Deformation detection method and system for photovoltaic panel

Through a depth camera, the difference in the difference between the characteristic points and thickness of the photovoltaic panels is detected, the deformation index is calculated, and whether the photovoltaic panels are deformed is solved, and the problem of high complexity of the existing photovoltaic panel deformation detection methods is achieved, efficient and simple deformation detection is achieved, and resource recycling and utilization rate is improved.

CN119594882APending Publication Date: 2025-03-11CHANGZHOU UNIV
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Patent Information

Application Number
CN202411670145.2
Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2024-11-21
Publication Date
2025-03-11

AI Technical Summary

Technical Problem

The existing photovoltaic panel deformation detection methods are complex and it is difficult to effectively detect the deformation of photovoltaic panels during disassembly, resulting in glass rupture or unclear separation of EVA film during separation, reducing resource recycling rate.

Method used

The depth camera is used to detect the difference between different feature points on the photovoltaic panel and the thickness of the photovoltaic panel. By constructing a deformation state array and a standard state array, the deformation index is calculated, and whether the photovoltaic panel has deformed.

Benefits of technology

The simplicity and practicality of photovoltaic panel deformation detection are realized, the detection efficiency and disassembly efficiency are improved, and glass cracking or EVA film separation problems caused by photovoltaic panel deformation is avoided, resource utilization is improved and environmental pollution is reduced.

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Abstract

The invention relates to the technical field of photovoltaic panel detection, in particular to a deformation detection method and system for a photovoltaic panel, and the method comprises the steps: collecting the distance between a central point of a plurality of ROI regions of a to-be-detected photovoltaic panel and an image collection device; and constructing a deformation state array, calculating unequal times of element values in the deformation state array and the standard state array, and calculating a deformation index by using the sum of the unequal times. The problem that an existing photovoltaic panel deformation detection method is high in complexity is solved.
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Description

Technical Field

[0001] The present invention relates to the technical field of photovoltaic panel detection, and in particular to a photovoltaic panel deformation detection method and system. Background Art

[0002] Photovoltaic panels can be used to generate electricity and are currently widely used. However, due to problems such as overall deformation of photovoltaic panels, material aging, and performance degradation during long-term use, waste photovoltaic panels need to be recycled and disassembled. When separating the components of photovoltaic panels after peeling off the frame, water jet separation technology is usually used. The overall deformation of the photovoltaic panels can lead to problems such as glass breakage or incomplete separation of the EVA film during the separation process, and contaminate the photovoltaic cells, thereby hindering subsequent separation processing and reducing the recycling rate of resources.

[0003] Therefore, it is necessary to perform deformation detection before separating the components of the photovoltaic panel after peeling off the frame to determine whether deformation has occurred, and whether to select the photovoltaic panel for subsequent separation process, so as to reduce the generation of waste, effectively improve the utilization rate of each component resource, and avoid pollution to the environment.

[0004] A solar photovoltaic panel deformation detection device with publication number CN217738195U improves the detection efficiency of photovoltaic panels, but does not specifically describe the photovoltaic panel deformation detection method; a flexible photovoltaic cell detection and correction method and system with publication number CN 117670880A monitors photovoltaic panels for large deformation during use, but the deformation algorithm of photovoltaic panels during disassembly is highly complex, which reduces the detection efficiency. Summary of the invention

[0005] In view of the shortcomings of the existing methods, the present invention solves the problem of high complexity in the existing methods for detecting photovoltaic panel deformation.

[0006] The technical solution adopted by the present invention is: a photovoltaic panel deformation detection method comprises the following steps:

[0007] Step 1: Collect the distances between the center points of several ROI areas of the photovoltaic panel to be tested and the image acquisition device;

[0008] Step 2: construct a deformation state array, calculate the number of times the element values ​​in the deformation state array and the standard state array are unequal, and use the sum of the unequal numbers to calculate the deformation index.

[0009] As a preferred embodiment of the present invention, the formula of the deformation index is:

[0010]

[0011] Among them, c is the sum of the number of times the element values ​​in the deformed state array and the standard state array are not equal, m is the number of rows of the center points of the ROI area in the photovoltaic panel, and n is the number of columns of the center points of the ROI area in the photovoltaic panel.

[0012] As a preferred implementation manner of the present invention, it also includes step three, using the deformation index to determine whether the photovoltaic panel to be tested is deformed.

