collection interval, and the first collection interval is an integer multiple of the second collection interval, so that when the surface profile collection device is moving, the relative height collection point of the second wheel group and the relative position collection point of the first wheel group can overlap as much as possible.

[0077] In a possible implementation, the first collection interval may also be a non-integer of the second collection interval. In this case, the collection points of the second wheel group may not overlap with the collection points of the first wheel group. In this case, the height of the second wheel group determined by interpolation at the collection point of the first wheel group can be determined by interpolating the relative heights collected by the second wheel group. For example Figure 1 In the surface profile acquisition device shown, the first wheel 1011 in the first wheel group 101 is located at point A, the second wheel 1012 is located at point B, the third wheel 1021 is located at point C, and the fourth wheel 1022 is located at point D. The height d1 of point A relative to the reference point B is obtained through the first acquisition interval and the first deviation information, and the height d2 of point C relative to point D is obtained through the second acquisition interval and the second deviation information. When the surface profile acquisition device moves the first distance (the distance between the third wheel and the second wheel), the third wheel 1021 moves to point B. Since the first distance is the same as the second acquisition interval, the fourth wheel 1022 moves to point C at this time. The height information d3 of point B relative to point C can be obtained through the second acquisition interval and the second deviation information. The device moves N (N is a multiple of the first acquisition interval relative to the second acquisition interval) first distances again, and the heights of N third wheels 1021 relative to the fourth wheels 1022 are acquired. The straight lines determined by the N relative heights can be connected to obtain a part of the second surface profile curve.

[0078] At this time, the first wheel group can determine the height d1 of point A relative to point B through one relative height calculation, and obtain the height d1' of point A relative to point B through N calculations. Since the first wheel group can determine the height of point A relative to point B through one calculation, the accumulated attenuation is less. Therefore, the accuracy of the height of point B relative to point A determined by the first wheel group is higher than the accuracy of the height of point B relative to point A determined by the second wheel group. However, in the first surface contour curve determined by the first wheel group, in the area between the collection points, the change of the surface contour can only be determined by linear interpolation, and the contour accuracy between the collection points needs to be further improved. Between the collection points of the first wheel group, the second wheel group includes multiple collection points, such as N collection points (N is a natural number greater than 0). Therefore, between the collection points of the first wheel group, the surface contour curve determined by the second wheel group has a higher accuracy. The advantages of the first surface contour curve and the second surface contour curve can be merged by fusion, and a more accurate surface contour acquisition result after fusion is obtained.

[0079] For example, the first acquisition interval may be 60 cm, and the second acquisition interval may be 10 cm, but the present invention is not limited thereto. The smaller the second acquisition interval, the higher the accuracy of the local flatness detected. Therefore, the first height change line segment determined by the first acquisition interval is used to reflect the height change information of two positions in the 60 cm interval length, and the first height change sub-line segment determined by the second acquisition interval is used to reflect the height change information of two positions in the 10 cm interval length.

[0080] Combination Figure 1 The surface profile acquisition device shown in the figure, after acquiring the relative height in the initial state, moves the surface profile acquisition device so that the fourth wheel 1022 moves to the B position. At this time, the third wheel 1021 moves to the position 10 cm before the B position, and the first height change sub-line segment can be determined by the second deviation detection device in the deviation detection device. By continuously moving, N=6 height change sub-line segments located within the range of the first height change line segment can be obtained. For example, if the first acquisition interval from A to B is 60 cm, if the distance from C to D is 10 cm, 6 height change sub-line segments can be included in the range of the first height change line segment. Since the second deviation detection device uses iterative calculation, the accuracy of the height of point A relative to point B determined by 6 height change sub-line segments is lower than the accuracy determined by a single calculation, the height of point A relative to point B determined by the second deviation device can be corrected by only a single comparison, that is, the height of point A relative to point B determined by the first height change line segment. At the same time, only the first height change line segment determined by A and B cannot reflect more specific height change information between A and B. Multiple height change sub-line segments determined by multiple second deviation detection devices, such as Figure 7 The six height variation sub-segments shown describe the flatness information and levelness information of the detected surface more accurately.

