Automatic double-pulse test system and test method

Abstract

The invention discloses an automatic double-pulse test system and method, and the system comprises an upper computer unit, a controller unit, a capacitor charging and discharging loop unit, a load inductance unit, an IGBT power unit, and an oscilloscope unit, the upper computer unit is connected with the controller unit, the controller unit is connected with the IGBT power unit, and the oscilloscope unit is connected with the capacitor charging and discharging loop unit. The control end of the controller unit is connected with the input ends of the capacitor charging and discharging loop unit and the load inductance unit, and the output ends of the load inductance unit, the capacitor charging and discharging loop unit and the oscilloscope unit are respectively connected with the IGBT power unit. The whole operation process can be realized through an upper computer. Full-automatic control and electrical isolation of the whole double-pulse test loop are realized through the controller, so that the test safety is effectively guaranteed; the turn-on and turn-off resistors driven by the IGBT can be adjusted on line, the operation is convenient, and the test efficiency is greatly improved; most IGBT double-pulse test scenes can be met, and the IGBT power module and the capacitor module can be directly and quickly connected with the system for testing.

Description

Technical Field

[0001] The invention belongs to the technical field of double pulse testing, and in particular relates to an automatic double pulse testing system and a testing method. Background Art

[0002] As the most representative product of power electronics technology, IGBT realizes power conversion, transmission and control in electrical equipment. It is the core component of power electronics equipment and the main force of efficient energy saving and emission reduction. With the development of new energy, IGBT modules are more and more widely used, especially in new energy electric vehicles, power equipment, industry, consumption and other industries. Different power electronic products need to perform double pulse tests on IGBT during the design process. Different working conditions and parameters will have a great impact on the operation of IGBT. Therefore, in order to ensure the stable and reliable operation of IGBT, double pulse testing is necessary and the most effective means. Double pulse testing can not only obtain the parameters of the switch tube during the switching process, but also be used to evaluate whether the driving resistance value is appropriate and whether an absorption circuit is needed. It can also measure the performance of the switch tube in the actual circuit, mainly reverse recovery current, turn-off voltage spike, turn-on and turn-off time, etc., and then evaluate the reverse recovery behavior and safety margin of the diode.

[0003] Double-pulse testing often requires building a double-pulse testing system based on actual working conditions. During the test, it is necessary to replace the load inductor and IGBT drive resistor according to the actual working conditions, continuously adjust the IGBT on and off time, etc. The operation involves high voltage and large current, and there are many unsafe factors.

[0004] The dual-pulse test system currently used still needs to manually adjust the load inductance according to the actual working conditions, replace the IGBT drive resistor, and manually control the charge and discharge during the test. The test process and changing the test conditions are relatively cumbersome. The dual-pulse circuit involves high voltage and large current, and the operation itself has great safety hazards. Summary of the invention

[0005] The purpose of the present invention is to overcome the problem that a double pulse test system needs to manually adjust the inductance, replace the resistance and manually perform charge and discharge control, and proposes an automatic double pulse test system and a test method.

[0006] In order to achieve the above object, the present invention adopts the following technical scheme: An automatic double pulse test system comprises a host computer unit, a controller unit, a capacitor charge and discharge loop unit, a load inductance unit, an IGBT power unit and an oscilloscope unit, wherein the host computer unit is interconnected with the controller unit, the controller unit is interconnected with the IGBT power unit, a control end of the controller unit is connected to input ends of the capacitor charge and discharge loop unit and the load inductance unit, and output ends of the load inductance unit, the capacitor charge and discharge loop unit and the oscilloscope unit are respectively connected to the IGBT power unit; The host computer unit is used to set the test loop parameters, send work instructions to the control panel of the controller unit, receive the test data fed back by the controller unit and display and analyze it; The controller unit is used to receive the working instructions sent by the host computer unit to drive output, circuit switching and drive resistance switching, and feed back test data to the host computer unit; The capacitor charging and discharging circuit unit is used to store and release the test energy; The load inductance unit is used to simulate different load conditions of the test; The IGBT power unit is used to convert the energy stored in the capacitor charging and discharging circuit unit into a test power output, and at the same time automatically adjust the driving resistance through the control unit; The oscilloscope unit is used to monitor and record real-time data and waveforms during the test process.

[0007] Furthermore, the capacitor charging and discharging circuit unit includes a high-voltage DC source, a capacitor plate, a pre-charging resistor and a discharging resistor, wherein the high-voltage DC source is connected to a DC contactor and the capacitor plate, and the DC contactor is connected to a pre-charging resistor or a discharging resistor.

