Perovskite single crystal quality evaluation method, program product, medium, and electronic device

Abstract

The invention discloses a perovskite single crystal quality evaluation method, a program product, a medium and electronic equipment. The method comprises the following steps: storing a second preset number of voltage amplitude groups acquired by a digital acquisition card into a target text file; reading each voltage amplitude group in the target text file, calling a preset data processing algorithm, and performing data processing on each voltage amplitude group through the preset data processing algorithm to obtain perovskite single crystal quality parameters on a plurality of evaluation dimensions; and for each evaluation dimension, counting the quality parameters of the second preset number of perovskite single crystals on each evaluation dimension to obtain a statistical result which is used for evaluating the quality of the perovskite single crystals. According to the technical scheme provided by the invention, the efficiency of evaluating the quality of the perovskite single crystal can be improved.

Description

Technical Field

[0001] The present application belongs to the technical field of material quality evaluation, and in particular relates to a perovskite single crystal quality evaluation method, program product, medium and electronic equipment. Background Art

[0002] Perovskite single crystals are a type of semiconductor material that can be used to detect the energy spectrum of radioactive sources. The quality of perovskite single crystals is the key factor affecting their detection performance. In the existing technology, the traditional method of evaluating perovskite single crystals is relatively complex and inefficient. Based on this, how to improve the efficiency of perovskite single crystal quality evaluation is a technical problem that needs to be solved urgently. Summary of the invention

[0003] The embodiments of the present application provide a perovskite single crystal quality evaluation method, program product, medium and electronic equipment, thereby improving the efficiency of perovskite single crystal quality evaluation at least to a certain extent.

[0004] Other features and advantages of the present application will become apparent from the following detailed description, or may be learned in part by the practice of the present application.

[0005] According to a first aspect of an embodiment of the present application, a method for evaluating the quality of a perovskite single crystal is provided, characterized in that the method comprises: controlling a charge-sensitive amplifier to obtain a response charge generated by the perovskite single crystal after being irradiated by radiation from a radiation source, and converting the response charge into an amplified voltage signal that has been amplified; controlling a digital acquisition card to acquire a first preset number of voltage amplitudes of the amplified voltage signal at a preset acquisition frequency to obtain a voltage amplitude group; storing a second preset number of voltage amplitude groups acquired by the digital acquisition card into a target text file; reading each voltage amplitude group in the target text file, and calling a preset data processing algorithm, performing data processing on each voltage amplitude group through the preset data processing algorithm, and obtaining perovskite single crystal quality parameters in multiple evaluation dimensions; for each evaluation dimension, counting the second preset number of perovskite single crystal quality parameters in each evaluation dimension to obtain a statistical result, and the statistical result is used to evaluate the quality of the perovskite single crystal.

[0006] In some embodiments of the present application, based on the aforementioned scheme, before controlling the digital acquisition card to acquire the voltage amplitudes of the first preset number of amplified voltage signals according to the preset acquisition frequency, the method also includes: controlling the shaping amplifier to shape the amplified voltage signal to obtain a corresponding shaped voltage signal; judging whether the voltage amplitude of the shaped voltage signal is greater than the preset voltage amplitude; if the voltage amplitude of the shaped voltage signal is greater than the preset voltage amplitude, controlling the digital acquisition card to acquire the voltage amplitude of the amplified voltage signal corresponding to the shaped voltage signal; if the amplitude of the shaped voltage signal is less than or equal to the preset voltage amplitude, controlling the digital acquisition card to ignore the voltage amplitude of the amplified voltage signal corresponding to the shaped voltage signal.

[0007] In some embodiments of the present application, based on the aforementioned scheme, the data processing of each voltage amplitude group by the preset data processing algorithm is performed to obtain the perovskite single crystal quality parameters in multiple evaluation dimensions, including: storing each voltage amplitude group in a first data group, and performing mean smoothing processing on the first data group; storing the data obtained after the mean smoothing processing in a second data group, and performing first-order difference processing on the second data group; storing the data obtained after the first-order difference processing in a third data group, and performing second-order difference processing on the third data group; storing the data obtained after the second-order difference processing in a fourth data group ; Determine whether the maximum value and minimum value in the second data group and the maximum value and minimum value in the fourth data group are valid by different preset judgment formulas respectively; if the maximum value and minimum value in the second data group and the maximum value and minimum value in the fourth data group are both valid, then determine the perovskite single crystal quality parameters in multiple evaluation dimensions based on the maximum value and minimum value in the second data group and the maximum value and minimum value in the fourth data group; if any one of the maximum value and minimum value in the second data group and the maximum value and minimum value in the fourth data group is invalid, then determine that each voltage amplitude group is invalid data.

[0008] In some embodiments of the present application, based on the above solution, whether the maximum value in the fourth data group is valid is determined by the following formula:

[0009] a≥Q1-Q2

[0010] Among them, a represents the maximum value in the fourth data group, Q1 represents the data length in the fourth data group, and Q2 represents the preset slice length: if so, it means that the maximum value in the fourth data group is invalid, if not, it means that the maximum value in the fourth data group is valid.

