Clock frequency calibration method and device for HPLC + HRF dual-mode communication system

Abstract

The invention discloses a clock frequency calibration method and device for an HPLC + HRF dual-mode communication system. The method comprises the following steps: acquiring a real-time environment temperature value of a module crystal oscillator of the HPLC + HRF dual-mode communication system in a current detection period; if the real-time environment temperature value is greater than the preset reference temperature value, calculating a first frequency error value of the clock frequency of the module crystal oscillator based on a difference value between the real-time environment temperature value and the preset reference temperature value; if the real-time environment temperature value is smaller than the preset reference temperature value, calculating a second frequency error value of the clock frequency of the module crystal oscillator based on a difference value between the preset reference temperature value and the real-time environment temperature value; and calibrating the clock frequency of the module crystal oscillator in the next detection period based on the first frequency error value or the second frequency error value. The difference value between the real-time environment temperature and the preset reference temperature is considered, the frequency error values are calculated according to the situation that the temperature is higher than or lower than the preset value, the influence of temperature change on the clock frequency is accurately reflected, and an accurate data basis is provided for calibration.

Description

Technical Field

[0001] The invention relates to the technical field of HPLC+HRF dual-mode communication, and in particular to a clock frequency calibration method and device for an HPLC+HRF dual-mode communication system. Background Art

[0002] In modern communication systems, high-precision clock frequency is essential to ensure accurate data transmission and stable system operation. As a key device in the communication system, the stability of the crystal oscillator clock frequency inside the module directly affects the performance of the entire system.

[0003] However, in actual applications, the clock frequency of the module crystal oscillator will be affected by many factors. On the one hand, the change of ambient temperature is an important factor. The frequency characteristics of the crystal oscillator are usually closely related to the temperature. When the ambient temperature deviates from the preset reference temperature, the clock frequency of the crystal oscillator will change. Especially when the temperature is higher or lower than the preset reference temperature value, the change trend of the frequency error is different, which brings challenges to the stability of the clock frequency.

[0004] On the other hand, the aging of the crystal oscillator will also affect the clock frequency. As the use time increases, the performance of the module crystal oscillator will gradually decline, which is manifested as a nonlinear drift of the clock frequency. This aging phenomenon will further aggravate the error of the clock frequency and reduce the reliability of the communication system.

[0005] In the existing technology, there may be a lack of comprehensive and accurate clock frequency calibration methods for module crystal oscillators under different temperature conditions and considering crystal oscillator aging factors. Traditional calibration methods may only consider a single factor, or underestimate the impact of temperature and aging, resulting in low calibration accuracy and difficulty in meeting the requirements of modern communication systems for high-precision clock frequencies. Summary of the invention

[0006] The purpose of the embodiment of the present invention is to provide a clock frequency calibration method and device for an HPLC+HRF dual-mode communication system. By considering the difference between the real-time ambient temperature and the preset reference temperature, the frequency error value is calculated for the cases where the temperature is higher and lower than the preset value, respectively, so as to accurately reflect the influence of temperature change on the clock frequency and provide an accurate data basis for calibration.

[0007] In order to solve the above technical problems, a first aspect of an embodiment of the present invention provides a clock frequency calibration method for an HPLC+HRF dual-mode communication system, comprising the following steps:

[0008] Get the real-time ambient temperature value of the crystal oscillator of the HPLC+HRF dual-mode communication system module in the current detection cycle;

[0009] If the real-time ambient temperature value is greater than the preset reference temperature value, based on the difference between the real-time ambient temperature value and the preset reference temperature value, calculating a first frequency error value of the clock frequency of the module crystal oscillator;

[0010] If the real-time ambient temperature value is less than the preset reference temperature value, a second frequency error value of the clock frequency of the module crystal oscillator is calculated based on the difference between the preset reference temperature value and the real-time ambient temperature value;

[0011] The clock frequency of the module crystal oscillator in the next detection cycle is calibrated based on the first frequency error value or the second frequency error value.

[0012] Further, the calculating of the first frequency error value of the clock frequency of the module crystal oscillator includes:

[0013] Acquire a standard crystal oscillator clock frequency corresponding to the preset reference temperature value;

[0014] The first frequency error value is calculated based on the difference between the real-time ambient temperature value and the preset reference temperature value and the standard crystal oscillator clock frequency.

[0015] Furthermore, the calculation formula of the first frequency error value Δf1 is:

[0016]

[0017] Wherein, f0 is the standard crystal oscillator clock frequency, T is the real-time ambient temperature value, T0 is the preset reference temperature value, α is the first-order temperature coefficient, β is the second-order temperature coefficient, and λ is the third-order temperature coefficient.

