Automatic detection device, system and method

Abstract

The invention provides an automatic detection device, an automatic detection system and an automatic detection method. The automatic detection device comprises a power supply detection module, a startup signal detection module and a function signal detection module, the power supply detection module is connected with a power supply pin of a to-be-detected chip and is used for detecting whether the power supply pin of the to-be-detected chip is normal or not; the power-on signal detection module is connected with a power-on signal pin of the to-be-detected chip and is used for detecting whether the power-on signal pin of the to-be-detected chip is normal or not; the function signal detection module is connected with a function signal pin of the to-be-detected chip and is used for detecting whether the function signal pin of the to-be-detected chip is normal or not. According to the invention, the to-be-detected chip can be detected, and when the to-be-detected chip has a problem, the to-be-detected chip can be quickly positioned to a problem point, so that the production efficiency is improved, and the maintenance cost is reduced.

Description

Technical Field

[0001] The present invention relates to the technical field of chip detection, and in particular to an automatic detection device, system and detection method. Background Art

[0002] South bridge chips based on Intel platforms usually use BGA packaging. At the same time, the number of pins of the south bridge chip is large, which makes it impossible to determine whether the function of the south bridge chip is normal through conventional means. Further, if an abnormality occurs during the production of the south bridge chip, it is impossible to quickly locate the abnormal point, which reduces the production speed and increases the maintenance cost. Summary of the invention

[0003] The present invention provides an automatic detection device, system and detection method, aiming to solve the problem that the abnormal point of the south bridge chip cannot be quickly located at present.

[0004] In the first aspect, the present invention provides an automatic detection device, which includes a power detection module, a power-on signal detection module and a function signal detection module; the power detection module is connected to the power pin of the chip to be tested, and is used to detect whether the power pin of the chip to be tested is normal; the power-on signal detection module is connected to the power-on signal pin of the chip to be tested, and is used to detect whether the power-on signal pin of the chip to be tested is normal; the function signal detection module is connected to the function signal pin of the chip to be tested, and is used to detect whether the function signal pin of the chip to be tested is normal.

[0005] Furthermore, the power supply detection module includes a first power supply detection circuit and a second power supply detection circuit; the first power supply detection circuit is connected to the first power supply pin of the chip to be tested, and is used to detect whether the first power supply pin is normal; the second power supply detection circuit is connected to the second power supply pin of the chip to be tested, and is used to detect whether the second power supply pin is normal.

[0006] Furthermore, the first power detection circuit includes a first comparator and a first indication circuit connected; the non-inverting input terminal of the first comparator is connected to the first power pin, the inverting input terminal of the first comparator is connected to a reference voltage, and the output terminal of the first comparator is connected to the first indication circuit.

[0007] Furthermore, the first indicating circuit includes a first switch circuit and a first light emitting diode, and the first switch circuit is connected to the first light emitting diode and an output end of the first comparator respectively.

[0008] Furthermore, the first switching circuit includes a first switching tube and a second switching tube; the controlled electrode of the first switching tube is connected to the output end of the first comparator, the first electrode of the first switching tube is connected to the power supply end, and the second electrode of the first switching tube is grounded; the controlled electrode of the second switching tube is connected to the power supply end, the first electrode of the second switching tube is connected to the first light-emitting diode, and the second electrode of the second switching tube is grounded.

[0009] Furthermore, the second power supply detection circuit includes a second comparator connected to a second indication circuit; the non-inverting input terminal of the second comparator is connected to the second power supply pin, the inverting input terminal of the second comparator is connected to a reference voltage, and the output terminal of the second comparator is connected to the second indication circuit.

[0010] Furthermore, the second indicating circuit includes a second switch circuit and a second light emitting diode, and the second switch circuit is connected to the second light emitting diode and an output end of the second comparator respectively.

[0011] Furthermore, the second switching circuit includes a third switching tube and a fourth switching tube; the controlled electrode of the third switching tube is connected to the output end of the second comparator, the first electrode of the third switching tube is connected to the power supply end, and the second electrode of the third switching tube is grounded; the controlled electrode of the fourth switching tube is connected to the power supply end, the first electrode of the fourth switching tube is connected to the second light-emitting diode, and the second electrode of the fourth switching tube is grounded.

