Instrument rapid test system and test method

Abstract

The invention discloses an instrument rapid test system and a test method, the system comprises a main control module, a signal modulation module and a power supply module, the main control module is used for receiving an instruction of a user and sending a control instruction to the signal modulation module, and the signal modulation module communicates with an instrument through a CAN communication line based on the instruction sent by the main control module and sends the control instruction to the power supply module. The power module supplies power to the instrument; the test based on the modules comprises the following steps: setting fault codes and control parameters for different fault lamps and writing the fault codes and the control parameters into a memory, reading the fault codes and the control parameters from the memory by a microcontroller, lightening the corresponding fault lamps, controlling a timer to start timing, and generating an interruption when the timer reaches a preset time interval; the microcontroller responds to the interruption of the timer, turns off the fault lamp and executes the operation of turning on the next fault lamp; the above process is repeated, and timing lighting of all fault lamps is achieved. The fault lamp triggering condition of the whole vehicle can be simulated, the lightening duration of the indicator lamp can be controlled, the numerical value of a triggering interval and lightening detection of the indicator lamp can be better simulated, and therefore better instrument and vehicle matching design is achieved.

Description

Technical Field

[0001] The invention relates to the field of instrument testing, and in particular to an instrument rapid testing system and a testing method. Background Art

[0002] The instrument is one of the key electrical components that displays the user's vehicle information. The left and right turn signals and the high beam are hard-wired, and other fault light signals such as water temperature signals and oil pressure signals are sent through the CAN communication line. Therefore, when testing the instrument fault indicator light, the instrument is directly installed on the vehicle, and the fault warning light on the instrument is controlled by adjusting the state of the vehicle. This method of directly connecting the instrument to the vehicle for testing has low flexibility and inconvenient operation. In addition, the test operation of confirming the status of the instrument indicator light by controlling the state of the vehicle will also cause a certain degree of damage to the vehicle. Therefore, a solution for testing the instrument fault indicator light is urgently needed. Summary of the invention

[0003] Purpose of the invention: The purpose of the present invention is to provide an instrument rapid testing system and testing method, which can conveniently test the instrument fault light without the whole vehicle.

[0004] Technical solution: To achieve the above-mentioned purpose, an instrument rapid testing system described in the present invention includes a main control module, a signal modulation module, and a power supply module, wherein the main control module is used to receive user instructions and send control instructions to the signal modulation module, the signal modulation module communicates with the instrument through a CAN communication line based on the instructions sent by the main control module, and the power supply module supplies power to the instrument.

[0005] Among them, the signal modulation module includes a microcontroller, a memory, and a timer. The memory is used to store the corresponding codes and control parameters for each fault light when it is lit, which are written by the user through the main control module. The microcontroller reads the fault code and control parameters from the memory according to the instructions, determines the lighting time and duration of the fault light, and then controls the state of the instrument fault light. The timer is used to control the duration of the fault light state.

[0006] The microcontroller communicates with the instrument via a CAN communication line, thereby controlling the state of the instrument fault light.

[0007] The control parameters include the lighting order, lighting duration and lighting frequency of each fault lamp.

[0008] Wherein, the microcontroller includes a plurality of parallel signal output ports so as to synchronously communicate with a plurality of instruments at the same time.

[0009] Among them, the fault indicator lights of the instrument include engine fault light, oil pressure light, high water temperature light and ABS indicator light.

[0010] Wherein, the power module includes a power manager for controlling the output voltage and current of the power supply.

[0011] A testing method based on the above-mentioned instrument rapid testing system according to the present invention comprises:

[0012] Set fault codes and control parameters for different fault lights and write them into the memory;

[0013] The main control module sends a test instruction to the microcontroller, which reads the fault code and control parameters from the memory, lights up the corresponding fault light, and controls the timer to start timing. When the timer reaches the predetermined time interval, an interrupt is generated;

[0014] The microcontroller responds to the timer interrupt, turns off the fault light, and executes the operation of lighting the next fault light;

[0015] The microcontroller repeats the above process to achieve the timed lighting of all fault lights.

