Analysis device

By using the housing temperature regulating mechanism and the base temperature regulating mechanism in the analysis device, the temperature of the light source is controlled, and the problem of light quantity instability caused by the instability of the light source is solved, and the rapid stability of the light source and the suppression of temperature fluctuations are achieved.

CN119404094APending Publication Date: 2025-02-07HITACHI HIGH TECH CORP
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Patent Information

Application Number
CN202380046996.7
Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Priority Date
2022-09-26
Filing Date
2023-08-02
Publication Date
2025-02-07

AI Technical Summary

Technical Problem

In the existing absorber, the temperature of the light source is affected by the temperature of the external gas, resulting in unstable light quantity. Especially when the temperature of the external gas is low or changes, the light quantity of the light source needs a long time to reach stability and is easily fluctuated due to temperature changes.

Method used

An analysis device is designed, including an internal temperature regulating mechanism of the housing and a base temperature regulating mechanism, which ensures that the temperature of the light source remains constant by adjusting the interior of the light source housing and covering the base to avoid being exposed to external gas.

Benefits of technology

By appropriately controlling the temperature of the light source, the time required for the light source to stabilize the light amount can be effectively shortened, and the light amount of the light source fluctuates due to changes in the external gas temperature, thereby improving the stability and accuracy of the analysis device.

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Abstract

The purpose of the present invention is to provide an analysis device capable of effectively using a light source by appropriately controlling the temperature of the light source. An analysis device according to the present invention is provided with: an in-case temperature control means for controlling the temperature of the inside of a light source case; a base for supporting the substrate on which the light-emitting element is mounted; and a susceptor temperature adjustment mechanism that adjusts the temperature of the susceptor. The susceptor temperature adjustment mechanism covers the susceptor such that the susceptor is not exposed to the outside air (referring to Figure 2).
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Description

Technical Field

[0001] The present invention relates to an analysis device for analyzing a substance to be measured in a sample by irradiating the sample with light. Background Art

[0002] Among the analysis devices for analyzing the characteristics of a sample, there is a type that irradiates light onto the sample to analyze its reaction. This type of analysis device has a light source (light emitting element) that emits light. The operating characteristics of the light source are sometimes affected by the temperature of the light source or its surrounding environment.

[0003] Patent document 1 describes an absorptiophotometer and a semiconductor manufacturing device using the absorptiophotometer. The document describes the following technology: "In the case of measuring a high-temperature sample gas, even if the distance from the light source section to the light receiving section is not extended, the light source section and the light receiving section can be protected from the heat from the sample gas, thereby obtaining an absorptiophotometer capable of maintaining high measurement accuracy. The invention comprises: a sample receiving section 10 having a receiving space 11 for receiving the sample gas; a light source section 20 for irradiating light into the receiving space 11; a light receiving section 30 for receiving light emitted from the receiving space 11; a first heat insulating section 40a disposed adjacent to the light source section 20 side of the sample receiving section 10 and a second heat insulating section 40b disposed adjacent to the light receiving section 30 side of the sample receiving section 10; a first cooling section 50a disposed adjacent to the first heat insulating section 40a and a second cooling section 50b disposed adjacent to the second heat insulating section 40b." (See abstract).

[0004] Prior art literature

[0005] Patent Literature

[0006] Patent Document 1: WO2018 / 052074 Summary of the invention

[0007] Technical problem to be solved by the invention

[0008] In the absorbance meter described in Patent Document 1, the light source unit 20, the first cooling unit 501, the first heat insulating unit 40a, and the sample storage unit 10 are respectively provided as independent components, and the operability when replacing the light source is good. On the other hand, the light source unit 20 is not temperature-controlled, and a portion is exposed to the outside air. In view of the fact that the amount of light from the light source is affected by the temperature of the light source, the following problems are considered to exist: (1) When the outside air temperature is low, the temperature of the light source before the power is turned on is low, so the time required from turning on the power to the stabilization of the light amount of the light source is long; (2) When the outside air temperature changes, the temperature of the light source unit also changes, and finally the amount of light from the light source changes.

