Coupling test device
By designing a coupling test device for partitioning and supporting structures, the problem of low coupling test efficiency in the prior art is solved, efficient testing of a variety of antenna modules is realized, and testing stability and efficiency are improved.
Patent Information
- Application Number
- CN202420926565.1
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-04-29
- Publication Date
- 2024-12-17
- Estimated Expiration
- 2034-04-29
AI Technical Summary
In the prior art, the coupling test process of the antenna module of electronic devices is cumbersome, resulting in inefficient coupling testing and multiple testing devices are required to be compatible with multiple types of antenna modules.
A coupling test device including a housing, a support assembly and a plurality of coupling parts is designed, and the electronic device is allowed to enter the test through the inlet of the housing. Each coupling part is separated from the orthoprojection on one side of the housing, and the support assembly is passed through the first The two accommodating chamber supports the coupling portion, the plurality of coupling portions are arranged in at least two rows and two columns, spaced to reduce contact and interference between the coupling portions, the support assembly can be moved to adjust the coupling position, and the interface is electrically connected to the support assembly to realize test.
The number of adjustments of positions is reduced, the efficiency of coupling tests is improved, and it is compatible with multiple types of antenna modules, reducing the number of antennas for a single coupling part, and improving the stability and efficiency of the test.
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Figure CN222192424U_ABST
Abstract
Description
Technical Field
[0001] The present application relates to the technical field of coupling testing, and in particular to a coupling testing device. Background Art
[0002] An electronic device is a device that can exchange information with other electronic devices, and generally exchanges information wirelessly.
[0003] Electronic devices generally include multiple antenna modules, and different antenna modules generally radiate and receive wireless signals in different frequency bands.
[0004] In order to ensure the normal operation of the antenna module of the electronic device, the antenna module of the electronic device needs to be subjected to a coupling test during production. In the related art, the testing process of the antenna module is cumbersome, resulting in low efficiency of the coupling test. Utility Model Content
[0005] In view of this, the present application provides a coupling test device to improve the efficiency of coupling testing.
[0006] Specifically, the following technical solutions are included:
[0007] The present application provides a coupling test device, which includes a shell, a support assembly and a plurality of coupling parts. The shell has a first accommodating cavity and an inlet, the first accommodating cavity is connected to the inlet, and the inlet is located on one side of the shell. The support assembly and the plurality of coupling parts are both located in the first accommodating cavity, and the support assembly connects the shell and the plurality of coupling parts. The orthographic projection of each coupling part on one side of the shell is separated from the inlet.
[0008] Optionally, the plurality of coupling parts are distributed in at least two rows and at least two columns, two adjacent rows of coupling parts form a first interval along the thickness direction of the coupling parts, and two adjacent columns of coupling parts form a second interval along the width direction of the coupling parts.
[0009] Optionally, the coupling test device further comprises a partition, and the partition fills the first interval and the second interval.
[0010] Optionally, the support assembly has a second accommodating cavity, and the plurality of coupling parts are all located in the second accommodating cavity and connected to the support assembly.
[0011] Optionally, the support assembly includes a limit plate, which is located in the second accommodating cavity and on a side of the coupling portion away from the entrance, an edge of the limit plate is connected to the shell, and each coupling portion is connected to the limit plate.
[0012] Optionally, the support assembly is connected to an adjacent side of one side of the shell, and at least a portion of the support assembly is movable relative to the shell.
[0013] Optionally, the support assembly includes a slide rail and a bracket, the slide rail is connected to the shell, and the bracket is connected to the slide rail and can move along the extension direction of the slide rail.
[0014] Optionally, the support assembly further includes a locking member, which is capable of connecting the slide rail and the bracket to limit the movement of the bracket relative to the slide rail.
[0015] Optionally, the inlet is located below the support assembly.
[0016] Optionally, the coupling test device further comprises an interface, wherein the interface is connected to the supporting assembly, and each of the coupling parts is electrically connected to the interface.
