Multi-piece rotary OLED test probe jig

By using a multi-piece rotating OLED test probe fixture and a PLC controller and mechanical linkage structure, automated continuous testing of OLED devices is achieved, solving the problems of low testing efficiency, poor compatibility and device damage, and improving testing stability and efficiency.

CN121578029APending Publication Date: 2026-02-27JIANG SU HE YI GUANG XIAN KE JI YOU XIAN GONG SI
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Patent Information

Application Number
CN202511807721.8
Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2025-12-03
Publication Date
2026-02-27

AI Technical Summary

Technical Problem

Existing OLED testing fixtures suffer from low testing efficiency, poor compatibility, easy damage to devices, and insufficient testing stability, making it difficult to achieve automated continuous testing.

Method used

A multi-piece rotating OLED test probe fixture is adopted. Through the PLC controller, the support base and rotating tray assembly are coordinated. Combined with the ring guide rail and positioning locking components, the loading station is precisely aligned with the feeding, testing and unloading stations. The mechanical linkage structure replaces the complex clamping components, and the abnormality detection is carried out by combining elastic contact design and photoelectric sensors.

Benefits of technology

Significantly improves testing efficiency, avoids device damage, reduces test data deviation, lowers equipment failure risk, and enables integrated, automated, and continuous testing.

✦ Generated by Eureka AI based on patent content.

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Abstract

The invention relates to the technical field of OLED testing, in particular to a multi-piece rotary OLED testing jig which comprises a bearing base, a rotary tray assembly and a PLC. An annular guide rail and a guide groove are arranged at the top of the bearing base, a feeding and discharging frame is slidably mounted in the guide groove, and a first driving cylinder is arranged at the bottom of the guide groove. The rotating tray assembly comprises a mounting frame and a rotating disc, the mounting frame is arranged at the top of the bearing base, and a second driving cylinder and a first servo motor are arranged at the top of the mounting frame; an annular guide groove matched with the annular guide rail is annularly formed in the bottom of the rotating disc, a plurality of loading stations are arranged on the peripheral edge of the rotating disc in a circumferential array mode, the rotating angle of the rotating disc is matched with the circumferential array interval of the loading stations, and a material taking and discharging mechanism is arranged in each loading station; the PLC is electrically connected with the bearing base and the rotating tray assembly. According to the invention, the detection efficiency and compatibility of the OLED device are improved, the damage to the detection device is reduced, the test stability is improved, and the production efficiency and the product yield are greatly improved.
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Description

Technical Field

[0001] This application relates to the field of OLED testing technology, and in particular to a multi-piece rotating OLED test probe fixture. Background Technology

[0002] With the widespread application of OLED devices in the display field, the demand for performance testing during mass production is becoming increasingly urgent. For example, Chinese patent CN113311308A describes a multi-piece rotating OLED test probe fixture, comprising a square base, a circular device loading platform, electrode ports, electrode probes, an annular pressure plate, a loading platform cover, a stepper motor, a rotating platform, and a CCD light signal collector. Eight electrode ports are arranged in a ring on the device loading platform, with six electrode probes in each port. An annular pressure plate on each electrode port provides pressure for contact between the device and the electrode. A stepper motor is located in the center of the loading platform cover. Driven by pulses, the stepper motor rotates the CCD at the edge of the platform, aligning the CCD sequentially with the device under test. The replacement of light-emitting points and devices is completed by a combination of computer software and hardware driving circuits, avoiding repetitive manual operations in OLED testing. The design of multiple device placement points shortens the waiting time for individual device illumination before testing, greatly improving testing efficiency.

[0003] Existing test fixtures mostly adopt single-station or linear conveyor structures, which suffer from low testing efficiency, cumbersome loading and unloading, and insufficient device positioning accuracy. They are also difficult to adapt to the compatible testing of OLED devices of different sizes. At the same time, the unloading mechanism of traditional fixtures often relies on complex pneumatic or electric clamping components, which are not only structurally redundant and slow in action response, but also prone to scratching damage to the flexible surface of OLED devices. In addition, the contact stability between the device and the probe and the coordination of the actions of each station are insufficient during the testing process, resulting in large deviations in test data. Furthermore, the lack of effective anomaly detection and protection mechanisms can easily lead to equipment failure or device scrapping, seriously affecting production efficiency and product yield. Therefore, there is an urgent need for an integrated, high-precision, highly compatible OLED test fixture that can realize automated continuous testing to solve the technical problems of low efficiency, poor compatibility, easy damage to devices, and insufficient testing stability in existing technologies. Summary of the Invention

[0004] To overcome the problems existing in the prior art, this application provides a multi-piece rotating OLED test probe fixture.

