Method for detecting chip abnormity in bright environment

Abstract

The invention discloses a method for detecting chip abnormity in a bright environment, and the method comprises the following steps: setting a test light source, and placing a to-be-tested camera under the test light source; adjusting the central brightness value of the test light source; obtaining a middle area picture shot by the to-be-tested camera under the test light source; calculating a brightness average value of the middle area picture; according to the method and the device, the to-be-detected camera is placed in the bright environment to detect whether the chip is abnormal or not, so that the performance of the factory chip is ensured.

Description

Technical Field

[0001] The present invention relates to the field of camera detection technology, and in particular to a method for detecting chip abnormalities in a bright environment. Background Art

[0002] The camera module is composed of capacitors, chips, connectors, flexible circuit boards, lens + holder integrated materials and other main components. Among them, the chip is a particularly important component in the camera module. The quality of the chip determines the performance of the camera module. Therefore, the performance of the chip needs to be tested before the camera module leaves the factory. Due to the characteristics of some chips, it is impossible to test whether the chip is abnormal in conventional tests, so the performance of the chip cannot be guaranteed. Summary of the invention

[0003] The purpose of the present invention is to overcome the deficiencies in the prior art and provide a method for detecting chip abnormalities in a bright environment.

[0004] The objective of the present invention is achieved through the following technical solutions:

[0005] A method for detecting chip abnormality in a bright environment comprises the following steps:

[0006] Step 1: Set the test light source and place the camera to be tested under the test light source;

[0007] Step 2: Adjust the central brightness value of the test light source;

[0008] Step 3, obtaining a middle area image taken by the camera to be tested under the test light source;

[0009] Step 4: Calculate the average brightness of the image in the middle area;

[0010] Step 5: Determine the average brightness of the images in the middle area and perform screening.

[0011] In one embodiment, in step 1, the test light source is a 5100K light source.

[0012] In one implementation manner, in step 1, a certain brightness value is set for the test light source.

[0013] In one embodiment, in step 2,

[0014] Step 2-1, adjusting the central brightness value of the test light source to a target value, and setting an automatic adjustment exposure time;

[0015] Step 2-2, set the analog gain value range for the camera to be tested.

[0016] In one implementation manner, in step 3, the size of the middle area image is 100*100piexl.

[0017] In one implementation manner, in step 4, calculating the average brightness of the middle area picture is to respectively calculate the average brightness of R, GR, GB, and B channels in the middle area picture.

[0018] In one embodiment, respectively calculating the average brightness of the R, GR, GB, and B channels in the middle area image is calculating the brightness accumulation / number of each pixel in each channel.

[0019] In one embodiment, in step 4,

[0020] Step 4-1, respectively obtaining central area images taken by the camera to be tested under the test light source and at different simulated gain values ​​within the simulated gain value range;

[0021] Step 4-2, calculate the average brightness of the R, GR, GB, and B channels for each central area image taken.

[0022] In one implementation manner, in step 4-1, the simulated gain value range is 1x gain-15x gain, and the camera to be tested sequentially takes 15 center area images within the simulated gain value range and calculates the average brightness.

[0023] In one embodiment, in step 5,

[0024] Step 5-1, set the standard linear fitting coefficient value;

[0025] Step 5-2, obtaining the linear fitting coefficients of the average brightness of R, GR, GB, and B of the central area image taken by the camera to be tested within the range of the simulated gain value;

[0026] Step 5-3, determine whether the linear fitting coefficients of the brightness of R, GR, GB, and B are greater than the standard linear fitting coefficient values;

[0027] Step 5-4, screening the cameras to be tested with a linear fitting coefficient value less than the standard value and judging them as defective.

[0028] Compared with the prior art, the present invention has at least the following advantages:

[0029] A method for detecting chip abnormality in a bright environment of the present invention places a camera to be tested under a test light source, shoots and obtains central area pictures in sequence within a simulated gain value range, calculates the brightness averages of R, GR, GB, and B channels for the obtained central area pictures, and generates a linear fitting coefficient for comparison with a standard linear fitting coefficient. If it is greater than the standard linear fitting coefficient value, the chip of the camera to be tested is judged to be qualified. If it is less than the standard linear fitting coefficient value, it is screened and judged to be defective, so as to judge the quality of the chip and ensure the performance of the camera chip leaving the factory. BRIEF DESCRIPTION OF THE DRAWINGS

[0030] In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings required for use in the embodiments are briefly introduced below. It should be understood that the following drawings only show certain embodiments of the present invention and therefore should not be regarded as limiting the scope. For ordinary technicians in this field, other related drawings can be obtained based on these drawings without creative work.

