Temperature calibration method, device and equipment for infrared equipment and storage medium

Abstract

The invention relates to the technical field of temperature calibration, and provides a temperature calibration method, device and equipment for infrared equipment and a storage medium, and the method comprises the steps: determining at least one induction temperature; based on each induction temperature, a blackbody furnace is adopted to carry out temperature detection, and target temperatures detected by the infrared equipment at different radiation source temperatures are obtained; according to each radiation source temperature, the induction temperature and the corresponding target temperature, obtaining a mapping relation among the induction temperature, the radiation source temperature and the target temperature; and calibrating the target temperature to be calibrated based on the mapping relation. According to the embodiment of the invention, the accuracy of temperature detection of the infrared equipment is improved.

Description

Technical Field

[0001] The present application relates to the field of temperature calibration technology, and in particular to a temperature calibration method, device, equipment and storage medium for infrared equipment. Background Art

[0002] Nowadays, infrared devices are widely used in various fields. For example, infrared therapy devices are medical devices that use infrared rays to penetrate human skin to produce thermal effects, thereby achieving therapeutic effects. Due to differences in sensor parts and assembly processes between individual infrared devices, there may be a large deviation between the temperature detected by some infrared devices and the actual temperature. For example, there is a large deviation between the induced temperature measured by the infrared therapy device and the actual temperature. This situation may mislead users to choose an inappropriate treatment mode, thereby affecting the treatment effect of the infrared therapy device.

[0003] Therefore, how to improve the accuracy of temperature detection by infrared equipment has become an urgent problem to be solved. Summary of the invention

[0004] The present application provides a temperature calibration method, device, equipment and storage medium for an infrared device, aiming to improve the accuracy of temperature detection of the infrared device.

[0005] To achieve the above object, the present application provides a temperature calibration method for an infrared device, the temperature calibration method for an infrared device comprising:

[0006] determining at least one sensed temperature;

[0007] Based on each of the induced temperatures, a black body furnace is used to perform temperature detection to obtain a target temperature detected by the infrared device at each different radiation source temperature;

[0008] According to each of the radiation source temperatures, the sensing temperatures and the corresponding target temperatures, a mapping relationship among the sensing temperatures, the radiation source temperatures and the target temperatures is obtained;

[0009] Based on the mapping relationship, the target temperature to be calibrated is calibrated.

[0010] In addition, to achieve the above-mentioned purpose, the present application also provides a temperature calibration device, which includes a memory and a processor;

[0011] The memory is used to store computer programs;

[0012] The processor is used to execute the computer program and implement the steps of the temperature calibration method of the infrared device as described above when executing the computer program.

[0013] In addition, to achieve the above-mentioned purpose, the present application also provides an infrared device, which includes the temperature calibration device as mentioned above.

[0014] In addition, to achieve the above-mentioned purpose, the present application also provides a computer-readable storage medium, wherein the computer-readable storage medium stores a computer program, and when the computer program is executed by a processor, the steps of the temperature calibration method of the above-mentioned infrared device are implemented.

[0015] The present application discloses a temperature calibration method, device, equipment and storage medium for infrared equipment. At least one sensing temperature is determined, and a black body furnace is used to perform temperature detection based on each sensing temperature to obtain a target temperature detected by the infrared equipment at each different radiation source temperature. According to each radiation source temperature, the sensing temperature and the corresponding target temperature, a mapping relationship among the sensing temperature, the radiation source temperature and the target temperature is obtained. Based on the mapping relationship, the target temperature to be calibrated is calibrated, and then the infrared equipment performs temperature detection based on the calibrated target temperature, thereby improving the accuracy of temperature detection of the infrared equipment. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] In order to more clearly illustrate the technical solutions of the embodiments of the present application, the drawings required for use in the description of the embodiments will be briefly introduced below. Obviously, the drawings described below are some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative work.

[0017] Figure 1 is a schematic flow chart of the steps of a temperature calibration method for an infrared device provided in an embodiment of the present application;

[0018] Figure 2 is a schematic diagram of a control interface in an infrared device calibration mode provided in an embodiment of the present application;

[0019] Figure 3 This is a schematic diagram of a display of a warning message that the temperature of a radiation source is too high, provided in an embodiment of the present application;

[0020] Figure 4 It is a schematic diagram of displaying prompt information in temperature calibration during the calibration phase provided by an embodiment of the present application;

[0021] Figure 5 is a schematic diagram of a prompt message showing completion of temperature calibration provided by an embodiment of the present application;

[0022] Figure 6 is a schematic flow chart of steps for calibrating a target temperature to be calibrated based on the mapping relationship provided in an embodiment of the present application;

[0023] Figure 7 It is a schematic block diagram of a temperature calibration device provided in an embodiment of the present application. DETAILED DESCRIPTION

[0024] The following will be combined with the drawings in the embodiments of the present application to clearly and completely describe the technical solutions in the embodiments of the present application. Obviously, the described embodiments are part of the embodiments of the present application, not all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of this application.

