Automatic testing method and platform based on hardware

Abstract

The invention relates to the technical field of automatic test platforms, in particular to an automatic test method and platform based on hardware, comprising a test platform body, one side of the upper end of the test platform body is fixedly connected with a protection box, the protection box is internally provided with a test device, one side of the test device is fixedly connected with a first sliding column, and the first sliding column is fixedly connected with a second sliding column. A guide sliding groove is formed in one side of the inner wall of the protection box, and the inner wall of the guide sliding groove is slidably connected with one side of the outer side wall of the first sliding column. The dustproof plate is pulled upwards, one end of the dustproof plate relieves limitation of the swing rod, the test device is pulled into the protection box through resilience force of the tension spring, the first sliding column slides along the interior of the swing rod, the test device is moved into the protection box, and by means of the design, when the test device does not need to be used, only the dustproof plate needs to be pulled, and the test device is moved into the protection box. And the testing device can be moved into the protection box, so that dust in the air is prevented from entering a detection port of the testing device, and the detection data of the testing platform is improved.

Description

Technical Field

[0001] The present invention relates to the technical field of hardware testing equipment, and in particular to a hardware-based automated testing method and platform. Background Art

[0002] Hardware is the abbreviation of computer hardware, which refers to the general term for various physical devices in the computer system composed of electronic, mechanical and optoelectronic components. The function of hardware is to input and store programs and data, and to execute programs to process data into a usable form. However, the hardware produced needs to be tested using a test platform to prevent the produced hardware from being unqualified.

[0003] In the prior art, for example, Chinese patent CN 210268413 U discloses a novel hardware testing platform, including a base, a box body fixedly connected to the upper end of the base, a first scale fixedly connected to the middle of the top end of the box body, a first cavity is opened inside the box body, a pulley is provided on the inner wall of the bottom end of the first cavity, a sliding rod is rotatably connected to the rotating shaft of the pulley, a sliding groove is opened on the inner wall of the upper end of the first cavity, the top end of the sliding rod passes through the sliding groove, a second cavity is opened inside the sliding rod, a sliding block is provided inside the second cavity, a socket is opened on the outer wall of the sliding rod, and the socket is connected to the second cavity.

[0004] In the above patent, although the hardware size is measured by the cooperation between the clamp and the ruler, most of the detection equipment is generally equipped with a variety of detection ends for connecting to the hardware, and the detection ends are basically exposed to the outside, so that dust can easily enter the detection ends. The long-term accumulation of dust can easily lead to detection failure of the detection ends, resulting in inaccurate detection results. Summary of the invention

[0005] The purpose of the present invention is to provide a hardware-based automated testing method and platform with simple structure, reasonable design and easy use to solve the problems raised in the above background technology in view of the defects and shortcomings of the prior art.

[0006] To achieve the above object, the present invention provides the following technical solutions:

[0007] A hardware-based automated testing platform comprises a testing platform body, wherein one side of the upper end of the testing platform body is fixedly connected to a protective box, a testing device is arranged inside the protective box, one side of the testing device is fixedly connected to a sliding column one, one side of the inner wall of the protective box is provided with a guide sliding groove, the inner wall of the guide sliding groove is slidingly connected to one side of the outer wall of the sliding column one, the outer wall of the sliding column one is also slidingly connected to a swing rod, one side of the swing rod is rotatably connected to one side of the inner wall of the protective box, the other side of the inner wall of the protective box is provided with an L-shaped sliding groove, and the inner wall of the L-shaped sliding groove is slidably connected to a dustproof plate.

[0008] As a further preferred embodiment of a hardware-based automated test platform of the present invention, the test device comprises a main controller module, an interface module, an information reporting module, a display module, a relay control module and a power module; the interface module, the information reporting module, the display module, the storage module, the clock module, the relay control module and the power module are respectively connected to the main controller module;

[0009] Wherein, the main controller module is used to receive the device under test information of the device under test forwarded by the interface module and generate a control instruction;

[0010] An interface module, used for receiving the device under test information and forwarding the device under test information to the main controller module;

[0011] An information reporting module, used for obtaining the information of the device under test and sending the information of the device under test to a monitoring end host;

[0012] A display module, used to display the information of the device under test;

[0013] A power module, used to provide required electrical energy;

[0014] Clock module, used to record time;

[0015] A storage module, used for storing the information of the device under test in real time according to the time recorded by the clock module;

[0016] The relay control module is used to receive the control instruction from the main controller module and control the internal relay to close based on the control instruction.