[0011] In some embodiments of the present application, based on the above solution, whether the minimum value in the fourth data group is valid is determined by the following formula:

[0012] b≥Q3

[0013] Among them, b represents the minimum value in the fourth data group, Q3 represents the data length in the first data group, if yes, it means that the minimum value in the fourth data group is invalid, if no, it means that the minimum value in the fourth data group is valid.

[0014] In some embodiments of the present application, based on the above solution, whether the maximum value in the second data group is valid is determined by the following formula:

[0015] (b+(ba)×Q4 / b)<0

[0016] Wherein a represents the maximum value in the fourth data group, b represents the minimum value in the fourth data group, Q4 is the second product length, which is used to determine the range of the maximum value in the second data group. If yes, it means that the maximum value in the second data group is invalid, if not, it means that the maximum value in the second data group is valid.

[0017] In some embodiments of the present application, based on the above solution, whether the minimum value in the second data group is valid is determined by the following formula:

[0018] (a-(ba)×a / Q5)≤0

[0019] Wherein a represents the maximum value in the fourth data group, b represents the minimum value in the fourth data group, Q5 is the first product length, which is used to determine the range of the minimum value in the second data group. If yes, it means that the minimum value in the second data group is invalid, if not, it means that the minimum value in the second data group is valid.

[0020] According to a second aspect of an embodiment of the present application, a computer program product is provided, which includes computer instructions, which are stored in a computer-readable storage medium and are suitable for being read and executed by a processor, so that a computer device having the processor executes to implement the operations performed by the method described in any one of the embodiments of the first aspect above.

[0021] According to a third aspect of an embodiment of the present application, a computer-readable storage medium is provided, in which at least one computer program instruction is stored. The at least one computer program instruction is loaded and executed by a processor to implement the operations performed by the method described in any one of the embodiments of the first aspect above.

[0022] According to a fourth aspect of an embodiment of the present application, a clear electronic device is provided, the electronic device comprising one or more processors and one or more memories, the one or more memories storing at least one computer program instruction, the at least one computer program instruction being loaded and executed by the one or more processors to implement the operations performed by the method described in any one of the embodiments of the first aspect above.

[0023] Based on the technical solution proposed in the present application, firstly, by adopting a digital acquisition card to collect the voltage amplitude of the amplified voltage signal, the convenience of perovskite single crystal quality detection can be improved, thereby improving the efficiency of data acquisition to a certain extent; secondly, by setting a preset acquisition frequency, the change law of the voltage amplitude of the amplified voltage signal over time can be accurately reflected, thereby improving the accuracy of the data; thirdly, by setting the first preset number of voltage amplitudes of the amplified voltage signal collected by the digital acquisition card, the influence of abnormal data generated by random errors in the acquisition process on the data analysis results can be reduced, thereby further improving the accuracy of the data; fourthly, by processing the data through a preset data processing algorithm, the efficiency of data processing can be improved.

[0024] It should be understood that the foregoing general description and the following detailed description are exemplary and explanatory only and are not restrictive of the present application. BRIEF DESCRIPTION OF THE DRAWINGS

[0025] The drawings herein are incorporated into the specification and constitute a part of the specification, showing embodiments consistent with the present application, and together with the specification, are used to explain the principles of the present application. Obviously, the drawings described below are only some embodiments of the present application, and for ordinary technicians in this field, other drawings can be obtained based on these drawings without creative work. In the drawings:

[0026] Figure 1 A flow chart showing a method for evaluating the quality of a perovskite single crystal in an embodiment of the present application is shown;

[0027] Figure 2 , showing a relationship diagram of voltage amplitudes in a voltage amplitude group in an embodiment of the present application changing with time;

[0028] Figure 3 , showing a histogram of the distribution of the second rise time of all voltage amplitude groups in the embodiment of the present application;

[0029] Figure 4 , showing a histogram of the distribution of the second voltage rise amplitude of all voltage amplitude groups in the embodiment of the present application;

[0030] Figure 5, a distribution histogram of the total voltage rise amplitude of all voltage amplitude groups in the embodiment of the present application is shown;

[0031] Figure 6 A detailed flow chart of the perovskite single crystal quality evaluation algorithm in an embodiment of the present application is shown;

[0032] Figure 7 A detailed flow chart of a preset data processing algorithm in an embodiment of the present application is shown;

[0033] Figure 8 A detailed flow chart of the preset statistical algorithm in the embodiment of the present application is shown;

[0034] Fig. 9 A schematic diagram of the structure of an electronic device in an embodiment of the present application is shown. DETAILED DESCRIPTION

[0035] The following will be combined with the drawings in the embodiments of the present application to clearly and completely describe the technical solutions in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, not all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of this application.

[0036] In addition, described feature, structure or characteristic can be combined in one or more embodiments in any suitable manner. In the following description, many specific details are provided to provide a full understanding of the embodiments of the present application. However, those skilled in the art will appreciate that the technical scheme of the present application can be put into practice without one or more of the specific details, or other methods, components, devices, steps, etc. can be adopted. In other cases, known methods, devices, realizations or operations are not shown or described in detail to avoid blurring the various aspects of the application.

