Method and system for evaluating service life of insulating part of switch cabinet

Abstract

The invention relates to the technical field of switch cabinet insulator aging, and discloses a switch cabinet insulator life evaluation method and system, and the method comprises the steps: obtaining a target insulator, and setting an aging label for the target insulator; matching the aging factor represented by the aging tag with the aging weight in a preset factor weight map, and generating a tag feature map of the target insulator based on a matching result; extracting graph features of the tag feature graph, and putting an evaluation request of the target insulator into a life evaluation queue; calculating the type coincidence rate of the current evaluation requests to be processed in the life evaluation queue, and readjusting the sequence of the evaluation requests in the life evaluation queue under the condition that the type coincidence rate is lower than a specified threshold value; according to the adjusted sequence, the evaluation requests in the life evaluation queue are sequentially processed, the technical problem that the processing efficiency is low when a large number of evaluation requests are processed in the prior art is solved, and the technical effect of improving the processing efficiency of the evaluation requests is achieved.

Description

Technical Field

[0001] The present application relates to the technical field of aging of insulating components of switch cabinets, and in particular to a life assessment method and system for insulating components of switch cabinets. Background Art

[0002] The insulation performance of high-voltage switchgear insulators has a vital impact on the normal operation of its equipment. The life of switchgear insulators is not only related to the stable operation of the power system, but also a key factor in ensuring the safety of operators. Therefore, the life assessment of switchgear insulators is particularly important. In the related technologies, the life assessment processing flow for switchgear insulators is relatively simple, and generally the assessment request is processed on a first-come, first-served basis. However, this processing method has the defect of low processing efficiency when faced with a large number of assessment requests. Summary of the invention

[0003] The present application provides a life assessment method and system for switch cabinet insulation components, which solves the technical problem of low processing efficiency when faced with a large number of assessment requests in the related art, and achieves the technical effect of improving the processing efficiency of assessment requests.

[0004] In order to achieve the above objectives, the main technical solutions adopted in this application include: In a first aspect, an embodiment of the present application provides a life assessment method for an insulating component of a switch cabinet, the method comprising: obtaining a target insulating component, and setting an aging label for the target insulating component based on an aging environment of the target insulating component, the aging label being used to characterize one or more aging factors existing in the aging environment, each of the aging factors having its own aging weight; matching the aging factor and the aging weight represented by the aging label in a preset factor weight map, and generating a label feature map of the target insulating component based on the matching result, wherein the factor weight map includes a plurality of candidate aging factors, and each of the candidate aging factors has a preset number of candidate aging weights, and the label feature map includes at least one hit candidate aging factor and one hit candidate aging weight; extracting a graph feature of the label feature map, querying a life assessment queue matching the graph feature, and placing an assessment request of the target insulating component into the life assessment queue; calculating a type overlap rate of the assessment requests currently to be processed in the life assessment queue, and when the type overlap rate is lower than a specified threshold, re-adjusting the order of the assessment requests in the life assessment queue; and processing the assessment requests in the life assessment queue in sequence according to the adjusted order.

[0005] The life assessment method of the switch cabinet insulating component provided in the present embodiment includes: obtaining a target insulating component, and setting an aging label for the target insulating component based on the aging environment of the target insulating component, wherein the aging label is used to characterize one or more aging factors existing in the aging environment, and each aging factor has its own aging weight; matching the aging factor and the aging weight represented by the aging label in a preset factor weight map, and generating a label feature map of the target insulating component based on the matching result, wherein the factor weight map includes a plurality of candidate aging factors, and each candidate aging factor has a preset number of candidate aging weights, and the label feature map includes at least one hit candidate aging factor and one hit candidate aging weight; extracting the graph feature of the label feature map, querying the life assessment queue matching the graph feature, and placing the assessment request of the target insulating component into the life assessment queue; calculating the type overlap rate of the assessment request currently to be processed in the life assessment queue, and readjusting the order of each assessment request in the life assessment queue when the type overlap rate is lower than a specified threshold; processing the assessment requests in the life assessment queue in sequence according to the adjusted order, solving the technical problem of low processing efficiency when facing a large number of assessment requests in the related technology, and achieving the technical effect of improving the processing efficiency of the assessment requests.

[0006] Optionally, the aging factor and aging weight represented by the aging label are matched in a preset factor weight map, and the label feature map of the target insulating component is generated based on the matching result, including: querying the aging factor represented by the aging label among the candidate aging factors in the factor weight map, and marking the queried aging factor as a hit status in the factor weight map; traversing each queried aging factor, and for any queried aging factor, marking the candidate aging weight corresponding to the queried aging factor as a hit status in the factor weight map according to the aging weight carried in the aging label; and determining the factor weight map marked with the hit status as the label feature map of the target insulating component.

