Method and device for generating testability design script, electronic equipment and storage medium

Abstract

The invention provides a method and a device for generating testability design scripts, electronic equipment and a storage medium, and belongs to the technical field of testability design, the method comprises the following steps: determining a test technology of a to-be-tested target according to test technology indication information in to-be-tested demand parameters; according to the test technology of the to-be-tested target and to-be-tested target information in the to-be-tested demand parameters, script design information is determined; and according to the script design information, generating an automatic script file for testing the to-be-tested target. The test script for the chip hardware circuit can be automatically generated.

Description

Technical Field

[0001] The present disclosure relates to the technical field of design for testability, and in particular to a method, device, electronic device and storage medium for generating a design for testability script. Background Art

[0002] With the continuous increase in chip scale and the continuous advancement of process technology, chip testability design (Design For Test, DFT) is crucial to chip manufacturing and quality assurance. This technology introduces specific logic and structure in the chip design stage to effectively test the chip after chip manufacturing and check the chip manufacturing defects.

[0003] The implementation of the existing DFT full process relies on automated testing tools, such as Electronic Design Automation (EDA) tools. The use of these automated testing tools requires DFT engineers to gradually write customized script processes according to needs, and use these scripts to complete the insertion, verification, timing convergence and final testing of DFT intellectual property cores (IP).

[0004] However, manually writing scripts in the DFT process takes a lot of time and reduces development efficiency. Summary of the invention

[0005] The present disclosure provides a method, device, electronic device and storage medium for generating a design for testability script, which can automatically generate a test script for a chip hardware circuit.

[0006] The technical solution of the present disclosure is achieved as follows: In a first aspect, the present disclosure provides a method for generating a testability design script, the method comprising: determining the test technology of the target to be tested according to the test technology indication information in the test requirement parameters; determining the script design information according to the test technology of the test target and the target information to be tested in the test requirement parameters; generating an automated script file for testing the target to be tested according to the script design information. In this way, the user only needs to provide the test requirement parameters, and the automated script file for testing the target to be tested is automatically generated according to the test requirement parameters. Compared with manually generating automated script files, human errors can be reduced, accuracy can be improved, and the time for manually writing test scripts can be reduced, thereby improving test efficiency.

[0007] In some embodiments of the present disclosure, an automated script file for testing a target to be tested is generated based on script design information, including: parsing variable information, import files, initialization environment information, constraint setting information, testability design specification file information, test vector information, and simulation tool information from the script design information; and generating an automated script file based on the variable information, import files, initialization environment information, constraint setting information, testability design specification file information, test vector information, and simulation tool information. In this embodiment, by integrating variable information, import files, initialization environment information, constraint setting information, testability design specification file information, test vector information, and simulation tool information, while ensuring automatic generation of script files, a variety of test factors can be comprehensively considered to ensure the comprehensiveness and accuracy of the test.

[0008] In some embodiments, before generating an automated script file for testing the target to be tested according to the script design information, the method further includes: parsing the target automated test tool from the script design information; generating an automated script file for testing the target to be tested according to the script design information, including: generating an automated script file matching the target automated test tool according to the script design information. In this embodiment, by parsing the script design information to determine the target automated test tool, a script file compatible with a specific test tool can be generated to ensure the smooth progress of the test process; since the script file is customized for a specific test tool, the workload required for manual adjustment and adaptation is reduced, further improving the test efficiency.

[0009] In some embodiments, the script design information includes: manufacturing information and test information of the target to be tested. According to the test technology of the test target and the target information to be tested in the test requirement parameters, the script design information is determined, including: obtaining the manufacturing information of the target to be tested according to the target information to be tested; obtaining the test information according to the test technology of the test target and the target information to be tested. In this embodiment, obtaining the manufacturing information and the test information can not only reduce the amount of data in the subsequent parsing process, thereby improving the test efficiency, but also the target information to be tested can include different data as needed, and the user can flexibly select the input target information to be tested, thereby improving the user experience.

[0010] In some embodiments, the test technology of the target to be tested is determined according to the test technology indication information in the requirement parameters to be tested, including: according to the selection mark of the test technology, the test technology whose value is the selected value is determined as the test technology of the target to be tested. In this embodiment, the test technology indication information includes a selection mark indicating whether the test technology is selected, that is, for any test technology selected by the user, only the value corresponding to the selection mark of the test technology needs to be changed in the requirement parameters to be tested, and the rewriting of the requirement parameters to be tested is less, and the parsing logic remains unchanged, and the test technology whose value is the selected value is determined as the test technology of the target to be tested, and the parsing process is fixed, so that the entire test process is more time-saving.

