Earthquake thin layer position interpretation method and device, electronic equipment and storage medium
By determining the top reflection position and formation thickness of the reservoir's inner layer during the oil field development stage, and using the well point stratigraphic thickness and lateral trend constraints, the problem of seismic stratigraphic interpretation of the reservoir's inner layer is solved, and the reservoir is realized Accurate analysis of internal small-layer structure and seismic properties.
Patent Information
- Application Number
- CN202310944474.0
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2023-07-28
- Publication Date
- 2025-02-14
AI Technical Summary
The existing technology is difficult to effectively explain the seismic strata of the carbonate oil and gas reservoir inside small layers in the oil field development stage. The longitudinal resolution of conventional seismic data is not enough to meet the thickness interpretation needs of the reservoir inside small layers.
By determining the top surface reflection positions of each small layer in the drilled oil reservoir, the formation thickness of the first small layer to the N-th small layer of the reservoir is determined, and the formation thickness is used as the control point according to the well point stratigraphic thickness and combined with the formation thickness as the Constraints of the horizontal trend, determine the stratigraphic thickness and seismic interpretation stratigraphic location of the reservoir's insider layer.
It provides accurate data on the seismic strata interpretation of the reservoir's inside small layers, helps to establish the structure and seismic attribute analysis of the internal small layers of the reservoir, and solves the problem of interpreting the seismic strata interpretation of the oil field development stage.
Smart Images
Figure CN119439240A_ABST
Abstract
Description
Technical Field
[0001] The present invention relates to the technical field of petroleum geological exploration and development, and in particular to a seismic thin layer interpretation method, device, electronic equipment and storage medium. Background Art
[0002] During the development stage of carbonate oil and gas reservoirs in oil fields, the research object is the small layers inside the reservoir (fourth and fifth order formations). The thickness of the small layers inside the reservoir has a higher research accuracy than that in the exploration stage.
[0003] In the process of oil and gas exploration and development, seismic horizon interpretation mainly through artificial two-dimensional / three-dimensional seismic data is an important means to effectively obtain the stratigraphic structure and study the geophysical characteristics of the stratigraphic formation.
[0004] The main frequency of conventional seismic data is generally 20 Hz-40 Hz, and the vertical resolution is about 20 m-40 m, which is much higher than the thickness of the small layers (fourth and fifth order formations) studied inside the reservoir during the oil field development stage. Conventional seismic interpretation methods cannot effectively solve the problem of seismic horizon interpretation of small layers (fourth and fifth order formations) inside carbonate reservoirs during the oil field development stage. Summary of the invention
[0005] The present invention provides a seismic thin-layer interpretation method, device, electronic equipment and storage medium, which can effectively solve the problem of seismic layer interpretation of small layers inside the reservoir during the development stage of carbonate oil and gas reservoirs, and provide accurate data for the establishment of small-layer structure inside the reservoir and the analysis of seismic attributes.
[0006] According to one aspect of the present invention, a seismic thin layer interpretation method is provided, the method comprising:
[0007] Determine the top surface reflection position of each sub-layer inside the reservoir at the drilled point; the sub-layer is used to characterize the strata that constitute the fourth and fifth order sequences of the reservoir;
[0008] Determine the formation thickness of the first to Nth sublayers of the oil reservoir; wherein N is greater than 1;
[0009] According to the top surface reflection position of the Nth set of small layers inside the oil reservoir and the top surface reflection position of the N-1th set of small layers inside the oil reservoir, the well point formation thickness of the Nth set of small layers inside the oil reservoir is determined;
[0010] Taking the formation thickness of the Nth set of sublayers in the oil reservoir as a control point and the formation thickness of the first set of sublayers to the Nth set of sublayers in the oil reservoir as a lateral trend constraint, the formation thickness of the Nth set of sublayers in the oil reservoir is determined;
[0011] According to the thickness of the Nth set of small layers inside the reservoir and the predetermined seismic horizon of the reservoir top interface, the seismic interpretation horizon of the N-1th set of small layers inside the reservoir is determined.
[0012] According to another aspect of the present invention, a seismic thin layer interpretation device is provided, the device comprising:
[0013] The top surface reflection position determination module is used to determine the top surface reflection position of each sub-layer inside the reservoir at the drilled point; wherein the sub-layer is used to characterize the strata constituting the fourth and fifth order sequences of the reservoir;
[0014] The formation thickness determination module is used to determine the formation thickness of the first set of sublayers to the Nth set of sublayers in the oil reservoir; wherein N is greater than 1;
[0015] A well point formation thickness determination module is used to determine the well point formation thickness of the Nth set of small layers inside the reservoir according to the top surface reflection position of the Nth set of small layers inside the reservoir and the top surface reflection position of the N-1th set of small layers inside the reservoir;
[0016] A sub-layer formation thickness determination module is used to determine the formation thickness of the Nth sub-layer inside the oil reservoir by taking the formation thickness of the well point of the Nth sub-layer inside the oil reservoir as a control point and the formation thickness of the first sub-layer to the Nth sub-layer inside the oil reservoir as a lateral trend constraint;
[0017] The sub-layer seismic interpretation horizon determination module is used to determine the N-1th sub-layer seismic interpretation horizon inside the reservoir according to the Nth sub-layer stratum thickness inside the reservoir and the predetermined reservoir top interface seismic horizon.