[0007] Optionally, marking the candidate aging weight corresponding to the queried aging factor as a hit status in the factor weight map includes: among the candidate aging weights of the queried aging factor, querying the candidate aging weight closest to the aging weight carried in the aging label, and marking the closest candidate aging weight as a hit status; wherein, if there are multiple closest candidate aging weights queried, all of the multiple closest candidate aging weights queried are marked as hit status.

[0008] Optionally, querying the life assessment queue that matches the graphical feature includes: obtaining representative features of each life assessment queue, the representative features being obtained by weighted summation of graphical features of insulating parts corresponding to the assessment requests placed in the life assessment queue; calculating the similarity between the graphical feature and each of the representative features, and determining the life assessment queue corresponding to the representative feature with the highest similarity as the life assessment queue that matches the graphical feature.

[0009] Optionally, calculating the type overlap rate of the currently pending assessment requests in the life assessment queue includes: traversing the assessment requests in the life assessment queue, and for any adjacent first assessment request and second assessment request in the life assessment queue, identifying the first insulating component type corresponding to the first assessment request, and identifying the second insulating component type corresponding to the second assessment request; if the first insulating component type and the second insulating component type are consistent, accumulating the number of type overlaps; after the traversal is completed, calculating the ratio of the number of type overlaps to the total number of assessment requests in the life assessment queue, and using the calculated ratio as the type overlap rate.

[0010] Optionally, re-adjusting the order of each evaluation request in the life evaluation queue includes: adjusting the evaluation requests of the same type in the life evaluation queue to be arranged continuously.

[0011] Optionally, the aging weight of the aging factor in the aging label is configured in the following manner: obtaining an aging sample containing the aging factor, with the aging factor as the main aging factor in the aging sample; identifying the target influence ratio of the aging factor in each aging sample, and clustering the target influence ratio; generating one or more main influence ratios of the aging factor according to the clustering results, and screening out the largest main influence ratio from the one or more main influence ratios; and using the largest main influence ratio as the aging weight of the aging factor.

[0012] In a second aspect, an embodiment of the present application provides a life assessment system for switch cabinet insulating parts, the system comprising: a label setting unit, used to obtain a target insulating part, and based on the aging environment of the target insulating part, set an aging label for the target insulating part, the aging label is used to characterize one or more aging factors existing in the aging environment, and each of the aging factors has its own aging weight; a feature map generating unit, used to match the aging factors and aging weights represented by the aging labels in a preset factor weight map, and generate a label feature map of the target insulating part based on the matching result, wherein the factor weight map includes a number of candidate aging factors, and each of the candidate aging factors has a corresponding aging weight. A preset number of candidate aging weights are provided, wherein the label feature graph includes at least one hit candidate aging factor and one hit candidate aging weight; a request placement unit is used to extract the graph features of the label feature graph, query the life assessment queue matching the graph features, and place the assessment request of the target insulating component into the life assessment queue; a sequence adjustment unit is used to calculate the type overlap rate of the assessment requests currently to be processed in the life assessment queue, and readjust the order of each assessment request in the life assessment queue when the type overlap rate is lower than a specified threshold; a request processing unit is used to process the assessment requests in the life assessment queue in sequence according to the adjusted order.

[0013] Optionally, the feature map generation unit is specifically used to query the aging factor represented by the aging label among the candidate aging factors in the factor weight map, and mark the queried aging factor as a hit status in the factor weight map; traverse each queried aging factor, and for any queried aging factor, mark the candidate aging weight corresponding to the queried aging factor as a hit status in the factor weight map according to the aging weight carried in the aging label; and determine the factor weight map marked with the hit status as the label feature map of the target insulating part.

[0014] Optionally, the request placement unit is specifically used to obtain representative features of each life assessment queue, where the representative features are obtained by weighted summation of graphic features of the insulating parts corresponding to the assessment requests placed in the life assessment queue; calculate the similarity between the graphic features and each of the representative features, and determine the life assessment queue corresponding to the representative feature with the highest similarity as the life assessment queue that matches the graphic features.

[0015] In a third aspect, an embodiment of the present application provides a computer device, comprising: a memory and a processor, the memory and the processor are communicatively connected to each other, computer instructions are stored in the memory, and the processor executes the above-mentioned life assessment method for switch cabinet insulation parts by executing the computer instructions.

[0016] In a fourth aspect, an embodiment of the present application provides a computer-readable storage medium, on which computer instructions are stored, and the computer instructions are used to enable a computer to execute the above-mentioned life assessment method for switch cabinet insulation parts.

