Adjusting mechanism of chip testing machine

Abstract

The invention relates to the technical field of chip testing machines, in particular to an adjusting mechanism of a chip testing machine, which comprises an adjusting machine tool, a limiting plate fixedly connected to the surface of the adjusting machine tool, a motor fixedly connected to the side surface of the limiting plate, a protection structure arranged on one side, far away from the motor, of the limiting plate, and a clamping structure arranged on one side, far away from the limiting plate, of the protection structure. When the device is not used, the semicircular plate and the protective cover are arranged above the clamping structure, the clamping structure and the protective structure can be integrally shielded from dust, and even if a worker accidentally touches the clamping structure, the protective cover is made of silica gel, so that accidental touch force can be protected and buffered; the rotating column rotates to drive the semicircular plate and the protective cover to rotate to the position below the clamping structure, the chip testing machine clamped by the clamping plate and the clamping block is protected, damage caused by falling of the chip is reduced, the protection effect of the chip is improved, and meanwhile the phenomenon of resource waste is reduced.

Description

Technical Field

[0001] The present invention relates to the technical field of chip testers, and in particular to an adjustment mechanism of a chip tester. Background Art

[0002] A chip tester is an electronic measuring instrument used in the field of electronics and communication technology. During chip testing, the chip tester is generally placed on a fixed rack. Before testing, the chip tester needs to be connected to a probe card and aligned with the test wafer. For different types of test wafers, the chip tester on the rack needs to be rotated to different directions and adjusted to different angles for alignment. After searching the application number: 202321002844.0, an adjustment mechanism of a chip tester is disclosed. The device can drive the column and the chip tester to rotate horizontally through the first driving mechanism, without rotating the whole device, which is convenient to use. The bidirectional moving mechanism can clamp chip testers of different sizes, thereby improving practicality. The second driving mechanism and the rotatable clamping mechanism can automatically rotate the rotatable clamping mechanisms on both sides synchronously, thereby facilitating the adjustment of the vertical angle of the chip tester without separate operations, thereby reducing the workload. However, in the above-mentioned patent, when the chip is clamped and fixed and then tested by the staff, the staff may accidentally touch the structure of the clamped chip tester, causing the clamped chip tester to rotate or fall. If the clamped chip tester rotates accidentally, the test data may be inaccurate or the chip may be damaged. If the chip tester falls, it may collide with the test equipment, causing damage to the equipment or the chip. This not only affects the test task, but also requires additional cost and time to repair the equipment, and even wastes chip resources. In view of this, we propose an adjustment mechanism for the chip tester. Summary of the invention

[0003] The object of the present invention is to provide an adjustment mechanism for a chip tester to solve the problems raised in the above background technology.

[0004] To achieve the above-mentioned object, the present invention provides an adjustment mechanism of a chip tester, comprising an adjustment machine tool, a limit plate is fixedly connected to the surface of the adjustment machine tool, a motor is fixedly connected to the side of the limit plate, a protective structure is arranged on the side of the limit plate away from the motor, and a clamping structure is arranged on the side of the protective structure away from the limit plate; When not in use, the protective structure can protect the entire clamping structure from dust. When in use, the protective structure is first rotated 180 degrees to protect the chip from accidentally falling. After the protective structure is rotated, the clamping structure can be limited and clamped to prevent the clamped chip tester from rotating.

[0005] Preferably, the clamping structure includes a clamping plate, a clamping block is detachably mounted on the side of the clamping plate, a sliding shaft is fixedly connected to the side of the clamping plate away from the clamping block, a spring is arranged at the end of the sliding shaft away from the clamping plate, a spiral pattern is arranged inside the sliding shaft, and an arc-shaped limiting groove is arranged on the outer ring surface of the end of the sliding shaft close to the spring.

[0006] Preferably, several clamping blocks are respectively arranged along the center of the clamping plate, the interior of the sliding shaft is hollow, the arc-shaped limit groove is arc-shaped and has a first groove inside, and the clamping structure as a whole is symmetrically arranged in two groups along the lateral center of the adjustment machine tool.