[0009] The present invention has been made in view of the above-mentioned problems, and an object of the present invention is to provide an analysis device capable of effectively using a light source by appropriately controlling the temperature of the light source.

[0010] Technical solutions to solve problems

[0011] The analysis device of the present invention has an internal housing temperature control mechanism for controlling the temperature of the interior of a light source housing, a base supporting a substrate on which a light-emitting element is mounted, and a base temperature control mechanism for controlling the temperature of the base, wherein the base temperature control mechanism covers the base in a manner that the base is not exposed to external air.

[0012] Effects of the Invention

[0013] According to the analysis device of the present invention, the light source can be effectively used by appropriately controlling the temperature of the light source. Other objects, structures, effects, etc. of the present invention will become more apparent through the following description of the embodiments. BRIEF DESCRIPTION OF THE DRAWINGS

[0014] Figure 1 2 is a diagram showing the overall structure of the automatic analyzer 100 .

[0015] Figure 2 2 is a cross-sectional view illustrating the structure of the light emitting diode unit 120 .

[0016] Figure 3 This is a cross-sectional view of a mechanism having the function of the in-shell temperature control mechanism 407, in which a flow path is formed in the shell 401 and a flow path is also formed in the base temperature control mechanism 418, and both are temperature-controlled with a constant temperature liquid.

[0017] Figure 4 express Figure 3 The operation and heat conduction path of the LED unit 120 before the LED is turned on in the structure shown.

[0018] Figure 5 express Figure 3 The operation and heat conduction path of the LED unit 120 after the LED in the structure shown is turned on.

[0019] Figure 6 It is a cross-sectional view for explaining the structure of a conventional light emitting diode unit 120 which does not have a base temperature adjustment mechanism 418 .

[0020] Figure 7 express Figure 6 The heat conduction path of the light-emitting diode in the structure shown after it is illuminated.

[0021] Fig. 8A Yes means Figure 3 Figure 1 shows the temperature distribution of the light-emitting diode in the structure before it is lit.

[0022] Figure 8B Yes means Figure 6Figure 1 shows the temperature distribution of the light-emitting diode in the structure before it is lit.

[0023] Fig.9A This is a diagram showing the temperature change of the substrate 402 with the passage of time after the light-emitting diode is turned on.

[0024] Fig. 9B Yes means Fig.9A A graph showing the standard deviation of the temperature variation of the substrate 402 over 10 minutes is shown.

[0025] Fig.10 The time change of the ambient temperature of the light emitting diode unit 120 is shown.

[0026] Fig.11 It means in Fig.10 FIG. 4 is a diagram showing a change over time in the temperature of the substrate 402 when the light emitting diode 405 is turned on in the temperature environment shown. DETAILED DESCRIPTION

[0027] <Structure of Analyzer>

[0028] Figure 1 1 is an overall structural diagram of an automatic analyzer 100 according to an embodiment of the present invention. The automatic analyzer 100 is composed of a conveying line 101, a rotor 102, a reagent disk 103, a reaction disk 104, a dispensing mechanism 105, a stirring mechanism 106, a spectrometer 107, a reaction pool cleaning mechanism 108, a nozzle cleaning mechanism 109, a control unit 115, an input unit 123, a display unit 124, and the like.

[0029] The transport line 101 transfers a sample rack 111 holding a sample container 110 containing a sample in a required amount to a sample dispensing position 121. The dispensing mechanism 105 dispenses the sample from the sample container 110 to a reaction pool 112 (reaction container) at the sample dispensing position 121. The transport line 101 is also connected to the rotor 102. By rotating the rotor 102, the sample rack 111 is exchanged with other transport lines 101.