[0018] Furthermore, after obtaining the standard crystal oscillator clock frequency corresponding to the preset reference temperature value, the method further includes:

[0019] Obtain the usage time and first aging drift coefficient of the module crystal oscillator;

[0020] The calculation formula of the first frequency error value is:

[0021]

[0022] Among them, θ is the first aging drift coefficient of the module crystal oscillator, which is used to represent the nonlinear drift rate of the module crystal oscillator clock frequency over time, t u It is the usage time of the module crystal oscillator.

[0023] Furthermore, it also includes:

[0024] Obtain the second aging drift coefficient of the module crystal oscillator;

[0025] The calculation formula of the first frequency error value is:

[0026]

[0027] Wherein, σ is the second aging drift coefficient of the module crystal oscillator, which is used to indicate the nonlinear drift rate of the module crystal oscillator clock frequency over time; k is the aging drift index used to indicate the nonlinear degree of the module crystal oscillator clock frequency over time.

[0028] Further, the calculating of the second frequency error value of the clock frequency of the module crystal oscillator includes:

[0029] Acquire a standard crystal oscillator clock frequency corresponding to the preset reference temperature value;

[0030] The second frequency error value is calculated based on the difference between the preset reference temperature value and the real-time ambient temperature value and the standard crystal oscillator clock frequency.

[0031] Furthermore, the calculation formula of the second frequency error value Δf2 is:

[0032]

[0033] Among them, f0 is the standard crystal oscillator clock frequency, T is the real-time ambient temperature value, T0 is the preset reference temperature value, c n is the temperature weight coefficient corresponding to the nth order, and N is the set order of the calculation formula.

[0034] Furthermore, after obtaining the standard crystal oscillator clock frequency corresponding to the preset reference temperature value, the method further includes:

[0035] Obtain the usage time and first aging drift coefficient of the module crystal oscillator;

[0036] The calculation formula of the second frequency error value is:

[0037]

[0038] Among them, θ is the first aging drift coefficient of the module crystal oscillator, which is used to represent the nonlinear drift rate of the module crystal oscillator clock frequency over time, t u It is the usage time of the module crystal oscillator.

[0039] Furthermore, it also includes:

[0040] Obtain the second aging drift coefficient of the module crystal oscillator;

[0041] The calculation formula of the first frequency error value is:

[0042]

[0043] Wherein, σ is the second aging drift coefficient of the module crystal oscillator, which is used to indicate the nonlinear drift rate of the module crystal oscillator clock frequency over time; k is the aging drift index used to indicate the nonlinear degree of the module crystal oscillator clock frequency over time.

[0044] Accordingly, a second aspect of an embodiment of the present invention provides a clock frequency calibration device for an HPLC+HRF dual-mode communication system, comprising:

[0045] The temperature detection module is used to obtain the real-time ambient temperature value of the crystal oscillator of the HPLC+HRF dual-mode communication system module in the current detection cycle;

[0046] an error calculation module, configured to calculate a first frequency error value of the clock frequency of the module crystal oscillator based on a difference between the real-time ambient temperature value and the preset reference temperature value when the real-time ambient temperature value is greater than a preset reference temperature value;

[0047] The error calculation module is also used to calculate a second frequency error value of the module crystal oscillator clock frequency based on the difference between the preset reference temperature value and the real-time ambient temperature value when the real-time ambient temperature value is less than the preset reference temperature value;

[0048] A frequency calibration module is used to calibrate the clock frequency of the module crystal oscillator in the next detection cycle based on the first frequency error value or the second frequency error value.

[0049] Accordingly, a third aspect of an embodiment of the present invention provides an electronic device, comprising: at least one processor; and a memory connected to the at least one processor; wherein the memory stores instructions executable by the at least one processor, and the instructions are executed by the at least one processor so that the at least one processor executes the above-mentioned HPLC+HRF dual-mode communication system clock frequency calibration method.

[0050] Accordingly, a fourth aspect of an embodiment of the present invention provides a computer-readable storage medium having computer instructions stored thereon, which, when executed by a processor, implement the above-mentioned HPLC+HRF dual-mode communication system clock frequency calibration method.