[0081] In the same manner as the first height variation line segment, the surface profile acquisition device can be moved to obtain Figure 7 The first number of height-changing line segments shown can obtain a second number of height-changing sub-line segments during the movement through the second deviation detection device. For example, if the first acquisition interval is N times the second acquisition interval, the second number can be N times the first number.

[0082] If the first acquisition interval is not an integer multiple of the second acquisition interval, the height of the height change sub-segment including the first endpoint position in the second height change segment can be corrected according to the first endpoint position in the height change segment to complete the correction of the second height change segment. The first endpoint position is the endpoint of any one of the multiple height change segments acquired by the first deviation detection device.

[0083] A plurality of first deviation information can be determined by the first deviation detection device, and a plurality of height change line segments can be determined according to the first acquisition interval in combination with the plurality of first deviation information, and a first surface contour curve can be obtained according to the plurality of height change line segments.

[0084] A plurality of second deviation information can be determined by the second deviation detection device. A plurality of height change sub-line segments can be determined according to the second acquisition interval in combination with the plurality of second deviation information. A second surface contour curve can be obtained according to the plurality of height change sub-line segments.

[0085] When the first smoothness curve and the second smoothness curve are merged, the positions in the second smoothness curve that are the same as the endpoints of the line segments in the first smoothness curve can be corrected based on the fact that the height information of the endpoints of the line segments in the first smoothness curve is more accurate, or the heights of the height-changing sub-segments including the line segment endpoints can be corrected to improve the accuracy of the second smoothness curve determined by the height-changing sub-segments.

[0086] In a possible implementation, in order to make the wheels reliably contact the detected surface, an elastic mechanism may be set so that the wheels, including the first wheel and the second wheel, reliably contact the detected surface.

[0087] In a possible implementation, the surface profile acquisition device in the embodiment of the present application may further include a marking device. A marking threshold may be preset. After the detection result obtained by fusing the first flatness curve and the second flatness curve, the detection result may be compared with the marking threshold. The marking threshold may include a convex threshold and a concave threshold. If the height of the detected surface is lower than the concave threshold, it may be marked as a concave position by the marking device. If the height of the detected surface is higher than the convex threshold, it may be marked as a convex position by the marking device.

[0088] In order to improve the convenience of detection, the embodiment of the present application can also perform abnormal detection on the concave position and convex position after marking. The abnormal detection device can include equipment such as a hollow drum detection device to determine the specific cause of the abnormality, which is convenient for the staff to investigate the abnormality.

[0089] In a possible implementation, after determining the surface contour acquisition result of the inspected surface, the surface contour acquisition device in the implementation column of the present application can generate a scene map based on the surface contour acquisition result of the inspected surface in combination with the scene information acquired by the mapping device, and add flatness information and levelness information to the scene map to obtain a scene map of the inspected surface including flatness information and levelness information, such as a scene map including contour line information.

[0090] Figure 8A flow chart of a surface profile acquisition method provided in an embodiment of the present application, the method is based on the above-mentioned surface profile acquisition device, and the method includes:

[0091] In S801, first deviation information of the first wheel set is acquired through the deviation detection device, and second deviation information of the second wheel set is acquired.

[0092] The deviation detection device may include sensing devices such as angle sensors and distance sensors. The first wheel and the second wheel in the first wheel group are connected by a first connecting rod, and the second wheel and the third wheel in the second wheel group are connected by a second connecting rod. The deviation between the first connecting rod and the second connecting rod and the horizontal plane can be determined by an angle sensor or a distance sensor. The deviation can be expressed by an angle or by the distance of the second end relative to the horizontal plane determined by the first end of the first connecting rod or the second connecting rod based on the horizontal plane determined by the first end.

[0093] In S802, a first relative height at a position corresponding to the first collection interval of the first wheel group is determined according to the first collection interval of the first wheel group and the first deviation information, and a second relative height at a position corresponding to the second collection interval of the second wheel group is determined according to the second collection interval of the second wheel group and the second deviation information.

[0094] According to the first collection interval of the first wheel group and the first deviation information, the first relative height of the wheels in the first wheel group is determined, and according to the second collection interval of the second wheel group and the second deviation information, the second relative height of the wheels in the second wheel group is determined.