[0018] According to another aspect of the present invention, an electronic device is provided, the electronic device comprising:
[0019] at least one processor; and
[0020] a memory communicatively connected to the at least one processor; wherein,
[0021] The memory stores a computer program executable by the at least one processor, and the computer program is executed by the at least one processor so that the at least one processor can execute a seismic thin layer interpretation method described in any embodiment of the present invention.
[0022] According to another aspect of the present invention, a computer-readable storage medium is provided, wherein the computer-readable storage medium stores computer instructions, and the computer instructions are used to enable a processor to implement a seismic thin layer interpretation method described in any embodiment of the present invention when executed.
[0023] The technical solution of the embodiment of the present invention is to determine the top surface reflection position of each small layer inside the reservoir at the drilled point, and determine the formation thickness of the first to Nth small layers in the reservoir, and then determine the formation thickness of the Nth small layer inside the reservoir according to the top surface reflection position of the Nth small layer inside the reservoir and the top surface reflection position of the N-1th small layer inside the reservoir, and use the well point formation thickness of the Nth small layer inside the reservoir as a control point, and use the formation thickness of the first to Nth small layers in the reservoir as a lateral trend constraint to determine the formation thickness of the Nth small layer inside the reservoir, and determine the seismic interpretation horizon of the N-1th small layer inside the reservoir according to the formation thickness of the Nth small layer inside the reservoir and the pre-determined seismic horizon of the reservoir top interface. This technical solution can effectively solve the problem of seismic horizon interpretation of small layers inside the reservoir during the development stage of carbonate oil and gas reservoirs, and provide accurate data for the establishment of small layer structures inside the reservoir and the analysis of seismic attributes.
[0024] It should be understood that the contents described in this section are not intended to identify the key or important features of the embodiments of the present invention, nor are they intended to limit the scope of the present invention. Other features of the present invention will become easily understood through the following description. BRIEF DESCRIPTION OF THE DRAWINGS
[0025] In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the following briefly introduces the drawings required for use in the description of the embodiments. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without creative work.
[0026] Figure 1 is a flow chart of a seismic thin layer interpretation method provided according to the first embodiment of the present invention;
[0027] Figure 2 A schematic diagram of the structure of a seismic thin layer interpretation device provided in the second embodiment of the present invention;
[0028] Figure 3 The present invention is a schematic diagram of the structure of an electronic device for implementing a seismic thin layer interpretation method according to an embodiment of the present invention. DETAILED DESCRIPTION
[0029] In order to enable those skilled in the art to better understand the scheme of the present invention, the technical scheme in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work should fall within the scope of protection of the present invention.
[0030] It should be noted that the terms "first", "second", etc. in the specification and claims of the present invention and the above-mentioned drawings are used to distinguish similar objects, and are not necessarily used to describe a specific order or sequence. It should be understood that the data used in this way can be interchanged where appropriate, so that the embodiments of the present invention described herein can be implemented in an order other than those illustrated or described herein. In addition, the terms "including" and "having" and any variations thereof are intended to cover non-exclusive inclusions, for example, a process, method, system, product or device that includes a series of steps or units is not necessarily limited to those steps or units that are clearly listed, but may include other steps or units that are not clearly listed or inherent to these processes, methods, products or devices.
[0031] Embodiment 1
[0032] Figure 1 This is a flow chart of a seismic thin layer interpretation method provided according to the first embodiment of the present invention. This embodiment can be applied to analyze the seismic interpretation layer of the inner layer of the reservoir. The method can be executed by a seismic thin layer interpretation device. The seismic thin layer interpretation device can be implemented in the form of hardware and / or software. The seismic thin layer interpretation device can be configured in an electronic device. Figure 1 As shown, the method includes:
[0033] S110, determining the top surface reflection position of each sub-layer inside the reservoir at the drilled point; wherein the sub-layer is used to characterize the strata constituting the fourth and fifth order sequences of the reservoir.
[0034] In this scheme, strata with thickness below the seismic resolution are called seismic thin layers. By analyzing the seismic thin layer positions of the inner small layers of carbonate reservoirs during the oil field development stage, accurate data can be provided for the establishment of the internal small layer structure of the reservoir and the analysis of seismic attributes.