[0017] As a further preferred solution of a hardware-based automated testing platform of the present invention, the interface module includes an interface board, a 16-bit AD conversion chip, and a signal conditioning circuit, and the interface board, 16-bit AD conversion chip, and signal conditioning circuit are connected to a main controller module.

[0018] As a further preferred embodiment of a hardware-based automated testing platform of the present invention, the signal conditioning circuit includes a first resistor R1, a second resistor R2, a third resistor R3, a fourth resistor R4, a fifth resistor R5, a sixth resistor R6, a seventh resistor R7, an eighth resistor R8, a first capacitor C1, a second capacitor C2, a first operational amplifier U1, a second operational amplifier U2, a voltage input VIN terminal and a voltage output VOUT terminal, the voltage input VIN terminal is connected to one end of the first resistor R1, the other end of the first resistor R1 is respectively connected to the negative input terminal of the first operational amplifier U1, one end of the second resistor R2 and one end of the first capacitor C1, the other end of the first capacitor C1 is respectively connected to the other end of the second resistor R2, the first operational amplifier The output end of the amplifier U1 and one end of the fifth resistor R5, the other end of the fifth resistor R5 is respectively connected to one end of the second capacitor C2, one end of the sixth resistor R6 and the negative input end of the second operational amplifier U2, the other end of the second capacitor C2 is respectively connected to the other end of the sixth resistor R6, the output end of the second operational amplifier U2 and the voltage output VOUT end, the positive input end of the second operational amplifier U2 is respectively connected to one end of the seventh resistor R7 and one end of the eighth resistor R8, the other end of the seventh resistor R7 and the other end of the eighth resistor R8 are connected and grounded, the positive input end of the first operational amplifier U1 is respectively connected to one end of the third resistor R3 and one end of the fourth resistor R4, the other end of the third resistor R3 and the other end of the fourth resistor R4 are connected and grounded.

[0019] As a further preferred solution of a hardware-based automated test platform of the present invention, the power module includes a chip U1, a first resistor R10, a second resistor R11, a third resistor R12, a first diode D4, a second diode D5, a third diode D6, a first capacitor C5, a second capacitor C6, a third capacitor C7, a fourth capacitor C8, a fifth capacitor C9, a sixth capacitor C10, a seventh capacitor C11, a first inductor L4, and a second inductor L5;

[0020] Among them, one end of the first resistor R10 is connected to the live wire L, the other end of the first resistor R10 is connected to the positive electrode of the first diode D4, the negative electrode of the first diode D4 is respectively connected to one end of the first capacitor C5 and one end of the first inductor L4, the other end of the first inductor L4 is respectively connected to one end of the second capacitor C6 and the Drn pin of the chip U1, the other end of the first capacitor C5 is respectively connected to the other end of the second capacitor C6, the positive electrode of the second diode D5, one end of the sixth capacitor C10, one end of the seventh capacitor C11, and the neutral line N and grounded, one end of the third capacitor C7 is connected to the V pin of the chip U1, and the other end of the third capacitor C7 is respectively connected to the V pin of the chip U1. The Src pin of chip U1, the Sre pin of chip U1, one end of the fourth capacitor C8, one end of the second resistor R11, and one end of the second inductor L5 are connected; the other end of the fourth capacitor C8 is respectively connected to the FB pin of chip U1, the other end of the second resistor R11, and one end of the third resistor R12; the other end of the third resistor R12 is respectively connected to one end of the fifth capacitor C9 and the cathode of the third diode D6; the other end of the fifth capacitor C9 is connected to the cathode of the second diode D5; the anode of the third diode D6 is respectively connected to the other end of the second inductor L5, the other end of the sixth capacitor C10, the other end of the seventh capacitor C11 and the A5V terminal.

[0021] As a further preferred solution of the hardware-based automated testing platform of the present invention, a sliding cylinder is fixedly connected to one side of the outer wall of the dustproof plate, and the outer wall of the sliding cylinder is slidably connected to the inner wall of the L-shaped sliding groove, a fixed cylinder is fixedly connected to one side of the protective box, a fixed plug rod is slidably connected to the inside of the fixed cylinder, a reset spring is sleeved on the outer wall of the fixed plug rod, one end of the fixed plug rod is slidably connected to the inner wall of the sliding cylinder, a rotating handle is rotatably connected to one side of the outer wall of the fixed plug rod, and one side of the outer wall of the rotating handle is rotatably connected to the outer surface of the fixed cylinder.

