An inclined hole probe fixture mechanism

Abstract

The present invention relates to an inclined hole probe clamp mechanism, comprising a probe clamp base fixed on a probe station, a probe clamp body fixedly connected to one side of the probe clamp base, a probe tube fixedly connected to the inner cavity of the probe tube, a probe seat joint fixedly connected to the inner cavity of the probe seat joint, and a connecting section connected to the inner cavity of the probe seat joint through an elliptical groove. The present invention relates to the field of probe clamp technology. The inclined hole probe clamp mechanism has a simple overall structure and is easy to operate. The joint can be switched between a tightened state and a relaxed state by setting a hand-tightening nut, so that the operator can quickly and stably install the probe. At the same time, different types of probes can be adapted for installation, which reduces installation time waste and facilitates the rapid progress of subsequent operations.

Description

Technical Field

[0001] The invention relates to the technical field of probe clamps, in particular to an inclined hole probe clamp mechanism. Background Art

[0002] A probe is a tool or device used to measure, test or obtain information. It is usually a long and thin object that can be used to puncture, touch or contact the object to be tested to obtain the required data or information. Probes are widely used in various fields such as scientific research, engineering detection, medical diagnosis, electronic testing and information acquisition. In the prior art, when installing the probe, most of them are clamped and installed by a clamp, so that the probe can be quickly installed. However, the probe clamp in the prior art is more complicated to operate when clamping and installing the probe, which is not conducive to the rapid installation of the probe and increases the installation time. Summary of the invention

[0003] In view of the deficiencies in the prior art, the present invention provides an inclined hole probe fixture mechanism to solve the above-mentioned problems.

[0004] To achieve the above objectives, the present invention is implemented through the following technical solutions: an inclined hole probe clamp mechanism, comprising a probe clamp base fixed on a probe station, one side of the probe clamp base is fixedly connected to a probe clamp body, one side of the probe clamp body is fixed to a probe tube, the inner cavity of the probe tube is fixedly connected to a probe seat joint, the inner cavity of the probe seat joint is connected to a connecting section through an elliptical groove, one side of the connecting section is fixedly connected to a needle chuck, the inner cavity of the needle chuck clamps a probe through a clamping groove, the outer ring of the needle chuck is provided with a hand nut, and the outer part of the needle chuck is provided with an external thread installed corresponding to the inner ring of the hand nut;

[0005] The inner cavity of the elliptical groove is respectively provided with a buffer mechanism for buffering the connecting section and a supporting mechanism for supporting the connecting section.

[0006] As a further solution of the present invention: the probe tube is a copper tube.

[0007] As a further solution of the present invention: two clamping grooves are provided, which are oblique holes arranged non-perpendicularly relative to the circumference of the needle clamp, which is conducive to the probe being tilted toward the component to be tested, thereby facilitating the probe to perform detection work.

[0008] As a further solution of the present invention: the buffer mechanism includes an inner groove arranged in the inner cavity of the probe seat joint, the inner cavity of the inner groove is provided with a reset spring, the bottom of the inner groove is rotatably connected to a push plate abutting against the surface of the connecting section, the inner cavity of the push plate is provided with an oblique groove, the bottom of the reset spring abuts against the top of the push plate, the top of the reset spring is plugged with a pin shaft, the inner cavity of the probe seat joint is provided with an adjustment groove threadedly connected to the pin shaft, the surface of the pin shaft is sleeved with a limit plate abutting against the top of the reset spring, when in use, the pin shaft is rotated in the adjustment groove to drive the limit plate to adjust its position up and down, thereby adjusting the thrust on one end of the reset spring. The other end of the spring is squeezed on the top of the push plate, and the push plate is squeezed on the surface of the connecting section through the inclined groove, exerting pressure on the connecting section to position it inside the elliptical groove. When the detection is carried out, the probe contacts the component to be detected. When the force is too large, the probe is subjected to a reaction force, and the force is transmitted to the connecting section through the needle clamp. The connecting section moves upward in the elliptical groove, and the push plate squeezes the reset spring to drive the probe to move slightly to prevent the probe from being damaged due to excessive reaction force, thereby achieving elastic contact with the component to be detected and eliminating the phenomenon of probe damage. In addition, the probe loading pressure can be adjusted within a larger range by rotating the pin shaft, while ensuring the loading accuracy index of the test point.

[0009] As a further solution of the present invention: the top of the push plate is fixedly connected with a pull rope fixedly connected to the inner cavity of the inner groove, and the push plate is limited by the pull rope to prevent it from being squeezed by the return spring, extending excessively, and applying excessive force to the probe.

[0010] As a further solution of the present invention: the supporting mechanism includes a supporting spring fixed in the inner cavity of the probe seat joint and abutting against the surface of the connecting section. The connecting section is supported by the supporting spring to ensure uniform force on both sides. When the connecting section rotates in the elliptical groove, the gap on the other side can be filled.