[0035] In this embodiment, the top and bottom interfaces of a set of reservoirs are generally third-order sequence interfaces, and the interior of the reservoir is composed of multiple fourth-order and fifth-order sequence strata, and the small layers refer to the fourth-order and fifth-order sequence strata constituting the reservoir. During the sedimentary evolution process of a set of small layers inside a carbonate reservoir, the vertical development of the sedimentary thickness of the strata has the characteristics of inherited accumulation.
[0036] The top surface reflection position may refer to the accurate reflection position of a certain layer interface or the top and bottom surfaces of the (oil) sand layer at the well point position found on the seismic slope through the well.
[0037] In this scheme, it is assumed that the reservoir has Top1, Top2...TopN sets of reservoir inner layers from bottom to top, and M wells (Well-1, Well2...Well-M) have been drilled. The top surface reflection position Well-i of each reservoir inner layer can be determined by the data of the M wells. Topj (i=1, 2...M, j=1, 2...N).
[0038] Optionally, determining the top surface reflection position of each sublayer inside the reservoir at the drilled well point includes steps A1-A2:
[0039] Step A1, obtaining synthetic seismic records of the drilled points;
[0040] Among them, the seismic records obtained by artificially synthesizing logging data are called synthetic seismic records.
[0041] In this embodiment, well logging data may be acquired through seismic exploration technology, and the well logging data may be processed to obtain synthetic seismic records.
[0042] Step A2: Determine the top surface reflection position of each sublayer inside the reservoir based on the synthetic seismic record.
[0043] Specifically, the bridge (time-depth relationship) between logging and seismic comparison is determined by calibrating synthetic seismic records. With this bridge, the top surface reflection position of each small layer inside the reservoir can be determined. Topj (i=1, 2...M, j=1, 2...N).
[0044] By determining the top surface reflection position of each sublayer inside the oil reservoir, the well point formation thickness between the sublayers inside the oil reservoir can be determined based on the top surface reflection position of each sublayer inside the oil reservoir.
[0045] S120. Determine the stratum thickness from the 1st to the Nth sublayer of the oil reservoir; wherein N is greater than 1.
[0046] In this embodiment, the seismic horizon of the reservoir bottom interface can be determined by seismic horizon interpretation. Base The Nth set of small layer seismic interpretation horizon inside the reservoir TopN , based on the reservoir bottom interface seismic horizon Base The Nth set of small layer seismic interpretation horizon inside the reservoir TopN Determine the stratigraphic thickness from the 1st to the Nth sublayers in the reservoir.
[0047] In this scheme, seismic data is composed of a series of seismic reflection events. Different seismic reflection events represent different geological interfaces. The specific position of the reservoir top and bottom interfaces in the seismic data is determined by calibrating synthetic seismic records. Then, the specific position of the reservoir top and bottom interfaces is determined by calibrating the well point synthetic seismic records. The seismic horizons of the reservoir top and bottom interfaces are interpreted according to the characteristics and trends of the seismic reflection events, thereby determining the seismic horizons of the reservoir top and bottom interfaces. TopN , Horizon Base .
[0048] Optionally, determining the formation thickness of the first to Nth sublayers of the oil reservoir includes steps B1-B2:
[0049] Step B1, determining the reservoir bottom interface seismic horizon and the Nth set of small layer seismic interpretation horizon inside the reservoir;
[0050] Step B2, subtracting the reservoir bottom interface seismic horizon from the Nth set of seismic interpretation horizons inside the reservoir to obtain the stratum thickness from the first set of small layers to the Nth set of small layers in the reservoir.
[0051] Specifically, the following formula can be used to determine the formation thickness of the first to Nth sublayers in the reservoir:
[0052] Thickness Top1-TopN =Horizon Base -Horizon TopN .
[0053] By determining the formation thicknesses of the 1st to Nth sublayers in the oil reservoir, the formation thickness of the Nth sublayer inside the oil reservoir can be determined based on the formation thicknesses of the 1st to Nth sublayers in the oil reservoir.
[0054] S130, determining the well point formation thickness of the Nth sublayer inside the oil reservoir according to the top surface reflection position of the Nth sublayer inside the oil reservoir and the top surface reflection position of the N-1th sublayer inside the oil reservoir.
[0055] In this embodiment, after the top surface reflection position of each small layer inside the oil reservoir at the drilled well point is determined, the top surface reflection position Well-i of the Nth set of small layers inside the oil reservoir can be screened out from the top surface reflection positions of each small layer inside the oil reservoir at the drilled well point. TopN and the top reflection position of the N-1th layer in the reservoir Well-i Top(N-1) .
[0056] Specifically, the top surface reflection position of the Nth layer in the reservoir can be Well-i TopN and the top reflection position of the N-1th layer in the reservoir Well-i Top(N-1)Calculate and obtain the well point formation thickness Thickess (N) Well of the Nth set of small layers inside the reservoir i .