[0037] The block diagrams shown in the accompanying drawings are only functional entities and do not necessarily correspond to physically independent entities. That is, these functional entities can be implemented in software form, or in one or more hardware modules or integrated circuits, or in different networks and / or processor devices and / or microcontroller devices. It should also be noted that in the accompanying drawings, in order to ensure the simplicity of the drawings, some components in the drawings that do not affect the explanation of the technical solution of the present application are adaptively omitted.

[0038] The flowcharts shown in the accompanying drawings are only exemplary and do not necessarily include all the contents and operations / steps, nor must they be executed in the order described. For example, some operations / steps can be decomposed, and some operations / steps can be combined or partially combined, so the actual execution order may change according to actual conditions.

[0039] In the description of this application, it should be understood that the terms "first" and "second" are used for descriptive purposes only and should not be understood as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of the feature. In the description of this application, unless otherwise specified, "plurality" means two or more.

[0040] In the present application, the perovskite single crystal can form a radiation energy spectrum detection system for detecting the energy spectrum of the radiation source, and the quality of the perovskite is an important factor affecting the detector effect. The quality of the perovskite can be judged by the distribution of shallow defects. Based on this, the present application proposes a method that can improve the efficiency of perovskite single crystal quality evaluation.

[0041] In order to make those skilled in the art better understand the present application, Figure 1 The implementation details of the technical solution of the embodiment of the present application are elaborated in detail.

[0042] See also Figure 1 , shows a flow chart of the perovskite single crystal quality evaluation method in an embodiment of the present application.

[0043] like Figure 1 As shown, the method can be specifically performed by a device having a computing and processing function. The perovskite single crystal quality evaluation method includes at least steps 110 to 150, which are described in detail as follows:

[0044] Step 110, controlling the charge sensitive amplifier to obtain the response charge generated by the perovskite single crystal after being irradiated by the radiation from the radiation source, and converting the response charge into an amplified voltage signal after being amplified.

[0045] Step 120 , controlling the digital acquisition card to acquire voltage amplitudes of a first preset number of amplified voltage signals at a preset acquisition frequency to obtain a voltage amplitude group.

[0046] Step 130: storing a second preset number of voltage amplitude value groups acquired by the digital acquisition card into a target text file.

[0047] Step 140, read each voltage amplitude group in the target text file, and call a preset data processing algorithm, perform data processing on each voltage amplitude group through the preset data processing algorithm, and obtain perovskite single crystal quality parameters in multiple evaluation dimensions.

[0048] Step 150, for each evaluation dimension, counting the second preset number of perovskite single crystal quality parameters in each evaluation dimension to obtain a statistical result, and the statistical result is used to evaluate the quality of the perovskite single crystal.

[0049] In the present application, the voltage amplitude of the amplified voltage signal can be collected by a digital acquisition card, or it can be collected by other acquisition devices with higher signal acquisition efficiency and better storage capacity. In this regard, the present application does not make too many restrictions.

[0050] In a specific embodiment of the present application, the preset acquisition frequency may be 500 MHz (i.e., the digital acquisition card acquires the voltage amplitude of the amplified voltage signal once every 2 ns), the first preset number may be 10,000, and the second preset number may be 100,000. It can be understood that, according to actual needs, the preset acquisition frequency, the first preset number, and the second preset number may also be other parameter values. In this regard, the present application does not impose too many restrictions.

[0051] In the present application, the digital acquisition card can be controlled to collect the voltage amplitude of the first preset number of amplified voltage signals according to the preset acquisition frequency. On the one hand, by setting the preset acquisition frequency, the time interval of each voltage amplitude of the amplified voltage signal collected by the digital acquisition card can be controlled to remain consistent, so that the change law of the voltage amplitude of the amplified voltage signal over time can be accurately reflected, thereby improving the accuracy of the data, and then improving the accuracy of the perovskite quality evaluation. On the other hand, controlling the digital acquisition card to collect the voltage amplitude of the first preset number of amplified voltage signals can ensure that the number of voltage amplitude points collected by the digital acquisition card is sufficient, thereby reducing the impact of abnormal data generated by random errors during the acquisition process on the data analysis results, and can further improve the accuracy of the data, so as to improve the accuracy of the perovskite quality evaluation.

[0052] In the present application, by performing data processing on each voltage amplitude group through a preset data processing algorithm, the efficiency of the data processing process can be improved. At the same time, by collecting a second preset number of voltage amplitude groups, sufficient perovskite single crystal quality parameters can be obtained after data processing, so that there are sufficient perovskite single crystal quality parameters in each evaluation dimension, which can further reduce the impact of random errors on the quality evaluation of perovskite single crystals, and thus improve the accuracy of perovskite single crystal quality detection.

