Method, device and system for adjusting bias voltage of optical module and test equipment

Abstract

The embodiment of the invention discloses a method, device and system for adjusting bias voltage of an optical module and test equipment. The method comprises the following steps: acquiring a first bias voltage value of an optical module end at a first sampling moment; comparing the first bias voltage value with a target bias voltage value to obtain a first comparison result; obtaining a first target power supply output voltage value corresponding to the first bias voltage value according to the first comparison result based on a pre-constructed corresponding relation between the comparison result and the power supply output voltage value; and writing the first target power supply output voltage value into a register of the power supply management chip, so that the power supply management chip adjusts the output voltage to the first target power supply output voltage value. According to the application, the output voltage of the power supply can be adjusted according to the comparison result of the first bias voltage value of the optical module end at the first sampling moment and the target bias voltage value, so that the precision of the bias voltage value of the optical module end can meet the requirement, and the bias voltage of the optical module can be reliably and automatically adjusted.

Description

Technical Field

[0001] The present application belongs to the field of optical module testing technology, and specifically relates to a method, device, system and testing equipment for adjusting the pull-bias voltage of an optical module. Background Art

[0002] The bias voltage of the optical module is actually the power supply voltage of the optical module. In the test of the optical module, different manufacturers may try to provide different bias voltages to the optical module to observe the status of the optical module. Usually, the bias voltage is provided to the optical module by a power management chip, but the voltage output from the power management chip will be lost in the transmission path, resulting in a certain deviation between the voltage output from the source of the power management chip and the voltage at the optical module end.

[0003] In order to solve the above problems, the traditional approach is to calibrate the output voltage of the power management chip. The power management chip outputs some voltage values, records the voltage values ​​at the optical module end, and forms a linear equation, such as a linear equation or a quadratic equation, to compensate the voltage at the optical module end based on the linear equation.

[0004] However, the above method of compensating the bias voltage by calibration has the following drawbacks:

[0005] as follows:

[0006] 1. Different systems may achieve different accuracies. For example, for a system with good linearity, the calibration calculation is a linear equation, which is very simple. However, once nonlinear devices are involved, a quadratic equation or even a multi-variable equation may be required. This may be very accurate at some points, but will be very different at other points.

[0007] 2. When testing optical modules, manufacturers usually conduct three-temperature tests, including normal temperature, low temperature and high temperature. Calibration is usually performed at normal temperature, so the bias voltage accuracy at low and high temperatures cannot be met.

[0008] 3. As electronic components age, the original calibration coefficients may gradually become inapplicable, so they need to be returned to the factory for recalibration on a regular basis, which increases the workload of customers and suppliers and also affects the production efficiency of customers. Summary of the invention

[0009] The present application aims to solve at least one of the technical problems existing in the prior art, and discloses a method, device, system and testing equipment for adjusting the bias voltage of an optical module.

[0010] In a first aspect, the present application provides a method for adjusting a bias voltage of an optical module, the method comprising:

[0011] Obtain a first bias voltage value at the optical module end at a first sampling moment;

[0012] Comparing the first bias voltage value with a target bias voltage value to obtain a first comparison result;

[0013] Based on the pre-established correspondence between the comparison result and the power supply output voltage value, obtaining a first target power supply output voltage value corresponding to the first bias voltage value according to the first comparison result;

[0014] The first target power supply output voltage value is written into a register of a power management chip so that the power management chip adjusts the output voltage to the first target power supply output voltage value.

[0015] In some possible embodiments, the first comparison result is a first difference between the first bias voltage value and a target bias voltage value, and obtaining a first target power supply output voltage value corresponding to the first bias voltage value according to the first comparison result based on a pre-established correspondence between the comparison result and the power supply output voltage value includes:

[0016] If the absolute value of the first difference is less than a first threshold, taking the current power supply output voltage value as the first target power supply output voltage value;

[0017] If the absolute value of the first difference is greater than the first threshold and less than the second threshold, taking the difference between the current power supply output voltage value and the first difference as the first target power supply output voltage value;

[0018] If the absolute value of the first difference is greater than the second threshold, the difference between the current power supply output voltage value and the multiple of the first difference value is used as the first target power supply output voltage value.