[0012] In a second aspect, the present invention further provides an automatic detection system, which comprises a chip to be tested and any one of the automatic detection devices described above.

[0013] In a third aspect, the present invention further provides a detection method, the method comprising:

[0014] Detecting the power pin of the chip to be tested to confirm whether the chip to be tested passes the first test;

[0015] If the chip under test passes the first test, then testing the power-on signal pin of the chip under test to confirm whether the chip under test passes the second test;

[0016] If the chip under test passes the second test, testing the function signal pins of the chip under test to confirm whether the chip under test passes the third test;

[0017] If the chip under test passes the third test, it is confirmed that the chip under test is normal.

[0018] The invention discloses an automatic detection system and a detection method. The automatic detection system comprises an automatic detection device, which comprises a power detection module, a power-on signal detection module and a function signal detection module. The power detection module can be used to detect the power pin of a chip to be tested. After the power pin is detected, the power-on signal detection module is used to detect the power-on signal pin of the chip to be tested. After the power pin is detected, the function signal pin of the chip to be tested is finally detected by the function signal detection module. When the function signal pin is detected, it indicates that there is no abnormality in the chip to be tested. When the detection of any one of the above modules fails, the abnormal point of the chip to be tested can be confirmed according to the corresponding module, thereby improving production efficiency and reducing maintenance costs. BRIEF DESCRIPTION OF THE DRAWINGS

[0019] In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the accompanying drawings required for use in the description of the embodiments will be briefly introduced below. Obviously, the accompanying drawings described below are some embodiments of the present invention. For ordinary technicians in this field, other accompanying drawings can be obtained based on these accompanying drawings without paying any creative work.

[0020] Figure 1 is a block diagram of an automatic detection device provided by an embodiment of the present invention;

[0021] Figure 2 is a block diagram of an automatic detection device provided by another embodiment of the present invention;

[0022] Figure 3 is a circuit diagram of a first power supply detection circuit provided by an embodiment of the present invention;

[0023] Figure 4 is a circuit diagram of a second power supply detection circuit provided by an embodiment of the present invention;

[0024] Figure 5 It is a flow chart of a detection method provided by an embodiment of the present invention. DETAILED DESCRIPTION

[0025] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0026] It should be understood that when used in this specification and the appended claims, the terms "include" and "comprises" indicate the presence of described features, integers, operations, elements and / or components, but do not exclude the presence or addition of one or more other features, integers, operations, elements, components and / or groups thereof.

[0027] It should also be understood that the terms used in this specification of the present invention are only for the purpose of describing specific embodiments and are not intended to limit the present invention. As used in the specification of the present invention and the appended claims, the singular forms of "a", "an" and "the" are intended to include the plural forms unless the context clearly indicates otherwise. It should also be further understood that the term "and / or" used in the specification of the present invention and the appended claims refers to any combination of one or more of the associated listed items and all possible combinations, and includes these combinations.

[0028] In addition, the directional terms mentioned in the present invention, such as "upper", "lower", "front", "back", "left", "right", "inner", "outer", "side", etc., are only for reference to the directions of the attached drawings and the use status of the product. Therefore, the directional terms used are used to illustrate and understand the present invention, but not to limit the present invention. In addition, in the drawings, structures with similar or identical structures are represented by the same reference numerals.

[0029] See also Figures 1 to 4 , Figure 1 is a block diagram of an automatic detection device provided by an embodiment of the present invention; Figure 2 is a block diagram of an automatic detection device provided by another embodiment of the present invention; Figure 3 is a circuit diagram of a first power supply detection circuit provided by an embodiment of the present invention; Figure 4 FIG. 1 is a circuit diagram of a second power supply detection circuit provided by an embodiment of the present invention. Figure 1 As shown, the automatic detection device includes a power detection module, a power-on signal detection module and a function signal detection module; the power detection module is connected to the power pin of the chip to be tested, and is used to detect whether the power pin of the chip to be tested is normal; the power-on signal detection module is connected to the power-on signal pin of the chip to be tested, and is used to detect whether the power-on signal pin of the chip to be tested is normal; the function signal detection module is connected to the function signal pin of the chip to be tested, and is used to detect whether the function signal pin of the chip to be tested is normal.

