Semiconductor warehouse-in and warehouse-out management and control method and device

Abstract

The invention provides a semiconductor warehouse-in and warehouse-out management and control method and device, and the method comprises the steps: determining at least one warehouse-in detection item of a to-be-warehoused target semiconductor in response to a warehouse-in request; for each warehousing detection item, obtaining original product parameters of the target semiconductor required by the warehousing detection item; determining whether all warehousing detection items are qualified or not according to all obtained original product parameters; if all the warehousing detection items are qualified, executing warehousing operation; in response to the ex-warehouse request, generating an ex-warehouse code of the target semiconductor to be ex-warehouse, and executing ex-warehouse detection at the same time; if the ex-warehouse detection is qualified, executing ex-warehouse operation, and generating ex-warehouse information; wherein the delivery information comprises the delivery code. According to the scheme, the warehouse-in and warehouse-out management and control efficiency and accuracy can be effectively improved.

Description

Technical Field

[0001] The present application relates to the field of semiconductor technology, and more particularly to a method and device for controlling the entry and exit of semiconductors. Background Art

[0002] With the rapid development of the semiconductor industry, the requirements for efficiency and accuracy in production and supply chain management are constantly increasing. In the semiconductor manufacturing process, the management of raw materials, semi-finished products and finished products is one of the core links of the entire supply chain. Through efficient inbound and outbound control, the efficiency of material management can be improved, errors can be reduced, and the execution effect of production plans can be improved. However, the existing semiconductor inbound and outbound control methods still face many challenges, which affect their application effect and the degree of matching with industry needs.

[0003] At present, the commonly used methods of warehouse entry and exit control in the semiconductor industry include: scanning the barcode on the material label to realize automatic recording of warehouse entry and exit. In some enterprises, warehouse entry and exit information is mainly recorded manually. However, in the management of high-value materials, manual barcode scanning and registration are prone to problems such as missed scanning, wrong scanning or registration errors, resulting in inventory information that is inconsistent with the actual situation. As a result, it may cause shortages or waste of materials in subsequent processes. Summary of the invention

[0004] In view of this, the purpose of the present application is to provide a method and device for controlling the entry and exit of semiconductors, which can effectively improve the efficiency and accuracy of entry and exit control.

[0005] The present application provides a method for controlling the entry and exit of semiconductors, the method comprising:

[0006] In response to the warehousing request, determining at least one warehousing inspection item of the target semiconductor to be stored;

[0007] For each warehousing inspection item, obtaining original product parameters of the target semiconductor required for the warehousing inspection item;

[0008] Determine whether all incoming inspection items are qualified based on all the original product parameters obtained;

[0009] If all the warehousing inspection items are qualified, the warehousing operation is carried out;

[0010] In response to a warehouse-out request, a shipping code of a target semiconductor to be shipped out is generated, and a warehouse-out inspection is performed simultaneously;

[0011] If the outbound inspection is qualified, the outbound operation is executed and outbound information is generated; wherein the outbound information includes the shipping code.

[0012] Optionally, determining whether all incoming inspection items are qualified based on all acquired original product parameters includes:

[0013] For each incoming inspection item, determine whether the original product parameters corresponding to the incoming inspection item are within the corresponding control limits;

[0014] If it is, it is determined that the warehousing inspection item is qualified; otherwise, it is determined that the warehousing inspection item is unqualified.

[0015] Optionally, when it is determined that any of the warehousing inspection items is unqualified, the control method includes:

[0016] Generate a storage failure report for the target semiconductor, send the storage failure report to the target person, and execute a storage prohibition operation at the same time.

[0017] Optionally, when performing the warehousing operation, the control method further includes:

[0018] Generate a warehousing report for the target semiconductor according to the original product parameters and warehousing inspection items of the target semiconductor;

[0019] The inventory information in the inventory management system is updated according to the inventory entry report of the target semiconductor.

[0020] Optionally, in response to the outbound request of the target semiconductor, generating the shipping code of the target semiconductor and performing outbound detection at the same time include:

[0021] In response to the outbound request, verify the outbound request according to the inventory information;

[0022] When the outbound request is verified, a unique shipping code for the target semiconductor to be outbound is generated according to the preset coding rules;

[0023] According to the preset outbound inspection items, the target semiconductor to be outbound is inspected;

[0024] When all outbound inspection items are qualified, the outbound inspection is determined to be qualified; otherwise, the outbound inspection is determined to be unqualified.