[0011] In some embodiments, the script design information is determined according to the test technology of the target to be tested and the target information in the test requirement parameters, including: obtaining initial script design information according to the test technology of the target to be tested and the target information in the test requirement parameters; converting the initial script design information into script design information in a key-value format. In this embodiment, the obtained initial script design information is stored in a key-value format, so that it can be quickly retrieved in the process of generating an automated script file for testing the target to be tested according to the script design information, and the data processing speed is fast, thereby further improving the efficiency of script generation and shortening the test cycle.

[0012] In some embodiments of the present disclosure, before determining the test technology of the target to be tested according to the test technology indication information in the test demand parameter to be tested, the method further includes: receiving the test demand parameter to be tested input by the user on the graphical user interface. In this way, the user can fill in the test demand parameter through the graphical user interface, which simplifies the information input process. According to the prompt information on the graphical user interface, non-professionals can also perform input operations according to the instructions, which simplifies the process of generating an automated script file.

[0013] In a second aspect, the present disclosure provides a device for generating a testability design script, the device comprising: a determination part and a generation part; the determination part is configured to determine the test technology of the target to be tested according to the test technology indication information in the requirement parameters to be tested; the determination part is also configured to determine the script design information according to the test technology of the target to be tested and the target to be tested information in the requirement parameters to be tested; the generation part is configured to generate an automated script file for testing the target to be tested according to the script design information.

[0014] In a third aspect, the present disclosure provides an electronic device comprising a processor, a memory, and a program or instruction stored in the memory and executable on the processor, wherein the program or instruction, when executed by the processor, implements the steps of the method for generating a testability design script as described in the first aspect.

[0015] In a fourth aspect, the present disclosure provides a computer-readable storage medium storing a program or instruction, which, when executed by a processor, implements the steps of the method for generating a testability design script as described in the first aspect.

[0016] In a fifth aspect, the present disclosure provides a computer program product, wherein the computer program product includes a computer program or instructions. When the computer program product runs on a processor, the processor executes the computer program or instructions to implement the steps of the method for generating a testability design script as described in the first aspect.

[0017] In a sixth aspect, the present disclosure provides a chip, comprising a processor and a communication interface, wherein the communication interface is coupled to the processor, and the processor is used to run a program or instruction to implement the method for generating a testability design script as described in the first aspect.

[0018] The present disclosure provides a method for generating a testability design script, the method comprising: determining the test technology of the target to be tested according to the test technology indication information in the test requirement parameters; determining the script design information according to the test technology of the target to be tested and the target information in the test requirement parameters; generating an automated script file for testing the target to be tested according to the script design information. In this way, the user only needs to provide the test requirement parameters, and the automated script file for testing the target to be tested is automatically generated according to the test requirement parameters. Compared with manually generating automated script files, human errors can be reduced, accuracy can be improved, and the time for manually writing test scripts can be reduced, thereby improving test efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0019] Figure 1 A schematic diagram of an exemplary system architecture provided for the present disclosure; Figure 2 One of the flowcharts of the method for generating a design for testability script provided by the present disclosure; Figure 3 A second flowchart of the method for generating a design for testability script provided by the present disclosure; Figure 4 A third flowchart of the method for generating a design for testability script provided by the present disclosure; Figure 5 A fourth flowchart of the method for generating a design for testability script provided by the present disclosure; Figure 6 A schematic diagram of a graphical user interface provided by the present disclosure; Figure 7 A structural block diagram of a device for generating a design for testability script provided by the present disclosure; Figure 8A schematic diagram of the hardware structure of an electronic device provided by the present invention. DETAILED DESCRIPTION

[0020] The following will be combined with the drawings in the present disclosure to clearly describe the technical solutions in the embodiments of the present application. Obviously, the described embodiments are part of the embodiments of the present application, rather than all of the embodiments. All other embodiments obtained by ordinary technicians in this field based on the embodiments in the present application belong to the scope of protection of the present application.

[0021] The present invention provides a method for generating a testability design script. Figure 1 A schematic diagram of a system architecture that can implement the method for generating a design for testability script is shown, and the system architecture 100 may include a terminal 110 and a server 120. The terminal 110 may be a terminal device such as a smart phone, a tablet computer, a desktop computer, a laptop computer, etc. The server 120 generally refers to a background system that provides the generation of a design for testability script in this exemplary embodiment, and may be a server or a cluster formed by multiple servers. The terminal 110 and the server 120 may be connected via a wired or wireless communication link to perform data exchange.