[0030] The reagent disk 103 holds a reagent container 113 filled with a reagent, and rotates and moves the reagent container 113 to a position where the dispensing mechanism 105 can perform a dispensing operation. The dispensing mechanism 105 dispenses the reagent from the reagent container 113 to the reaction cell 112 at the reagent dispensing position 122. In addition, the reagent is dispensed into the reaction cell 112 in an amount required for colorimetric analysis, and reacts with a component in a sample to be analyzed.

[0031] The reaction disc 104 holds the reaction pool 112, and the reaction pool 112 to be the object of each action is rotated and transferred to the action position indicating the position where the spectrometer 107, the stirring mechanism 106, the reaction pool cleaning mechanism 108, etc. for colorimetric analysis are respectively operated. In addition, the reaction pool 112 is kept warm by a constant temperature medium such as water. Thus, in the reaction liquid which is a mixture of the sample and the reagent, the chemical reaction between the components in the sample and the reagent is promoted.

[0032] The dispensing mechanism 105 draws the sample to be colorimetrically analyzed from the sample container 110 and discharges it into the reaction pool 112. The dispensing mechanism 105 draws the reagent corresponding to the analysis object from the reagent container 113 and discharges it into the reaction pool 112. The dispensing mechanism 105 has an arm 118, a nozzle 116, and a dispensing mechanism motor 119. The arm 118 holds the nozzle 116 and the liquid level sensor 117. The nozzle 116 is connected to the liquid level sensor 117. The liquid level sensor 117 detects the presence or absence of liquid based on the change in electrostatic capacitance. A shielding portion 114 is provided near the position where the dispensing mechanism 105 performs the dispensing action. The dispensing mechanism motor 119 moves the dispensing mechanism 105 in the up and down direction or the rotational direction.

[0033] The stirring mechanism 106 stirs the reaction liquid in the reaction cell 112 in order to promote the reaction between the analyte component in the sample ejected from the sample container 110 into the reaction cell 112 and the reagent ejected from the reagent container 113 into the reaction cell 112 .

[0034] The light emitting diode unit 120 irradiates the reaction liquid that has been stirred and chemically reacted by the stirring mechanism 106 with light. The spectrometer 107 separates the transmitted light that has passed through the reaction liquid, and performs a colorimetric analysis based on absorbance measurement based on the separated transmitted light.

[0035] The reaction cell cleaning mechanism 108 sucks the reaction solution from the reaction cell 112 where the colorimetric analysis has been completed, discharges the detergent and the like, and cleans the reaction cell 112 .

[0036] The nozzle cleaning mechanism 109 cleans the tip of the nozzle 116 of the dispensing mechanism 105 into which the sample or reagent has been dispensed. Thus, the residue attached to the nozzle 116 is removed and does not affect the next analysis object. The control unit 115 is composed of a processor, a memory, etc., and controls various mechanisms and devices.

[0037] The input unit 123 is composed of a keyboard, a mouse, a touch panel, etc., and inputs instructions from the user to the control unit 115. The display unit 124 is composed of an LCD (Liquid Crystal Display) or the like, and displays an operation screen or the like.

[0038] <Basic structure of light emitting diode unit>

[0039] Figure 2 4 is a cross-sectional view for explaining the structure of the light emitting diode unit 120. The light emitting diode unit 120 has a structure in which components such as a substrate 402 are accommodated inside a housing 401. Light emitted from the light emitting diode unit 120 is emitted from the opening of the housing 401 (along the optical axis 404) Figure 2 The position of the arrow adjacent to the reference numeral 404 in the figure) is output.

[0040] The housing 401 has a space (housing internal space) for arranging the light-emitting diode 405, the substrate 402, and the base 406. In order to keep the light-emitting diode 405 at a constant temperature, the space needs to be kept at a constant temperature even if the external temperature changes. Therefore, the housing 401 needs to use a material with a volume as large as possible, a large specific heat, and a small thermal conductivity, thereby increasing the time constant. For example, it is necessary to use a material with a larger specific heat than the temperature control mechanism 407 in the housing described later and a small thermal conductivity.