[0022] As a further preferred solution of a hardware-based automated testing platform of the present invention, a tension spring is fixedly connected to one side of the lower end of the testing device, one side of the tension spring is fixedly connected to one side of the inner wall of the protective box, and the other side of the testing device is fixedly connected to a sliding column 2, and the outer wall of the sliding column 2 is slidably connected to the inner wall of the guide sliding groove.

[0023] As a further preferred embodiment of a hardware-based automated testing platform of the present invention, a slideway is provided on the other side of the upper end of the testing platform body, a measuring plate 1 is provided on one side of the slideway, a lower end of the measuring plate 1 is fixedly connected to one side of the upper end of the testing platform body, a measuring plate 2 is slidably connected to the inner wall of the slideway, a threaded rod is threadedly connected to the inner wall of the measuring plate 2, and a scale bar is fixedly connected to the other side of the upper end of the testing platform body and near the edge.

[0024] As a further preferred solution of a hardware-based automated testing platform of the present invention, one side of the threaded rod is fixedly connected to a hexagonal connecting rod, the outer side wall of the hexagonal connecting rod is slidably connected to a sliding ring, one side of the sliding ring is clamped with a limiting ring, and one side of the limiting ring is fixedly connected to one side of the testing platform body.

[0025] A testing method for a hardware-based automated testing platform specifically comprises the following steps:

[0026] Step 1: Pull the rotating handle to release the restriction of the dustproof plate, then pull down the dustproof plate, one end of the dustproof plate squeezes one side of the swing rod, the swing rod pushes the test device outward, and then pull the rotating handle to insert one end of the fixed insertion rod into the sliding cylinder to fix the dustproof plate;

[0027] Step 2: After placing one side of the hardware on one side of the measuring plate 1, pull the sliding ring to release the restriction of the hexagonal connecting rod, and rotate the hexagonal connecting rod to make one side of the measuring plate 2 fit with one side of the hardware;

[0028] Step 3, read the position of the scale bar by pointing at one side of the measuring board 2, and then measure the size of the hardware, and then connect the output end of the hardware to the port of the test device to perform the test, and the test data is displayed on the display screen of the test platform body, and the test is completed;

[0029] Step 4, pull the test line out of the test device, turn the rotating handle to release the restriction of the dustproof plate, and then pull the dustproof plate upward. One end of the dustproof plate releases the restriction of the swing rod, and the rebound force of the tension spring pulls the test device into the protective box. The sliding column slides along the swing rod, and the test device moves into the protective box.

[0030] After adopting the above structure, the beneficial effects of the present invention are:

[0031] (1) The present invention provides a hardware-based automated testing platform, wherein the testing device comprises a main controller module, an interface module, an information reporting module, a display module, a relay control module and a power supply module; the hardware control of the automated testing platform is realized, thereby improving the efficiency of automated testing;

[0032] (2) The present invention pulls the dustproof plate upward, and one end of the dustproof plate releases the restriction of the swing rod. The resilience of the tension spring pulls the test device into the protection box. The sliding column slides along the swing rod, and the test device moves into the protection box. With this design, when the test device is not needed, only the dustproof plate needs to be pulled, and the test device can be moved into the protection box, thereby reducing the dust in the air from entering the detection port of the test device and improving the detection data of the test platform.

[0033] (2) The present invention fixes the dustproof plate by pulling the rotating handle when the dustproof plate slides to the bottom of the protection box, and the fixed insertion rod slides from the fixed tube to the sliding tube, thereby preventing the elastic force of the tension spring from bringing back the sliding test device, and preventing the test device from shrinking due to the rebound force of the tension spring when the hardware is tested. BRIEF DESCRIPTION OF THE DRAWINGS

[0034] The drawings described herein are used to provide a further understanding of the present invention and constitute a part of the present application, but do not constitute an improper limitation of the present invention. In the drawings:

[0035] Figure 1 It is a schematic diagram of the three-dimensional structure of the present invention;

[0036] Figure 2 It is a schematic diagram of the connection relationship between the threaded rod and the second measuring plate in the present invention;

[0037] Figure 3 It is a schematic diagram of the explosion structure of the protection box in the present invention;

[0038] Figure 4 It is a schematic diagram of the cross-sectional structure of the protection box in the present invention;

[0039] Figure 5 It is a schematic diagram of the explosion structure of the fixed cylinder in the present invention;

[0040] Figure 6 The bone setting principle diagram of the test device of the present invention

[0041] Figure 7 This is a schematic diagram of the interface module structure of the present invention;

[0042] Figure 8 The circuit diagram of the signal conditioning circuit of the present invention;

[0043] Fig. 9 This is a circuit diagram of the power module of the present invention.