[0025] Optionally, after generating the outbound information, the management and control method further includes:

[0026] The outbound information is transmitted to a statistical process control system, and the product information in the statistical process control system is updated.

[0027] Optionally, when the target semiconductor to be stored completes the inspection at the final quality inspection node and reaches the storage node, a storage request is sent.

[0028] The embodiment of the present application also provides a semiconductor storage and access control device, the control device comprising:

[0029] A first response module, configured to determine at least one storage inspection item of the target semiconductor to be stored in response to the storage request;

[0030] An acquisition module, used for acquiring, for each warehousing inspection item, original product parameters of the target semiconductor required for the warehousing inspection item;

[0031] The first determination module is used to determine whether all incoming inspection items are qualified based on all the original product parameters obtained;

[0032] The first execution module is used to execute the warehousing operation if all warehousing inspection items are qualified;

[0033] A second response module, for generating a shipping code of a target semiconductor to be shipped out in response to a shipping request, and performing a shipping inspection at the same time;

[0034] The second execution module is used to execute the outbound operation and generate outbound information if the outbound inspection is qualified; wherein the outbound information includes the shipping code.

[0035] Optionally, when the first determination module is used to determine whether all incoming inspection items are qualified according to all acquired original product parameters, the first determination module is used to:

[0036] For each incoming inspection item, determine whether the original product parameters corresponding to the incoming inspection item are within the corresponding control limits;

[0037] If it is, it is determined that the warehousing inspection item is qualified; otherwise, it is determined that the warehousing inspection item is unqualified.

[0038] Optionally, the control device further includes a prohibition module, and the prohibition module is used to:

[0039] When it is determined that any of the warehousing inspection items is unqualified, an warehousing unqualified report of the target semiconductor is generated, and the warehousing unqualified report is sent to the target person, and a warehousing prohibition operation is performed at the same time.

[0040] Optionally, the first execution module is further used for:

[0041] Generate a warehousing report for the target semiconductor according to the original product parameters and warehousing inspection items of the target semiconductor;

[0042] The inventory information in the inventory management system is updated according to the inventory entry report of the target semiconductor.

[0043] Optionally, when the second execution module is used to respond to the outbound request of the target semiconductor, generate the shipping code of the target semiconductor, and perform outbound detection at the same time, the second execution module is used to:

[0044] In response to the outbound request, verify the outbound request according to the inventory information;

[0045] When the outbound request is verified, a unique shipping code for the target semiconductor to be outbound is generated according to the preset coding rules;

[0046] According to the preset outbound inspection items, the target semiconductor to be outbound is inspected;

[0047] When all outbound inspection items are qualified, the outbound inspection is determined to be qualified; otherwise, the outbound inspection is determined to be unqualified.

[0048] Optionally, the control device further includes an updating module, and the updating module is used to:

[0049] After the outbound information is generated, the outbound information is transmitted to a statistical process control system, and the product information in the statistical process control system is updated.

[0050] Optionally, the first response module is also used to send a warehousing request when the target semiconductor to be stored completes the inspection of the final quality inspection node and arrives at the warehousing node.

[0051] An embodiment of the present application also provides an electronic device, comprising: a processor, a memory and a bus, wherein the memory stores machine-readable instructions executable by the processor, and when the electronic device is running, the processor and the memory communicate through the bus, and when the machine-readable instructions are executed by the processor, the steps of the above-mentioned control method are performed.

[0052] An embodiment of the present application also provides a computer-readable storage medium, on which a computer program is stored. When the computer program is executed by a processor, the steps of the control method described above are executed.