[0053] In the present application, the multiple evaluation dimensions may include the distribution depth of shallow defects in the perovskite single crystal, the distribution density of shallow defects in the perovskite single crystal and the energy resolution of the perovskite single crystal. If the shallow defect distribution depth of the perovskite single crystal is shallower, the shallow defect distribution density of the perovskite single crystal is smaller and the energy resolution of the perovskite single crystal is smaller, it means that the quality of the perovskite single crystal is better.

[0054] In the present application, before controlling the digital acquisition card to acquire the voltage amplitudes of the first preset number of amplified voltage signals according to the preset acquisition frequency, the following steps 111 to 114 may be specifically performed:

[0055] Step 111, controlling a shaping amplifier to shape the amplified voltage signal to obtain a corresponding shaped voltage signal;

[0056] Step 112, determining whether the voltage amplitude of the shaped voltage signal is greater than a preset voltage amplitude;

[0057] Step 113, if the voltage amplitude of the shaped voltage signal is greater than the preset voltage amplitude, controlling the digital acquisition card to acquire the voltage amplitude of the amplified voltage signal corresponding to the shaped voltage signal;

[0058] Step 114: If the amplitude of the shaped voltage signal is less than or equal to the preset voltage amplitude, control the digital acquisition card to ignore the voltage amplitude of the amplified voltage signal corresponding to the shaped voltage signal.

[0059] In the present application, after the response charge is converted into an amplified voltage signal by a charge sensitive amplifier, the amplified voltage signal needs to be processed by a shaping amplifier to obtain a shaped voltage signal, and the shaped voltage signal is judged to be valid by the preset voltage amplitude. When the voltage amplitude of the shaped voltage signal obtained after the amplified voltage signal is processed by the shaping amplifier exceeds the preset voltage amplitude, the digital acquisition card will be controlled to collect the corresponding amplified voltage signal. When the voltage amplitude of the shaped voltage signal obtained after the amplified voltage signal is processed by the shaping amplifier does not exceed the preset voltage amplitude, the digital acquisition card will be controlled to ignore the corresponding amplified voltage signal. In this way, invalid data with a voltage amplitude lower than the preset voltage amplitude will be ignored by the digital acquisition card, thereby avoiding the digital acquisition card from collecting too much invalid data, ensuring the efficiency and accuracy of data acquisition, and thus improving the efficiency of perovskite single crystal quality evaluation.

[0060] In the above step 140, the data processing is performed on each voltage amplitude group by the preset data processing algorithm to obtain the perovskite single crystal quality parameters in multiple evaluation dimensions, which can be specifically performed according to the following steps 141 to 147:

[0061] Step 141, storing each voltage amplitude group into a first data group, and performing mean smoothing processing on the first data group;

[0062] Step 142, storing the data obtained after the mean smoothing process into a second data group, and performing first-order difference processing on the second data group;

[0063] Step 143, storing the data obtained after the first-order difference processing into a third data group, and performing a second-order difference processing on the third data group;

[0064] Step 144, storing the data obtained after the second-order difference processing into a fourth data group;

[0065] Step 145, determining whether the maximum value and the minimum value in the second data group, and the maximum value and the minimum value in the fourth data group are valid by using different preset determination formulas respectively;

[0066] Step 146, if the maximum value and the minimum value in the second data group and the maximum value and the minimum value in the fourth data group are both valid, then determine the perovskite single crystal quality parameters in multiple evaluation dimensions based on the maximum value and the minimum value in the second data group and the maximum value and the minimum value in the fourth data group;

[0067] Step 147: If any one of the maximum value and the minimum value in the second data group and the maximum value and the minimum value in the fourth data group is invalid, then each of the voltage amplitude groups is determined to be invalid data.

[0068] It should be noted that in the present application, the digital acquisition card will generate random noise signals in the process of collecting and amplifying the voltage amplitude of the voltage signal. However, when the acquisition time of the digital acquisition card meets the target time, the influence of the noise signal can be eliminated by performing mean smoothing processing on the voltage amplitude group. The target time is the time for the digital acquisition card to collect the first preset number of voltage amplitudes according to the preset acquisition frequency. Therefore, the data of the first data group can be processed by mean smoothing, so as to obtain a more reasonable and intuitive relationship diagram of the voltage amplitude changing with time. For details, please refer to Figure 2 , shows a graph showing the relationship between the voltage amplitude in a voltage amplitude group and time in an embodiment of the present application. It can be seen from the figure that the curve drawn based on the data in the first data group has large fluctuations due to the influence of the noise signal, and it is difficult to determine the rules therein and perform subsequent data processing. However, the curve drawn based on the data in the second data group obtained after mean smoothing basically eliminates the influence of the noise signal and has a relatively obvious rule to facilitate subsequent data processing.

