Device for automatically measuring frequency of quartz crystal

Abstract

The invention relates to the technical field of quartz crystal frequency measurement, in particular to quartz crystal automatic frequency measurement equipment which comprises a rack, a material disc mechanism, a transplanting mechanism, a camera shooting mechanism and a testing mechanism are arranged at the top end of the rack, a distance adjusting mechanism is arranged below the testing mechanism in the rack, and the material disc mechanism is used for feeding and receiving materials. The transplanting mechanism and the camera shooting mechanism are matched for identifying and carrying materials, the testing mechanism and the distance adjusting mechanism are matched for measuring the frequency of the materials, the quartz crystals are subjected to spot test through the material disc mechanism, the transplanting mechanism, the camera shooting mechanism, the testing mechanism and the distance adjusting mechanism, and appearance size identification, number counting and frequency measurement of the quartz crystals can be achieved. The automation of the chip frequency spot test operation is realized, the manual operation is replaced, and the operation efficiency is improved.

Description

Technical Field

[0001] The invention relates to the technical field of quartz crystal frequency measurement, and in particular to a device for automatically measuring the frequency of a quartz crystal. Background Art

[0002] Quartz crystals have been widely used in military, communications, computers, home appliances and various industrial electronic equipment due to their excellent frequency stability, high Q value, high oscillation frequency and compact size. With the continuous development of science and technology, the requirements for the accuracy of quartz crystal resonators are getting higher and higher.

[0003] The existing quartz crystal sampling process is a manual operation mode with complicated steps. There are unstable factors in the sampling, low operation efficiency, affecting production capacity and heavy workload for operators. Considering the frequency measurement stability of quartz crystal products, the existing sampling process has potential risks. With the improvement of chip quality and output, it is necessary to design an automated equipment that can replace manual operation to meet production needs. Summary of the invention

[0004] In order to solve the above technical problems, the present invention provides a device for automatically measuring the frequency of a quartz crystal, which meets the needs of automatically and accurately measuring the frequency in the manufacturing of quartz crystal products, thereby achieving the purpose of improving the stability of sampling and improving the operating efficiency.

[0005] The present invention is achieved through the following technical solutions:

[0006] A device for automatically measuring the frequency of a quartz crystal product comprises a frame, wherein a material tray mechanism, a transplanting mechanism, a camera mechanism and a testing mechanism are arranged on the top of the frame, a spacing adjustment mechanism is arranged inside the frame below the testing mechanism, the material tray mechanism is used for loading and receiving materials, the transplanting mechanism cooperates with the camera mechanism for identifying and transporting materials, and the testing mechanism cooperates with the spacing adjustment mechanism for measuring the frequency of the materials.

[0007] Further preferably, the material tray mechanism includes a material tray, a motor 1 and a material box; the output end of the motor 1 is connected to the material tray, and a plurality of material boxes are provided, and the plurality of material boxes are connected in the circumferential direction of the material tray.

[0008] Further preferably, the transplanting mechanism includes suction nozzle 1, suction nozzle 2, suction nozzle cantilever, motor 2 and fixed bracket; motor 2 is installed on the fixed bracket, the fixed bracket is connected to the frame, the output end of motor 2 is connected to the suction nozzle cantilever, and suction nozzle 1 and suction nozzle 2 are both connected to the suction nozzle cantilever.

[0009] Further preferably, the camera mechanism includes a camera mounting plate and an industrial camera, the camera mounting plate is connected to the fixed bracket, and the industrial camera is mounted on the camera mounting plate.

