Automatic test bench system and method based on product acceptance

Abstract

The embodiment of the invention relates to the technical field of automatic testing, and discloses an automatic test bench system and method based on product acceptance. The test operation layer comprises a function test module which is used for identifying the product number, the power supply voltage and the working current of a tested device. Automatically testing a discrete magnitude signal acquisition and output function and a 232 bus communication function to obtain a function test result; the code downloading control module is used for downloading a built-in code of the tested device and executing operation on the built-in code to obtain a code logic operation result; the single board testing module is used for testing components on a single board in the tested device to obtain a single board testing result; and the appearance and weight testing module is used for measuring the appearance size and the weight of the product of the tested device to obtain an appearance weight testing result. According to the invention, an all-around automatic test process is executed for the test process of mass products, and the acceptance efficiency of scientific and technological products is improved.

Description

Technical Field

[0001] The embodiments of the present invention relate to the field of automated testing technology, and in particular to an automated testing bench system and method based on product acceptance. Background Art

[0002] With the rapid development of electronic computer technology, various control systems, products and equipment are becoming increasingly complex, gradually developing from mechanization and semi-automation to intelligence and automation, and control system equipment is also changing from a single, independent structure to an integrated, integrated structure. The development of these technologies has undoubtedly increased the difficulty of performance testing and parameter testing of control systems, products and equipment.

[0003] Traditional testing technologies mostly rely on a single testing device to test a single device, or are dominated by split-type testing and manual single-step testing. A set of testing processes still takes a long time. The testing efficiency is low, and the demand for mass product testing is still not met. Summary of the invention

[0004] The purpose of the embodiments of the present invention is to provide an automatic test bench system and method based on product acceptance, which can perform a full range of automated testing processes on the testing process of large quantities of products and improve the acceptance efficiency of scientific and technological products.

[0005] To solve the above technical problems, one embodiment of the present invention provides an automatic test bench system based on product acceptance, wherein the test operation layer includes a functional test module, a code download control module, a single board test module, and an appearance and weight test module;

[0006] The functional test module is used to identify the product number of the device under test; identify the power supply voltage and working current of the device under test; use pre-built functional test cases to automatically test the discrete signal acquisition and output functions and 232 bus communication functions of the device under test to obtain functional test results;

[0007] The code download control module includes a code downloader and a code execution environment, and is used to download the built-in code of the device under test by using the code downloader, and execute the built-in code according to the code execution environment to obtain the code logic operation result;

[0008] The single board test module is used to perform test operations on components on the single board in the device under test using pre-built component test cases to obtain single board test results;

[0009] The appearance and weight test module is used to measure the product appearance size and weight of the device under test to obtain the appearance weight test result;

[0010] The test results of each layer in the test operation layer are sent to the system development layer.

[0011] The bottom of the device under test is provided with n annular contact surfaces for leading out electrical interfaces of connecting wires.

[0012] In addition, the interface auxiliary layer is provided with an electrical interface of an m-channel crimping socket discrete wire connector;

[0013] When the code download control module is executed, the device under test is connected to the interface auxiliary layer by using the connecting wires led out from the annular contact surface and the crimping socket loose-wire connector.

[0014] In addition, the interface auxiliary layer also includes a pre-built customized motherboard as an electrical interface, wherein the interface auxiliary layer can simultaneously connect multiple customized motherboards;

[0015] When executing the functional test module and the single board test module, the customized motherboard is connected to the pins of the single board in the device under test by using the pre-trained automatic solder joint connection service.

[0016] In addition, the automated solder joint connection service includes a solder joint automatic recognition model and a welding numerical control device, which is used to obtain the target pin corresponding to the component test case and obtain a photograph of the single board;

[0017] Using the solder joint automatic recognition model, identifying the soldering position of the target pin in the captured image;

[0018] The target pin is welded and connected to the customized motherboard by utilizing the welding numerical control control equipment according to the welding position.

[0019] In addition, the customized master is used to call a pre-built barcode scanner to scan the label on the device under test to identify the product number of the device under test;

[0020] Calling a pre-built program to control the current source to perform power supply detection on the single board, and identifying the power supply voltage and working current of the device under test;

[0021] The pre-built discrete quantity board is called, and high and low level signals are generated according to the functional test case, and the high and low level signals are used to drive and control the single board to obtain the functional test result.