[0095] For example, when the first deviation information or the second deviation information is the angular deviation between the connecting rod (the first connecting rod or the second connecting rod) and the horizontal plane, the scheduling deviation in the first wheel group or the second wheel group, that is, the relative height, can be determined by the first collection interval and angle.

[0096] In S803, a first surface profile curve is obtained according to the moving distance determined by the distance detection device and the first relative height, and a second surface profile curve is obtained according to the moving distance and the second relative height.

[0097] By measuring the first deviation information of the first wheel group multiple times, multiple height change line segments can be obtained, and the first surface profile curve with high positioning accuracy of the endpoints of the height change line segments and low positioning accuracy between the endpoints can be obtained through the multiple height change line segments. By measuring the second deviation information of the second wheel group multiple times, multiple height change sub-line segments with high relative height detail accuracy between the endpoints of the height change line segments but with accumulated relative errors can be obtained, and the second flatness curve is determined through the multiple height change sub-line segments.

[0098] Wherein, obtaining the first surface profile curve according to the moving distance, the first collection interval and the first relative height determined by the distance detection device may include:

[0099] At the first moment T1, the first wheel of the first wheel group is at the i-th position, the second wheel is at the i+1-th position, the relative height of the two wheels in the first wheel group is h1, and the i-th height change line segment between the i-th position and the i+1-th position is determined according to the relative height h1 and the first collection interval d1 between the first wheel and the second wheel;

[0100] As the surface profile acquisition device moves, the first wheel of the surface profile acquisition device moves to the i+1th position, and at this time, the second wheel moves to the i+2th position. The relative height h2 between the i+1th position and the i+2th position can be determined according to the first deviation detection device, and the i+1th height change line segment between the i+1th position and the i+2th position can be determined according to the relative height h2 and the first acquisition interval. Multiple height change line segments are obtained by multiple movements, and the first surface profile curve can be obtained by connecting the multiple height change line segments determined by multiple movements.

[0101] According to the moving distance, the second collection interval and the second relative height, a second surface profile curve is obtained, including:

[0102] At a certain sampling time, it is determined that the third wheel of the second wheel group is at the jth position and the fourth wheel is at the j+1th position. The relative height h3 of the wheel at the j+1th position relative to the jth position can be detected by the second deviation detection device, and the jth height change sub-segment between the jth position and the j+1th position can be determined in combination with the second sampling interval between the third wheel and the fourth wheel.

[0103] Continue to move the surface contour acquisition device so that the third wheel of the surface contour acquisition device moves to the j+1th position. At this time, the fourth wheel moves to the j+2th position. The j+1th height change sub-segment between the j+1th position and the j+2th position is determined according to the second deviation detection device and the second acquisition interval. The second surface contour curve is obtained by connecting multiple height change sub-segments determined by multiple movements, where i and j are natural numbers.

[0104] In S804, the first surface profile curve and the second surface profile curve are fused to obtain a surface profile acquisition result.

[0105] Since the first smoothness curve has the characteristics of high positioning accuracy of the endpoints of the height change segment and low positioning accuracy between the endpoints, and the second smoothness curve has the characteristics of high relative height information accuracy between the endpoints of the height change segment but accumulated relative errors, the first smoothness curve and the second smoothness curve can be fused to obtain a more accurate fused curve.

[0106] The embodiment of the present application combines the advantages of relatively high positioning accuracy of the endpoints of the line segments in the second flatness curve and relatively high positioning accuracy between the endpoints of the height-changing line segments of the first flatness curve, and can obtain a surface profile acquisition result with higher accuracy after fusion. Moreover, the detection can be completed by pushing the surface profile acquisition device or automatically moving the surface profile acquisition device, which can effectively improve the detection efficiency and convenience of detection.

[0107] It should be understood that the size of the serial numbers of the steps in the above embodiments does not mean the order of execution. The execution order of each process should be determined by its function and internal logic, and should not constitute any limitation on the implementation process of the embodiments of the present application.