[0017] The beneficial effects of the technical solution provided by the embodiment of the present application include at least: the entrance of the shell can allow electronic equipment to pass through, so that the electronic equipment can enter the first accommodating chamber for testing. The positive projection of each coupling part on one side of the shell is separated from the entrance, which can reduce the interference of the coupling part with the electronic equipment inserted. The support component supports the coupling part through the second accommodating chamber, which can improve the stability of the coupling part and facilitate the completion of the coupling test. Multiple coupling parts can be coupled with the electronic device, which is beneficial for the coupling test device of the present application to obtain the test position of the electronic device and reduce the number of antennas coupled to a single coupling part, thereby improving the efficiency of the coupling test. BRIEF DESCRIPTION OF THE DRAWINGS
[0018] In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings required for use in the description of the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without creative work.
[0019] Figure 1 A longitudinal cross-sectional schematic diagram of a coupling test device provided in an embodiment of the present application;
[0020] Figure 2 A structural schematic diagram of a support assembly provided in an embodiment of the present application;
[0021] Figure 3 A schematic diagram of the arrangement of the coupling parts provided in an embodiment of the present application.
[0022] The reference numerals in the figures represent respectively:
[0023] 1. Shell; 101. First accommodating chamber; 102. Inlet;
[0024] 2. Support assembly; 21. Slide rail; 22. Bracket; 23. Locking member; 24. Limiting plate; 201. Second accommodating chamber;
[0025] 3. Coupling portion; 301. First interval; 302. Second interval;
[0026] 4. Separator;
[0027] 5. Interface.
[0028] The above drawings have shown clear embodiments of the present application, which will be described in more detail later. These drawings and text descriptions are not intended to limit the scope of the present application in any way, but to illustrate the concept of the present application to those skilled in the art by referring to specific embodiments. DETAILED DESCRIPTION
[0029] The following will be combined with the drawings in the embodiments of the present application to clearly and completely describe the technical solutions in the embodiments of the present application. Obviously, the described embodiments are part of the embodiments of the present application, not all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of this application.
[0030] The directional nouns involved in the embodiments of the present application, such as "upper", "lower", "side", etc., are generally represented by Figure 1 The relative relationship of the orientation shown in the figure is used as the basis, and these orientation terms are used only to more clearly describe the relationship between structures, not to describe absolute orientation. When the product is placed in different postures, the orientation may change, for example, "up" and "down" may be interchangeable.
[0031] Unless otherwise defined, all technical terms used in the embodiments of the present application have the same meanings as commonly understood by those of ordinary skill in the art.
[0032] In order to make the technical solutions and advantages of the present application more clear, the implementation methods of the present application will be further described in detail below with reference to the accompanying drawings.
[0033] The present application provides a coupling test device, such as Figure 1 , Figure 2 and Figure 3As shown, the coupling test device includes a housing 1, a support assembly 2 and a plurality of coupling parts 3. The housing 1 has a first accommodating cavity 101 and an inlet 102, the first accommodating cavity 101 is connected to the inlet 102, and the inlet 102 is located on one side of the housing 1. The support assembly 2 and the plurality of coupling parts 3 are both located in the first accommodating cavity 101, and the support assembly 2 connects the housing 1 and the plurality of coupling parts 3. The orthographic projection of each coupling part 3 on one side of the housing 1 is separated from the inlet 102.
[0034] It is understandable that the entrance 102 of the shell 1 can be passed through by the electronic device to be tested, so that it can enter the first accommodating chamber 101 for testing. The positive projection of each coupling part 3 on one side of the shell 1 is separated from the entrance 102, which can reduce the interference of the coupling part 3 with the electronic device inserted. The support assembly 2 supports the coupling part 3 through the second accommodating chamber 201, which can improve the stability of the coupling part 3 and facilitate the completion of the coupling test. Multiple coupling parts 3 can form a coupling with the electronic device to be tested, which is beneficial for the coupling test device of the present application to obtain its test position and reduce the number of antennas coupled to a single coupling part 3, thereby improving the efficiency of the coupling test.