[0016] Another testing method based on the above-mentioned instrument rapid testing system according to the present invention comprises:

[0017] Set fault codes and control parameters for different fault lights and write them into the memory;

[0018] The main control module sends a test instruction to the microcontroller, which reads the fault code and control parameters from the memory, lights up all fault lights, and controls the timer to start timing. When the timer reaches the predetermined time interval, an interrupt is generated;

[0019] The microcontroller responds to the timer interrupt and turns off all fault lamps.

[0020] Beneficial effects: The present invention has the following advantages: 1. The system and method can test the instrument fault lights independently of the whole vehicle, and the operation is simple and convenient. Through the setting of multiple communication ports, multiple instruments can be tested at the same time, which greatly improves the test efficiency, especially in the mass instrument production environment; 2. The system and method can adapt to various types of instruments and fault lights and have wide applicability. BRIEF DESCRIPTION OF THE DRAWINGS

[0021] Figure 1 This is the working principle framework diagram of the test system;

[0022] Figure 2 The following is a test flow chart. DETAILED DESCRIPTION

[0023] The technical solution of the present invention is described in detail below in conjunction with the embodiments and drawings.

[0024] like Figure 1 ,2 As shown, the instrument rapid test system includes a main control module, a signal modulation module, and a power module, wherein the main control module is used to receive user instructions and send control instructions to the signal modulation module, the signal modulation module is used to receive user instructions and communicate with the instrument through a CAN communication line, and the power module supplies power to the instrument.

[0025] The signal modulation module includes a microcontroller, a memory, and a timer. The memory is used to store the corresponding codes and control parameters for each fault light written by the user through the main control module. The control parameters include the lighting sequence, duration, and single lighting frequency of each fault light (such as lighting up 3 times in a row, each lighting time is 1s, and the interval is 1s), etc. The microcontroller reads the fault code and control parameters from the memory according to the instructions, determines the lighting time and duration of the fault light, and controls the lighting of the fault light through the CAN communication line. The timer is used to control the lighting duration of the fault light, and can support multiple timing modes, such as single timing, periodic timing, etc., to meet different test requirements.

[0026] In this embodiment, the microcontroller includes a plurality of signal output ports that can be connected in parallel, so as to test a plurality of instruments synchronously at the same time. The device applied to this system can be used in the test room of the instrument, and can light up all the fault lights in a single instrument in sequence for a fixed time or all the fault lights at the same time for a fixed time, and can also light up all the fault lights in multiple instruments in sequence for a fixed time or all the fault lights at the same time for a fixed time.

[0027] The CAN communication line includes two signal lines, CANH and CANL. The CANH and CANL signal lines use differential signals to transmit data, usually in the form of twisted pairs, which can improve the reliability of data transmission and reduce the impact of electromagnetic interference.

[0028] The instrument's fault indicator lights include the engine fault light, oil pressure light, high water temperature light and ABS indicator light.

[0029] In this embodiment, the power module also includes a power manager for controlling the output voltage and current of the power supply to meet the power requirements of different instruments, and further adjusting the brightness of the fault light when it is lit. The power module also includes multiple power ports, which can simultaneously power multiple instruments.

[0030] This embodiment provides a first instrument testing method based on the above system:

[0031] 1. Set fault codes and control parameters for different fault lights, including the fixed duration of all fault lights lighting up in sequence, and write them into the memory of the signal modulation module through the main control module;

[0032] 2. The user sends a test instruction to the microcontroller through the main control module. The microcontroller reads the fault code from the memory, lights up the corresponding fault light, and controls the timer to start timing. When the predetermined time interval is reached, an interrupt is generated;

[0033] 3. The microcontroller responds to the timer interrupt, turns off the fault light, and executes the operation of lighting the next fault light;

[0034] 4. The microcontroller repeats the above process to achieve the timed lighting of all fault lights.