[0022] In addition, the system development layer, the test operation layer and the interface auxiliary layer in the test bench system are connected via cables.

[0023] In addition, the system development layer includes a test control module and a data receiving module;

[0024] The test control module is used to select a pre-built test control interface according to the type of the device under test;

[0025] The test control interface includes test cases and product quality assessment standards corresponding to the device under test.

[0026] In addition, the data receiving module of the system development layer is used to receive module test results fed back by the function test module, code download control module, single board test module, and shape and weight test module;

[0027] According to the module test results, construct a test data record table;

[0028] According to the product quality assessment standard, the test data record table is automatically evaluated for product quality to obtain a product test evaluation report;

[0029] The test data record table and product test evaluation report are visually output.

[0030] A specific embodiment of the present invention further provides a method for controlling the automatic test bench system based on product acceptance, characterized in that the method comprises:

[0031] Using a pre-built barcode scanner, scan a preset label on the device under test to obtain a product number of the device under test;

[0032] Using a pre-built program to control a current source, performing power supply detection on a single board in the device under test, and obtaining a power supply voltage and an operating current of the device under test;

[0033] Identify the category of the device under test, and call functional test cases and component test cases corresponding to the category;

[0034] Using the functional test case, the discrete signal acquisition and output function and the 232 bus communication function of the device under test are automatically tested to obtain the functional test result;

[0035] Downloading the built-in code of the device under test, and executing the built-in code according to the pre-built code execution environment to obtain the code logic running result;

[0036] Using the component test case, test the components on the board in the device under test to obtain the board test result;

[0037] Measuring the product dimensions and weight of the device under test to obtain an appearance weight test result;

[0038] The product number, power supply voltage and operating current, functional test results, code logic operation results, single board test results and appearance weight test results of the tested product are sent to the system development layer of the test bench system.

[0039] In the embodiment of the present invention, firstly, according to the type of the device under test, a pre-built test case can be obtained from the system development layer; and the test operation layer of the test bench system includes a functional test module, a code download control module, a single board test module, and an appearance and weight test module. According to the test case, the functional test module and the single board test module can be tested to obtain a test result; and the code download control module is equipped with a code downloader and a single-chip microcomputer code execution environment, which can extract and execute the built-in code in the device under test to obtain the code logic operation result, and the code logic operation result can check whether the code operation logic is normal; the present invention also measures the product appearance size and weight of the device under test through the appearance and weight test module to obtain a more objective appearance weight test result; these test modules in the test operation layer can fully automatically execute the test process, realize the liberation of human resources from the execution of the test process, and better invest in the construction process of each test case, improve the test efficiency, and also improve the test case construction level. Therefore, the present invention provides an automatic test bench system and method based on product acceptance, which can perform a full range of automated test processes on the test process of large quantities of products and improve the acceptance efficiency of scientific and technological products. BRIEF DESCRIPTION OF THE DRAWINGS

[0040] One or more embodiments of the present invention are exemplarily described by the images in the corresponding drawings, and these exemplary descriptions do not constitute limitations on the embodiments. Elements with the same reference numerals in the drawings represent similar elements, and unless otherwise stated, the figures in the drawings do not constitute proportional limitations.

[0041] Figure 1 It is a system architecture of an automatic test bench system based on product acceptance provided according to an embodiment of the present invention;

[0042] Figure 2 is a schematic structural diagram of a customized motherboard in an automatic test bench based on product acceptance according to another embodiment of the present invention;

[0043] Figure 3 It is a flow chart of an automatic test bench control method based on product acceptance provided according to another embodiment of the present invention. DETAILED DESCRIPTION

[0044] In order to make the purpose, technical solution and advantages of the present application more obvious, the exemplary embodiments according to the present application will be described in detail with reference to the accompanying drawings. Obviously, the described embodiments are only part of the embodiments of the present application, rather than all the embodiments of the present application, and it should be understood that the present application is not limited to the exemplary embodiments described here.