[0022] In one implementation, the method for generating the testability design script may be performed by the terminal 110. For example, a user uses the terminal 110 to import the requirement parameters to be tested or the user inputs the requirement parameters to be tested on the graphical user interface of the terminal 110, and the terminal 110 determines the test technology of the target to be tested according to the test technology indication information in the requirement parameters to be tested; determines the script design information according to the test technology of the target to be tested and the target information to be tested in the requirement parameters to be tested; and generates an automated script file for testing the target to be tested according to the script design information.

[0023] In one embodiment, the method for generating the testability design script can be executed by the server 120. For example, after the user uses the terminal 110 to import the demand parameters to be tested or the user inputs the demand parameters to be tested on the graphical user interface of the terminal 110, the terminal 110 uploads the demand parameters to be tested to the server 120, and the server 120 determines the test technology of the target to be tested according to the test technology indication information in the demand parameters to be tested; determines the script design information according to the test technology of the target to be tested and the target information to be tested in the demand parameters to be tested; generates an automation script file for testing the target to be tested according to the script design information, and returns the automation script file to the terminal 110.

[0024] As can be seen from the above, the execution subject of the method for generating a design for testability script in this exemplary embodiment may be the terminal 110 or the server 120 , which is not limited in the present disclosure.

[0025] The method for generating a design for testability script provided by the present disclosure is described in detail below through specific embodiments in conjunction with the accompanying drawings.

[0026] like Figure 2 As shown, the present disclosure provides a method for generating a design for testability script, which may include the following steps S201 to S203.

[0027] In step S201, the test technology of the target to be tested is determined according to the test technology indication information in the requirement parameter to be tested.

[0028] The requirement parameters to be tested are used to indicate the requirement parameters that the DFT test of the target to be tested depends on, including: information of the target to be tested, test technology, etc.

[0029] Test technology is used to indicate the test logic inserted into the chip during the chip design phase. Different test technologies add different test logic during the chip design phase. Test technologies include: Boundary Scan (BSCAN), Memory Build in Self Test (MBIST), and Logic Test (LTEST). The target information to be tested is used to indicate the manufacturing information of the target to be tested during the production process, as well as the test information relied on when testing with different test technologies. The target information to be tested can be the identification of the target to be tested, the manufacturing information corresponding to the target to be tested, the storage path of the manufacturing information corresponding to the target to be tested, test information, etc.

[0030] Among them, BSCAN mainly tests the input and output ports of the chip. Its principle is to add a register to the input and output ports of the core logic circuit. By connecting the registers on these input and output ports, the data can be serially input into the unit under test and serially read out from the corresponding port to achieve testing; MBIST mainly tests the memory. Its principle is to embed some special test circuits in the memory during chip design for self-checking and testing. These test circuits can test all cells in the memory through specific test modes to detect whether there are faults or defects in them; LTEST mainly targets the logic circuits inside the chip. It uses scan testing and automatic generation of test vector technology to test the logic units in the standard cell library.

[0031] The test technology indication information is used to indicate which test technology is used to test the target to be tested. According to the target to be tested indication information, it is determined that the test technology used for the target to be tested is at least one of BSCAN, MBIST and LTEST.

[0032] In step S202, the script design information is determined according to the test technology of the target to be tested and the target information in the requirement parameters to be tested.

[0033] The script design information is used to indicate the various parameters and settings required for the DFT test of the target under test through the test technology of the target under test, including: manufacturing information during the production and manufacturing process of the target under test and test information related to the test technology. The manufacturing information includes: design information (such as layout, wiring information, specification parameter information, etc.) of the target under test from planning to production, library files (such as physical library, timing library, etc.), clock information, pin constraint information, redirection information, etc. The test information includes: description language information used in the test, port information available for DFT, configuration information of embedded deterministic test (Electronic Design Transformation, EDT), MBIST information corresponding to MBIST, BSCAN information corresponding to BSCAN, LTEST information corresponding to LTEST, etc.

[0034] The data in the script design information is stored according to the correspondence between keywords and information, such as key-value format, dictionary, etc.

[0035] In step S203, an automation script file for testing the target to be tested is generated according to the script design information.

[0036] The automation script file is composed of multiple commands. The test of the target to be tested can be completed by executing each command in sequence. According to the script design information, an automation script file for testing the target to be tested is generated, that is, a set of commands is generated. Each command depends on different information for execution. According to the commands to be generated, the corresponding information is retrieved from the script design information according to the keywords, and then the commands are generated according to the retrieved information through programming logic.