[0005] This application provides a multi-piece rotating OLED test probe fixture using the following technical solution: A multi-chip rotating OLED testing fixture includes a support base, a rotating tray assembly, and a PLC controller. The support base has an annular guide rail on its top and a guide groove extending radially through it. An integrally formed loading and unloading rack is slidably mounted within the guide groove, and a first drive cylinder is located at the bottom of the guide groove to drive the OLED devices within the loading and unloading rack to rise and fall. The rotating tray assembly includes a mounting frame and a rotating disk. The mounting frame is fixedly mounted on the top of the support base, and a second drive cylinder for driving the rotating disk to rise and fall, and a first servo motor for driving the rotating disk to rotate, are located on the top of the mounting frame. An annular guide groove adapted to the annular guide rail is annularly formed at the bottom of the rotating disk, and the rotating disk has... The circular array has several loading stations, which correspond to the feeding station, inspection station, unloading station, and idle station on the support base. The rotation angle of the rotating disk is adapted to the spacing of the circular array of loading stations, ensuring that the loading station is precisely aligned with the corresponding functional station after each rotation. Each loading station is equipped with a material handling mechanism, which is linked with the actions of each functional station to realize the automatic transfer of OLED devices. The PLC controller is electrically connected to the support base and the rotating tray assembly. After the rotating disk is lowered, the loading station in the corresponding functional area synchronously performs feeding, inspection, unloading, and idle operations. After the operation is completed, the rotating disk is controlled to rise, reset, and rotate to the next station.

[0006] Furthermore, the loading and unloading rack includes a base and storage racks evenly distributed on the base. The base has two sets of parallel internally threaded through holes along the extension direction of the guide groove, with adjusting screws passing through these holes. The two sets of adjusting screws are connected by a synchronous transmission mechanism and driven by the same second servo motor to achieve smooth adjustment of the storage racks. The storage racks include placement slots on the base and L-shaped limiting plates evenly distributed at the four corners of the placement slots. The guide groove connects the inlet and outlet ends of the supporting base. Two sets of first drive cylinders at the bottom of the guide groove are precisely positioned to correspond to the loading and unloading mechanisms of the loading and unloading stations, ensuring that the lifting and unloading actions are linked. The output end of the first drive cylinder passes through the base of the loading and unloading rack, and a top plate adapted to the storage rack is located at the top of the output end. The top plate is located in the placement slot on the base and is used to lift the OLED devices to a height that the unloading mechanism can grasp. The material guide trough includes a working section located in the middle of the support base and loading / unloading sections located on both sides of the working section. The opening of the working section of the material guide trough corresponds to the bottom surface of the rotating disk, and the top surface of the storage rack is flush with the upper edge of the opening of the working section of the material guide trough. The opening of the loading section of the material guide trough is horizontal with the top surface of the base.

[0007] Furthermore, the unloading mechanism includes a support bar for supporting OLED devices on the inner side of the loading station. The support bar is slidably installed in the mounting grooves on two opposite sides of the inner side of the loading station. The side of the support bar located in the mounting groove is connected to the bottom of the mounting groove by a spring, and an adjustment block integrally formed with the support bar is also provided between the springs. An adjustment rod corresponding to the adjustment block is provided on the top surface of the bearing base. The adjustment rod passes through the adjustment hole at the bottom of the adjustment block and is adapted to the adjustment groove at the bottom of the adjustment block. The adjustment rod is vertically fixed on the top surface of the bearing base, and its axis is coaxial with the adjustment hole of the adjustment block. The side of the adjustment groove away from the support bar adopts an inclined surface sloping towards the bottom surface. The top of the adjustment rod has an inclined surface adapted to the inclined surface. When the rotating disk descends, the adjustment rod can drive the support bar to retract into the mounting groove through the adjustment hole and the adjustment groove on the adjustment block. Limiting strips are installed on the two opposing inner surfaces of the loading station. The limiting strips are located above the support strips, and the spacing between them is the same as the thickness of the OLED device. The contact surfaces of the limiting strips and the support strips are provided with flexible protective layers. The bottom surface of the limiting strips is flat, the top surface of the support strips is flat, and the bottom surface is an inclined surface facing the free end of the support strips. A photoelectric sensor for detecting the presence or absence of OLED devices is installed on the inner surface of the loading station away from the opening. The detection end of the photoelectric sensor faces the opening of the loading station. When the OLED device is fully placed in the loading station, the photoelectric sensor triggers a signal and feeds it back to the PLC controller.

[0008] Furthermore, the testing station on the support base includes an electrode port fixedly mounted on the support base. A probe mounting plate is fixedly installed within the electrode port, and the probe mounting plate has several guide holes for mounting probes. The probes are slidably mounted within the guide holes. The bottom of the probe contacts the bottom surface of the electrode port via a spring, and the top of the probe fully contacts the OLED device electrode. The probe extends beyond the top surface of the support base under the action of the spring. A CCD light signal acquisition device is also installed at the top of the testing station. The CCD light signal acquisition device is lifted and mounted on a bracket at the top of the support base via a third drive cylinder.

[0009] Furthermore, a detection camera is installed at the open end of the idle station on the support base. The detection camera faces the unloading mechanism on the idle station and is used to detect whether the unloading mechanism is in the reset state and whether there are any OLED devices remaining. The detection signal from the detection camera is fed back to the PLC controller. When an abnormality is detected, the PLC controller controls the equipment to stop and issues an alarm signal.