[0045] An embodiment of the present application relates to an automatic test bench system based on product acceptance, such as Figure 1 As shown, it mainly includes system development layer, test operation layer, interface auxiliary layer and device under test.

[0046] refer to Figure 1 As shown, the system development layer includes test management software and code downloading equipment. The test management software includes some test cases, regression test programs, test data generation reports and other programs, and the code downloading equipment can be equipped with a suitable code downloader according to the test needs, such as DSP and FPGA downloaders.

[0047] The test management software part in the system development layer includes a test control module and a data receiving module;

[0048] The test control module is used to select a pre-built test control interface according to the type of the device under test; the data receiving module is used to receive the test result of the test operation layer and generate a test report.

[0049] The test control interface includes a test case cluster that can be selected by the user and product quality assessment standards for various types of devices under test.

[0050] In the embodiment of the present invention, the tester will construct a large number of test cases that meet the categories of each device under test, and then import the test cases into the system development layer. When executing the test process, the tester can select an interface for the device under test according to the category of the current device under test.

[0051] In detail, in the embodiment of the present invention, the data receiving module of the system development layer is used to receive the module test results fed back by the function test module, the code download control module, the single board test module, and the shape and weight test module;

[0052] According to the module test results, construct a test data record table;

[0053] According to the product quality assessment standard, the test data record table is automatically evaluated for product quality to obtain a product test evaluation report;

[0054] The test data record table and product test evaluation report are visually output.

[0055] In an embodiment of the present invention, the system development layer can realize automatic control of the test operation layer, and can also obtain the test results of the test operation layer, and perform automatic evaluation in combination with the product quality evaluation standard to obtain a product test evaluation report, and finally can also perform visual output through a display screen or printer.

[0056] according to Figure 1 As shown, the test operation layer includes a test computer and a physical parameter measurement module. The functional test module, code download control module, and single board test module all belong to the test computer, while the shape and weight test module belongs to the physical parameter detection module.

[0057] Further, in an embodiment of the present invention, the test operation layer includes a function test module, a code download control module, a single board test module, and an appearance and weight test module;

[0058] Sending the test results of each layer in the test operation layer to the system development layer;

[0059] The functional test module is used to identify the product number of the device under test; identify the power supply voltage and working current of the device under test; use pre-built functional test cases to automatically test the discrete signal acquisition and output functions and 232 bus communication functions of the device under test to obtain functional test results;

[0060] The code download control module includes a code downloader and a code execution environment, and is used to download the built-in code of the device under test by using the code downloader, and execute the built-in code according to the code execution environment to obtain the code logic operation result;

[0061] The single board test module is used to perform test operations on components on the single board in the device under test using pre-built component test cases to obtain single board test results;

[0062] The appearance and weight testing module is used to measure the product appearance size and weight of the device under test to obtain an appearance weight test result.

[0063] In the embodiment of the present invention, the following functions can be achieved by testing the various functions provided in the running layer:

[0064] a) Read the power supply voltage and working current of the device under test in real time;

[0065] b) Automatically test the discrete signal acquisition function of the device under test;

[0066] c) Automatically test the discrete signal output function of the device under test;

[0067] d) Automatically test the 232 bus communication function of the device under test:

[0068] e) Test the code download function of the device under test through DSP and FPGA downloader;

[0069] f) Test the logic processing function of the device under test through DSP and FPGA downloader;

[0070] g) The components of the board under test can be tested by the single board test equipment and recorded in a table;

[0071] h) Read the product number of the device under test by scanning the barcode gun;

[0072] i) The shape and weight of the device under test can be tested through 3D scanning, electronic scales and other equipment.

[0073] In the embodiment of the present invention, by designing a regression test and handing the regression test over to the test operation layer for automatic operation, the method in which the staff conducts tests and records step by step using a multimeter, oscilloscope, and ruler is completely replaced, which can greatly improve the test efficiency and shorten the regression test time.

