Infrared thermal wave nondestructive testing integrated test bed under electric pulse thermal excitation

Abstract

The invention relates to an infrared thermal wave nondestructive testing integrated test bench under electric pulse thermal excitation, which comprises a main frame, a console, a thermal excitation source, a liquid nitrogen gasification system and a thermal shielding case, the thermal shielding case is covered outside the main frame, the console is arranged outside the thermal shielding case, the thermal excitation source is fixed in the thermal shielding case, and the liquid nitrogen gasification system is fixed in the thermal excitation source. The thermal excitation source is electrically connected with the control console, the main frame is provided with a direction adjusting device, the direction adjusting device is movably connected with a thermal infrared imager, the main frame is provided with a plurality of supporting rods through fixing devices, the supporting rods are connected with telescopic fixing pieces through movable devices, and the telescopic fixing pieces are connected with the thermal infrared imager through movable devices. An electric contact is arranged at the other end of the telescopic fixing piece and electrically connected with the control table through a cable. According to the invention, the problems of rapid cooling of the test piece, shielding of an environment heat source and infrared light, and rapid fixation and position adjustment of the test piece, the thermal infrared imager and the thermal excitation loading electrode can be solved.

Description

Technical Field

[0001] The invention relates to the technical field of electric pulse infrared detection, in particular to an integrated test bench for infrared heat wave nondestructive detection under electric pulse thermal excitation. Background Art

[0002] In the electric pulse infrared detection test, due to the diversity of test objects and environments, a variety of test devices are often required to meet different test requirements. In particular, in order to achieve good detection results, it is often necessary to increase the voltage or current to increase the temperature difference between the defect and its adjacent parts; in addition, after a test, the specimen takes a long time to cool down in a natural state, so that the next test has to wait for a long time before it can start; furthermore, the environment around the specimen inevitably has heat sources and infrared light radiation with different temperatures, which affects the test of the surface temperature of the specimen; in addition, when the specimen is thermally excited, it is necessary to energize in two directions perpendicular to each other, and the wires are required to be connected to the specimen by welding or conductive clamps. In the conventional method, although the welding method is reliable and has good contact, it is labor-intensive and time-consuming. The conductive clip has the advantage of quick connection, but different shapes of test pieces require different conductive clips, and there is often a problem of poor contact. However, in the existing infrared thermal wave nondestructive testing based on electric pulse thermal excitation, either a handheld thermal imager is directly used to measure the thermal image of the test piece like the nondestructive testing of general test pieces, or only a simple test piece and thermal imager fixing bracket is set, but it still relies on manual adjustment and fixation, and there is no cooling of the test piece, environmental heat source and infrared light shielding measures, and there is no rapid docking between the electrode and the test piece, as well as rapid and accurate adjustment and focusing of the test piece and the infrared thermal imager. There are problems such as low test efficiency and large errors. Summary of the invention

[0003] The purpose of the present invention is to provide an integrated test bench for infrared thermal wave nondestructive testing under electric pulse thermal excitation, which can solve the problems of rapid cooling of test pieces and shielding of environmental heat sources and infrared light, as well as rapid fixation and position adjustment of test pieces, infrared thermal imagers and thermal excitation loading electrodes.

[0004] To achieve the above-mentioned objectives, the present invention provides the following technical solutions: an integrated test bench for infrared thermal wave nondestructive testing under electric pulse thermal excitation, comprising a main frame, a control console, a thermal excitation source, a liquid nitrogen gasification system and a heat shielding cover, the heat shielding cover is provided on the outer cover of the main frame, the control console is provided outside the heat shielding cover, the thermal excitation source is fixed inside the heat shielding cover, the thermal excitation source is electrically connected to the control console, the main frame is provided with an azimuth adjustment device, the azimuth adjustment device is movably connected to an infrared thermal imager, a plurality of support rods are provided on the main frame through a fixing device, a telescopic fixing piece is connected to the support rod through a movable device, an electric contact is provided at the other end of the telescopic fixing piece, and the electric contact is electrically connected to the control console through a cable.