[0057] Optionally, determining the well point formation thickness of the Nth set of sublayers inside the oil reservoir according to the top surface reflection position of the Nth set of sublayers inside the oil reservoir and the top surface reflection position of the N-1th set of sublayers inside the oil reservoir comprises steps C1-C2:
[0058] Step C1, determining the top surface reflection position of the Nth set of small layers inside the oil reservoir and the top surface reflection position of the N-1th set of small layers inside the oil reservoir from the top surface reflection positions of each small layer inside the oil reservoir;
[0059] Step C2, subtracting the top surface reflection position of the N-1th small layer inside the oil reservoir from the top surface reflection position of the Nth small layer inside the oil reservoir to obtain the well point formation thickness of the Nth small layer inside the oil reservoir.
[0060] Specifically, the following formula can be used to determine the well point formation thickness of the Nth set of small layers inside the reservoir:
[0061] Thickess(N)Well i =Well-i TopN -Well-i Top(N-1) .
[0062] By determining the well point formation thickness of the Nth set of small layers inside the oil reservoir, the formation thickness of the Nth set of small layers inside the oil reservoir can be determined based on the well point formation thickness of the Nth set of small layers inside the oil reservoir.
[0063] S140, taking the well point formation thickness of the Nth sublayer inside the oil reservoir as a control point, and taking the formation thickness from the 1st sublayer to the Nth sublayer of the oil reservoir as a lateral trend constraint, to determine the formation thickness of the Nth sublayer inside the oil reservoir.
[0064] In this embodiment, the seismic reflection position of the inner sublayer of the reservoir established by the calibration of synthetic seismic records is the standard or reference for seismic interpretation at the well point location, so the well point formation thickness of the Nth sublayer inside the reservoir is used as the control point; by using the formation thickness of the 1st to Nth sublayers of the reservoir as the lateral trend constraint, seismic interpretation can be performed between wells and at locations without wells.
[0065] Specifically, the thickness of the Nth set of inner layers of the reservoir at the drilled well point is used as the control point, that is, Thickess (N) Well i =Well-i TopN -Well-i Top(N-1) (i=1,2…M) as the control point, and the thickness of the formation from the first set of small layers to the Nth set of small layers in the reservoir isTop1-TopN As a lateral trend constraint, determine the thickness of the Nth set of small layers inside the reservoir. TopN .
[0066] S150, determining the N-1th set of seismic interpretation horizon of the sub-layer inside the reservoir according to the thickness of the Nth set of sub-layer inside the reservoir and the pre-determined seismic horizon of the reservoir top interface.
[0067] Among them, the thickness of the Nth layer of the reservoir is Thickness TopN The seismic horizon of the reservoir top interface is Horizon TopN .
[0068] In this embodiment, the thickness of the Nth layer of the reservoir can be TopN and reservoir top interface seismic horizon TopN Calculate and determine the N-1th set of small layer seismic interpretation horizon inside the reservoir Top(N -1) .
[0069] Optionally, according to the thickness of the Nth set of small layers in the reservoir and the predetermined seismic interpretation horizon of the Nth set of small layers in the reservoir, the seismic interpretation horizon of the Nth set of small layers in the reservoir is determined, comprising step D1:
[0070] Step D1, subtract the seismic horizon of the reservoir top interface from the thickness of the Nth set of small layers inside the reservoir to obtain the seismic interpretation horizon of the N-1th set of small layers inside the reservoir.
[0071] Specifically, the following formula can be used to calculate the N-1th set of small layer seismic interpretation horizons inside the reservoir:
[0072] Horizon Top(N-1) =Horizon TopN -Thickness TopN .
[0073] By determining the N-1th set of small-layer seismic interpretation horizons inside the reservoir, accurate data is provided for the establishment of the small-layer structure inside the reservoir and the analysis of seismic attributes.
[0074] Optionally, after determining the N-1th set of small layer seismic interpretation horizons inside the reservoir, the method further includes steps E1 to E5:
[0075] Step E1, determine the formation thickness of the 1st to the N-1th sublayers in the oil reservoir.
[0076] Step E2, determining the well point formation thickness of the N-1th sublayer inside the oil reservoir according to the top surface reflection position of the N-1th sublayer inside the oil reservoir and the top surface reflection position of the N-2th sublayer inside the oil reservoir.
[0077] Step E3, taking the well point formation thickness of the N-1th sublayer inside the oil reservoir as the control point, and taking the formation thickness from the 1st sublayer to the N-1th sublayer of the oil reservoir as the lateral trend constraint, determine the formation thickness of the N-1th sublayer inside the oil reservoir.
[0078] Step E4, determining the N-2 set of seismic interpretation horizon of the sub-layer inside the oil reservoir according to the N-1 set of stratigraphic thickness of the sub-layer inside the oil reservoir and the N-1 set of seismic interpretation horizon of the sub-layer inside the oil reservoir.
[0079] Step E5, iteratively determine the seismic interpretation horizons of other small layers until the seismic interpretation horizons of the first to the N-1th small layers inside the reservoir are obtained.