[0108] Fig. 9 A schematic diagram of a surface profile acquisition device provided in an embodiment of the present application. The surface profile acquisition device is based on the above-mentioned surface profile acquisition device, and the device includes:

[0109] An information acquisition unit 901 is used to acquire first deviation information of the first wheel group through the deviation detection device, and acquire second deviation information of the second wheel group;

[0110] a relative height determining unit 902, configured to determine a first relative height at a position corresponding to the first collection interval of the first wheel group according to the first collection interval of the first wheel group and the first deviation information, and to determine a second relative height at a position corresponding to the second collection interval of the second wheel group according to the second collection interval of the second wheel group and the second deviation information;

[0111] A curve determining unit 903, configured to obtain a first surface profile curve according to the moving distance determined by the distance detecting device and the first relative height, and to obtain a second surface profile curve according to the moving distance and the second relative height;

[0112] The fusion unit 904 is used to fuse the first surface contour curve and the second surface contour curve to obtain a surface contour acquisition result.

[0113] Fig. 9 The surface profile acquisition device shown is Figure 8 The surface profile acquisition method shown corresponds to .

[0114] Fig.10Schematic diagram of a detection device provided in an embodiment of the present application. Fig.10 As shown, the detection device 10 of this embodiment includes: a processor 100, a memory 101, and a computer program 102 stored in the memory 101 and executable on the processor 100, such as a surface profile acquisition program. When the processor 100 executes the computer program 102, the steps in the above-mentioned surface profile acquisition method embodiments are implemented. Alternatively, when the processor 100 executes the computer program 102, the functions of the modules / units in the above-mentioned device embodiments are implemented.

[0115] Exemplarily, the computer program 102 may be divided into one or more modules / units, which are stored in the memory 101 and executed by the processor 100 to complete the present application. The one or more modules / units may be a series of computer program instruction segments capable of completing specific functions, which are used to describe the execution process of the computer program 102 in the detection device 10.

[0116] The detection device 10 may be a computing device such as a desktop computer, a notebook, a PDA, or a cloud server. The detection device may include, but is not limited to, a processor 100 and a memory 101. Those skilled in the art will appreciate that Fig.10 It is only an example of a detection device 10 and does not constitute a limitation of the detection device 10. It may include more or fewer components than shown in the figure, or a combination of certain components, or different components. For example, the detection device may also include input and output devices, network access devices, buses, etc.

[0117] The processor 100 may be a central processing unit (CPU), or other general-purpose processors, digital signal processors (DSP), application-specific integrated circuits (ASIC), field-programmable gate arrays (FPGA) or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc. A general-purpose processor may be a microprocessor or any conventional processor, etc.

[0118] The memory 101 can be an internal storage unit of the detection device 10, such as a hard disk or memory of the detection device 10. The memory 101 can also be an external storage device of the detection device 10, such as a plug-in hard disk, a smart memory card (Smart Media Card, SMC), a secure digital (Secure Digital, SD) card, a flash card (Flash Card) etc. equipped on the detection device 10. Further, the memory 101 can also include both the internal storage unit of the detection device 10 and the external storage device. The memory 101 is used to store the computer program and other programs and data required by the detection device. The memory 101 can also be used to temporarily store data that has been output or is to be output.

[0119] The technicians in the relevant field can clearly understand that for the convenience and simplicity of description, only the division of the above-mentioned functional units and modules is used as an example for illustration. In practical applications, the above-mentioned function allocation can be completed by different functional units and modules as needed, that is, the internal structure of the device can be divided into different functional units or modules to complete all or part of the functions described above. The functional units and modules in the embodiment can be integrated in a processing unit, or each unit can exist physically separately, or two or more units can be integrated in one unit. The above-mentioned integrated unit can be implemented in the form of hardware or in the form of software functional units. In addition, the specific names of the functional units and modules are only for the convenience of distinguishing each other, and are not used to limit the scope of protection of this application. The specific working process of the units and modules in the above-mentioned system can refer to the corresponding process in the aforementioned method embodiment, which will not be repeated here.

[0120] In the above embodiments, the description of each embodiment has its own emphasis. For parts that are not described or recorded in detail in a certain embodiment, reference can be made to the relevant descriptions of other embodiments.

[0121] Those of ordinary skill in the art will appreciate that the units and algorithm steps of each example described in conjunction with the embodiments disclosed herein can be implemented in electronic hardware, or a combination of computer software and electronic hardware. Whether these functions are performed in hardware or software depends on the specific application and design constraints of the technical solution. Professional and technical personnel can use different methods to implement the described functions for each specific application, but such implementation should not be considered to be beyond the scope of this application.