[0010] Furthermore, the annular guide rail and the annular guide groove are provided with positioning and locking components, including permanent magnet blocks located on the outer side of the annular guide rail and the inner side of the annular guide groove respectively and attracting each other. When the permanent magnet blocks attract each other, the loading station, inspection station, unloading station and idling station on the bearing base correspond to the loading station on the rotary table.

[0011] In summary, this application includes at least one of the following beneficial technical effects: 1. This application uses a PLC controller to coordinate the movement of the support base and the rotating pallet assembly. The rotating pallet, with the help of the matching of the annular guide rail and the annular guide groove and the positioning locking component, achieves precise alignment between the loading station and the feeding, inspection, unloading and idle stations. Combined with the multi-loading station design and the rotating operation mode, the feeding, inspection and unloading operations can be carried out simultaneously, which greatly shortens the test waiting time and significantly improves the test efficiency. 2. The loading and unloading rack in this application realizes the adjustment of the spacing of the storage rack through the adjustment screw and synchronous transmission mechanism. Combined with the L-shaped limiting plate and flexible protective layer, it can not only meet the loading and unloading of OLED devices for continuous testing, but also avoid scratch damage to the flexible surface of the device. 3. In this application, the unloading mechanism replaces complex pneumatic or electric clamping components with a mechanical linkage structure. Combined with the elastic contact design of the probe and spring, it ensures stable contact between the device and the probe. At the same time, the linkage of photoelectric sensor, detection camera and PLC controller forms an effective abnormal detection and protection mechanism, reduces test data deviation, reduces the risk of equipment failure and device scrapping, and ultimately realizes integrated and automated continuous testing. Attached Figure Description

[0012] Figure 1 This is a schematic diagram of the overall structure of a multi-piece rotating OLED test probe fixture; Figure 2 This is an exploded view of a multi-piece rotating OLED test probe fixture; Figure 3 yes Figure 2 Enlarged view of the intermediate inspection station; Figure 4 yes Figure 2 A schematic diagram of the bottom side structure; Figure 5 This is a schematic diagram of the cross-sectional structure of the rotating disk portion in a multi-piece rotating OLED test probe fixture.

[0013] Explanation of reference numerals in the attached drawings: 1. Supporting base; 11. Annular guide rail; 12. Material guide trough; 121. Loading / unloading rack; 1211. Base; 1212. Storage rack; 1213. Through hole; 1214. Adjusting screw; 1215. Second servo motor; 1216. Placement slot; 1217. L-shaped limit plate; 122. First drive cylinder; 123. Working section; 124. Loading / unloading section; 13. Loading station; 14. Detection station; 141. Electrode port; 142. Probe mounting plate; 143. Probe; 144. Guide perforation; 145. CCD optical signal. 146. Acquisition device; 15. Third drive cylinder; 16. Unloading station; 17. Idle station; 18. Detection camera; 19. Bracket; 20. Rotary tray assembly; 21. Mounting frame; 22. Second drive cylinder; 23. First servo motor; 24. Rotary disk; 22. Annular guide groove; 25. Loading station; 26. Limit bar; 27. Photoelectric sensor; 28. Unloading mechanism; 29. ​​Support bar; 20. Adjusting block; 20. Adjusting rod; 21. Adjusting perforation; 22. Adjusting groove; 23. Mounting groove; 24. PLC controller. Detailed Implementation

[0014] The following is in conjunction with the appendix Figure 1-5 This application will be described in further detail.

[0015] This application discloses a multi-piece rotating OLED test probe fixture.