[0080] In this embodiment, the same steps as above are adopted to continue iterating from top to bottom to the first set of inner sublayers.
[0081] Specifically, the thickness of the well point of the N-1th inner layer of the reservoir inside the drilled well can be used as the control point, that is, Thickness(N-1)Well i =Well-i Top(N-1) -Well-i Top(N-2) (i=1, 2...M) as the control point, with the thickness of the first layer to the N-1th layer in the reservoir. Top1-Top(N-1) =Horizon TopN -Horizon Top (N-1) As a lateral trend constraint, determine the thickness of the N-1th small layer inside the reservoir. Top(N-1) , and then obtain the N-2th set of small layer seismic interpretation horizon inside the reservoir Top(N-2) =Horizon Top(N-1) -Thickness Top(N-1) , step by step iteration to obtain the seismic interpretation horizons of the first to the N-1th small layers inside the reservoir, i.e., Horizon Top1 To Horizon Top(N -1) .
[0082] By iteratively determining the seismic interpretation horizons of other small layers, the problem of seismic horizon interpretation of small layers inside the reservoir during the development stage of carbonate oil and gas reservoirs can be effectively solved, providing accurate data for the establishment of the small layer structure inside the reservoir and the analysis of seismic attributes.
[0083] The technical solution of the embodiment of the present invention determines the top surface reflection position of each sublayer inside the reservoir at the drilled point, and determines the formation thickness of the 1st to Nth sublayers in the reservoir, and then determines the formation thickness of the Nth sublayer inside the reservoir at the well point according to the top surface reflection position of the Nth sublayer inside the reservoir and the top surface reflection position of the N-1th sublayer inside the reservoir, takes the well point formation thickness of the Nth sublayer inside the reservoir as a control point, and takes the formation thickness of the 1st to Nth sublayers in the reservoir as a lateral trend constraint to determine the formation thickness of the Nth sublayer inside the reservoir, and determines the seismic interpretation horizon of the N-1th sublayer inside the reservoir according to the formation thickness of the Nth sublayer inside the reservoir and the pre-determined seismic horizon of the reservoir top interface. By implementing this technical solution, the difficulty of interpreting the seismic horizon of the sublayer inside the reservoir in the development stage of carbonate oil and gas reservoirs can be effectively solved, and accurate data can be provided for the establishment of the internal sublayer structure of the reservoir and the analysis of seismic attributes.
[0084] Embodiment 2
[0085] Figure 2 The schematic diagram of the structure of a seismic thin layer interpretation device provided in the second embodiment of the present invention. Figure 2 As shown, the device comprises:
[0086] The top surface reflection position determination module 210 is used to determine the top surface reflection position of each sub-layer inside the reservoir at the drilled point; wherein the sub-layer is used to characterize the strata constituting the fourth and fifth order sequences of the reservoir;
[0087] The formation thickness determination module 220 is used to determine the formation thickness of the first to Nth sublayers of the oil reservoir; wherein N is greater than 1;
[0088] The well point formation thickness determination module 230 is used to determine the well point formation thickness of the Nth set of sublayers inside the reservoir according to the top surface reflection position of the Nth set of sublayers inside the reservoir and the top surface reflection position of the N-1th set of sublayers inside the reservoir;
[0089] The sub-layer formation thickness determination module 240 is used to determine the formation thickness of the Nth sub-layer inside the oil reservoir by taking the formation thickness of the well point of the Nth sub-layer inside the oil reservoir as a control point and the formation thickness of the first sub-layer to the Nth sub-layer inside the oil reservoir as a lateral trend constraint;
[0090] The sub-layer seismic interpretation horizon determination module 250 is used to determine the N-1th sub-layer seismic interpretation horizon inside the reservoir according to the Nth sub-layer stratum thickness inside the reservoir and the predetermined reservoir top interface seismic horizon.
[0091] Optionally, the top surface reflection position determination module 210 is specifically used to:
[0092] Obtain synthetic seismic records of drilled well points;
[0093] The top surface reflection position of each small layer inside the reservoir is determined based on the synthetic seismic record.
[0094] Optionally, the well point formation thickness determination module 230 is specifically used to:
[0095] Determine the top surface reflection position of the Nth set of small layers in the reservoir and the top surface reflection position of the N-1th set of small layers in the reservoir from the top surface reflection positions of each small layer in the reservoir;
[0096] The top surface reflection position of the N-1th small layer inside the oil reservoir is subtracted from the top surface reflection position of the Nth small layer inside the oil reservoir to obtain the well point formation thickness of the Nth small layer inside the oil reservoir.