[0037] After the automation script file is generated, the script is executed, that is, the automation test tool is controlled to perform testing according to the commands in the script, and hardware test circuits and test vectors are generated. The simulation tool performs simulation according to the commands in the script. The simulation process is to input test vectors into the hardware test circuit to ultimately test the hardware circuit on the chip.

[0038] In this way, the user only needs to provide the test requirement parameters, and the automated script file for testing the target to be tested will be automatically generated according to the test requirement parameters. Compared with manually generating automated script files, it can reduce human errors, improve accuracy, and reduce the time of manually writing test scripts, thereby improving testing efficiency.

[0039] In some embodiments of the present disclosure, Figure 2 ,like Figure 3As shown, the above step S203 generates an automation script file for testing the target to be tested according to the script design information, which can be specifically implemented through the following steps S203a and S203b.

[0040] In step S203a, variable information, import files, initialization environment information, constraint setting information, testability design specification file information, test vector information and simulation tool information are parsed from the script design information.

[0041] Variable information refers to the information of the container used to store data, including the variable name, data type, scope, design name, design identification code, library file path, etc.; import file refers to the description and design of the behavior and structure of digital circuits, such as the connection method and behavior of logic circuits, the declaration and behavior description of registers and memories, etc. The import file can use different design languages ​​​​(i.e. hardware description languages ​​​​), such as Verilog and VHDL; initialization environment information refers to the environment and configuration in which the script is running, such as the operating system, programming language, and environment variables that the script depends on; constraint setting information refers to the information used to define test timing parameters and signal properties, such as: clock cycle, input delay, bidirectional port delay, probe time and probe width, etc.; the specification document information of testability design refers to a series of standards and guidelines formulated during the design phase to improve the testability of the product, such as: design requirements, test methods, test processes, test interface definitions, test signal timing and characteristics, etc.; test vector information refers to a set of specific input signal sequences used to stimulate specific fault modes in integrated circuits so as to detect these faults during the test process. The test vector includes input stimulus and expected response, usually expressed in binary form, and is directly associated with the logic or function of the circuit; simulation tool information is used to indicate the simulation tool used, such as: VCS.

[0042] Specifically, variable information of the target to be tested is extracted from the design information and library file information; initialization environment information is extracted from the design file; constraint setting information is extracted from the test technology information (such as BSCAN information, MBIST information and LTEST information) and pin constraint information corresponding to the test technology; import files are extracted from the design information; DFT specification files are extracted from the test information or DFT specification files are created; test vector information is extracted from the test technology information corresponding to the test technology; and simulation tool information is extracted from the test information.

[0043] In step S203b, an automation script file is generated according to variable information, import files, initialization environment information, constraint setting information, testability design specification file information, test vector information and simulation tool information.

[0044] The automation script file includes multiple commands. Depending on the automation test tool used, the syntax rules of the commands in the generated automation script file are different. Variable setting commands are generated according to variable information, file import commands are generated according to import files, environment initialization commands are generated according to initialization environment information, constraint setting commands are generated according to constraint setting information, commands for importing or creating DFT specification files are generated according to DFT specification file information, test vector generation commands are generated according to test vector information, and simulation commands are generated according to simulation tools.

[0045] In some embodiments, if the user needs log data during the test process in order to obtain detailed information on various faults tested during a test process, the test information may also include log requirement information for recording the test process, parse the log requirement information, obtain log output indication information for indicating which logs to output (such as clock information, DFT signal information, memory instance information, etc.), and generate corresponding automated testing tool commands based on the log output indication information.

[0046] In some embodiments, in order to reuse automation script files, the test data may also include an output path of the automation script file, parse the test data to obtain path information, and generate a command for an automation testing tool to store the automation script file in the path based on the path information.

[0047] In this embodiment, by integrating variable information, import files, initialization environment information, constraint setting information, testability design specification file information, test vector information and simulation tool information, while ensuring the automatic generation of script files, it is possible to comprehensively consider various testing factors to ensure the comprehensiveness and accuracy of the test.

[0048] In some embodiments of the present disclosure, Figure 2 ,like Figure 4 As shown, before the above step S203 generates an automation script file for testing the target to be tested according to the script design information, the method further includes the following step S204. The above step S203 can be specifically implemented by the following step S203c.

[0049] In step S204, the target automated testing tool is parsed from the script design information.

[0050] In step S203c, an automation script file matching the target automation testing tool is generated according to the script design information.

[0051] Since different test requirements may use different automated test tools, and different automated test tools may use different commands to achieve the same function, the syntax rules required to generate commands are also different. Therefore, in the present disclosure, according to the script design information and the target automated test tool used, the corresponding commands are generated according to the syntax rules of the target automated test tool.