[0016] Reference Figures 1 to 5A multi-chip rotating OLED testing fixture includes a support base 1, a rotating tray assembly 2, and a PLC controller 3. The support base 1 has an annular guide rail 11 at its top and a guide groove 12 extending radially through it. An integrally formed loading and unloading rack 121 is slidably mounted within the guide groove 12, and a first drive cylinder 122 is located at the bottom of the guide groove 12 to drive the OLED devices within the loading and unloading rack 121 to rise and fall. The rotating tray assembly 2 includes a mounting frame 21 and a rotating disk 22. The mounting frame 21 is fixedly mounted on the top of the support base 1, and a second drive cylinder 211 for driving the rotating disk 22 to rise and fall and a first servo motor 212 for driving the rotating disk 22 to rotate are located at the top of the mounting frame 21. The bottom of the rotating disk 22 has an annular guide groove 221 adapted to the annular guide rail 11, and the rotating disk 22... The four sides of the rotating tray 2 are provided with a circular array of loading stations 23. The loading stations 23 correspond to the feeding station 13, inspection station 14, unloading station 15 and idle station 16 on the support base 1. The rotation angle of the rotating disk 22 is adapted to the spacing of the circular array of loading stations 23 to ensure that the loading station 23 is precisely aligned with the corresponding functional station after each rotation. Each loading station 23 is provided with a material handling mechanism 24. The material handling mechanism 24 is linked with the action of each functional station to realize the automatic transfer of OLED devices. The PLC controller 3 is electrically connected to the support base 1 and the rotating tray assembly 2. After the rotating disk 22 is lowered, the loading station 23 of the corresponding functional area simultaneously performs feeding, inspection, unloading and idle operations. After the operation is completed, the rotating disk 22 is controlled to rise and reset and rotate to the next station. After the PLC controller 3 starts, it first controls the second drive cylinder 211 of the rotating tray assembly 2 to drive the rotating disk 22 to descend, so that the annular guide groove 221 at the bottom of the rotating disk 22 precisely fits with the annular guide rail 11 at the top of the support base 1. At this time, the loading stations 23 on the rotating disk 22 are precisely aligned with the loading station 13, the inspection station 14, the unloading station 15, and the idle station 16 on the support base 1. Subsequently, the PLC controller 3 synchronously triggers the linkage of each functional station. Specifically, the picking and unloading mechanism 24 of the loading station 13 cooperates with the loading and unloading rack 121 in the guide groove 12 to grab OLED devices, the inspection station 14 performs device performance testing, the unloading station 15 unloads the devices after completing the test, and the idle station 16 remains in standby state. The picking and unloading mechanism 24 in each loading station 23 coordinates with the corresponding functional station to realize the automatic transfer of OLED devices. After all workstations have completed their single operation, the PLC controller 3 controls the second drive cylinder 211 to drive the rotary table 22 to rise and reset, and then starts the first servo motor 212 to drive the rotary table 22 to rotate. The rotation angle is consistent with the circumferential array spacing of the loading station 23, ensuring that after the rotary table 22 stops, each loading station 23 is precisely aligned with the next functional station, and then the next round of loading, inspection, unloading and idling cycle operation is started. The entire process is automated and continuously controlled by the PLC controller 3.

[0017] reference Figures 1 to 5The loading and unloading rack 121 includes a base 1211 and storage racks 1212 evenly distributed on the base 1211. The base 1211 has two sets of parallel internal threaded through holes 1213 along the extension direction of the guide groove 12, and an adjusting screw 1214 passes through the through hole 1213. The two sets of adjusting screws 1214 are connected by a synchronous transmission mechanism and driven by the same second servo motor 1215 to realize the smooth adjustment of the storage rack 1212. The storage rack 1212 includes a placement groove 1216 opened on the base 1211 and L-shaped limiting plates 1217 evenly distributed at the four corners of the placement groove 1216. The guide trough 12 passes through the inlet and outlet ends of the support base 1. The first drive cylinder 122 at the bottom of the guide trough 12 is provided in two sets and is precisely corresponding to the loading and unloading mechanism 24 of the loading station 13 and the unloading station, respectively, to ensure that the loading action and the unloading action are linked. The output end of the first drive cylinder 122 passes through the base 1211 of the loading and unloading rack 121, and the top of the output end is provided with a top plate adapted to the storage rack 1212. The top plate is located in the placement groove 1216 on the base 1211 and is used to lift the OLED device to the height that the unloading mechanism 24 can grasp. The material guide trough 12 includes a working section 123 located in the middle of the support base 1 and loading / unloading sections 124 located on both sides of the working section 123. The opening of the working section 123 of the material guide trough 12 corresponds to the bottom surface of the rotating disk 22, and the top surface of the storage rack 1212 is flush with the upper edge of the opening of the working section 123 of the material guide trough 12. The opening of the loading section of the material guide trough 12 is horizontal with the top surface of the base 1211. The loading / unloading rack 121 slides along the material guide trough 12 of the support base 1 via the base 1211. The working section 123 of the material guide trough 12 corresponds to the bottom of the rotating disk 22, and the loading / unloading sections 124 serve as the inlet and outlet ends, respectively. The top surface of the storage rack 1212 is flush with the upper edge of the opening of the working section 123 of the material guide trough 12, ensuring smooth transfer of OLED devices.When work begins, the second servo motor 1215 starts, driving two sets of adjusting screws 1214 to rotate synchronously via a synchronous transmission mechanism. Since the adjusting screws 1214 are compatible with the internal threaded through holes 1213 on the base 1211, and the two sets of adjusting screws 1214 are arranged in parallel, the storage rack 1212 on the base 1211 can smoothly adjust its spacing. Simultaneously, the storage rack 1212 for loading OLED devices uses L-shaped limiting plates 1217 to limit the OLED devices from their four corners. The placement slot 1216 provides a stable placement space for the devices. During loading, the loading / unloading rack 121 containing the OLED devices is adjusted to the corresponding position of the loading station 13 on the working section 123 of the guide chute 12. The first drive cylinder 122 starts, and its output plate moves from the base 1211... The OLED device is lifted into the placement slot 1216 to a height that the unloading mechanism 24 can grasp, and the first drive cylinder 122 is linked with the unloading mechanism 24 of the loading station 13. When unloading, the first drive cylinder 122 of the unloading station moves synchronously, and the top plate receives the OLED device released by the unloading mechanism 24. Then the loading and unloading rack 121 slides along the guide groove 12 to the discharge end to complete the unloading. After the single set of storage racks 1212 on the loading and unloading rack 121 is finished loading, the single set of storage racks 1212 at the unloading station 15 on the other side is also full. Then the loading and unloading rack 121 is moved by adjusting the screw 1214 so that the storage racks 1212 at the loading station 13 and the unloading station 15 move synchronously, and the linkage between loading and unloading ensures accurate and efficient loading and unloading.