[0097] Optionally, the formation thickness determination module 220 is specifically configured to:
[0098] Determine the reservoir bottom interface seismic horizon and the Nth set of small layer seismic interpretation horizon inside the reservoir;
[0099] Subtract the reservoir bottom interface seismic horizon from the Nth set of small layer seismic interpretation horizon inside the reservoir to obtain the stratum thickness from the first set of small layers to the Nth set of small layers in the reservoir. Optionally, the small layer seismic interpretation horizon determination module 250 is specifically used to:
[0100] The seismic horizon of the reservoir top interface is subtracted from the thickness of the Nth set of small layers inside the reservoir to obtain the seismic interpretation horizon of the N-1th set of small layers inside the reservoir.
[0101] Optionally, the device further comprises:
[0102] Other sub-layer formation thickness determination modules are used to determine the formation thickness of the first to the N-1th sub-layers in the reservoir;
[0103] The module for determining the formation thickness of other small layers is used to determine the formation thickness of the well point of the N-1th small layer inside the reservoir according to the top surface reflection position of the N-1th small layer inside the reservoir and the top surface reflection position of the N-2th small layer inside the reservoir;
[0104] Other sub-layer formation thickness determination module, used for taking the formation thickness of the N-1th sub-layer in the oil reservoir as the control point, and taking the formation thickness of the first sub-layer to the N-1th sub-layer in the oil reservoir as the lateral trend constraint, to determine the formation thickness of the N-1th sub-layer in the oil reservoir;
[0105] The module for determining the seismic interpretation horizons of other small layers is used to determine the seismic interpretation horizons of the N-2th small layers inside the reservoir according to the stratigraphic thickness of the N-1th small layers inside the reservoir and the seismic interpretation horizons of the N-1th small layers inside the reservoir; the module for determining the seismic interpretation horizons of other small layers is used to iteratively determine the seismic interpretation horizons of other small layers until the seismic interpretation horizons of the 1st to N-1th small layers inside the reservoir are obtained.
[0106] A seismic thin layer interpretation device provided in an embodiment of the present invention can execute a seismic thin layer interpretation method provided in any embodiment of the present invention, and has functional modules and beneficial effects corresponding to the execution method.
[0107] Embodiment 3
[0108] Figure 3 A schematic diagram of the structure of an electronic device 10 that can be used to implement an embodiment of the present invention is shown. The electronic device is intended to represent various forms of digital computers, such as laptop computers, desktop computers, workstations, personal digital assistants, servers, blade servers, mainframe computers, and other suitable computers. The electronic device can also represent various forms of mobile devices, such as personal digital processing, cellular phones, smart phones, wearable devices (such as helmets, glasses, watches, etc.) and other similar computing devices. The components shown herein, their connections and relationships, and their functions are merely examples and are not intended to limit the implementation of the present invention described and / or required herein.
[0109] like Figure 3 As shown, the electronic device 10 includes at least one processor 11, and a memory connected to the at least one processor 11, such as a read-only memory (ROM) 12, a random access memory (RAM) 13, etc., wherein the memory stores a computer program that can be executed by at least one processor, and the processor 11 can perform various appropriate actions and processes according to the computer program stored in the read-only memory (ROM) 12 or the computer program loaded from the storage unit 18 to the random access memory (RAM) 13. In the RAM 13, various programs and data required for the operation of the electronic device 10 can also be stored. The processor 11, the ROM 12, and the RAM 13 are connected to each other through a bus 14. An input / output (I / O) interface 15 is also connected to the bus 14.
[0110] A number of components in the electronic device 10 are connected to the I / O interface 15, including: an input unit 16, such as a keyboard, a mouse, etc.; an output unit 17, such as various types of displays, speakers, etc.; a storage unit 18, such as a disk, an optical disk, etc.; and a communication unit 19, such as a network card, a modem, a wireless communication transceiver, etc. The communication unit 19 allows the electronic device 10 to exchange information / data with other devices through a computer network such as the Internet and / or various telecommunication networks.
[0111] The processor 11 may be a variety of general and / or special processing components with processing and computing capabilities. Some examples of the processor 11 include, but are not limited to, a central processing unit (CPU), a graphics processing unit (GPU), various dedicated artificial intelligence (AI) computing chips, various processors running machine learning model algorithms, digital signal processors (DSPs), and any appropriate processors, controllers, microcontrollers, etc. The processor 11 executes the various methods and processes described above, such as a seismic thin layer horizon interpretation method.
[0112] In some embodiments, a seismic thin layer horizon interpretation method can be implemented as a computer program, which is tangibly contained in a computer readable storage medium, such as a storage unit 18. In some embodiments, part or all of the computer program can be loaded and / or installed on the electronic device 10 via the ROM 12 and / or the communication unit 19. When the computer program is loaded into the RAM 13 and executed by the processor 11, one or more steps of a seismic thin layer horizon interpretation method described above can be performed. Alternatively, in other embodiments, the processor 11 can be configured to perform a seismic thin layer horizon interpretation method by any other appropriate means (e.g., by means of firmware).