[0017] In a fifth aspect, an embodiment of the present application provides a computer program product, including computer instructions, which are used to enable a computer to execute the above-mentioned life assessment method for switch cabinet insulation parts. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] In order to more clearly illustrate the specific implementation methods of the present application or the technical solutions in the prior art, the drawings required for use in the specific implementation methods or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are some implementation methods of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative work.

[0019] Figure 1 A flow chart of a method for evaluating the life of an insulating component of a switch cabinet provided in an embodiment of the present application; Figure 2 A schematic diagram of a factor weight diagram provided in an embodiment of the present application; Figure 3 A schematic diagram of a life assessment system for switch cabinet insulation components is provided for an embodiment of the present application; Figure 4 A schematic diagram of the structure of a computer device provided in an embodiment of the present application. DETAILED DESCRIPTION

[0020] In order to make the purpose, technical solution and advantages of the embodiments of the present application clearer, the technical solution in the embodiments of the present application will be clearly and completely described below in conjunction with the drawings in the embodiments of the present application. Obviously, the described embodiments are part of the embodiments of the present application, not all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by those skilled in the art without creative work are within the scope of protection of the present application.

[0021] The insulation performance of high-voltage switchgear insulators has a vital impact on the normal operation of its equipment. The life of switchgear insulators is not only related to the stable operation of the power system, but also a key factor in ensuring the safety of operators. Therefore, the life assessment of switchgear insulators is particularly important. In the related technologies, the life assessment processing flow for switchgear insulators is relatively simple, and generally the assessment request is processed on a first-come, first-served basis. However, this processing method has the defect of low processing efficiency when faced with a large number of assessment requests.

[0022] An embodiment of the present application provides a method for assessing the life of insulating components of a switch cabinet. It should be noted that the steps shown in the flowchart of the accompanying drawings can be executed in a computer system such as a set of computer executable instructions, and although a logical order is shown in the flowchart, in some cases, the steps shown or described can be executed in an order different from that shown here.

[0023] See also Figure 1 , Figure 1 This is a flow chart of a method for evaluating the life of a switch cabinet insulation component provided in an embodiment of the present application. Figure 1 As shown, the process includes the following steps: Step S1, obtaining a target insulating component, and setting an aging label for the target insulating component based on the aging environment of the target insulating component, wherein the aging label is used to characterize one or more aging factors existing in the aging environment, and each of the aging factors has its own aging weight.

[0024] Among them, the aging label of the target insulation component will indicate which aging factors affect the current target insulation component, such as thermal aging, electrical aging, humidity aging, etc. Different aging factors have different aging weights. The aging factor with a greater impact on aging has a greater corresponding aging weight. Different aging labels can be set for different aging environments.

[0025] Step S3, matching the aging factor and aging weight represented by the aging label in a preset factor weight map, and generating a label feature map of the target insulating part based on the matching result, wherein the factor weight map includes a plurality of candidate aging factors, and each of the candidate aging factors has a preset number of candidate aging weights, and the label feature map includes at least one hit candidate aging factor and one hit candidate aging weight.

[0026] Specifically, the preset factor weight map includes several candidate aging factors and multiple candidate aging weights under each candidate aging factor. According to the aging label of the target insulating component, a label feature map of the target insulating component can be generated. Specifically, according to the aging factor of the aging label, a matching candidate aging factor in the factor weight map is selected, and according to the aging weight of the aging label, a matching candidate aging weight in the factor weight map is selected. According to the matching candidate aging factors and candidate aging weights in the factor weight map, a label feature map of the target insulating component is generated.

[0027] Step S5, extracting the graph feature of the label feature graph, searching for a life evaluation queue that matches the graph feature, and placing the evaluation request of the target insulating component into the life evaluation queue.

[0028] Among them, based on the label feature graph of the target insulating part, the graph features of the label feature graph can be extracted using a neural network. For the evaluation request of the target insulating part, if there is a life evaluation queue that matches its graph features, the evaluation request of the target insulating part is placed in the corresponding life evaluation queue. The life evaluation queue includes multiple evaluation requests. The target insulating parts corresponding to each evaluation request in the life evaluation queue have similar graph features, so that the processing efficiency of the evaluation requests in the life evaluation queue can be improved.

[0029] Step S7, calculating the type overlap rate of the evaluation requests currently to be processed in the life evaluation queue, and when the type overlap rate is lower than a specified threshold, re-adjusting the order of each evaluation request in the life evaluation queue.