[0053] An embodiment of the present application provides a semiconductor warehousing and out-of-warehouse management method and device, the method comprising: in response to a warehousing request, determining at least one warehousing inspection item for a target semiconductor to be put into the warehouse; for each warehousing inspection item, obtaining the original product parameters of the target semiconductor required for the warehousing inspection item; determining whether all warehousing inspection items are qualified based on all the obtained original product parameters; if all warehousing inspection items are qualified, executing the warehousing operation; in response to a warehouse exit request, generating a shipping code for the target semiconductor to be shipped out, and simultaneously executing a warehouse exit inspection; if the warehouse exit inspection is qualified, executing a warehouse exit operation and generating warehouse exit information; wherein the warehouse exit information includes the shipping code.

[0054] In this way, this solution ensures that the target semiconductor products meet the technical requirements and quality standards before entering the warehouse by confirming each entry inspection item, avoiding unqualified products from entering the warehouse at the source and improving the overall inventory product quality. In addition, the inspection is performed again at the exit stage to ensure that the final state of the exit product meets the requirements, effectively reducing the risk of returns and after-sales problems.

[0055] Therefore, through the above control methods, it is possible to achieve efficient inventory management, perfect data traceability, and comprehensively optimize the production and supply chain processes while ensuring product quality.

[0056] In order to make the above-mentioned objects, features and advantages of the present application more obvious and easy to understand, preferred embodiments are specifically cited below and described in detail with reference to the attached drawings. BRIEF DESCRIPTION OF THE DRAWINGS

[0057] In order to more clearly illustrate the technical solutions of the embodiments of the present application, the drawings required for use in the embodiments will be briefly introduced below. It should be understood that the following drawings only show certain embodiments of the present application and therefore should not be regarded as limiting the scope. For ordinary technicians in this field, other related drawings can be obtained based on these drawings without paying creative work.

[0058] Figure 1 A flowchart of a semiconductor storage and warehousing control method provided in an embodiment of the present application;

[0059] Figure 2 One of the structural schematic diagrams of a semiconductor storage and access control device provided in an embodiment of the present application;

[0060] Figure 3 A second structural schematic diagram of a semiconductor storage and access control device provided in an embodiment of the present application;

[0061] Figure 4 A schematic diagram of the structure of an electronic device provided in an embodiment of the present application. DETAILED DESCRIPTION

[0062] To make the purpose, technical scheme and advantages of the embodiments of the present application clearer, the technical scheme in the embodiments of the present application will be clearly and completely described below in conjunction with the drawings in the embodiments of the present application. Obviously, the described embodiments are only a part of the embodiments of the present application, rather than all of the embodiments. The components of the embodiments of the present application usually described and shown in the drawings here can be arranged and designed in various different configurations. Therefore, the following detailed description of the embodiments of the present application provided in the drawings is not intended to limit the scope of the application claimed for protection, but merely represents the selected embodiments of the present application. Based on the embodiments of the present application, each other embodiment obtained by those skilled in the art without making creative work belongs to the scope of protection of the present application.

[0063] With the rapid development of the semiconductor industry, the requirements for efficiency and accuracy in production and supply chain management are constantly increasing. In the semiconductor manufacturing process, the management of raw materials, semi-finished products and finished products is one of the core links of the entire supply chain. Through efficient inbound and outbound control, the efficiency of material management can be improved, errors can be reduced, and the execution effect of production plans can be improved. However, the existing semiconductor inbound and outbound control methods still face many challenges, which affect their application effect and the degree of matching with industry needs.

[0064] At present, the commonly used methods of warehouse entry and exit control in the semiconductor industry include: scanning the barcode on the material label to realize automatic recording of warehouse entry and exit. In some enterprises, warehouse entry and exit information is mainly recorded manually. However, in the management of high-value materials, manual barcode scanning and registration are prone to problems such as missed scanning, wrong scanning or registration errors, resulting in inventory information that is inconsistent with the actual situation. As a result, it may cause shortages or waste of materials in subsequent processes.

[0065] Based on this, the embodiments of the present application provide a method and device for controlling the entry and exit of semiconductors, which can effectively improve the efficiency and accuracy of entry and exit control.

[0066] See also Figure 1 , Figure 1 A flowchart of a semiconductor storage and access control method provided in an embodiment of the present application. Figure 1 As shown in , the control method provided in the embodiment of the present application includes:

[0067] S101 . In response to a warehousing request, determine at least one warehousing inspection item for a target semiconductor to be warehousing.