[0030] Specifically, the automatic detection system may include a chip to be tested and an automatic detection device, and the chip to be tested may be any series of south bridge chips. The south bridge chip is an integrated circuit chip on a computer motherboard, also known as an input / output (I / O) control chip or an I / O controller, which is generally located below the north bridge chip on the motherboard and near the PCI slot. The functions of the south bridge chip may include I / O interface management, storage management, network control, audio control, power management and expansion slot management. I / O interface management is used to manage and control various input / output interfaces on the motherboard, such as USB, SATA, PCI, PCIe, etc., and provide communication and data transmission interfaces with external devices. Storage control is used to manage and control storage devices on the motherboard, such as hard disk drives, optical drives and flash memory devices, etc., and provide storage device interface and control functions to read and write data. Network control manages and controls the network connection of the computer system and handles network communication tasks, including receiving and sending data. Audio control is used to process the audio input and output of the computer system and provide audio interface and audio encoding and decoding functions. Power control is responsible for the power management function of the computer system, and can monitor and control the power supply, and cooperate with the operating system to implement power management strategies to save energy and extend battery life. Expansion slot management is used to manage and control expansion slots on the motherboard, such as PCI slots and PCIe slots.

[0031] The automatic detection device may include multiple detection modules, including a power detection module, a power-on signal detection module, and a function signal detection module. The power detection module is connected to the power pin of the chip to be tested, and is used to detect whether the power pin is normal. The power-on signal detection module is connected to the power-on signal pin of the chip to be tested, and is used to detect whether the power-on signal pin is normal. The function signal detection module is connected to the function signal pin of the chip to be tested, and is used to detect whether the function signal pin is normal. It is understandable that the power detection module, the power-on signal detection module, and the function signal detection module may include multiple detection circuits for connecting to different pins of the chip to be tested, and the specific number thereof is related to the number of pins of the chip to be tested. For example, if a chip has two power pins, the power detection module may include two detection circuits, and one detection circuit is connected to one power pin.

[0032] In actual use, the automatic detection device provided by the present invention may also include a card holder, each interface of the card holder is connected to each detection module of the automatic detection device, when it is necessary to detect the chip to be tested, the chip to be tested is inserted into the card holder, so that the chip to be tested is connected with the power detection module, the power-on signal detection module and the function signal detection module, and the automatic detection device starts to detect the chip to be tested according to a predetermined program. During the detection, the power pin of the chip to be tested can be detected by the power detection module first, and it can be confirmed whether there is a problem with the power pin according to the prompt information sent by the power detection module. For example, it can be prompted by an indicator light or a sound. Taking the indicator light as an example, when there is no problem with the power pin, the power detection module sends a prompt of one color, and when there is a problem with the power pin, the power detection module sends a prompt of another color, or, when there is no problem with the power pin, the power detection module sends a prompt of one color, and when there is a problem with the power pin, the power detection module does not indicate. When the power detection module detects that there is a problem with the chip under test, it indicates that there is a problem with the power pin of the chip under test. The abnormal point can be quickly locked to the power pin. The user can remove the chip under test from the card holder and repair it. When the repair is completed, the chip under test can be inserted into the card holder again and the test can be restarted. After the chip under test passes the test of the power detection module, the power-on signal detection module detects the chip under test. The detection principle of the power-on signal detection module can refer to the aforementioned power detection module. After the chip under test passes the power-on signal detection module, the functional signal detection module detects the chip under test. When the chip under test passes the test of the functional signal detection module, it indicates that there is no problem with the chip under test and the next chip under test can be tested.

[0033] See also Figure 2 As a further embodiment, the power detection module includes a first power detection circuit and a second power detection circuit; the first power detection circuit is connected to the first power pin of the chip to be tested, and is used to detect whether the first power pin is normal; the second power detection circuit is connected to the second power pin of the chip to be tested, and is used to detect whether the second power pin is normal.