[0113] Various implementations of the systems and techniques described above herein can be implemented in digital electronic circuit systems, integrated circuit systems, field programmable gate arrays (FPGAs), application specific integrated circuits (ASICs), application specific standard products (ASSPs), systems on chips (SOCs), load programmable logic devices (CPLDs), computer hardware, firmware, software, and / or combinations thereof. These various implementations can include: being implemented in one or more computer programs that can be executed and / or interpreted on a programmable system including at least one programmable processor, which can be a special purpose or general purpose programmable processor that can receive data and instructions from a storage system, at least one input device, and at least one output device, and transmit data and instructions to the storage system, the at least one input device, and the at least one output device.
[0114] Computer programs for implementing the methods of the present invention may be written in any combination of one or more programming languages. These computer programs may be provided to a processor of a general-purpose computer, a special-purpose computer, or other programmable data processing device, so that when the computer program is executed by the processor, the functions / operations specified in the flow chart and / or block diagram are implemented. The computer program may be executed entirely on the machine, partially on the machine, partially on the machine and partially on a remote machine as a stand-alone software package, or entirely on a remote machine or server.
[0115] In the context of the present invention, a computer-readable storage medium may be a tangible medium that may contain or store a computer program for use by or in combination with an instruction execution system, device or equipment. A computer-readable storage medium may include, but is not limited to, electronic, magnetic, optical, electromagnetic, infrared, or semiconductor systems, devices or equipment, or any suitable combination of the foregoing. Alternatively, a computer-readable storage medium may be a machine-readable signal medium. A more specific example of a machine-readable storage medium may include an electrical connection based on one or more lines, a portable computer disk, a hard disk, a random access memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or flash memory), an optical fiber, a portable compact disk read-only memory (CD-ROM), an optical storage device, a magnetic storage device, or any suitable combination of the foregoing.
[0116] To provide interaction with a user, the systems and techniques described herein may be implemented on an electronic device having: a display device (e.g., a CRT (cathode ray tube) or LCD (liquid crystal display) monitor) for displaying information to the user; and a keyboard and a pointing device (e.g., a mouse or trackball) through which the user can provide input to the electronic device. Other types of devices may also be used to provide interaction with the user; for example, the feedback provided to the user may be any form of sensory feedback (e.g., visual feedback, auditory feedback, or tactile feedback); and input from the user may be received in any form (including acoustic input, voice input, or tactile input).
[0117] The systems and techniques described herein may be implemented in a computing system that includes backend components (e.g., as a data server), or a computing system that includes middleware components (e.g., an application server), or a computing system that includes frontend components (e.g., a user computer with a graphical user interface or a web browser through which a user can interact with implementations of the systems and techniques described herein), or a computing system that includes any combination of such backend components, middleware components, or frontend components. The components of the system may be interconnected by any form or medium of digital data communication (e.g., a communication network). Examples of communication networks include: a local area network (LAN), a wide area network (WAN), a blockchain network, and the Internet.
[0118] A computing system may include a client and a server. The client and the server are generally remote from each other and usually interact through a communication network. The client and server relationship is generated by computer programs running on the corresponding computers and having a client-server relationship with each other. The server may be a cloud server, also known as a cloud computing server or cloud host, which is a host product in the cloud computing service system to solve the defects of difficult management and weak business scalability in traditional physical hosts and VPS services.
[0119] It should be understood that the various forms of processes shown above can be used to reorder, add or delete steps. For example, the steps described in the present invention can be executed in parallel, sequentially or in different orders, as long as the desired results of the technical solution of the present invention can be achieved, and this document does not limit this.
[0120] The above specific implementations do not constitute a limitation on the protection scope of the present invention. It should be understood by those skilled in the art that various modifications, combinations, sub-combinations and substitutions can be made according to design requirements and other factors. Any modification, equivalent substitution and improvement made within the spirit and principle of the present invention should be included in the protection scope of the present invention.
Claims
1. A seismic thin layer interpretation method, characterized in that: include: Determine the top surface reflection position of each sub-layer inside the reservoir at the drilled point; the sub-layer is used to characterize the strata that constitute the fourth and fifth order sequences of the reservoir; Determine the formation thickness of the first to Nth sublayers of the oil reservoir; wherein N is greater than 1; According to the top surface reflection position of the Nth set of small layers inside the oil reservoir and the top surface reflection position of the N-1th set of small layers inside the oil reservoir, the well point formation thickness of the Nth set of small layers inside the oil reservoir is determined; Taking the formation thickness of the Nth set of sublayers in the oil reservoir as a control point and the formation thickness of the first set of sublayers to the Nth set of sublayers in the oil reservoir as a lateral trend constraint, the formation thickness of the Nth set of sublayers in the oil reservoir is determined; According to the thickness of the Nth set of small layers inside the reservoir and the predetermined seismic horizon of the reservoir top interface, the seismic interpretation horizon of the N-1th set of small layers inside the reservoir is determined.