[0019] In some possible embodiments, the multiple is 1 / 3 to 1 / 2 of the first difference.

[0020] In some possible embodiments, the method further includes:

[0021] The target bias voltage value is determined based on the current optical module test item.

[0022] In some possible embodiments, the method further includes:

[0023] Obtain a second bias voltage value at the optical module end at a second sampling moment; wherein the second sampling moment is a sampling moment after most of the first sampling moments;

[0024] Comparing the second bias voltage value with the target bias voltage value to obtain a second comparison result;

[0025] Based on the pre-established correspondence between the comparison result and the power supply output voltage value, obtaining a second target power supply output voltage value corresponding to the second bias voltage value according to the second comparison result;

[0026] The second target power supply output voltage value is written into a register of a power management chip so that the power management chip adjusts the output voltage to the second target power supply output voltage value.

[0027] In a second aspect, an embodiment of the present application provides a device for adjusting a bias voltage of an optical module, the device comprising:

[0028] An acquisition module, used to acquire a first bias voltage value at the optical module end at a first sampling moment;

[0029] A comparison module, configured to compare the first bias voltage value with a target bias voltage value to obtain a first comparison result;

[0030] a processing module, configured to obtain a first target power supply output voltage value corresponding to the first pull-bias voltage value according to the first comparison result based on a pre-established correspondence between the comparison result and the power supply output voltage value;

[0031] The adjustment module is used to write the first target power supply output voltage value into the register of the power management chip so that the power management chip adjusts the output voltage to the first target power supply output voltage value.

[0032] In a third aspect, an embodiment of the present application provides an optical module calibration system, the system comprising a power management chip, a microcontroller, an analog-to-digital converter, and an optical module, the power management chip being electrically connected to the optical module and the microcontroller, respectively, the analog-to-digital converter being electrically connected to the optical module and the microcontroller, respectively;

[0033] The analog-to-digital converter is used to obtain a first bias voltage value at the optical module end at a first sampling moment;

[0034] The microcontroller is used to compare the first bias voltage value with a target bias voltage value to obtain a first comparison result;

[0035] The microcontroller is further configured to obtain a first target power supply output voltage value corresponding to the first pull-bias voltage value according to the first comparison result based on a pre-established correspondence relationship between the comparison result and the power supply output voltage value;

[0036] The microcontroller is further used to write the first target power supply output voltage value into the register of the power management chip so that the power management chip adjusts the output voltage to the first target power supply output voltage value.

[0037] In a fourth aspect, an embodiment of the present application provides an optical module testing device, the optical module testing device comprising: a test box and an optical module fixture connected to the test box; the optical module fixture is provided with an optical module to be tested, the optical module to be tested is provided with an analog-to-digital converter, and a microcontroller and a power management chip are provided in the test box;

[0038] The power management chip is electrically connected to the optical module and the microcontroller respectively, and the analog-to-digital converter is electrically connected to the optical module and the microcontroller respectively;

[0039] The analog-to-digital converter is used to obtain a first bias voltage value at the optical module end at a first sampling moment;

[0040] The microcontroller is used to compare the first bias voltage value with a target bias voltage value to obtain a first comparison result;

[0041] The microcontroller is further configured to obtain a first target power supply output voltage value corresponding to the first pull-bias voltage value according to the first comparison result based on a pre-established correspondence relationship between the comparison result and the power supply output voltage value;

[0042] The microcontroller is further used to write the first target power supply output voltage value into the register of the power management chip so that the power management chip adjusts the output voltage to the first target power supply output voltage value.

[0043] In a fifth aspect, an embodiment of the present application provides an electronic device, including:

[0044] one or more processors;

[0045] A storage unit is used to store one or more programs, and when the one or more programs are executed by the one or more processors, the one or more processors can implement the method described above.

[0046] In a sixth aspect, an embodiment of the present application provides a computer-readable storage medium having a computer program stored thereon, and when the computer program is executed by a processor, the method described above can be implemented.

