Test method and device based on OpenHarmony equipment and electronic equipment

Abstract

The invention discloses a test method and device based on OpenHarmony equipment and electronic equipment, and the method comprises the steps: executing a test case for a to-be-tested terminal according to a received test rule of the to-be-tested terminal, and calling pile equipment from other equipment when a preset pile driving test point of the to-be-tested terminal is executed, the terminal to be tested is in distributed connection with other equipment, and the other equipment comprises the pile equipment with the pile driving test capability, so that the pile driving test capability of the pile equipment is called to test the preset pile driving test point, and the test result is obtained. The pile equipment in distributed connection can be used for replacing a traditional pile function to execute the whole testing process, the complete pile driving testing capacity of the pile equipment is used for testing, the problem that a real interaction scene cannot be presented due to the fact that pile data is too single is avoided, the actual interaction scene is truly embodied, the pile data is flexible and changeable, and the testing efficiency is improved. And the quality and the effect of the test case are greatly improved, so that the integrity and the accuracy of the test are improved.

Description

Technical Field

[0001] The present invention relates to the field of testing, and in particular to a testing method, device and electronic equipment based on OpenHarmony equipment. Background Art

[0002] In functional testing, stub testing is a technique that uses simulated objects (stubs) or fake objects (mocks) to replace real components. Through stub testing, the dependencies of the tested code can be isolated, making the test more controllable, stable, and efficient.

[0003] In the related art, the stub functions used in stub testing are mostly implemented using empty functions or simple codes, which are very different from the actual component functions to be tested and cannot reflect the actual interaction scenarios. The preset stub data is single, which poses a hidden danger to the integrity and accuracy of the test. Summary of the invention

[0004] The technical problem to be solved by the present invention is to provide a test method, device and electronic equipment based on OpenHarmony equipment, which improves the integrity and accuracy of the test.

[0005] In order to solve the above technical problems, a technical solution adopted by the present invention is: A test method based on OpenHarmony equipment is used for a terminal to be tested, wherein the terminal to be tested is connected to other equipment in a distributed manner, wherein the other equipment includes a pile equipment with pile driving test capability, and the method comprises the steps of: Receiving a test rule of the terminal to be tested; Execute the test case on the terminal to be tested according to the test rule; When the preset pile driving test point of the terminal to be tested is executed, the pile device is called from the other devices, and the pile driving test capability of the pile device is called to test the preset pile driving test point to obtain a test result.

[0006] In order to solve the above technical problems, another technical solution adopted by the present invention is: A test device based on OpenHarmony equipment includes a test rule receiving module, a test case execution module and a pile driving test module: The test rule receiving module is used to receive the test rule of the terminal to be tested; The test case execution module is used to execute the test case on the terminal to be tested according to the test rules; The piling test module is used to call the pile device from the other devices when executing the preset piling test point of the terminal to be tested, and call the piling test capability of the pile device to test the preset piling test point to obtain the test result.

[0007] In order to solve the above technical problems, another technical solution adopted by the present invention is: An electronic device comprises a memory, a processor and a computer program stored in the memory and running on the processor, wherein the processor implements each step of the above-mentioned test method based on OpenHarmony device when executing the computer program.

[0008] The beneficial effects of the present invention are as follows: a test case is executed on the terminal to be tested according to the received test rule of the terminal to be tested; when the preset pile driving test point of the terminal to be tested is executed, a pile device is called from other devices, and the pile driving test capability of the pile device is called to test the preset pile driving test point to obtain a test result; since the terminal to be tested of the present application is connected to other devices in a distributed manner, and the other devices include pile devices with pile driving test capabilities, the method of the present application can be used to replace the traditional pile function with the distributed connected pile device to execute the entire test process, and the complete pile driving test capability of the pile device is used to perform the test, thereby avoiding the problem that the pile data is too single and cannot present the real interaction scene; by truly reflecting the actual interaction scene, the pile data is flexible and changeable, and the quality and effect of the test case are greatly improved, thereby improving the integrity and accuracy of the test. BRIEF DESCRIPTION OF THE DRAWINGS