[0025] The flowcharts shown in the accompanying drawings are only examples and do not necessarily include all the contents and operations / steps, nor must they be executed in the order described. For example, some operations / steps may also be decomposed, combined or partially merged, so the actual execution order may change according to actual conditions.

[0026] It should be understood that the terms used in this application specification are only for the purpose of describing specific embodiments and are not intended to limit the application. As used in this application specification and the appended claims, unless the context clearly indicates otherwise, the singular forms "a", "an" and "the" are intended to include plural forms.

[0027] It should also be understood that the term “and / or” used in the specification and appended claims refers to any and all possible combinations of one or more of the associated listed items, and includes these combinations.

[0028] Embodiments of the present application provide a temperature calibration method, apparatus, device, and storage medium for an infrared device, which are used to improve the accuracy of temperature detection of the infrared device.

[0029] See also Figure 1 , Figure 1 1 is a flow chart of a temperature calibration method for an infrared device provided in an embodiment of the present application. The method can be applied to a temperature calibration device or to an infrared device, and the present application does not limit the application scenario of the method. The infrared device includes but is not limited to an infrared therapeutic device.

[0030] like Figure 1 As shown, the temperature calibration method of the infrared device specifically includes steps S101 to S104.

[0031] S101. Determine at least one sensed temperature.

[0032] Before introducing temperature calibration, the working process of temperature detection of infrared equipment is explained first. The FLASH memory of the infrared device stores an original data table, which records the mapping relationship between the induced temperature, the radiation source temperature, and the target temperature. Among them, the induced temperature represents the temperature of the object being measured itself. Taking the infrared therapy device as an example, the corresponding induced temperature represents the temperature of human skin. Without considering the influence of radiation source irradiation, the induced temperature is a relatively stable value close to human body temperature. The radiation source temperature represents the radiation source temperature of the infrared device, which can be detected by a temperature sensor set inside the lamp head of the infrared device and close to the surface of the radiation source. The target temperature represents the temperature of the part of the object being measured that is irradiated by the infrared device. The target temperature can be detected by the infrared sensor on the infrared device. Taking the infrared therapy device as an example, the target temperature represents the temperature of the part of the human body that is irradiated by the infrared therapy device during treatment. For example, the original data table of the infrared therapy device is shown in Table 1 below:

[0033] Table 1

[0034]

[0035] Wherein, G represents the induced temperature, F represents the radiation source temperature, and M represents the target temperature, all in °C.

[0036] The original data table is the initial data obtained by the R&D personnel after experimental testing. The specific operation is: aim the lamp head (radiation source) of the infrared therapy device at the black body furnace, then set the black body furnace temperature (sensing temperature), start the infrared therapy device to start treatment, record the different radiation source temperatures during the treatment and the corresponding target temperature at this temperature, and obtain a set of temperature data. For example, in Table 1, the black body furnace temperature is set to 37°C, and in the radiation source temperature range of 25°C-165°C, the radiation source temperature and the corresponding target temperature are recorded every 10°C interval to obtain a column of data. Repeat the above operation, test and record the data at different black body furnace temperatures, summarize all data sets, and generate the original data table shown in Table 1.

[0037] In actual application, the induced temperature is obtained by detecting the radiation source temperature and the target temperature through the infrared therapy device, and then comparing and searching in the original data table (such as Table 1) pre-written in the FLASH memory based on the target temperature and the radiation source temperature, and finding the corresponding induced temperature in the original data table according to the target temperature and the radiation source temperature. For example, if the radiation source temperature is 95°C, the row data of the radiation source temperature of 95°C in Table 1 is automatically queried, and then according to the target temperature, for example, the target temperature is 38.92°C, the induced temperature corresponding to the column of 38.92°C is found to be 37°C, that is, the induced temperature is 37°C, and the induced temperature is automatically displayed as 37°C.

[0038] In order to avoid a large deviation between the induced temperature detected by the infrared device and the actual temperature, the original data table stored in the FLASH memory of the infrared device is calibrated and updated. The induced temperature measured using the updated data table will meet the tolerance requirements between the actual temperature, thereby ensuring the accuracy of temperature detection.

