A method, system, terminal and medium for measuring parameters of large-size diamond slices

Abstract

The present application discloses a method, system, terminal and medium for measuring parameters of a large-size diamond sheet. The method comprises: marking a target diamond sheet at a point to obtain a marked diamond sheet; measuring the marked diamond sheet to obtain surface data; generating a fitting curve according to the surface data, and calculating the radius of curvature corresponding to the fitting curve; if the radius of curvature is greater than a preset threshold, the target diamond sheet is judged to be qualified. The present application improves the accuracy of the assessment of the flatness and quality of the diamond sheet by measuring the surface data of the diamond sheet and calculating the radius of curvature, thereby improving the measurement accuracy.

Description

Technical Field

[0001] The present application relates to the field of diamond measurement technology, and in particular to a method, system, terminal and medium for measuring parameters of large-size diamond sheets. Background Art

[0002] Diamond has excellent physical and chemical properties and is the hardest substance known so far. It also has a low friction coefficient, a high elastic modulus, a high thermal conductivity, good chemical stability, a large band gap and a small dielectric constant. It has broad application prospects in many high-tech fields.

[0003] For large-sized diamond sheets, flatness is an important criterion for evaluating whether the diamond sheet is qualified. After a certain stage of growth, the surface of the diamond will have impurities and be uneven, and the diamond sheet needs to be ground and polished. If the diamond sheet is not flat after grinding and polishing, it is not conducive to the continued growth of diamond and cannot meet the shipping requirements. The existing technology has complicated measurement operations for diamond sheets after grinding and polishing, resulting in low measurement accuracy.

[0004] Therefore, the prior art still needs to be improved and developed. Summary of the invention

[0005] The main purpose of the present application is to provide a method, system, terminal and medium for measuring parameters of a large-size diamond sheet, aiming to solve the problem in the prior art that when measuring parameters of a diamond sheet, the diamond sheet needs to be positioned and adjusted multiple times, resulting in low measurement accuracy of the diamond sheet.

[0006] A first aspect of an embodiment of the present application provides a method for measuring parameters of a large-size diamond sheet, the method comprising the following steps: marking points on a target diamond sheet to obtain a marked diamond sheet; measuring the marked diamond sheet to obtain surface data; generating a fitting curve based on the surface data, and calculating a curvature radius corresponding to the fitting curve; if the curvature radius is greater than a preset threshold, determining that the target diamond sheet is qualified.

[0007] Optionally, in one embodiment of the present application, the point marking of the target diamond sheet to obtain the marked diamond sheet also includes: acquiring an initial image of the diamond sheet on a light source; identifying the initial image, and when it is detected that no cracks exist in the initial image, using the diamond sheet as a target diamond sheet.

[0008] Optionally, in one embodiment of the present application, the point marking of the target diamond sheet to obtain the marked diamond sheet specifically includes: dividing a plurality of evenly distributed measurement lines on the target diamond sheet; marking a plurality of evenly distributed measurement points on each of the measurement lines until all the measurement lines are respectively marked with a plurality of the measurement points to obtain the marked diamond sheet.

[0009] Optionally, in one embodiment of the present application, the target diamond piece is circular; the multiple measurement lines evenly distributed on the target diamond piece are specifically: eight measurement lines evenly distributed on the nucleation surface and growth surface of the target diamond along the diameter direction, wherein the angle between two adjacent measurement lines is 45 degrees.

[0010] Optionally, in one embodiment of the present application, the surface data includes a plurality of measured heights; the measuring the marked diamond sheet to obtain the surface data specifically includes:

[0011] Determine a plurality of first marking points located on the nucleation surface and a plurality of second marking points located on the growth surface from the plurality of measuring points; wherein the plurality of first marking points correspond one-to-one to the plurality of second marking points; and obtain a plurality of measured heights of the nucleation surface from the growth surface based on the plurality of first marking points and the plurality of second marking points.

[0012] Optionally, in an embodiment of the present application, generating a fitting curve according to the surface data specifically includes: obtaining the plotting point coordinates corresponding to each of the plurality of measurement points; and generating a fitting curve according to the plurality of plotting point coordinates and the plurality of measurement heights.