[0010] Further preferably, the measuring mechanism includes a lower electrode seat, a lower electrode magnetic ring, a lower electrode, an upper electrode magnetic ring, an upper electrode, an upper electrode bracket, a slider module 1, a test mechanism bracket, a cylinder connecting block, a spring, a zero adjustment rod fastening ring, a zero adjustment rod and a cylinder; the lower electrode is installed in the lower electrode magnetic ring, and the lower electrode magnetic ring is connected to the lower electrode seat; the lower electrode seat is connected to the frame, the upper electrode is installed in the upper electrode magnetic ring, the upper electrode magnetic ring is connected to the upper electrode bracket, the upper electrode is arranged directly above the lower electrode, and the zero adjustment rod is connected to the zero adjustment rod fastening ring; the zero adjustment rod fastening ring is connected to the upper electrode bracket, the upper electrode bracket is slidably connected to the slider module 1, the slider module 1 is connected to the test mechanism bracket, one end of the cylinder connecting block is connected to the top of the upper electrode bracket, the other end of the cylinder connecting block is connected to the telescopic end of the cylinder, the cylinder is connected to the test mechanism bracket, the test mechanism bracket is installed on the frame, there are two springs, and the two ends of the spring are respectively connected to one side of the upper electrode bracket and the test mechanism bracket.

[0011] Further preferably, the spacing adjustment mechanism includes motor three, a motor mounting block, a spiral differential head, a differential head fixing block, a slider connecting plate, a micrometer limit plate, a contact rod, a micrometer fixing block, an adjustment mechanism mounting plate, a digital micrometer and a slider module two; motor three is connected to the motor mounting block, the motor mounting block is connected to the adjustment mechanism mounting plate, the adjustment mechanism mounting plate is installed at the top end inside the frame, the output end of motor three is connected to the shaft end of the spiral differential head, the outer diameter of the spiral differential head is connected to the differential head fixing block, the differential head fixing block is connected to the slider connecting plate, one end of the micrometer limit plate is connected to the slider connecting plate, the contact rod is directly below the zeroing adjustment rod, the contact rod is connected to the top of the micrometer limit plate, the slider connecting plate is slidably connected to the slider module two, the slider module two is connected to the adjustment mechanism mounting plate, the micrometer fixing block is connected to the adjustment mechanism mounting plate, the digital micrometer is connected to the micrometer fixing block, and the head of the digital micrometer abuts against the bottom surface of the micrometer limit plate.

[0012] Further preferably, the frame includes a main body, a warning light and a display are arranged on the top of the main body, and a plurality of casters are arranged on the bottom of the main body.

[0013] Further preferably, the equipment also includes a network analyzer and a PC terminal, the network analyzer is electrically connected to the testing mechanism, and the PC terminal is electrically connected to the tray mechanism, the transplanting mechanism, the camera mechanism, the testing mechanism, the spacing adjustment mechanism, the network analyzer and the display.

[0014] Beneficial effects of the present invention:

[0015] The present invention performs sampling test on quartz crystals through a tray mechanism, a transplanting mechanism, a camera mechanism, a testing mechanism and a spacing adjustment mechanism, and can identify the appearance size of the quartz crystals, count the number and measure the frequency, thereby automating the chip frequency sampling operation, replacing manual operation and improving operation efficiency.

[0016] The specific implementation modes of the present invention are further described in detail below in conjunction with the accompanying drawings. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] The accompanying drawings are used to provide a further understanding of the present invention and constitute a part of the specification. Together with the following specific embodiments, they are used to explain the present invention, but do not constitute a limitation of the present invention. In the accompanying drawings:

[0018] Figure 1 It is a structural schematic diagram of a quartz crystal automatic frequency measurement device of the present invention;

[0019] Figure 2 It is a schematic diagram of the internal perspective structure of a quartz crystal automatic frequency measurement device of the present invention;

[0020] Figure 3 It is a structural schematic diagram of the material tray mechanism in the device of the present invention;

[0021] Figure 4 It is a structural schematic diagram of the transplanting mechanism in the device of the present invention;

[0022] Figure 5 It is a structural schematic diagram of the camera mechanism in the device of the present invention;

[0023] Figure 6 It is a schematic diagram of the structure of the measuring mechanism in the device of the present invention;

[0024] Figure 7 It is a structural schematic diagram of the spacing adjustment mechanism in the device of the present invention;

[0025] Figure 8 It is a side view structural schematic diagram of the spacing adjustment mechanism in the device of the present invention;

[0026] Fig. 9 It is a structural schematic diagram of a rack in the device of the present invention.