[0122] In the embodiments provided in the present application, it should be understood that the disclosed devices / terminal equipment and methods can be implemented in other ways. For example, the device / terminal equipment embodiments described above are only schematic. For example, the division of the modules or units is only a logical function division. There may be other division methods in actual implementation, such as multiple units or components can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the mutual coupling or direct coupling or communication connection shown or discussed can be through some interfaces, indirect coupling or communication connection of devices or units, which can be electrical, mechanical or other forms.

[0123] The units described as separate components may or may not be physically separated, and the components shown as units may or may not be physical units, that is, they may be located in one place or distributed on multiple network units. Some or all of the units may be selected according to actual needs to achieve the purpose of the solution of this embodiment.

[0124] In addition, each functional unit in each embodiment of the present application may be integrated into one processing unit, or each unit may exist physically separately, or two or more units may be integrated into one unit. The above-mentioned integrated unit may be implemented in the form of hardware or in the form of software functional units.

[0125] If the integrated module / unit is implemented in the form of a software functional unit and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on this understanding, the present application implements all or part of the process in the above-mentioned embodiment method, and can also be completed by hardware related to computer program instructions. The computer program can be stored in a computer-readable storage medium, and the computer program can implement the steps of the above-mentioned various method embodiments when executed by the processor. Among them, the computer program includes computer program code, and the computer program code can be in source code form, object code form, executable file or some intermediate form. The computer-readable medium may include: any entity or device capable of carrying the computer program code, recording medium, U disk, mobile hard disk, disk, optical disk, computer memory, read-only memory (ROM, Read-Only Memory), random access memory (RAM, Random Access Memory), electric carrier signal, telecommunication signal and software distribution medium. It should be noted that the content contained in the computer-readable medium can be appropriately increased or decreased according to the requirements of legislation and patent practice in the jurisdiction. For example, in some jurisdictions, according to legislation and patent practice, computer-readable media do not include electric carrier signals and telecommunication signals.

[0126] The embodiments described above are only used to illustrate the technical solutions of the present application, rather than to limit them. Although the present application has been described in detail with reference to the aforementioned embodiments, a person skilled in the art should understand that the technical solutions described in the aforementioned embodiments may still be modified, or some of the technical features may be replaced by equivalents. Such modifications or replacements do not deviate the essence of the corresponding technical solutions from the spirit and scope of the technical solutions of the embodiments of the present application, and should all be included in the protection scope of the present application.

Claims

1. A surface profile acquisition device, characterized in that: The surface profile acquisition device comprises a first wheel group, a second wheel group, a first deviation detection device, a second deviation detection device, a distance detection device and a controller; The first wheel set and the second wheel set are used to contact the detected surface respectively, the first deviation detection device is used to detect the first deviation information of the first wheel set, and the second deviation detection device is used to detect the second deviation information of the second wheel set; The distance detection device is used to detect the moving distance of the surface profile acquisition device; The controller is used to determine a first surface contour curve of the detected surface according to the first deviation information of the first wheel group, determine a second surface contour curve of the detected surface according to the second deviation information of the second wheel group, and fuse the first surface contour curve and the second surface contour curve to obtain a surface contour acquisition result, wherein the intervals between surface contour acquisition points of the first surface contour curve and the second surface contour curve are different.

2. The surface profile acquisition device according to claim 1, characterized in that: The first wheel group includes a first wheel and a second wheel for contacting the detected surface, the first wheel group is connected by a first connecting rod, the second wheel group includes a third wheel and a fourth wheel for contacting the detected surface, the second wheel group is connected by a second connecting rod, the interval of the surface contour collection points of the first surface contour curve is the first collection interval between the first wheel and the second wheel, the interval of the surface contour collection points of the second surface contour curve is the second collection interval between the third wheel and the fourth wheel, and the first collection interval is greater than the second collection interval.

