Resistance network and resistance selection method thereof, storage medium and processor

Abstract

The embodiment of the invention provides a resistor network for calibrating sensitive resistors, a resistor selection method of the resistor network, a storage medium and a processor, and belongs to the technical field of integrated circuits. The resistance network comprises N network unit groups which are connected in series and respectively comprise one, two,..., 2N-1 resistance network units, each network unit group can be short-circuited by a corresponding controlled switch, the resistance network can be partially invalid or valid through the controlled switches, the sum of equivalent resistance of the valid network unit groups is equivalent resistance of the resistance network, and the equivalent resistance of the effective network unit groups is equivalent resistance of the resistance network. The equivalent resistance of a single resistance network unit is equivalent to the maximum resistance value of a sensitive resistor to be calibrated, so that the equivalent resistance of the resistor network unit with the maximum number in parallel connection in the N network unit groups is equivalent to the step length required for calibrating the sensitive resistor; when the resistance network is used for calibration, it can be ensured that each calibrated measurement value meets the precision requirement, and measurement errors are reduced.

Description

Technical Field

[0001] The present invention relates to the technical field of integrated circuits, and in particular to a resistor network and a resistor selection method, a storage medium and a processor for calibrating sensitive resistors. Background Art

[0002] When calibrating the resistance value of equivalent resistors, especially when calibrating the resistance value of sensitive resistors, detailed calibration is required to restore the corresponding information between the resistance value and the environmental parameters. For the resistors used for calibration, since the resistance value of the resistor product does not change continuously, it may happen that the designed resistor value cannot be found in the corresponding product, and it is necessary to use a nearby resistor model to replace it; or redesign the resistor parameters to match the existing resistor resistance value specification model.

[0003] However, using a resistor with a similar resistance value as a substitute will produce additional errors, resulting in the actual product not matching the parameters of the designed product, and the measured product indicators cannot reach the designed indicators. Furthermore, when the above resistor products that do not match the parameters of the designed product are used for actual measurement, deviations will also occur, especially when measuring multiple locations at the same time. Since different locations are affected by the environment differently, the measurement deviation directions between different locations will also be different, resulting in greater measurement errors.

[0004] The inventors of the present application discovered during the process of implementing the present invention that the technical defects of the prior art have not yet been effectively resolved. Summary of the invention

[0005] The purpose of the embodiment of the present invention is to provide a resistor network that can improve calibration accuracy and reduce measurement errors.

[0006] In order to achieve the above-mentioned object, an embodiment of the present invention provides a resistor network for calibrating a sensitive resistor, comprising a plurality of resistor network units and a plurality of controlled switches.

[0007] Wherein, the multiple resistance network units are divided into N network unit groups, the resistance network units in each network unit group are connected in parallel, and the resistance network units in different network unit groups are connected in series, and N is an integer greater than 1;

[0008] The number of resistor network units connected in parallel in the N network unit groups is in ascending order: 1, 2, ..., 2 N-1 indivual;

[0009] The equivalent resistance of the resistance network unit is equivalent to the maximum resistance value of the calibrated sensitive resistor, and the equivalent resistance of the resistance network unit with the largest number of parallel connections in the N network unit groups is equivalent to the step length required for calibrating the sensitive resistor;

[0010] Each resistor network unit includes a plurality of resistors connected in series and / or in parallel in the same order, and the resistance values ​​and resistance specifications of the resistors in the same order positions are consistent;

[0011] Each of the plurality of controlled switches is used to short-circuit one of the plurality of network unit groups.

[0012] Preferably, the precision of each resistor in the resistor network unit is 1% of the resistance.

[0013] Preferably, the connected resistors are connected via pads, and the diameter of the pads is comparable to the diameter of the semicircular notch of the resistor array.

[0014] Preferably, each resistor network unit is arranged in two layers, and the resistors in the two layers are arranged symmetrically to each other.

[0015] Optionally, the sensitive resistor is PT100, and each resistor network unit is two 220-ohm resistors connected in series and two 49.9-ohm resistors connected in series in parallel.

[0016] Optionally, the sensitive resistor is sensitive to one of light intensity, pressure, temperature, humidity, magnetic field intensity, and gas concentration.