[0007] Preferably, the protective structure includes a rotating shaft, which passes through a limit plate and is fixedly connected to an output shaft of the motor; an end of the rotating shaft away from the motor is fixedly connected to a rotating column, a first limit block is slidably connected inside the rotating column, and a linear slide groove that matches the first limit block is provided inside the rotating column.

[0008] Preferably, the end of the rotating column away from the first limit block is internally slidably connected to the second limit block, the end of the second limit block away from the rotating column is abutted against a movable plate, the bottom of the movable plate is slidably connected to a semicircular plate, the outer annular surface of the semicircular plate is movably connected to a protective cover, and the side of the movable plate is fixedly connected to a movable column.

[0009] Preferably, the rotating shaft passes through the semicircular plate and is fixedly connected to the rotating column. The semicircular plate is semicircular in shape. The protective cover movably connected to the outer ring surface of the semicircular plate is U-shaped. The side of the semicircular plate is provided with a second groove that matches the second limit block.

[0010] Preferably, the moving column and the spring are matched with each other, one end of the moving column away from the moving plate is matched with the spiral pattern, and the moving column passes through the semicircular plate.

[0011] Preferably, the interior of the semicircular plate is hollow, and the protective cover movably connected to the outer annular surface of the semicircular plate is made of rubber.

[0012] Preferably, the first limiting block and the arc-shaped limiting groove are adapted to each other, and the first limiting block and the arc-shaped limiting groove are slidably connected.

[0013] Compared with the prior art, the present invention has the following beneficial effects: 1. In the adjustment mechanism of the chip testing machine, the first limit block is stuck in the arc-shaped limit groove, so that the sliding shaft, the clamping plate and the clamping block are limited to prevent them from rotating. Even if the staff touches them by mistake, the overall structure of the clamping structure cannot rotate. When the angle needs to be adjusted, the rotation of the first limit block can drive the overall structure of the clamping structure to rotate, and the clamped chip can be adjusted to the required angle, which is beneficial to improve the accuracy of the test results of the staff.

[0014] 2. In the adjustment mechanism of the chip tester, when not in use, a semicircular plate and a protective cover are arranged above the clamping structure, which can shield the clamping structure and the protective structure from dust as a whole. Even if the staff accidentally touches the clamping structure, the protective cover is set with silicone, which can protect and buffer the force of the accidental touch, which is conducive to improving the service life of the clamping structure and the protective structure as a whole; When in use, the rotation of the rotating column first drives the semicircular plate and the protective cover to rotate to the bottom of the clamping structure, and the chip testing machine clamped by the protective clamping plate and the clamping block. Even if the chip falls, the protective cover can receive and protect the fallen chip, reducing the damage caused by the chip falling, which is beneficial to improve the protection effect of the chip and reduce the waste of resources. BRIEF DESCRIPTION OF THE DRAWINGS

[0015] Figure 1 It is a schematic diagram of the overall assembly of the present invention; Figure 2 It is a partial schematic diagram of the overall structure of the present invention; Figure 3 It is a cutaway perspective view of the protective structure of the present invention; Figure 4 It is a sectional stereoscopic view of the whole clamping structure and the protective structure of the present invention; Figure 5 It is a schematic diagram of the disassembly of the protective structure of the present invention; Figure 6 It is a schematic diagram of the disassembly of the clamping structure and the protective structure of the present invention; Figure 7 It is a schematic diagram of the disassembly of the clamping structure of the present invention; Figure 8 It is a two-dimensional schematic diagram of the motion state of the overall structure of the present invention; Fig. 9 It is a two-dimensional schematic diagram of the overall structure of the present invention in the reset state.