[0069] In the present application, the distribution depth of shallow defects of the perovskite single crystal, the distribution density of shallow defects of the perovskite single crystal and the energy resolution of the perovskite single crystal are judged, and the perovskite single crystal quality parameters corresponding to the distribution depth of shallow defects of the perovskite single crystal, the distribution density of shallow defects of the perovskite single crystal and the energy resolution of the perovskite single crystal can be determined respectively. Figure 2 , the perovskite single crystal quality parameters can be obtained by Figure 2 The first rising area, the second rising area and the total rising area in the mean smoothing curve shown in the figure are determined. It can be seen from the figure that the first rising area is the area between point a and point b, where the third data group needs to be obtained by first-order difference of the second data group, and then the fourth data group is obtained by difference of the third data group. The maximum value in the fourth data group is point a, and the minimum value is point b. The second rising area is as follows Figure 2 The area between point b and point c in the mean smooth curve shown in FIG. 1 is the area between point b and point c in the mean smooth curve shown in FIG. 1 , so it is necessary to find the maximum value point c in the second data group after point b in the second data group. The total rising area is as follows: Figure 2 The area between point d and point c in the mean smooth curve shown, therefore it is necessary to find the minimum point d in the second data group before point a in the second data group.

[0070] In the present application, in order to avoid errors in the maximum and minimum values ​​in the second data group and the maximum and minimum values ​​in the fourth data group, which may lead to errors in the quality evaluation of the perovskite single crystal, the inventors of the present application have designed a preset judgment formula to determine whether the maximum and minimum values ​​in the second data group and the maximum and minimum values ​​in the fourth data group are valid. If the maximum and minimum values ​​in the second data group and the maximum and minimum values ​​in the fourth data group are both valid, the quality parameters of the perovskite single crystal can be determined based on the maximum and minimum values ​​in the second data group and the maximum and minimum values ​​in the fourth data group. If any one of the maximum and minimum values ​​in the second data group and the maximum and minimum values ​​in the fourth data group is invalid, it means that this group of voltage amplitude group data is invalid and this group of data needs to be removed. By using the preset judgment formula to judge the maximum and minimum values ​​in the second data group and the maximum and minimum values ​​in the fourth data group, valid data can be screened out and invalid data can be removed, thereby improving the accuracy of the quality evaluation of the perovskite single crystal.

[0071] Next, this application will combine Figure 3 , Figure 4 and Figure 5 The specific determination method of the distribution depth of the shallow defects of the perovskite single crystal, the distribution density of the shallow defects of the perovskite single crystal and the energy resolution of the perovskite single crystal is described in detail.

[0072] See also Figure 3 , shows a histogram of the distribution of the second rise time of all voltage amplitude groups in the embodiment of the present application.

[0073] See also Figure 4 , shows a histogram of the distribution of the second-segment voltage rise amplitudes of all voltage amplitude groups in the embodiment of the present application.

[0074] See also Figure 5 , a histogram of the distribution of the total voltage rise amplitudes of all voltage amplitude groups in the embodiment of the present application is shown.

[0075] First, please combine Figure 3 The perovskite single crystal quality parameter for judging the distribution depth of the shallow defects of the perovskite single crystal is the second rise time, and the second rise time is the time passed by the second rise area in the mean smooth curve. The distribution depth of the shallow defects of the perovskite single crystal can be judged by the distribution of the second rise time of all voltage amplitude groups. If the number of voltage amplitude groups whose second rise time is less than the preset second rise time is greater than or equal to the third preset number, it means that the distribution depth of the shallow defects of the perovskite single crystal is shallow. If the number of voltage amplitude groups whose second rise time is less than the preset second rise time is less than the third preset number, it means that the distribution depth of the shallow defects of the perovskite single crystal is deep.

[0076] Secondly, please combine Figure 4 The perovskite single crystal quality parameter for judging the distribution density of shallow defects of the perovskite single crystal is the second-segment voltage rise amplitude, the second-segment voltage rise amplitude is the magnitude of the voltage amplitude rise in the second-segment rising area in the mean smoothing curve, and the distribution density of shallow defects of the perovskite single crystal can be judged by the distribution of the second-segment voltage rise amplitudes of all voltage amplitude groups. If the number of voltage amplitude groups whose second-segment voltage rise amplitude is less than the preset second-segment voltage rise amplitude is greater than or equal to the third preset number, then the distribution density of shallow defects of the perovskite single crystal is smaller; if the number of voltage amplitude groups whose second-segment voltage rise amplitude is less than the preset second-segment voltage rise amplitude is less than the third preset number, then the distribution density of shallow defects of the perovskite single crystal is larger.

[0077] Finally, please combine Figure 5, the perovskite single crystal quality parameter for judging the energy resolution of the perovskite single crystal is the total voltage rise amplitude, the total voltage rise amplitude shown is the magnitude of the voltage amplitude rise in the total rise area in the mean smoothing curve, and the energy resolution of the perovskite single crystal can be obtained by performing Gaussian fitting on the distribution of the total voltage rise amplitude of all voltage amplitude groups. If the energy resolution is less than or equal to the preset energy resolution, it means that the perovskite single crystal has a good quality, and if the energy resolution is greater than the preset energy resolution, it means that the perovskite single crystal has a poor quality. For example, the inventor of the present application obtained the following through experiments: Figure 5 The distribution histogram of the total voltage rise amplitude shown in the figure shows that the energy resolution of a perovskite single crystal is 2.6% after Gaussian fitting, which is less than the preset threshold of 3%, indicating that the quality of the perovskite single crystal is good.