[0027] 1- tray mechanism, 11- tray, 12- motor 1, 13- material discharging box, 14- material receiving box, 2- transplanting mechanism, 21- nozzle 1, 22- nozzle 2, 23- nozzle cantilever, 24- motor 2, 25- motor 2 mounting block, 26- fixed bracket, 3- camera mechanism, 31- camera mounting plate, 32- industrial camera, 4- testing mechanism, 41- lower electrode seat, 42- lower electrode magnetic ring, 43- lower electrode, 44- upper electrode magnetic ring, 45- upper electrode, 46- upper electrode bracket, 47- slider module 1, 48- testing mechanism bracket, 49- cylinder connecting block, 410 -spring screw, 411-spring, 412-zero adjustment rod fastening ring, 413-zero adjustment rod, 414-cylinder, 5-spacing adjustment mechanism, 51-motor three, 52-connector, 53-motor mounting block, 54-spiral differential head, 55-differential head fixing block, 56-slider connecting plate, 57-micrometer limit plate, 58-contact rod, 59-micrometer fixing block, 510-adjustment mechanism mounting plate, 511-digital micrometer, 512-slider module two, 6-network analyzer, 7-rack, 71-castor, 72-main body, 73-warning light, 8-display. DETAILED DESCRIPTION

[0028] The embodiments of the present invention are described in detail below, examples of which are shown in the accompanying drawings, wherein the same or similar reference numerals throughout represent the same or similar elements or elements having the same or similar functions. The embodiments described below with reference to the accompanying drawings are exemplary and are only used to explain the present invention, and cannot be understood as limiting the present invention.

[0029] In the description of the present invention, it should be understood that the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside", "clockwise", "counterclockwise" and the like indicate positions or positional relationships based on the positions or positional relationships shown in the accompanying drawings, and are only for the convenience of describing the present invention and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as limiting the present invention. In addition, the terms "first" and "second" are only used for descriptive purposes, and cannot be understood as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Therefore, the features defined as "first" and "second" may explicitly or implicitly include one or more of the features. In the description of the present invention, the meaning of "multiple" is two or more, unless otherwise clearly and specifically defined.

[0030] In the description of the present invention, it should be noted that, unless otherwise clearly specified and limited, the terms "installed", "connected", and "connected" should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection, an electrical connection, or mutual communication; it can be a direct connection, or an indirect connection through an intermediate medium, it can be the internal connection of two elements or the interaction relationship between two elements. For ordinary technicians in this field, the specific meanings of the above terms in the present invention can be understood according to specific circumstances.

[0031] Please refer to Figure 1-9 The present invention provides a device for automatically measuring the frequency of a quartz crystal product to replace manual measurement; the overall structure of the device is as shown in the attached Figure 1 , mainly composed of a tray mechanism 1, a transplanting mechanism 2, a camera mechanism 3, a testing mechanism 4, a spacing adjustment mechanism 5, a network analyzer 6, a rack 7 and a display 8: wherein, the tray mechanism 1, the transplanting mechanism 2, the camera mechanism 3, the testing mechanism 4 and the display 8 are all installed on the top of the rack 7, the network analyzer 6 is installed in the rack 7, the spacing adjustment mechanism 5 is installed in the top of the rack 7, and at the corresponding lower part of the testing mechanism 4, the material is loaded and received through the tray mechanism 1, the transported material is identified through the transplanting mechanism 2 and the camera mechanism 3, the material frequency is measured through the testing mechanism 4 and the spacing adjustment mechanism 5, the measurement data is obtained through the network analyzer 6, and the display 8 is connected to a PC terminal (not shown in the figure).

[0032] The material tray mechanism 11 includes a material tray 11, a motor 12, a material discharge box 13 and a material receiving box 14; the output end of the motor 12 is connected to the material tray 11, so that the motor 12 drives the material tray 11 to rotate. The material tray 11 has holes arranged along the circumferential direction, and the material receiving box 14 is placed in the holes of the material tray 11. The material tray 11 is designed with a total of 36 holes for the material receiving box 14 to be placed. The holes are designed with boss supports for easy access to the material receiving box 14. Similarly, the outer wall of the material receiving box 14 has support bars on the circumference, which cooperate with the bosses in the holes to support the material receiving box 14. The material discharge box 13 is installed on the material receiving box 14 to form a complete material box, which is used to discharge material from the material discharge box 13 into the material receiving box 14.