[0041] The substrate 402 on which the light emitting diode 405 is mounted is arranged in contact with the base 406, and is mounted in mechanical contact with the housing 401 to constitute a part of the outer wall of the housing 401. Therefore, by adjusting the position of the base 406, the optical axis 404 of the light emitting diode 405 can be aligned with the opening of the housing 401. That is, the base 406 supports the substrate 402 and has a function as a component for aligning the optical axis 404. By configuring the housing 401, the base 406, the substrate 402 and the optical axis 404 in such a structure, the opening of the housing 401 and the optical axis 404 can be aligned by adjusting the positions of the housing 401 and the base 406. The base 406 is mounted in a manner that can be removed from the housing 401. By configuring the light emitting diode 405 to be detachable in this way, when the light emitting diode 405 is replaced due to a failure or the like, the base 406 on which the light emitting diode 405 and the substrate 402 are mounted can be removed from the housing 401 and replaced without removing the housing 401 from the biochemical analysis device. Therefore, when the base 406 is mounted after replacing the light emitting diode 405, the optical axis alignment is facilitated by simply adjusting the base 406 and the housing 401. The base 406 can also be mounted to the housing 401 by screws.

[0042] When replacing the base 406, first, the base temperature control mechanism 418 is removed from the housing 401. Thus, the base temperature control mechanism 418 is also removed from the base 406. Then, the base 406 is removed from the housing 401. Even when the base 406 is replaced, the base temperature control mechanism 418 can be reused without replacement.

[0043] The temperature change of the light emitting diode unit 120 after the power supply of the light emitting diode 405 is turned on is described. After the light emitting diode 405 is turned on, the temperature of the light emitting diode 405 rises, and the heat conduction of the light emitting diode 405 causes the temperature of the substrate 402 and the base 406 to rise. After a certain period of time, the light emitting diode 405, the substrate 402 and the base 406 reach a stable temperature, and the light amount and wavelength of the light emitting diode 405 are stabilized. Therefore, in order to quickly stabilize the light amount after the power supply of the light emitting diode 405 is turned on, it is necessary to quickly stabilize the temperature of the light emitting diode 405, the substrate 402 and the base 406. Therefore, the base 406 needs to be made of a material such as a metal (for example, aluminum) with a small volume, a small specific heat and a large thermal conductivity, and a small time constant.

[0044] The base temperature control mechanism 418 covers the periphery of the base 406 so that there is no part of the base 406 exposed to the outside air, and contacts the base 406 to control the temperature of the base 406. The base temperature control mechanism 418 is installed in a manner that can be removed from the base 406 and the housing 401. The housing internal temperature control mechanism 407 contacts the housing 401 to control the temperature of the housing 401 in order to keep the temperature of the internal space of the housing constant.

[0045] At least one of the base temperature control mechanism 418 and the temperature control mechanism in the shell 407 may also form a flow path inside and allow the constant temperature liquid to flow in the flow path. In this case, the volume of the base temperature control mechanism 418 or the temperature control mechanism in the shell 407 needs to be as large as possible and made of a material with a large specific heat and a small thermal conductivity. The base temperature control mechanism 418 needs to be composed of a material with a larger specific heat and a smaller thermal conductivity than the base 406. The temperature control mechanism in the shell 407 needs to be composed of a material with a larger specific heat and a smaller thermal conductivity than the shell 401.

[0046] At least one of the base temperature control mechanism 418 and the temperature control mechanism in the shell 407 may also be configured in a manner that uses a Peltier element to implement temperature control. In this case, in order to make the base temperature control mechanism 418 or the temperature control mechanism in the shell 407 also change temperature in conjunction with the temperature change of the Peltier element, it is necessary to reduce the time constant. Therefore, it is necessary to minimize the volume of the base temperature control mechanism 418 or the temperature control mechanism in the shell 407 and to make it consist of a material such as a metal with a small specific heat and a large thermal conductivity (for example, aluminum). The base temperature control mechanism 418 needs to be composed of a material with a specific heat less than that of the base 406 and a thermal conductivity greater than that of the base 406. The temperature control mechanism in the shell 407 needs to be composed of a material with a specific heat less than that of the shell 401 and a thermal conductivity greater than that of the shell 401.