[0013] Optionally, in one embodiment of the present application, a fitting curve is generated according to the surface data, and a radius of curvature corresponding to the fitting curve is calculated, and then the process further includes: if the radius of curvature is less than or equal to a preset threshold, grinding and polishing the target diamond sheet until the radius of curvature is greater than the preset threshold, and determining that the target diamond sheet is qualified.

[0014] The second aspect of the embodiment of the present application further provides a system for measuring parameters of a large-sized diamond sheet, wherein the system for measuring parameters of a large-sized diamond sheet comprises:

[0015] A division module is used to mark the target diamond piece at a certain position to obtain a marked diamond piece;

[0016] A measuring module, used to measure the marked diamond sheet to obtain surface data;

[0017] A calculation module, used to generate a fitting curve according to the surface data, and calculate the curvature radius corresponding to the fitting curve;

[0018] The flatness judgment module is used to judge that the target diamond sheet is qualified if the curvature radius is greater than a preset threshold.

[0019] A third aspect of an embodiment of the present application further provides a terminal, wherein the terminal comprises: a memory, a processor, and a large-size diamond sheet parameter measurement program stored in the memory and executable on the processor, wherein the large-size diamond sheet parameter measurement program implements the steps of the large-size diamond sheet parameter measurement method as described above when executed by the processor.

[0020] A fourth aspect of an embodiment of the present application further provides a computer-readable storage medium, wherein the computer-readable storage medium stores a measurement program for large-size diamond sheet parameters, and when the measurement program for large-size diamond sheet parameters is executed by a processor, the steps of the method for measuring large-size diamond sheet parameters as described above are implemented.

[0021] Beneficial effects: The present application provides a method, system, terminal and medium for measuring parameters of large-size diamond sheets. The method improves the accuracy of evaluating the flatness and quality of diamond sheets by measuring the surface data of the diamond sheets and calculating the radius of curvature, thereby improving the measurement accuracy and reliability. BRIEF DESCRIPTION OF THE DRAWINGS

[0022] In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments recorded in the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.

[0023] Figure 1 It is a flow chart of a preferred embodiment of the method for measuring parameters of large-sized diamond sheets of the present application;

[0024] Figure 2 It is a structural schematic diagram of a preferred embodiment of the measurement system of large-size diamond sheet parameters of the present application;

[0025] Figure 3 This is a schematic diagram of the structure of a preferred embodiment of the terminal of the present application.

[0026] Description of reference numerals:

[0027] 10. A measurement system for parameters of large-size diamond sheets; 100. A division module; 200. A measurement module; 300. A calculation module; 400. A flatness determination module. DETAILED DESCRIPTION

[0028] In order to make the purpose, technical scheme and effect of the present application clearer and more specific, the technical scheme in the embodiments of the present application will be described clearly and completely in combination with the drawings in the embodiments of the present application. The described embodiments are only possible technical implementations of the present application, not all possible implementations. Based on the embodiments in the present application, those skilled in the art can completely combine the embodiments of the present application to obtain other embodiments without creative work, and these embodiments are also within the scope of protection of the present application.

[0029] In the related art, the existing large-size diamond sheet parameter measurement methods mainly include mechanical measurement, optical measurement and electronic measurement, etc. The existing technology requires multiple positioning, adjustment and measurement of the diamond sheet during the measurement process. The operation process is cumbersome and time-consuming, resulting in inaccurate measurement results.

[0030] The following describes the method, system, terminal and medium for measuring parameters of large-sized diamond sheets in the embodiments of the present application with reference to the accompanying drawings. In view of the problem that the measurement of parameters of diamond sheets in the above-mentioned related art requires multiple positioning adjustments of the diamond sheets, resulting in low measurement accuracy of the diamond sheets, the present application provides a method for measuring parameters of large-sized diamond sheets, in which the accuracy of the assessment of the flatness and quality of the diamond sheets is improved by measuring the surface data of the diamond sheets and calculating the radius of curvature, thereby improving the measurement accuracy and reliability. As a result, the technical problem that the measurement of parameters of diamond sheets in the related art requires multiple positioning adjustments of the diamond sheets, resulting in low measurement accuracy of the diamond sheets, is solved.