[0078] In the above step 145, the maximum value and the minimum value in the second data group, and the maximum value and the minimum value in the fourth data group can be determined by the following formula:

[0079] a≥Q1-Q2 (1)

[0080] Wherein, a represents the maximum value in the fourth data group, Q1 represents the data length in the fourth data group, and Q2 represents the preset slice length.

[0081] b≥Q3 (2)

[0082] Among them, b represents the minimum value in the fourth data group, and Q3 represents the data length in the first data group.

[0083] (b+(ba)×Q4 / b)<0 (3)

[0084] Wherein a represents the maximum value in the fourth data group, b represents the minimum value in the fourth data group, and Q4 is the second product length, which is used to determine the determination range of the maximum value in the second data group.

[0085] (a-(ba)×a / Q5)≤0 (4)

[0086] Wherein a represents the maximum value in the fourth data group, b represents the minimum value in the fourth data group, and Q5 is the first product length, which is used to determine the determination range of the minimum value in the second data group.

[0087] In the present application, formula (1) is used to determine whether the maximum value in the fourth data group is valid. If formula (1) is established, it means that the maximum value in the fourth data group is invalid. If formula (1) is not established, it means that the maximum value in the fourth data group is valid. Formula (2) is used to determine whether the minimum value in the fourth data group is valid. If formula (2) is established, it means that the minimum value in the fourth data group is invalid. If formula (2) is not established, it means that the minimum value in the fourth data group is valid. Formula (3) is used to determine whether the maximum value in the second data group is valid. If formula (3) is established, it means that the maximum value in the second data group is invalid. If formula (3) is not established, it means that the maximum value in the second data group is valid. Formula (4) is used to determine whether the minimum value in the second data group is valid. If formula (4) is established, it means that the minimum value in the second data group is invalid. If formula (4) is not established, it means that the minimum value in the second data group is valid.

[0088] In order to make those skilled in the art better understand the present application, Figure 6 , Figure 7 and Figure 8 , an example in a specific application scenario is used to illustrate the perovskite single crystal quality evaluation method proposed in this application.

[0089] See also Figure 6 , shows a detailed flow chart of the perovskite single crystal quality evaluation algorithm in an embodiment of the present application, specifically including steps 601 to 605:

[0090] Step 601, start running the perovskite single crystal quality evaluation algorithm.

[0091] Step 602, reading each voltage amplitude group in the target text file.

[0092] Step 603: Call a preset data processing algorithm to perform data processing on each voltage group.

[0093] Step 604, obtaining perovskite single crystal quality parameters in multiple evaluation dimensions.

[0094] Step 605, determine whether the second preset number of cycles have been performed. If yes, execute step 606; if no, execute step 602.

[0095] Step 606, calling a preset statistical algorithm to count the second preset number of perovskite single crystal quality parameters in each evaluation dimension.

[0096] See also Figure 7 , shows a detailed flow chart of the preset data processing algorithm in the embodiment of the present application, specifically including steps 701 to 717:

[0097] Step 701, start running the preset data processing algorithm.

[0098] Step 702: store each voltage amplitude group into a first data group, and perform mean smoothing processing on the first data group.

[0099] Step 703: store the data obtained after the mean smoothing process into a second data group, and perform first-order difference processing on the second data group.

[0100] Step 704: store the data obtained after the first-order difference processing into a third data group, and perform a second-order difference processing on the third data group.

[0101] Step 705, storing the data obtained after the second-order difference processing into the fourth data group.

[0102] Step 706, determining the maximum value a in the fourth data group.

[0103] Step 707, determine: a ≥ Q1-Q2? If yes, execute step 708, if no, execute step 709.

[0104] Step 708: determine that the voltage amplitude group is invalid data.

[0105] Step 709, determining the minimum value b in the fourth data group.

[0106] Step 710, determine: b ≥ Q3? If yes, execute step 708, if no, execute step 711.

[0107] Step 711, determining the maximum value c in the second data group.

[0108] Step 712, determine: (b+(ba)×Q4 / b)<0? If yes, execute step 708, if no, execute step 713.

[0109] Step 713, determining the minimum value d in the second data group.

[0110] Step 714, determine: (a-(ba)×a / Q5)≤0? If yes, execute step 708, if no, execute step 715.

[0111] Step 715: Determine the perovskite single crystal quality parameters in multiple evaluation dimensions based on the maximum value and the minimum value in the second data group and the maximum value and the minimum value in the fourth data group.

[0112] Step 716, determine whether the difference between the total voltage rise amplitude and the first voltage rise amplitude is less than a preset threshold. If yes, execute step 708, if no, execute step 717.

[0113] Step 717, returning the perovskite single crystal quality parameters in multiple evaluation dimensions.

[0114] The first voltage rise amplitude is the magnitude of the voltage rise in the first rising region of the mean smoothing curve.