[0044] Description of reference numerals:

[0045] 1. Test platform body; 2. Protection box; 3. Dustproof plate; 4. Scale bar; 5. Measuring plate 1; 6. Measuring plate 2; 7. Slide; 8. Limiting ring; 9. Hexagonal connecting rod; 10. Fixed cylinder; 11. Sliding ring; 12. Threaded rod; 13. Test device; 14. Guide sliding groove; 15. L-shaped sliding groove; 16. Swing rod; 17. Sliding column 1; 18. Sliding cylinder; 19. Sliding column 2; 20. Tension spring; 21. Reset spring; 22. Rotating handle; 23. Fixed plug rod. DETAILED DESCRIPTION

[0046] The present invention will be described in detail below in conjunction with the accompanying drawings and specific embodiments, wherein the illustrative embodiments and descriptions are only used to explain the present invention but are not intended to limit the present invention.

[0047] The present invention provides a technical solution: Figure 1 - Fig. 9 As shown, in this embodiment, a hardware-based automated testing platform includes a testing platform body 1, a protective box 2 is fixedly connected to one side of the upper end of the testing platform body 1, a testing device 13 is arranged inside the protective box 2, a sliding column 17 is fixedly connected to one side of the testing device 13, a guide sliding groove 14 is provided on one side of the inner wall of the protective box 2, the inner wall of the guide sliding groove 14 is slidingly connected to one side of the outer wall of the sliding column 17, the outer wall of the sliding column 17 is also slidingly connected to a swing rod 16, one side of the swing rod 16 is rotatably connected to one side of the inner wall of the protective box 2, an L-shaped sliding groove 15 is provided on the other side of the inner wall of the protective box 2, and the inner wall of the L-shaped sliding groove 15 is slidingly connected There is a dustproof plate 3. By pulling the dustproof plate 3 upwards, one end of the dustproof plate 3 releases the restriction of the swing rod 16, and the rebound force of the tension spring 20 pulls the test device 13 into the protective box 2. The sliding column 17 slides along the swing rod 16, and the test device 13 moves into the protective box 2. Through this design, when the test device 13 is not needed, only the dustproof plate 3 needs to be pulled, and the test device 13 can be moved into the protective box 2, thereby reducing the dust in the air from entering the detection port of the test device 13 and improving the detection data of the test platform. Guide sliding grooves 14 and L-shaped sliding grooves 15 are provided on both sides of the inner wall of the protective box 2, and two swing rods 16 are rotated on the inner wall.

[0048] like Figure 1 , Figure 3 and Figure 5 As shown, a sliding cylinder 18 is fixedly connected to one side of the outer wall of the dustproof plate 3, and the outer wall of the sliding cylinder 18 is slidably connected to the inner wall of the L-shaped sliding groove 15; a fixed cylinder 10 is fixedly connected to one side of the protective box 2, and a fixed plug rod 23 is slidably connected inside the fixed cylinder 10. The outer wall of the fixed plug rod 23 is sleeved with a reset spring 21, and one end of the fixed plug rod 23 is slidably connected to the inner wall of the sliding cylinder 18, and a rotating handle 22 is rotatably connected to one side of the outer wall of the fixed plug rod 23, and one side of the outer wall of the rotating handle 22 is rotatably connected to the outer surface of the fixed cylinder 10. When the dustproof plate 3 slides to the bottom of the protective box 2, the rotating handle 22 is pulled, and the fixed plug rod 23 slides from the fixed cylinder 10 to the sliding cylinder 18 to fix the dustproof plate 3, so as to prevent the elastic force of the tension spring 20 from bringing back the sliding test device 13, and to prevent the hardware from being retracted due to the rebound force of the tension spring 20 when the test device 13 is used to test the hardware.

[0049] like Figure 4As shown, a tension spring 20 is fixedly connected to one side of the lower end of the test device 13, and one side of the tension spring 20 is fixedly connected to one side of the inner wall of the protective box 2. The tension spring 20 can be used to quickly pull the test device 13 into the test platform body 1 to prevent dust from falling onto the test device 13.