[0031] The embodiments of the present application can achieve rapid and accurate measurement of parameters of large-sized diamond sheets, thereby improving measurement accuracy and efficiency.

[0032] The technical solution of the present application is described in detail with specific embodiments below. The following specific embodiments can be combined with each other, and the same or similar concepts or processes may not be described in detail in some embodiments.

[0033] The method for measuring parameters of large-size diamond sheets described in the preferred embodiment of the present application is as follows: Figure 1 As shown, the method for measuring parameters of large-size diamond sheets comprises the following steps:

[0034] In step S101, the target diamond sheet is point-marked to obtain a marked diamond sheet.

[0035] In a possible implementation, a plurality of evenly distributed measurement lines are divided on the target diamond sheet; and a plurality of evenly distributed measurement points are marked on each of the measurement lines until all the measurement lines are respectively marked with a plurality of the measurement points, thereby obtaining a marked diamond sheet.

[0036] In a possible implementation, the target diamond piece is circular; in the process of dividing the straight lines, eight evenly distributed measurement straight lines are divided along the diameter direction on the nucleation surface and growth surface of the target diamond, wherein the angle between two adjacent measurement straight lines is 45 degrees.

[0037] Specifically, points are drawn on the surface of the diamond: the diamond sheet (circular) is divided into 8 lines along the diameter direction, each line has an angle of 45 degrees, and points with the same distance are drawn on each line.

[0038] Further, divide the diameter line: divide 8 lines along the diameter direction of the target diamond piece. Since the diamond piece is circular, the 8 lines are straight lines, and the angle between every two adjacent lines is 45 degrees, that is, starting from any line, there is a line every 45 degrees until a full circle of 360 degrees is divided; mark points: on each divided diameter line, divide points with the same distance. These points will be used as reference points for measurement for subsequent height measurement and data analysis; ensure uniform distribution: since each line is 45 degrees apart and the distance between points on each line is the same, this ensures that the points are evenly distributed on the surface of the diamond piece. Evenly distributed points help to more accurately capture the overall surface features of the diamond piece, including any possible curvature or unevenness; prepare for measurement: after completing the marking of the points, the marked diamond piece is ready for subsequent height measurement. Each marked point will be used to measure the height of its nucleation surface (basal surface) and growth surface (surface after diamond growth).

[0039] In a possible implementation, in the process of determining the target diamond sheet, an initial image of the diamond sheet on the light source is acquired; the initial image is recognized, and when it is detected that no cracks exist in the initial image, the diamond sheet is used as the target diamond sheet.

[0040] Specifically, the diamond sheet is imaged, and the initial image is analyzed to determine whether the corresponding diamond sheet has cracks, so that the diamond sheet without cracks is used as the target diamond sheet.

[0041] In a possible implementation, during the process of determining the target diamond sheet, the diamond sheet is placed on the bottom light source, the light source switch is turned on, and whether there are cracks on the diamond sheet is observed. If there are no cracks, the radius of curvature is measured, and if there are cracks, it is a defective product. It can be understood that diamond sheets with obvious defects (such as cracks) are screened out through preliminary visual inspection, thereby avoiding further, potentially more costly, inspection and processing of defective materials.

[0042] Specifically, place the diamond sheet: place the diamond sheet to be tested on the bottom light source. The bottom light can provide a uniform and bright background, which helps to clearly show the details of the diamond sheet, especially surface defects such as cracks; turn on the light source switch: turn on the bottom light source and observe the diamond sheet in the transmitted light mode. The transmitted light can pass through the bottom of the diamond sheet, making any cracks or unevenness more visually obvious; observe cracks: observe whether there are cracks in the diamond sheet with the naked eye or with the help of magnifying equipment (such as a microscope) under sufficient light. Cracks may be caused by internal stress of the material or external mechanical impact, usually appearing as fine lines or forked patterns; preliminary judgment: if cracks are found, the diamond sheet is directly judged as unqualified without the need for subsequent complex tests. The presence of cracks means that the diamond sheet has major structural defects and cannot meet the quality standards; continue to test if there are no cracks: if no cracks are observed, it means that the diamond sheet has passed the preliminary screening, and more detailed tests can be carried out next, such as the measurement of the radius of curvature. This step is to further confirm the flatness and overall quality of the diamond sheet to ensure that it meets the application requirements of precision processing or research.