[0039] For the temperature calibration process, the corresponding sensing temperature is first determined. For example, the sensing temperature may be a default setting, or the sensing temperature may be manually set by the user.

[0040] In some embodiments, determining at least one sensed temperature comprises:

[0041] The infrared device is controlled to enter a calibration mode, and the sensed temperature is determined in the calibration mode.

[0042] The infrared device software adds a calibration setting function, and the quality inspector can input a calibration mode start command to control the infrared device to enter the calibration mode. For example, in the calibration mode, the control interface corresponding to the calibration mode is displayed, and multiple sensing temperature options are displayed on the control interface, from which the quality inspector can select operations, and the sensing temperature is determined according to the selection of the quality inspector.

[0043] For example, still taking the infrared device as an infrared therapy device, after the infrared therapy device is turned on, the corresponding control is displayed in the preset area on the display interface of the infrared therapy device. The quality inspector performs the corresponding touch operation based on the control and inputs the command to start the calibration mode to control the infrared therapy device to enter the calibration mode. For example, a control such as "Model Name: ***" is displayed in the upper left corner of the display interface of the infrared therapy device. If the quality inspector clicks it multiple times (for example, five times) and inputs the command to start the calibration mode, the infrared therapy device automatically enters the calibration mode and displays the control interface corresponding to the calibration mode, for example, Figure 2 The "engineer interface" shown in the figure displays multiple sensing temperature options, such as "30°C", "37°C", "45°C", etc. If the quality inspector clicks "30°C", the sensing temperature is determined to be 30°C.

[0044] In some embodiments, controlling the infrared device to enter a calibration mode, and determining the sensed temperature in the calibration mode, comprises:

[0045] After the infrared device enters the calibration mode, the current radiation source temperature is detected;

[0046] If the current radiation source temperature is less than or equal to a preset temperature threshold, determining the sensed temperature;

[0047] If the current radiation source temperature is greater than the preset temperature threshold, a warning message indicating that the radiation source temperature is too high is output and / or a temperature reduction process is performed.

[0048] In order to reduce the interference of the radiation source temperature on the sensing temperature during calibration, a preset temperature threshold for judging the influence of the radiation source temperature interference is pre-set. For example, the preset temperature threshold is set to 30°C. It should be noted that the preset temperature threshold can be flexibly set according to actual conditions and is not specifically limited in this application.

[0049] After the infrared device enters the calibration mode, before starting the automatic calibration operation, the current radiation source temperature is detected first. If the current radiation source temperature is less than or equal to the preset temperature threshold, such as less than 30°C, it means that the automatic calibration operation can be started at this time, and the calibration stage is smoothly entered to determine the sensing temperature. If the current radiation source temperature is greater than the preset temperature threshold, such as greater than 30°C, it means that the radiation source temperature may interfere with the sensing temperature. At this time, a warning message that the radiation source temperature is too high is output, and / or a cooling process is performed, such as turning on the exhaust fan on the infrared device for cooling.

[0050] For example, still taking the infrared device as an infrared therapy device, if the current radiation source temperature is greater than 30°C, Figure 3 As shown, a prompt message such as "the temperature of the radiation source is greater than 30°C" is displayed in the control interface.

[0051] When the temperature of the radiation source is greater than 30°C, the infrared therapy device cannot enter the calibration stage, and the exhaust fan of the infrared therapy device is automatically turned on, and the exhaust fan is used to accelerate the cooling until the temperature of the radiation source is less than 30°C, and the exhaust fan is stopped. Exemplarily, the exhaust fan has multiple wind speed gears. During the cooling process, the wind speed gear of the exhaust fan will be automatically adjusted according to the detected temperature of the radiation source to shorten the cooling time. For example, the exhaust fan has three wind speed gears: high, medium, and low. If the detected radiation source temperature value is higher than temperature value A (such as 80°C), the exhaust fan enters the high speed gear; if the radiation source temperature is between temperature value B and temperature value A (such as between 45°C-80°C), the exhaust fan enters the medium speed gear; if the radiation source temperature is between temperature value C and temperature value B (such as between 30°C-45°C), the exhaust fan enters the low speed gear; if the radiation source temperature is lower than temperature value C (such as 30°C), the exhaust fan is stopped. At this time, the prompt message "The radiation source temperature is greater than 30°C" on the control interface disappears automatically.

[0052] S102: Perform temperature detection using a black body furnace based on each of the sensed temperatures to obtain a target temperature detected by the infrared device at each different radiation source temperature.