[0008] Furthermore, before the test starts, the control board controls the DC contactor to be connected to the pre-charging resistor, and the high-voltage DC source pre-charges the capacitor. After the test is completed, the control board controls the DC contactor to be connected to the discharge resistor to discharge the capacitor plate.

[0009] Furthermore, the load inductance unit includes a load inductance and a DC contactor. The load inductance is connected to a control board of the control unit through the DC contactor, and the inductance value of the load inductance is adjusted through the control board.

[0010] Furthermore, the IGBT power unit includes a drive adapter board, an IGBT drive board, an IGBT module and a busbar. The IGBT module is connected to the IGBT drive board through the drive adapter board, the busbar connects the IGBT to the capacitor board, and the control board is connected to the IGBT drive unit through a short cable.

[0011] Furthermore, the IGBT power unit simultaneously outputs four isolated IGBT drive signals, and is compatible with driving IGBTs below 2KV. The IGBT power unit receives a working instruction sent by the host computer unit through the control board to adjust the drive resistance.

[0012] Furthermore, the IGBT power unit adjusts the on-resistance and the off-resistance respectively, with an adjustment interval of 1 ohm and an adjustment range of 1-10 ohms.

[0013] Furthermore, the oscilloscope unit includes an oscilloscope, an isolated voltage probe and a Rogowski coil probe, and the oscilloscope unit is directly connected to the host computer unit and is used to store oscilloscope measurement results.

[0014] Furthermore, the host computer unit switches the test load inductance, capacitor charging and discharging circuit and driving resistance through the controller unit.

[0015] An automatic double pulse test method, using the automatic double pulse test system, includes the following steps: setting test loop parameters in a host computer unit, selecting a test mode to send a work instruction to a controller unit, the controller unit receiving the work instruction sent by the host computer to prepare for drive output, loop switching and drive resistance switching operations; the capacitor charge and discharge loop unit performs energy storage and release; Perform a double pulse test. The controller unit sends the first pulse signal to the IGBT power unit according to the test mode and parameters set by the host computer to drive the IGBT to turn on. The bus voltage is loaded onto the load inductor unit through the IGBT, and the inductor current begins to rise linearly. The oscilloscope unit monitors and records the real-time data of voltage and current during the IGBT turn-on process. After the first pulse ends, the IGBT is turned off, and the inductor current continues to flow through the freewheeling diode, and the current slowly decays. After the set pulse interval, the controller unit sends the second pulse signal to the IGBT power unit to drive the IGBT to turn on again. At this time, the freewheeling diode enters the reverse recovery state, and the voltage generated by the stray inductance is superimposed on the DC voltage to form a voltage spike. The oscilloscope unit monitors and records the real-time data of voltage and current during the IGBT turn-on and turn-off process. The controller unit feeds back the data collected during the test to the host computer unit, which receives and displays the test data, processes and analyzes the test data, and adjusts the driving resistance of the driving circuit according to the test results.

[0016] Compared with the prior art, the present invention has the following beneficial technical effects: The automatic double pulse test system proposed in the present invention optimizes and improves the double pulse test circuit from the perspective of experimental testing and engineering application, adopts commonly used power devices, control boards, drive boards and host computers, and realizes the automatic test of the double pulse test system through the host computer software and controller. The entire operation process can be realized through the host computer. The controller realizes full automatic control and electrical isolation of the entire double pulse test circuit, effectively ensuring the safety of the test; the on and off resistance of the IGBT drive can be adjusted online, which is convenient to operate and greatly improves the test efficiency; the test system can meet most of the IGBT double pulse test scenarios, and the IGBT power module and capacitor module can be directly connected to the system for testing, and the double pulse test system is automated in a simple circuit form, which improves the efficiency of the double pulse test and ensures the safety of the test personnel. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] The drawings described herein are for explanation purposes only and are not intended to limit the scope of the present invention in any way. In addition, the shapes and proportional dimensions of the components in the drawings are only for illustration purposes to help understand the present invention, and are not intended to specifically limit the shapes and proportional dimensions of the components of the present invention. In the drawings: Figure 1 This is a structural diagram of an automatic double-pulse testing system of the present invention.

[0018] Figure 2 The present invention is a structural diagram of an IGBT driver board in an IGBT power unit of an automatic double-pulse test system. DETAILED DESCRIPTION

[0019] In order to enable those skilled in the art to better understand the scheme of the present invention, the technical scheme in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work should fall within the scope of protection of the present invention.