[0018] Reference Figures 1 to 5The unloading mechanism 24 includes a support strip 241 for supporting OLED devices, which is provided inside the loading station 23. The support strip 241 is slidably installed in the mounting grooves 246 on two opposite sides inside the loading station 23. The side of the support strip 241 located in the mounting groove 246 is connected to the bottom of the mounting groove 246 by a spring, and an adjusting block 242 integrally formed with the support strip 241 is provided between the springs. An adjusting rod 243 corresponding to the adjusting block 242 is provided on the top surface of the bearing base 1. The adjusting rod 243 passes through the bottom of the adjusting block 242. The adjustment hole 244 is adapted to the adjustment groove 245 opened at the bottom of the adjustment block 242. The adjustment rod 243 is vertically fixed on the top surface of the bearing base 1, and its axis is coaxial with the adjustment hole 244 of the adjustment block 242. The side of the adjustment groove 245 away from the support bar 241 adopts an inclined surface that is inclined towards the bottom surface. The top of the adjustment rod 243 is provided with an inclined surface adapted to the inclined surface. When the rotating disk 22 descends, the adjustment rod 243 can drive the support bar 241 to retract into the mounting groove 246 through the adjustment hole 244 and the adjustment groove 245 on the adjustment block 242. Limiting strips 231 are installed on the two opposing inner surfaces of the loading station 23. The limiting strips 231 are located above the support strips 241 and the spacing between them is the same as the thickness of the OLED device. The contact surfaces of the limiting strips 231 and the support strips 241 are provided with flexible protective layers. The bottom surface of the limiting strips 231 is flat, the top surface of the support strips 241 is flat, and the bottom surface is an inclined surface facing the free end of the support strips 241. A photoelectric sensor 232 for detecting the presence or absence of OLED devices is installed on the inner surface of the loading station 23 away from the opening. The detection end of the photoelectric sensor 232 faces the opening direction of the loading station 23. When the OLED device is fully placed into the loading station 23, the photoelectric sensor 232 triggers a signal and feeds it back to the PLC controller 3. When the rotating disk 22 descends to the loading station 23 and aligns with the corresponding functional station, the adjusting rod 243 on the top surface of the bearing base 1 passes through the adjusting hole 244 at the bottom of the adjusting block 242 and matches the adjusting groove 245 of the adjusting block 242. As the rotating disk 22 continues to descend, the inclined surface at the top of the adjusting rod 243 interacts with the inclined surface of the adjusting groove 245, driving the adjusting block 242 to retract the support bar 241 into the mounting groove 246. At this time, the support bar 241 no longer supports the OLED device, and the OLED device lifted by the first driving cylinder 122 in the loading station 13 enters the loading station 23. The gap between the limiting bar 231 and the support bar 241 matches the thickness of the OLED device, and the flexible protective layer on the contact surface of the two prevents damage to the device. When the rotating disk 22 rises, the adjusting rod 243 disengages from the adjusting block 242, and the support bar 241 resets under the elastic force of the spring, extending from the inside of the loading station 23 to support the OLED device, thus achieving stable support of the device.The limiting bar 231 limits the OLED device from above, and the L-shaped limiting plate 1217 provides auxiliary positioning from the four corners. The photoelectric sensor 232 in the loading station 23 faces the opening direction. When the OLED device is fully placed in the loading station 23, the photoelectric sensor 232 triggers a signal and feeds it back to the PLC controller 3 to confirm that the device is in place. At the unloading station 15, when the rotating disk 22 descends, the support bar 241 retracts again, and the OLED device is released onto the top plate of the unloading station, completing the automatic unloading. The entire unloading process is realized through mechanical structure linkage, without the need for complex clamping components, which ensures the stability of the transfer and avoids damage to the device.