[0053] The quality inspector operates the lamp head to aim at the black body furnace and sets the temperature of the black body furnace to the sensing temperature. After the temperature of the black body furnace becomes constant, the infrared equipment automatically starts the calibration operation to detect and record the target temperature under different radiation source temperatures.

[0054] In order to ensure the effectiveness of the target temperature detected by the infrared sensor during calibration, when the quality inspector operates the lamp head to aim at the black body furnace, the distance between the lamp head and the black body furnace is required to be within a preset distance range, such as 0.2-0.3m. For example, the distance between the lamp head and the black body furnace is set to 0.25m.

[0055] For example, during the calibration phase, prompt information for temperature calibration is output. For example, still taking the infrared therapy device as an example, the quality inspector sets the temperature of the black body furnace to 30°C. After the temperature of the black body furnace is constant, click Figure 2 Select the "30°C" option shown in the figure to start calibration. Figure 4 As shown, a prompt message such as "Calibrating 30°C" is displayed on the control interface. If the "37°C" or "45°C" option is selected, the black body furnace temperature is set to the corresponding 37°C or 45°C, and the control interface prompts that 37°C or 45°C is being calibrated.

[0056] During the calibration process, the infrared device automatically detects and records the target temperature corresponding to the radiation source temperature at every 10°C interval in the range of 25°C-165°C, and automatically compares the newly detected target temperature with the target temperature recorded in the original data table to determine whether the temperature difference between the newly detected target temperature and the target temperature recorded in the original data table is within the allowable error range (for example, ±2°C). If the temperature difference between the newly detected target temperature and the target temperature recorded in the original data table exceeds the allowable error range, the target temperature recorded in the original data table is automatically replaced by the newly detected target temperature. If the temperature difference between the newly detected target temperature and the target temperature recorded in the original data table is within the allowable error range, there is no need to update the target temperature recorded in the original data table. After the temperature calibration operation corresponding to each sensed temperature is completed, a prompt message indicating that the temperature calibration corresponding to the sensed temperature is completed is output. For example, if the temperature calibration of the sensed temperature of 30°C is completed, such as Figure 5 As shown, a prompt message such as "Complete calibration at 30°C" is displayed on the control interface. All temperature data will be automatically stored in the FLASH memory. The entire calibration process does not require manual supervision, which is very convenient.

[0057] S103. Obtain a mapping relationship among the sensing temperature, the radiation source temperature, and the target temperature according to each of the radiation source temperatures, the sensing temperature, and the corresponding target temperature.

[0058] In order to improve the calibration efficiency and shorten the overall calibration cycle, in the calibration mode, not all temperature data are calibrated according to the original data table, but a part of the induced temperatures are selected and the target temperature calibration is performed in the above manner. Afterwards, the mapping relationship between the induced temperature, the radiation source temperature and the target temperature is obtained according to each selected induced temperature, the corresponding radiation source temperature and the target temperature. Therefore, based on the obtained mapping relationship, the target temperatures corresponding to the remaining induced temperature numbers can be calibrated.

[0059] For example, still taking the infrared therapy device as an example, 30℃-45℃ is the most common sensing temperature range of the infrared therapy device during actual use. Selecting the target temperature series corresponding to the three sets of sensing temperatures of 30℃, 37℃, and 45℃ in Table 1 for calibration can reduce sampling bias, thereby improving the reliability and accuracy of the calibration procedure.

[0060] In some embodiments, obtaining a mapping relationship between the sensing temperature, the radiation source temperature, and the target temperature according to each of the radiation source temperatures, the sensing temperature, and the corresponding target temperature includes:

[0061] Linear analysis is performed on the multiple sensed temperatures and the corresponding target temperature at each radiation source temperature to obtain the mapping relationship at each radiation source temperature.

[0062] For example, according to the target temperatures corresponding to the radiation source temperature of 35°C and the sensing temperatures of 30°C, 37°C, and 45°C, the linear relationship between the sensing temperature and the target temperature at the radiation source temperature of 35°C is analyzed to obtain the temperature mapping relationship at the radiation source temperature of 35°C. Further, according to the target temperatures corresponding to the radiation source temperature of 45°C and the sensing temperatures of 30°C, 37°C, and 45°C, the linear relationship between the sensing temperature and the target temperature at the radiation source temperature of 45°C is analyzed to obtain the temperature mapping relationship at the radiation source temperature of 35°C. In this way, the temperature mapping relationship at the radiation source temperature of every 10°C interval in the range of 25°C-165°C is obtained.