[0020] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as those commonly understood by those skilled in the art to which the present invention belongs. The terms used herein in the specification of the present invention are only for the purpose of describing specific embodiments and are not intended to limit the present invention. The term "and / or" used herein includes any and all combinations of one or more of the related listed items.

[0021] It should be noted that the terms "first", "second", etc. in the specification and claims of the present invention and the above-mentioned drawings are used to distinguish similar objects, and are not necessarily used to describe a specific order or sequence. It should be understood that the data used in this way can be interchanged where appropriate, so that the embodiments of the present invention described herein can be implemented in an order other than those illustrated or described herein. In addition, the terms "including" and "having" and any variations thereof are intended to cover non-exclusive inclusions, for example, a process, method, system, product or device that includes a series of steps or units is not necessarily limited to those steps or units that are clearly listed, but may include other steps or units that are not clearly listed or inherent to these processes, methods, products or devices.

[0022] Embodiment 1 See also Figure 1 , an automatic double pulse test system, including a host computer unit, a controller unit, a capacitor charge and discharge loop unit, a load inductance unit, an IGBT power unit and an oscilloscope unit, the host computer unit is interconnected with the controller unit, the controller unit is interconnected with the IGBT power unit, the control end of the controller unit is connected to the input end of the capacitor charge and discharge loop unit and the load inductance unit, and the output end of the load inductance unit, the capacitor charge and discharge loop unit and the oscilloscope unit are respectively connected to the IGBT power unit; the host computer unit is used to set the test loop parameters, send work instructions to the control board of the controller unit, receive the test data fed back by the controller unit and display and analyze it; the controller unit is used to receive the work instructions sent by the host computer unit to drive output, loop switching and drive resistance switching, and feed back test data to the host computer unit; the capacitor charge and discharge loop unit is used to store and release test energy; the load inductance unit is used to simulate different load conditions of the test; the IGBT power unit is used to convert the energy stored in the capacitor charge and discharge loop unit into test power output, and adjust the drive resistance at the same time; the oscilloscope unit is used to monitor and record real-time data during the test.

[0023] The automatic double pulse test system provided in this embodiment only needs to connect the IGBT power unit and capacitor unit of the actual working condition to the double pulse test system. The test personnel can set parameters and test through the host computer. The test process effectively isolates the test personnel and the test high voltage circuit, effectively reduces the frequency of personnel operating the circuit, and ensures the safety of the test personnel. It has a high degree of automation, flexibility and versatility, can meet the needs of various IGBT double pulse tests, and ensures the safety and accuracy of the test.

[0024] The capacitor charge and discharge circuit unit includes a high-voltage DC source, a capacitor plate, a pre-charge resistor and a discharge resistor. The high-voltage DC source is connected to a DC contactor and the capacitor plate, and the DC contactor is connected to a pre-charge resistor or a discharge resistor. Before the test starts, the DC contactor is controlled by the control board to connect to the pre-charge resistor, and the high-voltage DC source pre-charges the capacitor. After the test is completed, the control board controls the DC contactor to connect to the discharge resistor to discharge the capacitor plate. The load inductance unit includes a load inductance and a DC contactor. The load inductance is connected to the control board of the control unit through the DC contactor, and the load inductance is adjusted by the control board. See Figure 2 The IGBT power unit includes a drive adapter board, an IGBT drive board, an IGBT module and a busbar. The IGBT module is connected to the IGBT drive board through the drive adapter board, the busbar is connected to the capacitor board, and the control board is connected to the IGBT drive unit through a short cable. The IGBT power unit simultaneously outputs four isolated IGBT drive signals, which are compatible with driving IGBTs below 2KV. The IGBT power unit receives the work instructions issued by the host computer unit through the control board to adjust the drive resistance. The IGBT power unit adjusts the turn-on resistance and the turn-off resistance respectively, with an adjustment interval of 1 ohm and an adjustment range of 1-10 ohms. The oscilloscope unit includes an oscilloscope, an isolated voltage probe and a Rogowski coil probe. The oscilloscope unit is directly connected to the host computer unit for storing the oscilloscope measurement results. The host computer unit switches the test load inductance, capacitor charging and discharging circuit and drive resistance through the controller unit.