[0016] The meaning of each number in the figure is: 1. Adjust the machine tool; 2. Motor; 300. Clamping structure; 301. Clamping plate; 302. Clamping block; 303. Sliding shaft; 304. Spring; 305. Spiral pattern; 306. Arc-shaped limit groove; 400. Protective structure; 401. Rotating shaft; 402. Rotating column; 403. First limit block; 404. Second limit block; 405. Semicircular plate; 406. Protective cover; 407. Moving plate; 408. Moving column; 5. Limit plate. DETAILED DESCRIPTION

[0017] The following will be combined with the accompanying drawings in the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0018] For the embodiments of the present invention, please refer to Figure 1-Figure 9 The adjustment mechanism of the chip tester includes an adjustment machine tool 1, a limit plate 5 is fixedly connected to the surface of the adjustment machine tool 1, a motor 2 is fixedly connected to the side of the limit plate 5, a protective structure 400 is arranged on the side of the limit plate 5 away from the motor 2, and a clamping structure 300 is arranged on the side of the protective structure 400 away from the limit plate 5; When not in use, the protective structure 400 can protect the entire structure of the clamping structure 300 from dust. When in use, the protective structure 400 is first rotated 180 degrees to protect the chip from accidentally falling, and after the protective structure 400 is rotated, the clamping structure 300 can be limited and clamped to prevent the clamped chip tester from rotating; The present invention takes into account that in the existing working environment of chip detection and testing, the layout of equipment, fixtures and various connecting lines is relatively compact, and the space left for staff to operate is often relatively narrow. When the staff needs to test the chip, the arms, tools, etc. are easy to accidentally touch the chip in the limited space, especially when some delicate operations are required. The probability of such accidental touch will be higher, resulting in the staff easily accidentally touching the structure of the clamping chip tester, causing the structure of the clamping chip tester to accidentally rotate or fall. Therefore, the first limit block 403 is stuck in the arc limit groove 306, so that the sliding shaft 303, the clamping plate 301 and the clamping block 302 are limited to prevent the clamped chip tester from rotating. Even if the staff accidentally touches it, the overall structure of the clamping structure 300 cannot rotate, and when the angle needs to be adjusted, the rotation of the first limit block 403 can drive the overall structure of the clamping structure 300 to rotate, and adjust the clamped chip to the required angle, which is conducive to improving the accuracy of the test results of the staff; Furthermore, considering that when the test equipment is not in use, the equipment as a whole may be corroded by external dust or the staff may accidentally touch the equipment, causing the equipment to accumulate too much dust and affect the effect of subsequent chip testing and the effect of the clamping chip tester, therefore, when not in use, the semicircular plate 405 and the protective cover 406 are arranged above the clamping structure 300, so that the clamping structure 300 and the protective structure 400 can be shielded from dust as a whole. Even if the staff accidentally touches the clamping structure 300, the protective cover 406 is set with silicone, which can protect and buffer the force of the accidental touch, which is beneficial to improve the service life of the clamping structure 300 and the protective structure 400 as a whole. Next, it is considered that during the chip testing process, if the design of the clamping chip tester is unreasonable, it will not be able to provide sufficient and uniform clamping force, which will easily cause the chip to fall off during the test process. For example, the contact area between the clamping part of the clamp and the chip surface is too small, or the elastic element of the clamping mechanism is aged or deformed, which will make the actual clamping force acting on the chip insufficient and difficult to firmly fix the chip. Therefore, when in use, the semicircular plate 405 and the protective cover 406 are first driven to rotate to the bottom of the clamping structure 300 through the rotation of the rotating column 402, and the chip tester clamped by the protective clamping plate 301 and the clamping block 302, even if the chip falls, the protective cover 406 can also receive and protect the fallen chip, reduce the damage caused by the chip falling, which is conducive to improving the chip protection effect and reducing the waste of resources. It is explained here that the working principle of the adjustment machine tool 1 is well known in the art. Through preset programs and parameters, the various moving parts of the machine tool are controlled, and the clamping structure 300 and the protective structure 400 are moved to preset positions, which is convenient for the staff to test the chip according to the adapted height, which is conducive to improving the efficiency of testing the chip; On the basis of the above, the following specific structures need to be disclosed in detail: First, in order to clamp the chip tester and adjust the clamped chip tester to different angles, the following specific structure needs to be disclosed in detail. Please refer to Figure 1-Figure 4 The clamping structure 300 includes a clamping plate 301, a clamping block 302 is detachably mounted on the side of the clamping plate 301, a sliding shaft 303 is fixedly connected to the side of the clamping plate 301 away from the clamping block 302, a spring 304 is arranged at one end of the sliding shaft 303 away from the clamping plate 301, a spiral pattern 305 is arranged inside the sliding shaft 303, and an arc-shaped limiting groove 306 is arranged on the outer ring surface of one end of the sliding shaft 303 close to the spring 304; Here, the specific features and quantity of the partial structure of the clamping structure 300 are described to facilitate the overall movement process of clamping the chip tester as described below, wherein a plurality of clamping blocks 302 are respectively arranged along the center of the clamping plate 301, the interior of the sliding shaft 303 is hollow, the arc-shaped limit groove 306 is arc-shaped and has a first groove (not marked in the text) arranged inside, and the clamping structure 300 and the protective structure 400 are symmetrically arranged in two groups along the transverse center of the adjustment machine 1. As for the clamping blocks 302, two groups are respectively arranged on the clamping plate 301, which is mutually compatible with the existing chip tester, so as to stabilize the chip test when clamped by two groups of clamping blocks 302; Next, it is necessary to describe the following working process in combination with the structure and characteristics of the clamping structure 300 mentioned above. First, the staff places the chip between the two sets of clamping plates 301 and the clamping block 302 to realize the clamping chip tester. During the clamping process of the chip tester, the thickness or width of the chip tester itself will drive the two sets of clamping plates 301 to move away from each other. When the clamping plate 301 moves, it will drive the sliding shaft 303 to slide inside the protective structure 400 and compress the spring 304, so that it can be clamped according to the thickness or width of the chip. At the same time, when the sliding shaft 303 moves, it will drive the spiral pattern 305 to move close to the direction of the protective structure 400 and engage, so as to facilitate the subsequent driving of the protective structure 400 to move to the bottom of the clamping structure 300.