[0009] Figure 1 A flowchart of a test method based on OpenHarmony equipment provided by an embodiment of the present invention; Figure 2 A schematic diagram of distributed connection between a terminal to be tested and other devices in a test method based on OpenHarmony devices provided in an embodiment of the present invention; Figure 3 A test flow chart of a test method based on OpenHarmony equipment provided in an embodiment of the present invention; Figure 4 A schematic diagram of distributed connection between a terminal to be tested and different pile devices in a test method based on OpenHarmony devices provided in an embodiment of the present invention; Figure 5 A structural diagram of a test device based on OpenHarmony equipment provided in an embodiment of the present invention; Figure 6 A schematic diagram of the structure of an electronic device provided by an embodiment of the present invention. DETAILED DESCRIPTION

[0010] In order to make the technical problems, technical solutions and beneficial effects to be solved by the present application more clearly understood, the present application is further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present application and are not used to limit the present application.

[0011] In the following description, specific details such as specific system structures, technologies, etc. are provided for the purpose of illustration rather than limitation, so as to provide a thorough understanding of the embodiments of the present application. However, it should be clear to those skilled in the art that the present application may also be implemented in other embodiments without these specific details. In other cases, detailed descriptions of well-known systems, devices, circuits, and methods are omitted to prevent unnecessary details from obstructing the description of the present application.

[0012] It should be understood that when used in the present specification and the appended claims, the term "comprising" indicates the presence of described features, wholes, steps, operations, elements and / or components, but does not exclude the presence or addition of one or more other features, wholes, steps, operations, elements, components and / or combinations thereof.

[0013] References to "one embodiment" or "some embodiments" etc. described in the specification of this application mean that one or more embodiments of the present application include specific features, structures or characteristics described in conjunction with the embodiment. Therefore, the statements "in one embodiment", "in some embodiments", "in some other embodiments", "in some other embodiments", etc. that appear in different places in this specification do not necessarily refer to the same embodiment, but mean "one or more but not all embodiments", unless otherwise specifically emphasized in other ways. The terms "including", "comprising", "having" and their variations all mean "including but not limited to", unless otherwise specifically emphasized in other ways.

[0014] In the early stage of equipment development, a certain module may not be fully developed. At this time, it is necessary to test the overall implementation effect of the equipment, and pile driving testing is required. Or, when all modules have been developed, but due to the long-term use of the equipment, problems occur during use, and pile driving testing can also be used to locate the fault point. Pile driving testing is a technology that uses simulated objects or fake objects to replace real components. Through pile driving testing, the dependencies of the tested code can be isolated, making the test more controllable, stable and efficient. In the related art, the pile functions used in pile driving testing are mostly implemented using empty functions or simple codes, which are very different from the actual component functions to be tested, and cannot reflect the actual interaction scenario. The preset pile data is single, resulting in hidden dangers in the integrity and accuracy of the test.

[0015] For example, the tester knows that the IC card component has not been completed. During the test, the prior art needs to start a stub function when calling the IC card function, such as fun{stub function()}. The stub function used here is relatively empty and cannot reflect the real interaction scenario, resulting in a decrease in test integrity and accuracy.

[0016] In order to solve the above problems, the present application provides a test method, device and electronic device based on OpenHarmony equipment. The following specifically introduces a test method based on OpenHarmony equipment in the present application.

[0017] The OpenHarmony device-based test method in this application can be used for the terminal to be tested, and the terminal to be tested can be a device using the OpenHarmony system. Figure 2 , the terminal to be tested can be connected to other devices in a distributed manner, and the capabilities of other devices can be used to complete the test. Distributed connections can be connected in the form of distributed soft buses. Distributed soft buses are a physical bus similar to hardware, which is software-based. All devices connected to it are in the form of software. It can be understood that software is a device. Since software can achieve decentralized and distributed layout; moreover, the most important feature is that devices in the distributed soft bus can call on the capabilities of other devices to complete the test; other devices include servers and pile devices with pile testing capabilities, such as Figure 2 As shown, a terminal to be tested can be distributedly connected to multiple other devices, such as other device 1, other device 2, other device 5, and so on.