[0013] As a preferred embodiment of the present invention, using the deformation index to determine whether the photovoltaic panel to be tested is deformed includes: when the deformation index s>s T When , it is judged that the photovoltaic panel to be tested is deformed; among them, s T is the deformation threshold.

[0014] As a preferred embodiment of the present invention, using the deformation index to determine whether the photovoltaic panel to be tested is deformed also includes: when the deformation index s≤s T and max|array s i -array nor i |>a T When , it is determined that the photovoltaic panel to be tested is deformed; among them, array s i is the value of the i-th element in the deformation state array, array nor i is the value of the i-th element in the standard state array, a T is the inflection point threshold.

[0015] As a preferred embodiment of the present invention, when array s i >array nor i When , the center point of the ROI area of ​​the photovoltaic panel is a convex point.

[0016] As a preferred embodiment of the present invention, when array s i <array nor i When , the center point of the ROI area of ​​the photovoltaic panel is a concave point.

[0017] As a preferred embodiment of the present invention, a photovoltaic panel deformation detection method and system include:

[0018] A first sensor, a second sensor, a controller and an image acquisition device; wherein,

[0019] The first sensor is used to determine whether the photovoltaic panel has reached the sampling position, and trigger the image acquisition device to measure the distance between the center point of the ROI area of ​​the photovoltaic panel and the image acquisition device;

[0020] The second sensor triggers the image acquisition device to measure the distance between the center point of the ROI area of ​​the photovoltaic panel and the image acquisition device according to the displacement of the photovoltaic panel;

[0021] The controller compares the distance between the center point of the ROI area of ​​the photovoltaic panel and the image acquisition device with the standard value of the photovoltaic panel thickness to determine whether the photovoltaic panel is deformed.

[0022] As a preferred embodiment of the present invention, the image acquisition device includes a depth camera.

[0023] As a preferred implementation mode of the present invention, the controller includes: an MCU controller, a single chip microcomputer, and a host computer.

[0024] Beneficial effects of the present invention:

[0025] 1. Use the depth camera to detect the difference between different feature points on the photovoltaic panel and the thickness of the photovoltaic panel, and judge the deformation of the photovoltaic panel to be tested from the overall and local thresholds. The method is simple and practical;

[0026] 2. The deformation detection is completed during the movement of the photovoltaic panel to be detected, which improves the deformation detection efficiency and disassembly efficiency of the photovoltaic panel;

[0027] 3. By testing the photovoltaic panels for deformation before separating the components, the subsequent separation process is selected according to whether deformation occurs, which can effectively avoid problems such as glass breakage or incomplete separation of EVA film caused by the deformation of the photovoltaic panels during the separation operation, thereby reducing the generation of waste, effectively improving the utilization rate of each component resource, and avoiding pollution to the environment. BRIEF DESCRIPTION OF THE DRAWINGS

[0028] Figure 1 is a flow chart of a method for detecting deformation of a photovoltaic panel of the present invention;

[0029] Figure 2 is a schematic diagram of a photovoltaic panel deformation detection device of the present invention;

[0030] Among them, 1. photovoltaic panel, 2. conveyor belt, 3. linear sliding guide, 4. slider, 5. depth camera, 6. first sensor, 7. second sensor, 8. driving motor. DETAILED DESCRIPTION

[0031] The present invention is further described below in conjunction with the accompanying drawings and embodiments. This figure is a simplified schematic diagram, which only illustrates the basic structure of the present invention in a schematic manner, and therefore it only shows the components related to the present invention.

[0032] like Figure 1 As shown, a method for detecting deformation of a photovoltaic panel comprises the following steps:

[0033] Step 1: Collect the distances between the center points of several ROI areas of the photovoltaic panel to be tested and the image acquisition device;

[0034] Step 2: construct a deformation state array, calculate the number of times the element values ​​in the deformation state array and the standard state array are unequal, and use the sum of the unequal numbers to calculate the deformation index.

[0035] The formula for the standard state array is:

[0036]

[0037] Among them, h is the thickness of the photovoltaic panel to be tested, m is the number of rows of the center points of the ROI area in the photovoltaic panel, and n is the number of columns of the center points of the ROI area in the photovoltaic panel; the row refers to the length direction of the photovoltaic panel, and the column refers to the width direction of the photovoltaic panel.