[0030] Among them, the type overlap rate is used to characterize the similarity between the evaluation requests in the life evaluation queue. The higher the type overlap rate, the higher the similarity of the evaluation requests in the life evaluation queue, and the higher the efficiency of processing the evaluation requests of the life evaluation queue. If the type overlap rate is lower than the specified threshold, it means that the similarity of the evaluation requests in the life evaluation queue is low, and the order of the evaluation requests needs to be readjusted to improve the processing efficiency of the evaluation requests of the life evaluation queue.

[0031] Step S9: Processing the evaluation requests in the life evaluation queue in sequence according to the adjusted order.

[0032] The life assessment method of the switch cabinet insulating component provided in the present embodiment includes: obtaining a target insulating component, and setting an aging label for the target insulating component based on the aging environment of the target insulating component, wherein the aging label is used to characterize one or more aging factors existing in the aging environment, and each aging factor has its own aging weight; matching the aging factor and the aging weight represented by the aging label in a preset factor weight map, and generating a label feature map of the target insulating component based on the matching result, wherein the factor weight map includes a plurality of candidate aging factors, and each candidate aging factor has a preset number of candidate aging weights, and the label feature map includes at least one hit candidate aging factor and one hit candidate aging weight; extracting the graph feature of the label feature map, querying the life assessment queue matching the graph feature, and placing the assessment request of the target insulating component into the life assessment queue; calculating the type overlap rate of the assessment request currently to be processed in the life assessment queue, and readjusting the order of each assessment request in the life assessment queue when the type overlap rate is lower than a specified threshold; processing the assessment requests in the life assessment queue in sequence according to the adjusted order, solving the technical problem of low processing efficiency when facing a large number of assessment requests in the related technology, and achieving the technical effect of improving the processing efficiency of the assessment requests.

[0033] In some embodiments, the aging factor represented by the aging label and the aging weight are matched in a preset factor weight map, and the label feature map of the target insulating component is generated based on the matching result, including: querying the aging factor represented by the aging label among the candidate aging factors in the factor weight map, and marking the queried aging factor as a hit status in the factor weight map; traversing each queried aging factor, and for any queried aging factor, marking the candidate aging weight corresponding to the queried aging factor as a hit status in the factor weight map according to the aging weight carried in the aging label; and determining the factor weight map marked with the hit status as the label feature map of the target insulating component.

[0034] See also Figure 2 , Figure 2 A schematic diagram of a factor weight graph provided in an embodiment of the present application. According to the aging factor and aging weight represented by the aging label, the candidate aging factors and candidate aging weights in the factor weight graph are queried and matched to determine the hit aging factor and candidate aging weight. According to the hit aging factor and candidate aging weight, the label feature graph of the target insulation component is determined.

[0035] In some embodiments, marking the candidate aging weight corresponding to the queried aging factor as a hit status in the factor weight graph includes: among the candidate aging weights possessed by the queried aging factor, querying the candidate aging weight closest to the aging weight carried in the aging label, and marking the closest candidate aging weight as a hit status; wherein, if there are multiple closest candidate aging weights queried, all of the multiple closest candidate aging weights queried are marked as hit status.

[0036] Among them, the aging weight corresponding to the aging factor in the aging label may not directly exist in the candidate aging weight. For example, for the aging factor 1, there are 9 candidate aging weights from 0.1 to 0.9 (with a step of 0.1) in the factor weight graph. The aging weight in the aging label is 0.15, so the candidate aging weight closest to 0.15 can be marked as a hit state, that is, 0.1 and 0.2 in the candidate aging weights are marked as hit states.

[0037] In some embodiments, querying a life assessment queue that matches the graphical feature includes: obtaining representative features of each life assessment queue, the representative features being obtained by weighted summing up the graphical features of the insulating parts corresponding to the assessment requests placed in the life assessment queue; calculating the similarity between the graphical feature and each of the representative features, and determining the life assessment queue corresponding to the representative feature with the highest similarity as the life assessment queue that matches the graphical feature.

[0038] Among them, the representative features of the life assessment queue can be obtained by weighted summing of the graph features of the assessment requests that have been placed in the life assessment queue. Before placing the assessment request in the life assessment queue, it is necessary to calculate the similarity between the graph features of the assessment request and the representative features of multiple life assessment queues. The higher the similarity, the higher the matching degree between the assessment request and the life assessment queue. The assessment request is placed in the life assessment queue corresponding to the representative feature with the highest similarity, and the similarity between the assessment requests in the life assessment queue is improved, thereby improving the processing efficiency of the assessment requests in the life assessment queue.