[0011] As a further solution of the present invention: the support spring and the reset spring are symmetrically distributed on both sides of the elliptical groove in the inner cavity of the probe seat joint, and the center lines are coaxial. Through the arrangement of the support springs and the reset springs on both sides, when the probe is displaced by the reaction force, the stability of the displacement can be guaranteed, it will not shake left and right, and it can be quickly reset automatically without affecting subsequent detection operations.

[0012] As a further solution of the present invention: the end of the connecting section is rotatably arranged in the elliptical groove, and the setting of the elliptical groove reserves a movable space for the connecting section, which can drive the probe to do a slight displacement.

[0013] Compared with the prior art, the present invention has the following beneficial effects:

[0014] The present invention has a simple overall structure and is easy to operate. The joint can be switched between a tightened state and a relaxed state by setting a hand-tightening nut, so that the operator can quickly and firmly install the probe. At the same time, different types of probes can be adapted for installation, which reduces the waste of installation time and is conducive to the rapid progress of subsequent operations.

[0015] According to the present invention, when the detection is carried out, the probe contacts the component to be detected. When the force is too large, the probe is subjected to a reaction force, and the force is transmitted to the connecting section through the needle clamp. The connecting section moves upward in the elliptical groove, and the reset spring is squeezed by the push plate to drive the probe to move slightly, so as to prevent the probe from being damaged due to excessive reaction force, thereby achieving elastic contact with the component to be detected and preventing the probe from being damaged. Moreover, the probe loading pressure can be adjusted within a larger range by rotating the pin shaft, while ensuring the index of the loading accuracy of the test point.

[0016] The present invention drives the limit plate to adjust its position up and down by rotating the pin shaft in the adjusting groove, thereby adjusting the thrust on one end of the reset spring. At this time, the other end of the reset spring is pressed above the push plate, and the push plate is pressed on the surface of the connecting section through the inclined groove, exerting pressure on the connecting section to position it inside the elliptical groove. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] Figure 1 It is a structural schematic diagram of the present invention;

[0018] Figure 2 It is a partial structural cross-sectional view of the present invention;

[0019] Figure 3 For the present invention Figure 2 A partial enlarged view of the middle A;

[0020] Figure 4 It is a top view of the structure of the present invention.

[0021] In the figure: 1. probe fixture base; 2. probe fixture body; 3. probe tube; 4. probe seat joint; 5. connecting section; 6. hand nut; 7. needle clamp; 8. probe; 9. support spring; 10. oval groove; 11. adjustment groove; 12. pin shaft; 13. limit plate; 14. reset spring; 15. pull rope; 16. push plate; 17. oblique groove. DETAILED DESCRIPTION

[0022] In order to further explain the technical means and effects adopted by the present invention to achieve the predetermined invention purpose, the specific implementation mode, structure, characteristics and effects of the present invention are described in detail below in combination with the accompanying drawings and preferred embodiments.

[0023] See also Figure 1-4The present invention provides a technical solution: an inclined hole probe clamp mechanism, comprising a probe clamp base 1 fixed on a probe station, a probe clamp body 2 fixedly connected to one side of the probe clamp base 1, a probe tube 3 fixedly connected to one side of the probe clamp body 2, an inner cavity of the probe tube 3 fixedly connected to a probe seat joint 4, an inner cavity of the probe seat joint 4 connected to a connecting section 5 through an elliptical groove 10, a needle clamp 7 fixedly connected to one side of the connecting section 5, an inner cavity of the needle clamp 7 clamps a probe 8 through a clamping groove, an outer ring sleeve of the needle clamp 7 is provided with a hand-tightening nut 6, and an outer surface of the needle clamp 7 is provided with an external thread installed corresponding to the inner ring of the hand-tightening nut 6;

[0024] The inner cavity of the elliptical groove 10 is respectively provided with a buffer mechanism for buffering the connecting section 5 and a supporting mechanism for supporting the connecting section 5 .

[0025] The probe tube 3 is a copper tube.

[0026] There are two clamping grooves, which are oblique holes arranged non-perpendicularly relative to the circumference of the needle clamp 7, which is conducive to the probe 8 being tilted toward the component to be tested, thereby facilitating the probe 8 to perform detection work.

[0027] The buffer mechanism includes an inner groove arranged in the inner cavity of the probe seat joint 4, the inner cavity of the inner groove is provided with a reset spring 14, the bottom of the inner groove is rotatably connected with a push plate 16 abutting against the surface of the connecting section 5, the inner cavity of the push plate 16 is provided with an inclined groove 17, the bottom of the reset spring 14 abuts against the top of the push plate 16, the top of the reset spring 14 is plugged with a pin shaft 12, the inner cavity of the probe seat joint 4 is provided with an adjustment groove 11 threadedly connected to the pin shaft 12, the surface of the pin shaft 12 is sleeved with a limit plate 13 abutting against the top of the reset spring 14, when in use, by rotating the pin shaft 12 in the adjustment groove 11, the limit plate 13 is driven to adjust the position up and down, thereby adjusting the thrust on one end of the reset spring 14, and at this time the other end of the reset spring 14 squeezes The push plate 16 is pressed on the surface of the connecting section 5 through the inclined groove 17, and pressure is applied to the connecting section 5 to position it inside the elliptical groove 10. When the detection is carried out, the probe 8 contacts the component to be detected. When the force is too large, the probe 8 is subjected to a reaction force, and the force is transmitted to the connecting section 5 through the needle clamp 7. The connecting section 5 moves upward in the elliptical groove 10, and the reset spring 14 is squeezed by the push plate 16, which drives the probe 8 to move slightly to prevent the probe 8 from being damaged due to excessive reaction force, thereby realizing elastic contact with the component to be detected, and preventing the probe 8 from being damaged. Moreover, the loading pressure of the probe 8 can be adjusted within a larger range by rotating the pin shaft 12, while ensuring the index of the loading accuracy of the test point.