[0050] like Figure 3 and Figure 4 As shown, a second sliding column 19 is fixedly connected to the other side of the test device 13 , and the outer wall of the second sliding column 19 is slidably connected to the inner wall of the guide sliding groove 14 , so that the second sliding column 19 can make the test device 13 more stable when moving.

[0051] like Figure 1 and Figure 2 As shown, a slideway 7 is provided on the other side of the upper end of the test platform body 1, and a measuring plate 5 is provided on one side of the slideway 7. The lower end of the measuring plate 5 is fixedly connected to one side of the upper end of the test platform body 1, and the inner wall of the slideway 7 is slidably connected to a measuring plate 2 6. The inner wall of the measuring plate 2 6 is threadedly connected to a threaded rod 12. A scale bar 4 is fixedly connected to the other side of the upper end of the test platform body 1 and near the edge. By placing one side of the hardware on one side of the measuring plate 5 and rotating the hexagonal connecting rod 9 to make one side of the measuring plate 2 6 fit with one side of the hardware, the staff uses one side of the measuring plate 2 6 to point at the position of the scale bar 4 to read the value and measure the size of the hardware.

[0052] like Figure 1 and Figure 2 As shown, one side of the threaded rod 12 is fixedly connected to a hexagonal connecting rod 9, and the outer wall of the hexagonal connecting rod 9 is slidably connected to a sliding ring 11, one side of the sliding ring 11 is clamped with a limiting ring 8, and one side of the limiting ring 8 is fixedly connected to one side of the test platform body 1. By pushing the sliding ring 11, one side of the sliding ring 11 is clamped in the limiting ring 8, and the hexagonal connecting rod 9 is fixed to the test platform body 1, thereby fixing the hardware on the test platform body 1 to prevent it from falling.

[0053] like Figure 6 As shown, the test device 13 includes a main controller module, an interface module, an information reporting module, a display module, a relay control module and a power module; the interface module, the information reporting module, the display module, the storage module, the clock module, the relay control module and the power module are respectively connected to the main controller module;

[0054] Wherein, the main controller module is used to receive the device under test information of the device under test forwarded by the interface module and generate a control instruction;

[0055] An interface module, used for receiving the device under test information and forwarding the device under test information to the main controller module;

[0056] An information reporting module, used for obtaining the information of the device under test and sending the information of the device under test to a monitoring end host;

[0057] A display module, used to display the information of the device under test;

[0058] A power module, used to provide required electrical energy;

[0059] Clock module, used to record time;

[0060] A storage module, used for storing the information of the device under test in real time according to the time recorded by the clock module;

[0061] The relay control module is used to receive the control instruction from the main controller module and control the internal relay to close based on the control instruction.

[0062] like Figure 7 As shown, the interface module includes an interface board, a 16-bit AD conversion chip, and a signal conditioning circuit, and the interface board, the 16-bit AD conversion chip, and the signal conditioning circuit are connected to the main controller module.

[0063] like Figure 8 As shown, the signal conditioning circuit includes a first resistor R1, a second resistor R2, a third resistor R3, a fourth resistor R4, a fifth resistor R5, a sixth resistor R6, a seventh resistor R7, an eighth resistor R8, a first capacitor C1, a second capacitor C2, a first operational amplifier U1, a second operational amplifier U2, a voltage input VIN terminal and a voltage output VOUT terminal, the voltage input VIN terminal is connected to one end of the first resistor R1, the other end of the first resistor R1 is respectively connected to the negative input terminal of the first operational amplifier U1, one end of the second resistor R2 and one end of the first capacitor C1, the other end of the first capacitor C1 is respectively connected to the other end of the second resistor R2, the output terminal of the first operational amplifier U1 and the fifth resistor R 5, the other end of the fifth resistor R5 is respectively connected to one end of the second capacitor C2, one end of the sixth resistor R6 and the negative input terminal of the second operational amplifier U2, the other end of the second capacitor C2 is respectively connected to the other end of the sixth resistor R6, the output terminal of the second operational amplifier U2 and the voltage output VOUT terminal, the positive input terminal of the second operational amplifier U2 is respectively connected to one end of the seventh resistor R7 and one end of the eighth resistor R8, the other end of the seventh resistor R7 and the other end of the eighth resistor R8 are connected and grounded, the positive input terminal of the first operational amplifier U1 is respectively connected to one end of the third resistor R3 and one end of the fourth resistor R4, the other end of the third resistor R3 and the other end of the fourth resistor R4 are connected and grounded.