3. The surface profile acquisition device according to claim 1, characterized in that: The first wheel group includes a first wheel and a second wheel for contacting the detected surface, the first wheel and the second wheel are connected by a first connecting rod, the second wheel group includes a second wheel and a third wheel for contacting the detected surface, the second wheel and the third wheel are connected by a second connecting rod, the interval of surface contour collection points of the first surface contour curve is the first collection interval between the first wheel and the second wheel, the interval of surface contour collection points of the second surface contour curve is the third collection interval between the second wheel and the third wheel, and the first collection interval is greater than the third collection interval.

4. The surface profile acquisition device according to claim 1, characterized in that: The first wheel group includes a first wheel and a second wheel, the second wheel group includes a second wheel, the second deviation detection device includes a distance sensor, the first wheel and the second wheel are connected by a first connecting rod, the interval of the surface contour collection points of the first surface contour curve is the first collection interval between the first wheel and the second wheel, the interval of the surface contour collection points of the second surface contour curve is the fourth collection interval between the second wheel and the distance sensor, and the first collection interval is greater than the fourth collection interval.

5. The surface profile acquisition device according to claim 4, characterized in that: The distance sensor is arranged on the first connecting rod; Alternatively, the second wheel group includes a second wheel and a third wheel, the second wheel and the third wheel are connected by a second connecting rod, the second connecting rod is equipped with a second deviation detection device, the second deviation detection device includes an angle sensor and a distance sensor, the distance sensor is used to detect the distance between the distance sensor and the ground, and the angle sensor is used to detect the inclination angle of the second connecting rod.

6. The surface profile acquisition device according to claim 1 or 2, characterized in that: The surface profile acquisition device further includes a marking device, wherein the controller is used to determine the raised positions and / or recessed positions that meet preset requirements according to the determined surface profile acquisition result, and the marking device is used to mark the raised positions and recessed positions.

7. The surface profile acquisition device according to claim 6, characterized in that: The surface profile acquisition device further comprises a ground anomaly detection device, and the controller is used for controlling the ground anomaly detection device to perform anomaly detection on the convex position and / or concave position after detecting the convex position and / or concave position.

8. The surface profile acquisition device according to claim 1, characterized in that: The surface contour acquisition device also includes a mapping device, and the controller is used to obtain scene information of the detected surface through the mapping device, generate a scene map according to the scene information, and generate a contour map according to the surface contour acquisition result and the scene map.

9. A surface profile acquisition method, characterized in that: The surface profile acquisition method is based on the surface profile acquisition device according to any one of claims 1 to 6, and the method comprises: Acquire first deviation information of the first wheel set by the deviation detection device, and acquire second deviation information of the second wheel set; Determine a first relative height at a position corresponding to the first collection interval of the first wheel group according to the first collection interval of the first wheel group and the first deviation information, and determine a second relative height at a position corresponding to the second collection interval of the second wheel group according to the second collection interval of the second wheel group and the second deviation information; Obtaining a first surface profile curve according to the moving distance determined by the distance detection device and the first relative height, and obtaining a second surface profile curve according to the moving distance and the second relative height; The first surface profile curve and the second surface profile curve are fused to obtain a surface profile acquisition result.

10. The method according to claim 9, characterized in that Obtaining a first surface profile curve according to the moving distance determined by the distance detection device and the first relative height includes: Determine, according to the first relative heights of the i-th position and the i+1-th position collected by the first wheel group and in combination with the first collection interval, an i-th line segment between the i-th position and the i+1-th position; According to the moving distance, when the first wheel group of the surface profile acquisition device acquires the i+1th position and the i+2th position, the first relative height is updated, and the i+1th line segment between the i+1th position and the i+2th position is determined according to the first relative height, and the first surface profile curve is obtained by connecting multiple line segments determined by multiple movements; Obtaining a second surface profile curve according to the moving distance, the second collection interval and the second relative height, including: Determine a jth line segment between the jth position and the j+1th position according to the second relative heights of the jth position and the j+1th position collected by the second wheel group and in combination with the second collection interval; According to the moving distance, it is determined that when the third wheel group of the surface contour acquisition device moves to collect the j+1th position and the j+2th position, the second relative height is updated, and the j+1th line segment between the j+1th position and the j+2th position is determined according to the second relative height, and the second surface contour curve is obtained by connecting multiple line segments determined by multiple movements, wherein i and j are natural numbers.

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