[0017] On the other hand, an embodiment of the present invention provides a method for selecting a resistor in a resistor network for calibrating a sensitive resistor, which is used to determine the resistance value of a resistor in the resistor network for calibrating a sensitive resistor of the present application, and the method includes:

[0018] Selecting a resistor combination constituting a resistor network unit from resistor components that meet the precision requirements, so that the equivalent resistance of the resistor network unit is equivalent to the maximum resistance value of the calibrated sensitive resistor, and the equivalent resistance of the resistor network unit with the largest number of parallel-connected units in the N network unit groups is equivalent to the step length required for calibrating the sensitive resistor; and

[0019] Each resistor network unit includes a plurality of resistors connected in series and / or in parallel in the same order, and the resistance values ​​and resistance specifications of the resistors in the same order positions are consistent.

[0020] Optionally, the resistance selection method of the resistance network also includes: the equivalent resistance of the resistance network unit meets the accuracy requirement of the maximum resistance value of the sensitive resistor to be calibrated, and the equivalent resistance of the resistance network unit with the largest number of parallel-connected units in the N network unit groups meets the accuracy requirement of the step size.

[0021] On the other hand, an embodiment of the present invention provides a machine-readable storage medium having instructions stored thereon, the instructions being used to enable a machine to execute the resistance selection method for calibrating a resistance network of a sensitive resistor of the present application.

[0022] On the other hand, an embodiment of the present invention provides a processor for running a program, wherein the program, when being run, is used to execute the resistance selection method of the resistance network for calibrating sensitive resistors of the present application.

[0023] Through the above technical solution, the resistor network includes N groups of network units connected in series, including 1, 2, ..., 2 N-1 resistance network units, and each network unit group can be short-circuited by the corresponding controlled switch, that is, the controlled switch can make part of the resistance network invalid or valid, and the sum of the equivalent resistances of the valid network unit groups is the equivalent resistance of the resistance network. Since the equivalent resistance of a single resistance network unit is equivalent to the maximum resistance value of the sensitive resistor to be calibrated, the equivalent resistance of the resistance network unit with the largest number of parallel connections in the N network unit groups is equivalent to the step length required for calibrating the sensitive resistor. When the resistance network is used for calibration, it can be ensured that the measured value of each step of the calibration also meets the accuracy requirement. At the same time, each resistance network unit has the same structure, which can make the influence of the environment on the resistance in the parallel resistance network units as consistent as possible, thereby reducing the measurement error.

[0024] Other features and advantages of the embodiments of the present invention will be described in detail in the subsequent detailed description. BRIEF DESCRIPTION OF THE DRAWINGS

[0025] The accompanying drawings are used to provide a further understanding of the embodiments of the present invention and constitute a part of the specification. Together with the following specific implementations, they are used to explain the embodiments of the present invention, but do not constitute a limitation on the embodiments of the present invention. In the accompanying drawings:

[0026] Figure 1 is a circuit diagram of an embodiment of a resistor network for calibrating a sensitive resistor of the present invention;

[0027] Figure 2 yes Figure 1 A schematic diagram of the resistor connection of a resistor network unit;

[0028] Figure 3 Yes Figure 1 The embodiment shown is a schematic diagram of a circuit for calibrating a sensitive resistor;

[0029] Figure 4A and 4B yes Figure 1 Schematic diagram of packaging of resistors with the same resistance value in an integrated circuit in the embodiment;

[0030] Figure 5A and 5B yes Figure 4A and 4B Schematic diagram of the resistors arranged in two layers. DETAILED DESCRIPTION

[0031] The specific implementation of the embodiment of the present invention is described in detail below in conjunction with the accompanying drawings. It should be understood that the specific implementation described here is only used to illustrate and explain the embodiment of the present invention, and is not used to limit the embodiment of the present invention.