[0115] See also Figure 8 , shows a detailed flow chart of the preset statistical algorithm in the embodiment of the present application, specifically including steps 801 to 804:

[0116] Step 801, start running the preset statistical algorithm.

[0117] Step 802 , counting the perovskite single crystal quality parameters of each evaluation dimension of all voltage amplitude groups.

[0118] Step 803 , draw a histogram of the distribution of perovskite single crystal quality parameters for each evaluation dimension of all voltage amplitude groups.

[0119] Step 804, returning the histogram.

[0120] Based on the technical solution proposed in the present application, firstly, by adopting a digital acquisition card to collect the voltage amplitude of the amplified voltage signal, the convenience of perovskite single crystal quality detection can be improved, thereby improving the efficiency of data acquisition to a certain extent; secondly, by setting a preset acquisition frequency, the change law of the voltage amplitude of the amplified voltage signal over time can be accurately reflected, thereby improving the accuracy of the data; thirdly, by setting the first preset number of voltage amplitudes of the amplified voltage signal collected by the digital acquisition card, the influence of abnormal data generated by random errors in the acquisition process on the data analysis results can be reduced, thereby further improving the accuracy of the data; fourthly, by processing the data through a preset data processing algorithm, the efficiency of data processing can be improved.

[0121] Based on the same inventive concept, an embodiment of the present application provides a computer program product, which includes computer instructions, which are stored in a computer-readable storage medium and are suitable for being read and executed by a processor, so that a computer device with the processor executes to implement the operations performed by the perovskite single crystal quality evaluation method as described above.

[0122] Based on the same inventive concept, an embodiment of the present application provides a computer-readable storage medium, in which at least one computer program instruction is stored. The at least one computer program instruction is loaded and executed by a processor to implement the operations performed by the perovskite single crystal quality evaluation method as described above.

[0123] Based on the same inventive concept, the embodiment of the present application further provides an electronic device, referring to Fig. 9 , shows a schematic diagram of the structure of an electronic device in an embodiment of the present application, wherein the electronic device includes one or more memories 904, one or more processors 902, and at least one computer program (computer program instruction) stored in the memory 904 and executable on the processor 902, and when the processor 902 executes the computer program, the perovskite single crystal quality evaluation method as described above is implemented.

[0124] Among them, Fig. 9 In the embodiment of the present invention, a bus architecture (represented by bus 900) is shown, and bus 900 may include any number of interconnected buses and bridges, and bus 900 links various circuits including one or more processors represented by processor 902 and memory represented by memory 904. Bus 900 may also link various other circuits such as peripherals, voltage regulators, and power management circuits, which are well known in the art and are therefore not further described herein. Bus interface 905 provides an interface between bus 900 and receiver 901 and transmitter 903. Receiver 901 and transmitter 903 may be the same element, namely a transceiver, providing a unit for communicating with various other devices over a transmission medium. Processor 902 is responsible for managing bus 900 and general processing, while memory 904 may be used to store data used by processor 902 when performing operations.

[0125] The functions described herein may be implemented in hardware, software executed by a processor, firmware, or any combination thereof. If implemented in software executed by a processor, the functions may be stored as one or more instructions or codes on a computer-readable medium or transmitted via a computer-readable medium. Other examples and implementations are within the scope and spirit of the present application and the appended claims. For example, due to the nature of software, the functions described above may be implemented using software executed by a processor, hardware, firmware, hard wiring, or a combination of any of these. In addition, each functional unit may be integrated into a processing unit, each unit may exist physically separately, or two or more units may be integrated into one unit.

[0126] In the several embodiments provided in this application, it should be understood that the disclosed technical content can be implemented in other ways. Among them, the device embodiments described above are only schematic. For example, the division of the units can be a logical function division. There may be other division methods in actual implementation. For example, multiple units or components can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the mutual coupling or direct coupling or communication connection shown or discussed can be through some interfaces, indirect coupling or communication connection of units or modules, which can be electrical or other forms.

[0127] The units described as separate components may or may not be physically separated, and the components of the control device may or may not be physical units, that is, they may be located in one place or distributed in multiple units. Some or all of the units may be selected according to actual needs to achieve the purpose of the present embodiment.

[0128] If the integrated unit is implemented in the form of a software functional unit and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of the present application can be essentially or partly or all or partly embodied in the form of a software product that contributes to the prior art. The computer software product is stored in a storage medium, including several instructions for a computer device (which can be a personal computer, a server or a network device, etc.) to perform all or part of the steps of the method described in each embodiment of the present application. The aforementioned storage medium includes: U disk, read-only memory (ROM, Read-Only Memory), random access memory (RAM, Random Access Memory), mobile hard disk, disk or optical disk, etc., which can store computer program instructions.

[0129] The above description is only an embodiment of the present application and is not intended to limit the present application. For those skilled in the art, the present application may have various modifications and variations. Any modification, equivalent substitution, improvement, etc. made within the spirit and principle of the present application shall be included in the scope of the claims of the present application.

