Inspection in process of manufacturing module or module precursor

Abstract

An inspection in a process of manufacturing a module or module precursor includes: providing a single anode / cathode layer at a receiving point; conveying the stacking device to the receiving point; the stacking device receives the anode layer / cathode layer from the receiving point; detecting the position and / or orientation of the anode / cathode layer; the stacking device transports the anode layer / cathode layer to a stacking point; aligning the stacking device with the transported anode layer / cathode layer relative to the stacking point; and stacking the transported anode layer / cathode layer at the stacking point.

Description

Technical Field

[0001] The present invention discloses an inspection during the manufacture of a module or a module precursor. This module or its precursor can be, for example, a layer arrangement containing layer materials, an arrangement for a fuel cell or a battery cell, or a component for manufacturing a battery. This inspection is disclosed as a method and a device. For details, see the claims. The description also contains data on the structure and technical principle of the inspection as well as on device and method variants. Background Art

[0002] WO 2021 171 946A1 relates to an inspection device for inspecting the position of an electrode layer in a laminated material from one side of a release film, in which the release film and the electrode layer are bonded by an adhesive. An infrared irradiation unit irradiates the laminated material with infrared rays from one side of the release film. An infrared light-sensitive camera records the infrared light that passes through the release film and is reflected by the electrode layer. A detection unit detects the position of the electrode layer based on the image recorded by the camera. A laminated stack is stacked on a stacking table by a release layer and an electrode layer. A transport unit is used to transport the release layer and the electrode layer and is placed on the stacking table. The inspection device inspects the position of the electrode layer in the laminated stack released by the transport unit.

[0003] KR 10 23 70 748 B1 relates to an electrode layer charging device for a secondary battery. The device has an electrode layer receiving unit for receiving electrode layers, which are stacked together and fed one by one to a magazine unit. A visual inspection unit detects the orientation state of the electrode layer, specifically in that the visual inspection unit directs a large number of cameras at the electrode layers in the electrode layer. A charging drive is used to place the electrode layer on a stacking table by moving the electrode plate receiving unit toward the position of the stacking table.

[0004] In other known solutions, electrical short circuit testing is performed on the finished battery as well as in the precursors of the electrode stack. This process produces a high percentage of unusable (intermediate and final) products, since inaccurate finished electrode stacks are also laminated and thus ultimately processed into substandard battery cells. Summary of the invention

[0005] Technical issues

[0006] In view of this, a configuration and a processing method should be provided which allow the production of modules or module precursors, such as fuel cells or battery cells comprising layer materials, at high processing speeds, high precision, with reduced short-circuit risks and increased efficiency.

[0007] Technical Solutions

[0008] The inspection method in the process of manufacturing modules or module precursors includes the following steps, for example, in the following order: providing a single anode layer and / or cathode layer at a receiving point; transporting a stacking device to the receiving point; the stacking device receiving the anode layer / cathode layer from the receiving point; detecting the position and / or orientation of the anode layer / cathode layer; the stacking device transporting the anode layer / cathode layer to the stacking point; aligning the stacking device with the transported anode layer / cathode layer relative to the stacking point; and stacking the transported anode layer / cathode layer at the stacking point.

[0009] In a technical variant of the inspection method, the anode layers are transported to the stacking point alternately from the first side by the first stacking device and the cathode layers are transported to the stacking point from the opposite second side by the second stacking device. In a technical variant of the inspection method, the anode layers are transported to the stacking point alternately only from the first side by the first stacking device and only from the opposite second side by the second stacking device. This type of treatment is advantageous in that it ensures a classified treatment of the sensitive electrodes by the stacking device and that no impurities of the electrode coating can appear on the contact surfaces of the stacking device.

[0010] In a technical variant of the inspection method, the position and / or orientation of the anode layer / cathode layer is detected before the stacking device receives the anode layer / cathode layer from the receiving point and / or during the stacking device transports the anode layer / cathode layer to the stacking point. In a technical variant of the inspection method, the position and / or orientation of the anode layer / cathode layer is detected during the stacking device transports the anode layer / cathode layer to the stacking point with the help of a first camera and / or before the stacking device receives the anode layer / cathode layer from the receiving point with the help of a second camera.

[0011] To ensure precise positioning, in one technical variant the current position of the incoming anode / cathode layer during transport is first checked with the aid of a matrix camera and lighting (white light, adjustable from 0 to 20°).

[0012] In a technical variant of the inspection method, the first and / or second camera detects the position and / or orientation of the anode layer / cathode layer at a vertical top-down viewing angle of ± about 25°. In a technical variant of the inspection method, a white light source corresponding to the first and / or second camera illuminates the anode layer / cathode layer so that the first and / or second camera performs image acquisition. In a technical variant of the inspection method, the first and / or second camera performs a complete detection of the anode layer / cathode layer by (single) one image acquisition to detect its position and / or orientation. In a technical variant of the inspection method, the first and / or second camera detects a region, at least one corner area, two diagonal corner areas and / or at least one corner area and at least one segment of the anode layer / cathode layer by (single) one image acquisition to detect its position and / or orientation. In a technical variant of the inspection method, the first and / or second camera is designed as a line scan camera, which detects the position and / or orientation of the anode layer / cathode layer before the anode layer / cathode layer is received by the stacking device or when it reaches the receiving point or on the way to the receiving point.

[0013] In a technical variant of the inspection method, at least one optically effective element is provided upstream of the first and / or second camera to detect the position and / or orientation of the anode layer / cathode layer at one or more positions or areas before the anode layer / cathode layer is received by the stacking device or when it reaches the receiving point or on the way to the receiving point.

[0014] In a technical variant of the checking method, correction values ​​are determined from the position and / or orientation of the anode layer / cathode layer before it is received by the stacking device, the position and / or orientation of the stacking device and / or the position and / or orientation of the individual anode layers / cathode layers recorded during the transport of the anode layers / cathode layers to the stacking point. In a technical variant of the checking method, these correction values ​​are taken into account when aligning the stacking device with the transported anode layer / cathode layer relative to the stacking point. In a technical variant of the checking method, these correction values ​​are taken into account when aligning the stacking device for the stacking device to receive the anode layer / cathode layer, so that the anode layer / cathode layer is received by the stacking device in a centered zero position and / or aligned.

[0015] In a technical variant of the inspection method, the stacking device is positioned relative to the anode layer / cathode layer before / when the anode layer / cathode layer is accommodated using the calculated correction value so that the anode layer / cathode layer is received by the stacking device positioned in the zero position. To this end, the position and / or orientation of the stacking device relative to the anode layer / cathode layer at the receiving point can be corrected.

[0016] Similarly, during transport after receipt, the stacking device is positioned based on the correction values ​​from the image acquisition so that when placed on the stacking point, the stacking device places the anode layer / cathode layer on the electrode stack at the stacking point in a manner that matches the anode layer / cathode layer and with minimal correction movement or without further correction movement.

[0017] This method can be carried out in a very fast and high-precision manner. For example, the device to be described below is suitable for carrying out this method.

[0018] A device for conveying and inspecting modules or module precursors, comprising: a stacking device, which is determined and configured to receive a single anode layer / cathode layer at a receiving point; a conveying device, which is determined and configured to transport the stacking device to the receiving point and away from the receiving point; a first camera, which is determined and configured to detect the position and / or orientation of the anode layer / cathode layer on the way from the receiving point to the stacking point; an adjustment device, including at least one servo drive, which is determined and configured to manipulate the stacking device to receive the anode layer / cathode layer, and / or align the stacking device with the anode layer / cathode layer relative to the stacking point during the transportation of the anode layer / cathode layer to the stacking point, and / or stack the anode layer / cathode layer at the stacking point.