[0019] Then, in order to realize rotating the protective cover 406 to the bottom of the clamping structure 300 to receive the chip tester that accidentally falls, the following insulator structure needs to be disclosed in detail, please refer to Figure 1-Figure 7 The protective structure 400 includes a rotating shaft 401, which passes through the limiting plate 5 and is fixedly connected to the output shaft of the motor 2. The end of the rotating shaft 401 away from the motor 2 is fixedly connected to a rotating column 402, and a first limiting block 403 is slidably connected inside the rotating column 402. A linear slide groove (not shown in the text) that is adapted to the first limiting block 403 is provided inside the rotating column 402; In combination with the specific movement process of the above structure, when the clamping structure 300 as a whole finishes the clamping movement of the chip tester, the staff needs to start the motor 2 to rotate the rotating shaft 401 fixedly connected to the output shaft end, and then synchronously drive the rotating column 402 to rotate. When the rotating column 402 rotates, it will drive the second limit block 404 to rotate around the center of the rotating column 402, and then the second limit block 404 will synchronously rotate to the bottom of the clamping plate 301 against the semicircular plate 405 and the protective cover 406, so as to receive and protect the chip tester from accidentally falling. In addition, the rotation of the rotating column 402 will also drive the first limit block 403 to slide in the arc-shaped limit groove 306 opened on the surface of the sliding shaft 303, and then be clamped in the first groove below the arc-shaped limit groove 306, so as to limit the rotation of the sliding shaft 303 and the clamping plate 301 when the clamping plate 301 is accidentally touched, which is beneficial to improve the efficiency of the staff in testing chips.