[0052] An automation script file that matches the target automation testing tool is generated according to the script design information. Specifically, different script generation template engines are set for different automation testing tools. The corresponding script generation template engine is determined according to the target automation testing tool, and then the automation script file is generated through the template engine.

[0053] In this embodiment, by parsing the script design information to determine the target automated testing tool, a script file compatible with the specific testing tool can be generated to ensure the smooth progress of the testing process; since the script file is customized for the specific testing tool, the workload required for manual adjustment and adaptation is reduced, further improving the testing efficiency.

[0054] In some embodiments of the present disclosure, the script design information includes: manufacturing information and test information of the target to be tested. The above step S202 determines the script design information based on the test technology of the target to be tested and the target information to be tested in the test requirement parameters, including: obtaining the manufacturing information of the target to be tested based on the target information to be tested; obtaining the test information based on the test technology of the target to be tested and the target information to be tested.

[0055] The target information to be measured is used to indicate the manufacturing information of the target to be measured, and the target information to be measured includes at least one of the following: identification information of the target to be measured, storage path, and manufacturing information. For example: in one case, the target information to be measured includes the identification information of the target to be measured, and according to the identification information of the target to be measured, the storage path of the manufacturing information of the target to be measured is determined from the correspondence between the identification of the target to be measured and the storage path stored in advance, and the corresponding manufacturing information is obtained from the storage path; in another case, the target information to be measured includes the storage path of the manufacturing information of the target to be measured, and the corresponding manufacturing information is obtained from the storage path; in another case, the target information to be measured includes the manufacturing information, and the manufacturing information is directly obtained; in another case, the target information to be measured includes the storage path of part of the manufacturing information and part of the manufacturing information, and the part of the manufacturing information is obtained from the storage path and the part of the manufacturing information is obtained from the target information to be measured; in another case, the target information to be measured includes the identification information and part of the manufacturing information of the target to be measured, and according to the identification information of the target to be measured, the part of the manufacturing information is obtained from the corresponding storage path and the part of the manufacturing information is obtained from the target information to be measured.

[0056] The target information to be tested is also used to indicate the test information related to the test technology. According to the test technology of the target to be tested and the target information to be tested, the test information is obtained. In one case, the target information to be tested includes the storage path of the test information corresponding to each test technology, the storage path corresponding to the test technology of the target to be tested is determined from the target information to be tested, and the test information is obtained from the storage path; in another case, the target information to be tested includes the test information corresponding to each test technology, and the test information corresponding to the test technology of the target to be tested is obtained from the target information to be tested.

[0057] In this embodiment, obtaining manufacturing information and test information can not only reduce the amount of data in the subsequent analysis process, thereby improving test efficiency, but also the target information to be tested can include different data as needed, and the user can flexibly select the target information to be tested, thereby improving user experience.

[0058] In some embodiments of the present disclosure, the above-mentioned step S201 determines the test technology of the target to be tested according to the test technology indication information in the demand parameter to be tested, including: according to the selection identifier of the test technology, determining the test technology whose value is the selected value as the test technology of the target to be tested.

[0059] The test technology indication information is a selection mark for each test technology. If the value of the selection mark is a selected value (such as "1"), the test technology is determined to be the test technology of the target to be tested.

[0060] The demand parameters to be tested are also generated according to user requirements. If the user determines a test technology each time, a corresponding indication information indicating the test technology is generated. In the corresponding subsequent parsing process, the parsing logic needs to adapt to the parsing of the indication information corresponding to different test technologies, which increases the difficulty of parsing. In this embodiment, the test technology indication information includes a selection mark indicating whether the test technology is selected, that is, for any test technology selected by the user, only the value corresponding to the selection mark of the test technology needs to be changed in the demand parameters to be tested. There are fewer rewrites for the demand parameters to be tested, and the parsing logic remains unchanged. The test technology with the selected value of the selection mark is determined as the test technology of the target to be tested. The parsing process is fixed, which makes the entire test process more time-saving.

[0061] In some embodiments, the above-mentioned step S202 determines the script design information according to the test technology of the target to be tested and the target information to be tested in the requirement parameters to be tested, including: obtaining initial script design information according to the test technology of the target to be tested and the target information to be tested in the requirement parameters to be tested; converting the initial script design information into script design information in a key-value format.