[0038] The formula for the deformation state array is:

[0039]

[0040] Where, d is the distance between the depth camera and the conveyor belt, d mn It is the distance between the center point of the ROI area in the mth row and nth column and the image acquisition device.

[0041] When array s i ≠array nor i When , the count is 1; array s i is the value of the i-th element in the deformation state array, array nor i is the value of the i-th element in the standard state array, i=m*n.

[0042] Taking m=n=3 as an example, array s There is only array in the array s 6 =array nor 6 , then the sum of the unequal times c=3x3-1=8, that is, the center points of 8 ROI areas are deformed convex or concave points.

[0043] The formula for the deformation index is:

[0044]

[0045] Where c is the sum of the number of times the element values ​​in the deformed state array and the standard state array are not equal.

[0046] The method also includes step three, using the deformation index to determine whether the photovoltaic panel to be tested is deformed.

[0047] Specifically include:

[0048] When s>s T When , it is judged that the photovoltaic panel to be tested is deformed; among them, s T is the deformation threshold;

[0049] otherwise,

[0050] When s≤s T and max|array s i -array nor i |>a T When , it is judged that the photovoltaic panel to be tested is deformed;

[0051] Otherwise, s≤s T and max|array s i -array nor i |≤a T When , it is judged that the photovoltaic panel to be tested has not been deformed; where a T is the inflection point threshold.

[0052] When array s i >array nor i When , the center point of the ROI area of ​​the photovoltaic panel is a convex point.

[0053] When array s i <array nor i When , the center point of the ROI area of ​​the photovoltaic panel is a concave point.

[0054] A system for detecting deformation of a photovoltaic panel includes: a first sensor, a second sensor, a controller and an image acquisition device, wherein the first sensor, the second sensor, the image acquisition device and the controller are electrically connected; wherein:

[0055] The first sensor is used to determine whether the photovoltaic panel has reached the sampling position, and trigger the image acquisition device to measure the distance between the center point of the ROI area of ​​the photovoltaic panel and the image acquisition device;

[0056] The sampling position is directly below the linear sliding guide.

[0057] The second sensor triggers the image acquisition device to measure the distance between the center point of the ROI area of ​​the photovoltaic panel and the image acquisition device according to the displacement of the photovoltaic panel;

[0058] The first and second sensors are used to obtain the center point of the ROI area in the m-row and n-column photovoltaic panel, where m and n are custom set in the controller.

[0059] The controller compares the distance between the center point of the ROI area of ​​the photovoltaic panel and the image acquisition device with the standard value of the photovoltaic panel thickness to determine whether the photovoltaic panel is deformed.

[0060] The controller is preset with the size parameters of each type of photovoltaic panel, such as length, width, and thickness; and the number of samples of the center point of the ROI area of ​​the photovoltaic panel, that is, the values ​​of m and n, is preset.

[0061] The controller includes an MCU controller, a single chip microcomputer, a host computer, etc.

[0062] The image acquisition device includes a depth camera, which can measure the distance depth value between the photovoltaic panel to be tested and the depth camera. Specific embodiment:

[0064] The photovoltaic panels to be inspected are transported to the bottom of the image acquisition device through a conveying device, the conveying device includes a conveying belt and a driving motor, and the conveying belt can convey photovoltaic panels of different batches; wherein the size parameters of photovoltaic panels of different batches are different, and the size parameters of photovoltaic panels of the same batch are the same; the conveying belt is kept horizontal and flat;

[0065] The photovoltaic panel is placed on the conveyor belt, the glass component of the photovoltaic panel is in contact with the conveyor belt, the longitudinal axis of the photovoltaic panel and the longitudinal axis of the conveyor belt are located in the same vertical plane, and the longitudinal axis refers to the length direction of the photovoltaic panel;

[0066] The image acquisition device also includes an adjustable linear slide rail, and the depth camera is connected to the linear slide rail through a slider. The linear slide rail is used to control the reasonable movement boundary of the slider, and photovoltaic panels of different sizes can be collected; the maximum movement boundary of the slider is equal to the width of the conveyor belt, and the reasonable movement boundary of the slider is the width of the photovoltaic panels of the current batch to be inspected;

[0067] The depth camera takes vertical photos of the photovoltaic panels;

[0068] When the first sensor senses that the photovoltaic panel reaches directly below the linear sliding guide, the depth camera can be used to collect the center points of several ROI areas in a horizontal direction from left to right, for example, m=3;

[0069] When the second sensor detects that the photovoltaic panel moves a distance of l / 2, the depth camera can be used to collect the center points of several ROI areas horizontally from left to right, where l is the length of the photovoltaic panel;

[0070] When the second sensor detects that the photovoltaic panel moves a distance of l, the depth camera can be used to collect the center points of several ROI areas in a horizontal direction from left to right, and n=3 at this time.