[0025] The dual pulse test system provided in this embodiment can automatically switch the load inductance, capacitor charging and discharging circuit and driving resistance through the host computer. The on-resistance and off-resistance of the IGBT drive can be adjusted online with an accuracy of 1 ohm, which greatly saves the time of replacing the driving resistance. The operation is safe and convenient, and the test efficiency is greatly improved. The IGBT drive unit can output 4 isolated drives at the same time, and the output drive voltage is adjustable, which is compatible with most IGBT models below 2KV. Based on the dual pulse test system of the energy storage inverter, combined with the relevant principles of automatic control, the efficiency, safety and convenience of the dual pulse test can be effectively improved.

[0026] Embodiment 2 An automatic double pulse test method, using a double pulse test system provided in the first embodiment, setting test loop parameters in the host computer unit, selecting the test mode to send a work instruction to the controller unit, the controller unit receives the work instruction sent by the host computer and prepares to perform drive output, loop switching and drive resistance switching operations; the capacitor charge and discharge loop unit performs energy storage and release; Perform double pulse test. The controller unit sends the first pulse signal to the IGBT power unit to drive the IGBT to turn on. The bus voltage is loaded onto the load inductor unit through the IGBT, and the inductor current begins to rise linearly. The oscilloscope unit monitors and records the real-time data of voltage and current during the IGBT turn-on process. After the first pulse, the IGBT is turned off, and the inductor current continues to flow through the freewheeling diode, and the current decays slowly. After the set pulse interval, the controller unit sends the second pulse signal to the IGBT power unit to drive the IGBT to turn on again. At this time, the freewheeling diode enters the reverse recovery state, and the voltage generated by the stray inductance is superimposed on the DC voltage to form a voltage spike. The oscilloscope unit monitors and records the real-time data of voltage and current during the IGBT turn-on and turn-off process. The controller unit feeds back the data collected during the test to the host computer unit, which receives and displays the test data, processes and analyzes the test data, and adjusts the driving resistance of the driving circuit according to the test results.

[0027] Embodiment 3 This embodiment provides an automatic double pulse test system. Double pulse test is widely used in the power electronics industry. In order to find out the characteristic parameters of the selected IGBT, it is necessary to build a double pulse test platform according to the actual working conditions. Different IGBTs and different application conditions need to be tested with double pulses so that the IGBT can work in a safe range, thereby improving the reliability of power electronic products. With the increase in product types and the increase in IGBT models, the workload of double pulse testing increases rapidly. In terms of comprehensive testing, safety and production cost requirements, this embodiment is based on the double pulse test system of the energy storage converter and combines the relevant principles of automatic control to effectively improve the efficiency, safety and convenience of double pulse testing. The double pulse test system provided by this embodiment takes the control board as the core, effectively connects the IGBT double pulse test circuit, sends commands to the control board through the host computer, and can select the load inductance, IGBT drive resistance, IGBT drive pulse duration and voltage on the host computer interface. After the settings are completed, click the double pulse test, the system automatically powers on to charge the capacitor, and the capacitor is automatically discharged after the test is completed. It includes a host computer unit, a controller unit, a drive unit, an IGBT power unit, a capacitor charging and discharging circuit unit, a load inductance unit and an oscilloscope unit.

[0028] Specifically, the host computer unit is connected to the control board via a network cable, and the test loop parameters are set through the interface to achieve effective isolation between the test personnel and the test loop.

[0029] The controller unit, as the core of the dual pulse test system, is mainly responsible for communicating with the host computer and performing drive output, loop switching, drive resistance switching, etc. according to the instructions of the host computer.

[0030] The capacitor charging and discharging circuit unit includes a high-voltage DC source, a capacitor plate, a pre-charging resistor and a discharge resistor. The DC contactor is controlled by the control board, and then the high-voltage DC unit is controlled to output a high-voltage circuit to pre-charge the capacitor. After the test, the discharge circuit is automatically switched to discharge the capacitor plate to ensure the safety of the test.

[0031] The load inductance unit includes a load inductance and a DC contactor, and the inductance value of the load inductance can be adjusted online through a control panel.

[0032] IGBT power unit, an IGBT power unit built according to actual working conditions, is connected to the capacitor board through the busbar, the IGBT module is connected to the IGBT driver board through the driver adapter board, and the control board is connected to the IGBT driver unit through a short cable. The IGBT driver unit can output 4 IGBT drive signals at the same time, and the drive resistance can be adjusted online through the host computer. The turn-on resistance and turn-off resistance can be adjusted separately, with an adjustment interval of 1 ohm (adjustment range 1-10 ohms), and it is compatible with driving IGBT modules of different models.

[0033] The oscilloscope unit includes an oscilloscope, an isolated voltage probe, and a Rogowski coil probe. The oscilloscope is directly connected to the host computer to automatically store the measurement results.