[0031] Figure 1 A schematic flow chart of a method for detecting chip abnormalities in a bright environment provided by the present invention. DETAILED DESCRIPTION

[0032] In order to facilitate the understanding of the present invention, the present invention will be described more fully below with reference to the relevant drawings. The preferred embodiments of the present invention are given in the drawings. However, the present invention can be implemented in many different forms and is not limited to the embodiments described herein. On the contrary, the purpose of providing these embodiments is to make the disclosure of the present invention more thoroughly understood.

[0033] It should be noted that when an element is referred to as being "fixed to" another element, it may be directly on the other element or there may be a central element. When an element is considered to be "connected to" another element, it may be directly connected to the other element or there may be a central element at the same time. The terms "vertical", "horizontal", "left", "right" and similar expressions used herein are for illustrative purposes only and do not represent the only implementation method.

[0034] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as those commonly understood by those skilled in the art of the present invention. The terms used herein in the specification of the present invention are only for the purpose of describing specific embodiments and are not intended to limit the present invention. The term "and / or" used herein includes any and all combinations of one or more related listed items.

[0035] A method for detecting chip anomalies in a bright environment, referring to Figure 1, including the following steps:

[0036] Step 1: Set the test light source and place the camera to be tested under the test light source;

[0037] Step 2: Adjust the central brightness value of the test light source;

[0038] Step 3, obtaining a middle area image taken by the camera to be tested under the test light source;

[0039] Step 4: Calculate the average brightness of the image in the middle area;

[0040] Step 5: Determine the average brightness of the images in the middle area and perform screening.

[0041] Reference Figure 1 In step 1, the test light source is a 5100k light source, and a certain brightness value is set for the test light source. The purpose of setting the test light source to a 5100k light source is to allow the camera to be tested to shoot in a bright environment to detect whether there is any abnormality in the chip.

[0042] Reference Figure 1 , in step 2,

[0043] Step 2-1, adjusting the central brightness value of the test light source to a target value, and setting an automatic adjustment exposure time;

[0044] Step 2-2, set the analog gain value range for the camera to be tested.

[0045] Among them, the central brightness of the test light source is adjusted to the target value because it is difficult to ensure that the brightness value of each light source of the test light source is consistent. Therefore, it is only required to adjust the central brightness of the test light source to the target value and place the camera to be tested under the central area of ​​the test light source.

[0046] Reference Figure 1 In step 3, the size of the middle area image is 100*100piexl. The size of the middle area image is set to facilitate the subsequent calculation of the brightness average value of the central area image. In this embodiment, middle area images of other sizes can also be obtained according to needs.

[0047] Reference Figure 1 In step 4, the calculation of the brightness average of the middle area picture is to calculate the brightness average of the R, GR, GB, and B channels in the middle area picture respectively. The middle area picture is provided with a plurality of pixels, and each pixel has four photosensors, namely R, GR, GB, and B. The four photosensors make the pixel have different colors. The brightness average of the four photosensors in the middle area picture is calculated to obtain the quality of the pixels in the middle area picture, so as to judge the performance of the chip in the camera to be tested.

[0048] Reference Figure 1 , and respectively calculating the average brightness of the R, GR, GB, and B channels in the middle area image is to calculate the brightness accumulation / number of each pixel in each channel.

[0049] Further, refer to Figure 1 , in step 4,

[0050] Step 4-1, respectively obtain the center area pictures taken by the camera to be tested under the test light source and at different simulated gain values ​​in the simulated gain value range; wherein the simulated gain value range is 1x gain-15x gain, and the camera to be tested sequentially takes 15 center area pictures in the simulated gain value range and calculates the average brightness.

[0051] Step 4-2, calculate the average brightness of the R, GR, GB, and B channels for each central area image taken.

[0052] Reference Figure 1 , where the gain value in the camera under test is the highlight value. The analog gain value is set to allow the camera under test to shoot at different gain values ​​and obtain the middle area picture. For each middle area picture obtained, the brightness average of the R, GR, GB, and B channels is calculated to test whether the brightness value of the middle area pictures taken by the camera under test at different gain values ​​is qualified.

[0053] Reference Figure 1 , in step 5,

[0054] Step 5-1, set the standard linear fitting coefficient value;

[0055] Step 5-2, obtaining the linear fitting coefficients of the average brightness of R, GR, GB, and B of the central area image taken by the camera to be tested within the range of the simulated gain value;

[0056] Step 5-3, determine whether the linear fitting coefficients of the brightness of R, GR, GB, and B are greater than the standard linear fitting coefficient values;

[0057] Step 5-4, screening the cameras to be tested with a linear fitting coefficient value less than the standard value and judging them as defective.