[0033] The transplanting mechanism 2 includes a suction nozzle 1 21, a suction nozzle 22, a suction nozzle cantilever 23, a motor 24, a motor 2 mounting block 25 and a fixed bracket 26; the motor 24 is mounted on the fixed bracket 26 through the motor 2 mounting block 25, the fixed bracket 26 is mounted on the frame 7, the suction nozzle 1 21 and the suction nozzle 2 22 are connected in the mounting hole of the suction nozzle cantilever 23, and the output end of the motor 24 is connected to the end of the suction nozzle cantilever 23 close to the suction nozzle 1 21, so that the motor 24 drives the suction nozzle cantilever 23 to rotate, and the suction nozzle 1 21 and the suction nozzle 2 22 suck the material to perform the transportation action.

[0034] The camera mechanism 3 includes a camera mounting plate 31 and an industrial camera 32. The camera mounting plate 31 is connected to the fixing bracket 26. The industrial camera 32 is mounted on the camera mounting plate 31 to realize the function of identifying material information.

[0035] The measuring mechanism 4 comprises a lower electrode seat 41, a lower electrode magnetic ring 42, a lower electrode 43, an upper electrode magnetic ring 44, an upper electrode 45, an upper electrode bracket 46, a slider module 47, a testing mechanism bracket 48, a cylinder connecting block 49, a spring screw 410, a spring 411, a zero adjustment rod fastening ring 412, a zero adjustment rod 413 and a cylinder 414; the lower electrode 43 is installed in the lower electrode magnetic ring 42, and the lower electrode magnetic ring 42 is installed on the lower electrode seat 41; the lower electrode The seat 41 is installed on the frame 7, the upper electrode 45 is installed in the upper electrode magnetic ring 44, the upper electrode magnetic ring 44 is connected to the upper electrode bracket 46, and the upper electrode 45 is directly above the lower electrode 43, the zero adjustment rod 413 is connected to the zero adjustment rod fastening ring 412; the zero adjustment rod fastening ring 412 is connected to the upper electrode bracket 46, the upper electrode bracket 46 is slidably connected with the slider module 1 47, the slider module 1 47 has a slide rail and a slider, and the upper electrode bracket 46 is fixed The slider slides on the slide rail, the slide rail of the slider module 47 is connected to the test mechanism bracket 48, one end of the cylinder connecting block 49 is connected to the top of the upper electrode bracket 46, and the other end of the cylinder connecting block 49 is connected to the telescopic end of the cylinder 414, and the cylinder 414 is connected to the test mechanism bracket 48, and the test mechanism bracket 48 is installed on the frame 7. The cylinder 414 can drive the upper electrode bracket 46 to slide upward. There are four spring screws 410 and two springs 411. The two springs 411 are respectively connected between the two sides of the upper electrode bracket 46 and the test mechanism bracket 48, that is, one end of each spring 411 is connected to the upper electrode bracket 46 through the spring screw 410, and the other end of the spring 411 is connected to the test mechanism bracket 48 through the spring screw 410. The spring 411 drives the upper electrode bracket 46 to slide downward, and the zero adjustment rod 413 is used to cooperate with the spacing adjustment mechanism 5 to realize the test spacing adjustment between the lower electrode 43 and the upper electrode 45.