[0039] In some embodiments, calculating the type overlap rate of the currently pending assessment requests in the life assessment queue includes: traversing the assessment requests in the life assessment queue, and for any adjacent first assessment request and second assessment request in the life assessment queue, identifying the first insulating component type corresponding to the first assessment request, and identifying the second insulating component type corresponding to the second assessment request; if the first insulating component type and the second insulating component type are consistent, accumulating the number of type overlaps; after the traversal is completed, calculating the ratio of the number of type overlaps to the total number of assessment requests in the life assessment queue, and using the calculated ratio as the type overlap rate.

[0040] Among them, the consistency of the insulation type can be the consistency of the material type of the insulation, or the consistency of the function, etc. The standard of the consistency of the insulation type can be determined according to the actual situation. For example, the four evaluation requests A, B, C, and D currently to be processed are arranged in sequence in the life evaluation queue. In the process of calculating the type overlap rate of the evaluation requests in the life evaluation queue, the number of type overlaps between adjacent evaluation requests will be judged, that is, whether the insulation types of A and B are consistent, whether the insulation types of B and C are consistent, and whether the insulation types of C and D are consistent. Assuming that they are all consistent, the cumulative number of type overlaps is 3, and the type overlap rate is the ratio of the cumulative number of type overlaps 3 to the total number of evaluation requests 4, which can obtain a type overlap rate of 75%.

[0041] In some embodiments, re-adjusting the order of the evaluation requests in the life evaluation queue includes: adjusting the evaluation requests of the same type in the life evaluation queue to be arranged continuously.

[0042] Specifically, the graph features of the evaluation requests in the life evaluation queue are similar, but the types of insulation components corresponding to the evaluation requests are not necessarily the same. By further adjusting the order of the evaluation requests in the life evaluation queue, the evaluation requests of the same type are arranged consecutively together, that is, the aging requests corresponding to the insulation components of the same type are processed together, which is conducive to further improving the processing efficiency of the evaluation requests in the life evaluation queue.

[0043] In some embodiments, the aging weight of the aging factor in the aging label is configured as follows: obtaining an aging sample containing the aging factor, with the aging factor as the main aging factor in the aging sample; identifying the target influence ratio of the aging factor in each aging sample, and clustering the target influence ratio; generating one or more main influence ratios of the aging factor according to the clustering results, and screening out the largest main influence ratio from the one or more main influence ratios; and using the largest main influence ratio as the aging weight of the aging factor.

[0044] Among them, it is necessary to screen out aging samples with aging factors as the main influencing factors. If a and b are the main aging factors, samples with a and b as the main aging influencing factors can be selected. For example, the samples can include a (0.7) b (0.3), a (0.65) b (0.35), a (0.4) b (0.6), and a (0.35) b (0.65). If a is the target latent factor, that is, the most important aging factor, the target influence ratio of the aging factor in the aging sample is identified, including 0.7, 0.65, 0.4, and 0.35. Clustering the target influence ratio, it is obvious that 0.7 and 0.65 are in one category, and 0.4 and 0.35 are in another category. According to the clustering results, the main influence ratios of a include 0.68 (the mean of 0.7 and 0.65) and 0.38 (the mean of 0.4 and 0.35). Among them, the largest main influence ratio is 0.68, which can be used as the aging weight of aging factor 1 in the aging label.

[0045] Accordingly, please refer to Figure 3 , Figure 3 A schematic diagram of a life assessment system for switch cabinet insulation components provided in an embodiment of the present application is shown in FIG. Figure 3As shown, the life assessment system includes: a label setting unit, which is used to obtain a target insulating component and set an aging label for the target insulating component based on the aging environment of the target insulating component, wherein the aging label is used to characterize one or more aging factors existing in the aging environment, and each of the aging factors has its own aging weight; a feature map generating unit, which is used to match the aging factors and aging weights represented by the aging label in a preset factor weight map, and generate a label feature map of the target insulating component based on the matching result, wherein the factor weight map includes a plurality of candidate aging factors, and each of the candidate aging factors has a preset number of candidate aging weights. The label feature map includes at least one hit candidate aging factor and one hit candidate aging weight; a request placement unit is used to extract the map feature of the label feature map, query the life assessment queue matching the map feature, and put the assessment request of the target insulation part into the life assessment queue; a sequence adjustment unit is used to calculate the type overlap rate of the currently pending assessment requests in the life assessment queue, and readjust the order of each assessment request in the life assessment queue when the type overlap rate is lower than a specified threshold; a request processing unit is used to process the assessment requests in the life assessment queue in sequence according to the adjusted order.