[0051] The above technical solution of the embodiment of the present invention has the following beneficial technical effects:

[0052] 1. By considering the difference between the real-time ambient temperature and the preset reference temperature, the first and second frequency error values ​​are calculated for the cases where the temperature is higher and lower than the preset value, respectively, which can accurately reflect the impact of temperature changes on the module crystal oscillator clock frequency and provide an accurate data basis for calibration;

[0053] 2. The temperature weight coefficient, aging drift coefficient and aging drift index of different orders are introduced to comprehensively consider the complexity of temperature change and the nonlinear characteristics of crystal oscillator aging, making the frequency error calculation more precise, thereby greatly improving the accuracy of clock frequency calibration;

[0054] 3. Accurate clock frequency calibration helps reduce frequency errors caused by temperature changes and crystal oscillator aging, thereby reducing the probability of data transmission error rates, communication delays and other problems, and improving the stability of the communication system. BRIEF DESCRIPTION OF THE DRAWINGS

[0055] Figure 1 It is a flow chart of a clock frequency calibration method for an HPLC+HRF dual-mode communication system provided by an embodiment of the present invention;

[0056] Figure 2 It is a module block diagram of a clock frequency calibration device for a HPLC+HRF dual-mode communication system provided by an embodiment of the present invention.

[0057] Reference numerals:

[0058] 1. Temperature detection module, 2. Error calculation module, 3. Frequency calibration module. DETAILED DESCRIPTION

[0059] In order to make the purpose, technical scheme and advantages of the present invention clearer, the present invention is further described in detail below in conjunction with specific embodiments and with reference to the accompanying drawings. It should be understood that these descriptions are only exemplary and are not intended to limit the scope of the present invention. In addition, in the following description, the description of well-known structures and technologies is omitted to avoid unnecessary confusion of the concept of the present invention.

[0060] Please refer to Figure 1 A first aspect of an embodiment of the present invention provides a method for calibrating a clock frequency of an HPLC+HRF dual-mode communication system, comprising the following steps:

[0061] Step S100, obtaining the real-time ambient temperature value of the crystal oscillator of the HPLC+HRF dual-mode communication system module in the current detection cycle.

[0062] By monitoring the ambient temperature of the module crystal oscillator, a key data basis is provided for the subsequent judgment of the clock frequency error and calibration according to the temperature conditions. The real-time temperature value of the module crystal oscillator can be obtained through the temperature sensor method or the infrared temperature measurement method.

[0063] The temperature sensor method can install high-precision temperature sensors such as thermistors, thermocouples or digital temperature sensors near the module crystal oscillator. These temperature sensors can sense the temperature changes of the surrounding environment in real time and transmit the temperature data to the monitoring system. By processing and analyzing the output signal of the temperature sensor, the real-time temperature of the module crystal oscillator can be accurately obtained. For example, the digital temperature sensor DS18B20 is used, which has the advantages of small size, high precision and strong anti-interference ability. The DS18B20 is installed near the module crystal oscillator and connected to the microcontroller through its unique single bus interface. The microcontroller can regularly read the temperature value measured by the DS18B20, thereby realizing the monitoring of the real-time temperature of the module crystal oscillator.

[0064] The infrared temperature measurement method uses an infrared thermometer set near the module crystal oscillator to perform non-contact temperature measurement on the module crystal oscillator. The infrared thermometer determines the temperature of an object by detecting the infrared radiation emitted by it. Aim the infrared thermometer at the area where the module crystal oscillator is located, and the instrument can quickly measure the surface temperature of the area, thereby indirectly reflecting the temperature of the module crystal oscillator. The advantage of this method is that it does not require direct contact with the object being measured, will not interfere with the normal operation of the module crystal oscillator, and can be measured at a certain distance, which is convenient and fast.

[0065] Real-time monitoring of the ambient temperature of the module crystal oscillator is to ensure the accuracy of the clock frequency. Temperature changes will affect the frequency of the crystal oscillator, because the frequency characteristics of the crystal oscillator are closely related to temperature. When the ambient temperature changes, the oscillation frequency of the crystal oscillator will also change. The preset reference temperature value is a standard temperature determined based on the optimal temperature conditions or empirical values ​​for the normal operation of the system. Continuously monitoring the real-time ambient temperature of the module crystal oscillator is an important part of ensuring the stability of the clock frequency. Because temperature changes will directly affect the oscillation frequency of the crystal oscillator, and the crystal oscillator is a key component of the communication system, the accuracy of its frequency is crucial to the quality of communication.

[0066] Step S200: If the real-time ambient temperature value is greater than the preset reference temperature value, a first frequency error value of the clock frequency of the module crystal oscillator is calculated based on the difference between the real-time ambient temperature value and the preset reference temperature value.

