System for testing CT value by detecting reflection spectrum
By designing a system for detecting reflection spectrum to test CT values, using optical control circuits and PD sensors, the problem of insufficient sensitivity and specificity in detecting reflection spectrum is solved, and high sensitivity and rapid detection of CT values are achieved effect.
Patent Information
- Application Number
- CN202420453969.3
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-03-11
- Publication Date
- 2024-12-13
- Estimated Expiration
- 2034-03-11
AI Technical Summary
Existing colloidal gold fluorescence detectors have problems with insufficient sensitivity and specificity when detecting reflection spectrum, making it difficult to quickly and accurately measure CT values.
A system was designed to test CT values by detecting reflection spectra, including optical control circuits, filters, mechanical control components and PD sensors. The 365NM wavelength LED lamp beads are used to stimulate the measured substance on the fluorescent test strip and pass the filter. Reflect light of different wavelengths to the PD sensor, generate electrical signals and form waveforms.
It achieves high sensitivity and high specificity, and quickly detects CT values, and can accurately convert optical signals into electrical signals and generate waveforms.
Smart Images
Figure CN222167046U_ABST
Abstract
Description
Technical Field
[0001] The invention relates to the technical field of biological detection, and in particular to a system for testing CT values by detecting reflection spectra. Background Art
[0002] The colloidal gold fluorescence detector is a highly sensitive biological detection instrument, which is widely used in the fields of medicine, biotechnology and food safety. Its technical core is to use the characteristics of colloidal gold and fluorescence to quickly and accurately collect and analyze the target molecules in the sample. Its products are basically focused on the accuracy of the test results and the detection speed. This technology is mainly composed of four units: an optical control unit, a mechanical structure unit, a control and analysis unit, and an external power adapter. It uses colloidal gold fluorescence quantitative detection, obtains the reflection value by the sensor through the principle of spectral reflection, and performs high-precision reflection value calculation and calibration through the control and analysis unit, calculates the corresponding photometric curve, and accurate data value.
[0003] A system for testing CT value using reflection spectrum is now proposed. Summary of the invention
[0004] In view of the above problems, a system for testing the CT value by detecting the reflection spectrum is now provided, aiming to solve the problems existing in the prior art.
[0005] The specific technical solutions are as follows:
[0006] A system for testing CT value by detecting reflection spectrum comprises an optical control circuit, a filter, a mechanical control component, a detection card and a PD sensor; the optical control circuit is used to control the light emitting diode therein to generate required light; the filter is arranged in front of the light emitting diode at a certain angle so that the light generated by the light emitting diode just passes through the filter; the mechanical control component is used to adjust the position of the detection card to receive the light reflected by the filter; the PD sensor is used to receive feedback light of different wavelengths generated by the detection card due to the light reflected by the filter.
[0007] The above-mentioned system for testing CT value by detecting reflection spectrum also has the following characteristics: the optical control circuit includes a resistor R1, a capacitor C1, a capacitor C2, a transistor Q1, a light-emitting diode D1, a resistor R2, a resistor R3 and a capacitor C3; one end of the resistor R1 serves as a first input end; the other end of the resistor R1 is electrically connected to the base of the transistor Q1; the base of the transistor Q1 is also grounded through the capacitor C1; the capacitor C2 is connected in parallel to both ends of the capacitor C1; the anode of the light-emitting diode D1 serves as a second input end; the cathode of the light-emitting diode D1 is electrically connected to the collector of the transistor Q1; the emitter of the transistor Q1 is grounded through the resistor R2; the emitter of the transistor Q1 is also grounded through the resistor R3 and the capacitor C3 in sequence; and the common end of the resistor R3 and the capacitor C3 serves as an output end.
[0008] The above-mentioned system for testing the CT value by detecting the reflection spectrum also has the following feature: the light emitting diode D1 is an LED lamp bead that can generate a wavelength of 365NM.
[0009] The above-mentioned system for testing CT value by detecting reflection spectrum also has the following characteristics: the mechanical control component includes a stepper motor and a screw rod, the power output end of the stepper motor is transmission connected to one end of the screw rod, and the screw rod is transmission connected to the detection card. When the stepper motor is started, the detection card can be driven to move.