[0035] This embodiment provides a second instrument testing method based on the above system:

[0036] 1. Set fault codes and control parameters for different fault lights, including the fixed duration for all fault lights to light up at the same time, and write them into the memory of the signal modulation module through the main control module;

[0037] 2. The user sends a test instruction to the microcontroller through the main control module. The microcontroller reads the fault code from the memory, lights up all fault lights, and controls the timer to start timing. When the predetermined time interval is reached, an interrupt is generated;

[0038] 3. The microcontroller responds to the timer interrupt and turns off all fault lights.

[0039] The above system can further set the temperature simulation range while testing whether the instrument fault indicator light can light up. For example, for the water temperature signal, it is normal for the engine water temperature light to light up blue. If the water temperature light lights up red, it means that the engine cooling system is abnormal. This system can further adjust the temperature receiving code to test the normal working condition of the instrument water temperature signal light.

[0040] According to regulations, when the high beam / passing light is on, the instrument must have a message prompt that the light is on. The device can simulate the high beam on state, or the passing light on multiple times during riding to test the service life and response speed of the instrument indicator light. The indicator light can be tested for life through a timer multi-frequency test.

[0041] The system and measurement method of the present invention solve the problem in the prior art that the instrument fault light needs to be connected to the entire vehicle before it can be measured. The measurement of the entire vehicle involves certain risks and the possibility of destructive testing. Therefore, the triggering condition of the fault light of the entire vehicle and the lighting duration of the control indicator light can be simulated, and the value of the triggering interval and the lighting detection of the indicator light can be better simulated, thereby achieving a better coordination design between the instrument and the vehicle.

Claims

1. An instrument rapid testing system, characterized in that: It includes a main control module, a signal modulation module, and a power module. The main control module is used to receive user instructions and send control instructions to the signal modulation module. The signal modulation module communicates with the instrument through the CAN communication line based on the instructions sent by the main control module. The power module supplies power to the instrument.

2. The instrument rapid testing system according to claim 1, characterized in that: The signal modulation module includes a microcontroller, a memory, and a timer. The memory is used to store the corresponding codes and control parameters for each fault light when it is lit, which are written by the user through the main control module. The microcontroller reads the fault code and control parameters from the memory according to the instructions, determines the lighting time and duration of the fault light, and then controls the state of the instrument fault light. The timer is used to control the duration of the fault light state.

3. The instrument rapid testing system according to claim 2, characterized in that: The microcontroller communicates with the instrument through the CAN communication line, and then controls the state of the instrument fault light.

4. The instrument rapid testing system according to claim 2, characterized in that: The control parameters include the lighting order, lighting duration and lighting frequency of each fault lamp.

5. The instrument rapid testing system according to claim 2, characterized in that: The microcontroller includes a plurality of parallel signal output ports to synchronously communicate with a plurality of instruments at the same time.

6. The instrument rapid testing system according to claim 2, characterized in that: The fault indicator lights of the instrument include an engine fault light, an oil pressure light, a water temperature over-high light and an ABS indicator light.

7. The instrument rapid testing system according to claim 1, characterized in that: The power module includes a power manager for controlling the output voltage and current of the power supply.

8. A testing method based on the instrument rapid testing system according to any one of claims 1 to 7, characterized in that: include: Set fault codes and control parameters for different fault lights and write them into the memory; The main control module sends a test instruction to the microcontroller, which reads the fault code and control parameters from the memory, lights up the corresponding fault light, and controls the timer to start timing. When the timer reaches the predetermined time interval, an interrupt is generated; The microcontroller responds to the timer interrupt, turns off the fault light, and executes the operation of lighting the next fault light; The microcontroller repeats the above process to achieve the timed lighting of all fault lights.

9. A testing method based on the instrument rapid testing system according to any one of claims 1 to 7, characterized in that: include: Set fault codes and control parameters for different fault lights and write them into the memory; The main control module sends a test instruction to the microcontroller, which reads the fault code and control parameters from the memory, lights up all fault lights, and controls the timer to start timing. When the timer reaches the predetermined time interval, an interrupt is generated; The microcontroller responds to the timer interrupt and turns off all fault lamps.

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