[0047] In order to quickly stabilize the temperature of the light-emitting diode 405, a substrate temperature control mechanism 430 may be arranged on the substrate 402 to directly control the temperature of the substrate 402. The substrate temperature control mechanism 430 may control the temperature by having an internal flow path and allowing a constant temperature liquid to flow through the flow path, or may use a Peltier element to implement the temperature control. As long as the temperature control mechanism 407 in the housing and the base temperature control mechanism 418 can provide a sufficient temperature control function, the substrate temperature control mechanism 430 may not be provided. In the following description, the substrate temperature control mechanism 430 is appropriately omitted.

[0048] <Structure of LED Unit (Water Cooling)>

[0049] Figure 3 This is a cross-sectional view when a flow path is formed in the housing 401 as a mechanism having the function of the housing temperature control mechanism 407 and a flow path is also formed in the base temperature control mechanism 418, and both are temperature-controlled by a constant temperature liquid.

[0050] In the housing 401, the constant temperature liquid is injected from the inlet 409 of the flow path in the housing, circulates in the flow path 411 in the housing, and is discharged from the outlet 410 of the flow path in the housing. In the base temperature control mechanism 418, the constant temperature liquid is injected from the inlet 420 of the flow path of the base temperature control mechanism, circulates in the flow path 419 of the base temperature control mechanism, and is discharged from the outlet 421 of the flow path of the base temperature control mechanism. The temperature of the constant temperature liquid is set to a temperature higher than the temperature of the external air of the light emitting diode unit 120, for example. In this case, if the temperature is to be lowered, the heat transmitted by reducing the amount of water is reduced, and the temperature is naturally lowered, so there is no need to set up an additional element capable of cooling, etc., and the temperature can be adjusted by a simple structure. The constant temperature liquid can also be borrowed from the constant temperature liquid used in the constant temperature bath provided in the automatic analyzer 100 to maintain the temperature of the sample constant. In this case, by supplying the constant temperature liquid to the light emitting diode unit 120, the light emitting diode unit 120 does not need to have a separate constant temperature liquid supply source, so it is useful. When the constant temperature liquid is shared with the automatic analyzer 100, the control of the flow rate of the constant temperature liquid can be entrusted to the automatic analyzer 100. Alternatively, for example, a flow control valve can be arranged inside the LED unit 120 so that the LED unit 120 itself has a flow control function.

[0051] <Light Emitting Diode Behavior and Heat Transfer Path Before Lighting Up>

[0052] Figure 4 express Figure 3The operation and heat conduction path of the light-emitting diode unit 120 before the light-emitting diode in the structure shown is turned on. When not measuring, such as in the standby state, the light-emitting diode unit 120 is not powered on. At this time, the constant temperature liquid is circulated in the flow path 411 in the shell and the flow path 419 of the base temperature control mechanism in advance. As a result, the shell 401 and the base temperature control mechanism 418 are heated to the temperature of the constant temperature liquid. The heat of the heated shell 401 is conducted to the space 408 in the shell (dashed arrow), thereby preheating the space 408 in the shell. On the other hand, the heat of the heated base temperature control mechanism 418 is respectively conducted to the base 406, the substrate 402, and the light-emitting diode 405 via the contact surface (black arrow), thereby preheating the light-emitting diode 405. In this way, by preheating the space 408 in the shell and the light-emitting diode 405, even when the external air temperature is low, the time required from turning on the power of the light-emitting diode unit 120 to stabilizing the light intensity can be shortened.