[0036] The spacing adjustment mechanism 5 includes a motor 3 51, a connector 52, a motor mounting block 53, a spiral differential head 54, a differential head fixing block 55, a slider connecting plate 56, a micrometer limit plate 57, a contact rod 58, a micrometer fixing block 59, an adjustment mechanism mounting plate 510, a digital display micrometer 511 and a slider module 2 512; the motor 3 51 adopts a telescopic motor, the motor 3 51 is connected to the motor mounting block 53, the motor mounting block 53 is connected to the adjustment mechanism mounting plate 510, the adjustment mechanism mounting plate 510 is installed at the top of the frame 7, the output end of the motor 3 51 is connected to the shaft end of the spiral differential head 54 through the connector 52, the outer diameter of the spiral differential head 54 is connected to the differential head fixing block 55, the differential head fixing block 55 is connected to the slider connecting plate 56, and one end of the micrometer limit plate 57 is connected to the slider connecting plate 5 6 is connected, the contact rod 58 is connected to the top of the micrometer limit plate 57, and the contact rod 58 is directly below the zero adjustment rod. After the contact rod 58 passes through the top of the frame 7, it can contact the zero adjustment rod 413. The slider connecting plate 56 is slidably connected to the slider module 2 512. Similarly, the slider module 2 512 has a slide rail and a slider. After the slider connecting plate 56 is connected to the slider, it slides on the slide rail through the slider. The track of the slider module 2 512 is connected to the adjustment mechanism mounting plate 510, the micrometer fixing block 59 is connected to the adjustment mechanism mounting plate 510, the digital micrometer 511 is connected to the micrometer fixing block 59, and the head of the digital micrometer 511 is in contact with the bottom surface of the micrometer limit plate 57. In this way, the reading of the digital micrometer 511 changes with the height position change of the micrometer limit plate 57, thereby calculating the changed height.

[0037] The network analyzer 6 is electrically connected to the test mechanism 4 and the PC end respectively. After being tested by the test mechanism 4, the network analyzer 6 outputs a test frequency waveform and numbers. The numbers can be input into the PC end and then displayed by a display 8 connected to the PC end signal. The PC end is electrically connected to the motor 12 of the tray mechanism 1, the motor 2 of the transplanting mechanism 2, the industrial camera 32 of the camera mechanism 3, the cylinder of the test mechanism 4, the motor 3 51 of the spacing adjustment mechanism 5 and the digital display micrometer 511, and the network analyzer 6 respectively. The PC end is used to control the operation of the entire equipment.

[0038] The rack 7 includes a main body 72, which is used for installing various mechanisms, display 8, and network analyzer 6. An alarm light 73 is provided on the top of the main body 72, and four casters 71 are provided at the bottom of the main body 72. The alarm light 73 is used to display the equipment operation status and fault alarm, and the casters 71 are used for equipment level adjustment and equipment support.

[0039] When the device of the present invention is used, the basic information of the batch of wafers to be measured is entered into the PC, and the PC program transmits the information to each mechanism of the device, and the corresponding wafers to be measured are poured into the discharge box 13 of the tray mechanism 1. According to the use requirements, the tray mechanism 1 can place a maximum of 36 discharge boxes 13, and the discharge boxes 13 can be marked with numbers 1 to 36. The discharge boxes 13 on the tray 11 are rotated by the motor 12, and the rotation angle position of the motor 12 corresponds to the number 1 to 36 marked on the corresponding discharge box 13. At the same time, the motor 12 is controlled to rotate each discharge box 13 to the industrial camera 32 in the camera mechanism 3. When the wafer placed on the corresponding discharge box 13 can achieve the grasping position, the industrial camera 32 in the camera mechanism 3 identifies the wafer placed on the discharge box 13 and obtains the location information of the wafer, and controls the motor 22 in the transplanting mechanism 2 through the position information. 4 drives the suction nozzle 22 to rotate an angle to grab the wafer placed on the corresponding material box 13 identified by the industrial camera 32, and drives the upper electrode support 46 to slide through the cylinder 414 to control the upper electrode 45 to move upward, and then drives the suction nozzle 22 through the motor 24 of the transfer mechanism 2 to transfer the sucked wafer to the lower electrode 43 of the measuring mechanism 4, and then the motor 24 drives the suction nozzle 22 to continue to rotate to the other side of the lower electrode 43 to reserve measurement space. At this time, the gas that controls the upper electrode support 46 to slide by the cylinder 414 is disconnected, and the spring drives the upper electrode support 46 to slide to control the upper electrode 45 to slide downward. The contact rod 58 of the spacing adjustment mechanism 5 and the zero adjustment rod 413 of the measuring mechanism are just in contact to limit the position where the spring drives the upper electrode 45 to slide downward. This position is the positioning position of the upper electrode 45 and the lower electrode 43 for wafer measurement spacing.