[0067] When the real-time ambient temperature value is greater than the preset reference temperature value, it indicates that the current ambient temperature exceeds the expected normal range. At this time, it is necessary to calculate the first frequency error value of the module crystal oscillator clock frequency based on the difference between the real-time ambient temperature value and the preset reference temperature value. Specifically, this difference reflects the degree of temperature change. Through a certain mathematical model or empirical formula, this temperature difference can be converted into a clock frequency error value. For example, the frequency change corresponding to each unit temperature change can be determined based on the temperature-frequency characteristic curve of the crystal oscillator, and then the corresponding frequency error value can be calculated based on the temperature difference. After calculating the first frequency error value, a specific adjustment basis can be provided for the subsequent clock frequency calibration. By calibrating the clock frequency, the impact of temperature changes on the crystal oscillator frequency can be reduced, and the stability and reliability of the communication system can be improved.

[0068] Step S300: If the real-time ambient temperature value is less than the preset reference temperature value, a second frequency error value of the clock frequency of the module crystal oscillator is calculated based on the difference between the preset reference temperature value and the real-time ambient temperature value.

[0069] When the real-time ambient temperature value is less than the preset reference temperature value, it means that the current ambient temperature is lower than the expected standard temperature. At this time, it is necessary to calculate the difference between the preset reference temperature value and the real-time ambient temperature value. This difference reflects the degree to which the temperature deviates from the standard value. Then, the second frequency error value of the clock frequency of the module crystal oscillator is calculated based on this difference. This is usually calculated through a specific mathematical model or based on the temperature-frequency characteristics of the crystal oscillator. For example, the frequency change law of the crystal oscillator at different temperatures is known, and the corresponding frequency change amount can be determined according to the temperature difference, thereby obtaining the second frequency error value.

[0070] Step S400: calibrate the clock frequency of the module crystal oscillator in the next detection cycle based on the first frequency error value or the second frequency error value.

[0071] After the error value of the clock frequency is obtained, the clock frequency can be calibrated by adjusting the capacitance or inductance of the module crystal oscillator. In addition, the specific calibration method can also be performed in other ways, such as calibrating the clock frequency by a software setting value through the clock adjustment unit of the communication system control module.

[0072] The first frequency error value is calculated when the real-time ambient temperature value is greater than the preset reference temperature value, and the second frequency error value is calculated when the real-time ambient temperature value is less than the preset reference temperature value. These two error values ​​respectively reflect the degree of deviation of the module crystal oscillator clock frequency in different temperature change directions. After determining the current frequency error value, the clock frequency can be calibrated in the next detection cycle. The purpose of calibration is to reduce the impact of temperature changes on the clock frequency and ensure that the clock frequency of the module crystal oscillator is always kept within a more accurate range, thereby improving the stability and reliability of the entire HPLC+HRF dual-mode communication system.

[0073] As the temperature rises, the physical properties of the crystal material inside the crystal oscillator will change. Usually, the oscillation frequency of the crystal will decrease as the temperature rises. The temperature rise will cause the lattice vibration inside the crystal to intensify, thus affecting the vibration frequency of the crystal. When the temperature drops, the physical properties of the crystal material of the crystal oscillator will also change. Contrary to the temperature increase, the temperature drop will usually increase the oscillation frequency of the crystal. At low temperatures, the lattice vibration inside the crystal is weakened, thereby increasing the vibration frequency of the crystal.

[0074] When the real-time temperature value of the module crystal oscillator is higher than the preset reference temperature value and lower than the preset reference temperature value, the corresponding relationship between the frequency error and the temperature value deviation is not the same. In order to improve the calibration accuracy, the present invention calibrates the clock frequency respectively for the above two situations.

[0075] In a specific implementation of the embodiment of the present invention, the first frequency error value of the clock frequency of the crystal oscillator of the calculation module in step S200 includes:

[0076] Step S210, obtaining a standard crystal oscillator clock frequency corresponding to a preset reference temperature value.

[0077] Step S220, calculating a first frequency error value based on a difference between the real-time ambient temperature value and a preset reference temperature value and a standard crystal oscillator clock frequency.

[0078] Specifically, the calculation formula of the first frequency error value Δf1 is:

[0079]

[0080] Wherein, f0 is the standard crystal oscillator clock frequency, T is the real-time ambient temperature value, T0 is the preset reference temperature value, α is the first-order temperature coefficient, β is the second-order temperature coefficient, and λ is the third-order temperature coefficient.