[0074] The present invention can run more tests in less time through automated testing. Even if a large part of business functions and business logic are extremely cumbersome, the patience of automated testing is infinite. The execution speed of computers is much faster than that of manual work. The present invention automates more cumbersome tasks, which can improve the accuracy of tests and the enthusiasm of testers. Freeing up testers to devote more energy to designing better test cases, or devoting the energy of testers to new functions or testing deeper business logic, helps testers discover deeper defects in the device under test.

[0075] Furthermore, the interface auxiliary layer refers to a part that provides electrical interface support in order to connect the test operation layer and the device under test.

[0076] In the embodiment of the present invention, the bottom of the device under test is provided with n (for example, 4) annular contact surfaces for leading out electrical interfaces of the connection wires. The interface auxiliary layer is provided with an electrical interface of m-channel (9-channel) crimping socket loose wire connector. In addition, the interface auxiliary layer can also use a pre-built customized motherboard as an electrical interface, wherein the interface auxiliary layer can simultaneously connect multiple customized motherboards. The structure of each motherboard is referenced as follows: Figure 2 shown.

[0077] The customized motherboard device supports the following detection contents:

[0078] The system-configured programmable DC power supply can detect the power supply of the single board; the system-configured discrete quantity board can output high and low level signals, which can be used for various drive controls and can also detect various discrete quantity output signals; the system-configured barcode scanner can collect data.

[0079] When executing different module functions of the test operation layer, the present invention may require different test interfaces for connection. For example, when executing the code download control module, the device under test is connected to the interface auxiliary layer by using the connecting wires and crimping socket loose wire connectors led out from the annular contact surface; when executing the functional test module and the single board test module, the customized motherboard is connected to the pins of the single board in the device under test by using the pre-trained automated solder joint connection service.

[0080] The automated solder joint connection service is a service that automatically searches for target pins through image recognition and controls related equipment for soldering.

[0081] In detail, in an embodiment of the present invention, the automated solder joint connection service includes a solder joint automatic recognition model and a welding numerical control control device, which are used to obtain the target pin corresponding to the component test case and obtain a photograph of the single board;

[0082] Using the solder joint automatic recognition model, identifying the soldering position of the target pin in the captured image;

[0083] The target pin is welded and connected to the customized motherboard by utilizing the welding numerical control control equipment according to the welding position.

[0084] The solder point automatic recognition model is a Transformer-based neural network model, which can identify the distribution of solder points on a single-board circuit board through training.

[0085] Furthermore, the system development layer, the test operation layer and the interface auxiliary layer in the test bench system of the present invention are connected by cables, which facilitates data transmission and collection.

[0086] In the embodiment of the present invention, firstly, according to the type of the device under test, a pre-built test case can be obtained from the system development layer; and the test operation layer of the test bench system includes a functional test module, a code download control module, a single board test module, and an appearance and weight test module. According to the test case, the functional test module and the single board test module can be tested to obtain a test result; and the code download control module is equipped with a code downloader and a single-chip code execution environment, which can extract and execute the built-in code in the device under test to obtain the code logic operation result, and the code logic operation result can check whether the code operation logic is normal; the present invention also measures the product appearance size and weight of the device under test through the appearance and weight test module to obtain a more objective appearance weight test result; these test modules in the test operation layer can fully automatically execute the test process, realize the liberation of human resources from the execution of the test process, and better invest in the construction process of each test case, improve the test efficiency, and also improve the test case construction level. Therefore, the present invention provides an automatic test bench system based on product acceptance, which can perform a full range of automated test processes on the test process of large quantities of products, and improve the acceptance efficiency of scientific and technological products.

[0087] Further, see Figure 3 As shown, the embodiment of the present invention also provides a method for utilizing Figure 1 The control method performed by the automatic test bench system based on product acceptance shown includes:

[0088] S1. Use a pre-built barcode scanner to scan a preset label on the device under test to obtain a product number of the device under test.

[0089] In the embodiment of the present invention, a barcode scanner is used to scan a preset label on the device under test, such as a QR code or a barcode, to directly obtain the product number, and the product number is recorded in the file.

[0090] S2. Use a pre-built program to control the current source to perform power supply detection on a single board in the device under test, and obtain the power supply voltage and operating current of the device under test.