[0068] S102: For each warehousing inspection item, obtain the original product parameters of the target semiconductor required for the warehousing inspection item.

[0069] S103. Determine whether all incoming inspection items are qualified based on all acquired original product parameters.

[0070] S104: If all the warehousing inspection items are qualified, the warehousing operation is performed.

[0071] S105 . In response to the outbound request, generate an outbound code for the target semiconductor to be outbound, and simultaneously perform outbound inspection.

[0072] S106. If the outbound inspection is qualified, the outbound operation is executed and outbound information is generated; wherein the outbound information includes the shipping code.

[0073] With respect to step S101, in this step, after receiving the warehousing request, the warehousing request is parsed to determine the target semiconductor to be warehousing, and the warehousing related information of the target semiconductor to be warehousing is obtained. For each target semiconductor to be warehousing, the warehousing inspection items of the target semiconductor to be warehousing are dynamically determined.

[0074] Here, the warehousing request may be sent by a user, an automated system, or an upstream supply chain, etc., without any specific limitation.

[0075] The storage-related information of the target semiconductor to be stored determined by parsing the storage request may include, for example, product model, batch number, production date, manufacturer information, etc.

[0076] The warehousing inspection items may include, for example: appearance inspection (such as scratches, damage, etc.), electrical performance test (such as resistance, leakage current, etc.), size and shape inspection (such as whether the package size meets the specifications), environmental tolerance inspection (such as temperature and humidity adaptability), etc.

[0077] Among them, the warehouse inspection items for different target semiconductors are generally different. In addition, the warehouse inspection items can be dynamically adjusted for different models or batches.

[0078] In one embodiment provided in the present application, the timing of sending the warehousing request may be: when the target semiconductor to be stored completes the inspection of the final quality inspection node and arrives at the warehousing node, the warehousing request is sent.

[0079] Here, the triggering condition for the warehousing request is that the target semiconductor product completes all necessary quality checks in the production process and reaches the designated warehousing location (ie, warehousing node) in the logistics or production chain, triggering the warehousing request.

[0080] The storage entry node may be a pre-set virtual node. The storage entry node is located after the final quality inspection node (OQC site).

[0081] In this way, the above embodiment ensures that the warehousing request is sent when the product is qualified and actually arrives at the warehousing node, which not only ensures the compliance of the process, but also improves the collaborative efficiency of production and warehousing through automation and intelligence.

[0082] With respect to step S102 , in this step, for each warehousing inspection item of the target semiconductor to be put into storage, the original product parameters of the target semiconductor required for executing the warehousing inspection item are obtained in a targeted manner.

[0083] By way of example, the original product parameters of the target semiconductor may include: electrical performance parameters (e.g., operating voltage range, current characteristics, switching speed, power consumption, impedance value, etc.), size and physical parameters (e.g., overall dimensions, pin spacing, package type, weight, etc.), environmental tolerance parameters (e.g., operating temperature range, storage temperature range, humidity tolerance, etc.) and test report parameters (e.g., test index range, failure rate, consistency report), etc.

[0084] With respect to step S103, in this step, for each warehousing inspection item, a qualified inspection of the warehousing inspection item is performed according to the original product parameters obtained for the warehousing inspection item, and it is determined whether all the warehousing inspection items are qualified.

[0085] In one embodiment provided in the present application, determining whether all incoming inspection items are qualified based on all acquired original product parameters includes:

[0086] S1031. For each incoming inspection item, determine whether the original product parameters corresponding to the incoming inspection item are within the corresponding control limits.

[0087] S1032. If yes, determine that the warehousing inspection item is qualified; otherwise, determine that the warehousing inspection item is unqualified.

[0088] For step S1031, in this step, for each incoming inspection item, the control limit corresponding to each incoming inspection item is obtained according to the preset information; then the original product parameters collected by the incoming inspection item are compared with the control limit to determine whether the original product parameters are within the control limit.

[0089] Among them, different warehousing inspection items generally correspond to different control limits.

[0090] For step S1032, compared with the result of S1031, if all parameter values ​​are within the corresponding control limit range, the test item is determined to be qualified. If any parameter is out of range, the test item is determined to be unqualified.