[0081] The standard crystal oscillator clock frequency f0 represents the clock frequency of the crystal oscillator under ideal conditions, that is, when there is no temperature influence, and is a fixed reference value. The real-time ambient temperature value T represents the temperature of the environment in which the module crystal oscillator is currently detected. This temperature value will change continuously with the change of the environment. The preset reference temperature value T0 is a pre-set temperature standard value, which is used to compare with the real-time ambient temperature value to determine the temperature change. The first-order temperature coefficient α, the second-order temperature coefficient β, and the third-order temperature coefficient λ reflect the characteristics of the crystal oscillator frequency changing with temperature. Different coefficients correspond to different orders of temperature influence; the first-order temperature coefficient α mainly describes the linear influence of temperature change on frequency; the second-order temperature coefficient β considers the influence of the quadratic term of temperature change on frequency; the third-order temperature coefficient λ further considers the influence of the cubic term of temperature change on frequency; the introduction of the first-order, second-order and third-order temperature coefficients can better fit the complex relationship between temperature and frequency. In this way, various factors affecting the crystal oscillator frequency due to temperature change can be considered more comprehensively, and the accuracy of calculation can be improved.

[0082] Further, after obtaining the standard crystal oscillator clock frequency corresponding to the preset reference temperature value in step S210, the method further includes:

[0083] Step S211, obtaining the usage time and the first aging drift coefficient of the module crystal oscillator.

[0084] The usage time of the module crystal is an important parameter because the performance of the crystal may change as the usage time increases. By monitoring the usage time, the aging degree of the crystal can be understood, which provides a basis for more accurate calculation of frequency error.

[0085] The first aging drift coefficient reflects the nonlinear drift rate of the module crystal oscillator clock frequency over time. This coefficient can help quantify the frequency change of the crystal oscillator during long-term use, taking into account the impact of crystal oscillator aging on frequency.

[0086] Accordingly, the calculation formula of the first frequency error value is:

[0087]

[0088] Among them, θ is the first aging drift coefficient of the module crystal oscillator, which is used to represent the nonlinear drift rate of the module crystal oscillator clock frequency over time, t u It is the usage time of the module crystal oscillator.

[0089] Based on the original calculation formula of the first frequency error value, parameters related to crystal oscillator aging are added to more comprehensively consider the factors affecting the module crystal oscillator clock frequency, not only the influence of temperature, but also the aging drift caused by time factors. In actual communication systems, crystal oscillator aging is inevitable. The new calculation formula can better adapt to actual application scenarios, taking into account the performance changes of the crystal oscillator during long-term use, and provide guarantee for the long-term stable operation of the system.

[0090] Furthermore, it also includes:

[0091] Step S212, obtaining a second aging drift coefficient of the module crystal oscillator.

[0092] Accordingly, the calculation formula of the first frequency error value is:

[0093]

[0094] Wherein, σ is the second aging drift coefficient of the module crystal oscillator, which is used to indicate the nonlinear drift rate of the module crystal oscillator clock frequency over time; k is the aging drift index used to indicate the nonlinear degree of the module crystal oscillator clock frequency over time.

[0095] As the use time increases, the aging process of the crystal oscillator may show complex nonlinear changes; by introducing the second aging drift coefficient, the description of the clock frequency change caused by the aging of the module crystal oscillator over time is more refined. Different aging drift coefficients can reflect the characteristics of crystal oscillator aging from different angles, which helps to more accurately grasp the trend of crystal oscillator performance over time. In addition, the aging drift index is used to indicate the degree of nonlinearity of the module crystal oscillator clock frequency over time, which can help determine the complexity of the frequency change during the crystal oscillator aging process, and provide an important reference for more accurate calculation of frequency error.

[0096] In another specific implementation of the embodiment of the present invention, when the temperature deviation direction of the module crystal oscillator is lower than the preset reference temperature value, the second frequency error value of the clock frequency of the module crystal oscillator is calculated in step S300, including:

[0097] Step S310, obtaining a standard crystal oscillator clock frequency corresponding to a preset reference temperature value.

[0098] Step S320, calculating a second frequency error value based on a difference between a preset reference temperature value and a real-time ambient temperature value and a standard crystal oscillator clock frequency.

[0099] By combining the difference with the standard crystal oscillator clock frequency to calculate the second frequency error value, the frequency change caused by the temperature being lower than the reference temperature can be quantified more accurately. The amplitude of the temperature change and the benchmark role of the standard frequency are taken into account, so that the calculated second frequency error value can more truly reflect the actual frequency deviation.

[0100] Specifically, the calculation formula of the second frequency error value Δf2 is:

[0101]

[0102] Among them, f0 is the standard crystal oscillator clock frequency, T is the real-time ambient temperature value, T0 is the preset reference temperature value, c n is the temperature weight coefficient corresponding to the nth order, and N is the set order of the calculation formula.

[0103] Temperature weight coefficient corresponding to the order: Different orders correspond to different degrees of weight of the influence of temperature on the frequency error. As the order increases, the temperature weight coefficient reflects the contribution of higher-order temperature changes to the frequency error. For example, the first-order temperature weight coefficient may mainly reflect the influence of linear temperature changes on the frequency, while higher-order coefficients take into account the nonlinear part of the temperature change. The set order of the calculation formula: determines the complexity of considering the temperature effect. The higher the order, the more detailed the relationship between temperature and frequency error can be described by the formula, and the higher the calculation complexity is.