[0091] In the embodiment of the present invention, the device under test is connected to a customized template in the interface auxiliary layer, and the customized template is integrated with functions such as a barcode scanner and a program-controlled current source, so as to facilitate the automatic execution of the actions of S1 and S2.

[0092] S3. Identify the category of the device under test, and call functional test cases and component test cases corresponding to the category.

[0093] In the embodiment of the present invention, different product test interfaces can be selected according to the type of the device under test, and different product interfaces also have functional test cases and component test cases corresponding to each device under test. Among them, these test cases are constructed by users according to product testing requirements and can be added or deleted as the product is updated and iterated. This process is carried out on the system development layer of the test bench system.

[0094] S4. Using the functional test case, perform automated testing on the discrete signal acquisition and output function and 232 bus communication function of the device under test to obtain functional test results.

[0095] In the embodiment of the present invention, the discrete quantity board configured by the system can output high and low level signals for various drive controls. In addition, the discrete quantity board can also detect various discrete quantity output signals.

[0096] Among them, the performance of the 232 bus communication function needs to meet the requirements of industry specifications, and a 232 bus board is selected for serial bus testing of the receiving device product.

[0097] S5. Download the built-in code of the device under test, and execute the built-in code according to the pre-built code execution environment to obtain the code logic operation result.

[0098] In the embodiment of the present invention, an FPGA code downloader and a single-chip code downloader are integrated. According to the FPGA code downloader and the single-chip code downloader, and the code execution environment equipped by the FPGA code downloader and the single-chip code downloader, the built-in code of the device under test can be executed once outside the device under test, so as to view the code logic running results.

[0099] S6. Using the component test case, test the components on the board in the device under test to obtain the board test result.

[0100] In the embodiment of the present invention, a customized motherboard in the interface auxiliary layer is used to connect the components on the single board in the device under test with the test operation layer, so as to execute the component test cases selected in the system development layer and obtain the single board test results.

[0101] S7, measuring the product size and weight of the device under test to obtain an appearance weight test result;

[0102] S8. Send the product number, power supply voltage and operating current, functional test results, code logic operation results, single board test results and appearance weight test results of the tested product to the system development layer of the test bench system.

[0103] In the embodiment of the present invention, after each test module in the test operation layer is executed, each test result can be sent to the system development layer. The system development layer has a pre-trained evaluation network model and a pre-built product quality evaluation standard, and can automatically evaluate each test result to obtain a test report of the device under test.

[0104] In the embodiment of the present invention, firstly, according to the type of the device under test, a pre-built test case can be obtained from the system development layer; and the test operation layer of the test bench system includes a functional test module, a code download control module, a single board test module, and an appearance and weight test module. According to the test case, the functional test module and the single board test module can be tested to obtain a test result; and the code download control module is equipped with a code downloader and a single-chip microcomputer code execution environment, which can extract and execute the built-in code in the device under test to obtain the code logic operation result, and the code logic operation result can check whether the code operation logic is normal; the present invention also measures the product appearance size and weight of the device under test through the appearance and weight test module to obtain a more objective appearance weight test result; these test modules in the test operation layer can fully automatically execute the test process, realize the liberation of human resources from the execution of the test process, and better invest in the construction process of each test case, improve the test efficiency, and also improve the test case construction level. Therefore, the present invention provides an automatic test bench method based on product acceptance, which can perform a full range of automated test processes on the test process of large quantities of products, and improve the acceptance efficiency of scientific and technological products.

[0105] Those skilled in the art will appreciate that the above-mentioned embodiments are specific examples for implementing the present embodiment, and in actual applications, various changes may be made thereto in form and detail without departing from the spirit and scope of the present embodiment.

Claims

1. An automatic test bench system based on product acceptance, comprising a system development layer, a test operation layer, an interface auxiliary layer and a device under test, characterized in that: The test operation layer includes a function test module, a code download control module, a single board test module, and a shape and weight test module; The functional test module is used to identify the product number of the device under test; identify the power supply voltage and working current of the device under test; use pre-built functional test cases to automatically test the discrete signal acquisition and output functions and 232 bus communication functions of the device under test to obtain functional test results; The code download control module includes a code downloader and a code execution environment, and is used to download the built-in code of the device under test by using the code downloader, and execute the built-in code according to the code execution environment to obtain the code logic operation result; The single board test module is used to perform test operations on components on the single board in the device under test using pre-built component test cases to obtain single board test results; The appearance and weight test module is used to measure the product appearance size and weight of the device under test to obtain the appearance weight test result; The test results of each layer in the test operation layer are sent to the system development layer.