[0032] The embodiment of the present invention provides a resistor network for calibrating sensitive resistors. The structure of the resistor network and the principle of using the resistor network to obtain the equivalent resistance required for calibrating sensitive resistors are described below in conjunction with the accompanying drawings. The resistor network includes N network unit groups and N controlled switches, wherein the N network unit groups are as follows: Figure 1 As shown in FIG. 1 , R1, R2, ... Rn are connected in series, and N controlled switches are as follows: Figure 1 K1, K2, ...Kn shown are used to short-circuit the corresponding R1, R2, ...Rn respectively.

[0033] The internal network of each network unit group R1, R2, ... Rn is not shown, and is now described as follows:

[0034] Each of the n series-connected R1, R2, ... Rn includes a different number of parallel-connected resistor network units, but the present application does not limit the number of resistor network units included in R1, R2, ... Rn to be in ascending order. The equivalent resistance of each resistor network unit is equivalent to the maximum resistance value of the calibrated sensitive resistor, including 2 N-1 The equivalent resistance of the parallel resistor network units is equivalent to the step size required to calibrate the sensitive resistor.

[0035] In this embodiment, Figure 1 The resistor network shown is used in Figure 3 The calibration circuit shown is used, for example, for calibrating RT100, wherein the number of resistor network units connected in parallel in R1, R2, ..., Rn is in the order of 1, 2, ..., 2 in ascending order. N-1 The equivalent resistance of R1 is equivalent to the maximum resistance of the calibrated RT100, and the equivalent resistance of Rn is equivalent to the step size required for calibrating RT100.

[0036] Specifically, when the calibrated temperature range of RT100 is -50℃~600℃, its resistance range is 80.31Ω~350Ω. Figure 3 In the circuit shown, the resistance value of R0 is equivalent to 80.31Ω, and the sum of the resistance values ​​of R1 to Rn is in the range of 0Ω to 270Ω. The relationship between the minimum equivalent resistance value of the network unit group and the number of temperature measurement calibration points determined according to the temperature measurement step length of the calibration system is shown in Table 1 below:

[0037] Table 1

[0038] Number of temperature calibration points Minimum equivalent resistance value Ω 2 135 4 67.5 8 33.75 16 16.875 32 8.4375 64 4.21875 128 2.109375 256 1.0546875

[0039] More specifically, if you need to get 2 16 When the resistance interval of each calibration point is equal, 16 network unit groups are used, the resistance of each resistance network unit is 135Ω, and the number of parallel resistance network units included in the 16 network unit groups is 1, 2, 4, 8, 16, ..., 2 from small to large. 15 , that is, the equivalent resistance of the 16 network unit groups from large to small is: 135Ω, 135Ω / 2, 135Ω / 4, 135Ω / 8, ..., 135Ω / 2 15 When different equivalent resistances need to be simulated, Figure 3 The control signals DO1, DO2, ..., DOn shown in the figure control the on and off of switches K1, K2, ..., Kn (n = 16 at this time), respectively, so that the network unit group corresponding to the disconnected switches K1, K2, ..., Kn is an effective resistor, and the resistance value of the equivalent resistor is the sum of the resistance values ​​of the effective resistors. Thus, Figure 3 In the figure, the resistance range of the equivalent resistor is from R0 to R0+R1+R2+…+Rn, that is, 80.31Ω to 350Ω.

[0040] It should be noted that in actual applications, it is not always possible to find a resistance value that is completely consistent with the calibration point of the temperature measuring element to be calibrated. For example, when calibrating the resistance value of RT100, the minimum equivalent resistance value required is 135. However, if a high-precision resistor with an accuracy of 1% is used, especially a network resistor or a resistor array, only the following resistance values ​​can be selected: 10, 22, 33, 47, 49.9, 51, 82, 100, 220, 330, 510. Therefore, in this embodiment, the following can be selected: Figure 2 The resistor network unit shown, i.e., two 220 ohm resistors connected in series and two 49.9 ohm resistors connected in series in parallel, obtains an equivalent resistance of 134.95Ω, and the error with the required 135Ω is: 0.037%, which meets the temperature measurement accuracy requirement of PT100. For other sensitive resistors to be calibrated, technicians need to select a combination from the specifications of existing resistor products and make the equivalent resistance of a resistor network unit formed by the combination in series and parallel equal to the maximum resistance of the calibrated sensitive resistor. In other words, the equivalent resistance of a resistor network unit formed by series and parallel can be within the accuracy range required for calibration.