[0047] In a seventh aspect, an embodiment of the present application provides a computer program product, including a computer program, which, when executed by a processor, can implement the method described above.

[0048] Beneficial effects:

[0049] The embodiments of the present application provide a method, device, system and testing equipment for adjusting the bias voltage of an optical module, which can adjust the power supply output voltage according to the comparison result of the first bias voltage value at the optical module end at the first sampling moment and the target bias voltage value, so that the accuracy of the bias voltage value at the optical module end can meet the requirements, and the bias voltage of the optical module can be reliably and automatically adjusted, which not only ensures that the accuracy of the bias voltage setting is high enough, but also can automatically adapt to the three-temperature test of the optical module, and ensure the production efficiency of the optical module manufacturer. BRIEF DESCRIPTION OF THE DRAWINGS

[0050] The above and other features, advantages and aspects of the embodiments of the present application will become more apparent with reference to the following detailed description in conjunction with the accompanying drawings. Throughout the accompanying drawings, the same or similar reference numerals represent the same or similar elements. It should be understood that the drawings are schematic and that components and elements are not necessarily drawn to scale.

[0051] Figure 1 A flow chart of a method for adjusting the bias voltage of an optical module according to an embodiment of the present application;

[0052] Figure 2 A flow chart of a method for adjusting the bias voltage of an optical module according to another embodiment of the present application;

[0053] Figure 3 This is a schematic diagram of the structure of a device for adjusting the bias voltage of an optical module according to an embodiment of the present application;

[0054] Figure 4 A schematic diagram of the structure of an optical module calibration system according to an embodiment of the present application;

[0055] Figure 5 This is a schematic block diagram of an optical module testing device according to an embodiment of the present application. DETAILED DESCRIPTION

[0056] In order to enable those skilled in the art to better understand the technical solution of the present application, the present application is further described in detail below in conjunction with the accompanying drawings and specific implementation methods. Obviously, the described embodiments are part of the embodiments of the present application, rather than all of the embodiments. Based on the described embodiments of the present application, all other embodiments obtained by those of ordinary skill in the art without creative work are within the scope of protection of the present application.

[0057] Unless otherwise specified, the technical terms or scientific terms used in the embodiments of the present application should be the usual meanings understood by people with ordinary skills in the field to which the application belongs. The "include" or "comprising" used in the embodiments of the present application neither limit the shapes, numbers, steps, actions, operations, components, originals and / or their groups mentioned, nor exclude the occurrence or addition of one or more other different shapes, numbers, steps, actions, operations, components, originals and / or their groups, or add these. In addition, the terms "first" and "second" are only used for descriptive purposes, and cannot be understood as indicating or implying relative importance or implicitly indicating the quantity and order of the indicated technical features. Thus, the features defined as "first" and "second" can expressly or implicitly include one or more of these features. In the description of the embodiments of the present application, the meaning of "multiple" is two or more, unless otherwise clearly and specifically defined.

[0058] Unless otherwise specifically stated, the relative arrangement of the components and steps, numerical expressions and numerical values ​​set forth in these embodiments do not limit the scope of the present application. At the same time, it should be understood that, for ease of description, the sizes of the various parts shown in the drawings are not drawn according to the actual proportional relationship, and the techniques, methods and devices known to ordinary technicians in the relevant fields may not be discussed in detail, but where appropriate, the techniques, methods and devices shown should be considered as part of the authorization specification. In all examples shown and discussed here, any specific other examples may have different values. It should be noted that similar symbols and letters represent similar items in the following drawings, so once an item is defined in one drawing, it does not need to be further discussed in subsequent drawings.

[0059] In the description of the embodiments of the present application, the description with reference to the terms "one embodiment", "some embodiments", "example", "specific example", or "some examples" etc. means that the specific features, structures, materials or characteristics described in conjunction with the embodiment or example are included in at least one embodiment or example of the present application. In the embodiments of the present application, the schematic representations of the above terms do not necessarily refer to the same embodiments or examples. Moreover, the specific features, structures, materials or characteristics described may be combined in any one or more embodiments or examples in a suitable manner. In addition, those skilled in the art may combine and combine the different embodiments or examples described in the embodiments of the present application and the features of the different embodiments or examples, without contradicting each other.