[0104] Further, after obtaining the standard crystal oscillator clock frequency corresponding to the preset reference temperature value in step S310, the method further includes:

[0105] Step S311, obtaining the usage time and the first aging drift coefficient of the module crystal oscillator.

[0106] Similarly, when the actual temperature of the module crystal oscillator is lower than the preset reference temperature, the corresponding frequency error will also be affected by the aging of the crystal oscillator.

[0107] Accordingly, the calculation formula of the second frequency error value is:

[0108]

[0109] Among them, θ is the first aging drift coefficient of the module crystal oscillator, which is used to represent the nonlinear drift rate of the module crystal oscillator clock frequency over time, t uis the length of time the module crystal has been used. Crystal aging will make the second frequency error value more complicated. When calculating the second frequency error value, not only the impact of the temperature being lower than the preset reference temperature value should be considered, but also the nonlinear drift of the clock frequency caused by aging should be considered. If the aging factor is not considered, the calculated error value may be inaccurate, thereby affecting the subsequent clock frequency calibration effect. The impact of crystal aging when the temperature shifts downward may have an adverse effect on the performance of the communication system. For example, it may cause problems such as increased data transmission error rate and increased communication delay. Therefore, when calculating the second frequency error value, both temperature and aging factors must be considered comprehensively to ensure the stability and reliability of the communication system.

[0110] Furthermore, it also includes:

[0111] Step S312, obtaining a second aging drift coefficient of the module crystal oscillator;

[0112] The calculation formula for the first frequency error value is:

[0113]

[0114] Wherein, σ is the second aging drift coefficient of the module crystal oscillator, which is used to indicate the nonlinear drift rate of the module crystal oscillator clock frequency over time; k is the aging drift index used to indicate the nonlinear degree of the module crystal oscillator clock frequency over time.

[0115] The introduction of the second aging drift coefficient further refines the nonlinear drift of the module crystal oscillator over time. Combined with the first aging drift coefficient, the impact of crystal oscillator aging on the clock frequency can be more comprehensively considered, especially when the temperature is lower than the preset reference temperature value, and the complex changes in crystal oscillator performance over time can be captured more accurately; it also helps to consider different degrees of aging nonlinear drift when calculating the frequency error, thereby improving the accuracy of error calculation and providing more reliable data support for subsequent clock frequency calibration. In addition, the aging drift index is used to indicate the degree of nonlinearity of the module crystal oscillator clock frequency over time, helping to determine the complexity of the frequency change during the crystal oscillator aging process, and providing a basis for adjusting the calculation formula and calibration strategy. For example, if the aging drift index is high, it means that the nonlinear degree of the crystal oscillator clock frequency over time is large, and more attention needs to be paid to the influence of nonlinear factors when calculating errors and performing calibration.

[0116] By introducing multiple aging drift coefficients and aging drift exponents, the calculation formula of the second frequency error value can better adapt to different types of module crystal oscillators and different working environments. Whether in the case of large temperature changes or in the case of severe crystal oscillator aging, it can provide more accurate frequency error calculation results, providing strong support for clock frequency calibration.

[0117] Accordingly, please refer to Figure 2 A second aspect of an embodiment of the present invention provides a clock frequency calibration device for an HPLC+HRF dual-mode communication system, comprising:

[0118] Temperature detection module 1, which is used to obtain the real-time ambient temperature value of the crystal oscillator of the HPLC+HRF dual-mode communication system module in the current detection cycle;

[0119] An error calculation module 2, which is used to calculate a first frequency error value of the clock frequency of the module crystal oscillator based on the difference between the real-time ambient temperature value and the preset reference temperature value when the real-time ambient temperature value is greater than the preset reference temperature value;

[0120] The error calculation module 2 is also used to calculate a second frequency error value of the module crystal oscillator clock frequency based on the difference between the preset reference temperature value and the real-time ambient temperature value when the real-time ambient temperature value is less than the preset reference temperature value;

[0121] The frequency calibration module 3 is used to calibrate the clock frequency of the module crystal oscillator in the next detection cycle based on the first frequency error value or the second frequency error value.

[0122] Accordingly, a third aspect of an embodiment of the present invention provides an electronic device, comprising: at least one processor; and a memory connected to the at least one processor; wherein the memory stores instructions that can be executed by the at least one processor, and the instructions are executed by the at least one processor so that the at least one processor executes the above-mentioned HPLC+HRF dual-mode communication system clock frequency calibration method.