[0010] The above-mentioned system for testing CT value by detecting reflection spectrum also has the following characteristics: a fluorescent test strip is provided on the test card, and when light with a wavelength of 365NM is irradiated onto the fluorescent test strip, the light with a wavelength of 365NM will excite the substance to be tested on the NC membrane carrier on the test strip, and when the substance to be tested is irradiated by the light with a wavelength of 365NM, it will reflect light with a wavelength of 610NM.
[0011] The above-mentioned system for testing CT value by detecting reflection spectrum also has the following characteristics: the optical filter has the ability to reflect light with a wavelength of 365 nm, but light with a wavelength of 610 nm can smoothly pass through the optical filter and reach the receiving surface of the PD sensor.
[0012] In summary, the beneficial effects of this scheme are:
[0013] In the system for testing CT value by detecting reflection spectrum provided by the present invention, light of different intensities is received by the detection card, and feedback light of different wavelengths is generated accordingly, and the feedback light is received by the PD sensor to convert into an electrical signal and generate a waveform. The system for testing CT value by detecting reflection spectrum provided by the present invention has the effects of high sensitivity, high specificity and rapid detection. BRIEF DESCRIPTION OF THE DRAWINGS
[0014] Figure 1 It is a front view structural schematic diagram of the system for testing CT value by detecting reflection spectrum of the present invention;
[0015] Figure 2 It is a schematic diagram of the structure of the optical control circuit of the system for testing the CT value by detecting the reflection spectrum of the present invention.
[0016] Description of the accompanying drawings: 1. Detection card; 2. Filter plate; 3. PD sensor. DETAILED DESCRIPTION
[0017] The technical solution of the present invention will be clearly and completely described below in conjunction with the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.
[0018] It should be noted that, in the absence of conflict, the embodiments of the present invention and the features in the embodiments may be combined with each other.
[0019] The present invention will be further described below in conjunction with specific embodiments, but the present invention is not limited thereto.
[0020] Figure 1 This is a schematic diagram of the front view of the system for testing CT value by detecting reflection spectrum of the present invention, Figure 2 FIG. 1 is a schematic diagram of the structure of the optical control circuit of the system for testing the CT value by detecting the reflection spectrum of the present invention. Figure 1 and Figure 2 As shown, the system for testing CT value by detecting reflection spectrum provided by the present embodiment includes an optical control circuit, a filter, a mechanical control component, a detection card 1 and a PD sensor 3; the optical control circuit is used to control the light emitting diode therein to generate the required light; the filter is arranged in front of the light emitting diode at a certain angle so that the light generated by the light emitting diode just passes through the filter; the mechanical control component is used to adjust the position of the detection card 1 to receive the light reflected by the filter; the PD sensor 3 is used to receive feedback light of different wavelengths generated by the detection card 1 due to the light reflected by the filter.
[0021] In the above embodiment, the optical control circuit includes a resistor R1, a capacitor C1, a capacitor C2, a transistor Q1, a light-emitting diode D1, a resistor R2, a resistor R3 and a capacitor C3, one end of the resistor R1 serves as a first input end, the other end of the resistor R1 is electrically connected to the base of the transistor Q1, the base of the transistor Q1 is also grounded through the capacitor C1, the capacitor C2 is connected in parallel to both ends of the capacitor C1, the anode of the light-emitting diode D1 serves as a second input end, the cathode of the light-emitting diode D1 is electrically connected to the collector of the transistor Q1, the emitter of the transistor Q1 is grounded through the resistor R2, the emitter of the transistor Q1 is also grounded through the resistor R3 and the capacitor C3 in sequence, and the common end of the resistor R3 and the capacitor C3 serves as an output end.
[0022] In the above embodiment, the light emitting diode D1 is an LED lamp bead capable of generating light with a wavelength of 365 nm.
[0023] In the above embodiment, the mechanical control component includes a stepper motor and a screw rod, the power output end of the stepper motor is transmission connected to one end of the screw rod, and the screw rod is transmission connected to the detection card 1. When the stepper motor is started, it can drive the detection card 1 to move.
[0024] In the above embodiment, a fluorescent test strip is provided on the detection card 1. When light with a wavelength of 365NM is irradiated onto the fluorescent test strip, the light with a wavelength of 365NM will excite the substance to be tested on the NC membrane carrier on the test strip. When the substance to be tested is irradiated by the light with a wavelength of 365NM, it will reflect light with a wavelength of 610NM.