[0005] Furthermore, the main frame includes a square top frame, and the square top frame and the square bottom frame are fixedly connected by vertical rods.

[0006] Furthermore, the liquid nitrogen gasification system includes a support rod and a liquid nitrogen bottle. The support rod is fixed on the main frame, and a nitrogen injection ring tube is fixed at the end of the support rod. The air inlet of the nitrogen injection ring tube is connected to the liquid nitrogen bottle outside the heat shield through a connecting pipeline, and a vaporizer and an electric heater are sequentially arranged on the connecting pipeline.

[0007] Furthermore, a plurality of nozzles are arranged on one side of the nitrogen injection ring tube facing the test piece.

[0008] Furthermore, the movable device includes a first slide and a first pulley, the first slide is provided on the support rod, the first pulley is fixed on the telescopic fixing member, and the telescopic fixing member slides on the first slide via the first pulley.

[0009] Furthermore, the azimuth adjustment device includes a sliding rod, a second slide and a second pulley. The second slide is fixed on the lower surface of the square top frame and the upper surface of the square bottom frame. The second pulleys are fixed at both ends of the sliding rod. The second pulleys at both ends can slide on the second slide. A support seat body is sleeved on the sliding rod, and the infrared thermal imager is fixed on the support seat body. A threaded through hole is opened at the other end of the support seat body, and a locking bolt can press against the sliding rod through the threaded through hole to lock the position of the support seat body.

[0010] Furthermore, the main frame is fixed to the ground or a base by anchor bolts.

[0011] Furthermore, the telescopic fixing member includes a hydraulic rod, and the telescopic end of the hydraulic rod is connected to a clamp or a tightener.

[0012] Furthermore, the fixing device includes a first threaded hole arranged on the vertical rod and second threaded holes arranged at both ends of the support rod. The first threaded holes are provided in plurality and are arranged vertically in a line. The support rod is locked with a nut by passing a bolt through the first threaded hole and the second thread.

[0013] Beneficial effects of the present invention: The test bench of the present invention is suitable for nondestructive testing of infrared heat waves under electric pulse thermal excitation. The integrated test bench integrates various functional modules, which can effectively isolate the influence of external thermal radiation and infrared light from the environment, and can quickly cool the test piece through low-temperature nitrogen, shorten the test cycle, increase the temperature difference inside the test piece, and improve the recognition of defects. In addition, the test bench has strong applicability and can meet the testing needs of test pieces of different structural shapes, and the assembly, disassembly and adjustment speed of the test piece and the thermal imager are fast. BRIEF DESCRIPTION OF THE DRAWINGS

[0014] Figure 1 It is a structural schematic diagram of the test bench of the present invention; Figure 2 It is a structural schematic diagram of the azimuth adjustment device of the present invention; Figure 3 for Figure 2 A magnified cross-sectional view of the structure at A in the middle; Figure 4 It is a top view of the tightener and the support rod when the test piece of the present invention is in a three-dimensional shape; Figure 5 It is a top view of the clamp and the support rod when the test piece of the present invention is a cylinder.

[0015] Wherein: 1. control console, 2. thermal excitation source, 3. azimuth adjustment device, 31. slide bar, 32. second slideway, 33. second pulley, 34. support seat, 35. infrared thermal imager, 36. locking bolt, 4. liquid nitrogen gasification system, 41. electric heater, 42. vaporizer, 43. liquid nitrogen bottle, 44. nitrogen injection ring tube, 45. support rod, 5. fixing device, 51. second threaded hole, 6. heat shielding cover, 7. main frame, 71. square top frame, 72. square bottom frame, 73. vertical rod, 8. movable device, 81. first slideway, 82. first pulley, 9. support rod, 10. telescopic fixing part, 101. hydraulic rod, 102. tightener, 103. clamp, 11. electrode contact, 12. test piece, 14. cable. DETAILED DESCRIPTION

[0016] The present invention will be further described below in conjunction with the accompanying drawings.