[0091] With respect to step S104, in this step, if it is determined that all the storage inspection items of the target semiconductor are qualified, the storage operation is performed on the target semiconductor.

[0092] Here, the execution of the warehousing operation may include: updating the inventory status (for example, updating the target semiconductors that have passed the inspection to "available inventory" and allocating a storage location), and / or saving warehousing records (storing information such as warehousing time, inspection results, storage location, etc. to the corresponding system, for example, a warehouse management system (WMS), and / or label printing (for example: printing a warehousing label for the target semiconductor, marking the batch number, warehousing date, inspector, etc.).

[0093] In addition, in another embodiment provided by the present application, when performing the warehousing operation, the management and control method further includes:

[0094] S1041. Generate a warehousing report for the target semiconductor according to the original product parameters and warehousing inspection items of the target semiconductor.

[0095] S1042: Update the inventory information in the inventory management system according to the warehousing report of the target semiconductor.

[0096] For step S1041, this step, for example, may include: determining the test results based on all inventory inspection items, associating the original product parameters and the test results with the specific product identification; then using a predefined report template, importing the test results, product parameters and product identification into the report template to generate an inventory report for the target semiconductor.

[0097] Here, the warehousing report of the target semiconductor may be archived in the product quality database, or may be automatically sent to the relevant departments, and the contents of step S1042 may also be executed.

[0098] Among them, the report template usually includes the following parts: basic product information, original parameter records, test results, and overall conclusions, etc.

[0099] With respect to step S1042, in this step, key information is extracted based on the generated warehousing report of the target semiconductor, and inventory information in the inventory management system is updated based on the key information.

[0100] Here, key information may include product identification, quantity, storage location, storage time, etc.

[0101] When updating inventory information in an inventory management system, it may include: increasing product inventory quantity, assigning specific storage locations, marking product status as "available inventory" or other custom status, etc.

[0102] In addition, in another embodiment provided in the present application, when it is determined that any warehousing inspection item is unqualified, the management and control method includes: generating an unqualified warehousing report for the target semiconductor, and sending the unqualified warehousing report to the target personnel, while executing a prohibition on warehousing operations.

[0103] Here, the unqualified report may include the name of the test item, the specific value of the unqualified parameter, the description of the reason for the unqualified, etc.

[0104] The template used to generate the warehouse unqualified report and the module used to produce the warehouse unqualified report can be different. And the generated warehouse unqualified report can be stored in a separate category, so as to facilitate quality analysis.

[0105] With respect to step S105, in one embodiment provided in the present application, in response to the outbound request of the target semiconductor, generating the shipping code of the target semiconductor and performing outbound detection at the same time include:

[0106] S1051. In response to the outbound delivery request, verify the outbound delivery request according to the inventory information.

[0107] S1052: When the shipment request is verified, a unique shipment code for the target semiconductor to be shipped is generated according to a preset coding rule.

[0108] S1053, performing an outbound inspection on the target semiconductor to be outbound according to the preset outbound inspection items;

[0109] S1054. When all outbound inspection items are qualified, it is determined that the outbound inspection is qualified; otherwise, it is determined that the outbound inspection is unqualified.

[0110] For step S1051, when verifying the outbound shipment request, it may specifically include: inventory status verification (checking whether there is sufficient inventory of the target semiconductor), batch matching verification (confirming that the product batch of the outbound shipment request is consistent with the inventory record), order association verification, etc.

[0111] With respect to step S1052, a shipping code may be generated according to the rules preset by the enterprise to ensure that each shipping operation has a unique identifier.

[0112] The information that may be included in the shipping code mentioned here includes timestamp, product batch number or model number, serial number or running number, etc.

[0113] With respect to step S1053, the outbound inspection items may include, for example: appearance inspection items, performance parameter test items, packaging integrity inspection, etc.

[0114] For step S1054, when all the inspection items are passed, it is determined that the target semiconductor has passed the outbound inspection and the outbound operation can be performed. If any inspection item fails, it is determined that the inspection is unqualified, the outbound is blocked, and the abnormal process is triggered (such as notifying relevant personnel or generating an unqualified report).

[0115] In addition, after determining that the shipment is unsuitable, a shipment non-conformity report can be automatically generated.