[0063] In some embodiments, the linear analysis is performed on the plurality of sensed temperatures and the corresponding target temperature at each radiation source temperature to obtain the mapping relationship at each radiation source temperature, including:

[0064] According to the first target temperature corresponding to the first sensing temperature and the second target temperature corresponding to the second sensing temperature at each radiation source temperature, linear fitting parameters are calculated for the first sensing temperature and the first target temperature, as well as the second sensing temperature and the second target temperature, to obtain the mapping relationship corresponding to the temperature range of the first sensing temperature and the second sensing temperature at each radiation source temperature.

[0065] Exemplarily, the target temperature increases as the sensed temperature increases, showing a linear positive correlation. According to the linear fitting function t=kT+b, with the sensed temperature as the independent variable T and the target temperature as the dependent variable t, the linear fitting parameters k and b in the function are calculated, thereby accurately correcting the target temperature within the entire temperature range.

[0066] According to the first sensing temperature T1, the first target temperature t1, the second sensing temperature T2, and the second target temperature t2 corresponding to each radiation source temperature, they are substituted into the linear fitting function, and we have:

[0067]

[0068] Therefore, the linear fitting parameters k and b can be calculated as:

[0069]

[0070] After the linear fitting parameters k and b are determined, the linear mapping relationship between the induced temperature and the target temperature at each radiation source temperature is obtained.

[0071] For example, in the sensing temperature range of 30°C-37°C, at every 10°C interval of the radiation source temperature in the range of 25°C-165°C, the sensing temperature of 30°C and the corresponding target temperature detected are substituted into the linear fitting function, and the sensing temperature of 37°C and the corresponding target temperature detected are substituted into the linear fitting function, and the linear mapping relationship between the sensing temperature and the target temperature in the sensing temperature range of 30°C-37°C at every 10°C interval of the radiation source temperature in the range of 25°C-165°C is calculated.

[0072] Similarly, in the sensing temperature range of 37°C-45°C, at every 10°C interval of the radiation source temperature in the range of 25°C-165°C, the sensing temperature of 37°C and the corresponding target temperature detected are substituted into the linear fitting function, and the sensing temperature of 45°C and the corresponding target temperature detected are substituted into the linear fitting function, and the linear mapping relationship between the sensing temperature and the target temperature in the sensing temperature range of 37°C-45°C at every 10°C interval of the radiation source temperature in the range of 25°C-165°C is calculated.

[0073] S104: Calibrate the target temperature to be calibrated based on the mapping relationship.

[0074] For example, taking the linear mapping relationship between the induced temperature and the target temperature in the range of 30℃-37℃ at the radiation source temperature of every 10℃ interval in the range of 25℃-165℃ as an example, T is taken as 33℃, and based on the linear mapping relationship, the target temperature corresponding to each radiation source temperature and the induced temperature of 33℃ is calculated, and the target temperature corresponding to each radiation source temperature and the induced temperature of 33℃ in the original data table is calibrated based on the calculated target temperature. For example, the target temperature recorded in the original data table is replaced with the calculated target temperature corresponding to each radiation source temperature and the induced temperature of 33℃. And taking T as 35℃, the target temperature corresponding to each radiation source temperature and the induced temperature of 35℃ is calculated, and the target temperature corresponding to each radiation source temperature and the induced temperature of 35℃ recorded in the original data table is replaced with the calculated target temperature.

[0075] Similarly, based on the linear mapping relationship between the induced temperature in the range of 37°C-45°C and the target temperature at every 10°C interval of the radiation source temperature in the range of 25°C-165°C, T is taken as 39°C, 41°C, and 43°C respectively, and the target temperature corresponding to each radiation source temperature and the induced temperature of 39°C, the target temperature corresponding to each radiation source temperature and the induced temperature of 41°C, and the target temperature corresponding to each radiation source temperature and the induced temperature of 43°C are calculated, and the calculation results are used to replace the corresponding target temperatures in the original data table.

[0076] In the above examples, the sensing temperature range is divided into two segments: 30℃-37℃ interval and 37℃-45℃ interval. The linear fitting function is used separately in each segment for calculation, that is, a multi-segment broken line chain is used to replace the real nonlinear curve, which not only improves the calculation accuracy, but also has a simple algorithm, small amount of calculation and fast data update speed.

[0077] It is understandable that, in addition to the above-mentioned method of dividing the sensing temperature range into two segments, the sensing temperature range may also be unsegmented or divided into more segments. The specific segmentation method is not specifically limited in this application.