[0053] <Light Emitting Diode Behavior and Heat Transfer Path after Lighting>

[0054] Figure 5 express Figure 3 The operation and heat conduction path of the light emitting diode unit 120 after the light emitting diode in the structure shown is turned on. When the light emitting diode unit 120 is powered on, the light emitting diode 405 emits light, and the temperature of the light emitting diode 405 gradually increases over time. The heat of the light emitting diode 405 is conducted to the substrate 402 via the contact surface between the light emitting diode 405 and the substrate 402 ( Figure 5 The heat of the substrate 402 is transferred to the base 406 via the contact surface between the substrate 402 and the base 406 ( Figure 5 The heat of the base 406 is transferred to the base temperature regulating mechanism 418 via the contact surface between the base 406 and the base temperature regulating mechanism 418 ( Figure 5 In addition, the heat of the base temperature control mechanism 418 is dissipated to the constant temperature liquid in the base temperature control mechanism flow path 419.

[0055] <Existing structure (without base temperature control mechanism)>

[0056] Figure 6 4 is a cross-sectional view illustrating the structure of a conventional light emitting diode unit 120 without a base temperature control mechanism 418. Figure 6 In the structure, a portion of the base 406 is in contact with the shell 401, and the surface 422 exposed to the outside air is exposed to the outside air.

[0057] <Heat dissipation path of the existing structure (without base temperature control mechanism)>

[0058] Figure 7 express Figure 6The heat conduction path after the light emitting diode 405 is lit in the structure shown. The heat generated by the light emitting diode 405 after being lit is conducted to the substrate 402 via the contact surface between the light emitting diode 405 and the substrate 402 ( Figure 6 The heat of the substrate 402 is transferred to the base 406 via the contact surface between the substrate 402 and the base 406 ( Figure 6 In addition, the heat of the base 406 is dissipated to the outside air from the exposed surface 422 of the base that is exposed to the outside air ( Figure 7 solid black arrow in the figure).

[0059] <Effect 1 (fast preheating start time)>

[0060] Fig. 8A Yes means Figure 3 Figure 1 shows the temperature distribution of the LED in the structure before it is lit. Fig. 8A As shown, when the base temperature control mechanism 418 is provided, the 37°C constant temperature liquid enters and exits from the housing flow path inlet 409, the housing flow path outlet 410, the base temperature control mechanism flow path inlet 420, and the base temperature control mechanism flow path outlet 421. In this case, the base 406 is at the same temperature of 37°C as the constant temperature liquid.

[0061] Figure 8B Yes means Figure 6 Figure 1 shows the temperature distribution of the LED in the structure before it is lit. Figure 8B As shown, in the absence of the base temperature adjustment mechanism 418, the 37°C constant temperature liquid enters and exits from the flow path inlet 409 and the flow path outlet 410 in the shell, but the exposed surface 422 of the base 406 exposed to the outside air contacts the outside air at 27°C, so the temperature of the base 406 is 36°C. That is, Fig. 8A The condition of the base temperature control mechanism 418 shown is the same as that without Figure 8B As a result, when the base temperature control mechanism 418 is provided, the time required for the temperature to stabilize after the light-emitting diode is turned on can be shortened compared to the case where the base temperature control mechanism 418 is not provided.

[0062] <Effect 2 (good heat dissipation, so fast startup time)>

[0063] Fig.9A 4 is a graph showing the temperature change of the substrate 402 as time passes after the light emitting diode is turned on. Fig.9AAs shown, there is no susceptor temperature control mechanism (dashed line) and there is a susceptor temperature control mechanism (solid line), and the temperature of the substrate 402 rises as time passes from the time when the light-emitting diode is turned on (0 seconds). After a certain period of time, the temperature of the substrate 402 stabilizes at 48°C without the susceptor temperature control mechanism (dashed line) and at 43°C with the susceptor temperature control mechanism (solid line). It is believed that the temperature difference is caused by the heat dissipation effect of the susceptor temperature control mechanism 418.