[0116] Regarding step S106, this step may include, for example: when the outbound inspection result is compared with the standard and it is determined that the outbound inspection is qualified, the target semiconductor is removed from the inventory and recorded as "outbound", and then the outbound information is generated and synchronized to the corresponding system to achieve traceability.

[0117] By way of example, in an implementation provided in the present application, after generating the outbound delivery information, the management and control method further includes: transmitting the outbound delivery information to a statistical process control system, and updating the product information in the statistical process control system.

[0118] Here, the outbound information may include: basic product information (such as model, batch number, serial number), outbound time, shipping code (a unique identifier used to identify the outbound operation), outbound inspection results, consignee information, etc.

[0119] The Statistical Process Control (SPC) is a system for real-time monitoring and analysis of product quality data.

[0120] When the outbound information is transmitted to the statistical process control system, the transmission method adopted may be, for example: through an API interface (real-time data push to the SPC system) or batch uploading.

[0121] Updating the product information in the statistical process control system may include, for example, marking the status of the corresponding product as "shipped", deleting or archiving the inventory records of the shipped products to avoid duplicate counting.

[0122] In addition, the SPC system can generate statistical reports based on the updated information, including: the qualified rate of shipped products, statistics on reasons for non-compliance; the distribution of shipping time for each batch; and abnormal shipping alarms: for example, if multiple batches of products in the same time period fail the shipping inspection, etc.

[0123] In this way, this solution ensures that the target semiconductor products meet the technical requirements and quality standards before entering the warehouse by confirming each entry inspection item, avoiding unqualified products from entering the warehouse at the source and improving the overall inventory product quality. In addition, the inspection is performed again at the exit stage to ensure that the final state of the exit product meets the requirements, effectively reducing the risk of returns and after-sales problems.

[0124] Therefore, through the above control methods, it is possible to achieve efficient inventory management, perfect data traceability, and comprehensively optimize the production and supply chain processes while ensuring product quality.

[0125] Based on the same inventive concept, a control device corresponding to the control method is also provided in the embodiment of the present application. Since the principle of solving the problem by the device in the embodiment of the present application is similar to the above-mentioned control method in the embodiment of the present application, the implementation of the device can refer to the implementation of the method, and the repeated parts will not be repeated.

[0126] See also Figure 2 , Figure 3 , Figure 2 This is one of the structural schematic diagrams of a semiconductor storage and access control device provided in an embodiment of the present application. Figure 3 This is a second structural diagram of a semiconductor storage and access control device provided in an embodiment of the present application. Figure 2 As shown in , the control device 200 includes:

[0127] A first response module 210 is used to determine at least one storage inspection item of the target semiconductor to be stored in response to the storage request;

[0128] An acquisition module 220 is used to acquire, for each warehousing inspection item, the original product parameters of the target semiconductor required for the warehousing inspection item;

[0129] The first determination module 230 is used to determine whether all the incoming inspection items are qualified according to all the acquired original product parameters;

[0130] The first execution module 240 is used to execute the warehousing operation if all the warehousing inspection items are qualified;

[0131] The second response module 250 is used to generate a shipping code of the target semiconductor to be shipped out in response to the shipping request, and simultaneously perform a shipping detection;

[0132] The second execution module 260 is used to execute the outbound operation and generate outbound information if the outbound inspection is qualified; wherein the outbound information includes the shipping code.

[0133] Optionally, when the first determination module 230 is used to determine whether all the incoming inspection items are qualified according to all the acquired original product parameters, the first determination module 230 is used to:

[0134] For each incoming inspection item, determine whether the original product parameters corresponding to the incoming inspection item are within the corresponding control limits;

[0135] If it is, it is determined that the warehousing inspection item is qualified; otherwise, it is determined that the warehousing inspection item is unqualified.

[0136] Optional, such as Figure 3 As shown, the control device 200 further includes a prohibition module 270, and the prohibition module 270 is used to:

[0137] When it is determined that any of the warehousing inspection items is unqualified, an warehousing unqualified report of the target semiconductor is generated, and the warehousing unqualified report is sent to the target person, and a warehousing prohibition operation is performed at the same time.