[0034] Among them, the chip to be tested generally includes two power pins, namely a 1.8V power pin and a 3.3V power pin, and a first power detection circuit and a second power detection circuit can be provided accordingly. The first power detection circuit is connected to the first power pin, and the second power detection circuit is connected to the second power pin. The first power pin corresponds to the 1.8V power pin, and the second power pin corresponds to the 3.3V power pin.

[0035] During detection, the first power detection circuit and the second power detection circuit can detect their corresponding power pins simultaneously, or can detect them one after another. Preferably, the first power detection circuit and the second power detection circuit detect their connected power pins simultaneously.

[0036] See also Figure 3 As a further embodiment, the first power detection circuit includes a first comparator connected to a first indication circuit; the non-inverting input of the first comparator is connected to the first power pin, the inverting input of the first comparator is connected to a reference voltage, and the output of the first comparator is connected to the first indication circuit. Further, the first indication circuit includes a first switch circuit and a first light-emitting diode, and the first switch circuit is respectively connected to the first light-emitting diode and the output of the first comparator. Further, the first switch circuit includes a first switch tube and a second switch tube; the controlled electrode of the first switch tube is connected to the output of the first comparator, the first electrode of the first switch tube is connected to the power supply end, and the second electrode of the first switch tube is grounded; the controlled electrode of the second switch tube is connected to the power supply end, the first electrode of the second switch tube is connected to the first light-emitting diode, and the second electrode of the second switch tube is grounded.

[0037] The first power detection circuit may include a first comparator and a first indication circuit, the first indication circuit may include a first switch circuit and a first light emitting diode, it is understandable that the first light emitting diode may also be a buzzer, which may be specifically set according to actual conditions. The first switch circuit may include a first switch tube and a second switch tube.

[0038] The non-inverting input terminal of the first comparator is connected to the first power supply pin, the inverting input terminal of the first comparator is connected to the reference voltage, the output terminal of the first comparator is connected to the controlled electrode of the first switch tube, the first electrode of the first switch tube and the controlled electrode of the second switch tube are connected to the power supply terminal, the second electrode of the first switch tube and the second electrode of the second switch tube are grounded, and the first electrode of the second switch tube is connected to the first light-emitting diode.

[0039] In actual use, the supply voltage of the first power supply pin can be 1.8V, and the reference voltage of the first comparator can be 1.72V. When the voltage of the in-phase input terminal of the first comparator is higher than the reference voltage, the first comparator outputs a high level. The high level output by the first comparator pulls up the voltage of the controlled electrode of the first switch tube after passing through the fourth resistor R4. The first switch tube is turned on, and the voltage of the controlled electrode of the second switch tube is pulled down. The first electrode of the second switch tube outputs a high level, and the first light-emitting diode is turned on, indicating that the first power supply pin is normal. When the voltage of the in-phase input terminal of the first comparator is lower than the reference voltage, the first comparator outputs a low level. The low level output by the first comparator pulls down the voltage of the controlled electrode of the first switch tube after passing through the fourth resistor R4. The first switch tube is turned off, and the voltage of the controlled electrode of the second switch tube is pulled up. The first electrode of the second switch tube outputs a low level, and the first light-emitting diode is turned off, indicating that the first power supply pin is abnormal.

[0040] See also Figure 4 As a further embodiment, the second power supply detection circuit includes a second comparator connected to a second indication circuit; the non-inverting input of the second comparator is connected to the second power supply pin, the inverting input of the second comparator is connected to the reference voltage, and the output of the second comparator is connected to the second indication circuit. Further, the second indication circuit includes a second switch circuit and a second light-emitting diode, and the second switch circuit is respectively connected to the second light-emitting diode and the output of the second comparator. Further, the second switch circuit includes a third switch tube and a fourth switch tube; the controlled electrode of the third switch tube is connected to the output of the second comparator, the first electrode of the third switch tube is connected to the power supply end, and the second electrode of the third switch tube is grounded; the controlled electrode of the fourth switch tube is connected to the power supply end, the first electrode of the fourth switch tube is connected to the second light-emitting diode, and the second electrode of the fourth switch tube is grounded.