[0020] Here we will continue to describe other structures and features in the protective structure 400 to facilitate understanding of the following mentioned prevention of the protective cover 406 from rotating, which will not be able to protect the chip tester from accidentally falling, and the movement process of adjusting the angle of the chip tester after clamping. Please refer to Figure 3-Figure 9 , wherein the end of the rotating column 402 away from the first limit block 403 is slidably connected to the second limit block 404, the end of the second limit block 404 away from the rotating column 402 is abutted against a moving plate 407, a semicircular plate 405 is slidably connected to the bottom of the moving plate 407, a protective cover 406 is movably connected to the outer ring surface of the semicircular plate 405, and a moving column 408 is fixedly connected to the side of the moving plate 407, the rotating shaft 401 passes through the semicircular plate 405 and is fixedly connected to the rotating column 402, the semicircular plate 405 is semicircular, the protective cover 406 movably connected to the outer ring surface of the semicircular plate 405 is U-shaped, and a second groove (not marked in the text) that is mutually adapted to the second limit block 404 is opened on the side of the semicircular plate 405; Specifically in combination with the above structure, before adjusting the angle of the clamped chip tester, the protective cover 406 is prevented from following the rotation process. When the semicircular plate 405 and the protective cover 406 rotate to the bottom of the clamping plate 301, the semicircular plate 405 will drive the movable plate 407 to rotate synchronously, so that the movable column 408 fixedly connected to the side of the movable plate 407 rotates. At this time, it has been mentioned in the previous text that the spiral pattern 305 has moved to the movable column 408 and meshed. Therefore, when the movable column 408 rotates, it will mesh with the spiral pattern 305 and move, so that the movable column 408 moves toward the clamping plate 301 and crosses the meshing point of the spiral pattern 305, which is convenient for the subsequent driving of the second limit block 404 to move, and move in the second groove opened in the semicircular plate 405, so as to prevent the subsequent protective cover 406 from following the clamped chip tester and rotating when adjusting the angle; The specific reasons and implementation methods for the protection cover 406 not rotating will be described below. When the moving column 408 passes over the meshing part of the spiral pattern 305, the movement of the moving column 408 drives the moving plate 407 to slide inside the semicircular plate 405, and drives the second limit block 404 to move inside the rotating column 402, so that the second limit block 404 placed at the deepest part of the second groove opened in the semicircular plate 405 moves to the shallowest part of the second groove opened in the semicircular plate 405, so that the rotating column 402 rotates to drive the second limit block 404 to rotate When the second limit block 404 is driven to rotate around the center of the rotating shaft 401, it will only continuously cross the second groove of the semicircular plate 405, and will not drive the semicircular plate 405, thereby preventing the semicircular plate 405 and the protective cover 406 from moving synchronously, so that when the angle of the clamped chip is adjusted, the protective cover 406 does not rotate to protect the chip tester clamped by the clamping plate 301; The following is to adjust the angle of the chip tester after clamping, so that the staff can test the chip tester at different angles. As mentioned above, the protective cover 406 will not be able to rotate with the chip tester clamped by the clamping plate 301. Therefore, when the staff needs to adjust the angle of the chip tester clamped between the two sets of clamping plates 301 and the clamping block 302, the motor 2 can be started again to make its rotating shaft 401 and the rotating column 402 rotate synchronously. When the rotating column 402 rotates, it will drive the sliding shaft 303 that has been clamped in the first groove below the arc-shaped limit groove 306 to rotate synchronously, so that the clamping plate 301 connected to the side of the sliding shaft 303 rotates, so as to adjust the clamped chip tester to the specified angle; Working principle: The staff needs to place the chip between the two sets of clamping plates 301 and the clamping block 302 to realize the clamping