[0035] In the related art, when performing a coupling test, it is necessary to repeatedly adjust the relative position of the electronic device to be tested and the coupling test device so that the coupling test device performs the coupling test at the position where the signal of the antenna module is the best, resulting in a long debugging time for the coupling test device. Secondly, there are many types of antenna modules of the electronic devices to be tested, and multiple coupling test devices are required to complete the coupling test of one electronic device. The above reasons lead to low efficiency of coupling testing.
[0036] In the embodiment of the present application, by using multiple coupling parts 3 to couple the electronic device to be tested, the coupling test device of the present application can reduce the number of times of adjusting the position to complete the coupling test of the antenna module, and can also be compatible with the coupling test of multiple types of antennas, which is conducive to directly completing the coupling test of electronic devices with multiple antenna modules. This improves the efficiency of the coupling test.
[0037] In the embodiment of the present application, the support assembly 2 and the shell 1 can be connected by welding, bolt connection, etc.
[0038] In the embodiment of the present application, the electronic device to be tested is generally fixed on a tray. The tray extends into the first accommodating cavity 101 from the entrance 102. The longitudinal cross-section of the tray is generally a rectangle with a width greater than a height, so setting the shape of the entrance 102 to be a rectangle is conducive to indicating the direction of the tray when it is extended into the entrance 102. In addition, the orthographic projection of each coupling portion 3 on one side of the housing 1 is separated from the entrance 102, so that when the tray is extended into the first accommodating cavity 101, there will be no collision between the coupling portion 3.
[0039] In an embodiment of the present application, the coupling part 3 can be a circuit board, which can realize signal transmission between the electronic device to be tested and the instrument, so that other components of the coupling test device, such as a computer, can measure the actual transmission frequency band and the actual receiving frequency band of each antenna module of the electronic device to be tested, and identify the coupling part 3 among multiple coupling parts 3 that best reflects the working performance of the antenna module and measure line loss.
[0040] In some of the embodiments of this application, Figure 3 As shown, the plurality of coupling parts 3 are distributed in at least two rows and at least two columns, and the coupling parts 3 in two adjacent rows form a first interval 301 along the thickness direction of the coupling parts 3, and the coupling parts 3 in two adjacent columns form a second interval 302 along the width direction of the coupling parts 3. Such an arrangement can improve the working independence between adjacent coupling parts 3.
[0041] It is understandable that the coupling part 3 generally generates current when working. When adjacent coupling parts 3 are in contact, the working performance of the coupling parts 3 is easily changed, which is not conducive to forming a coupling with the electronic device to be tested. By setting the first interval 301 and the second interval 302, the coupling test device of the present application can reduce the contact between adjacent coupling parts 3, thereby improving its working stability.
[0042] In the embodiment of the present application, the coupling parts 3 may be distributed in 2 columns and 3 rows.
[0043] In some of the embodiments of this application, Figure 2 As shown, the coupling test device further includes a partition 4 , which fills the first space 301 and the second space 302 .
[0044] It is understandable that the partition 4 can, on the one hand, separate the adjacent coupling parts 3 by filling the first space 301 and the second space 302, and can also be used to support the coupling part 3 and improve the stability of the coupling part 3, which is conducive to the coupling between the coupling part 3 and the electronic device to be tested. In addition, the partition 4 can also be used to separate the signals generated by the coupling part 3 to reduce the mutual interference between them.
[0045] In the embodiment of the present application, the partition 4 may be a sponge.
[0046] In the embodiment of the present application, the partition 4 can be an integral structure, and the first partition 301 is connected to the second partition 302, so that the installation efficiency of the partition 4 can be improved.
[0047] In some of the embodiments of this application, Figure 2 As shown, the support assembly 2 has a second accommodating cavity 201 , and the plurality of coupling parts 3 are all located in the second accommodating cavity 201 and connected to the support assembly 2 .