[0019] In a technical variant of the device, a first stacking device is provided and is configured to transport the anode layers to the stacking point from a first side, and a second stacking device is provided and is configured to transport the cathode layers to the stacking point from a second, opposite side, alternating with the first stacking device. In a technical variant of the device, the first stacking device transports the anode layers to the stacking point only from the first side, and the second stacking device transports the cathode layers to the stacking point only from the second, opposite side.

[0020] In a technical variant of the device, the first camera is determined and configured to detect the position and / or orientation of the anode layer / cathode layer during the transport of the anode layer / cathode layer by the stacking device to the stacking point. In a technical variant of the device, the second camera is determined and configured to detect the position and / or orientation of the anode layer / cathode layer before the stacking device receives the anode layer / cathode layer from the receiving point.

[0021] In a technical variant of the device, the first and / or second camera is determined and configured to detect the position and / or orientation of the anode layer / cathode layer at a vertical top-down viewing angle of ± approximately 25°. In a technical variant of the device, a white light source corresponding to the first and / or second camera is determined and configured to illuminate the anode layer / cathode layer so that the first and / or second camera can perform image acquisition. In a technical variant of the device, the first and / or second camera is determined and configured to perform a complete detection of the anode layer / cathode layer by (a single) image acquisition to detect its position and / or orientation. In a technical variant of the device, the first and / or second camera is determined and configured to detect a region, at least one corner area, two diagonal corner areas and / or at least one corner area and at least one segment of the anode layer / cathode layer by (a single) image acquisition to detect its position and / or orientation. In a technical variant of the device, the first and / or the second camera is designed as a line scan camera, which is determined and configured to detect the position and / or orientation of the anode layer / cathode layer before the anode layer / cathode layer is received by the stacking device or when it arrives at the receiving point or on the way to the receiving point.

[0022] In a technical variant of the device, at least one optically active element is provided upstream of the first and / or the second camera, which is determined and configured to detect the position and / or orientation of the anode layer / cathode layer at one or more positions or regions before the anode layer / cathode layer is received by the stacking device or when it reaches the receiving point or on the way to the receiving point. In a technical variant of the device, the at least one optically active element is a lens or a lens arrangement, a mirror or a mirror arrangement, a prism or a prism arrangement, a plane light, a coaxial annular light, a dark field light or a combination thereof.

[0023] In a technical variant of the device, the control unit is determined and configured to determine correction values ​​from the image acquisition and / or data from the detection device and / or the first and / or second camera, based on the position and / or orientation of the anode layer / cathode layer before it is received by the stacking device, the position and / or orientation of the stacking device and / or the position and / or orientation of each anode layer / cathode layer relative to the stacking device recorded during the transport of the anode layer / cathode layer to the stacking point. In a technical variant of the device, the control unit is determined and configured to take these correction values ​​into account when sending adjustment instructions to the adjustment device, the conveying device and / or the stacking device so that the stacking device is aligned with the transported anode layer / cathode layer relative to the stacking point. In a technical variant of the device, the control unit is determined and configured to take these correction values, the orientation and position of the stacking device into account when sending adjustment instructions to the adjustment device, the conveying device and / or the stacking device to receive the anode layer / cathode layer so that the stacking device receives the anode layer / cathode layer in a centered zero position and / or aligned with the electrode stack at the stacking point.

[0024] By checking the position of the incoming anode layer / cathode layer before or at the receiving point, the orientation and position of the stacking device when or before receiving the anode layer / cathode layer can be accurately determined. This enables the stacking device to receive the anode layer / cathode layer in a precisely determined and correct manner. In a technical variant, during the transport of the stacking device to the stacking point, the orientation and position of the lifted anode layer / cathode layer is further checked, which additionally improves the accuracy with which the anode layer / cathode layer is placed on the electrode stack at the stacking point.

[0025] Another inspection method in the process of manufacturing a module or a module precursor includes, for example, the following steps in the following order: providing a single anode layer / cathode layer; a stacking device transporting the anode layer / cathode layer to a stacking point; stacking the transported anode layer / cathode layer at the stacking point; inspecting the vertical edges of the electrode stack grown around the anode layer / cathode layer stacked at the stacking point and / or the electrode stack at the stacking point from at least one side angle; and inspecting the orientation and / or position of this or each stacked anode layer / cathode layer relative to the remaining electrode stacks grown at the stacking point.

[0026] This process allows the position of the top layer of the electrode stack to be determined precisely relative to the remaining layers. This inspection becomes increasingly important as the height of the electrode stack increases, since an incorrect placement of the top layer will inevitably lead to the electrode stack being rejected without further correction. However, the inspection becomes increasingly precise as the height of the electrode stack increases, since the geometrical areas to be measured (corners or vertical edges of the electrode stack) can be detected and evaluated more easily and more precisely.

[0027] In one technical variant of the method, this enables more precise correction values ​​to be calculated when placing the next layer on the electrode stack. Overall, this type of process with precise position checking can significantly reduce the risk of short circuits in, for example, fuel cells or battery cells.

[0028] This can also be clearly seen by the fact that solutions to date could only place layers with an accuracy of ±0.5 mm, while the solution proposed here is able to achieve an accuracy of ±0.1 mm and higher when placing the anode / cathode layers on the electrode stack in order to reduce rejects and increase efficiency.

[0029] After the anode / cathode layers have been placed on the electrode stack, the position / displacement between the layers is checked to check whether / how much the layers of the entire electrode stack are aligned with each other in the longitudinal or transverse direction. In one technical variant, the displacement between the layers is detected by (a single) image acquisition of at least one (high and / or transverse) side of the electrode stack (grown until the most recent image acquisition) by at least one third camera. By analyzing the acquired image acquisition by means of image processing (corner / edge search, etc.), it can be checked whether one or more layers of the electrode stack are higher or lower than the remaining layers in the longitudinal or transverse direction, and whether the anode / cathode layers are stacked with a predetermined accuracy. The alternatingly stacked anode and cathode layers of the electrode stack have different sizes, which result in (vertical) sides that are stepped in the side view, which require corresponding (image) processing. It may be relevant to this that the individual layers are higher or lower (on the side) than the remaining anode or cathode layers. It may also be relevant that the different anode / cathode layers always form steps of the same height in the entire electrode stack. The latter demonstrates that the stack of anode / cathode layers has no folds or bends.

[0030] To this end, in a technical variant of the method, the shape and / or size of the alternatingly stacked anode layers and cathode layers of an electrode stack are checked, which layers have different sizes and have (vertical) sides that are stepped in the z-direction in a side view. In a technical variant of the method, the alternatingly stacked anode layers and cathode layers of an electrode stack are checked to see to what extent the individual layers are higher or lower (at the side) than the remaining anode layers or cathode layers. In a technical variant of the method, it is checked to what extent the different anode layers / cathode layers deviate in the z-direction (vertical axis) to form a step in the electrode stack.

[0031] In a technical variant of the method, two third matrix cameras are used, which (seen from above) are aimed at diagonally opposite corners / (vertical) sides of the electrode stack at the placement point. In a technical variant of the method, the cameras are set according to the corresponding sides of the electrode stack. In a technical variant of the method, the corresponding sides of the electrode stack are illuminated by a (white) spotlight that illuminates the desired position.

[0032] In a technical variant of the method, four third matrix cameras are used, which (seen from above) are aimed at all four corners / (vertical) sides of the electrode stack at the placement point. In a technical variant of the method, background illumination (backlight) or dark field illumination (dark field) is achieved with the aid of corresponding light sources. In this way, the relevant areas of the different anode layers / cathode layers can be clearly seen in the transmitted light. In a technical variant of the method, mirrors or prisms are used to guide the light path of the third camera to adapt to the spatial conditions.