[0046] In some embodiments, the feature map generation unit is specifically used to query the aging factor represented by the aging label among the candidate aging factors in the factor weight map, and mark the queried aging factor as a hit status in the factor weight map; traverse each queried aging factor, and for any queried aging factor, according to the aging weight carried in the aging label, mark the candidate aging weight corresponding to the queried aging factor as a hit status in the factor weight map; determine the factor weight map marked with the hit status as the label feature map of the target insulating part.

[0047] In some embodiments, the request placement unit is specifically used to obtain representative features of each life assessment queue, where the representative features are obtained by weighted summation of graphic features of the insulating parts corresponding to the assessment requests placed in the life assessment queue; calculate the similarity between the graphic features and each of the representative features, and determine the life assessment queue corresponding to the representative feature with the highest similarity as the life assessment queue that matches the graphic features.

[0048] See also Figure 4 , Figure 4 is a schematic diagram of the structure of a computer device provided in an embodiment of the present application, such as Figure 4As shown, the computer device includes: one or more processors 10, a memory 20, and interfaces for connecting various components, including high-speed interfaces and low-speed interfaces. Various components are connected to each other using different buses for communication, and can be installed on a common mainboard or installed in other ways as needed. The processor can process the instructions executed in the computer device, including instructions stored in or on the memory to display the graphical information of the GUI on an external input / output device (such as, a display device coupled to the interface). In some optional embodiments, if necessary, multiple processors and / or multiple buses can be used together with multiple memories and multiple memories. Similarly, multiple computer devices can be connected, and each device provides some necessary operations (for example, as a server array, a group of blade servers, or a multi-processor system). Figure 4 A processor 10 is taken as an example.

[0049] The processor 10 may be a central processing unit, a network processor or a combination thereof. The processor 10 may further include a hardware chip. The hardware chip may be a dedicated integrated circuit, a programmable logic device or a combination thereof. The programmable logic device may be a complex programmable logic device, a field programmable gate array, a general purpose array logic or any combination thereof.

[0050] The memory 20 stores instructions executable by at least one processor 10, so that the at least one processor 10 executes the method shown in the above embodiment.

[0051] The memory 20 may include a program storage area and a data storage area, wherein the program storage area may store an operating system, an application required for at least one function; the data storage area may store data created according to the use of the computer device, etc. In addition, the memory 20 may include a high-speed random access memory, and may also include a non-transient memory, such as at least one disk storage device, a flash memory device, or other non-transient solid-state storage device. In some optional embodiments, the memory 20 may optionally include a memory remotely arranged relative to the processor 10, and these remote memories may be connected to the computer device via a network. Examples of the above-mentioned network include, but are not limited to, the Internet, an intranet, a local area network, a mobile communication network, and combinations thereof.

[0052] The memory 20 may include a volatile memory, such as a random access memory; the memory may also include a non-volatile memory, such as a flash memory, a hard disk or a solid state drive; the memory 20 may also include a combination of the above types of memory.

[0053] The computer device further comprises a communication interface 30 for the computer device to communicate with other devices or a communication network.

[0054] The embodiment of the present application also provides a computer-readable storage medium. The above method according to the embodiment of the present application can be implemented in hardware, firmware, or implemented as a computer code that can be recorded in a storage medium, or is implemented as a computer code that is originally stored in a remote storage medium or a non-temporary machine-readable storage medium and will be stored in a local storage medium through a network download, so that the method described herein can be stored in such software processing on a storage medium using a general-purpose computer, a dedicated processor, or programmable or dedicated hardware. Among them, the storage medium can be a magnetic disk, an optical disk, a read-only storage memory, a random access memory, a flash memory, a hard disk or a solid-state hard disk, etc.; further, the storage medium can also include a combination of the above types of memories. It can be understood that a computer, a processor, a microprocessor controller, or programmable hardware includes a storage component that can store or receive software or computer code. When the software or computer code is accessed and executed by a computer, a processor, or hardware, the method shown in the above embodiment is implemented.

[0055] The embodiment of the present application provides a computer program product, which includes computer instructions, which are stored in a computer-readable storage medium. A processor of a computer device reads the computer instructions from the computer-readable storage medium, and the processor executes the computer instructions, so that the computer device executes the method of any embodiment of the present application.

[0056] Although the embodiments of the present application are described in conjunction with the accompanying drawings, those skilled in the art may make various modifications and variations without departing from the spirit and scope of the present application, and such modifications and variations are all within the scope defined by the appended claims.