[0043] The embodiments of the present application can quickly and effectively screen out unqualified diamond sheets at the initial stage, reducing unnecessary subsequent testing costs, while also ensuring that only materials of qualified quality will enter the next stage of detailed testing and application areas.

[0044] In step S102, the marked diamond sheet is measured to obtain surface data.

[0045] In one possible implementation, the surface data includes multiple measured heights; multiple first marking points located on the nucleation surface and multiple second marking points located on the growth surface are determined from the multiple measurement points; wherein the multiple first marking points correspond one-to-one to the multiple second marking points; and based on the multiple first marking points and the multiple second marking points, multiple measured heights of the nucleation surface from the growth surface are obtained.

[0046] Specifically, place the diamond sheet on the thickness gauge and measure the height of the nucleation surface and growth surface of all plotted points (the nucleation surface is the base surface of diamond growth, usually the side of the diamond sheet in contact with the growth matrix; the growth surface is the surface formed by the diamond during the growth process, opposite to the nucleation surface).

[0047] Further, position the diamond sheet: place the diamond sheet on the measuring table of the thickness gauge, ensuring that it is stable and in the correct position for accurate height measurement; select measuring points: select the points to be measured based on the points previously marked on the diamond sheet (8 lines divided along the diameter direction, each line with an angle of 45 degrees); measure the nucleation surface and growth surface; record the data, use the thickness gauge to measure the height of the nucleation surface and growth surface of each marked point, which is used to calculate the flatness and curvature of the diamond sheet; repeat the measurement: in order to ensure the accuracy of the data, measure each point multiple times and take the average value to reduce the error.

[0048] In step S103, a fitting curve is generated according to the surface data, and a curvature radius corresponding to the fitting curve is calculated.

[0049] In a possible implementation manner, the coordinates of the plotted points corresponding to each of the plurality of measurement points are obtained; and a fitting curve is generated according to the plurality of plotted point coordinates and the plurality of measurement heights.

[0050] Specifically, input the coordinates of the points in the direction of the arrow (starting from the point closest to the edge of the diamond in the direction of the arrow, 0 is the initial value, and the coordinates in all directions are input in sequence), fit a curve based on the height difference between the growth surface and the nucleation surface and the coordinates of the points in the direction of the arrow, and calculate the curvature radius of the curve. It can be understood that the direction of the arrow refers to the direction from the edge of the diamond sheet to the center, or a specific measurement direction, which should be previously defined with a clear starting point and end point.

[0051] Further, determine the coordinates of the plotted points: 8 lines have been divided along the diameter direction on the diamond sheet, each line has an angle of 45 degrees, and points with the same distance are marked on each line. The coordinates of these points are input in the direction of the arrow; start measuring from the edge: start from the point closest to the diamond edge in the direction of the arrow, set this point as the coordinate origin (0,0), and then measure and record the actual coordinates of all points inward in sequence; record the height difference between the growth surface and the nucleation surface: for each plotted point, it is necessary to measure the height difference between its growth surface and the nucleation surface. This height difference is the key data for evaluating the flatness of the diamond sheet; fit the curve: use these coordinate points and the corresponding height difference data to fit a curve through mathematical methods (such as the least squares method). The fitted curve represents the height change of the surface of the diamond sheet; calculate the radius of curvature: based on the fitted curve, the radius of curvature of the curve can be calculated. The radius of curvature is a quantity that describes the degree of curvature of the curve. The larger the radius of curvature, the flatter the curve; the smaller the radius of curvature, the more curved the curve.

[0052] In step S104, if the radius of curvature is greater than a preset threshold, the target diamond piece is determined to be qualified.