[0123] Accordingly, a fourth aspect of an embodiment of the present invention provides a computer-readable storage medium having computer instructions stored thereon, which, when executed by a processor, implement the above-mentioned HPLC+HRF dual-mode communication system clock frequency calibration method.

[0124] The embodiment of the present invention aims to protect a method and device for calibrating the clock frequency of an HPLC+HRF dual-mode communication system, including the following steps: obtaining the real-time ambient temperature value of the module crystal oscillator of the HPLC+HRF dual-mode communication system in the current detection cycle; if the real-time ambient temperature value is greater than the preset reference temperature value, based on the difference between the real-time ambient temperature value and the preset reference temperature value, calculating the first frequency error value of the clock frequency of the module crystal oscillator; if the real-time ambient temperature value is less than the preset reference temperature value, based on the difference between the preset reference temperature value and the real-time ambient temperature value, calculating the second frequency error value of the clock frequency of the module crystal oscillator; based on the first frequency error value or the second frequency error value, calibrating the clock frequency of the module crystal oscillator in the next detection cycle. The above technical solution has the following effects:

[0125] 1. By considering the difference between the real-time ambient temperature and the preset reference temperature, the first and second frequency error values ​​are calculated for the cases where the temperature is higher and lower than the preset value, respectively, which can accurately reflect the impact of temperature changes on the module crystal oscillator clock frequency and provide an accurate data basis for calibration;

[0126] 2. The temperature weight coefficient, aging drift coefficient and aging drift index of different orders are introduced to comprehensively consider the complexity of temperature change and the nonlinear characteristics of crystal oscillator aging, making the frequency error calculation more precise, thereby greatly improving the accuracy of clock frequency calibration;

[0127] 3. Accurate clock frequency calibration helps reduce frequency errors caused by temperature changes and crystal oscillator aging, thereby reducing the probability of data transmission error rates, communication delays and other problems, and improving the stability of the communication system.

[0128] Those skilled in the art will appreciate that the embodiments of the present application may be provided as methods, systems, or computer program products. Therefore, the present application may adopt the form of a complete hardware embodiment, a complete software embodiment, or an embodiment in combination with software and hardware. Moreover, the present application may adopt the form of a computer program product implemented in one or more computer-usable storage media (including but not limited to disk storage, CD-ROM, optical storage, etc.) that include computer-usable program code.

[0129] The present application is described with reference to the flowcharts and / or block diagrams of the methods, devices (systems), and computer program products according to the embodiments of the present application. It should be understood that each process and / or box in the flowchart and / or block diagram, as well as the combination of the processes and / or boxes in the flowchart and / or block diagram, can be implemented by computer program instructions. These computer program instructions can be provided to a processor of a general-purpose computer, a special-purpose computer, an embedded processor, or other programmable data processing device to generate a machine, so that the instructions executed by the processor of the computer or other programmable data processing device generate instructions for implementing the processes in the flowchart and / or block diagram. Figure 1 A process or multiple processes and / or boxes Figure 1 A device that provides the functions specified in a block or multiple blocks.

[0130] These computer program instructions may also be stored in a computer-readable memory capable of directing a computer or other programmable data processing device to operate in a specific manner, so that the instructions stored in the computer-readable memory produce an article of manufacture comprising an instruction device, which implements the process Figure 1 A process or multiple processes and / or boxes Figure 1 A function specified in one or more boxes.

[0131] These computer program instructions can also be loaded onto a computer or other programmable data processing device so that a series of operating steps are executed on the computer or other programmable device to produce a computer-implemented process, thereby providing instructions for implementing the process. Figure 1 A process or multiple processes and / or boxes Figure 1 The steps for the functions specified in one or more boxes.

[0132] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention rather than to limit it. Although the present invention has been described in detail with reference to the above embodiments, ordinary technicians in the relevant field should understand that the specific implementation methods of the present invention can still be modified or replaced by equivalents. Any modification or equivalent replacement that does not depart from the spirit and scope of the present invention should be covered within the scope of protection of the claims of the present invention.

Claims

1. A clock frequency calibration method for an HPLC+HRF dual-mode communication system, characterized in that: The steps include: Get the real-time ambient temperature value of the crystal oscillator of the HPLC+HRF dual-mode communication system module in the current detection cycle; If the real-time ambient temperature value is greater than the preset reference temperature value, based on the difference between the real-time ambient temperature value and the preset reference temperature value, calculating a first frequency error value of the clock frequency of the module crystal oscillator; If the real-time ambient temperature value is less than the preset reference temperature value, a second frequency error value of the clock frequency of the module crystal oscillator is calculated based on the difference between the preset reference temperature value and the real-time ambient temperature value; The clock frequency of the module crystal oscillator in the next detection cycle is calibrated based on the first frequency error value or the second frequency error value.