[0041] Among them, the circuit structure of the second power supply detection circuit is the same as that of the first power supply detection circuit, and the difference is that the pin connected to the in-phase input terminal of the second comparator of the second power supply detection circuit is different, and the reference voltage of the inverting input terminal of the corresponding second comparator is also different. For example, the supply voltage of the second power supply pin can be 3.3V, and the reference voltage of the inverting input terminal of the second comparator can be 3.15V. When the voltage of the in-phase input terminal of the second comparator is higher than the reference voltage, the second comparator outputs a high level, and the high level output by the second comparator pulls up the voltage of the controlled electrode of the third switch tube after passing through the fourth resistor R10, and the third switch tube is turned on, then the voltage of the controlled electrode of the fourth switch tube is pulled down, and the first electrode of the fourth switch tube outputs a high level, and the second light-emitting diode is turned on, indicating that the second power supply pin is normal. When the voltage at the non-inverting input terminal of the second comparator is lower than the reference voltage, the second comparator outputs a low level. The low level output by the second comparator pulls down the voltage of the controlled electrode of the third switch tube after passing through the fourth resistor R10. The third switch tube is turned off, and the voltage of the controlled electrode of the fourth switch tube is pulled up. The first electrode of the fourth switch tube outputs a low level, and the second light-emitting diode is disconnected, indicating that the second power supply pin is abnormal.

[0042] The specific circuit structure of the power-on signal detection module and the function signal detection module can refer to the circuit structure of the power detection module. The difference lies in the different connected pins and reference voltages, which will not be repeated here.

[0043] The present invention also provides an automatic detection system, which includes a chip to be tested and an automatic detection device described in any one of the above embodiments; the automatic detection device includes a power detection module, a power-on signal detection module and a function signal detection module; the power detection module is connected to the power pin of the chip to be tested, and is used to detect whether the power pin of the chip to be tested is normal; the power-on signal detection module is connected to the power-on signal pin of the chip to be tested, and is used to detect whether the power-on signal pin of the chip to be tested is normal; the function signal detection module is connected to the function signal pin of the chip to be tested, and is used to detect whether the function signal pin of the chip to be tested is normal.

[0044] Specifically, the automatic detection system may include a chip to be tested and an automatic detection device, and the chip to be tested may be any series of south bridge chips. The south bridge chip is an integrated circuit chip on a computer motherboard, also known as an input / output (I / O) control chip or an I / O controller, which is generally located below the north bridge chip on the motherboard and near the PCI slot. The functions of the south bridge chip may include I / O interface management, storage management, network control, audio control, power management and expansion slot management. I / O interface management is used to manage and control various input / output interfaces on the motherboard, such as USB, SATA, PCI, PCIe, etc., and provide communication and data transmission interfaces with external devices. Storage control is used to manage and control storage devices on the motherboard, such as hard disk drives, optical drives and flash memory devices, etc., and provide storage device interface and control functions to read and write data. Network control manages and controls the network connection of the computer system and handles network communication tasks, including receiving and sending data. Audio control is used to process the audio input and output of the computer system and provide audio interface and audio encoding and decoding functions. Power control is responsible for the power management function of the computer system, and can monitor and control the power supply, and cooperate with the operating system to implement power management strategies to save energy and extend battery life. Expansion slot management is used to manage and control expansion slots on the motherboard, such as PCI slots and PCIe slots.

[0045] The automatic detection device may include multiple detection modules, including a power detection module, a power-on signal detection module, and a function signal detection module. The power detection module is connected to the power pin of the chip to be tested, and is used to detect whether the power pin is normal. The power-on signal detection module is connected to the power-on signal pin of the chip to be tested, and is used to detect whether the power-on signal pin is normal. The function signal detection module is connected to the function signal pin of the chip to be tested, and is used to detect whether the function signal pin is normal. It is understandable that the power detection module, the power-on signal detection module, and the function signal detection module may include multiple detection circuits for connecting to different pins of the chip to be tested, and the specific number thereof is related to the number of pins of the chip to be tested. For example, if a chip has two power pins, the power detection module may include two detection circuits, and one detection circuit is connected to one power pin.