[0062] Since data in key-value format can be directly accessed through keys, data reading and writing operations can be performed very quickly to achieve fast retrieval, and the key-value format allows the storage of any type of value, including simple strings, complex objects, binary data, etc. Therefore, the present disclosure stores the acquired initial script design information in a key-value format, so that in the process of generating an automated script file for testing the target to be tested according to the script design information, it can be quickly retrieved, and the data processing speed is fast, thereby further improving the efficiency of script generation and shortening the test cycle.

[0063] In some embodiments, in combination Figure 1 ,like Figure 5 As shown, before the above step S201 determines the test technology of the target to be tested according to the test technology indication information in the demand parameter to be tested, the method further includes the following step S205.

[0064] In step S205, the demand parameters to be tested input by the user on the graphical user interface are received.

[0065] Use software development kits to implement graphical user interfaces (GUIs), such as Python's standard GUI library, C++-based QT's standard GUI library under Linux, JavaFX, etc. to design GUIs. GUI controls include windows, text boxes, drop-down menus, check boxes, labels, sliders, lists, etc., which are used to collect user input.

[0066] For example, Figure 6 As shown, a graphical user interface provided by the present disclosure is shown. Taking the test technology and target information included in the test requirement parameters as an example, the target information includes: automated test tools, library files, always information, constraint information, design type (register transfer level (RTL) or netlist can be selected), design language (the hardware description language that can be selected includes Verilog or VDHL (Very HighSpeed ​​Integrated Circuit Hardware Description Language)), design level, design name and design information. After the user fills in the test requirement parameters, click the Start button to generate an automated script file and execute the script file for testing. If the Save button is clicked, the generated automated script file will be stored in the default path.

[0067] Through the graphical user interface, users can input or select the required parameters to be tested, such as test technology, clock information, etc. In this way, users can fill in the required parameters to be tested through the graphical user interface, which simplifies the information input process. According to the prompt information on the graphical user interface, non-professionals can also perform input operations according to the instructions, which simplifies the process of generating automated script files.

[0068] Based on the same concept as the above method for generating a design for testability script, the present disclosure also provides a device for generating a design for testability script. Figure 7 A structural block diagram of a device for generating a design for testability script shown in the present disclosure, such as Figure 7 As shown, the device for generating a testability design script includes: a determining part 701 and a generating part 702; the determining part 701 is configured to determine the test technology of the target to be tested according to the test technology indication information in the requirement parameters to be tested; the determining part 701 is also configured to determine the script design information according to the test technology of the target to be tested and the target information to be tested in the requirement parameters to be tested; the generating part 702 is configured to generate an automated script file for testing the target to be tested according to the script design information.

[0069] In some embodiments of the present disclosure, the generation part 702 is specifically configured to parse the script design information to obtain variable information, import files, initialization environment information, constraint setting information, testability design specification file information, test vector information and simulation tool information; and generate an automated script file based on the variable information, import files, initialization environment information, constraint setting information, testability design specification file information, test vector information and simulation tool information.

[0070] In some embodiments of the present disclosure, the device for generating a testability design script also includes: a parsing part, which is configured to parse the script design information to obtain a target automated testing tool before generating an automated script file for testing the target to be tested based on the script design information; the generating part 702 is specifically configured to generate an automated script file that matches the target automated testing tool based on the script design information.

[0071] In some embodiments of the present disclosure, the script design information includes: manufacturing information and test information of the target to be tested. The determination part 701 is specifically configured to obtain the manufacturing information of the target to be tested according to the target information to be tested; and to obtain the test information according to the test technology of the target to be tested and the target information to be tested.

[0072] In some embodiments of the present disclosure, the determining part 701 is specifically configured to determine, according to the selection identifier of the test technology, a test technology whose value of the selection identifier is the selected value as the test technology of the target to be tested.

[0073] In some embodiments of the present disclosure, the determination part 701 is specifically configured to obtain initial script design information according to the test technology of the test target and the target information to be tested in the test requirement parameters; and convert the initial script design information into script design information in a key-value format.

[0074] In some embodiments of the present disclosure, the device for generating a testability design script also includes: a receiving part, which is configured to receive the test requirement parameters to be tested input by a user on a graphical user interface before determining the test technology of the target to be tested based on the test technology indication information in the test requirement parameters to be tested.

[0075] It should be noted that the above-mentioned device for generating a testability design script may be the electronic device in the above-mentioned method embodiment of the present application, or it may be a functional module and / or functional entity in the electronic device that can implement the functions of the device embodiment, and the embodiments of the present application are not limited thereto.

[0076] In the embodiment of the present application, each module can implement the device method for generating a testability design script provided in the above method embodiment, and can achieve the same technical effect. To avoid repetition, it will not be repeated here.