[0033] In a technical variant of the method, a third matrix camera is used, whose field of view looks at the electrode stack from above and completely detects the entire electrode stack with a single image acquisition, or two third matrix cameras are used, which respectively detect one of the two diagonal corners of the electrode stack from above, and a maximum of four third matrix cameras are used, which detect all four corners of the electrode stack from above and are aimed at the electrode stack at the placement point with a top-down perspective. In a technical variant, the light path of the camera is also guided by a corresponding mirror or prism configuration to adapt to the spatial conditions. In a technical variant, for lighting, a coaxial (red) lighting device and a (white) spotlight are applied to each of the third cameras.

[0034] This makes it possible to see very precisely that the anode / cathode layers are always stacked in the correct position on the electrode stack.

[0035] In one technical variant, the movement of the lifting device with the corresponding workpiece carrier along the vertical axis (z axis) and its inaccuracies are also taken into account by detecting the x, y position of the workpiece carrier at different z heights with a third camera before starting to place the anode layer / cathode layer to form the electrode stack. In this way, the third camera can be used to check whether the anode layer / cathode layer is stacked in the correct x, y position during the placement of the anode layer / cathode layer, which corresponds to the corresponding z position on the workpiece carrier on the lifting device. The accuracy of the rotation direction around the vertical axis (along theta) when the stacking device receives the anode layer / cathode layer can also be corrected in this way to achieve accurate stacking of the anode layer / cathode layer of the electrode stack later.

[0036] A device for conveying and inspecting modules or module precursors, equipped with: a receiving point for providing a single anode layer / cathode layer; a stacking device, which is determined and configured to transport the anode layer / cathode layer to the stacking point; and a camera, which is determined and configured to detect the electrode stack grown around the anode layer / cathode layer stacked at the stacking point and / or includes image acquisition of the vertical edges of the electrode stack along the z direction at the stacking point from at least one side angle; and a control unit, which is determined and configured to determine the orientation and / or position of this or each stacked anode layer / cathode layer relative to the remaining electrode stacks grown at the stacking point by image acquisition with a second camera.

[0037] In one technical solution of the device, the control unit is determined and configured to determine the position of the stacked anode layer / cathode layer relative to the remaining layers of the electrode stack, specifically by checking the position / twist / shift between the anode layers / cathode layers after the anode layers / cathode layers are placed on the electrode stack, and / or wherein the control unit is determined and configured to determine the shift between the anode layers / cathode layers by capturing an image of at least one (high and / or horizontal) side of the electrode stack with at least one third camera. In one technical solution of the device, the control unit is determined and configured to check the obtained image capture by corner / edge search to see whether one or more anode layers / cathode layers of the electrode stack are higher or lower than the remaining anode layers / cathode layers, and / or whether the accuracy is maintained when stacking the anode layers / cathode layers.

[0038] In a technical solution of the device, the control unit is determined and configured to determine the different sizes of the (vertical) sides that are stepped in the z-direction in a side view from the image acquisition of the alternating stacked anode layers and cathode layers of the electrode stack, and to check the shape and / or size of the stacked anode layers and cathode layers. In a technical variant of the device, the control unit is determined and configured to check the stacked anode layers and cathode layers to see to what extent each layer deviates above or below the remaining anode layers or cathode layers. In a technical variant of the device, the control unit is determined and configured to check the image acquisition to see to what extent the different anode layers / cathode layers deviate in the z-direction (vertical axis) to form steps in the electrode stack.

[0039] In a technical variant of the device, the control unit is determined and configured to receive image acquisitions from at least two third cameras, which include diagonally opposite corners of the electrode stack ES at the placement point observed from the side and above and / or its edges on the vertical axis (z axis) so as to inspect the stacked anode layers and cathode layers to see to what extent the individual layers deviate in the longitudinal and / or transverse directions of the layers in the x or y direction (lateral, longitudinal) and are higher / lower than the remaining anode layers or cathode layers of the electrode stack; and / or to check to what extent different anode layers / cathode layers deviate in the z direction (vertical axis) to form steps in the electrode stack.

[0040] In a technical variant of the device, the at least two third cameras are directed toward the (vertical) edges of the electrode stack and / or a (white) spotlight illuminates desired locations on the electrode stack to illuminate the corresponding edges of the electrode stack.

[0041] In a technical variant of the device, the control unit is determined and configured to receive image acquisitions from at least four third cameras, which include four corners of the electrode stack at the placement point observed from above to determine the position of the topmost stacked anode layer / cathode layer relative to at least one electrode stack layer located therebelow, specifically, after the anode layer / cathode layer is placed on the electrode stack, the position / torsion / displacement between each anode layer / cathode layer is checked with the aid of image acquisition by each of the four cameras.

[0042] In a technical variant of the device, the control unit is determined and configured to take into account the movement of the lifting device with the corresponding workpiece carrier along the vertical axis (z axis) and its inaccuracy, specifically, before starting to place the anode layer / cathode layer to form the electrode stack, the x, y position of the workpiece carrier at different z heights is detected by a third camera with the aid of image acquisition, the corresponding data is stored in a data memory for comparison with the x, y position of the workpiece carrier at different z heights during the placement of the anode layer / cathode layer, so as to check whether the stacking of the anode layer / cathode layer at the x, y position is within the accuracy corresponding to the corresponding z position on the workpiece carrier on the lifting device, and / or when the stacking device receives the anode layer / cathode layer, the orientation of the rotation direction around the z axis (vertical axis) is corrected (along theta).

[0043] The aforementioned processing method and device can greatly reduce the risk of short circuits in the modules thus formed, thereby also improving the overall quality and efficiency of the fuel cell or battery cell.

[0044] Overall, the above-described apparatus and method are capable of achieving an accuracy of ±0.1 mm or better at a high stacking throughput.

[0045] In the above, method aspects are expressed in apparatus terms, and vice versa, wherein both method aspects and apparatus aspects are used to illustrate configurations and their operations. BRIEF DESCRIPTION OF THE DRAWINGS

[0046] Further features, characteristics and advantages of the apparatus and the method can be found in the following description in conjunction with the accompanying drawings. Possible variations will be apparent to those skilled in the art with reference to the following description in conjunction with the accompanying drawings, wherein the accompanying drawings schematically illustrate the apparatus discussed herein and illustrate its operation. Among them:

[0047] Figure 1 is a schematic top view of an assembly line including inspection during the manufacturing process of a module or a module precursor;

[0048] Figure 1a a second camera arrangement for inspecting the layer before the layer is received by the stacking device;

[0049] Figure 2 for Figure 1 A schematic side view of a process station of an assembly line designed as a stacking unit;

[0050] Figure 2a A first technical variant for a second camera configuration for inspecting the layers during the transport of the layers by the stacking device from the receiving point to the stacking point;

[0051] Figure 2b a second technical variant for a second camera configuration for checking the layers during the transport of the layers by the stacking device from the receiving point to the stacking point;

[0052] Figure 3 A technical variant of a third camera configuration for inspecting the layers of the electrode stack after the stacking device has stacked the layers at the stacking point; and

[0053] Figure 3a for Figure 3 Top view of a technical variant of the third camera configuration in . DETAILED DESCRIPTION

[0054] Figure 1 A section of an assembly line 100 for producing modules or module precursors is schematically shown. The assembly line 100 is described here by way of example in conjunction with the production of fuel cells or battery cells containing layer materials and / or fluids. A central transport line 110 transports a plurality of workpiece carriers 120 between a plurality of process stations. The central transport line 110 is configured to transport the workpiece carriers 120 in groups in transport sections by means of drives not shown in further detail.