Claims

1. A method for evaluating the quality of a perovskite single crystal, characterized in that: The method comprises: Controlling the charge-sensitive amplifier to obtain the response charge generated by the perovskite single crystal after being exposed to radiation from the radiation source, and converting the response charge into an amplified voltage signal after amplification processing; Controlling the digital acquisition card to acquire voltage amplitudes of a first preset number of amplified voltage signals at a preset acquisition frequency to obtain a voltage amplitude group; storing a second preset number of voltage amplitude value groups acquired by the digital acquisition card into a target text file; Reading each voltage amplitude group in the target text file, and calling a preset data processing algorithm, performing data processing on each voltage amplitude group by the preset data processing algorithm, and obtaining perovskite single crystal quality parameters in multiple evaluation dimensions; For each evaluation dimension, the second preset number of perovskite single crystal quality parameters in each evaluation dimension are counted to obtain a statistical result, and the statistical result is used to evaluate the quality of the perovskite single crystal.

2. The method according to claim 1, characterized in that: Before controlling the digital acquisition card to acquire the voltage amplitudes of the first preset number of amplified voltage signals according to the preset acquisition frequency, the method further includes: Controlling the shaping amplifier to shape the amplified voltage signal to obtain a corresponding shaped voltage signal; Determining whether the voltage amplitude of the shaped voltage signal is greater than a preset voltage amplitude; If the voltage amplitude of the shaped voltage signal is greater than the preset voltage amplitude, controlling the digital acquisition card to acquire the voltage amplitude of the amplified voltage signal corresponding to the shaped voltage signal; If the amplitude of the shaped voltage signal is less than or equal to the preset voltage amplitude, the digital acquisition card is controlled to ignore the voltage amplitude of the amplified voltage signal corresponding to the shaped voltage signal.

3. The method according to claim 1, characterized in that The method of performing data processing on each of the voltage amplitude groups by using the preset data processing algorithm to obtain perovskite single crystal quality parameters in multiple evaluation dimensions includes: storing each voltage amplitude group into a first data group, and performing mean smoothing processing on the first data group; storing the data obtained after the mean smoothing process into a second data group, and performing first-order difference processing on the second data group; storing the data obtained after the first-order difference processing into a third data group, and performing a second-order difference processing on the third data group; storing the data obtained after the second-order difference processing into a fourth data group; Determine whether the maximum value and the minimum value in the second data group, and the maximum value and the minimum value in the fourth data group are valid by using different preset determination formulas respectively; If the maximum value and the minimum value in the second data group and the maximum value and the minimum value in the fourth data group are both valid, then determining the perovskite single crystal quality parameters in multiple evaluation dimensions based on the maximum value and the minimum value in the second data group and the maximum value and the minimum value in the fourth data group; If any one of the maximum value and the minimum value in the second data group and the maximum value and the minimum value in the fourth data group is invalid, each of the voltage amplitude value groups is determined to be invalid data.

4. The method according to claim 3, characterized in that Whether the maximum value in the fourth data group is valid is determined by the following formula: a≥Q1-Q2 Among them, a represents the maximum value in the fourth data group, Q1 represents the data length in the fourth data group, and Q2 represents the preset slice length; if so, it means that the maximum value in the fourth data group is invalid, if not, it means that the maximum value in the fourth data group is valid.

5. The method according to claim 3, characterized in that: Whether the minimum value in the fourth data group is valid is determined by the following formula: b≥Q3 Among them, b represents the minimum value in the fourth data group, Q3 represents the data length in the first data group, if yes, it means that the minimum value in the fourth data group is invalid, if no, it means that the minimum value in the fourth data group is valid.

6. The method according to claim 3, characterized in that Whether the maximum value in the second data group is valid is determined by the following formula: (b+(ba)×Q4 / b)<0 Wherein a represents the maximum value in the fourth data group, b represents the minimum value in the fourth data group, Q4 is the second product length, which is used to determine the range of the maximum value in the second data group. If yes, it means that the maximum value in the second data group is invalid, if not, it means that the maximum value in the second data group is valid.

7. The method according to claim 3, characterized in that Whether the minimum value in the second data group is valid is determined by the following formula: (a-(ba)×a / Q5)≤0 Wherein a represents the maximum value in the fourth data group, b represents the minimum value in the fourth data group, Q5 is the first product length, which is used to determine the range of the minimum value in the second data group. If yes, it means that the minimum value in the second data group is invalid, if not, it means that the minimum value in the second data group is valid.

8. A computer program product, characterized in that The computer program product includes computer instructions, which are stored in a computer-readable storage medium and are suitable for being read and executed by a processor, so that a computer device having the processor executes the data backup method according to any one of claims 1 to 7.

9. A computer-readable storage medium, characterized in that: The computer-readable storage medium stores at least one program code, and the at least one program code is loaded and executed by a processor to implement the operations performed by the data backup method according to any one of claims 1 to 7.

10. An electronic device, characterized in that: The electronic device includes one or more processors and one or more memories, wherein the one or more memories store at least one program code, and the at least one program code is loaded and executed by the one or more processors to implement the operations performed by the data backup method as described in any one of claims 1 to 7.

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