[0046] In actual use, the automatic detection device provided by the present invention may also include a card holder, each interface of the card holder is connected to each detection module of the automatic detection device, when it is necessary to detect the chip to be tested, the chip to be tested is inserted into the card holder, so that the chip to be tested is connected with the power detection module, the power-on signal detection module and the function signal detection module, and the automatic detection device starts to detect the chip to be tested according to a predetermined program. During the detection, the power pin of the chip to be tested can be detected by the power detection module first, and it can be confirmed whether there is a problem with the power pin according to the prompt information sent by the power detection module. For example, it can be prompted by an indicator light or a sound. Taking the indicator light as an example, when there is no problem with the power pin, the power detection module sends a prompt of one color, and when there is a problem with the power pin, the power detection module sends a prompt of another color, or, when there is no problem with the power pin, the power detection module sends a prompt of one color, and when there is a problem with the power pin, the power detection module does not indicate. When the power detection module detects that there is a problem with the chip under test, it indicates that there is a problem with the power pin of the chip under test. The abnormal point can be quickly locked to the power pin. The user can remove the chip under test from the card holder and repair it. When the repair is completed, the chip under test can be inserted into the card holder again and the test can be restarted. After the chip under test passes the test of the power detection module, the power-on signal detection module detects the chip under test. The detection principle of the power-on signal detection module can refer to the aforementioned power detection module. After the chip under test passes the power-on signal detection module, the functional signal detection module detects the chip under test. When the chip under test passes the test of the functional signal detection module, it indicates that there is no problem with the chip under test and the next chip under test can be tested.

[0047] See also Figure 5 The present invention also provides a detection method, which is used to detect a chip to be tested to confirm whether the chip to be tested has an abnormality. The detection method includes steps S110-S140.

[0048] S110, testing the power pins of the chip to be tested to confirm whether the chip to be tested passes a first test.

[0049] In an embodiment of the present invention, the chip to be tested may be any series in the south bridge chip series. When the chip to be tested is tested, different pins of the chip to be tested may be tested in sequence. Preferably, the power pin of the chip to be tested may be tested first to confirm whether there is a problem with the power pin of the chip to be tested. When there is a problem with the power pin, an output signal reminds the user that there is a problem with the power pin of the chip to be tested. When there is no problem with the power pin, an output signal reminds the user that the power pin of the chip to be tested is normal and the next test may be performed. It is understandable that the signal indicating that there is a problem with the power pin is different from the signal indicating that there is no problem with the power pin. For example, the signal indicating that there is a problem with the power pin may be a red light, and the signal indicating that there is no problem with the power pin may be a green light, or the signal indicating that there is a problem with the power pin may be no light, and the light indicating that there is no problem with the power pin may be on, or the signal indicating that there is a problem with the power pin may be a whistle, and the whistle does not sound if there is no problem with the power pin.

[0050] S120: If the chip under test passes the first test, a power-on signal pin of the chip under test is tested to confirm whether the chip under test passes the second test.

[0051] In the embodiment of the present invention, when the chip under test passes the first test, the second test is performed on the chip under test, that is, the power-on signal pin of the chip under test is tested. When all the power-on signal pins of the chip under test pass the test, the chip under test is deemed to have passed the second test, and when any power-on signal pin fails the test, a corresponding signal is output to remind the user that there is a problem with the power-on signal pin of the chip under test.

[0052] S130: If the chip under test passes the second test, then test the functional signal pins of the chip under test to confirm whether the chip under test passes the third test.

[0053] In the embodiment of the present invention, when the chip to be tested passes the second test, the third test is performed on the chip to be tested, that is, the functional signal pins of the chip to be tested are tested. When all the functional signal pins of the chip to be tested pass the test, the chip to be tested is deemed to have passed the third test, and when any functional signal pin fails the test, a corresponding signal is output to remind the user that there is a problem with the functional signal pin of the chip to be tested.

[0054] S140: If the chip under test passes the third test, it is confirmed that the chip under test is normal.

[0055] In the embodiment of the present invention, when the chip to be tested passes the third test, that is, the chip to be tested passes all tests, and there is no abnormality in the chip to be tested, the next chip to be tested can be tested.