[0055] As a delivery station of the assembly line 100, a first cutting station or cutting station, not further shown, is configured to divide the first continuous layer material from the roll into identical rectangular pieces and deliver it to the carrier 82 as a series of individual anode layers AL. A second cutting station or cutting station, not further shown, is configured to divide the second continuous layer material from the roll into identical rectangular pieces and deliver it to the carrier 92 as a series of individual cathode layers KL. The first placement station 80 feeds the individual anode layers AL onto the transportable adhesive trays 212 of the first transport line 210 in order to deliver them to the stacking unit 138. The second placement station 90 feeds the individual cathode layers KL onto the transportable adhesive trays 312 of the second transport line 310 in order to deliver them to the stacking unit 138. On the way to the stacking unit 130, the anode and cathode layers AL, KL pass through the inspection stations 84, 94 corresponding to the respective transport lines 210, 310 in order to inspect the quality of the layers. In one technical variant, the cathode is a metal foil with a conductive coating on both sides and with protruding discharge tabs. In one technical variant, the anode is a metal foil with a conductive coating on both sides, which is laminated between two dielectric foils (spacers), wherein the current collecting tab protrudes from the side, that is, at one of the short sides between the spacers.

[0056] As an alternative to the transportable adhesive tray 212 of the first transport line 210 and the transportable adhesive tray 312 of the second transport line 310, in one technical variant, a negative pressure conveyor belt is provided. In this technical variant, the first and second transport lines 210, 310 also have a plurality of receiving points 221, 321. Here, the sensitive electrodes are also sorted to avoid impurities in the electrode coating.

[0057] The assembly line 100 has a first transport section 116 including a first receiving area 132, a stacking area 134 and a placement area 136. A plurality of (e.g., four) first lifting devices 135 are provided in the stacking area 134 to lift the workpiece carrier 120 from the slide 140 in the Z direction. The slide 140 can be positioned along the first transport section 116 along or opposite to the outward path 112. The slide 140 is configured to position a plurality of empty workpiece carriers 120 in groups from the receiving area 132 to the stacking area 134 and / or to position a plurality of stacks each carrying a stack made in the stacking area 134 from the stacking area 134 to the placement area 136. Each lifting device 135 is configured to lift and lower the corresponding workpiece carrier 120 from the slide 140 in a controlled manner for stacking. The slide 140 has a length in the conveying direction (x direction) of the workpiece carrier 120, which length corresponds approximately at least to the extension of the receiving area 132 and the stacking area 134 or the stacking area 134 and the placement area 136 in the conveying direction of the workpiece carrier 120. The slide 140 is arranged in a longitudinally movable manner on two opposite linear guides and has 2×N receivers 142 on each longitudinal side for N workpiece carriers 120 to be positioned. For this purpose, the lifting device 135 extends between the linear guides, so that during the movement of the slide 140 along the linear guides (in the x direction), the N workpiece carriers 120 can be lifted in the z direction and the workpiece carriers are kept in their respective x, y positions. Similarly, for the N workpiece carriers 120, the lifting device 150 is arranged in the receiving area 132, and one lifting device is arranged in the placement area 136 respectively.

[0058] In the technical variant shown here, a plurality of workpiece carriers 120 (here, in groups of four) can be removed from the central transport line 110 in the receiving area 132. In other technical variants, more or less than four workpiece carriers 120 can also be removed from the central transport line 110. For this purpose, the central transport line 110 has a lifting device 150 upstream of the stacking unit 130 in the receiving area 132, which in one technical variant can be part of the central transport line 110 and is designed here as a scissor lift. The lifting device 150 is configured to lift the workpiece carriers 120 in groups of four from the central transport line 110 in the receiving area 132 and place them on the slide 140. In one technical variant, the slide 140 can also be part of the central transport line 110. The slide 140 in the stacking unit 130 is controlled by a drive (not further shown) to move along or opposite to the conveying direction x of the workpiece carrier 120 so as to receive the group of workpiece carriers 120 in the receiving area 132, transport them from the receiving area 132 to the stacking area 134, and transport them from the stacking area 134 to the placement area 136.

[0059] In the stacking area 134, stacking devices 138 (here four) whose number corresponds to the number of workpiece carriers 120 in the group are used to transport the anode layers AL and the cathode layers KL from the first and second transport lines 210 and 310 on the two longitudinal sides of the central transport line 110 using negative pressure pallets or adhesive pallets 212 and 312 (also called shuttles) to the stacking area 134 (see Figure 1 ). In other words, each workpiece carrier 120 corresponds to two stacking devices 138 in the stacking area 134. For this purpose, the stacking devices 138 are configured with corresponding drives, not further shown, so as to move the stacking devices 138 vertically in the z direction individually to lift or sink each anode layer and cathode layer KL. In the technical variant shown here, the transport lines 210, 310 are respectively continuous transport lines and are configured to transport negative pressure pallets or adhesive pallets 212, 312 along closed tracks in a horizontal transport plane.

[0060] The following will combine Figure 2 The drive 224 described is used to move the stacking device 138 horizontally in the y direction alone and transversely to the central transport line 110, so as to transport the individual anode layers and cathode layers AL, KL from the pallets of the first and second transport lines 210, 310 to the corresponding stacking points 133 on the workpiece carriers 120 in the stacking area 134. Therein, on the workpiece carriers 120 removed from the central transport line 110, at the corresponding stacking points 133 of the stacking unit 130, the individual anode layers AL are alternately sent from the first side of the workpiece carrier 120 and the individual cathode layers KL are sent from the second side of the workpiece carrier 120 to the corresponding workpiece carrier 120, and are stacked on the corresponding workpiece carrier 120 to form an electrode stack ES. Figure 1 The assembly line 100 / stacking unit 130 shown exemplarily comprises four stacking points 133. In addition, the stacking unit 130 has a plurality of first lifting devices 135 acting in the z-direction, one for each workpiece carrier 120, in order to controllably lift the workpiece carrier 120 from the slide 140 in the z-direction and thereby separate it from the slide 140, and to controllably place the workpiece carrier 120 / these workpiece carriers 120 in the z-direction on the slide 140. In this way, the workpiece carriers 120 can be supplied with layer material to form the electrode stack ES, during which the slide 140 can move back and forth in the x-direction.

[0061] A flat receiver 137 with positioning pins 139 is provided at each stacking point 133, which receives an empty workpiece carrier 120 and holds it there precisely (see Figure 2 ).

[0062] Figure 2The workpiece carrier 120 in the stacking unit 130 is shown on one of the first lifting devices 135, which is lifted from a slide 140 (not shown) and is at a stacking point 133. As described below, the empty workpiece carrier 120 is filled at the stacking point 133 and then put back into the central transport line 110 to be transported to the next process station. As described above, the first lifting device 135 is used to remove the at least one empty workpiece carrier 120 from the central transport line 110. At each stacking point 133, the stacking device 138 stacks each anode layer AL ( Figure 2 Left) and the stacking device 138 connects each cathode layer KL ( Figure 2 The workpiece carrier 120 is alternately transported from both sides of the workpiece carrier 120 along and in the opposite direction to the y direction and stacked on the workpiece carrier 120 along the z direction. Thus, the electrode stack ES grows to the desired number of layers. In a technical variant, after each anode layer AL or cathode layer KL, the workpiece carrier 120 sinks along the z direction by the height / thickness of the anode layer AL or cathode layer KL.

[0063] Each of the stacking devices 138 is arranged and configured to receive the anode layers AL / cathode layers KL by means of controlled pneumatic negative pressure and to hold them above the workpiece carrier 120 during transport to the stacking point 133. Each stacking device 138 has a flat gripping tool to which negative pressure can be applied to hold and transport the anode layers AL / cathode layers AL, KL. In a technical variant, the anode layers AL / cathode layers KL can also be delivered to the stacking point 133 by means of a short controlled pneumatic overpressure shock, so that the layers AL, KL are stacked on the workpiece carrier 120.