[0078] In some embodiments, Figure 6 As shown, step S104 may include sub-step S1041 and sub-step S1042.

[0079] S1041. Determine, based on the mapping relationship, a mapped target temperature corresponding to the target temperature to be calibrated at each radiation source temperature;

[0080] S1042: If the target temperature to be calibrated does not match the mapped target temperature, update the target temperature to be calibrated to the mapped target temperature.

[0081] The target temperature corresponding to each radiation source temperature and the sensing temperature is calculated in the above manner. For the convenience of distinguishing the description, the calculated target temperature is referred to as the mapping target temperature below. The target temperature recorded in the original data table is the target temperature to be calibrated. The calculated mapping target temperature is compared with the corresponding target temperature to be calibrated in the original data table to determine whether the target temperature to be calibrated matches the mapping target temperature, that is, to determine whether the deviation between the target temperature to be calibrated and the mapping target temperature is too large. If the target temperature to be calibrated does not match the mapping target temperature, the target temperature to be calibrated recorded in the original data table is updated to the calculated mapping target temperature. If the target temperature to be calibrated matches the mapping target temperature, there is no need to replace the target temperature to be calibrated, that is, there is no need to update the target temperature to be calibrated.

[0082] In some embodiments, the temperature calibration method of the infrared device further includes:

[0083] calculating a temperature difference between the target temperature to be calibrated and the mapped target temperature;

[0084] If the temperature difference is less than or equal to a preset temperature difference threshold, determining that the target temperature to be calibrated matches the mapped target temperature;

[0085] If the temperature difference is greater than the preset temperature difference threshold, it is determined that the target temperature to be calibrated does not match the mapped target temperature.

[0086] Exemplarily, the preset temperature difference threshold may be set to 2° C. It should be noted that the preset temperature difference threshold may be flexibly set according to actual conditions and is not specifically limited in the present application.

[0087] By calculating the temperature difference between the mapped target temperature and the corresponding target temperature to be calibrated, it is determined whether the temperature difference is greater than the preset temperature difference threshold, such as whether the temperature difference is greater than 2°C. If the temperature difference is greater than the preset temperature difference threshold (such as greater than 2°C) and exceeds the allowable error range, it is determined that the target temperature to be calibrated does not match the mapped target temperature. At this time, the calculated mapped target temperature is automatically used to replace the target temperature to be calibrated recorded in the original data table. If the temperature difference is less than or equal to the preset temperature difference threshold (such as less than 2°C) and is within the allowable error range, it is determined that the target temperature to be calibrated matches the mapped target temperature. At this time, there is no need to update the target temperature to be calibrated recorded in the original data table.

[0088] After all the target temperature data to be calibrated in the original data table are processed and updated according to the above processing method, a complete updated data table can be obtained. The infrared device writes the updated data table into the FLASH memory for storage to meet the actual use requirements of the infrared device. When in use, the infrared device can ensure that the deviation between the sensed temperature output and the actual temperature is within the allowable error range based on the calibrated data table, thereby solving the problem of large sensed temperature deviation.

[0089] In the above embodiment, by determining at least one sensing temperature, a black body furnace is used to perform temperature detection based on each sensing temperature, and the target temperature detected by the infrared device at each different radiation source temperature is obtained. According to each radiation source temperature, the sensing temperature and the corresponding target temperature, a mapping relationship between the sensing temperature, the radiation source temperature and the target temperature is obtained. Based on the mapping relationship, the target temperature to be calibrated is calibrated, and then the infrared device performs temperature detection based on the calibrated target temperature, thereby improving the accuracy of temperature detection of the infrared device.

[0090] See also Figure 7 , Figure 7 It is a schematic block diagram of a temperature calibration device provided in an embodiment of the present application. The temperature calibration device can be configured in an infrared device to execute the aforementioned temperature calibration method of the infrared device.

[0091] like Figure 7 As shown, the temperature calibration device 200 may include a processor 210 and a memory 220, wherein the processor 210 and the memory 220 are connected via a bus, such as an I2C (Inter-integrated Circuit) bus.

[0092] Specifically, the processor 210 may be a micro-controller unit (MCU), a central processing unit (CPU), or a digital signal processor (DSP).

[0093] Specifically, the memory 220 may be a Flash chip, a read-only memory (ROM) disk, an optical disk, a USB disk, or a mobile hard disk, etc. The memory 220 stores various computer programs for the processor 210 to execute.