[0071] The depth camera can be used to collect d 11 to d 33 There are 9 depth values ​​in total.

[0072] The present invention uses a depth camera to detect the difference between different feature points on a photovoltaic panel and the thickness of the photovoltaic panel, and judges the deformation of the photovoltaic panel to be tested from two thresholds, namely, overall and local thresholds. The method is simple and highly practical.

[0073] Based on the above ideal embodiments of the present invention, the relevant staff can make various changes and modifications without departing from the technical concept of the present invention through the above description. The technical scope of the present invention is not limited to the contents of the specification, and its technical scope must be determined according to the scope of the claims.

Claims

1. A method for detecting deformation of a photovoltaic panel, characterized in that: The following steps are involved: Step 1: Collect the distances between the center points of several ROI areas of the photovoltaic panel to be tested and the image acquisition device; Step 2: construct a deformation state array, calculate the number of times the element values ​​in the deformation state array and the standard state array are unequal, and use the sum of the unequal numbers to calculate the deformation index.

2. The photovoltaic panel deformation detection method according to claim 1, characterized in that: The formula for the deformation index is: Among them, c is the sum of the number of times the element values ​​in the deformed state array and the standard state array are not equal, m is the number of rows of the center points of the ROI area in the photovoltaic panel, and n is the number of columns of the center points of the ROI area in the photovoltaic panel.

3. The photovoltaic panel deformation detection method according to claim 2, characterized in that: The method also includes step three, using the deformation index to determine whether the photovoltaic panel to be tested is deformed.

4. The photovoltaic panel deformation detection method according to claim 1, characterized in that: Using the deformation index to determine whether the photovoltaic panel under test is deformed includes: when the deformation index s> deformation threshold s T When the photovoltaic panel to be tested is deformed, it is determined that the photovoltaic panel to be tested is deformed.

5. The photovoltaic panel deformation detection method according to claim 1, characterized in that: Using the deformation index to determine whether the photovoltaic panel to be tested is deformed also includes: when the deformation index s ≤ deformation threshold s T and max|array s i -array nor i |>Inflection point threshold a T When , it is determined that the photovoltaic panel to be tested is deformed; among them, array s i is the value of the i-th element in the deformation state array, array nor i is the value of the i-th element in the standard state array.

6. The photovoltaic panel deformation detection method according to claim 5, characterized in that: When array s i >array nor i When , the center point of the ROI area of ​​the photovoltaic panel is a convex point.

7. The photovoltaic panel deformation detection method according to claim 5, characterized in that: When array s i <array nor i When , the center point of the ROI area of ​​the photovoltaic panel is a concave point.

8. A system using the photovoltaic panel deformation detection method of claims 1-7, characterized in that: include: A first sensor, a second sensor, a controller and an image acquisition device; wherein, The first sensor is used to determine whether the photovoltaic panel has reached the sampling position, and trigger the image acquisition device to measure the distance between the center point of the ROI area of ​​the photovoltaic panel and the image acquisition device; The second sensor triggers the image acquisition device to measure the distance between the center point of the ROI area of ​​the photovoltaic panel and the image acquisition device according to the travel displacement of the photovoltaic panel; The controller compares the distance between the center point of the ROI area of ​​the photovoltaic panel and the image acquisition device with the standard value of the photovoltaic panel thickness to determine whether the photovoltaic panel is deformed.

9. The photovoltaic panel deformation detection system according to claim 8, characterized in that: The image acquisition device includes a depth camera.

10. The photovoltaic panel deformation detection system according to claim 8, characterized in that: The controller includes: MCU controller, microcontroller or host computer.

Citation Information

Patent Citations

  • Detection and correction method and system for flexible photovoltaic cell

    CN117670880A

  • Solar photovoltaic panel deformation detection device

    CN217738195U