[0064] The device described herein is used, in addition to transporting the layers AL, KL, to inspect the layers AL, KL on their way to the corresponding stacking point 133 on their corresponding transport lines 210, 310. For this purpose, receiving points 221, 321 are provided in the stacking area 134, to which the individual anode layers / cathode layers AL, KL are transported by means of negative pressure trays or adhesive trays 212, 312. Before the adhesive trays 212, 312 containing the anode layers / cathode layers arrive at the corresponding stacking point 133, the anode layers / cathode layers AL, KL are inspected by means of a second camera 220. This second camera 220 is used to position and / or orient the anode layers / cathode layers on their adhesive trays 212, 312 (here along x, y and theta) before the anode layers / cathode layers AL, KL are received from their adhesive trays 212, 312 by the stacking device 138. The anode layer AL or cathode layer KL can be inspected by the second camera 220 while the negative pressure tray or adhesive tray 212 , 312 transporting the anode layer / cathode layer AL, KL to be inspected moves along the closed track of the transport line 210 , 310 .

[0065] Alternatively, the anode layer AL or cathode layer KL can be inspected with the second camera 220 while the negative pressure tray or sticky tray 212, 312 transporting the anode layer / cathode layer AL, KL to be inspected stops (for a few milliseconds) and other negative pressure trays or sticky trays 212, 312 that can move along the closed track of the transport lines 210, 310 (such as the negative pressure tray or sticky tray immediately before and / or after the negative pressure tray or sticky tray 212, 312 that stops (briefly) for inspection with the second camera 220) move along the closed track of the transport lines 210, 310.

[0066] The second camera 220 is aligned in such a way that it can capture images of the position and / or orientation (along x, y and / or theta) of the corresponding anode layer / cathode layer AL, KL just before it reaches its receiving point 221, 321 during transportation from a vertical top-down perspective of the anode layer / cathode layer. Figure 2 Two first cameras 220 for the anode layer AL and the cathode layer KL are shown in FIG. Of course, a second camera 220 can also be set before each receiving point 221, 321 or only at the first receiving point 221, 321. A white light source 225 is provided at each first camera 220 (see Figure 1a ), which is used to illuminate the anode layer / cathode layer so that the camera 220 can collect images. Figure 1a The second camera 220 (as shown) is designed as a full-frame camera so that the anode layer / cathode layer can be completely detected by a single image acquisition, or the second camera 220 is designed as a line scan camera so that the position and / or orientation of the anode layer / cathode layer along x, y and / or theta can be detected during the transportation of the anode layer / cathode layer to the corresponding receiving point 221, 321. The full-frame camera can, for example, have a 24-megapixel digital image acquisition chip 220a. Depending on the accuracy, resolution and spatial conditions, the second camera 220 can also provide a top-down full-frame acquisition of the anode layer / cathode layer (using corresponding optical devices, such as a lens 226 and a 90° polarizer 227 that is semi-transparent to white light).

[0067] Each stacking device 138 corresponds to a conveying device 224 for conveying the stacking device 138 back and forth between the corresponding receiving point 221, 321 and the stacking point 133. Thus, the stacking devices 138 (here four) corresponding to the number of workpiece carriers 120 in the group are used to convey the anode layers AL and the cathode layers KL to the stacking area 134 (see FIG. 1 ) from the first and second conveying lines 210, 310 on the two longitudinal sides of the central conveying line 110 by means of negative pressure pallets or adhesive pallets 212, 312 (also called shuttles). Figure 1). In other words, each workpiece carrier 120 corresponds to two stacking devices 138 in the stacking area 134. For this purpose, the stacking device 138 is configured with a corresponding servo drive 138a so as to move the stacking device 138 vertically in the z direction alone to lift or sink each anode layer and cathode layer KL. The other drive 224 is used to move the stacking device 138 horizontally in the y direction alone transverse to the central transport line 110 so as to transport each anode layer and cathode layer AL, KL from the trays 211, 311 of the first and second transport lines 210, 310 to the corresponding stacking point 133.

[0068] A common horizontal linear guide is provided for each of two stacking devices 138 and is arranged above the respective workpiece carrier located in the stacking area 134. The linear guide extends from the receiving point of the transport line 210 to the receiving point of the transport line 310 and across the stacking area 134.

[0069] The sensors 230 serve as detection means for detecting the position and / or orientation (in x, y, z and / or theta) of the stacking device 138. These sensors 230 provide corresponding data to the control unit ECU, for the sake of clarity only the position of the stacking device 138 in the y direction is shown here.

[0070] On the way from the receiving point 221, 321 to the stacking point 133, each stacking device 138 passes by a first camera 260. These first cameras 260 are used to detect the position and / or orientation (along x, y, z and / or theta) of the anode layer / cathode layer AL, KL attached to the bottom side of the stacking device 138 relative to the stacking device 138 on the way to the stacking point 133. These data are input to the control unit ECU and processed there in order to control the corresponding regulating devices, such as servo drives 138a, 224, etc. This adjustment device also includes a pneumatic actuator not further shown so that the stacking device 138 receives and puts down the anode layer / cathode layer AL, KL. The electric or pneumatic actuator enables the stacking device 138 to be aligned along x, y, z and / or theta during the transportation of the anode layer / cathode layer to the stacking point 133, so that the anode layer / cathode layer AL, KL is in the optimal stacking position relative to the stacking point 133 and the electrode stack there, and is used to stack the anode layer / cathode layer at the stacking point 133.

[0071] The first camera 260 is used here to detect the position and orientation (along x, y, z and / or theta) of the anode layer / cathode layer AL, KL relative to the stacking device 138 before stacking the anode layer / cathode layer AL, KL at the stacking point 133. These data are transmitted to the control unit ECU and processed there. The control unit ECU obtains correction values ​​from the image acquisition and data from various detection devices. In particular, the correction values ​​are obtained from the position and orientation (along x, y, z and / or theta) of the anode layer / cathode layer AL, KL at the receiving point or on the way to the receiving point before being received by the stacking device 138, the position and orientation (along x, y, z and / or theta) of the stacking device 138 at the receiving point or on the way to the receiving point, and the position and orientation (along x, y, z and / or theta) of each anode layer / cathode layer received during the transportation of the anode layer / cathode layer to the stacking point 133 relative to the stacking device 138. These correction values ​​are used to align the stacking device 138 and the transported anode layer / cathode layer relative to the stacking point 133 along x, y, z and / or theta, so that the transported anode layer / cathode layer is accurately placed in its nominal position relative to the electrode stack ES at the stacking point 133. In other words, when the orientation and position (along x, y, z and / or theta) of the stacking device 138 are corrected when the adjustment instructions are sent to the adjustment device, the conveying device 224 and / or the stacking device 138 to receive the anode layer / cathode layer, these correction values ​​are converted in such a way that the anode layer / cathode layer is received by the stacking device 138, for example, in a centered zero position and / or aligned with the electrode stack at the stacking point 133.

[0072] The first camera 260 is aligned in such a way that the position and / or orientation (along x, y and / or theta) of the corresponding anode layer / cathode layer AL, KL just before reaching its stacking point 133 is detected by image acquisition from a vertical upward perspective during transportation of the anode layer / cathode layer. Figure 2 2 shows one of the second cameras 260 for the anode layer AL and one of the second cameras 260 for the cathode layer KL. Each second camera 260 is provided with a light source 275, such as a white light source, to illuminate the anode layer / cathode layer so that the first camera 260 can capture an image. Figure 1aThe first camera 260 is designed as a full-frame camera to completely detect the anode layer / cathode layer through a single image acquisition, or the first camera 260 is designed as a line scan camera to detect the position and / or orientation of the anode layer / cathode layer along x, y and / or theta during the transportation of the anode layer / cathode layer to the corresponding stacking point 133. The full-frame camera can, for example, have a 24-megapixel digital image acquisition chip 260a. Depending on the accuracy, resolution and spatial conditions, the first camera 260 can also provide an upward-looking full-frame acquisition of the anode layer / cathode layer (using corresponding optical devices, such as a lens 276 and a 90° deflector 277 that is semi-transparent to white light). The light source 275 can also be arranged in a pivotable manner to provide optimal light incidence for the corresponding anode layer / cathode layer AL, KL. Thus, for example, the first camera 260 can provide a field of view of at least 720×400 mm for the anode layer / cathode layer AL, KL at a resolution of 134 pm / pixel or higher.