[0056] The automatic detection device, system and detection method disclosed in the present invention can respectively detect the power pins, power-on signal pins and function signal pins of the chip to be tested. When there is a problem with the chip to be tested, the problem point can be quickly located, thereby improving production efficiency and reducing maintenance costs.

[0057] The above is only a specific embodiment of the present invention, but the protection scope of the present invention is not limited thereto. Any technician familiar with the technical field can easily think of various equivalent modifications or replacements within the technical scope disclosed by the present invention, and these modifications or replacements should be included in the protection scope of the present invention. Therefore, the protection scope of the present invention shall be based on the protection scope of the claims.

Claims

1. An automatic detection device, characterized in that: Applied to an automatic detection system, the automatic detection device comprises: A power detection module, which is connected to the power pin of the chip to be tested and is used to detect whether the power pin of the chip to be tested is normal; A power-on signal detection module, which is connected to the power-on signal pin of the chip to be tested and is used to detect whether the power-on signal pin of the chip to be tested is normal; A function signal detection module is connected to the function signal pin of the chip to be tested and is used to detect whether the function signal pin of the chip to be tested is normal.

2. The automatic detection device according to claim 1, characterized in that: The power detection module includes a first power detection circuit and a second power detection circuit; The first power detection circuit is connected to the first power pin of the chip to be tested, and is used to detect whether the first power pin is normal; The second power detection circuit is connected to the second power pin of the chip to be tested, and is used to detect whether the second power pin is normal.

3. The automatic detection device according to claim 2, characterized in that: The first power supply detection circuit includes a first comparator connected to a first indication circuit; The non-inverting input terminal of the first comparator is connected to the first power supply pin, the inverting input terminal of the first comparator is connected to a reference voltage, and the output terminal of the first comparator is connected to the first indication circuit.

4. The automatic detection device according to claim 3, characterized in that: The first indicating circuit includes a first switch circuit and a first light emitting diode, and the first switch circuit is connected to the first light emitting diode and an output end of the first comparator respectively.

5. The automatic detection device according to claim 4, characterized in that: The first switch circuit includes a first switch tube and a second switch tube; The controlled electrode of the first switch tube is connected to the output end of the first comparator, the first electrode of the first switch tube is connected to the power supply end, and the second electrode of the first switch tube is grounded; A controlled electrode of the second switch tube is connected to the power supply end, a first electrode of the second switch tube is connected to the first light emitting diode, and a second electrode of the second switch tube is grounded.

6. The automatic detection device according to claim 2, characterized in that: The second power supply detection circuit includes a second comparator connected to a second indication circuit; The non-inverting input terminal of the second comparator is connected to the second power supply pin, the inverting input terminal of the second comparator is connected to a reference voltage, and the output terminal of the second comparator is connected to the second indication circuit.

7. The automatic detection device according to claim 6, characterized in that: The second indicating circuit includes a second switch circuit and a second light emitting diode, and the second switch circuit is connected to the second light emitting diode and the output end of the second comparator respectively.

8. The automatic detection device according to claim 7, characterized in that: The second switch circuit includes a third switch tube and a fourth switch tube; The controlled electrode of the third switch tube is connected to the output end of the second comparator, the first electrode of the third switch tube is connected to the power supply end, and the second electrode of the third switch tube is grounded; A controlled electrode of the fourth switch tube is connected to the power supply end, a first electrode of the fourth switch tube is connected to the second light emitting diode, and a second electrode of the fourth switch tube is grounded.

9. An automatic detection system, characterized in that: The invention comprises a chip to be tested and an automatic detection device as described in any one of claims 1 to 8.

10. A detection method, characterized in that: The method comprises: Detecting the power pin of the chip to be tested to confirm whether the chip to be tested passes the first test; If the chip under test passes the first test, then testing the power-on signal pin of the chip under test to confirm whether the chip under test passes the second test; If the chip under test passes the second test, testing the function signal pins of the chip under test to confirm whether the chip under test passes the third test; If the chip under test passes the third test, it is confirmed that the chip under test is normal.

Images