[0053] Specifically, if the radius of curvature on any surface in any direction is greater than a certain threshold, usually 3 meters, the diamond sheet is considered qualified and can be shipped or continue to grow. If it is less than the above threshold, it needs to be polished again.

[0054] In a possible implementation, if the curvature radius is less than or equal to a preset threshold, the target diamond sheet is ground and polished until the curvature radius is greater than the preset threshold, and the target diamond sheet is determined to be qualified.

[0055] Specifically, the quality of diamond sheets can be evaluated: based on the calculated radius of curvature, the flatness of the diamond sheet can be evaluated. If the radius of curvature is greater than a preset threshold, the diamond sheet may be qualified; if the radius of curvature is less than the threshold, the diamond sheet may require further processing or be considered unqualified. If the diamond sheet meets the quality standards, it can continue to be shipped or used for subsequent processing; if it does not meet the standards, it needs to be polished or corrected in other forms.

[0056] Further, first, determine the threshold: it is necessary to clarify the threshold of the radius of curvature, which is the standard for judging whether the diamond sheet is qualified. In the embodiment of the present application, the preset threshold is 3 meters; compare the radius of curvature with the threshold: for each surface (nucleation surface and growth surface) in each measuring direction, the calculated radius of curvature needs to be compared with the threshold. If the radius of curvature of all surfaces in all directions is greater than 3 meters, then the diamond sheet is considered to be qualified; qualified judgment: if the radius of curvature is greater than or equal to 3 meters, this indicates that the flatness and overall quality of the diamond sheet meet the requirements, and therefore it is judged to be qualified. The qualified diamond sheet can be identified as suitable for shipment, or if it has not yet fully grown, its growth process can continue; unqualified processing: if the radius of curvature of any surface in any direction is less than 3 meters, this indicates that the flatness of the diamond sheet in this area does not meet the standard, and therefore it needs to be polished again to remove the uneven parts of the surface and improve its overall quality. Re-testing: After grinding and polishing, the diamond sheet needs to be re-tested, including recalculation of the radius of curvature; only when the results of the re-test show that the radius of curvature of all surfaces in all directions is greater than 3 meters, the diamond sheet can be judged as qualified.

[0057] The embodiments of the present application can ensure that only diamond sheets that meet the quality standards will be shipped or continue to grow, thereby ensuring the quality of the final product.

[0058] The specific implementation of this application is described below in conjunction with a specific application scenario.

[0059] First, place the diamond sheet on the bottom light source, turn on the light source switch, and observe whether there are cracks on the diamond sheet. If there are no cracks, measure the curvature radius. If there are cracks, it is a defective product.

[0060] Mark points on the diamond surface: Divide the diamond sheet (circular) into 8 lines along the diameter direction, with each line having an angle of 45 degrees, and mark points of equal distance on each line.

[0061] Place the diamond sheet on the thickness gauge and measure the height of the nucleation surface and growth surface of all plotted points (the nucleation surface is the basal surface, and the growth surface is the surface after the diamond grows).

[0062] Input the coordinates of the points in the direction of the arrow (starting from the point closest to the edge of the diamond in the direction of the arrow, 0 is the initial value, and input the coordinates in all directions in sequence). Fit a curve based on the height difference between the growth surface and the nucleation surface and the coordinates of the points in the direction of the arrow, and calculate the curvature radius of the curve.

[0063] If the radius of curvature on any surface in any direction is greater than a certain threshold, usually 3 meters, the diamond sheet is considered qualified and can be shipped or continue to grow. If it is less than the above threshold, it needs to be polished again.

[0064] Next, a system for measuring parameters of a large-sized diamond sheet according to an embodiment of the present application will be described with reference to the accompanying drawings.

[0065] Figure 2 It is a block diagram of a system for measuring parameters of a large-size diamond sheet according to an embodiment of the present application.

[0066] like Figure 2 As shown, the large-size diamond sheet parameter measurement system 10 includes: a division module 100 , a measurement module 200 , a calculation module 300 and a flatness judgment module 400 .