[0073] An annular light source is arranged in the optical path of the second camera 260, i.e. in the region of the vertical section of the optical path. To enhance the contrast of surface defects, the light of the annular light source (about 600-780 nm) hits the bottom side of the anode or cathode at a low angle, i.e. less than 45 degrees.

[0074] Figure 2a A technical variant of the configuration of the second camera 260 is shown. The first camera 260 is also aligned in such a way that the position and / or orientation (along x, y and / or theta) of the respective anode layer / cathode layer AL, KL just before reaching its stacking point 133 during transport of the anode layer / cathode layer is detected by image acquisition from a vertical upward viewing angle.

[0075] and Figure 2 The difference from the configuration in is that the white light source 275 is provided here between the horizontal section of the optical path of the camera 260 and the stacking device 138. In addition, another translucent 90° polarizer 277a is provided between the camera 260 and the translucent 90° polarizer 277 to deflect the white light into the optical path directed toward the bottom side of the stacking device 138 including the anode layer / cathode layer, so that the first camera 260 can perform image acquisition. In addition, Figure 2a The camera configuration in is equivalent to Figure 2 Configuration in .

[0076] As an alternative to full-frame acquisition with the aid of a (single) camera, the position and / or orientation (along x, y and / or theta) of only selected areas, here, corner / edge areas of the anode layer / cathode layer AL, KL, can be detected with a vertical upward viewing angle during transport of the anode layer / cathode layer, just before the corresponding anode layer / cathode layer AL, KL reaches its stacking point 133.

[0077] For this reason, Figure 2b As shown, when the anode layer / cathode layer AL, KL passes over the camera, the corner area of ​​the anode layer / cathode layer AL, KL is detected vertically upward by two second cameras 260. In particular, during transportation ("on the fly", in the air), that is, during the continuous movement of the anode layer / cathode layer AL, KL held on the stacking device toward the stacking point 133, an image is captured for each corner of the layer KL attached to the stacking device 138 by means of negative pressure.

[0078] In front of each stacking point, one or two cameras 260 for the anode layer AL (on one side) and one or two cameras 260 for the cathode layer KL (on the other side) are provided. For the sake of clarity, only one camera 260 is shown in the figure. While the anode / cathode layer AL, KL held on the stacking device passes by the camera 260, first an image of one corner on the front edge of the layer AL or KL is taken, or first two images of the corners on the front edge of the layer AL or KL are taken respectively. Subsequently, first an image of one (preferably diagonal) corner on the rear edge of the layer AL or KL is taken, or two cameras 260 are used to take the other two corners on the rear edge of the layer AL or KL. The control unit ECU determines the correction values ​​(along x, y, z and / or theta) for the position / angular movement and orientation of the stacking device 138 relative to the electrode stack ES from the possible deviations between the positions of the corners on the front edge and the corners on the rear edge transversely to the transport direction of the corresponding layer AL or KL, so that when the stacking point 133 is reached, the anode layer / cathode layer AL, KL can be placed vertically on the electrode stack extremely quickly with only minimal (ideally even no) further correction required.

[0079] In a technical variant, the holding area of ​​the gripping tool in the stacking device 138 can be smaller than the area of ​​the anode layer / cathode layer AL, KL in order to receive and hold the anode layer / cathode layer AL, KL. The (four) corner regions of the gripping tool can be slotted, for example. Thus, during transport, the corner regions of the anode layer / cathode layer AL, KL can be illuminated from above, i.e. from the side, by a light source 275 resting against the gripping tool. This makes it possible to detect the edges of the cathode layer KL with a particularly high contrast to the surroundings.

[0080] exist Figure 2bIn the embodiment, each of the first cameras is configured to include a matrix camera 260 with a red coaxial ring illuminator 266 and / or a blue dark field illuminator 268. The dark field illuminator provides incident light at a low angle (here, less than 45° to the optical axis) so that, for example, the edge regions reflect or scatter light toward the camera, in which case the camera image appears contrast-clear and bright.

[0081] With this configuration, a square area of ​​approximately 21×21 mm can be inspected at a resolution of 10.8 um / pixel or higher.

[0082] Since there are a plurality of adjacent stacking units 130 , the inspection of the anode layer / cathode layer AL, KL can be performed in parallel.

[0083] A first group of non-directly adjacent electrode stacks or workpiece carriers 120 within the stacking area 134, such as multiple anodes of the first workpiece carrier and the third workpiece carrier, can be detected in a temporally overlapping manner using a corresponding second camera 260, and / or a second group of non-directly adjacent electrode stacks or workpiece carriers 120 within the stacking area that is different from the first group, such as multiple cathodes of workpiece carriers 2 and 4, can be detected in a temporally overlapping manner using a corresponding second camera 260.

[0084] Since adjacent stacking devices 138 move towards each other, i.e. in opposite directions in the Y direction, vibrations / oscillations can be compensated and efficient inspection can be achieved. In addition, the separate stacking devices 138 can process the anodes independently of the cathodes. This prevents sensitive electrodes from being placed alternately on the same surface. Impurities in the electrode coating are thus avoided.

[0085] Alternatively, the anode layers and cathode layers may be provided in groups at a plurality of receiving points of the respective transport lines 210 , 310 using negative pressure trays or adhesive trays 212 , 312 .

[0086] In another technical variant, the group inspection is performed by cameras 260 for the anode layer and for the cathode layer. In a technical variant not shown, for example, another resolution and another field of view are obtained, wherein four cameras 260 can also be used to simultaneously detect all four corners, or a line scan camera is used.

[0087] All of the above-described inspection technology variants are used to determine the exact position of the anode / cathode layers AL, KL at least once in order to perform alignment corrections before placement. By optically detecting the position and orientation of characteristic areas (corners, edges) of the layers AL, KL at the receiving point and / or during transport to the stacking point 133, and using the data obtained therefrom to correct the orientation of the stacking device 138 relative to the electrode stack ES at the stacking point 133 before and / or during transport of the layers AL, KL to the stacking point 133, placement can be performed efficiently in time with high precision.

[0088] Combine the following Figure 2 and Figure 3 Another inspection method used in the process of manufacturing a module or a module precursor is described. In the first step, a single anode layer / cathode layer AL, KL is provided on a corresponding negative pressure tray or an adhesive tray 212, 312. Subsequently, the single anode layer / cathode layer AL, KL is transported to a stacking point 133 by a stacking device 138. The transported anode layer / cathode layer AL, KL is stacked there. At the stacking point 133, the electrode stack ES grown around the anode layer / cathode layer AL, KL stacked at the stacking point 133 and / or the vertical edges including the electrode stack ES are detected at at least one side viewing angle. In a technical variant of the method, this detection of the side viewing angle or the vertical edge of the electrode stack ES provides image acquisition. Finally, the orientation and / or position of this or each stacked anode layer / cathode layer AL, KL relative to the remaining electrode stacks grown at the stacking point is inspected.