[0060] Figure 1 The present invention is a flow chart of a method for adjusting the bias voltage of an optical module according to an embodiment of the present application.

[0061] like Figure 1As shown, a method for adjusting the bias voltage of an optical module includes the following steps S101 to S104:

[0062] Step S101: Obtain a first bias voltage value at the optical module end at a first sampling moment.

[0063] Specifically, in this step, the first bias voltage value of the optical module end can be collected through some software interfaces set by the optical module end. Alternatively, a collection hardware such as an analog-to-digital converter can be added between the optical module and the power management chip through some hardware interfaces set by the optical module end to collect the first bias voltage value of the optical module end. Of course, in addition to this, those skilled in the art can also adopt other methods to obtain the first bias voltage value of the optical module end, and this embodiment does not limit this.

[0064] It should be noted that the first sampling moment mentioned above may refer to a specific time point, which is usually determined according to the system clock or synchronization signal. In addition, the first sampling moment may also be a sampling time point set by the user, for example, a predetermined time after the power management chip provides voltage to the optical module, such as 5s, 10s, etc. as the first sampling moment, etc., and this embodiment does not limit this.

[0065] Step S102: Compare the first bias voltage value with the target bias voltage value to obtain a first comparison result.

[0066] Specifically, in this step, the first comparison result may be the difference between the first bias voltage value and the target bias voltage value, or the first comparison result may be the ratio of the first bias voltage value to the target bias voltage value, etc. This embodiment does not limit this.

[0067] Step S103: based on the pre-established correspondence between the comparison result and the power supply output voltage value, obtaining a first target power supply output voltage value corresponding to the first bias voltage value according to the first comparison result.

[0068] Specifically, in this step, a correspondence between the comparison result and the power supply output voltage value can be pre-constructed, and the correspondence can be pre-stored in the power management chip. When the first comparison result is obtained, the first target power supply output voltage value corresponding to the first pull-bias voltage value can be directly obtained according to the first comparison result.

[0069] In some embodiments, the first comparison result is a first difference between the first bias voltage value and the target bias voltage value, and if the absolute value of the first difference is less than a first threshold, the current power supply output voltage value is used as the first target power supply output voltage value. In other words, at this time, the bias voltage value at the optical module end meets the accuracy requirement, and there is no need to adjust the power supply output voltage value output by the power management chip, and it can be directly maintained at the current power supply output voltage value.

[0070] If the absolute value of the first difference is greater than the first threshold value and less than the second threshold value, the difference between the current power supply output voltage value and the first difference is used as the first target power supply output voltage value. Since the absolute value of the first difference is greater than the first threshold value and less than the second threshold value, it indicates that the deviation between the two is not large. Therefore, when compensating the voltage, the difference between the two can be directly compensated, and it will not cause too much voltage change. It is not difficult to understand that since the first difference is the difference between the first bias voltage value and the target bias voltage value, when the first bias voltage value is greater than the target bias voltage value, the first difference is a positive value, and negative compensation is required at this time. Therefore, the current power supply output voltage value minus the first difference is used as the first target power supply output voltage value; when the first bias voltage value is less than the target bias voltage value, the first difference is a negative value, and positive compensation is required at this time. At this time, the current power supply output voltage value minus the first difference is used as the first target power supply output voltage value. Since the first difference is a negative value, it is equivalent to adding the absolute value of the first difference to the current power supply output voltage value as the first target power supply output voltage value.