[0028] The top of the push plate 16 is fixedly connected with a pull rope 15 fixedly connected to the inner cavity of the inner groove. The pull rope 15 limits the push plate 16 to prevent it from being squeezed by the return spring 14 and extending excessively, thereby applying excessive force to the probe 8.

[0029] The supporting mechanism includes a supporting spring 9 fixed in the inner cavity of the probe seat joint 4 and abutting against the surface of the connecting section 5. The connecting section 5 is supported by the supporting spring 9 to ensure uniform force on both sides. When the connecting section 5 rotates in the elliptical groove 10, the gap on the other side can be filled.

[0030] The support spring 9 and the reset spring 14 are symmetrically distributed on both sides of the elliptical groove 10 in the inner cavity of the probe seat joint 4, and the center lines are coaxial. Through the arrangement of the support springs 9 and the reset spring 14 on both sides, when the probe 8 is displaced by the reaction force, the stability of the displacement can be guaranteed, it will not shake left and right, and it can be quickly reset automatically without affecting subsequent detection operations.

[0031] The end of the connecting section 5 is rotatably arranged in the elliptical groove 10 . The arrangement of the elliptical groove 10 reserves a movable space for the connecting section 5 , which can drive the probe 8 to make a slight displacement.

[0032] The above description is only a preferred embodiment of the present invention and does not limit the present invention in any form. Although the present invention has been disclosed as a preferred embodiment as above, it is not used to limit the present invention. Any technical personnel in this field can make some changes or modify the technical contents disclosed above into equivalent embodiments without departing from the scope of the technical solution of the present invention. However, any brief modifications, equivalent changes and modifications made to the above embodiments based on the technical essence of the present invention without departing from the content of the technical solution of the present invention are still within the scope of the technical solution of the present invention.

Claims

1. An inclined hole probe fixture mechanism, comprising a probe fixture base (1) fixed to a probe station, characterized in that: One side of the probe clamp base (1) is fixedly connected to a probe clamp body (2), one side of the probe clamp body (2) is fixedly connected to a probe tube (3), the inner cavity of the probe tube (3) is fixedly connected to a probe seat joint (4), the inner cavity of the probe seat joint (4) is connected to a connecting section (5) via an elliptical groove (10), one side of the connecting section (5) is fixedly connected to a needle clamp (7), the inner cavity of the needle clamp (7) clamps a probe (8) via a clamping groove, the outer ring of the needle clamp (7) is provided with a hand nut (6), and the outer portion of the needle clamp (7) is provided with an external thread mounted corresponding to the inner ring of the hand nut (6); The inner cavity of the elliptical groove (10) is respectively provided with a buffer mechanism for buffering the connecting section (5) and a support mechanism for supporting the connecting section (5); The buffer mechanism comprises an inner groove arranged in the inner cavity of the probe seat joint (4), the inner cavity of the inner groove is provided with a reset spring (14), the bottom of the inner groove is rotatably connected to a push plate (16) abutting against the surface of the connecting section (5), the inner cavity of the push plate (16) is provided with an inclined groove (17), the bottom of the reset spring (14) abuts against the top of the push plate (16), the top of the reset spring (14) is plugged with a pin shaft (12), the inner cavity of the probe seat joint (4) is provided with an adjustment groove (11) threadedly connected to the pin shaft (12), and the surface of the pin shaft (12) is sleeved with a limit plate (13) abutting against the top of the reset spring (14); The supporting mechanism comprises a supporting spring (9) fixed in the inner cavity of the probe seat joint (4) and abutting against the surface of the connecting section (5).

2. The inclined hole probe fixture mechanism according to claim 1, characterized in that: The probe tube (3) is a copper tube.

3. The inclined hole probe fixture mechanism according to claim 1, characterized in that: Two clamping grooves are provided, which are oblique holes arranged non-perpendicularly to the circumference of the needle clamp (7).

4. The inclined hole probe fixture mechanism according to claim 1, characterized in that: A pull rope (15) fixedly connected to the inner cavity of the inner groove is fixedly connected to the top of the push plate (16).

5. The inclined hole probe fixture mechanism according to claim 1, characterized in that: The support spring (9) and the return spring (14) are symmetrically distributed on both sides of the elliptical groove (10) in the inner cavity of the probe seat joint (4), and their center lines are coaxial.

6. The inclined hole probe fixture mechanism according to claim 1, characterized in that: The end of the connecting section (5) is rotatably arranged in the elliptical groove (10).

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