[0094] The processor 210 is used to run a computer program stored in the memory, and implements the following steps when executing the computer program:

[0095] determining at least one sensed temperature;

[0096] Based on each of the induced temperatures, a black body furnace is used to perform temperature detection to obtain a target temperature detected by the infrared device at each different radiation source temperature;

[0097] According to each of the radiation source temperatures, the sensing temperatures and the corresponding target temperatures, a mapping relationship among the sensing temperatures, the radiation source temperatures and the target temperatures is obtained;

[0098] Based on the mapping relationship, the target temperature to be calibrated is calibrated.

[0099] In some embodiments, when the processor 210 implements obtaining a mapping relationship between the sensing temperature, the radiation source temperature, and the target temperature according to each of the radiation source temperatures, the sensing temperature, and the corresponding target temperature, it is configured to implement:

[0100] Linear analysis is performed on the multiple sensed temperatures and the corresponding target temperature at each radiation source temperature to obtain the mapping relationship at each radiation source temperature.

[0101] In some embodiments, when the processor 210 performs linear analysis on the multiple sensed temperatures and the corresponding target temperatures at each radiation source temperature to obtain the mapping relationship at each radiation source temperature, it is configured to implement:

[0102] According to the first target temperature corresponding to the first sensing temperature and the second target temperature corresponding to the second sensing temperature at each radiation source temperature, linear fitting parameters are calculated for the first sensing temperature and the first target temperature, as well as the second sensing temperature and the second target temperature, to obtain the mapping relationship corresponding to the temperature range of the first sensing temperature and the second sensing temperature at each radiation source temperature.

[0103] In some embodiments, when the processor 210 implements the calibration of the target temperature to be calibrated based on the mapping relationship, it is configured to implement:

[0104] Based on the mapping relationship, determining a mapped target temperature corresponding to the target temperature to be calibrated at each radiation source temperature;

[0105] If the target temperature to be calibrated does not match the mapped target temperature, the target temperature to be calibrated is updated to the mapped target temperature.

[0106] In some embodiments, the processor 210 is further configured to implement:

[0107] calculating a temperature difference between the target temperature to be calibrated and the mapped target temperature;

[0108] If the temperature difference is less than or equal to a preset temperature difference threshold, determining that the target temperature to be calibrated matches the mapped target temperature;

[0109] If the temperature difference is greater than the preset temperature difference threshold, it is determined that the target temperature to be calibrated does not match the mapped target temperature.

[0110] In some embodiments, the processor 210, when implementing the determining of at least one sensed temperature, is configured to implement:

[0111] The infrared device is controlled to enter a calibration mode, and the sensed temperature is determined in the calibration mode.

[0112] In some embodiments, the processor 210, when implementing the control of the infrared device to enter a calibration mode and determining the sensed temperature in the calibration mode, is configured to implement:

[0113] After the infrared device enters the calibration mode, the current radiation source temperature is detected;

[0114] If the current radiation source temperature is less than or equal to a preset temperature threshold, determining the sensed temperature;

[0115] If the current radiation source temperature is greater than the preset temperature threshold, a warning message indicating that the radiation source temperature is too high is output and / or a temperature reduction process is performed.

[0116] The temperature calibration device 200 can execute the temperature calibration method of the infrared device provided in the embodiment of the present application. Therefore, it can achieve the beneficial effects that can be achieved by the temperature calibration method of the infrared device provided in the embodiment of the present application. Please refer to the previous embodiment for details and will not be repeated here.

[0117] An infrared device is also provided in an embodiment of the present application. The infrared device includes a temperature calibration device. The temperature calibration device can be Figure 7 The temperature calibration device 200 shown in FIG. Therefore, the infrared device can achieve the beneficial effects that can be achieved by the temperature calibration method of the infrared device provided in the embodiment of the present application, as detailed in the previous embodiment, which will not be repeated here.

[0118] An embodiment of the present application further provides a computer-readable storage medium, on which a computer program is stored. When the computer program is executed by a processor, the steps of the temperature calibration method of the infrared device as described above are implemented.

[0119] The computer-readable storage medium may be an internal storage unit of the temperature calibration device or infrared device described in the above embodiments, such as a hard disk or memory of the temperature calibration device or infrared device. The computer-readable storage medium may also be an external storage device of the temperature calibration device or infrared device, such as a plug-in hard disk, a smart memory card (Smart Media Card, SMC), a secure digital card (Secure Digital Card, SD Card), a flash card (Flash Card), etc., equipped on the temperature calibration device or infrared device.

[0120] Since the computer program stored in the storage medium can execute any temperature calibration method for an infrared device provided in the embodiments of the present application, the beneficial effects that can be achieved by any temperature calibration method for an infrared device provided in the embodiments of the present application can be achieved. Please refer to the previous embodiments for details and will not be repeated here.