[0064] Fig. 9B Yes means Fig.9A The 10-minute standard deviation of the temperature variation of the substrate 402 shown in FIG. The 10-minute standard deviation of the substrate temperature is an indicator for judging whether the temperature of the substrate 402 quickly reaches the stable temperature after the light-emitting diode is turned on. That is, if the 10-minute standard deviation of the substrate temperature decreases quickly, it means that the substrate temperature quickly reaches the stable temperature. It is known that the 10-minute standard deviation of the substrate temperature decreases with the passage of time after the light-emitting diode power is turned on. If it decreases to about 0.01°C, the light intensity and wavelength of the light-emitting diode are also stable.

[0065] like Fig. 9B As shown in FIG. 4 , the time required for the standard deviation of 10 minutes to decrease to about 0.01° C. is about 1200 seconds when there is no susceptor temperature control mechanism (dashed line), while it is about 140 seconds when there is a susceptor temperature control mechanism (solid line). That is, the time can be shortened by having the susceptor temperature control mechanism 418. It is believed that this is because the lower the stable temperature, the faster it reaches the stable temperature.

[0066] <Effect 3 (Small temperature fluctuation due to water temperature control)>

[0067] Fig.10 represents the time variation of the ambient temperature of the light emitting diode unit 120. Fig.10 As shown, there are cases where the ambient temperature fluctuates by about 2°C.

[0068] Fig.11 It means in Fig.10 The temperature of the substrate 402 changes over time when the light-emitting diode 405 is turned on in the temperature environment shown. When there is no susceptor temperature control mechanism (dashed line), the substrate temperature changes by 0.035°C, whereas when there is a susceptor temperature control mechanism (solid line), the substrate temperature can be suppressed to a change of 0.015°C.

[0069] <Summary of the Invention>

[0070] The automatic analyzer 100 of the present invention can arrange the base 406 in a constant temperature space which is temperature-controlled by the temperature control mechanism 407 in the housing, and preheat the light-emitting diode 405, the substrate 402, and the base 406 by the base temperature control mechanism 418. In addition, by providing the base temperature control mechanism 418, the heat dissipation performance of the light-emitting diode 405, the substrate 402, and the base 406 after the light-emitting diode 405 is powered on is improved, and the temperature of the light-emitting diode 405 can be reduced compared with the case where the base temperature control mechanism 418 is not provided. Thus, (1) the time required from power-on to light quantity stabilization can be shortened. In addition, the base 406 is temperature-controlled by the base temperature control mechanism 418 and arranged in a constant temperature space which is temperature-controlled by the temperature control mechanism 407 in the housing, and therefore is not affected by changes in the temperature of the external air. Therefore, (2) even when the temperature of the external air changes, changes in the light-emitting efficiency of the light-emitting diode can be suppressed.

[0071] Description of Reference Numerals

[0072] 100...Automatic analyzer, 101...Transport line, 102...Rotor, 103...Reagent disk, 104...Reaction disk, 105...Dispensing mechanism, 106...Stirring mechanism, 107...Spectrometer, 108...Reaction pool cleaning mechanism, 109...Nozzle cleaning mechanism, 110...Sample container, 111...Sample rack, 112...Reaction pool, 113...Reagent container, 114...Shielding unit, 115...Control unit, 116...Nozzle, 117...Liquid level sensor, 118...Arm, 119...Dispensing mechanism motor, 120...Light emitting diode unit, 121...Sample dispensing position, 122…reagent dispensing position, 123…input unit, 124…display unit, 401…housing, 402…substrate, 404…optical axis, 405…light emitting diode, 406…base, 407…temperature control mechanism inside the housing, 408…space inside the housing, 409…flow path inlet inside the housing, 410…flow path outlet inside the housing, 411…flow path inside the housing, 418…base temperature control mechanism, 419…base temperature control mechanism flow path, 420…base temperature control mechanism flow path inlet, 421…base temperature control mechanism flow path outlet, 422…exposed surface, 430…substrate temperature control mechanism.