[0017] See also Figures 1 to 5The present invention provides an embodiment: an integrated test bench for infrared thermal wave nondestructive testing under electric pulse thermal excitation, comprising a main frame 7, a control console 1, a thermal excitation source 2, a liquid nitrogen gasification system 4 and a heat shielding cover 6, wherein the heat shielding cover 6 is provided on the outer cover of the main frame 7, the control console 1 is provided outside the heat shielding cover 6, the thermal excitation source 2 is fixed inside the heat shielding cover 6, the thermal excitation source 2 is electrically connected to the control console 1, the main frame 7 is provided with an azimuth adjustment device 3, the azimuth adjustment device 3 is movably connected to an infrared thermal imager 35, a plurality of support rods 9 are provided on the main frame 7 through a fixing device 5, a telescopic fixing member 10 is connected to the support rod 9 through a movable device 8, an electrical contact is provided at the other end of the telescopic fixing member 10, and the electrical contact is electrically connected to the control console 1 through a cable 14. The heat shield 6 is used to block the test of the surface temperature of the test piece 12 by the environmental heat radiation. The control console 1 has the function of starting the thermal excitation source 2 (electric pulse generator), thermally exciting the test piece 12 and controlling the liquid nitrogen gasification system 4. The dynamic temperature field on the surface of the test piece 12 captured by the infrared thermal imager 35 is also transmitted to the computer of the control console 1, and the computer stores, reproduces and analyzes the dynamic infrared thermal image. When using the test bench, first adjust the upper and lower positions of the test piece 12 along the main frame 7 according to the structural shape and size of the test piece 12, and adjust the position of the telescopic fixing member 10 on the support rod 9. The support rod 9 can be set in a group of 4, and two groups are set on the main frame 7, such as Figure 1 As shown, by setting liquid nitrogen and its gasification system, a method of spraying low-temperature nitrogen or liquid nitrogen (adjustable as needed) around the test piece 12 to cool the test piece 12, fixing the test piece 12 and the thermal excitation device in the heat shielding cover 6 through the heat shielding cover 6, eliminating the influence of external environmental heat sources and infrared light on the test, and by setting a telescopic fixing member 10 with adjustable up, down, left, and right positions and adjustable clamping force or top tightening force, fast fixing of test pieces 12 of different sizes and shapes can be achieved; at the same time, the azimuth adjustment device 3 is used to realize fast and accurate adjustment of the position and focus of the infrared thermal imager 35.

[0018] Please continue reading Figure 1 As shown, in one embodiment of the present invention, the main frame 7 includes a square top frame 71, and the square top frame 71 and the square bottom frame 72 are fixedly connected by a vertical rod 73. The main frame 7 is used to support the infrared thermal imager 35 and the telescopic fixing member 10.

[0019] Please continue reading Figure 1As shown, in one embodiment of the present invention, the liquid nitrogen gasification system 4 includes a support rod 45 and a liquid nitrogen bottle 43. The support rod 45 is fixed on the main frame 7. A nitrogen injection ring pipe 44 is fixed at the end of the support rod 45. The air inlet of the nitrogen injection ring pipe 44 is connected to the liquid nitrogen bottle 43 outside the heat shield 6 through a connecting pipeline. A vaporizer 42 and an electric heater 41 are sequentially arranged on the connecting pipeline. The nitrogen injection ring pipe 44 passes through the support rod 45. Four support rods 45 can be arranged and fixed on the four sides of the main frame 7. When the specimen 12 needs to be cooled, the liquid nitrogen outlet valve of the liquid nitrogen bottle 43 is opened to gasify the liquid nitrogen through the vaporizer 42, and the nitrogen temperature is adjusted to the required temperature through the electric heater 41, and finally sprayed out from the nitrogen injection ring pipe 44 to cool the specimen 12.

[0020] Please continue reading Figure 1 As shown, in one embodiment of the present invention, a plurality of nozzles are provided on a side of the nitrogen injection ring tube 44 facing the test piece 12 .