[0034] The specific process steps of the automatic double pulse testing method performed by an automatic double pulse testing system provided by this embodiment are given below: Step 1: Initialize the system and set parameters Set up the host computer unit and set the test loop parameters, such as bus voltage, test current, pulse width, pulse interval, etc., through the host computer interface. Select the test mode, such as double pulse test, multi-pulse test, etc., and configure the corresponding test sequence. The controller unit receives the work instructions issued by the host computer and prepares to perform operations such as drive output, loop switching, and drive resistance switching. The controller unit is initialized internally to ensure that each functional module is in standby status.

[0035] Step 2: Capacitor charging and discharging circuit unit operation: high voltage DC source charging and capacitor energy storage The high voltage DC source is connected to the capacitor plate through the DC contactor to charge the capacitor plate to the set bus voltage. During the charging process, the pre-charge resistor is used to limit the charging current and protect the high voltage DC source and the capacitor plate from the impact of excessive current. After charging is completed, the capacitor plate stores the energy required for the test. The discharge resistor remains disconnected during the test to prevent accidental release of energy on the capacitor plate.

[0036] Step 3: Perform a double pulse test First pulse test: The controller unit sends the first pulse signal to the IGBT power unit to drive the IGBT to turn on. The bus voltage is loaded onto the load inductor unit through the IGBT, and the inductor current begins to rise linearly. The oscilloscope unit monitors and records real-time data such as voltage and current during the IGBT turn-on process. After the first pulse ends, the IGBT is turned off, the inductor current continues to flow through the freewheeling diode, and the current slowly decays.

[0037] Second pulse test: After the set pulse interval, the controller unit sends a second pulse signal to the IGBT power unit to drive the IGBT to turn on again. At this time, the freewheeling diode enters the reverse recovery state, and the voltage generated by the stray inductance is superimposed on the DC voltage to form a voltage spike. The oscilloscope unit monitors and records the real-time data such as voltage and current during the IGBT turn-on and turn-off process, paying special attention to whether the gate waveform has oscillation.

[0038] Step 4: Feedback test data and analyze The controller unit feeds back the data collected during the test to the host unit. The host unit receives and displays the test data, including key parameters such as voltage waveform, current waveform, turn-on loss, turn-off loss, etc. The host unit processes and analyzes the test data, optimizes the design of the drive circuit according to the test results, adjusts parameters such as drive resistance, and improves the performance and reliability of the device.

[0039] Step 5: Safety protection and troubleshooting during testing During the test, the system should monitor the output voltage and current of the high-voltage power supply in real time to ensure that it does not exceed the withstand voltage and rated current of the device under test. After the test, the system automatically disconnects the high-voltage power supply and discharges the capacitor plate to ensure the safety of the tester. If an abnormal situation occurs during the test, such as excessive voltage spikes or excessive current fluctuations, the system should immediately stop the test and issue an alarm signal. The tester should check the test circuit and the device under test according to the alarm information, and retest after troubleshooting.

[0040] Through the coordinated work of the host computer unit, the controller unit, the capacitor charging and discharging circuit unit, the load inductance unit, the IGBT power unit and the oscilloscope unit, the automatic double pulse test system proposed in this embodiment can realize automatic double pulse testing and display and analyze the test data in real time.

[0041] Many embodiments and many applications beyond the examples provided will be apparent to those skilled in the art upon reading the above description. Therefore, the scope of the present teachings should not be determined with reference to the above description, but rather with reference to the preceding claims and the full scope of equivalents to which such claims are entitled. For the purpose of comprehensiveness, all articles and references, including disclosures of patent applications and publications, are incorporated herein by reference. The omission of any aspect of the subject matter disclosed herein in the preceding claims is not intended to be a disclaimer of such subject matter, nor should it be considered that the applicants did not consider such subject matter to be part of the disclosed inventive subject matter.

[0042] The above content is a further detailed description of the present invention. It cannot be determined that the specific implementation methods of the present invention are limited to these. For ordinary technicians in the technical field to which the present invention belongs, without departing from the concept of the present invention, they can also make several simple deductions or substitutions, which should be regarded as belonging to the protection scope of the present invention determined by the submitted claims.