[0071] If the absolute value of the first difference is greater than the second threshold, the difference between the current power supply output voltage value and the multiple of the first difference is used as the first target power supply output voltage value. That is to say, when the absolute value of the first difference is greater than the second threshold, it means that the deviation between the two is relatively large. When compensating the voltage, in order to make the voltage change as gentle as possible, the embodiment only needs to compensate the multiple of the difference between the two when compensating the voltage. Similarly, since the first difference is the difference between the first bias voltage value and the target bias voltage value, when the first bias voltage value is greater than the target bias voltage value, the first difference is a positive value, and negative compensation is required at this time, so the current power supply output voltage value minus the multiple of the first difference is used as the first target power supply output voltage value; when the first bias voltage value is less than the target bias voltage value, the first difference is a negative value, and positive compensation is required at this time. At this time, the current power supply output voltage value minus the multiple of the first difference is used as the first target power supply output voltage value. Since the first difference is a negative value, it is equivalent to adding the absolute value of the multiple of the first difference to the current power supply output voltage value as the first target power supply output voltage value.

[0072] It should be noted that the first threshold and the second threshold can be determined according to empirical data, for example, the first threshold can be 5mv, the second threshold can be 50mv, etc. Of course, in addition to this, those skilled in the art can also set the first threshold to other values ​​according to actual needs, and this embodiment does not limit this, but it should be understood that the second threshold should be greater than or much greater than the value of the first threshold.

[0073] It should be further noted that the multiple may be 1 / 3 to 1 / 2 of the first difference. Preferably, the multiple is 1 / 2 of the first difference.

[0074] Step S104: writing the first target power supply output voltage value into a register of a power management chip so that the power management chip adjusts the output voltage to the first target power supply output voltage value.

[0075] Specifically, in this step, after obtaining the first target power supply output voltage value, the first target power supply output voltage value can be directly written into the register of the power management chip, so that the power management chip can directly call the first target power supply output voltage value stored in its register and use it as the current output voltage value.

[0076] The method for adjusting the bias voltage of an optical module in an embodiment of the present application can adjust the power supply output voltage according to the comparison result of the first bias voltage value at the optical module end at the first sampling moment and the target bias voltage value, so that the accuracy of the bias voltage value at the optical module end can meet the requirements, and the bias voltage of the optical module can be reliably and automatically adjusted, which not only ensures that the accuracy of the bias voltage setting is high enough, but also can automatically adapt to the three-temperature test of the optical module, and ensures the production efficiency of the optical module manufacturer.

[0077] In some embodiments, the method further includes: determining the target bias voltage value based on a current optical module test item.

[0078] Specifically, in this step, the target bias voltage values ​​corresponding to different optical module test items are not the same. Therefore, the embodiment of the present application will determine the corresponding target bias voltage value according to the current optical module test item, so as to meet the bias voltage accuracy requirements of different optical module test items.

[0079] It should be noted that there is no limitation on how to determine the target pull-bias voltage value based on the current optical module test item. For example, different optical module test item names can be pre-associated with the corresponding target pull-bias voltage values ​​and stored in the register or other storage area of ​​the power management chip. Then, the corresponding target pull-bias voltage value can be found according to the current optical module test item name.

[0080] In some embodiments, Figure 2As shown, the method further includes the following steps S105 to S108:

[0081] Step S105: Obtain a second bias voltage value at the optical module end at a second sampling time.

[0082] Specifically, in this step, the second sampling moment is a sampling moment after a plurality of first sampling moments, that is, the second sampling may be performed after a plurality of first sampling moments.

[0083] Step S106: Compare the second bias voltage value with the target bias voltage value to obtain a second comparison result.

[0084] Specifically, in this step, the process of comparing the second bias voltage value with the target bias voltage value to obtain the second comparison result is similar to the first comparison result described above, and the details can be referred to the relevant records above, which will not be repeated here.

[0085] Step S107 : based on the pre-established correspondence between the comparison result and the power supply output voltage value, obtaining a second target power supply output voltage value corresponding to the second bias voltage value according to the second comparison result.

[0086] Specifically, in this step, the process of obtaining the second target power supply output voltage value corresponding to the second bias voltage value according to the second comparison result is similar to the process of obtaining the first target power supply output voltage value corresponding to the first bias voltage value according to the first comparison result. For details, please refer to the relevant records in the previous text and will not be repeated here.