[0064] The analog signal is input to the AD through the signal conditioning and amplification circuit to achieve a signal amplitude that can be accepted by the AD. When the analog signal amplitude of the displacement sensor input increases from 0V to 10V, the output amplitude after signal conditioning is 0V to 4V, which is within the acceptable amplitude range of the AD. Its cutoff bandwidth frequency is approximately 6kHZ, which can effectively filter out noise.

[0065] like Fig. 9 As shown, the power module includes a chip U1, a first resistor R10, a second resistor R11, a third resistor R12, a first diode D4, a second diode D5, a third diode D6, a first capacitor C5, a second capacitor C6, a third capacitor C7, a fourth capacitor C8, a fifth capacitor C9, a sixth capacitor C10, a seventh capacitor C11, a first inductor L4, and a second inductor L5;

[0066] Among them, one end of the first resistor R10 is connected to the live wire L, the other end of the first resistor R10 is connected to the positive electrode of the first diode D4, the negative electrode of the first diode D4 is respectively connected to one end of the first capacitor C5 and one end of the first inductor L4, the other end of the first inductor L4 is respectively connected to one end of the second capacitor C6 and the Drn pin of the chip U1, the other end of the first capacitor C5 is respectively connected to the other end of the second capacitor C6, the positive electrode of the second diode D5, one end of the sixth capacitor C10, one end of the seventh capacitor C11, and the neutral line N and grounded, one end of the third capacitor C7 is connected to the V pin of the chip U1, and the other end of the third capacitor C7 is respectively connected to the V pin of the chip U1. The Src pin of chip U1, the Sre pin of chip U1, one end of the fourth capacitor C8, one end of the second resistor R11, and one end of the second inductor L5 are connected; the other end of the fourth capacitor C8 is respectively connected to the FB pin of chip U1, the other end of the second resistor R11, and one end of the third resistor R12; the other end of the third resistor R12 is respectively connected to one end of the fifth capacitor C9 and the cathode of the third diode D6; the other end of the fifth capacitor C9 is connected to the cathode of the second diode D5; the anode of the third diode D6 is respectively connected to the other end of the second inductor L5, the other end of the sixth capacitor C10, the other end of the seventh capacitor C11 and the A5V terminal.

[0067] The power module of the present invention can provide a 5V, 200mA non-isolated power supply for powering the test platform, and can realize a precise constant voltage regulation function; a 5V voltage difference is obtained after rectification, filtering and voltage stabilization of the single-phase industrial frequency mains power, and since the analog ground is connected to the neutral line N, the 5V voltage difference floats with the AC neutral line; the power is supplied by a self-excited isolated power supply, and the high-voltage area is supplied by a non-isolated power supply, so as to avoid 220V AC from entering the low-voltage area, thereby increasing the reliability of the system.

[0068] When using the test platform to test the hardware, first turn the rotating handle 22 to release the restriction of the dustproof plate 3, then pull down the dustproof plate 3, one end of the dustproof plate 3 squeezes one side of the swing rod 16, and the swing rod 16 pushes the test device 13 outward, and then turn the rotating handle 22, insert one end of the fixed plug rod 23 into the sliding cylinder 18 to fix the dustproof plate 3, and then place one side of the hardware on one side of the measuring plate 1 5, pull the sliding ring 11, release the restriction of the hexagonal connecting rod 9, and rotate the hexagonal connecting rod 9 to make one side of the measuring plate 2 6 fit with one side of the hardware. The staff passes through one side of the measuring plate 2 6 It refers to taking readings at the position of the scale bar 4, and then measuring the size of the hardware. The output end of the hardware is connected to the port of the test device 13 for testing. The test data is displayed on the display screen of the test platform body 1. After the test is completed, the test line is pulled out from the test device 13, and the rotating handle 22 is turned to release the restriction of the dustproof plate 3. The dustproof plate 3 is then pulled upward. One end of the dustproof plate 3 releases the restriction of the swing rod 16, and the rebound force of the tension spring 20 pulls the test device 13 into the protective box 2. The sliding column 17 slides along the swing rod 16, and the test device 13 moves into the protective box 2.

[0069] The above description is only a preferred embodiment of the present invention, so all equivalent changes or modifications made according to the structure, characteristics and principles described in the scope of the patent application of the present invention are included in the scope of the patent application of the present invention.