[0077] Please refer to Figure 8 , which shows a schematic diagram of the hardware structure of an electronic device provided by an exemplary embodiment of the present disclosure. In some examples, the electronic device may be at least one of a smart phone, a smart watch, a desktop computer, a laptop, a virtual reality terminal, an augmented reality terminal, a wireless terminal, and a laptop computer. The electronic device has a communication function and can access a wired network or a wireless network. The electronic device may generally refer to one of a plurality of terminals, and those skilled in the art may know that the number of the above terminals may be more or less. It can be understood that the electronic device undertakes the calculation and processing work of the technical solution of the present disclosure, and the present disclosure does not limit this.

[0078] like Figure 8 As shown, the electronic device in the present disclosure may include one or more of the following components: a processor 810 and a memory 820 .

[0079] Optionally, the processor 810 uses various interfaces and lines to connect various parts of the entire electronic device, and executes various functions of the electronic device and processes data by running or executing instructions, programs, code sets or instruction sets stored in the memory 820, and calling data stored in the memory 820. Optionally, the processor 810 can be implemented in at least one hardware form of digital signal processing (DSP), field-programmable gate array (FPGA), and programmable logic array (PLA). The processor 810 can integrate one or a combination of a central processing unit (CPU), a graphics processing unit (GPU), a neural network processor (NPU), and a baseband chip. Among them, the CPU mainly processes the operating system, user interface, and application programs; the GPU is responsible for rendering and drawing the content that needs to be displayed on the touch display; the NPU is used to implement artificial intelligence (AI) functions; and the baseband chip is used to process wireless communications. It is understandable that the above baseband chip may not be integrated into the processor 810, but may be implemented by a separate chip.

[0080] The memory 820 may include a random access memory (RAM) or a read-only memory (ROM). Optionally, the memory 820 includes a non-transitory computer-readable storage medium. The memory 820 may be used to store instructions, programs, codes, code sets, or instruction sets. The memory 820 may include a program storage area and a data storage area, wherein the program storage area may store instructions for implementing an operating system, instructions for at least one function (such as a touch function, a sound playback function, an image playback function, etc.), instructions for implementing the above various method embodiments, etc.; the data storage area may store data created according to the use of the electronic device, etc.

[0081] In addition, those skilled in the art can understand that the structure of the electronic device shown in the above drawings does not constitute a limitation on the electronic device, and the electronic device may include more or fewer components than shown, or combine certain components, or arrange the components differently. For example, the electronic device also includes a display screen, a camera assembly, a microphone, a speaker, a radio frequency circuit, an input unit, a sensor (such as an acceleration sensor, an angular velocity sensor, a light sensor, etc.), an audio circuit, a WiFi module, a power supply, a Bluetooth module and other components, which will not be described in detail here.

[0082] The present disclosure also provides a computer-readable storage medium storing at least one instruction, wherein the at least one instruction is used to be executed by a processor to implement the method for generating a design for testability script as described in the above embodiments.

[0083] The present disclosure also provides a computer program product, which includes computer instructions, which are stored in a computer-readable storage medium; a processor of an electronic device reads the computer instructions from the computer-readable storage medium, and the processor executes the computer instructions, so that the electronic device executes to implement the method of generating a testability design script described in the above-mentioned embodiments.

[0084] An embodiment of the present application further provides a chip, which includes a processor and a communication interface, wherein the communication interface is coupled to the processor, and the processor is used to run programs or instructions to implement the various processes of the above-mentioned method embodiment for generating a testability design script, and can achieve the same technical effect. To avoid repetition, it will not be repeated here.

[0085] It should be understood that the chip mentioned in the embodiments of the present application can also be called a system-level chip, a system chip, a chip system or a system-on-chip chip, etc.

[0086] In the several embodiments provided in the present disclosure, it should be understood that the disclosed systems, devices, servers and methods can be implemented in other ways. For example, the device embodiments described above are only schematic. For example, the division of the units is only a logical function division. There may be other division methods in actual implementation, such as multiple units or components can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the mutual coupling or direct coupling or communication connection shown or discussed can be an indirect coupling or communication connection through some interfaces, devices or units, which can be electrical, mechanical or other forms.

[0087] The units described as separate components may or may not be physically separated, and the components shown as units may or may not be physical units, that is, they may be located in one place or distributed on multiple network units. Some or all of the units may be selected according to actual needs to achieve the purpose of the solution of this embodiment.