Claims

1. An automatic double pulse test system, characterized in that: It includes a host computer unit, a controller unit, a capacitor charging and discharging loop unit, a load inductance unit, an IGBT power unit and an oscilloscope unit. The host computer unit is interconnected with the controller unit, the controller unit is interconnected with the IGBT power unit, the control end of the controller unit is connected to the input end of the capacitor charging and discharging loop unit and the load inductance unit, and the output ends of the load inductance unit, the capacitor charging and discharging loop unit and the oscilloscope unit are respectively connected to the IGBT power unit; The host computer unit is used to set the test loop parameters, send work instructions to the control panel of the controller unit, receive the test data fed back by the controller unit and display and analyze it; The controller unit is used to receive the working instructions sent by the host computer unit to drive output, circuit switching and drive resistance switching, and feed back test data to the host computer unit; The capacitor charging and discharging circuit unit is used to store and release test energy; The load inductance unit is used to simulate different load conditions of the test; The IGBT power unit is used to convert the energy stored in the capacitor charging and discharging circuit unit into a test power output, and at the same time automatically adjust the driving resistance through the control unit; The oscilloscope unit is used to monitor and record real-time data and waveforms during the test process.

2. An automatic double pulse test system according to claim 1, characterized in that: The capacitor charging and discharging circuit unit comprises a high-voltage DC source, a capacitor plate, a pre-charging resistor and a discharging resistor. The high-voltage DC source is connected to a DC contactor and the capacitor plate, and the DC contactor is connected to a pre-charging resistor or a discharging resistor.

3. An automatic double pulse test system according to claim 2, characterized in that: Before the test begins, the control board controls the DC contactor to connect to the pre-charging resistor, and the high-voltage DC source pre-charges the capacitor. After the test is completed, the control board controls the DC contactor to connect to the discharge resistor to discharge the capacitor plate.

4. An automatic double pulse test system according to claim 1, characterized in that: The load inductance unit includes a load inductance and a DC contactor. The load inductance is connected to a control board of the control unit through the DC contactor, and the inductance value of the load inductance is adjusted through the control board.

5. An automatic double pulse test system according to claim 4, characterized in that: The IGBT power unit includes a drive adapter board, an IGBT drive board, an IGBT module and a busbar. The IGBT module is connected to the IGBT drive board through the drive adapter board. The busbar connects the IGBT and the capacitor board. The control board is connected to the IGBT drive unit through a short cable.

6. An automatic double pulse test system according to claim 1, characterized in that: The IGBT power unit simultaneously outputs four-way isolated IGBT drive signals, and is compatible with driving IGBTs below 2KV. The IGBT power unit receives a working instruction sent by a host computer unit through a control board to adjust the drive resistance.

7. An automatic double pulse test system according to claim 6, characterized in that: The IGBT power unit adjusts the on-resistance and the off-resistance respectively, with an adjustment interval of 1 ohm and an adjustment range of 1-10 ohms.

8. An automatic double pulse test system according to claim 1, characterized in that: The oscilloscope unit comprises an oscilloscope, an isolation voltage probe and a Rogowski coil probe. The oscilloscope unit is directly connected to the host computer unit and is used to store the oscilloscope measurement results.

9. An automatic double pulse test system according to claim 1, characterized in that: The host computer unit switches the test load inductance, capacitor charging and discharging circuit and driving resistance through the controller unit.

10. An automatic double pulse test method, using an automatic double pulse test system as claimed in any one of claims 1 to 9, characterized in that: The method comprises the following steps: setting test loop parameters in the host computer unit, selecting the test mode and sending working instructions to the controller unit, the controller unit receiving the working instructions sent by the host computer and preparing to perform drive output, loop switching and drive resistance switching operations; the capacitor charging and discharging loop unit performs energy storage and release; Perform a double pulse test. The controller unit sends the first pulse signal to the IGBT power unit according to the test mode and parameters set by the host computer to drive the IGBT to turn on. The bus voltage is loaded onto the load inductor unit through the IGBT, and the inductor current begins to rise linearly. The oscilloscope unit monitors and records the real-time data of voltage and current during the IGBT turn-on process. After the first pulse ends, the IGBT is turned off, and the inductor current continues to flow through the freewheeling diode, and the current slowly decays. After the set pulse interval, the controller unit sends the second pulse signal to the IGBT power unit to drive the IGBT to turn on again. At this time, the freewheeling diode enters the reverse recovery state, and the voltage generated by the stray inductance is superimposed on the DC voltage to form a voltage spike. The oscilloscope unit monitors and records the real-time data of voltage and current during the IGBT turn-on and turn-off process. The controller unit feeds back the data collected during the test to the host computer unit, which receives and displays the test data, processes and analyzes the test data, and adjusts the driving resistance of the driving circuit according to the test results.

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