[0067] Specifically, the dividing module 100 is used to mark the target diamond piece at a certain position to obtain a marked diamond piece;

[0068] The measuring module 200 is used to measure the marked diamond sheet to obtain surface data;

[0069] A calculation module 300, used to generate a fitting curve according to the surface data, and calculate a curvature radius corresponding to the fitting curve;

[0070] The flatness judgment module 400 is used to judge that the target diamond sheet is qualified if the curvature radius is greater than a preset threshold.

[0071] Figure 3 A schematic diagram of the structure of a terminal provided in an embodiment of the present application. The terminal may include:

[0072] A memory 501 , a processor 502 , and a computer program stored in the memory 501 and executable on the processor 502 .

[0073] When the processor 502 executes the program, the method for measuring parameters of a large-sized diamond sheet provided in the above embodiment is implemented.

[0074] Furthermore, the terminal further includes:

[0075] The communication interface 503 is used for communication between the memory 501 and the processor 502 .

[0076] The memory 501 is used to store computer programs that can be executed on the processor 502 .

[0077] The memory 501 may include a high-speed RAM memory, and may also include a non-volatile memory (non-volatile memory), such as at least one disk memory.

[0078] If the memory 501, the processor 502 and the communication interface 503 are implemented independently, the communication interface 503, the memory 501 and the processor 502 can be connected to each other through a bus and communicate with each other. The bus can be an Industry Standard Architecture (ISA) bus, a Peripheral Component (PCI) bus or an Extended Industry Standard Architecture (EIS) bus. The bus can be divided into an address bus, a data bus, a control bus, etc. For ease of representation, Figure 3 Only one thick line is used in the diagram, but this does not mean that there is only one bus or only one type of bus.

[0079] Optionally, in a specific implementation, if the memory 501, the processor 502 and the communication interface 503 are integrated on a chip, the memory 501, the processor 502 and the communication interface 503 can communicate with each other through an internal interface.

[0080] The processor 502 may be a central processing unit (CPU), or an application specific integrated circuit (ASIC), or one or more integrated circuits configured to implement the embodiments of the present application.

[0081] This embodiment also provides a computer-readable storage medium on which a computer program is stored. When the program is executed by a processor, the above method for measuring parameters of a large-sized diamond sheet is implemented.

[0082] One embodiment of the present application provides a computer program product, including a computer program, which, when executed by a processor, implements the present application Figure 1 A method for measuring parameters of a large-size diamond sheet provided in any of the corresponding embodiments.

[0083] In the description of this specification, the description with reference to the terms "one embodiment", "some embodiments", "example", "specific example", or "some examples" etc. means that the specific features, structures, materials or characteristics described in conjunction with the embodiment or example are included in at least one embodiment or example of the present application. In this specification, the schematic representations of the above terms do not necessarily refer to the same embodiment or example. Moreover, the specific features, structures, materials or characteristics described may be combined in any one or N embodiments or examples in a suitable manner. In addition, those skilled in the art may combine and combine the different embodiments or examples described in this specification and the features of the different embodiments or examples, without contradiction.

[0084] In addition, the terms "first" and "second" are used for descriptive purposes only and should not be understood as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Therefore, a feature defined as "first" or "second" may explicitly or implicitly include at least one of the features. In the description of this application, "N" means at least two, such as two, three, etc., unless otherwise clearly and specifically defined.

[0085] Any process or method description in a flowchart or otherwise described herein may be understood to represent a module, fragment or portion of code comprising one or N executable instructions for implementing the steps of a custom logical function or process, and the scope of the preferred embodiments of the present application includes alternative implementations in which functions may not be performed in the order shown or discussed, including performing functions in a substantially simultaneous manner or in reverse order depending on the functions involved, which should be understood by technicians in the technical field to which the embodiments of the present application belong.