[0019] Reference Figures 1 to 5 The detection station 14 on the support base 1 includes an electrode port 141 on the support base 1. A probe mounting plate 142 is fixedly installed in the electrode port 141, and the probe mounting plate 142 has several guide holes 144 for mounting probes 143. The probes 143 are slidably installed in the guide holes 144. The bottom of the probes 143 contacts the bottom surface of the electrode port 141 through a spring, and the top of the probes 143 is in full contact with the electrodes of the OLED device. The probes 143 extend out of the top surface of the support base 1 under the action of the spring. A CCD light signal acquisition device 145 is also installed on the top of the detection station 14. The CCD light signal acquisition device 145 is lifted and lowered on the bracket 17 on the top of the support base 1 by a third drive cylinder 146. After the rotating disk 22 descends to precisely align the loading station 23 with the testing station 14, the OLED device in the loading station 23 maintains a stable posture under the coordinated action of the support bar 241 and the limiting bar 231. The probe 143 in the electrode port 141 extends upward under the elastic force of the bottom spring, making full contact with the electrode of the OLED device to ensure stable electrical connection. At the same time, the PLC controller 3 controls the third drive cylinder 146 to drive the CCD light signal acquisition device 145 to descend to the preset detection height to acquire the light signal of the OLED device. During the acquisition process, the probe 143 always maintains good contact with the electrode under the action of the spring to avoid test deviation caused by poor contact. After the test is completed, the third drive cylinder 146 drives the CCD light signal acquisition device 145 to rise and reset. During the subsequent transfer of the OLED device, the probe 143 rebounds under the action of the spring as the OLED device detaches, waiting for the next test operation. The entire testing process ensures contact stability through mechanical structure and achieves accurate detection in conjunction with CCD light signal acquisition.

[0020] Reference Figures 1 to 5A detection camera 161 is also installed at the open end of the idle station 16 on the support base 1. The detection camera 161 faces the unloading mechanism 24 on the idle station 16 and is used to detect whether the unloading mechanism 24 is in the reset state and whether there are any OLED devices remaining. The detection signal of the detection camera 161 is fed back to the PLC controller 3. When an abnormality is detected, the PLC controller 3 controls the equipment to stop and issues an alarm signal. The idle station 16, as a supplement to the functional station, operates synchronously with the loading, detection, and unloading station 15 during the rotation of the rotary table 22. The detection camera 161 installed at its open end faces the unloading mechanism 24 in real time to detect the status of the unloading mechanism 24. The detection camera 161 mainly monitors several aspects, specifically: first, whether the support bar 241 of the unloading mechanism 24 is reset to the supporting position under the action of the spring; second, whether there are any untransferred OLED devices remaining in the loading station 23; and third, the state of the support bar 241 retracting and extending in the no-load state. The detection camera 161 feeds back the detection signal to the PLC controller 3 in real time. If the support bar 241 is not reset or there are residual components, the PLC controller 3 immediately issues a control command to stop the equipment and trigger an alarm signal, reminding the staff to troubleshoot the fault in time, so as to avoid component damage or equipment failure caused by the equipment continuing to run under abnormal conditions, and ensure the stable operation of the test fixture.

[0021] Reference Figures 1 to 5 The annular guide rail 11 and the annular guide groove 221 are equipped with positioning and locking components, including permanent magnet blocks located on the outer side of the annular guide rail 11 and the inner side of the annular guide groove 221 respectively, which attract each other. When the permanent magnet blocks attract each other, the loading station 13, the inspection station 14, the unloading station 15, and the idling station 16 on the bearing base 1 correspond to the loading station 23 on the rotating disk 22. The positioning and locking components are composed of permanent magnet blocks on the outer side of the annular guide rail 11 and the inner side of the annular guide groove 221. When the PLC controller 3 controls the rotating disk 22 to descend, the annular guide groove 221 moves down synchronously with the rotating disk 22 and gradually fits into the annular guide rail 11 at the top of the bearing base 1. During the bonding process, the permanent magnets on the annular guide rail 11 and the annular guide groove 221 attract each other, generating an adsorption force. This further refines the positioning of the rotating disk 22, ensuring that the loading station 13, inspection station 14, unloading station 15, and idling station 16 on the support base 1 correspond precisely to the loading station 23 on the rotating disk 22, avoiding station offsets caused by mechanical transmission errors. After the operation is completed, the PLC controller 3 controls the rotating disk 22 to rise. The adsorption force between the permanent magnets gradually disappears, and the rotating disk 22 smoothly detaches from the annular guide rail 11 and rotates to the next station. This positioning and locking structure achieves auxiliary positioning through magnetic adsorption, improving the accuracy of station alignment and ensuring the synergy of the actions of each functional station.