[0018] For example, when a POS machine is used as a terminal to be tested, barcode scanners, other POS machines, face recognition terminals, and palm print recognition devices that are distributedly connected to the POS machine can be used as other devices of this application. The piling test capabilities of other devices can be used to perform piling tests on the items that need to be tested on the terminal to be tested. For example, this application can use a POS machine with full functions installed as other devices. When it is necessary to test the acquiring program of the terminal to be tested, and the underlying contact IC card module has not been developed and prepared, the IC card capabilities of the POS machine with full functions installed can be used as piling test capabilities.

[0019] The following is a detailed description of the test method based on the OpenHarmony device in the present invention, including steps S101 to S103. Figure 1 .

[0020] Step S101: Receive test rules of the terminal to be tested.

[0021] The test rules describe the business rules to be tested. The test rules include functional test rules and scenario test rules. Functional test rules include black box testing and white box testing. For example, if the IC card module of the terminal to be tested needs to be tested, the corresponding test rules include the business rules for testing the IC card module.

[0022] Step S102: Execute the test case on the terminal to be tested according to the test rules.

[0023] For example, the IC card module test case is executed according to the business rules of the IC card module test.

[0024] Step S103: When the preset pile driving test point of the terminal to be tested is executed, the pile device is called from other devices, and the pile driving test capability of the pile device is called to test the preset pile driving test point to obtain the test result. For example, when the IC card component is executed, the IC card pile device is called, and the pile driving test capability of the IC card pile device is called to test the IC card component to obtain the test result.

[0025] In this way, since the terminal to be tested of the present application is connected to other devices in a distributed manner, and other devices include pile devices with pile driving test capabilities, using the method of the present application, the distributed connected pile devices can be used to replace the traditional pile functions to execute the entire test process, and the complete pile driving test capabilities of the pile devices are used to perform tests, such as fun{call pile device}, thereby avoiding the problem that the pile data is too single and cannot present the real interaction scene. By truly reflecting the actual interaction scene, the pile data is flexible and changeable, and the quality and effect of the test case are greatly improved, thereby improving the integrity and accuracy of the test.

[0026] In one embodiment of the present application, before step S101, the process further includes: determining undeveloped components in the terminal to be tested; and determining the undeveloped components as preset pile test points.

[0027] In this way, before testing, testers can know which components have not been fully developed. These components are the test points that need to be piled in the future. The unfinished components are identified as preset pile test points to facilitate subsequent complete testing.

[0028] In one embodiment of the present application, before step S101, it also includes: obtaining all candidate fault points in the terminal to be tested; selecting an alternative fault point from all the candidate fault points as a target candidate fault point, and determining the target candidate fault point as a preset pile test point.

[0029] In this way, when it is necessary to locate the fault point, the candidate fault points are respectively determined as preset piling test points, so as to facilitate the subsequent accurate positioning of the fault point by means of piling test.

[0030] In one embodiment of the present application, after step S103, it also includes: if the test result is that the test passes, the target candidate fault point is determined as the final fault point; if the test result is that the test fails, an unselected candidate fault point is selected from all candidate fault points as the target candidate fault point, and the step of determining the target candidate fault point as the preset piling test point is returned to execute until all candidate fault points have been selected.

[0031] In this way, a pile driving test is performed on each candidate fault point. If the test result is passed, it means that the current preset pile driving test point is the final fault point, which can be replaced or repaired, so that the fault can be quickly located based on the accuracy of the test.

[0032] In one embodiment of the present application, when a preset pile driving test point of the terminal to be tested is executed, calling a pile device from other devices includes: when a preset pile driving test point of the terminal to be tested is executed, if there are multiple pile devices in other devices, obtaining the distances between the multiple pile devices and the terminal to be tested; selecting a pile device with the shortest distance from the multiple pile devices, and calling the pile device with the shortest distance.

[0033] In this way, if there are multiple pile devices, calling the pile device with the shortest distance to the terminal to be tested can complete the test more conveniently and quickly, and calling the pile device with a short distance can improve stability.