[0041] In some embodiments, the number of temperature measurement steps or calibration points is 4, and 2 network unit groups are used, wherein the design requirement for the resistance value of the network unit group with the smaller minimum equivalent resistance is 67.5Ω, and the following is used: Figure 2The two resistor network units shown in the figure are connected in parallel to achieve this. Among them, the packaging form of the 220Ω resistor array is as follows Figure 4A As shown, the package form of 49.9Ω resistor is as follows Figure 4B shown.

[0042] In order to further save space and stabilize the output resistance, a single resistor network unit is arranged on both sides, with the upper layer Figure 5A , the lower layer is Figure 5B As shown in the figure, the black dots are pads on the circuit board, which are used to connect the resistor components, and the black solid lines are the lines on the circuit board, which are used to connect different pads to achieve electrical connection. The size of the circuit board pad is designed according to the semicircular notch of the resistor component, and the diameter of the pad is equal to the diameter of the semicircular notch, which can reduce the area of ​​the circuit board and maximize the use of the circuit board space. In addition, in this embodiment, the pad 9 is arranged on the upper circuit board, and the pad 10 is arranged on the lower circuit board, and the two pads are arranged symmetrically up and down, and the temperature influence is consistent, avoiding the influence of temperature on different components and circuits.

[0043] It should be noted that, in this embodiment, only an example of a resistor network for calibrating PT100 is given, but the present invention is not limited to this. The sensitive resistor components used for calibration can be resistors that are sensitive to one of light intensity, pressure, temperature, humidity, magnetic field intensity, and gas concentration. Technicians can derive specific data of the resistor network of other sensitive resistors based on the principles given in this embodiment, and this application will not list them one by one.

[0044] Compared with the prior art, the technical advantages of the resistor network for calibrating sensitive resistors in the present application are:

[0045] 1. A resistor network that can accurately calibrate sensitive resistor components is proposed, which covers different temperature measurement steps or different numbers of temperature measurement points. For every doubling of the number of temperature measurement points, a group of network units is added accordingly, and the calibration accuracy is doubled.

[0046] 2. Each resistor network unit adopts a strictly symmetrical design. The temperature has a consistent effect on the resistance value and does not affect the resistance voltage division result. This avoids the influence of ambient temperature on the calibrated resistor network and improves the accuracy of calibration.

[0047] 3. The resistor network unit can be formed by combining the existing specifications of the resistor array or network resistor products. There is no need to customize the resistors of specific specifications. This improves the stability of the finished resistor network used to calibrate sensitive resistors and reduces measurement errors.

[0048] An embodiment of the present invention provides a method for selecting a resistor of a resistor network for calibrating a sensitive resistor, which is used to determine the resistance value and connection mode of the resistor network for calibrating the sensitive resistor. The method includes:

[0049] Selecting a resistor combination constituting a resistor network unit from resistor components that meet the precision requirements, so that the equivalent resistance of the resistor network unit is equivalent to the maximum resistance value of the calibrated sensitive resistor, and the equivalent resistance of the resistor network unit with the largest number of parallel-connected units in the N network unit groups is equivalent to the step length required for calibrating the sensitive resistor; and

[0050] Each resistor network unit includes a plurality of resistors connected in series and / or in parallel in the same order, and the resistance values ​​and resistance specifications of the resistors in the same order positions are consistent.

[0051] In some embodiments, the resistance selection method of the resistance network also includes: the equivalent resistance of the resistance network unit meets the accuracy requirement of the maximum resistance value of the sensitive resistor to be calibrated, and the equivalent resistance of the resistance network unit with the largest number of parallel-connected units in the N network unit groups meets the accuracy requirement of the step size.

[0052] An embodiment of the present invention provides a resistor selection device for a resistor network for calibrating sensitive resistors, including a processor and a memory. A program unit for executing the resistor selection method for calibrating the resistor network for calibrating sensitive resistors of the present application is stored in the memory, and the processor executes the above program unit stored in the memory to implement corresponding functions.