[0040] The method for confirming the measured spacing between the upper electrode 45 and the lower electrode 43 on the wafer is as follows: the spacing S = (1.67*1000 / f(MHz)+30)um (f is the wafer frequency) is calculated by the PC end to obtain the measured spacing value;

[0041] The automatic adjustment method of the spacing is as follows: the spring 411 drives the upper electrode bracket 46 to slide to control the upper electrode 45 to slide downward until the zero adjustment rod 413 contacts the contact rod 58, and the motor three 51 rotates to make the contact rod 58 and the zero adjustment rod 413 move downward, and at the same time, the reading of the digital micrometer 511 keeps changing. When the upper electrode 45 and the lower electrode 43 just touch, the upper electrode 45 and the lower electrode 43 are connected. At this time, the reading of the digital micrometer 511 is used as the spacing zero point. The motor three 51 is controlled to rotate in the opposite direction through the PC output signal, and the contact rod 58 is controlled to drive the zero adjustment rod 413 to move upward. When the difference between the reading of the digital micrometer 511 and the spacing zero point reaches the PC-side calculated spacing S=(1.67*1000 / f(MHz)+30)um (f is the chip frequency), the motor three 51 stops rotating at this time, and the spacing adjustment between the upper electrode 45 and the lower electrode 43 is completed.

[0042] After the automatic adjustment of the spacing is completed, the frequency test can be performed, and the test data is obtained through the network analyzer 6, and then the test data is transmitted from the network analyzer 6 to the PC and displayed on the display 8. After the measurement data is completed, the motor 24 drives the suction nozzle 22 to transfer the tested wafer to the receiving box 14 of the tray mechanism 1 to complete a test. The test quantity can be changed on the PC side according to the needs, and the above actions are repeated until the test quantity is completed. When testing wafers with larger or smaller size specifications, it is necessary to consider replacing the size specifications of the suction hole of the suction nozzle 2 22 so that the suction nozzle 2 22 can grab the wafer without dropping the material.

[0043] In summary, although the present invention has been disclosed as above in terms of preferred embodiments, the above preferred embodiments are not intended to limit the present invention. A person skilled in the art may make various changes and modifications without departing from the spirit and scope of the present invention. Therefore, the scope of protection of the present invention shall be based on the scope defined in the claims.

Claims

1. A device for automatically measuring the frequency of a quartz crystal product, characterized in that: The invention comprises a frame (7), wherein a material tray mechanism (1), a transplanting mechanism (2), a camera mechanism (3) and a testing mechanism (4) are arranged on the top of the frame (7), and a spacing adjustment mechanism (5) is arranged in the frame (7) below the testing mechanism (4). The material tray mechanism (1) is used for loading and receiving materials, the transplanting mechanism (2) cooperates with the camera mechanism (3) for identifying the transported materials, and the testing mechanism (4) cooperates with the spacing adjustment mechanism (5) for measuring the material frequency.

2. The device for automatically measuring the frequency of a quartz crystal product according to claim 1, characterized in that: The material tray mechanism (1) comprises a material tray (11), a motor one (12) and a material box; the output end of the motor one (12) is connected to the material tray (11), a plurality of material boxes are provided, and the plurality of material boxes are arranged in the circumferential direction of the material tray (11).

3. The device for automatically measuring the frequency of a quartz crystal product according to claim 1, characterized in that: The transplanting mechanism (2) comprises a suction nozzle 1 (21), a suction nozzle 2 (22), a suction nozzle cantilever (23), a motor 2 (24) and a fixed bracket (26); the motor 2 (24) is mounted on the fixed bracket (26), the fixed bracket (26) is connected to the frame (7), the output end of the motor 2 (24) is connected to the suction nozzle cantilever (23), and the suction nozzle 1 (21) and the suction nozzle 2 (22) are both connected to the suction nozzle cantilever (23).