[0089] For example, the position of the stacked anode layers / cathode layers AL, KL relative to the remaining layers of the electrode stack ES is determined by checking the position / twist / shift between the anode layers / cathode layers AL, KL after placing them on the electrode stack ES. The shift between the anode layers / cathode layers (AL, KL) is determined, for example, by capturing an image of at least one (height and / or horizontal) side of the electrode stack ES by at least one third camera 320. Therein, the image capture obtained is checked by computer-assisted image processing through corner / edge search to see whether one or more anode layers / cathode layers AL, KL of the electrode stack ES are higher or lower than the remaining anode layers / cathode layers AL, KL in the side or longitudinal direction, and / or whether the predetermined accuracy is maintained when stacking the anode layers / cathode layers AL, KL. A technical variant of the edge search uses the Canny algorithm (Canny edge detection), which provides an image that ideally only contains the edges of the output image.

[0090] The alternately stacked anode layers AL and cathode layers KL of the electrode stack ES usually have different sizes. This results in a (vertical) side that is stepped in the z direction when stacked in a side view. This vertical side or the two vertical sides k1, k2 are checked by means of image acquisition, see Figure 3 In this case, the shape and / or size of the stacked anode layers AL and cathode layers KL are checked. In other technical variants, the stacked anode layers AL and cathode layers KL are checked to see to what extent the individual layers are higher or lower than the remaining anode layers or cathode layers AL, KL of the electrode stack ES in the lateral or longitudinal direction. These higher / lower parts ( Figure 3 ul, u2) in the electrode stack to determine the rotation around the vertical axis (along theta), or the degree to which different anode layers / cathode layers (AL, KL) deviate in the z direction (vertical axis) to form steps in the electrode stack ( Figure 3 s1, s2).

[0091] Figure 3 and Figure 3a 1 and 2. It shows how the two third cameras 320 are aligned with the diagonally opposite corners el, e2 of the electrode stack ES at the placement point and / or its sides k1, k2 on the vertical axis (z axis) (see FIG. Figure 3 ). Thus, the stacked anode layer (AL) and cathode layer (KL) are checked to see to what extent the individual layers deviate u1, u2 in the x or y direction (lateral, longitudinal) (see Figure 3 ) is higher / lower than the other anode layers or cathode layers AL, KL of the electrode stack ES in the longitudinal or transverse direction. In this way, the deviations s1, s2 (see Figure 3 ) for inspection.

[0092] In this process, the two third cameras 320 are directly aimed at the vertical edges of the electrode stack. In addition, in order to illuminate the corresponding edge of the electrode stack ES, a white spotlight 330 is used to illuminate the desired position at about 45° with the optical axis of the corresponding third camera 320.

[0093] exist Figure 3a In the variant illustrated with dashed lines in FIG. 1 , four third cameras 320 ′ are vertically directed from above with a spotlight 330 (not shown in further detail) at the four corners e1, e2, e3, e4 of the electrode stack at the placement point, as viewed from above. In this way, the position of the topmost stacked anode / cathode layer AL, KL relative to at least one electrode stack layer located below it can be determined. After the anode / cathode layers AL, KL have been placed on the electrode stack ES, the position / twist / displacement between the anode / cathode layers AL, KL is checked by image acquisition by each of the four cameras 320 ′.

[0094] With the aid of a camera 320 (see FIG. 1 ) which is directed laterally toward the vertical edge of the electrode stack ES Figure 3 ), the movement of the lifting device 135 with the corresponding workpiece carrier 120 along the vertical axis (z axis) can be determined by processing the corresponding image acquisition. Therefore, before starting to place the anode layer / cathode layer AL, KL to form the electrode stack ES, the x, y position of the workpiece carrier at different z heights is detected by image acquisition with the third camera 320. The corresponding data is stored for comparison with the x, y position of the workpiece carrier at different z heights during the placement of the anode layer / cathode layer, so as to check whether the stacking of the anode layer / cathode layer at the x, y position is within the accuracy, which corresponds to the corresponding z position on the workpiece carrier on the lifting device 135. In a technical variant, when the stacking device 138 receives the anode layer / cathode layer, the orientation (along theta) of the rotation direction around the z axis (vertical axis) is corrected using the data obtained above.

[0095] In one technical variant, the incorrectly placed layers are re-received from the electrode stack ES by means of processed data acquired by images from at least one of the cameras, in particular the third camera, using the stacking device 138 and are selectively replaced correctly on the electrode stack or transported to a location for disposal.

[0096] The above-mentioned variants of the device, its structure and operation, and the variants of the method are only used to better understand the structure, working mode and characteristics; they do not limit the present disclosure, for example, to several embodiments. Part of this figure is a schematic diagram. Part of it shows the basic characteristics and effects in a significantly enlarged manner in order to illustrate the functions, working principles, technical designs and features. Among them, each operating mode, each principle, each technical design and each feature disclosed in the figure or text can be freely and arbitrarily combined with all claims, each feature in the text and other figures, other operating modes, principles, technical designs and features contained in this disclosure or derived therefrom, so that all conceivable combinations can correspond to the program. The combination between all individual embodiments in the text (i.e. in each chapter of the specification) and in the claims, as well as the combination between different variants in the text, claims and drawings are also included. The claims also do not limit the disclosure content, and thus also do not limit the combination possibilities of all disclosed features with each other. All disclosed features are also explicitly disclosed separately here and disclosed in combination with all other features.

Claims

1. A method for inspecting a module or a module precursor during manufacture, comprising the following steps: - providing a single anode layer / cathode layer (AL, KL) at the receiving point (221, 321); - transporting the stacking device (138) to the receiving point (221, 321); - the stacking device (138) receives the anode layer / cathode layer (AL, KL) from the receiving point (221, 321); - detecting the position and / or orientation (in x, y, z and / or theta) of the anode layer / cathode layer (AL, KL); The stacking device (138) transports the anode layer / cathode layer (AL, KL) to the stacking point (133); - aligning the stacking device (138) with the transported anode / cathode layer (AL, KL) relative to the stacking point (133) (in x, y, z and / or theta); as well as - Stacking the transported anode / cathode layers (AL, KL) at the stacking point (133).

2. The inspection method according to claim 1, wherein alternately - transporting the anode layers (AL) from a first side to the stacking point (133) by means of a first stacking device (138), and - transporting the cathode layers (KL) to the stacking point (133) from the opposite second side by means of a second stacking device (138); and / or wherein alternately - transporting the anode layers (AL) to the stacking point (133) only from the first side by means of a first stacking device (138), and The cathode layers (KL) are transported to the stacking point (133) only from the opposite second side by means of a second stacking device (138).

3. The inspection method according to claim 1 or 2, wherein - before the stacking device (138) receives the anode layer / cathode layer (AL, KL) from the receiving point (221, 321), and / or - During the transport of the anode layer / cathode layer (AL, KL) by the stacking device (138) to the stacking point (133) The position and / or orientation of the anode layer / cathode layer (AL, KL) is detected; and / or wherein - during the transport of the anode layer / cathode layer (AL, KL) to the stacking point (133) by the stacking device (138) with the aid of a first camera (260), and / or Before the stacking device (138) receives the anode layer / cathode layer (AL, KL) from the receiving point (221, 321) by means of a second camera (220) - Detecting the position and / or orientation of the anode layer / cathode layer (AL, KL).