[0022] Working principle: First, the second servo motor 1215 drives the adjusting screw 1214 and the synchronous transmission mechanism to adjust the position of the loading and unloading rack 121 on the guide groove 12, and the L-shaped limit plate 1217 limits the device. After the equipment is started, the PLC controller 3 controls the second drive cylinder 211 to drive the rotating disk 22 to descend. The annular guide groove 221 is adapted to the annular guide rail 11 and is attracted and locked by the permanent magnet block, so that the loading station 23 on the rotating disk 22 is precisely aligned with the loading, detection, unloading and idling station 16 on the bearing base 1. At this time, the adjusting rod 243 and the adjusting block 242 of the unloading mechanism 24 act to drive the support bar 241 to retract into the mounting groove 246. At loading station 13, the first drive cylinder 122 pushes the top plate to lift the OLED device in the storage rack 1212 to the picking height. After the device enters loading station 23, the photoelectric sensor 232 triggers a signal to feed back to the PLC controller 3. The second drive cylinder 211 drives the rotating disk to rise. The adjusting rod 243 gradually disengages from the adjusting groove 245 on the adjusting block 242. The support bar 241 resets under the action of the spring to support the OLED device to be tested, thereby loading it into loading station 23. At the same time, the limiting bar 231 works with the flexible protective layer to limit and protect the device. At testing station 14, after the second drive cylinder 211 drives the rotating disk 22 to descend, the adjusting rod 243 interacts with the adjusting block 242 of the unloading mechanism 24, driving the support bar 241 to retract into the mounting groove 246. The top of the OLED device under test is limited by the limiting bar 231, and the bottom contacts the probe 143. Under the action of the spring, the probe 143 makes full contact with the electrode of the OLED device. The third drive cylinder 146 drives the CCD light signal acquisition device 145 to descend, completing the light signal acquisition. After the light signal acquisition, the second drive cylinder 211 drives the rotating disk to rise, and the adjusting rod 243 gradually disengages from the adjusting groove 245 on the adjusting block 242. Under the action of the spring, the support bar 241 resets to support the OLED device under test, and cooperates with the probe 143 to support the OLED device under test, thereby reloading it into the loading station 23. At unloading station 15, after the second drive cylinder 211 drives the rotary disk 22 to descend, the adjusting rod 243 interacts with the adjusting block 242 of the unloading mechanism 24, driving the support bar 241 to retract into the mounting slot 246. The first drive cylinder 122, in conjunction with the top plate, unloads the OLED device from unloading station 15 into the loading rack 121. At idle station 16, the detection camera 161 monitors the reset status of the unloading mechanism 24 and whether any device remains, as well as the retraction and reset actions of the support bar 241. In case of an abnormality, the PLC controller 3 controls the equipment to stop and alarm. After the operation of each station is synchronized, the PLC controller 3 controls the rotary disk 22 to rise and reset. The first servo motor 212 drives the rotary disk 22 to rotate to the next station, repeating the above process to achieve automated continuous testing of OLED devices.

[0023] The above are all preferred embodiments of this application, and are not intended to limit the scope of protection of this application. Therefore, all equivalent changes made in accordance with the structure, shape and principle of this application should be covered within the scope of protection of this application.

Claims

1. A multi-chip rotating OLED testing fixture, characterized in that: Includes a support base (1), a rotating pallet assembly (2), and a PLC controller (3); The top of the support base (1) is provided with an annular guide rail (11), and a guide groove (12) is provided through the radial direction of the support base (1). An integrally formed loading and unloading rack (121) is slidably installed in the guide groove (12), and a first driving cylinder (122) is provided at the bottom of the guide groove (12) to drive the OLED device in the loading and unloading rack (121) to rise and fall. The rotating pallet assembly (2) includes a mounting frame (21) and a rotating disk (22). The mounting frame (21) is fixedly mounted on the top of the support base (1). The top of the mounting frame (21) is provided with a second drive cylinder (211) for driving the rotating disk (22) to rise and fall, and a first servo motor (212) for driving the rotating disk (22) to rotate. The bottom of the rotating disk (22) is provided with an annular guide groove (221) that is adapted to the annular guide rail (11). The four sides of the rotating disk (22) are provided with a circular array of several loading stations (23). The loading station (23) corresponds to the loading station (13), inspection station (14), unloading station (15) and idle station (16) on the bearing base (1), respectively. The rotation angle of the rotating disk (22) is adapted to the circumferential array spacing of the loading station (23) to ensure that the loading station (23) is precisely aligned with the corresponding functional station after each rotation. Each loading station (23) is equipped with a material handling mechanism (24). The material handling mechanism (24) is linked with the action of each functional station to realize the automatic transfer of OLED devices. The PLC controller (3) is electrically connected to the support base (1) and the rotating pallet assembly (2) respectively. After the rotating pallet (22) is lowered, the loading station (23) of the corresponding functional area synchronously performs loading, detection, unloading and idling operations. After the operation is completed, the rotating pallet (22) is raised, reset and rotated to the next station.

2. The multi-piece rotating OLED testing fixture according to claim 1, characterized in that: The loading and unloading rack (121) includes a base (1211) and storage racks (1212) evenly distributed on the base (1211). The base (1211) has two sets of parallel internal thread through holes (1213) along the extension direction of the guide groove (12), and an adjusting screw (1214) passes through the through hole (1213). The two sets of adjusting screws (1214) are connected by a synchronous transmission mechanism and driven by the same second servo motor (1215) to realize the smooth adjustment of the storage rack (1212). The storage rack (1212) includes a placement groove (1216) opened on the base (1211) and L-shaped limiting plates (1217) evenly distributed at the four corners of the placement groove (1216).