[0048] It is understandable that the second accommodating cavity 201 is conducive to fixing the coupling part 3 on the supporting assembly 2, while shielding and protecting the coupling part 3, thereby reducing the possibility of collision between the electronic device or other items to be tested and the coupling part 3 due to direct contact.
[0049] In some of the embodiments of this application, Figure 2 As shown, the support assembly 2 includes a limit plate 24 , which is located in the second accommodating cavity 201 and on the side of the coupling part 3 away from the entrance 102 . The edge of the limit plate 24 is connected to the shell 1 , and each coupling part 3 is connected to the limit plate 24 .
[0050] It can be understood that the limiting plate 24 has the function of limiting and supporting the coupling part 3, and by being connected to the housing 1, it can fix the side of the coupling part 3 away from the entrance 102. The coupling part 3 is generally a circuit board, and after one side of it is fixed, it is not easy to shake when the housing 1 is hit, so that the stability of the coupling part 3 can be improved, and coupling with the electronic device to be tested can be formed.
[0051] In the embodiment of the present application, the material of the limiting plate 24 can be acrylic.
[0052] In some of the embodiments of this application, Figure 2 As shown, the support assembly 2 is connected to an adjacent side of one side of the housing 1 , and at least a portion of the support assembly 2 is movable relative to the housing 1 .
[0053] It is understandable that the support assembly 2 movable relative to the shell 1 can drive the coupling part 3 to adjust its position, which is helpful for the tester to adjust the position of the coupling part 3 and obtain the best signal position of the antenna module of the electronic device to be tested.
[0054] In the embodiment of the present application, the support assembly 2 can move along the width direction of the shell 1, and can also move along the length direction of the shell 1.
[0055] In some of the embodiments of this application, Figure 2 As shown, the support assembly 2 includes a slide rail 21 and a bracket 22 . The slide rail 21 is connected to the housing 1 . The bracket 22 is connected to the slide rail 21 and can move along the extension direction of the slide rail 21 .
[0056] It is understandable that the slide rail 21 provides a moving direction and a supporting position for the bracket 22. The bracket 22 can adjust the position of the coupling part 3 by moving along the extension direction of the slide rail 21, which is conducive to the coupling part 3 and the electronic device to be tested to form a coupling.
[0057] In some embodiments of the present application, the relatively movable bracket 22 is easily moved along the extension direction of the slide rail 21 when it is hit, thereby causing the position to change. Figure 2 As shown, the support assembly 2 further includes a locking member 23, which can connect the slide rail 21 and the bracket 22 to limit the movement of the bracket 22 relative to the slide rail 21. This is beneficial to improve the stability of the support assembly 2.
[0058] It is understandable that the bracket 22 can be connected to the coupling part 3. When the position of the coupling part 3 needs to be adjusted, the locking member 23 and the slide rail 21 can be separated, or the locking member 23 and the bracket 22 can be separated, and the bracket 22 can be moved to a suitable position; when coupling needs to be formed, the slide rail 21 and the bracket 22 can be connected by the locking member 23, thereby fixing the position of the bracket 22.
[0059] In the embodiment of the present application, a through hole is provided on the bracket 22. When the locking member 23 is separated from the slide rail 21, the bracket 22 can move relative to the slide rail 21; when the locking member 23 abuts against the slide rail 21 through the through hole, the bracket 22 cannot move relative to the slide rail 21.
[0060] In the embodiment of the present application, a through hole is provided on the bracket 22, and a threaded hole is provided on the slide rail 21. When the locking member 23 is separated from the slide rail 21, the bracket 22 can move relative to the slide rail 21; when the locking member 23 forms a threaded connection with the threaded hole through the through hole, the bracket 22 cannot move relative to the slide rail 21.
[0061] In some of the embodiments of this application, Figure 1 As shown, the inlet 102 is located below the support assembly 2 .