Claims

1. An analysis device for analyzing a substance to be measured in a sample by irradiating the sample with light, characterized in that: include: a light emitting element for emitting the light; a substrate for mounting the light emitting element; a base supporting the substrate; A housing for accommodating the light emitting element and the substrate; an in-shell temperature regulating mechanism for regulating the temperature of the interior of the shell; and a base temperature regulating mechanism for regulating the temperature of the base, The susceptor temperature control mechanism covers the susceptor in a manner that the susceptor is not exposed to external air, The base temperature adjustment mechanism contacts the base to directly adjust the temperature of the base.

2. The analysis device according to claim 1, characterized in that: The base is configured to be detachable from the housing.

3. The analysis device according to claim 1, characterized in that: The housing has an inner space for accommodating the light emitting element and the substrate. The light emitting element and the substrate are sealed in an inner space of the housing by the base and the housing.

4. The analysis device according to claim 1, characterized in that: The housing has a first specific heat and a first thermal conductivity, The housing temperature adjustment mechanism has a second specific heat smaller than the first specific heat, and has a second thermal conductivity larger than the first thermal conductivity.

5. The analysis device according to claim 1, characterized in that: The base temperature adjustment mechanism is configured to be attachable to and detachable from the base and from the housing.

6. The analysis device according to claim 1, characterized in that: The susceptor temperature regulating mechanism is detachably mounted on the housing to cover the susceptor in a manner that the susceptor is not exposed to external air.

7. The analysis device according to claim 1, characterized in that: The base temperature control mechanism is configured to cover the base when the base temperature control mechanism is mounted on the housing. The susceptor temperature regulating mechanism is configured to be detachable from the susceptor when the susceptor temperature regulating mechanism is detached from the housing.

8. The analysis device according to claim 1, characterized in that: A flow path for a constant temperature liquid for temperature control is formed inside the base temperature control mechanism. The base has a third specific heat and a third thermal conductivity, The susceptor temperature adjustment mechanism has a fourth specific heat greater than the third specific heat, and has a fourth thermal conductivity less than the third thermal conductivity.

9. The analysis device according to claim 1, characterized in that: A flow path for a constant temperature liquid for temperature control is formed inside the temperature control mechanism in the housing. The housing has a fifth specific heat and a fifth thermal conductivity, The in-casing temperature adjustment mechanism has a sixth specific heat greater than the fifth specific heat, and has a sixth thermal conductivity smaller than the fifth thermal conductivity.

10. The analysis device according to claim 1, characterized in that: The base temperature control mechanism is configured to use a Peltier element to control the temperature. The base has a seventh specific heat and a seventh thermal conductivity, The susceptor temperature adjustment mechanism has an eighth specific heat that is less than or equal to the seventh specific heat, and has an eighth thermal conductivity that is greater than or equal to the seventh thermal conductivity.

11. The analysis device according to claim 1, characterized in that: The temperature control mechanism in the housing is configured to be able to control the temperature using a Peltier element. The shell has a ninth specific heat and a ninth thermal conductivity, The casing temperature adjustment mechanism has a tenth specific heat that is less than or equal to the ninth specific heat, and has a tenth thermal conductivity that is greater than or equal to the ninth thermal conductivity.

12. The analysis device according to claim 1, characterized in that: The analysis device further includes a substrate temperature control mechanism for controlling the temperature of the substrate.

13. The analysis device according to claim 12, characterized in that: The substrate temperature control mechanism is composed of at least one of the following methods: having a flow path through which a constant temperature liquid for temperature adjustment flows; and The temperature is controlled by a Peltier element.

14. The analysis device according to claim 1, characterized in that: At least one of the housing temperature control mechanism and the susceptor temperature control mechanism preheats the light emitting element during a period in which the light emitting element does not emit light.

15. The analysis device according to claim 1, characterized in that: The substrate, the susceptor, and the susceptor temperature control mechanism are configured to allow heat generated by light emission from the light-emitting element to be dissipated via the substrate, the susceptor, and the susceptor temperature control mechanism.

Citation Information

Patent Citations

  • Absorbance meter and semiconductor manufacturing device using absorbance meter

    WO2018052074A1