chip tester. During the clamping chip tester process, the thickness or width of the chip tester itself will drive the two sets of clamping plates 301 to move away from each other. When the clamping plate 301 moves, it will drive the sliding shaft 303 to slide inside the protective structure 400 and compress the spring 304, so that it can be clamped according to the thickness or width of the chip. At the same time, when the sliding shaft 303 moves, it will drive the spiral pattern 305 to move close to the protective structure 400 and engage, so as to facilitate the subsequent driving of the protective structure 400 to move to the bottom of the clamping structure 300; When the clamping structure 300 as a whole has finished clamping the chip tester, the staff needs to start the motor 2 to rotate the rotating shaft 401 fixedly connected to the output shaft end, and then synchronously drive the rotating column 402 to rotate. When the rotating column 402 rotates, it will drive the second limit block 404 to rotate around the center of the rotating column 402, and then it will synchronously rotate to the bottom of the clamping plate 301 against the semicircular plate 405 and the protective cover 406. At the same time, the rotation process of the rotating column 402 will also drive the first limit block 403 to slide in the arc-shaped limit groove 306 opened on the surface of the sliding shaft 303, and then clamped in the first groove below the arc-shaped limit groove 306, so as to limit the rotation of the sliding shaft 303 and the clamping plate 301 when the clamping plate 301 is accidentally touched; When the moving column 408 passes over the meshing part of the spiral pattern 305, the movement of the moving column 408 drives the moving plate 407 to slide inside the semicircular plate 405, and drives the second limit block 404 to move inside the rotating column 402, so that the second limit block 404 placed at the deepest part of the second groove opened in the semicircular plate 405 moves to the shallowest part of the second groove opened in the semicircular plate 405, so that when the rotating column 402 rotates to drive the second limit block 404 to rotate, the second limit block 404 will not drive the semicircular plate 405 to rotate, so as to prevent the semicircular plate 405 and the protective cover 406 from moving synchronously, and the protective cover 406 will not be able to protect the chip tester from accidentally falling; Then, when the staff needs to adjust the angle of the chip tester clamped between the two sets of clamping plates 301 and the clamping block 302, the motor 2 can be started again to make the rotating shaft 401 and the rotating column 402 rotate synchronously. When the rotating column 402 rotates, it will drive the sliding shaft 303 that has been clamped in the first groove below the arc-shaped limiting groove 306 to rotate synchronously, so that the clamping plate 301 connected to the side of the sliding shaft 303 rotates, so as to adjust the clamped chip tester to the specified angle; After the chip test is finished, the staff needs to remove the chip tester clamped by the two sets of clamping plates 301, and then the spring 304 will lose pressure and change from a compressed state to a relaxed state, so that the two sets of sliding shafts 303 and the clamping plates 301 can be moved closer to each other, i.e., reset. At the same time, the moving column 408 mentioned above passes over one side of the spiral pattern 305, and will be reset by the sliding shaft 303 and the spiral pattern 305 to the meshing position of the spiral pattern 305; Then, when the rotating shaft 401 rotates, the rotating column 402 and the first limiting block 403 are driven in the opposite direction, so that the first limiting block 403 passes over the first groove below the arc limiting groove 306 and is reset to the first limiting block 403 and is placed at the top of the sliding shaft 303. At the same time, when the rotating column 402 is reversed, the second limiting block 404 will push the semicircular plate 405, the protective cover 406 and the moving plate 407 to reverse synchronously in the groove opened in the semicircular plate 405, so that the moving column 408 fixed on the side of the moving plate 407 reverses the spiral pattern 305 that has been passed, so that the moving column 408 moves to the inside of the semicircular plate 405 close to the side of the limiting plate 5 (i.e. Figure 8 The semicircular plate 405 and the protective cover 406 are reversed to above the clamping plate 301 to provide dustproof protection therefor.