[0021] Please continue reading Figure 4 , Figure 5 As shown, in one embodiment of the present invention, the movable device 8 includes a first slide 81 and a first pulley 82. The first slide 81 is provided on the support rod 9, and the first pulley 82 is fixed on the telescopic fixing member 10. The telescopic fixing member 10 slides on the first slide 81 through the first pulley 82. The first slide 81 is provided on the support rod 9, and the telescopic fixing member 10 can be horizontally moved on the support rod 9 through the pulley at the connection position of the telescopic fixing member 10 and the support rod 9. The telescopic fixing member 10 has a telescopic function, and the length can be adjusted according to the size of the test piece 12 to ensure the contact between the electric contact and the test piece 12. The top of the telescopic fixing member 10 is provided with an electrode contact 11. The material of the electrode contact 11 is a copper component with good plasticity, and the fastening method can be adjusted according to the test piece 12. It has good conductivity, and an electric pulse current can be applied to the test piece 12 to achieve thermal excitation of the test piece 12.

[0022] Please continue reading Figure 2 , Figure 3As shown, in one embodiment of the present invention, the azimuth adjustment device 3 includes a slide bar 31, a second slideway 32 and a second pulley 33. The second slideway 32 is fixed to the lower surface of the square top frame 71 and the upper surface of the square bottom frame 72. The second pulleys 33 are fixed at both ends of the slide bar 31. The second pulleys 33 at both ends can slide on the second slideway 32. A support seat body 34 is sleeved on the slide bar 31. The infrared thermal imager 35 is fixed on the support seat body 34. A threaded through hole is provided at the other end of the support seat body 34. The locking bolt 36 can press against the slide bar 31 through the threaded through hole to lock the position of the support seat body 34. The slide bar 31 moves left and right along the pulley tracks fixed on the lower surface of the square top frame 71 and the upper surface of the square bottom frame 72 through the second pulleys 33 at the top and bottom. The infrared thermal imager 35 is fixed on the support base 34. The support base 34 is sleeved on the slide bar 31. The support base can adjust the position of the support base 34 on the slide bar 31 and the direction of the infrared thermal imager 35. Tighten the locking bolt 36 and the thermal imager is fixed on the bracket 31; loosen the locking bolt 36 so that the infrared thermal imager 35 can flexibly adjust its direction to quickly reach the best shooting position.

[0023] Please continue reading Figure 1 As shown, in one embodiment of the present invention, the main frame 7 can be fixed on the ground or the base by anchor bolts. The main frame 7 is used to bear the weight of the test system components and the tightening force of the tightening device.

[0024] Please continue reading Figure 1 , Figure 4 , Figure 5 As shown, in one embodiment of the present invention, further, the telescopic fixing member 10 includes a hydraulic rod 101, and the telescopic end of the hydraulic rod 101 is connected to a clamp 103 or a tensioner 102. When the specimen 12 is a cylinder, the clamp 103 is used to clamp the specimen 12; when the specimen 12 is a plate, a general three-dimensional structure or a columnar structure or other three-dimensional shapes, the tensioner 102 is used to press the specimen 12. Figure 4 , Figure 5 As shown, the fixation and positioning of the test piece 12 is greatly accelerated thereby.

[0025] Please continue reading Figure 1 , Figure 4 , Figure 5 As shown, the fixing device 5 includes a first threaded hole arranged on the vertical rod 73 and second threaded holes 51 arranged at both ends of the support rod 9. The first threaded holes are provided in plurality and are arranged vertically side by side in a line. The support rod 9 is fastened with a nut by passing a bolt through the first threaded hole and the second thread.

[0026] The present invention has the following working principle: when the test bench is used, the upper and lower positions of the test piece 12 along the main frame 7 are adjusted according to the structural shape and size of the test piece 12, and the position of the telescopic fixing member 10 on the support rod 9 is adjusted. When the test piece 12 is fixed, the electric pulse switch on the control console 1 is enabled to thermally excite the test piece 12. By setting liquid nitrogen and its gasification system, low-temperature nitrogen or liquid nitrogen (adjustable as needed) is sprayed around the test piece 12 to cool the test piece 12. The test piece 12 and the thermal excitation device are fixed in the heat shielding cover 6 through the heat shielding cover 6 to prevent the influence of external environmental heat sources and infrared light on the test. By setting the telescopic fixing member 10 with adjustable upper, lower, left and right positions and adjustable clamping force or top tightening force, the test pieces 12 of different sizes and shapes can be quickly fixed; at the same time, the azimuth adjustment device 3 is used to realize the rapid and accurate adjustment of the position and focus of the infrared thermal imager 35.