[0058] Reference Figure 1, wherein the linear fitting coefficient of the average brightness of the central area pictures R, GR, GB, and B taken by the camera to be tested within the range of simulated gain values ​​is obtained, and the linear fitting coefficient of the average brightness of the central area pictures R, GR, GB, and B is generated after calculating the average brightness of each central area picture, and this linear fitting coefficient is compared with the standard linear fitting coefficient value. If it is greater than the standard linear fitting coefficient value, the chip of the camera to be tested is judged to be qualified. If it is less than the standard linear fitting coefficient value, it is screened and judged to be defective.

[0059] In summary, by placing the camera to be tested under the test light source and shooting in sequence within the range of simulated gain values ​​to obtain pictures of the central area, the brightness averages of the R, GR, GB, and B channels are calculated for the obtained pictures of the central area, and a linear fitting coefficient is generated for comparison with the standard linear fitting coefficient. If it is greater than the standard linear fitting coefficient value, the chip of the camera to be tested is judged to be qualified. If it is less than the standard linear fitting coefficient value, it is screened and judged to be defective, so as to judge the quality of the chip and ensure the performance of the camera chip leaving the factory.

[0060] The above-mentioned embodiments only express several implementation methods of the present invention, and the descriptions thereof are relatively specific and detailed, but they cannot be understood as limiting the scope of the invention patent. It should be pointed out that, for ordinary technicians in this field, several variations and improvements can be made without departing from the concept of the present invention, and these all belong to the protection scope of the present invention. Therefore, the protection scope of the patent of the present invention shall be subject to the attached claims.

Claims

1. A method for detecting chip abnormality in a bright environment, characterized in that: The following steps are involved: Step 1: Set the test light source and place the camera to be tested under the test light source; Step 2: Adjust the central brightness value of the test light source; Step 3, obtaining a middle area image taken by the camera to be tested under the test light source; Step 4: Calculate the average brightness of the image in the middle area; Step 5: Determine the average brightness of the images in the middle area and filter them.

2. The method for detecting chip abnormality in a bright environment according to claim 1, characterized in that: In step 1, the test light source is a 5100k light source.

3. The method for detecting chip abnormality in a bright environment according to claim 2, characterized in that: In step 1, a certain brightness value is set for the test light source.

4. The method for detecting chip abnormality in a bright environment according to claim 3, characterized in that: In step 2, Step 2-1, adjusting the central brightness value of the test light source to a target value, and setting an automatic adjustment exposure time; Step 2-2, set the analog gain value range for the camera to be tested.

5. The method for detecting chip abnormality in a bright environment according to claim 4, characterized in that: In step 3, the size of the middle area image is 100*100piexl.

6. The method for detecting chip abnormality in a bright environment according to claim 5, characterized in that: In step 4, the calculation of the brightness average of the middle area picture is to respectively calculate the brightness averages of the R, GR, GB, and B channels in the middle area picture.

7. The method for detecting chip abnormality in a bright environment according to claim 6, characterized in that: The method of respectively calculating the average brightness of the R, GR, GB, and B channels in the middle area picture is to calculate the brightness accumulation / number of each pixel in each channel.

8. The method for detecting chip abnormality in a bright environment according to claim 7, characterized in that: In step 4, Step 4-1, respectively obtaining central area images taken by the camera to be tested under the test light source and at different simulated gain values ​​within the simulated gain value range; Step 4-2, calculate the average brightness of the R, GR, GB, and B channels for each central area image taken.

9. The method for detecting chip abnormality in a bright environment according to claim 8, characterized in that: In step 4-1, the simulated gain value range is 1x gain-15x gain, and the camera to be tested takes 15 center area pictures in sequence within the simulated gain value range and calculates the average brightness.

10. The method for detecting chip abnormality in a bright environment according to claim 8, characterized in that: In step 5, Step 5-1, set the standard linear fitting coefficient value; Step 5-2, obtaining the linear fitting coefficients of the average brightness of R, GR, GB, and B of the central area image taken by the camera to be tested within the range of the simulated gain value; Step 5-3, determine whether the linear fitting coefficients of the brightness of R, GR, GB, and B are greater than the standard linear fitting coefficient values; Step 5-4, screening the cameras to be tested with a linear fitting coefficient value less than the standard value and judging them as defective.

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