Claims

1. A hardware-based automated testing platform, comprising a testing platform body (1), characterized in that: A protective box (2) is fixedly connected to one side of the upper end of the test platform body (1), a test device (13) is arranged inside the protective box (2), a sliding column (17) is fixedly connected to one side of the test device (13), a guide sliding groove (14) is provided on one side of the inner wall of the protective box (2), the inner wall of the guide sliding groove (14) is slidably connected to one side of the outer wall of the sliding column (17), the outer wall of the sliding column (17) is also slidably connected to a swing rod (16), one side of the swing rod (16) is rotatably connected to one side of the inner wall of the protective box (2), an L-shaped sliding groove (15) is provided on the other side of the inner wall of the protective box (2), and a dustproof plate (3) is slidably connected to the inner wall of the L-shaped sliding groove (15).

2. A hardware-based automated testing platform according to claim 1, characterized in that: The testing device (13) comprises a main controller module, an interface module, an information reporting module, a display module, a relay control module and a power module; the interface module, the information reporting module, the display module, the storage module, the clock module, the relay control module and the power module are respectively connected to the main controller module; Wherein, the main controller module is used to receive the device under test information of the device under test forwarded by the interface module and generate a control instruction; An interface module, used for receiving the device under test information and forwarding the device under test information to the main controller module; An information reporting module, used for obtaining the information of the device under test and sending the information of the device under test to a monitoring end host; A display module, used to display the information of the device under test; A power module, used to provide required electrical energy; Clock module, used to record time; A storage module, used for storing the information of the device under test in real time according to the time recorded by the clock module; The relay control module is used to receive the control instruction from the main controller module and control the internal relay to close based on the control instruction.

3. A hardware-based automated testing platform according to claim 2, characterized in that: The interface module comprises an interface board, a 16-bit AD conversion chip, and a signal conditioning circuit, and the interface board, the 16-bit AD conversion chip, and the signal conditioning circuit are connected to a main controller module.

4. A hardware-based automated testing platform according to claim 3, characterized in that: The signal conditioning circuit comprises a first resistor R1, a second resistor R2, a third resistor R3, a fourth resistor R4, a fifth resistor R5, a sixth resistor R6, a seventh resistor R7, an eighth resistor R8, a first capacitor C1, a second capacitor C2, a first operational amplifier U1, a second operational amplifier U2, a voltage input VIN terminal and a voltage output VOUT terminal, wherein the voltage input VIN terminal is connected to one end of the first resistor R1, the other end of the first resistor R1 is respectively connected to the negative input terminal of the first operational amplifier U1, one end of the second resistor R2 and one end of the first capacitor C1, and the other end of the first capacitor C1 is respectively connected to the other end of the second resistor R2, the output terminal of the first operational amplifier U1 and the fifth resistor R5 One end of the fifth resistor R5 is respectively connected to one end of the second capacitor C2, one end of the sixth resistor R6 and the negative input end of the second operational amplifier U2, the other end of the second capacitor C2 is respectively connected to the other end of the sixth resistor R6, the output end of the second operational amplifier U2 and the voltage output VOUT end, the positive input end of the second operational amplifier U2 is respectively connected to one end of the seventh resistor R7 and one end of the eighth resistor R8, the other end of the seventh resistor R7 and the other end of the eighth resistor R8 are connected and grounded, the positive input end of the first operational amplifier U1 is respectively connected to one end of the third resistor R3 and one end of the fourth resistor R4, the other end of the third resistor R3 and the other end of the fourth resistor R4 are connected and grounded.

5. The hardware-based automated testing platform according to claim 2, characterized in that: The power module includes a chip U1, a first resistor R10, a second resistor R11, a third resistor R12, a first diode D4, a second diode D5, a third diode D6, a first capacitor C5, a second capacitor C6, a third capacitor C7, a fourth capacitor C8, a fifth capacitor C9, a sixth capacitor C10, a seventh capacitor C11, a first inductor L4, and a second inductor L5; Among them, one end of the first resistor R10 is connected to the live wire L, the other end of the first resistor R10 is connected to the positive electrode of the first diode D4, the negative electrode of the first diode D4 is respectively connected to one end of the first capacitor C5 and one end of the first inductor L4, the other end of the first inductor L4 is respectively connected to one end of the second capacitor C6 and the Drn pin of the chip U1, the other end of the first capacitor C5 is respectively connected to the other end of the second capacitor C6, the positive electrode of the second diode D5, one end of the sixth capacitor C10, one end of the seventh capacitor C11, and the neutral line N and grounded, one end of the third capacitor C7 is connected to the V pin of the chip U1, and the other end of the third capacitor C7 is respectively connected to the V pin of the chip U1. The Src pin of chip U1, the Sre pin of chip U1, one end of the fourth capacitor C8, one end of the second resistor R11, and one end of the second inductor L5 are connected; the other end of the fourth capacitor C8 is respectively connected to the FB pin of chip U1, the other end of the second resistor R11, and one end of the third resistor R12; the other end of the third resistor R12 is respectively connected to one end of the fifth capacitor C9 and the cathode of the third diode D6; the other end of the fifth capacitor C9 is connected to the cathode of the second diode D5; the anode of the third diode D6 is respectively connected to the other end of the second inductor L5, the other end of the sixth capacitor C10, the other end of the seventh capacitor C11 and the A5V terminal.