[0062] It is understandable that when the tray is inserted into the first receiving cavity 101, if it slips out of the hand, it may fall under the action of gravity. When falling, since the support assembly 2 is not in the moving direction of the tray, the coupling part 3 located in the support assembly 2 can be prevented from being damaged.
[0063] In some of the embodiments of this application, Figure 2 As shown, the coupling test device further includes an interface 5 , which is connected to the supporting assembly 2 , and each coupling portion 3 is electrically connected to the interface 5 .
[0064] It can be understood that when the coupling part 3 is coupled with the electronic device to be tested, its working parameters can be transmitted to the computer through the interface 5 for analysis and processing by the computer, thereby completing the coupling test.
[0065] In the present application, the terms "first" and "second" are used for descriptive purposes only and should not be understood as indicating or implying relative importance. The term "plurality" refers to two or more than two, unless otherwise clearly defined.
[0066] Those skilled in the art will readily appreciate other embodiments of the present application after considering the specification and practicing the present application disclosed herein. The present application is intended to cover any variations, uses or adaptations of the present application, which follow the general principles of the present application and include common knowledge or customary techniques in the art that are not disclosed in the present application. The specification and examples are intended to be exemplary only.
[0067] It should be understood that the present application is not limited to the precise structures that have been described above and shown in the drawings, and that various modifications and changes may be made without departing from the scope thereof. The scope of the present application is limited only by the appended claims.
Claims
1. A coupling test device, characterized in that: The coupling test device comprises a housing (1), a support assembly (2) and a plurality of coupling parts (3), wherein: The housing (1) comprises a first accommodating chamber (101) and an inlet (102); the first accommodating chamber (101) is in communication with the inlet (102); and the inlet (102) is located on one side of the housing (1); The support assembly (2) and the plurality of coupling parts (3) are both located in the first accommodating cavity (101), and the support assembly (2) connects the housing (1) and the plurality of coupling parts (3); The orthographic projection of each coupling portion (3) on one side of the housing (1) is separated from the inlet (102).
2. The coupling test device according to claim 1, characterized in that: The plurality of coupling parts (3) are distributed in at least two rows and at least two columns, two adjacent rows of coupling parts (3) form a first interval (301) along the thickness direction of the coupling parts (3), and two adjacent columns of coupling parts (3) form a second interval (302) along the width direction of the coupling parts (3).
3. The coupling test device according to claim 2, characterized in that: The coupling test device further comprises a partition (4), wherein the partition (4) fills the first space (301) and the second space (302).
4. The coupling test device according to claim 1, characterized in that: The support assembly (2) has a second accommodating cavity (201), and the plurality of coupling parts (3) are all located in the second accommodating cavity (201) and are connected to the support assembly (2).
5. The coupling test device according to claim 4, characterized in that: The support assembly (2) comprises a limit plate (24), the limit plate (24) being located in the second accommodating cavity (201) and on a side of the coupling portion (3) away from the inlet (102), the edge of the limit plate (24) being connected to the shell (1), and each coupling portion (3) being connected to the limit plate (24).
6. The coupling test device according to claim 1, characterized in that: The support assembly (2) is connected to an adjacent side of one side of the shell (1), and at least a portion of the support assembly (2) is movable relative to the shell (1).
7. The coupling test device according to claim 6, characterized in that: The support assembly (2) comprises a slide rail (21) and a bracket (22); the slide rail (21) is connected to the housing (1); the bracket (22) is connected to the slide rail (21) and is movable along the extension direction of the slide rail (21).
8. The coupling test device according to claim 7, characterized in that: The support assembly (2) further comprises a locking member (23), wherein the locking member (23) is capable of connecting the slide rail (21) and the bracket (22) to limit the movement of the bracket (22) relative to the slide rail (21).
9. The coupling test device according to claim 1, characterized in that: The inlet (102) is located below the support assembly (2).
10. The coupling test device according to claim 1, characterized in that: The coupling test device further comprises an interface (5), wherein the interface (5) is connected to the support assembly (2), and each of the coupling parts (3) is electrically connected to the interface (5).