2. The method according to claim 1, characterized in that Determine the top surface reflection position of each sub-layer inside the reservoir at the drilled point, including: Obtain synthetic seismic records of drilled well points; The top surface reflection position of each small layer inside the reservoir is determined based on the synthetic seismic record.
3. The method according to claim 2, characterized in that According to the top surface reflection position of the Nth set of small layers inside the reservoir and the top surface reflection position of the N-1th set of small layers inside the reservoir, the well point formation thickness of the Nth set of small layers inside the reservoir is determined, including: Determine the top surface reflection position of the Nth set of small layers in the reservoir and the top surface reflection position of the N-1th set of small layers in the reservoir from the top surface reflection positions of each small layer in the reservoir; The top surface reflection position of the N-1th small layer inside the oil reservoir is subtracted from the top surface reflection position of the Nth small layer inside the oil reservoir to obtain the well point formation thickness of the Nth small layer inside the oil reservoir.
4. The method according to claim 1, characterized in that: Determine the thickness of the first to Nth layers of the reservoir, including: Determine the reservoir bottom interface seismic horizon and the Nth set of small layer seismic interpretation horizon inside the reservoir; The reservoir bottom interface seismic horizon and the Nth set of seismic interpretation horizons inside the reservoir are subtracted to obtain the stratum thicknesses from the first set of small layers to the Nth set of small layers in the reservoir.
5. The method according to claim 1, characterized in that According to the thickness of the Nth set of small layers in the reservoir and the predetermined seismic horizon of the reservoir top interface, the seismic interpretation horizon of the N-1th set of small layers in the reservoir is determined, including: The seismic horizon of the reservoir top interface is subtracted from the thickness of the Nth set of small layers inside the reservoir to obtain the seismic interpretation horizon of the N-1th set of small layers inside the reservoir.
6. The method according to claim 1, characterized in that After determining the N-1th set of small layer seismic interpretation horizons inside the reservoir, the method further comprises: Determine the formation thickness of the first to the N-1th sublayers in the reservoir; According to the top surface reflection position of the N-1th set of small layers inside the oil reservoir and the top surface reflection position of the N-2th set of small layers inside the oil reservoir, the well point formation thickness of the N-1th set of small layers inside the oil reservoir is determined; Taking the well point formation thickness of the N-1th sublayer inside the oil reservoir as a control point, and taking the formation thickness from the 1st sublayer to the N-1th sublayer of the oil reservoir as a lateral trend constraint, the formation thickness of the N-1th sublayer inside the oil reservoir is determined; Determine the N-2 set of seismic interpretation horizon of the inner layer of the oil reservoir according to the N-1 set of small layer stratum thickness and the N-1 set of seismic interpretation horizon of the inner layer of the oil reservoir; The seismic interpretation horizons of other small layers are determined iteratively until the seismic interpretation horizons of the 1st to the N-1th small layers inside the reservoir are obtained.
7. A seismic thin layer interpretation device, characterized in that: include: The top surface reflection position determination module is used to determine the top surface reflection position of each sub-layer inside the reservoir at the drilled point; wherein the sub-layer is used to characterize the strata constituting the fourth and fifth order sequences of the reservoir; The formation thickness determination module is used to determine the formation thickness of the first set of sublayers to the Nth set of sublayers in the oil reservoir; wherein N is greater than 1; A well point formation thickness determination module is used to determine the well point formation thickness of the Nth set of small layers inside the reservoir according to the top surface reflection position of the Nth set of small layers inside the reservoir and the top surface reflection position of the N-1th set of small layers inside the reservoir; A sub-layer formation thickness determination module is used to determine the formation thickness of the Nth sub-layer inside the oil reservoir by taking the formation thickness of the well point of the Nth sub-layer inside the oil reservoir as a control point and the formation thickness of the first sub-layer to the Nth sub-layer inside the oil reservoir as a lateral trend constraint; The sub-layer seismic interpretation horizon determination module is used to determine the N-1th sub-layer seismic interpretation horizon inside the reservoir according to the Nth sub-layer stratum thickness inside the reservoir and the predetermined reservoir top interface seismic horizon.
8. The device according to claim 7, characterized in that The top surface reflection position determination module is specifically used for: Obtain synthetic seismic records of drilled well points; The top surface reflection position of each small layer inside the reservoir is determined based on the synthetic seismic record.
9. An electronic device, characterized in that: The electronic device comprises: at least one processor; and a memory communicatively connected to the at least one processor; wherein, The memory stores a computer program executable by the at least one processor, and the computer program is executed by the at least one processor so that the at least one processor can execute a seismic thin layer interpretation method as described in any one of claims 1-6.
10. A computer-readable storage medium, characterized in that: The computer-readable storage medium stores computer instructions, and the computer instructions are used to enable a processor to implement a seismic thin layer interpretation method according to any one of claims 1 to 6 when executed.