[0027] The above description is only a preferred embodiment of the present invention and should not be construed as limiting the present application. All equivalent changes and modifications made within the scope of the patent application of the present invention should fall within the scope of the present invention.

Claims

1. An integrated test bench for infrared thermal wave nondestructive testing under electric pulse thermal excitation, characterized in that: The invention comprises a main frame, a control console, a thermal excitation source, a liquid nitrogen gasification system and a heat shielding cover. The heat shielding cover is arranged on the outer cover of the main frame, the control console is arranged outside the heat shielding cover, the thermal excitation source is fixed inside the heat shielding cover, the thermal excitation source is electrically connected to the control console, the main frame is provided with an azimuth adjustment device, the azimuth adjustment device is movably connected to an infrared thermal imager, a plurality of support rods are arranged on the main frame through a fixing device, a telescopic fixing piece is connected to the support rod through a movable device, an electric contact is arranged on the other end of the telescopic fixing piece, and the electric contact is electrically connected to the control console through a cable.

2. According to claim 1, an integrated test bench for infrared thermal wave nondestructive testing under electric pulse thermal excitation is characterized in that: The main frame comprises a square top frame and a square bottom frame, and the square top frame and the square bottom frame are fixedly connected by vertical rods.

3. The integrated test bench for infrared thermal wave nondestructive testing under electric pulse thermal excitation according to claim 2 is characterized in that: The liquid nitrogen gasification system comprises a support rod and a liquid nitrogen bottle. The support rod is fixed on the main frame. A nitrogen injection ring pipe is fixed at the end of the support rod. The air inlet of the nitrogen injection ring pipe is connected to the liquid nitrogen bottle outside the heat shield through a connecting pipeline. A vaporizer and an electric heater are sequentially arranged on the connecting pipeline.

4. The integrated test bench for infrared thermal wave nondestructive testing under electric pulse thermal excitation according to claim 3 is characterized by: The nitrogen injection ring tube is provided with a plurality of nozzles on one side facing the test piece.

5. The integrated test bench for infrared thermal wave nondestructive testing under electric pulse thermal excitation according to claim 1 is characterized by: The movable device comprises a first slideway and a first pulley. The support rod is provided with the first slideway, the telescopic fixing member is fixed with the first pulley, and the telescopic fixing member slides on the first slideway via the first pulley.

6. The integrated test bench for infrared thermal wave nondestructive testing under electric pulse thermal excitation according to claim 1 is characterized by: The azimuth adjustment device includes a sliding rod, a second slideway and a second pulley. The second slideway is fixed to the lower surface of the square top frame and the upper surface of the square bottom frame. The second pulleys are fixed to both ends of the sliding rod. The second pulleys at both ends can slide on the second slideway. A support seat body is sleeved on the sliding rod, and the infrared thermal imager is fixed on the support seat body. A threaded through hole is opened at the other end of the support seat body, and a locking bolt can press against the sliding rod through the threaded through hole to lock the position of the support seat body.

7. The integrated test bench for infrared thermal wave nondestructive testing under electric pulse thermal excitation according to claim 1 is characterized by: The main frame is fixed on the ground or a base by anchor bolts.

8. The integrated test bench for infrared thermal wave nondestructive testing under electric pulse thermal excitation according to claim 1 is characterized by: The telescopic fixing member comprises a hydraulic rod, and the telescopic end of the hydraulic rod is connected with a clamp or a tensioner.

9. According to the integrated test bench for infrared thermal wave non-destructive testing under electric pulse thermal excitation described in claim 2, the fixing device includes a first threaded hole arranged on the vertical rod and a second threaded hole arranged at both ends of the support rod, the first threaded hole is provided with a plurality of holes and arranged vertically side by side in a line, and the support rod is locked with a nut by passing a bolt through the first threaded hole and the second thread.

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