4. The inspection method according to claim 2 or 3, wherein: - the first and / or the second camera (260, 220) detects the position and / or orientation (along x, y, z and / or theta) of the anode layer / cathode layer (AL, KL) with a vertical top-down viewing angle of ± about 25°; and / or - a light source (275, 225) corresponding to the first and / or the second camera (260, 220) illuminates the anode layer / cathode layer (AL, KL) so that the first or second camera (260, 220) can capture an image; and / or - the first and / or the second camera (260, 220) performs a complete detection of the anode layer / cathode layer (AL, KL) by image acquisition to detect its position and / or orientation (along x, y, z and / or theta); and / or - the first and / or the second camera (260, 220) acquires an image through a single image acquisition -- a region of the anode layer / cathode layer (AL, KL), --At least one corner area, -- two diagonal corner areas, and / or --At least one corner area and at least one segment of an edge Performing detection to detect the position and / or orientation (along x, y, z and / or theta) of the anode layer / cathode layer (AL, KL); and / or -The first and / or the second camera (260, 220) is designed as a line scan camera, which detects the position and / or orientation (along x, y, z and / or theta) of the anode layer / cathode layer (AL, KL) before the anode layer / cathode layer is received by the stacking device (138) or when it reaches the receiving point (221, 321) or on the way to the receiving point (221, 321).

5. The inspection method according to any one of claims 1 to 4, wherein: -At least one optically effective element is provided upstream of the first and / or second camera (260, 220) so as to detect the position and / or orientation (along x, y, z and / or theta) of the anode layer / cathode layer at one or more positions or areas before the anode layer / cathode layer (AL, KL) is received by the stacking device (138) or when it reaches the receiving point (221, 321) or on the way to the receiving point (221, 321).

6. The inspection method according to any one of claims 1 to 5, wherein: -Correction value is given by the position and / or orientation (in x, y, z and / or theta) of the anode layer / cathode layer (AL, KL) before being received by the stacking device (138), - the position and / or orientation (in x, y, z and / or theta) of the stacking device (138), and / or - the position and / or orientation (in x, y, z and / or theta) of each anode layer / cathode layer (AL, KL) recorded during transport of the anode layer / cathode layer (AL, KL) to the stacking point (133) Find out; and - taking the correction value into account when aligning the stacking device (138) with the transported anode layer / cathode layer (AL, KL) relative to the stacking point (133) 133 (along x, y, z and / or theta); and / or - taking the correction values ​​(along x, y, z and / or theta) into account when aligning the stacking device (138) for the stacking device (138) to receive the anode layer / cathode layer (AL, KL) so that the anode layer / cathode layer (AL, KL) is received by the stacking device (138) in a centered zero position and / or aligned.

7. The inspection method according to any one of claims 1 to 6, wherein: - providing a plurality of individual anode layers or cathode layers (AL, KL) in groups at the corresponding receiving points (221, 321) according to the number of stacking units (130) within the stacking region (134).

8. A device for conveying and inspecting a module or a module precursor, comprising: - a stacking device (138) determined and configured for receiving a single anode layer / cathode layer (AL, KL) at a receiving point; a conveying device (224) which is designed and configured to convey the stacking device (138) to and from the receiving point (221, 321); a first camera (260) determined and configured to detect the position and / or orientation (in x, y, z and / or theta) of the anode / cathode layer (AL, KL) on the way from the receiving point (221, 321) to the stacking point (133); - a regulating device, comprising at least one servo drive, said regulating device being designed and configured for - manipulating the stacking device (138) to receive the anode layer / cathode layer (AL, KL), and / or - aligning the stacking device (138) with the anode layer / cathode layer (AL, KL) relative to the stacking point (133) 133 (along x, y, z and / or theta) during transport of the anode layer / cathode layer (AL, KL) to the stacking point (133) 133, and / or --The anode layer / cathode layer (AL, KL) is stacked at the stacking point (133) 133.

9. The device for conveying and inspecting a module or a module precursor according to claim 8, wherein A first stacking device (138) is provided and is configured to transport the anode layers (AL) to the stacking point from a first side, and a second stacking device (138) is provided and is configured to transport the cathode layers (KL) to the stacking point (133) alternately from an opposite second side; and / or wherein The first stacking device (138) transports the anode layers (AL) only from the first side, And the second stacking device (138) transports the cathode layers (KL) only from the opposite second side.

10. The device for transporting and inspecting modules or module precursors according to claim 8 or 9, wherein - a first camera (260) is determined and configured to detect the position and / or orientation of the anode layer / cathode layer (AL, KL) during the transport of the anode layer / cathode layer (AL, KL) by the stacking device (138) to the stacking point (133); and / or - The second camera (220) is determined and configured to detect the position and / or orientation of the anode layer / cathode layer (AL, KL) before the stacking device (138) receives the anode layer / cathode layer (AL, KL) from the receiving point (221, 321).

11. The device for transporting and inspecting modules or module precursors according to claim 8, 9 or 10, wherein - the first and / or the second camera (260, 220) is determined and configured to detect the position and / or orientation (along x, y, z and / or theta) of the anode layer / cathode layer (AL, KL) with a vertical top-down viewing angle of ± about 25°; and / or - the light source (275, 225) corresponding to the first and / or the second camera (260) is determined and configured to illuminate the anode layer / cathode layer (AL, KL) so that the first or second camera (260) can capture an image; and / or - the first and / or the second camera (260, 220) is determined and configured to perform a complete detection of the anode layer / cathode layer (AL, KL) by image acquisition in order to detect its position and / or orientation (along x, y, z and / or theta); and / or The first and / or the second camera (260, 220) is determined and configured to, through image acquisition -- a region of the anode layer / cathode layer (AL, KL), --At least one corner area, -- two diagonal corner areas and / or --At least one corner area and at least one segment of an edge Performing detection to detect the position and / or orientation (along x, y, z and / or theta) of the anode layer / cathode layer (AL, KL); and / or -The first and / or the second camera (260, 220) is designed as a line scan camera, which is determined and configured to detect the position and / or orientation (along x, y, z and / or theta) of the anode layer / cathode layer (AL, KL) before the anode layer / cathode layer is received by the stacking device (138) or when it reaches the receiving point (221, 321) or on the way to the receiving point (221, 321).

12. The device for transporting and inspecting modules or module precursors according to any one of claims 8 to 11, wherein -At least one optically effective element is provided upstream of the first and / or second camera (260, 220), which is determined and configured to detect the position and / or orientation (along x, y, z and / or theta) of the anode layer / cathode layer at one or more positions or areas before the anode layer / cathode layer (AL, KL) is received by the stacking device (138) or when it reaches the receiving point (221, 321) or on the way to the receiving point (221, 321).

13. The device for conveying and inspecting modules or module precursors according to any one of claims 8 to 12, wherein: - the control unit (ECU) is determined and configured to determine a correction value from the data from the detection device and / or the image acquisition of the first and / or second camera, wherein the correction value can be obtained by the position and / or orientation (in x, y, z and / or theta) of the anode layer / cathode layer (AL, KL) before being received by the stacking device (138), - the position and / or orientation (in x, y, z and / or theta) of the stacking device (138), and / or - determining the position and / or orientation (in x, y, z and / or theta) of the anode layers / cathode layers (AL, KL) relative to the stacking device (138) recorded during the transport of the anode layers / cathode layers (AL, KL) to the stacking point (133); as well as - taking the correction value into account when sending adjustment instructions to the adjustment device, the transport device (224) and / or the stacking device (138) so that the stacking device (138) and the transported anode layer / cathode layer (AL, KL) are aligned relative to the stacking point (133) (along x, y, z and / or theta); and / or - when sending adjustment instructions to the adjustment device, the conveying device (224) and / or the stacking device (138) to receive the anode layer / cathode layer (AL, KL), the correction value, the orientation and position (along x, y, z and / or theta) of the stacking device (138) are taken into account, so that the stacking device (138) receives the corresponding anode layer / cathode layer (AL, KL) in a centered zero position and / or aligned with the electrode stack at the stacking point (133). KL).

14. An apparatus for conveying and inspecting modules or module precursors according to any one of claims 8 to 13, wherein the transport line (210, 310) is configured and determined to provide anode layers / cathode layers (AL, KL) in groups at multiple receiving points (221, 321) using corresponding negative pressure trays or adhesive trays (212, 312).

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