[0057] The systems or units described in the above embodiments may be implemented by computer chips or entities, or by products with certain functions. A typical implementation device is a computer. Specifically, the computer may be, for example, a personal computer, a laptop computer, a cellular phone, a camera phone, a smart phone, a personal digital assistant, a media player, a navigation device, an email device, a game console, a tablet computer, a wearable device, or a combination of any of these devices.

[0058] For the convenience of description, the above device is described in various units according to their functions. Of course, when implementing the present application, the functions of each unit can be implemented in the same or multiple software and / or hardware.

[0059] Those skilled in the art will appreciate that the embodiments of the present application may be provided as methods, systems, or computer program products. Therefore, the present application may adopt the form of a complete hardware embodiment, a complete software embodiment, or an embodiment combining software and hardware. Moreover, the present application may adopt the form of a computer program product implemented on one or more computer-usable storage media (including but not limited to disk storage, CD-ROM, optical storage, etc.) containing computer-usable program codes.

[0060] The present application is described with reference to the flowcharts and / or block diagrams of the methods, systems and computer program products according to the embodiments of the present application. It should be understood that each process and / or block in the flowchart and / or block diagram, as well as the combination of the processes and / or blocks in the flowchart and / or block diagram, can be implemented by computer program instructions. These computer program instructions can be provided to a processor of a general-purpose computer, a special-purpose computer, an embedded processor or other programmable data processing device to generate a machine, so that the instructions executed by the processor of the computer or other programmable data processing device generate instructions for implementing the processes in the flowchart and / or block diagram. Figure 1 A process or multiple processes and / or boxes Figure 1 A device that provides the functions specified in a block or multiple blocks.

[0061] These computer program instructions may also be stored in a computer-readable memory capable of directing a computer or other programmable data processing device to operate in a specific manner, so that the instructions stored in the computer-readable memory produce an article of manufacture including an instruction device, which implements the process Figure 1 A process or multiple processes and / or boxes Figure 1 A function specified in one or more boxes.

[0062] These computer program instructions can also be loaded onto a computer or other programmable data processing device so that a series of operating steps are executed on the computer or other programmable device to produce a computer-implemented process, thereby providing instructions for implementing the process in the computer or other programmable device. Figure 1 A process or multiple processes and / or boxes Figure 1 The steps for the functions specified in one or more boxes.

[0063] It should also be noted that the terms "include", "comprises" or any other variations thereof are intended to cover non-exclusive inclusion, so that a process, method, commodity or device including a series of elements includes not only those elements, but also other elements not explicitly listed, or also includes elements inherent to such process, method, commodity or device. In the absence of more restrictions, an element defined by the sentence "comprises a ..." does not exclude the presence of other identical elements in the process, method, commodity or device including the element.

[0064] Each embodiment in this specification is described in a progressive manner, and the same or similar parts between the embodiments can be referred to each other, and each embodiment focuses on the differences from other embodiments. In particular, for the system embodiment, since it is basically similar to the method embodiment, the description is relatively simple, and the relevant parts can be referred to the partial description of the method embodiment.

[0065] The above is only an embodiment of the present application and is not intended to limit the present application. For those skilled in the art, the present application may have various changes and variations. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present application should be included in the scope of the claims of the present application.

[0066] Although the embodiments of the present application have been described in conjunction with the accompanying drawings, those skilled in the art may make various modifications and variations without departing from the spirit and scope of the present application, and such modifications and variations are all within the scope defined by the appended claims.

Claims

1. A method for evaluating the life of an insulating component of a switch cabinet, characterized in that: The method comprises: Acquire a target insulating component, and set an aging label for the target insulating component based on the aging environment of the target insulating component, wherein the aging label is used to characterize one or more aging factors existing in the aging environment, and each of the aging factors has its own aging weight; Matching the aging factor and aging weight represented by the aging label in a preset factor weight map, and generating a label feature map of the target insulating component based on the matching result, wherein the factor weight map includes a plurality of candidate aging factors, and each of the candidate aging factors has a preset number of candidate aging weights, and the label feature map includes at least one hit candidate aging factor and one hit candidate aging weight; Extracting the graph feature of the label feature graph, querying the life evaluation queue matching the graph feature, and placing the evaluation request of the target insulating component into the life evaluation queue; Calculating the type overlap rate of the evaluation requests currently to be processed in the life evaluation queue, and if the type overlap rate is lower than a specified threshold, re-adjusting the order of each evaluation request in the life evaluation queue; The evaluation requests in the life evaluation queue are processed in sequence according to the adjusted order.