[0021] The above shows and describes the basic principles, main features and advantages of the present invention. Those skilled in the art should understand that the present invention is not limited by the above embodiments. The above embodiments and descriptions are only preferred examples of the present invention and are not intended to limit the present invention. Without departing from the spirit and scope of the present invention, the present invention may have various changes and improvements, which fall within the scope of the present invention. The scope of protection of the present invention is defined by the attached claims and their equivalents.

Claims

1. An adjustment mechanism for a chip testing machine, comprising an adjustment machine tool (1), characterized in that: The regulating machine tool (1) has a limit plate (5) fixedly connected to its surface, a motor (2) fixedly connected to the side of the limit plate (5), a protective structure (400) provided on the side of the limit plate (5) away from the motor (2), and a clamping structure (300) provided on the side of the protective structure (400) away from the limit plate (5); When not in use, the protective structure (400) can protect the entire structure of the clamping structure (300) from dust. When in use, the protective structure (400) is first rotated 180 degrees to protect the chip from accidentally falling, and after the protective structure (400) is rotated, the clamping structure (300) can be limited and clamped to prevent the clamped chip tester from rotating.

2. The adjustment mechanism of the chip tester according to claim 1, characterized in that: The clamping structure (300) comprises a clamping plate (301), a clamping block (302) being detachably mounted on a side of the clamping plate (301), a sliding shaft (303) being fixedly connected to a side of the clamping plate (301) away from the clamping block (302), a spring (304) being arranged at one end of the sliding shaft (303) away from the clamping plate (301), a spiral pattern (305) being arranged inside the sliding shaft (303), and an arc-shaped limiting groove (306) being arranged on an outer ring surface of one end of the sliding shaft (303) close to the spring (304).

3. The adjustment mechanism of the chip tester according to claim 2, characterized in that: A plurality of the clamping blocks (302) are respectively arranged along the center of the clamping plate (301); the interior of the sliding shaft (303) is hollow; the arc-shaped limiting groove (306) is arc-shaped and has a first groove therein; and the clamping structure (300) as a whole is symmetrically arranged in two groups along the transverse center of the adjusting machine tool (1).

4. The adjustment mechanism of the chip tester according to claim 1, characterized in that: The protective structure (400) comprises a rotating shaft (401), the rotating shaft (401) passes through the limiting plate (5) and is fixedly connected to the output shaft of the motor (2), one end of the rotating shaft (401) away from the motor (2) is fixedly connected to a rotating column (402), a first limiting block (403) is slidably connected inside the rotating column (402), and a linear sliding groove that is mutually compatible with the first limiting block (403) is provided inside the rotating column (402).

5. The adjustment mechanism of the chip tester according to claim 4, characterized in that: The end of the rotating column (402) away from the first limit block (403) is slidably connected to the inside with a second limit block (404), the end of the second limit block (404) away from the rotating column (402) is abutted against a moving plate (407), the bottom of the moving plate (407) is slidably connected to a semicircular plate (405), the outer ring surface of the semicircular plate (405) is movably connected to a protective cover (406), and the side of the moving plate (407) is fixedly connected to a moving column (408).

6. The adjustment mechanism of the chip tester according to claim 4, characterized in that: The rotating shaft (401) passes through the semicircular plate (405) and is fixedly connected to the rotating column (402); the semicircular plate (405) is semicircular in shape; the protective cover (406) movably connected to the outer ring surface of the semicircular plate (405) is U-shaped; and a second groove that is adapted to the second limit block (404) is provided on the side surface of the semicircular plate (405).

7. The adjustment mechanism of the chip tester according to claim 5, characterized in that: The movable column (408) and the spring (304) are mutually adapted, one end of the movable column (408) away from the movable plate (407) is mutually adapted with the spiral pattern (305), and the movable column (408) passes through the semicircular plate (405).

8. The adjustment mechanism of the chip tester according to claim 7, characterized in that: The interior of the semicircular plate (405) is hollow, and the protective cover (406) movably connected to the outer ring surface of the semicircular plate (405) is made of rubber.

9. The adjustment mechanism of the chip tester according to claim 4, characterized in that: The first limiting block (403) and the arc-shaped limiting groove (306) are adapted to each other, and the first limiting block (403) and the arc-shaped limiting groove (306) are slidably connected.

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