6. The hardware-based automated testing platform according to claim 1, characterized in that: A sliding cylinder (18) is fixedly connected to one side of the outer wall of the dustproof plate (3), and the outer wall of the sliding cylinder (18) is slidably connected to the inner wall of the L-shaped sliding groove (15). A fixed cylinder (10) is fixedly connected to one side of the protective box (2), and a fixed plug rod (23) is slidably connected inside the fixed cylinder (10). A return spring (21) is sleeved on the outer wall of the fixed plug rod (23), and one end of the fixed plug rod (23) is slidably connected to the inner wall of the sliding cylinder (18). A rotating handle (22) is rotatably connected to one side of the outer wall of the fixed plug rod (23), and one side of the outer wall of the rotating handle (22) is rotatably connected to the outer surface of the fixed cylinder (10).

7. The hardware-based automated testing platform according to claim 1, characterized in that: A tension spring (20) is fixedly connected to one side of the lower end of the test device (13), and one side of the tension spring (20) is fixedly connected to one side of the inner wall of the protection box (2). A second sliding column (19) is fixedly connected to the other side of the test device (13), and the outer side wall of the second sliding column (19) is slidably connected to the inner wall of the guide sliding groove (14).

8. The hardware-based automated testing platform according to claim 1, characterized in that: A slideway (7) is provided on the other side of the upper end of the test platform body (1), a measuring plate 1 (5) is provided on one side of the slideway (7), the lower end of the measuring plate 1 (5) is fixedly connected to one side of the upper end of the test platform body (1), the inner wall of the slideway (7) is slidably connected to a measuring plate 2 (6), the inner wall of the measuring plate 2 (6) is threadedly connected to a threaded rod (12), and a scale bar (4) is fixedly connected to the other side of the upper end of the test platform body (1) and close to the edge.

9. The hardware-based automated testing platform according to claim 8, characterized in that: One side of the threaded rod (12) is fixedly connected to a hexagonal connecting rod (9), the outer side wall of the hexagonal connecting rod (9) is slidably connected to a sliding ring (11), one side of the sliding ring (11) is clamped to a limiting ring (8), and one side of the limiting ring (8) is fixedly connected to one side of the test platform body (1).

10. A testing method based on the hardware-based automated testing platform according to any one of claims 1 to 9, characterized in that: The specific steps include: Step 1, turn the rotating handle (22) to release the restriction of the dustproof plate (3), then pull down the dustproof plate (3), one end of the dustproof plate (3) presses one side of the swing rod (16), the swing rod (16) pushes the test device (13) outward, and then turn the rotating handle (22), one end of the fixed insertion rod (23) is inserted into the sliding cylinder (18), and the dustproof plate (3) is fixed; Step 2, after placing one side of the hardware on one side of the measuring plate 1 (5), pull the sliding ring (11) to release the restriction of the hexagonal connecting rod (9), and rotate the hexagonal connecting rod (9) to make one side of the measuring plate 2 (6) fit with one side of the hardware; Step 3, reading the position of the scale bar (4) by one side finger of the measuring plate 2 (6), and then measuring the size of the hardware, and then connecting the output end of the hardware to the port of the test device (13) to perform the test, and the test data is displayed on the display screen of the test platform body (1), and the test is completed; Step 4, pull the test line out of the test device (13), turn the rotating handle (22) to release the restriction of the dustproof plate (3), and then pull the dustproof plate (3) upward. One end of the dustproof plate (3) releases the restriction of the swing rod (16), and the rebound force of the tension spring (20) pulls the test device (13) into the protective box (2). The sliding column (17) slides along the swing rod (16), and the test device (13) moves into the protective box (2).

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