2. The method according to claim 1, characterized in that Matching the aging factor and the aging weight represented by the aging label in a preset factor weight map, and generating the label feature map of the target insulating component based on the matching result includes: In the candidate aging factors in the factor weight graph, query the aging factor represented by the aging label, and mark the queried aging factor as a hit state in the factor weight graph; Traversing each aging factor found in the query, and for any aging factor found in the query, marking the candidate aging weight corresponding to the aging factor found in the query as a hit state in the factor weight map according to the aging weight carried in the aging tag; The factor weight map marked with the hit status is determined as the label feature map of the target insulating part.

3. The method according to claim 2, characterized in that Marking the candidate aging weight corresponding to the queried aging factor as a hit state in the factor weight graph includes: Among the candidate aging weights of the queried aging factor, query the candidate aging weight that is closest to the aging weight carried in the aging tag, and mark the closest candidate aging weight as a hit state; If there are multiple closest candidate aging weights found, all of the multiple closest candidate aging weights found are marked as hit states.

4. The method according to claim 1, characterized in that Querying the life evaluation queues matching the graph features includes: Acquire representative features of each life assessment queue, where the representative features are obtained by weighted summing of graph features of insulating parts corresponding to assessment requests placed in the life assessment queue; The similarity between the graph feature and each of the representative features is calculated, and the life assessment queue corresponding to the representative feature with the highest similarity is determined as the life assessment queue that matches the graph feature.

5. The method according to claim 1, characterized in that Calculating the type overlap rate of the evaluation requests currently to be processed in the life evaluation queue includes: Traversing the evaluation requests in the life evaluation queue, and for any adjacent first evaluation request and second evaluation request in the life evaluation queue, identifying a first insulating component type corresponding to the first evaluation request, and identifying a second insulating component type corresponding to the second evaluation request; If the first insulating member type is consistent with the second insulating member type, the number of times the types coincide is accumulated; After the traversal is completed, the ratio of the number of type overlaps to the total number of evaluation requests in the life evaluation queue is calculated, and the calculated ratio is used as the type overlap rate.

6. The method according to claim 1 or 5, characterized in that: Re-adjusting the order of each evaluation request in the life evaluation queue includes: The evaluation requests of the same type in the life evaluation queue are adjusted to be arranged continuously.

7. The method according to claim 1, characterized in that The aging weight of the aging factor in the aging tag is configured as follows: Acquiring an aging sample containing the aging factor, wherein the aging factor is used as a main aging factor in the aging sample; Identifying the target impact ratio of the aging factor in each aging sample, and clustering the target impact ratio; generating one or more main influencing ratios of the aging factor according to the clustering result, and screening out the largest main influencing ratio from the one or more main influencing ratios; The largest main influence ratio is used as the aging weight of the aging factor.

8. A life assessment system for switch cabinet insulation components, characterized in that: The system comprises: A label setting unit, used to obtain a target insulating component, and set an aging label for the target insulating component based on the aging environment of the target insulating component, wherein the aging label is used to characterize one or more aging factors existing in the aging environment, and each of the aging factors has its own aging weight; A feature map generating unit, used for matching the aging factor and aging weight represented by the aging label in a preset factor weight map, and generating a label feature map of the target insulating component based on the matching result, wherein the factor weight map includes a plurality of candidate aging factors, and each of the candidate aging factors has a preset number of candidate aging weights, and the label feature map includes at least one hit candidate aging factor and one hit candidate aging weight; A request placement unit, configured to extract a graph feature of the label feature graph, query a life evaluation queue that matches the graph feature, and place an evaluation request for the target insulating component into the life evaluation queue; A sequence adjustment unit, used for calculating the type overlap rate of the evaluation requests currently to be processed in the life evaluation queue, and readjusting the order of each evaluation request in the life evaluation queue when the type overlap rate is lower than a specified threshold; The request processing unit is used to process the evaluation requests in the life evaluation queue in sequence according to the adjusted order.

9. The system according to claim 8, characterized in that The feature map generating unit is specifically used to query the aging factor represented by the aging label among the candidate aging factors in the factor weight map, and mark the queried aging factor as a hit state in the factor weight map; Traversing each aging factor found in the query, and for any aging factor found in the query, marking the candidate aging weight corresponding to the aging factor found in the query as a hit state in the factor weight map according to the aging weight carried in the aging tag; The factor weight map marked with the hit status is determined as the label feature map of the target insulating part.

10. The system according to claim 8, characterized in that The request placement unit is specifically used to obtain representative features of each life assessment queue, where the representative features are obtained by weighted summation of graphic features of insulating parts corresponding to the assessment requests placed in the life assessment queue; calculate the similarity between the graphic features and each of the representative features, and determine the life assessment queue corresponding to the representative feature with the highest similarity as the life assessment queue that matches the graphic features.

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