[0025] In the above embodiment, the filter has the ability to reflect light with a wavelength of 365 nm, but light with a wavelength of 610 nm can pass through the filter smoothly and reach the receiving surface of the PD sensor 3 .
[0026] Working principle: through the PWM modulation of the single-chip computer, the control signal is output, the LED light-emitting diode is lit, and the light of 365NM wavelength is emitted. When the light encounters the filter at a specific angle, the light of 365NM wavelength cannot penetrate the filter due to the characteristics of the filter, and it will be reflected at the reflection angle of the filter. When the reflected light irradiates the fluorescent test strip on the test card 1, the light of 365NM wavelength will excite the substance to be tested on the NC membrane carrier on the test strip. When the substance to be tested is irradiated by the light of 365NM wavelength, it will reflect the light of 610NM wavelength, and the substance to be tested will be stimulated by the light of 610NM wavelength. The stronger the reaction of the material, the stronger the intensity of the light with a wavelength of 610NM will be. When the light with a wavelength of 610NM is emitted, it enters the optical path structure and encounters the filter with a wavelength of 365NM. Because the filter only blocks the light with a wavelength of 365NM from passing through, the light with a wavelength of 610NM can pass through the filter smoothly and reach the receiving surface of the PD sensor 3. After receiving the light, the PD sensor 3 will convert it into different electrical signals according to different light intensities, and use an external operational amplifier to receive and analyze the electrical signals to generate the waveform presented by the instrument.
[0027] The above are only preferred embodiments of the present invention, and are not intended to limit the implementation methods and protection scope of the present invention. Those skilled in the art should be aware that all solutions obtained by equivalent substitutions and obvious changes made using the contents of the specification of the present invention should be included in the protection scope of the present invention.
Claims
1. A system for testing CT value by detecting reflection spectrum, characterized in that: It includes an optical control circuit, a filter, a mechanical control component, a detection card (1) and a PD sensor (3); The optical control circuit is used to control the light emitting diode therein to generate the required light; The filter is arranged in front of the light emitting diode at a certain angle so that the light generated by the light emitting diode just passes through the filter; The mechanical control component is used to adjust the position of the detection card (1) to receive the light reflected by the filter; The PD sensor (3) is used to receive feedback light of different wavelengths generated by the detection card (1) due to the light reflected by the filter.
2. A system for testing CT value by detecting reflection spectrum according to claim 1, characterized in that: The optical control circuit includes a resistor R1, a capacitor C1, a capacitor C2, a transistor Q1, a light-emitting diode D1, a resistor R2, a resistor R3 and a capacitor C3, one end of the resistor R1 serves as a first input end, the other end of the resistor R1 is electrically connected to the base of the transistor Q1, the base of the transistor Q1 is also grounded through the capacitor C1, the capacitor C2 is connected in parallel to both ends of the capacitor C1, the anode of the light-emitting diode D1 serves as a second input end, the cathode of the light-emitting diode D1 is electrically connected to the collector of the transistor Q1, the emitter of the transistor Q1 is grounded through the resistor R2, the emitter of the transistor Q1 is also grounded through the resistor R3 and the capacitor C3 in sequence, and the common end of the resistor R3 and the capacitor C3 serves as an output end.
3. A system for testing CT value by detecting reflection spectrum according to claim 2, characterized in that: The light emitting diode D1 is an LED lamp bead that can generate a wavelength of 365NM.
4. A system for testing CT value by detecting reflection spectrum according to any one of claims 1 to 3, characterized in that: The mechanical control component comprises a stepper motor and a screw rod, wherein the power output end of the stepper motor is transmission-connected to one end of the screw rod, and the screw rod is transmission-connected to the detection card (1). When the stepper motor is started, the detection card (1) can be driven to move.
5. The system for testing CT value by detecting reflection spectrum according to claim 3, characterized in that: The detection card (1) is provided with a fluorescent test strip. When light with a wavelength of 365 nm is irradiated onto the fluorescent test strip, the light with a wavelength of 365 nm will excite the substance to be tested on the NC membrane carrier on the test strip. When the substance to be tested is irradiated by the light with a wavelength of 365 nm, it will reflect light with a wavelength of 610 nm.
6. The system for testing CT value by detecting reflection spectrum according to claim 5, characterized in that: The filter has the ability to reflect light with a wavelength of 365 nm, but light with a wavelength of 610 nm can pass through the filter smoothly and reach the receiving surface of the PD sensor (3).