4. The device for automatically measuring the frequency of a quartz crystal product according to claim 3, characterized in that: The camera mechanism (3) comprises a camera mounting plate (31) and an industrial camera (32); the camera mounting plate (31) is connected to the fixing bracket (26); and the industrial camera (32) is mounted on the camera mounting plate (31).

5. The device for automatically measuring the frequency of a quartz crystal product according to claim 1, characterized in that: The testing mechanism (4) comprises an upper electrode magnetic ring (44), an upper electrode (45), an upper electrode bracket (46), a slider module (47), a testing mechanism bracket (48), a cylinder connecting block (49), a spring (411), a zero adjustment rod fastening ring (412), a zero adjustment rod (413) and a cylinder (414); the upper electrode (45) is installed in the upper electrode magnetic ring (44), the upper electrode magnetic ring (44) is connected to the upper electrode bracket (46), the zero adjustment rod (413) is connected to the zero adjustment rod fastening ring (412); the zero adjustment rod fastening ring (412) is connected to the upper electrode bracket (46), The upper electrode support (46) is slidably connected to the slider module (47), the slider module (47) is connected to the test mechanism support (48), one end of the cylinder connection block (49) is connected to the top of the upper electrode support (46), the other end of the cylinder connection block (49) is connected to the telescopic end of the cylinder (414), the cylinder (414) is connected to the test mechanism support (48), and the test mechanism support (48) is installed on the frame (7), there are two springs (411), and the two ends of the spring (411) are respectively connected to one side of the upper electrode support (46) and the test mechanism support (48).

6. The device for automatically measuring the frequency of a quartz crystal product according to claim 5, characterized in that: The testing mechanism (4) further comprises a lower electrode seat (41), a lower electrode magnetic ring (42) and a lower electrode (43); the lower electrode (43) is installed in the lower electrode magnetic ring (42); the lower electrode magnetic ring (42) is connected to the lower electrode seat (41); the lower electrode seat (41) is connected to the frame (7); and the lower electrode (43) is arranged directly below the upper electrode (45).

7. The device for automatically measuring the frequency of a quartz crystal product according to claim 6, characterized in that: The spacing adjustment mechanism (5) comprises a motor three (51), a motor mounting block (53), a spiral differential head (54), a differential head fixing block (55), a slider connecting plate (56), a micrometer limit plate (57), a contact rod (58), a micrometer fixing block (59), an adjustment mechanism mounting plate (510), a digital display micrometer (511) and a slider module two (512); the motor three (51) is connected to the motor mounting block (53), the motor mounting block (53) is connected to the adjustment mechanism mounting plate (510), the adjustment mechanism mounting plate (510) is installed at the top end of the frame (7), the output end of the motor three (51) is connected to the shaft end of the spiral differential head (54), the spiral differential head (54) is connected to the differential head fixing block (55), The micrometer head fixing block (55) is connected to the slider connecting plate (56), one end of the micrometer limit plate (57) is connected to the slider connecting plate (56), the contact rod (58) is directly below the zero adjustment rod (413), the contact rod (58) is connected to the top of the micrometer limit plate (57), the slider connecting plate (56) is slidably connected to the slider module 2 (512), the slider module 2 (512) is connected to the adjustment mechanism mounting plate (510), the micrometer fixing block (59) is connected to the adjustment mechanism mounting plate (510), the digital display micrometer (511) is connected to the micrometer fixing block (59), and the head of the digital display micrometer (511) is in contact with the bottom surface of the micrometer limit plate (57).

8. The device for automatically measuring the frequency of a quartz crystal product according to claim 1, characterized in that: The frame (7) comprises a main body (72), the top of the main body (72) is provided with an alarm light (73) and a display (8), and the bottom of the main body (72) is provided with a plurality of casters (71).

9. The device for automatically measuring the frequency of a quartz crystal product according to claim 8, characterized in that: The device further comprises a network analyzer (6) and a PC terminal, wherein the network analyzer (6) is electrically connected to the testing mechanism (4), and the PC terminal is electrically connected to the material tray mechanism (1), the transplanting mechanism (2), the camera mechanism (3), the testing mechanism (4), the spacing adjustment mechanism (5), the network analyzer (6) and the display (8) respectively.

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