[0087] Step S108: writing the second target power supply output voltage value into a register of a power management chip so that the power management chip adjusts the output voltage to the second target power supply output voltage value.

[0088] Specifically, in this step, the process of writing the second target power supply output voltage value into the register of the power management chip so that the power management chip can adjust its output voltage is similar to the adjustment process of the first target power supply output voltage value mentioned above. For details, please refer to the relevant records in the previous text and will not be repeated here.

[0089] The method for adjusting the bias voltage of an optical module in an embodiment of the present application further adjusts the power supply output voltage according to the comparison result of the second bias voltage value at the optical module end at the second sampling moment and the target bias voltage value, so that the accuracy of the bias voltage value at the optical module end can be further made to meet the requirements, and the bias voltage of the optical module can be automatically adjusted, which not only ensures that the accuracy of the bias voltage setting is high enough, but also can automatically adapt to the three-temperature test of the optical module, and ensures the production efficiency of the optical module manufacturer.

[0090] Based on the same inventive concept, an embodiment of the present application also provides a device for adjusting the bias voltage of an optical module, which can be applied to the method described above. For details, please refer to the relevant records in the above text and will not be repeated here. Figure 3 This is a schematic structural diagram of a device for adjusting the bias voltage of an optical module according to another embodiment of the present application.

[0091] like Figure 3 As shown, the device includes: an acquisition module 301, a comparison module 302, a processing module 303 and an adjustment module 304. The acquisition module 301 is used to acquire the first bias voltage value at the optical module end at the first sampling moment. The comparison module 302 is used to compare the first bias voltage value with the target bias voltage value to obtain a first comparison result. The processing module 303 is used to obtain a first target power supply output voltage value corresponding to the first bias voltage value according to the first comparison result based on a correspondence between a pre-constructed comparison result and a power supply output voltage value. The adjustment module 304 is used to write the first target power supply output voltage value into the register of the power management chip so that the power management chip adjusts the output voltage to the first target power supply output voltage value.

[0092] The device for adjusting the bias voltage of an optical module in an embodiment of the present application can adjust the power supply output voltage according to the comparison result of the first bias voltage value at the optical module end at the first sampling moment and the target bias voltage value, so that the accuracy of the bias voltage value at the optical module end can meet the requirements, and can reliably and automatically adjust the bias voltage of the optical module, which not only ensures that the accuracy of the bias voltage setting is high enough, but also can automatically adapt to the three-temperature test of the optical module, and ensure the production efficiency of the optical module manufacturer.

[0093] Based on the same inventive concept, the embodiment of the present application provides an optical module calibration system. Figure 4 Schematic diagram of the structure of the optical module calibration system according to an embodiment of the present application.

[0094] like Figure 4 As shown, the system includes a power management chip 401, a microcontroller 402, an analog-to-digital converter 403 and an optical module 404, wherein the power management chip 401 is electrically connected to the optical module 404 and the microcontroller 402 respectively, and the analog-to-digital converter 403 is electrically connected to the optical module 404 and the microcontroller 402 respectively.

[0095] Specifically, the analog-to-digital converter 403 is used to obtain a first bias voltage value at the optical module end at a first sampling moment. The microcontroller 402 is used to compare the first bias voltage value with the target bias voltage value to obtain a first comparison result, and is also used to obtain a first target power supply output voltage value corresponding to the first bias voltage value according to the first comparison result based on a pre-constructed correspondence between the comparison result and the power supply output voltage value; and is also used to write the first target power supply output voltage value into a register of a power management chip so that the power management chip 401 adjusts the output voltage to the first target power supply output voltage value.

[0096] In the optical module calibration system of the embodiment of the present application, the microcontroller can adjust the power supply output voltage according to the comparison result of the first bias voltage value at the optical module end at the first sampling moment and the target bias voltage value of the analog-to-digital conversion module, so that the accuracy of the bias voltage value at the optical module end can meet the requirements, and the bias voltage of the optical module can be reliably and automatically adjusted, which not only ensures that the accuracy of the bias voltage setting is high enough, but also can automatically adapt to the three-temperature test of the optical module, and ensures the production efficiency of the optical module manufacturer.