3. The multi-piece rotating OLED testing fixture according to claim 2, characterized in that: The guide trough (12) passes through the inlet and outlet of the bearing base (1). The first drive cylinder (122) at the bottom of the guide trough (12) is provided with two sets and is precisely corresponding to the loading station (13) and unloading station's unloading mechanism (24) to ensure that the top material action and the unloading action are linked. The output end of the first drive cylinder (122) passes through the base (1211) of the loading and unloading rack (121), and the top of the output end is provided with a top material plate that is compatible with the storage rack (1212). The top material plate is located in the placement groove (1216) on the base (1211) and is used to lift the OLED device to the height that the unloading mechanism (24) can grasp.

4. The multi-piece rotating OLED testing fixture according to claim 3, characterized in that: The guide trough (12) includes a working section (123) located in the middle section of the bearing base (1) and loading and unloading sections (124) located on both sides of the working section (123). The groove of the working section (123) of the guide trough (12) corresponds to the bottom surface of the rotating disk (22), and the top surface of the storage rack (1212) is flush with the upper edge of the groove of the working section (123) of the guide trough (12). The groove of the loading section of the guide trough (12) is horizontal with the top surface of the base (1211).

5. The multi-piece rotating OLED testing fixture according to claim 1, characterized in that: The unloading mechanism (24) includes a support strip (241) for supporting OLED devices, which is provided on the inner side of the loading station (23). The support strip (241) is slidably installed in the mounting grooves (246) on two opposite sides of the inner side of the loading station (23). The side of the support strip (241) located in the mounting groove (246) is connected to the bottom of the mounting groove (246) by a spring. An adjusting block (242) integrally formed with the support strip (241) is also provided between the springs. An adjusting rod (243) corresponding to the adjusting block (242) is provided on the top surface of the bearing base (1). The adjusting rod (243) passes through the bottom of the adjusting block (242). The adjustment rod (243) is vertically fixed on the top surface of the bearing base (1) and its axis is coaxial with the adjustment through hole (244) of the adjustment block (242). The side of the adjustment groove (245) away from the support bar (241) is inclined towards the bottom surface. The top of the adjustment rod (243) is provided with an inclined surface that matches the inclined surface. When the rotating disk (22) descends, the adjustment rod (243) can drive the support bar (241) to retract into the mounting groove (246) through the adjustment through hole (244) and the adjustment groove (245) on the adjustment block (242).

6. The multi-piece rotating OLED test fixture according to claim 5, characterized in that: Limiting strips (231) are installed on the two opposing inner surfaces of the loading station (23). The limiting strips (231) are located above the support strips (241) and the gap between them is the same as the thickness of the OLED device. The contact surfaces of the limiting strips (231) and the support strips (241) are provided with a flexible protective layer. The bottom surface of the limiting strips (231) is a plane, the top surface of the support strips (241) is a plane, and the bottom surface is an inclined surface facing the free end of the support strips (241). A photoelectric sensor (232) for detecting the presence or absence of OLED devices is installed on the inner surface of the loading station (23) away from the opening. The detection end of the photoelectric sensor (232) faces the opening direction of the loading station (23). When the OLED device is completely placed into the loading station (23), the photoelectric sensor (232) triggers a signal and feeds it back to the PLC controller (3).

7. The multi-piece rotating OLED testing fixture according to claim 1, characterized in that: The detection station (14) on the support base (1) includes an electrode port (141) on the support base (1), wherein a probe mounting plate (142) is fixedly installed in the electrode port (141), and a plurality of guide holes (144) for mounting probes (143) are opened on the probe mounting plate (142). The probes (143) are slidably installed in the guide holes (144). The bottom of the probes (143) is in contact with the bottom surface of the electrode port (141) through a spring, and the top of the probes (143) is in full contact with the OLED device electrode. The probes (143) extend out of the top surface of the support base (1) under the action of the spring.

8. The multi-piece rotating OLED test fixture according to claim 7, characterized in that: The top of the testing station (14) is also equipped with a CCD optical signal acquisition device (145), which is mounted on the bracket (17) on the top of the bearing base (1) by a third drive cylinder (146).

9. The multi-piece rotating OLED testing fixture according to claim 1, characterized in that: A detection camera (161) is also installed at the open end of the idle station (16) on the bearing base (1). The detection camera (161) faces the unloading mechanism (24) on the idle station (16) and is used to detect whether the unloading mechanism (24) of the idle station (16) is in the reset state and whether there are any OLED devices left. The detection signal of the detection camera (161) is fed back to the PLC controller (3). When an abnormality is detected, the PLC controller (3) controls the equipment to stop and issues an alarm signal.

10. The multi-piece rotating OLED testing fixture according to claim 1, characterized in that: The annular guide rail (11) and the annular guide groove (221) are provided with positioning and locking components, including permanent magnet blocks located on the outer side of the annular guide rail (11) and the inner side of the annular guide groove (221) respectively and attracting each other. When the permanent magnet blocks attract each other, the loading station (13), the detection station (14), the unloading station (15) and the idling station (16) on the bearing base (1) correspond to the loading station (23) on the rotating disk (22).

Citation Information

Patent Citations

  • Multi-piece rotary OLED test probe jig

    CN113311308A