[0034] In one embodiment of the present application, calling the pile driving test capability of the pile device to test the preset piling test point to obtain the test result includes: performing signature verification on the pile device, and if the verification passes, calling the pile driving test capability of the pile device to test the preset piling test point to obtain the test result.

[0035] In this way, before calling the pile driving test capability of the pile device for testing, the pile device is firstly signature verified to ensure the security of the pile device, thereby improving the accuracy of the test.

[0036] In one embodiment of the present application, step S103 includes: when executing to the preset piling test point of the terminal to be tested, determining whether there are multiple preset piling test points, and if so, calling multiple pile devices from other devices, and calling the piling test capabilities of the multiple pile devices to test the multiple preset piling test points to obtain test results.

[0037] In this way, when there are multiple preset piling test points, multiple pile devices are called at the same time for testing to improve test efficiency. For example, for some complex tests, calling a pile device takes a long time, while the present application calls multiple devices at the same time, and multiple devices can be used simultaneously, effectively improving efficiency.

[0038] In one embodiment of the present application, step S103 includes: when executing to the preset piling test point of the terminal to be tested, determining whether the preset piling test point needs to call multiple piling test capabilities, and if so, calling multiple pile devices from other devices, and calling the piling test capabilities of multiple pile devices to test the preset piling test point to obtain a test result.

[0039] In this way, when a preset piling test point needs to call multiple piling test capabilities, the piling test capabilities of multiple pile devices can be called at the same time to test the preset piling test point. For example, the testing of the code scanning payment capability and the face payment program are based on the same camera module. When the preset piling test point is a camera module, the piling test capabilities of the code scanner pile device and the face recognition pile device can be called at the same time for testing. In this way, multiple tests can be implemented for a preset piling test point, thereby improving the test efficiency.

[0040] In one embodiment of the present application, the preset staking test points include an IC card component, a printer component, a contactless card component and a password key component.

[0041] Call the pile device from other devices, and call the pile device's pile driving test capability to test the preset pile driving test points. The test results include: If the preset pile test point is an IC card component, the IC card pile device is called from other devices, and the pile test capability of the IC card pile device is called to test the IC card component to obtain the test result; If the preset stub test point is a printer component, the printer stub device is called from other devices, and the stub test capability of the printer stub device is called to test the printer component to obtain the test result; If the preset pile driving test point is a contactless card component, the contactless card pile device is called from other devices, and the pile driving test capability of the contactless card pile device is called to test the contactless card component to obtain the test result; If the preset pile test point is a password key component, the password key pile device is called from other devices, and the pile test capability of the password key pile device is called to test the password key component to obtain the test result.

[0042] In this way, the preset pile driving test points can include any components that have not yet been fully developed or components that serve as candidate fault points. By calling the corresponding pile equipment for testing, the flexibility of the test is guaranteed.

[0043] The following specifically introduces the application embodiments of the present application. The present application can apply the above solution to the testing scenario of the device that has not been fully developed or the fault location scenario of the device that has been fully developed.

[0044] Please refer to Figure 3 and Figure 4The method includes the following steps (1) to (5).

[0045] (1) Determine the preset piling test points.

[0046] In an optional implementation, undeveloped components in the terminal to be tested are determined; and the undeveloped components are determined as preset pile test points.

[0047] In another optional implementation, all candidate fault points in the terminal to be tested are obtained; an alternative fault point is selected from all the candidate fault points as a target candidate fault point, and the target candidate fault point is determined as a preset pile test point.

[0048] For example, when testing a bank acquiring program, the underlying IC card component has not been fully developed. If a test is required to be started, the underlying IC card component that has not been fully developed will be determined as a preset staking test point.

[0049] (2) Receive the test rules of the terminal to be tested.

[0050] For example, receive the business rules for IC card component testing.

[0051] (3) Execute test cases on the terminal to be tested according to the test rules.

[0052] For example, the IC card component test case is executed on the terminal under test according to the business rules of the IC card component test.

[0053] (4) When executing the preset pile driving test point of the terminal to be tested, if there are multiple pile devices in other devices, the distances between the multiple pile devices and the terminal to be tested are obtained; the pile device with the shortest distance is selected from the multiple pile devices, and the pile device with the shortest distance is called.