[0121] It should be noted that, in this article, the terms "include", "comprises" or any other variations thereof are intended to cover non-exclusive inclusion, so that a process, method, article or system including a series of elements includes not only those elements, but also other elements not explicitly listed, or also includes elements inherent to such process, method, article or system. In the absence of further restrictions, an element defined by the sentence "comprises a ..." does not exclude the existence of other identical elements in the process, method, article or system including the element.

[0122] The above description is only a specific implementation mode of the present application, but the protection scope of the present application is not limited thereto. Any technician familiar with the technical field can easily think of various equivalent modifications or substitutions within the technical scope disclosed in the present application, and these modifications or substitutions should be included in the protection scope of the present application.

Claims

1. A temperature calibration method for an infrared device, characterized in that: The temperature calibration method of the infrared device comprises: determining at least one sensed temperature; Based on each of the induced temperatures, a black body furnace is used to perform temperature detection to obtain a target temperature detected by the infrared device at each different radiation source temperature; According to each of the radiation source temperatures, the sensing temperatures and the corresponding target temperatures, a mapping relationship among the sensing temperatures, the radiation source temperatures and the target temperatures is obtained; Based on the mapping relationship, the target temperature to be calibrated is calibrated.

2. The temperature calibration method of infrared equipment according to claim 1, characterized in that: The obtaining, according to each of the radiation source temperatures, the sensing temperatures and the corresponding target temperatures, a mapping relationship among the sensing temperatures, the radiation source temperatures and the target temperatures comprises: Linear analysis is performed on the multiple sensed temperatures and the corresponding target temperature at each radiation source temperature to obtain the mapping relationship at each radiation source temperature.

3. The temperature calibration method of infrared equipment according to claim 2, characterized in that: The linear analysis is performed on the plurality of induced temperatures and the corresponding target temperature at each radiation source temperature to obtain the mapping relationship at each radiation source temperature, including: According to the first target temperature corresponding to the first sensing temperature and the second target temperature corresponding to the second sensing temperature at each radiation source temperature, linear fitting parameters are calculated for the first sensing temperature and the first target temperature, as well as the second sensing temperature and the second target temperature, to obtain the mapping relationship corresponding to the temperature range of the first sensing temperature and the second sensing temperature at each radiation source temperature.

4. The temperature calibration method of infrared equipment according to claim 1, characterized in that: The calibrating the target temperature to be calibrated based on the mapping relationship includes: Based on the mapping relationship, determining a mapped target temperature corresponding to the target temperature to be calibrated at each radiation source temperature; If the target temperature to be calibrated does not match the mapped target temperature, the target temperature to be calibrated is updated to the mapped target temperature.

5. The temperature calibration method of infrared equipment according to claim 4, characterized in that: The method further comprises: calculating a temperature difference between the target temperature to be calibrated and the mapped target temperature; If the temperature difference is less than or equal to a preset temperature difference threshold, determining that the target temperature to be calibrated matches the mapped target temperature; If the temperature difference is greater than the preset temperature difference threshold, it is determined that the target temperature to be calibrated does not match the mapped target temperature.

6. The temperature calibration method of infrared equipment according to claim 1, characterized in that: The determining of at least one sensed temperature comprises: The infrared device is controlled to enter a calibration mode, and the sensed temperature is determined in the calibration mode.

7. The temperature calibration method of infrared equipment according to claim 6, characterized in that: The controlling the infrared device to enter a calibration mode and determining the sensed temperature in the calibration mode includes: After the infrared device enters the calibration mode, it detects the current temperature of the radiation source; If the current radiation source temperature is less than or equal to a preset temperature threshold, determining the sensing temperature; If the current radiation source temperature is greater than the preset temperature threshold, a warning message indicating that the radiation source temperature is too high is output and / or a temperature reduction process is performed.

8. A temperature calibration device, characterized in that: The temperature calibration device includes a memory and a processor; The memory is used to store computer programs; The processor is used to execute the computer program and implement the steps of the temperature calibration method of the infrared device according to any one of claims 1 to 7 when executing the computer program.

9. An infrared device, characterized in that: The infrared device comprises a temperature calibration apparatus as claimed in claim 8.

10. A computer-readable storage medium, characterized in that: The computer-readable storage medium stores a computer program, and when the computer program is executed by a processor, the steps of the temperature calibration method of the infrared device according to any one of claims 1 to 7 are implemented.

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