[0097] Based on the same inventive concept, the embodiment of the present application also provides an optical module testing device, Figure 5 This is a schematic block diagram of an optical module testing device according to an embodiment of the present application.

[0098] like Figure 5 As shown, the optical module test equipment includes: a test box 501 and an optical module fixture 502 connected to the test box 501; the optical module fixture 502 is provided with an optical module 404, the optical module 404 is provided with an analog-to-digital converter 403, and the test box 401 is provided with a microcontroller 402 and a power management chip 401. The power management chip 401 is electrically connected to the optical module 404 and the microcontroller 402, respectively, and the analog-to-digital converter 403 is electrically connected to the optical module 404 and the microcontroller 402, respectively.

[0099] The analog-to-digital converter 403, the microcontroller 402 and the power management chip 401 can implement the optical module calibration described above. For details, please refer to the relevant records above and will not be repeated here.

[0100] In the optical module testing equipment of the embodiment of the present application, the microcontroller can adjust the power supply output voltage according to the comparison result of the first bias voltage value at the optical module end at the first sampling moment and the target bias voltage value of the analog-to-digital conversion module, so that the accuracy of the bias voltage value at the optical module end can meet the requirements, and the bias voltage of the optical module can be reliably and automatically adjusted, which not only ensures that the accuracy of the bias voltage setting is high enough, but also can automatically adapt to the three-temperature test of the optical module, and ensures the production efficiency of the optical module manufacturer.

[0101] Based on the same inventive concept, an embodiment of the present application provides an electronic device, including:

[0102] one or more processors;

[0103] A storage unit is used to store one or more programs, and when the one or more programs are executed by the one or more processors, the one or more processors can implement the method described above.

[0104] Based on the same inventive concept, an embodiment of the present application provides a computer-readable storage medium having a computer program stored thereon, and when the computer program is executed by a processor, the method described above can be implemented.

[0105] The computer-readable medium may be included in the apparatus, device, or system of the present invention, or may exist independently.

[0106] Among them, computer-readable storage media can be any tangible media that contains or stores a program, which can be an electronic, magnetic, optical, electromagnetic, infrared, or semiconductor system, device, or equipment. More specific examples include, but are not limited to: an electrical connection with one or more wires, a portable computer disk, a hard disk, an optical fiber, a random access memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or flash memory), a portable compact disk read-only memory (CD-ROM), an optical storage device, a magnetic storage device, or any suitable combination thereof.

[0107] The computer-readable storage medium may also include a data signal propagated in a baseband or as part of a carrier wave, which carries a computer-readable program code, specific examples of which include but are not limited to electromagnetic signals, optical signals, or any suitable combination thereof.

[0108] Based on the same inventive concept, an embodiment of the present application provides a computer program product, including a computer program, which can implement the method described above when executed by a processor.

[0109] It is to be understood that the above embodiments are merely exemplary embodiments used to illustrate the principles of the present application, but the present application is not limited thereto. For those skilled in the art, various modifications and improvements can be made without departing from the spirit and substance of the present application, and these modifications and improvements are also considered to be within the scope of protection of the present application.

Claims

1. A method for adjusting the bias voltage of an optical module, characterized in that: The method comprises: Obtain a first bias voltage value at the optical module end at a first sampling moment; Comparing the first bias voltage value with a target bias voltage value to obtain a first comparison result; Based on the pre-established correspondence between the comparison result and the power supply output voltage value, obtaining a first target power supply output voltage value corresponding to the first pull-bias voltage value according to the first comparison result; The first target power supply output voltage value is written into a register of a power management chip so that the power management chip adjusts the output voltage to the first target power supply output voltage value.