[0053] The processor includes a kernel, and the kernel retrieves the corresponding program unit from the memory. One or more kernels can be set, and the resistance value and connection mode of the resistor network used for calibrating the sensitive resistor are determined by adjusting the kernel parameters.

[0054] The memory may include non-permanent memory in a computer-readable medium, random access memory (RAM) and / or non-volatile memory, such as read-only memory (ROM) or flash RAM, and the memory includes at least one memory chip.

[0055] An embodiment of the present invention provides a storage medium on which a program is stored. When the program is executed by a processor, the method for selecting a resistor of a resistor network for calibrating a sensitive resistor of the present application is implemented.

[0056] An embodiment of the present invention provides a processor, which is used to run a program, wherein the program, when running, executes the resistance selection method of the resistance network for calibrating sensitive resistors of the present application.

[0057] An embodiment of the present invention provides a device, the device includes a processor, a memory, and a program stored in the memory and executable on the processor, and when the processor executes the program, the steps of the resistance selection method for calibrating a resistance network of a sensitive resistor of the present application are implemented. The device in this article can be a server, a PC, a PAD, a mobile phone, etc.

[0058] The present application also provides a computer program product, which, when executed on a data processing device, is suitable for executing a program for initializing the steps of the resistor selection method for calibrating a resistor network of a sensitive resistor of the present application.

[0059] Those skilled in the art will appreciate that the embodiments of the present application may be provided as methods, systems, or computer program products. Therefore, the present application may adopt the form of a complete hardware embodiment, a complete software embodiment, or an embodiment in combination with software and hardware. Moreover, the present application may adopt the form of a computer program product implemented in one or more computer-usable storage media (including but not limited to disk storage, CD-ROM, optical storage, etc.) that include computer-usable program code.

[0060] The present application is described with reference to the flowcharts and / or block diagrams of the methods, devices (systems), and computer program products according to the embodiments of the present application. It should be understood that each process and / or box in the flowchart and / or block diagram, as well as the combination of the processes and / or boxes in the flowchart and / or block diagram, can be implemented by computer program instructions. These computer program instructions can be provided to a processor of a general-purpose computer, a special-purpose computer, an embedded processor, or other programmable data processing device to generate a machine, so that the instructions executed by the processor of the computer or other programmable data processing device generate instructions for implementing the processes in the flowchart and / or block diagram. Figure 1 A process or multiple processes and / or boxes Figure 1 A device that provides the functions specified in a block or multiple blocks.

[0061] These computer program instructions may also be stored in a computer-readable memory capable of directing a computer or other programmable data processing device to operate in a specific manner, so that the instructions stored in the computer-readable memory produce an article of manufacture comprising an instruction device, which implements the process Figure 1 A process or multiple processes and / or boxes Figure 1 A function specified in one or more boxes.

[0062] These computer program instructions can also be loaded onto a computer or other programmable data processing device so that a series of operating steps are executed on the computer or other programmable device to produce a computer-implemented process, thereby providing instructions for implementing the process. Figure 1 A process or multiple processes and / or boxes Figure 1 The steps for the functions specified in one or more boxes.

[0063] In a typical configuration, a computing device includes one or more processors (CPU), input / output interfaces, network interfaces, and memory.

[0064] The memory may include non-permanent memory in a computer-readable medium, random access memory (RAM) and / or non-volatile memory in the form of read-only memory (ROM) or flash RAM. The memory is an example of a computer-readable medium.

[0065] Computer readable media include permanent and non-permanent, removable and non-removable media that can be implemented by any method or technology to store information. Information can be computer readable instructions, data structures, program modules or other data. Examples of computer storage media include, but are not limited to, phase change memory (PRAM), static random access memory (SRAM), dynamic random access memory (DRAM), other types of random access memory (RAM), read-only memory (ROM), electrically erasable programmable read-only memory (EEPROM), flash memory or other memory technology, compact disk read-only memory (CD-ROM), digital versatile disk (DVD) or other optical storage, magnetic cassettes, magnetic tape magnetic disk storage or other magnetic storage devices or any other non-transmission media that can be used to store information that can be accessed by a computing device. As defined herein, computer readable media does not include temporary computer readable media (transitory media), such as modulated data signals and carrier waves.