[0054] For example, when the IC card component is executed, if there is an IC card pile device in other devices, the IC card pile device is directly called.

[0055] (5) Perform signature verification on the pile device. If the verification passes, call the pile device's pile driving test capability to test the preset pile driving test point and obtain the test result. If the verification fails, select other pile devices.

[0056] Among them, Figure 4 As shown, the preset pile test point may include an IC card component, a printer component, a contactless card component and a password key component. The pile device may include an IC card pile device, a printer pile device, a contactless card pile device and a password key pile device.

[0057] For example, the signature verification is performed on the IC card pile device. If the verification passes, the pile driving test capability of the IC card pile device is called to test the IC card component to obtain the test result.

[0058] In an optional implementation, when executing the preset piling test point of the terminal to be tested, it is determined whether there are multiple preset piling test points. If so, multiple pile devices are called from other devices, and the piling test capabilities of the multiple pile devices are called to test the multiple preset piling test points to obtain test results.

[0059] In an optional embodiment, when the target candidate fault point is determined as a preset pile driving test point, it also includes step (6): if the test result is that the test passes, the target candidate fault point is determined as the final fault point; if the test result is that the test fails, an unselected candidate fault point is selected from all candidate fault points as the target candidate fault point, and the process returns to execute the step of determining the target candidate fault point as the preset pile driving test point until all candidate fault points have been selected.

[0060] The present invention also provides a test device based on OpenHarmony equipment. Figure 5 , including test rule receiving module, test case execution module and stubbing test module: The test rule receiving module is used to receive the test rules of the terminal to be tested.

[0061] The test case execution module is used to execute the test case on the terminal to be tested according to the test rules.

[0062] The piling test module is used to call the pile device from other devices when executing the preset piling test point of the terminal to be tested, and call the piling test capability of the pile device to test the preset piling test point to obtain the test result.

[0063] Please refer to Figure 6 The present invention also provides an electronic device 300, including a memory 301 and a processor 302, and a computer program stored in the memory 301 and running on the processor 302. When the processor 302 executes the computer program, each step in the above-mentioned test method based on OpenHarmony device is implemented.

[0064] The beneficial effects of the electronic device of the present invention are the same as those of the above method and will not be described in detail here.

[0065] In summary, the present invention provides a test method, device and electronic device based on OpenHarmony equipment. Test cases are executed on the terminal to be tested according to the received test rules of the terminal to be tested. When the preset piling test point of the terminal to be tested is executed, the pile device is called from other devices, and the piling test capability of the pile device is called to test the preset piling test point to obtain a test result. Since the terminal to be tested of the present application is connected to other devices in a distributed manner, and the other devices include pile devices with piling test capabilities, the method of the present application can be used to replace the traditional pile function with the distributed connected pile device to execute the entire test process, and the complete piling test capability of the pile device is used to perform the test, thereby avoiding the problem that the pile data is too single and cannot present the real interaction scene. By truly reflecting the actual interaction scene, the pile data is flexible and changeable, and the quality and effect of the test case are greatly improved, thereby improving the integrity and accuracy of the test. In addition, when determining the preset piling test points, the undeveloped components can be determined as preset piling test points to facilitate the subsequent complete testing. When the fault point needs to be located after the equipment development is completed, the alternative fault points can be determined as preset piling test points respectively to facilitate the subsequent accurate location of the fault point by piling testing.

[0066] The above are only embodiments of the present invention, and are not intended to limit the patent scope of the present invention. Any equivalent transformations made using the contents of the specification and drawings of the present invention, or directly or indirectly applied in related technical fields, are also included in the patent protection scope of the present invention.

Claims

1. A testing method based on OpenHarmony equipment, characterized in that: For a terminal to be tested, the terminal to be tested is connected to other devices in a distributed manner, and the other devices include pile devices with pile driving test capabilities. The method includes: Receiving a test rule of the terminal to be tested; Execute the test case on the terminal to be tested according to the test rule; When the preset pile driving test point of the terminal to be tested is executed, the pile device is called from the other devices, and the pile driving test capability of the pile device is called to test the preset pile driving test point to obtain a test result.