2. The method according to claim 1, characterized in that The first comparison result is a first difference between the first bias voltage value and the target bias voltage value, and the corresponding relationship between the comparison result and the power supply output voltage value established in advance is obtained according to the first comparison result. The first target power supply output voltage value corresponding to the first bias voltage value includes: If the absolute value of the first difference is less than a first threshold, taking the current power supply output voltage value as the first target power supply output voltage value; If the absolute value of the first difference is greater than the first threshold and less than the second threshold, taking the difference between the current power supply output voltage value and the first difference as the first target power supply output voltage value; If the absolute value of the first difference is greater than the second threshold, the difference between the current power supply output voltage value and the multiple of the first difference value is used as the first target power supply output voltage value.

3. The method according to claim 2, characterized in that The multiple is 1 / 3 to 1 / 2 times of the first difference.

4. The method according to any one of claims 1 to 3, characterized in that: The method further comprises: The target bias voltage value is determined based on the current optical module test item.

5. The method according to claim 1, characterized in that The method further comprises: Obtain a second bias voltage value at the optical module end at a second sampling moment; wherein the second sampling moment is a sampling moment after most of the first sampling moments; Comparing the second bias voltage value with the target bias voltage value to obtain a second comparison result; Based on the pre-established correspondence between the comparison result and the power supply output voltage value, obtaining a second target power supply output voltage value corresponding to the second bias voltage value according to the second comparison result; The second target power supply output voltage value is written into a register of a power management chip so that the power management chip adjusts the output voltage to the second target power supply output voltage value.

6. A device for adjusting the bias voltage of an optical module, characterized in that: The device comprises: An acquisition module, used to acquire a first bias voltage value at the optical module end at a first sampling moment; A comparison module, configured to compare the first bias voltage value with a target bias voltage value to obtain a first comparison result; a processing module, configured to obtain a first target power supply output voltage value corresponding to the first pull-bias voltage value according to the first comparison result based on a pre-established correspondence between the comparison result and the power supply output voltage value; The adjustment module is used to write the first target power supply output voltage value into the register of the power management chip so that the power management chip adjusts the output voltage to the first target power supply output voltage value.

7. An optical module calibration system, characterized in that: The system comprises a power management chip, a microcontroller, an analog-to-digital converter and an optical module, wherein the power management chip is electrically connected to the optical module and the microcontroller respectively, and the analog-to-digital converter is electrically connected to the optical module and the microcontroller respectively; The analog-to-digital converter is used to obtain a first bias voltage value at the optical module end at a first sampling moment; The microcontroller is used to compare the first bias voltage value with a target bias voltage value to obtain a first comparison result; The microcontroller is further configured to obtain a first target power supply output voltage value corresponding to the first pull-bias voltage value according to the first comparison result based on a pre-established correspondence relationship between the comparison result and the power supply output voltage value; The microcontroller is further used to write the first target power supply output voltage value into the register of the power management chip so that the power management chip adjusts the output voltage to the first target power supply output voltage value.

8. An optical module testing device, characterized in that: The optical module testing device comprises: a test box and an optical module fixture connected to the test box; the optical module fixture is provided with an optical module, the optical module is provided with an analog-to-digital converter, and the test box is provided with a microcontroller and a power management chip; The power management chip is electrically connected to the optical module and the microcontroller respectively, and the analog-to-digital converter is electrically connected to the optical module and the microcontroller respectively; The analog-to-digital converter is used to obtain a first bias voltage value at the optical module end at a first sampling moment; The microcontroller is used to compare the first bias voltage value with a target bias voltage value to obtain a first comparison result; The microcontroller is further configured to obtain a first target power supply output voltage value corresponding to the first pull-bias voltage value according to the first comparison result based on a pre-established correspondence relationship between the comparison result and the power supply output voltage value; The microcontroller is further used to write the first target power supply output voltage value into the register of the power management chip so that the power management chip adjusts the output voltage to the first target power supply output voltage value.

9. An electronic device, characterized in that: include: one or more processors; A storage unit, used to store one or more programs, which, when executed by the one or more processors, enable the one or more processors to implement the method according to any one of claims 1 to 5.

10. A computer-readable storage medium having a computer program stored thereon, characterized in that: When the computer program is executed by a processor, the method according to any one of claims 1 to 5 can be implemented.

Images