[0138] Optionally, the first execution module 240 is further configured to:

[0139] Generate a warehousing report for the target semiconductor according to the original product parameters and warehousing inspection items of the target semiconductor;

[0140] The inventory information in the inventory management system is updated according to the inventory entry report of the target semiconductor.

[0141] Optionally, when the second execution module 260 is used to respond to the outbound request of the target semiconductor, generate the shipping code of the target semiconductor, and perform outbound detection at the same time, the second execution module 260 is used to:

[0142] In response to the outbound request, verify the outbound request according to the inventory information;

[0143] When the outbound request is verified, a unique shipping code for the target semiconductor to be outbound is generated according to the preset coding rules;

[0144] According to the preset outbound inspection items, the target semiconductor to be outbound is inspected;

[0145] When all outbound inspection items are qualified, the outbound inspection is determined to be qualified; otherwise, the outbound inspection is determined to be unqualified.

[0146] Optionally, the control device 200 further includes an updating module 280, and the updating module 280 is used to:

[0147] After the outbound information is generated, the outbound information is transmitted to a statistical process control system, and the product information in the statistical process control system is updated.

[0148] Optionally, the first response module is also used to send a warehousing request when the target semiconductor to be stored completes the inspection of the final quality inspection node and arrives at the warehousing node.

[0149] See also Figure 4 , Figure 4 This is a schematic diagram of the structure of an electronic device provided in an embodiment of the present application. Figure 4 As shown in , the electronic device 400 includes a processor 410 , a memory 420 and a bus 430 .

[0150] The memory 420 stores machine-readable instructions executable by the processor 410. When the electronic device 400 is running, the processor 410 communicates with the memory 420 via the bus 430. When the machine-readable instructions are executed by the processor 410, the above-mentioned Figure 1 The specific implementation of the steps of the control method in the method embodiment shown can be found in the method embodiment, and will not be repeated here.

[0151] The present application also provides a computer-readable storage medium on which a computer program is stored. When the computer program is executed by a processor, the computer program can execute the above-mentioned Figure 1 The specific implementation of the steps of the control method in the method embodiment shown can be found in the method embodiment, and will not be repeated here.

[0152] Those skilled in the art can clearly understand that, for the convenience and brevity of description, the specific working processes of the systems, devices and units described above can refer to the corresponding processes in the aforementioned method embodiments and will not be repeated here.

[0153] In the several embodiments provided in the present application, it should be understood that the disclosed systems, devices and methods can be implemented in other ways. The device embodiments described above are merely schematic. For example, the division of the units is only a logical function division. There may be other division methods in actual implementation. For example, multiple units or components can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the mutual coupling or direct coupling or communication connection shown or discussed can be through some communication interfaces, and the indirect coupling or communication connection of devices or units can be electrical, mechanical or other forms.

[0154] The units described as separate components may or may not be physically separated, and the components shown as units may or may not be physical units, that is, they may be located in one place or distributed on multiple network units. Some or all of the units may be selected according to actual needs to achieve the purpose of the solution of this embodiment.

[0155] In addition, each functional unit in each embodiment of the present application may be integrated into one processing unit, or each unit may exist physically separately, or two or more units may be integrated into one unit.

[0156] If the functions are implemented in the form of software functional units and sold or used as independent products, they can be stored in a non-volatile computer-readable storage medium that is executable by a processor. Based on this understanding, the technical solution of the present application can essentially be embodied in the form of a software product, or in other words, the part that contributes to the prior art or the part of the technical solution. The computer software product is stored in a storage medium, including several instructions for a computer device (which can be a personal computer, a server, or a network device, etc.) to perform all or part of the steps of the method described in each embodiment of the present application. The aforementioned storage medium includes: various media that can store program codes, such as a USB flash drive, a mobile hard disk, a read-only memory (ROM), a random access memory (RAM), a magnetic disk or an optical disk.