2. The HPLC+HRF dual-mode communication system clock frequency calibration method according to claim 1, characterized in that: The calculating a first frequency error value of the clock frequency of the module crystal oscillator comprises: Acquire a standard crystal oscillator clock frequency corresponding to the preset reference temperature value; The first frequency error value is calculated based on the difference between the real-time ambient temperature value and the preset reference temperature value and the standard crystal oscillator clock frequency.

3. The HPLC+HRF dual-mode communication system clock frequency calibration method according to claim 2, characterized in that: The calculation formula of the first frequency error value Δf1 is: Wherein, f0 is the standard crystal oscillator clock frequency, T is the real-time ambient temperature value, T0 is the preset reference temperature value, α is the first-order temperature coefficient, β is the second-order temperature coefficient, and λ is the third-order temperature coefficient.

4. The HPLC+HRF dual-mode communication system clock frequency calibration method according to claim 3, characterized in that: After obtaining the standard crystal oscillator clock frequency corresponding to the preset reference temperature value, the method further includes: Obtain the usage time and first aging drift coefficient of the module crystal oscillator; The calculation formula of the first frequency error value is: Among them, θ is the first aging drift coefficient of the module crystal oscillator, which is used to represent the nonlinear drift rate of the module crystal oscillator clock frequency over time, t u It is the usage time of the module crystal oscillator.

5. The HPLC+HRF dual-mode communication system clock frequency calibration method according to claim 4, characterized in that: Also includes: Obtain the second aging drift coefficient of the module crystal oscillator; The calculation formula of the first frequency error value is: Wherein, σ is the second aging drift coefficient of the module crystal oscillator, which is used to indicate the nonlinear drift rate of the module crystal oscillator clock frequency over time; k is the aging drift index used to indicate the nonlinear degree of the module crystal oscillator clock frequency over time.

6. The HPLC+HRF dual-mode communication system clock frequency calibration method according to claim 1, characterized in that: The calculating a second frequency error value of the clock frequency of the module crystal oscillator comprises: Acquire a standard crystal oscillator clock frequency corresponding to the preset reference temperature value; The second frequency error value is calculated based on the difference between the preset reference temperature value and the real-time ambient temperature value and the standard crystal oscillator clock frequency.

7. The HPLC+HRF dual-mode communication system clock frequency calibration method according to claim 6, characterized in that: The calculation formula of the second frequency error value Δf2 is: Among them, f0 is the standard crystal oscillator clock frequency, T is the real-time ambient temperature value, T0 is the preset reference temperature value, c n is the temperature weight coefficient corresponding to the nth order, and N is the set order of the calculation formula.

8. The HPLC+HRF dual-mode communication system clock frequency calibration method according to claim 7, characterized in that: After obtaining the standard crystal oscillator clock frequency corresponding to the preset reference temperature value, the method further includes: Obtain the usage time and first aging drift coefficient of the module crystal oscillator; The calculation formula of the second frequency error value is: Among them, θ is the first aging drift coefficient of the module crystal oscillator, which is used to represent the nonlinear drift rate of the module crystal oscillator clock frequency over time, t u It is the usage time of the module crystal oscillator.

9. The HPLC+HRF dual-mode communication system clock frequency calibration method according to claim 8, characterized in that: Also includes: Obtain the second aging drift coefficient of the module crystal oscillator; The calculation formula of the first frequency error value is: Wherein, σ is the second aging drift coefficient of the module crystal oscillator, which is used to indicate the nonlinear drift rate of the module crystal oscillator clock frequency over time; k is the aging drift index used to indicate the nonlinear degree of the module crystal oscillator clock frequency over time.

10. A clock frequency calibration device for a HPLC+HRF dual-mode communication system, characterized in that: include: The temperature detection module is used to obtain the real-time ambient temperature value of the crystal oscillator of the HPLC+HRF dual-mode communication system module in the current detection cycle; an error calculation module, configured to calculate a first frequency error value of the clock frequency of the module crystal oscillator based on a difference between the real-time ambient temperature value and the preset reference temperature value when the real-time ambient temperature value is greater than a preset reference temperature value; The error calculation module is also used to calculate a second frequency error value of the module crystal oscillator clock frequency based on the difference between the preset reference temperature value and the real-time ambient temperature value when the real-time ambient temperature value is less than the preset reference temperature value; A frequency calibration module is used to calibrate the clock frequency of the module crystal oscillator in the next detection cycle based on the first frequency error value or the second frequency error value.

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