2. The automatic test bench system based on product acceptance according to claim 1 is characterized in that: The bottom of the device under test is provided with n annular contact surfaces for leading out electrical interfaces of connecting wires.

3. The automatic test bench system based on product acceptance according to claim 2 is characterized in that: The interface auxiliary layer is provided with an electrical interface of an m-channel crimping socket discrete wire connector; When the code download control module is executed, the device under test is connected to the interface auxiliary layer by using the connecting wires led out from the annular contact surface and the crimping socket loose-wire connector.

4. The automatic test bench system based on product acceptance according to claim 3 is characterized in that: The interface auxiliary layer also includes a pre-built customized motherboard as an electrical interface, wherein the interface auxiliary layer can be connected to a plurality of the customized motherboards at the same time; When executing the functional test module and the single board test module, the customized motherboard is connected to the pins of the single board in the device under test by using the pre-trained automatic solder joint connection service.

5. The automatic test bench system based on product acceptance according to claim 4 is characterized in that: The automated solder joint connection service includes a solder joint automatic recognition model and a welding numerical control device, which is used to obtain the target pin corresponding to the component test case and obtain a photograph of the single board; Using the solder joint automatic recognition model, identifying the soldering position of the target pin in the captured image; The target pin is welded and connected to the customized motherboard by utilizing the welding numerical control control equipment according to the welding position.

6. The automatic test bench system based on product acceptance according to claim 5 is characterized in that: The customized master is used to call a pre-built barcode scanner to scan the label on the device under test to identify the product number of the device under test; Calling a pre-built program to control the current source to perform power supply detection on the single board, and identifying the power supply voltage and working current of the device under test; The pre-built discrete quantity board is called, and high and low level signals are generated according to the functional test case, and the high and low level signals are used to drive and control the single board to obtain the functional test result.

7. The automatic test bench system based on product acceptance according to claim 6 is characterized in that: The system development layer, the test operation layer and the interface auxiliary layer in the test bench system are connected by cables.

8. The automatic test bench system based on product acceptance according to claim 7 is characterized in that: The system development layer includes a test control module and a data receiving module; The test control module is used to select a pre-built test control interface according to the type of the device under test; The test control interface includes test cases and product quality assessment standards corresponding to the device under test.

9. The automatic test bench system based on product acceptance according to claim 8, characterized in that: The data receiving module of the system development layer is used to receive the module test results fed back by the function test module, the code download control module, the single board test module, and the shape and weight test module; According to the module test results, construct a test data record table; According to the product quality assessment standard, the test data record table is automatically evaluated for product quality to obtain a product test evaluation report; The test data record table and product test evaluation report are visually output.

10. A method performed by using the automatic test bench system based on product acceptance according to any one of claims 1 to 9, characterized in that: The automated testing method for the test operation layer of the test bench system includes: Using a pre-built barcode scanner, scan a preset label on the device under test to obtain a product number of the device under test; Using a pre-built program to control a current source, performing power supply detection on a single board in the device under test, and obtaining a power supply voltage and an operating current of the device under test; Identify the category of the device under test, and call functional test cases and component test cases corresponding to the category; Using the functional test case, the discrete signal acquisition and output function and the 232 bus communication function of the device under test are automatically tested to obtain the functional test result; Downloading the built-in code of the device under test, and executing the built-in code according to the pre-built code execution environment to obtain the code logic running result; Using the component test case, test the components on the board in the device under test to obtain the board test result; Measuring the product dimensions and weight of the device under test to obtain an appearance weight test result; The product number, power supply voltage and operating current, functional test results, code logic operation results, single board test results and appearance weight test results of the tested product are sent to the system development layer of the test bench system.

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