[0157] Finally, it should be noted that the above-described embodiments are only specific implementation methods of the present application, which are used to illustrate the technical solutions of the present application, rather than to limit them. The protection scope of the present application is not limited thereto. Although the present application is described in detail with reference to the above-mentioned embodiments, ordinary technicians in the field should understand that any technician familiar with the technical field can still modify the technical solutions recorded in the above-mentioned embodiments within the technical scope disclosed in the present application, or can easily think of changes, or make equivalent replacements for some of the technical features therein; and these modifications, changes or replacements do not make the essence of the corresponding technical solutions deviate from the spirit and scope of the technical solutions of the embodiments of the present application, and should be included in the protection scope of the present application. Therefore, the protection scope of the present application shall be based on the protection scope of the claims.

Claims

1. A semiconductor storage and access control method, characterized in that: The control method includes: In response to the warehousing request, determining at least one warehousing inspection item of the target semiconductor to be stored; For each warehousing inspection item, obtaining original product parameters of the target semiconductor required for the warehousing inspection item; Determine whether all incoming inspection items are qualified based on all the original product parameters obtained; If all the warehousing inspection items are qualified, the warehousing operation is carried out; In response to a warehouse-out request, a shipping code of a target semiconductor to be shipped out is generated, and a warehouse-out inspection is performed simultaneously; If the outbound inspection is qualified, the outbound operation is executed and outbound information is generated; wherein the outbound information includes the shipping code.

2. The control method according to claim 1, characterized in that: Determine whether all incoming inspection items are qualified based on all the original product parameters obtained, including: For each incoming inspection item, determine whether the original product parameters corresponding to the incoming inspection item are within the corresponding control limits; If it is, it is determined that the warehousing inspection item is qualified; otherwise, it is determined that the warehousing inspection item is unqualified.

3. The control method according to claim 1, characterized in that: When it is determined that any of the warehousing inspection items are unqualified, the control methods include: Generate a storage failure report for the target semiconductor, send the storage failure report to the target person, and execute a storage prohibition operation at the same time.

4. The control method according to claim 1, characterized in that: When performing the warehousing operation, the control method further includes: Generate a warehousing report for the target semiconductor according to the original product parameters and warehousing inspection items of the target semiconductor; The inventory information in the inventory management system is updated according to the inventory entry report of the target semiconductor.

5. The control method according to claim 1, characterized in that: The step of generating a shipping code of the target semiconductor in response to a shipping request of the target semiconductor and performing a shipping inspection at the same time includes: In response to the outbound request, verify the outbound request according to the inventory information; When the outbound request is verified, a unique shipping code for the target semiconductor to be outbound is generated according to the preset coding rules; According to the preset outbound inspection items, the target semiconductor to be outbound is inspected; When all outbound inspection items are qualified, the outbound inspection is determined to be qualified; otherwise, the outbound inspection is determined to be unqualified.

6. The control method according to claim 1, characterized in that: After generating the outbound information, the management and control method further includes: The outbound information is transmitted to a statistical process control system, and the product information in the statistical process control system is updated.

7. The control method according to claim 1, characterized in that: When the target semiconductor to be stored completes the inspection at the final quality inspection node and reaches the storage node, a storage request is sent.

8. A semiconductor storage and access control device, characterized in that: The control device comprises: A first response module, configured to determine at least one storage inspection item of the target semiconductor to be stored in response to the storage request; An acquisition module, used for acquiring, for each warehousing inspection item, original product parameters of the target semiconductor required for the warehousing inspection item; The first determination module is used to determine whether all incoming inspection items are qualified based on all the original product parameters obtained; The first execution module is used to execute the warehousing operation if all warehousing inspection items are qualified; A second response module, for generating a shipping code of a target semiconductor to be shipped out in response to a shipping request, and performing a shipping inspection at the same time; The second execution module is used to execute the outbound operation and generate outbound information if the outbound inspection is qualified; wherein the outbound information includes the shipping code.

9. An electronic device, characterized in that: include: A processor, a memory and a bus, wherein the memory stores machine-readable instructions executable by the processor, and when the electronic device is running, the processor and the memory communicate through the bus, and the machine-readable instructions are executed by the processor to execute the steps of the control method as described in any one of claims 1 to 7.

10. A computer-readable storage medium, characterized in that: The computer-readable storage medium stores a computer program, and when the computer program is executed by a processor, the steps of the control method according to any one of claims 1 to 7 are executed.

Images