[0066] It should also be noted that the terms "include", "comprises" or any other variations thereof are intended to cover non-exclusive inclusion, so that a process, method, commodity or device including a series of elements includes not only those elements, but also other elements not explicitly listed, or also includes elements inherent to such process, method, commodity or device. In the absence of more restrictions, the elements defined by the sentence "comprises a ..." do not exclude the existence of other identical elements in the process, method, commodity or device including the elements.

[0067] The above are only embodiments of the present application and are not intended to limit the present application. For those skilled in the art, the present application may have various changes and variations. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present application should be included within the scope of the claims of the present application.

Claims

1. A resistor network for calibrating a sensitive resistor, characterized in that: comprising a plurality of resistor network units and a plurality of controlled switches, Wherein, the multiple resistance network units are divided into N network unit groups, the resistance network units in each network unit group are connected in parallel, and the resistance network units in different network unit groups are connected in series, and N is an integer greater than 1; The number of the resistor network units connected in parallel in the N network unit groups is, in ascending order, 1, 2, ..., 2. N-1 indivual; The equivalent resistance of the resistance network unit is equivalent to the maximum resistance value of the calibrated sensitive resistor, and the equivalent resistance of the resistance network unit with the largest number of parallel connections in the N network unit groups is equivalent to the step length required for calibrating the sensitive resistor; Each resistor network unit includes a plurality of resistors connected in series and / or in parallel in the same order, and the resistance values ​​and resistance specifications of the resistors in the same order positions are consistent; Each of the plurality of controlled switches is used to short-circuit one of the plurality of network unit groups.

2. The resistor network for calibrating a sensitive resistor according to claim 1, characterized in that: The precision of each resistor in the resistor network unit is 1%.

3. The resistor network for calibrating a sensitive resistor according to claim 1, characterized in that: The connected resistors are connected via pads, and the diameter of the pads is equivalent to the diameter of the semicircular notch of the resistor array.

4. The resistor network for calibrating a sensitive resistor according to claim 1, characterized in that: The plurality of resistor network units are arranged in a double layer, and the resistors in the double layer are arranged symmetrically to each other.

5. The resistor network for calibrating a sensitive resistor according to claim 1, characterized in that: The sensitive resistor is PT100, and each resistor network unit is two 220 ohm resistors connected in series and two 49.9 ohm resistors connected in series in parallel.

6. The resistor network for calibrating a sensitive resistor according to claim 1, characterized in that: The sensitive resistor is sensitive to one of light intensity, pressure, temperature, humidity, magnetic field intensity, and gas concentration.

7. A method for selecting resistors in a resistor network for calibrating sensitive resistors, for determining the resistance values ​​of resistors in a resistor network for calibrating sensitive resistors according to any one of claims 1 to 6, characterized in that: The method comprises: Selecting a resistor combination constituting the resistor network unit from resistor components that meet the precision requirements, so that the equivalent resistance of the resistor network unit is equivalent to the maximum resistance value of the calibrated sensitive resistor, and the equivalent resistance of the resistor network unit with the largest number of parallel-connected units in the N network unit groups is equivalent to the step length required for calibrating the sensitive resistor; and Each resistor network unit includes a plurality of resistors connected in series and / or in parallel in the same order, and the resistance values ​​and resistance specifications of the resistors in the same order positions are consistent.

8. The method for selecting resistors in a resistor network according to claim 7, wherein: Also includes: The equivalent resistance of the resistor network unit meets the accuracy requirement of the maximum resistance value of the sensitive resistor to be calibrated, and the equivalent resistance of the resistor network unit with the largest number of parallel-connected units in the N network unit groups meets the accuracy requirement of the step size.

9. A machine-readable storage medium having instructions stored thereon, the instructions being used to enable a machine to execute the resistor selection method for calibrating a resistor network of a sensitive resistor as claimed in claim 7 or 8.

10. A processor, characterized in that: Used to run a program, wherein the program, when run, is used to execute: the resistance selection method for a resistance network for calibrating sensitive resistors as described in claim 7 or 8.

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