[0088] In addition, each functional unit in each embodiment of the present disclosure may be integrated into one processing unit, or each unit may exist physically separately, or two or more units may be integrated into one unit. The above-mentioned integrated unit may be implemented in the form of hardware or in the form of software functional units.

[0089] If the integrated unit is implemented in the form of a software functional unit and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of the present application is essentially or the part that contributes to the prior art or all or part of the technical solution can be embodied in the form of a software product. The computer software product is stored in a storage medium, including several instructions to enable a computer device (which can be a personal computer, server, or network device, etc.) to execute all or part of the steps of the method described in each embodiment of the present application. The aforementioned storage medium includes: U disk, mobile hard disk, read-only memory (ROM, Read-Only Memory), random access memory (RAM, Random Access Memory), disk or optical disk and other media that can store program code.

[0090] Those skilled in the art should be aware that in one or more of the above examples, the functions described in the present disclosure can be implemented using hardware, software, firmware, or any combination thereof. When implemented using software, these functions can be stored in a computer-readable medium or transmitted as one or more instructions or codes on a computer-readable medium. Computer-readable media include computer storage media and communication media, wherein communication media include any media that facilitates the transmission of computer programs from one place to another. Storage media can be any available media that can be accessed by a general or special-purpose computer.

[0091] It should be noted that the technical solutions described in the present disclosure can be combined arbitrarily without conflict.

[0092] The above description is only a specific implementation mode of the present invention, but the protection scope of the present invention is not limited thereto. Any technician familiar with the technical field can easily think of changes or substitutions within the technical scope disclosed by the present invention, which should be covered by the protection scope of the present invention.

Claims

1. A method for generating a design for testability script, characterized in that: The method comprises: Determine the test technology of the target to be tested according to the test technology indication information in the test requirement parameters; Determine the script design information according to the test technology of the target to be tested and the target to be tested information in the test requirement parameters; An automated script file for testing the target to be tested is generated according to the script design information.

2. The method according to claim 1, characterized in that The step of generating an automated script file for testing the target to be tested according to the script design information includes: Parsing the script design information to obtain variable information, import files, initialization environment information, constraint setting information, testability design specification file information, test vector information and simulation tool information; An automation script file is generated according to the variable information, import file, initialization environment information, constraint setting information, testability design specification file information, test vector information and simulation tool information.

3. The method according to claim 1, characterized in that Before generating an automated script file for testing the target to be tested according to the script design information, the method further includes: Parsing the script design information to obtain a target automated testing tool; The step of generating an automated script file for testing the target to be tested according to the script design information includes: The automation script file matching the target automation testing tool is generated according to the script design information.

4. The method according to claim 1, characterized in that: The script design information includes: manufacturing information and test information of the target to be tested, and the script design information is determined according to the test technology of the target to be tested and the target to be tested information in the test requirement parameters, including: Acquiring manufacturing information of the target to be measured according to the target to be measured information; The test information is acquired according to the test technology of the target to be tested and the information of the target to be tested.

5. The method according to claim 1, characterized in that The step of determining the test technology of the target to be tested according to the test technology indication information in the test requirement parameter to be tested includes: According to the selection mark of the test technology, the test technology whose selection mark has a value of the selected value is determined as the test technology of the target to be tested.

6. The method according to any one of claims 1 to 5, characterized in that: Determining the script design information according to the test technology of the target to be tested and the target to be tested information in the test requirement parameters includes: Acquire initial script design information according to the test technology of the target to be tested and the target to be tested information in the test requirement parameters; The initial script design information is converted into the script design information in a key-value format.

7. The method according to any one of claims 1 to 5, characterized in that: Before determining the test technology of the target to be tested according to the test technology indication information in the test requirement parameter, the method further includes: Receive the test requirement parameters input by the user on the graphical user interface.

8. A device for generating a design for testability script, characterized in that: The device comprises: a determining part and a generating part; The determining part is configured to determine the test technology of the target to be tested according to the test technology indication information in the test requirement parameter; The determining part is further configured to determine the script design information according to the test technology of the target to be tested and the target to be tested information in the requirement parameters to be tested; The generating part is configured to generate an automation script file for testing the target to be tested according to the script design information.

9. An electronic device, characterized in that: It comprises a processor, a memory and a program or instruction stored in the memory and executable on the processor, wherein the program or instruction, when executed by the processor, implements the steps of the method for generating a testability design script as described in any one of claims 1 to 7.

10. A computer-readable storage medium, characterized in that: The readable storage medium stores a program or an instruction, and when the program or the instruction is executed by a processor, the steps of the method for generating a design for testability script according to any one of claims 1 to 7 are implemented.

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