[0086] The logic and / or steps represented in the flowchart or otherwise described herein, for example, can be considered as an ordered list of executable instructions for implementing logical functions, and can be embodied in any computer-readable storage medium for use by an instruction execution system, device or apparatus (such as a computer-based system, a system including a processor, or other system that can fetch instructions from an instruction execution system, device or apparatus and execute instructions), or in combination with these instruction execution systems, devices or apparatuses. For the purposes of this specification, a "computer-readable storage medium" can be any device that can contain, store, communicate, propagate or transmit a program for use by an instruction execution system, device or apparatus, or in combination with these instruction execution systems, devices or apparatuses. More specific examples (non-exhaustive list) of computer-readable storage media include the following: an electrical connection with one or N wirings (electronic device), a portable computer disk box (magnetic device), a random access memory (RAM), a read-only memory (ROM), an erasable and programmable read-only memory (EPROM or flash memory), an optical fiber device, and a portable compact disk read-only memory (CDROM). In addition, the computer-readable storage medium may even be paper or other suitable medium on which the program is printed, since the program may be obtained electronically by optically scanning the paper or other medium and then editing, interpreting or processing in other suitable ways as necessary and then storing it in a computer memory.

[0087] It should be understood that the various parts of the present application can be implemented by hardware, software, firmware or a combination thereof. In the above embodiment, N steps or methods can be implemented by software or firmware stored in a memory and executed by a suitable instruction execution system. For example, if implemented by hardware, as in another embodiment, it can be implemented by any one of the following technologies known in the art or their combination: a discrete logic circuit having a logic gate circuit for implementing a logic function for a data signal, a dedicated integrated circuit having a suitable combination of logic gate circuits, a programmable gate array (PGA), a field programmable gate array (FPGA), etc.

[0088] A person skilled in the art may understand that all or part of the steps in the method for implementing the above-mentioned embodiment may be completed by instructing related hardware through a program, and the program may be stored in a computer-readable storage medium, which, when executed, includes one or a combination of the steps of the method embodiment.

[0089] In addition, each functional unit in each embodiment of the present application may be integrated into a processing module, or each unit may exist physically separately, or two or more units may be integrated into one module. The above-mentioned integrated module may be implemented in the form of hardware or in the form of a software functional module. If the integrated module is implemented in the form of a software functional module and sold or used as an independent product, it may also be stored in a computer-readable storage medium.

[0090] The storage medium mentioned above may be a read-only memory, a magnetic disk or an optical disk, etc. Although the embodiments of the present application have been shown and described above, it can be understood that the above embodiments are exemplary and cannot be understood as limiting the present application. A person of ordinary skill in the art may change, modify, replace and modify the above embodiments within the scope of the present application.

[0091] It should be understood that the application of the present application is not limited to the above examples. For ordinary technicians in this field, improvements or changes can be made based on the above description. All these improvements and changes should fall within the scope of protection of the claims attached to this application.

[0092] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present application, rather than to limit it. Although the present application has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that they can still modify the technical solutions described in the aforementioned embodiments, or replace some or all of the technical features therein with equivalents. However, these modifications or replacements do not cause the essence of the corresponding technical solutions to deviate from the scope of the technical solutions of the embodiments of the present application.

Claims

1. A method for measuring parameters of large-size diamond sheets, characterized in that: The method for measuring the parameters of the large-size diamond sheet includes: Marking the target diamond sheet at certain positions to obtain a marked diamond sheet; Measuring the marked diamond sheet to obtain surface data; Generating a fitting curve according to the surface data, and calculating the curvature radius corresponding to the fitting curve; If the curvature radius is greater than a preset threshold, the target diamond sheet is determined to be qualified; The step of marking the target diamond sheet to obtain the marked diamond sheet specifically includes: Dividing a plurality of uniformly distributed measurement straight lines on the nucleation surface and the growth surface of the target diamond sheet; Marking a plurality of uniformly distributed measuring points on each of the measuring straight lines until all the measuring straight lines are respectively marked with a plurality of the measuring points, thereby obtaining a marked diamond sheet; The surface data includes a plurality of measured heights; the surface data is obtained by measuring the marked diamond sheet, specifically including: Determine a plurality of first marking points located on the nucleation surface and a plurality of second marking points located on the growth surface from the plurality of measurement points; wherein the plurality of first marking points correspond one to one with the plurality of second marking points; According to the plurality of the first marking points and the plurality of the second marking points, a plurality of measured heights of the nucleation surface from the growth surface are obtained; Generating a fitting curve according to the surface data specifically includes: Obtaining the coordinates of the points corresponding to each of the plurality of measuring points; Generate a fitting curve according to the plurality of plotted point coordinates and the plurality of measured heights; Generating a fitting curve according to the plurality of plotted point coordinates and the plurality of measured heights is specifically as follows: A fitting curve is obtained according to the multiple measured heights between the growth surface and the nucleation surface and the multiple plotted point coordinates in the arrow direction, wherein the plotted point coordinates in the arrow direction are coordinates pointing from the edge of the target diamond piece to the center.