2. A test method based on OpenHarmony equipment according to claim 1, characterized in that: Before receiving the test rule of the terminal to be tested, the method further includes: Determining undeveloped components in the terminal to be tested; The undeveloped components are determined as preset piling test points.

3. A test method based on OpenHarmony equipment according to claim 1, characterized in that: Before receiving the test rule of the terminal to be tested, the method further includes: Acquire all candidate fault points in the terminal to be tested; An alternative fault point is selected from all the alternative fault points as a target alternative fault point, and the target alternative fault point is determined as a preset pile driving test point.

4. A test method based on OpenHarmony equipment according to claim 3, characterized in that: When the preset pile driving test point of the terminal to be tested is executed, the pile device is called from the other devices, and the pile driving test capability of the pile device is called to test the preset pile driving test point, and after the test result is obtained, the method further includes: If the test result is that the test passes, the target candidate fault point is determined as the final fault point; If the test result is that the test fails, an unselected alternative fault point is selected from all the alternative fault points as the target alternative fault point, and the step of determining the target alternative fault point as the preset pile test point is returned to execute until all the alternative fault points have been selected.

5. A test method based on OpenHarmony equipment according to claim 2 or 4, characterized in that: When the preset pile driving test point of the terminal to be tested is executed, calling the pile device from the other device includes: When executing the preset pile driving test point of the terminal to be tested, if there are multiple pile devices in the other devices, obtaining the distances between the multiple pile devices and the terminal to be tested; A pile device with the shortest distance is selected from the plurality of pile devices, and the pile device with the shortest distance is called.

6. A test method based on OpenHarmony equipment according to claim 2 or 4, characterized in that: The calling of the pile driving test capability of the pile device to test the preset pile driving test point and obtaining the test result includes: The signature verification is performed on the pile device. If the verification passes, the pile driving test capability of the pile device is called to test the preset pile driving test point to obtain a test result.

7. A test method based on OpenHarmony equipment according to claim 2 or 4, characterized in that: When the preset pile driving test point of the terminal to be tested is executed, the pile device is called from the other devices, and the pile driving test capability of the pile device is called to test the preset pile driving test point, and the test result obtained includes: When executing to the preset piling test point of the terminal to be tested, determine whether there are multiple preset piling test points. If so, call multiple pile devices from the other devices, and call the piling test capabilities of multiple pile devices to test multiple preset piling test points to obtain test results.

8. A test method based on OpenHarmony equipment according to claim 2 or 4, characterized in that: The preset pile driving test points include an IC card component, a printer component, a contactless card component and a password key component; The calling of the pile device from the other device and calling the pile driving test capability of the pile device to test the preset pile driving test point to obtain the test result includes: If the preset pile driving test point is the IC card component, then calling the IC card pile device from the other devices, and calling the pile driving test capability of the IC card pile device to test the IC card component to obtain a test result; If the preset stub test point is the printer component, calling a printer stub device from the other devices, and calling the stub test capability of the printer stub device to test the printer component to obtain a test result; If the preset pile driving test point is the contactless card component, calling a contactless card pile device from the other devices, and calling the pile driving test capability of the contactless card pile device to test the contactless card component to obtain a test result; If the preset pile test point is the password key component, a password key pile device is called from the other devices, and the pile test capability of the password key pile device is called to test the password key component to obtain a test result.

9. A test device based on OpenHarmony equipment, characterized in that: Including test rule receiving module, test case execution module and stubbing test module: The test rule receiving module is used to receive the test rule of the terminal to be tested; The test case execution module is used to execute the test case on the terminal to be tested according to the test rules; The piling test module is used to call the pile device from the other devices when executing the preset piling test point of the terminal to be tested, and call the piling test capability of the pile device to test the preset piling test point to obtain the test result.

10. An electronic device, comprising a memory, a processor, and a computer program stored in the memory and running on the processor, wherein the processor implements each step of a test method based on an OpenHarmony device as described in any one of claims 1 to 8 when executing the computer program.

Images