2. The method for measuring parameters of large-size diamond sheets according to claim 1, characterized in that: The step of marking the target diamond sheet at a certain position to obtain a marked diamond sheet also includes: Acquire an initial image of the diamond sheet on the light source; The initial image is identified, and when it is detected that no cracks exist in the initial image, the diamond sheet is used as a target diamond sheet.

3. The method for measuring parameters of large-size diamond sheets according to claim 1, characterized in that: The target diamond piece is circular; The multiple measurement straight lines evenly distributed on the target diamond sheet are specifically: Eight evenly distributed measuring lines are divided on the nucleation surface and the growth surface of the target diamond along the diameter direction, wherein the angle between two adjacent measuring lines is 45 degrees.

4. The method for measuring parameters of large-size diamond sheets according to claim 1, characterized in that: The method further comprises generating a fitting curve according to the surface data and calculating a curvature radius corresponding to the fitting curve, and then: If the curvature radius is less than or equal to a preset threshold, the target diamond piece is ground and polished until the curvature radius is greater than the preset threshold, and the target diamond piece is determined to be qualified.

5. A system for measuring parameters of large-size diamond sheets, characterized in that: The measurement system of the large-size diamond sheet parameters includes: A division module is used to mark the target diamond piece at a certain position to obtain a marked diamond piece; The point marking of the target diamond sheet to obtain the marked diamond sheet specifically includes: dividing a plurality of uniformly distributed measurement lines on the nucleation surface and the growth surface of the target diamond sheet; marking a plurality of uniformly distributed measurement points on each of the measurement lines until all the measurement lines are respectively marked with a plurality of the measurement points, thereby obtaining the marked diamond sheet; A measuring module, used to measure the marked diamond sheet to obtain surface data; The surface data includes a plurality of measured heights; the measuring of the marked diamond sheet to obtain the surface data specifically includes: determining a plurality of first marking points located on the nucleation surface and a plurality of second marking points located on the growth surface from the plurality of measuring points; wherein the plurality of first marking points correspond to the plurality of second marking points one by one; and obtaining a plurality of measured heights of the nucleation surface from the growth surface according to the plurality of first marking points and the plurality of second marking points; A calculation module, used to generate a fitting curve according to the surface data, and calculate the curvature radius corresponding to the fitting curve; Generating a fitting curve according to the surface data specifically includes: obtaining the coordinates of the plotted points corresponding to each of the plurality of measurement points; generating a fitting curve according to the plurality of plotted point coordinates and the plurality of measurement heights; generating a fitting curve according to the plurality of plotted point coordinates and the plurality of measurement heights specifically includes: obtaining a fitting curve according to the plurality of measurement heights between the growth surface and the nucleation surface and the plurality of plotted point coordinates in the direction of the arrow, wherein the plotted point coordinates in the direction of the arrow are coordinates pointing from the edge of the target diamond piece to the center; The flatness judgment module is used to judge that the target diamond sheet is qualified if the curvature radius is greater than a preset threshold.

6. A terminal, characterized in that: The terminal comprises: a memory, a processor, and a large-size diamond sheet parameter measurement program stored in the memory and executable on the processor. When the large-size diamond sheet parameter measurement program is executed by the processor, the steps of the large-size diamond sheet parameter measurement method according to any one of claims 1 to 4 are implemented.

7. A computer-readable storage medium, characterized in that: The computer-readable storage medium stores a measurement program for large-size diamond sheet parameters, and when the measurement program for large-size diamond sheet parameters is executed by a processor, the steps of the method for measuring large-size diamond sheet parameters as claimed in any one of claims 1 to 4 are implemented.

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