PCB function test machine structure convenient for replacing test probe

Abstract

The utility model relates to the technical field of PCB (printed circuit board) testing, and discloses a structure of a PCB function tester for conveniently replacing a test probe, which comprises a probe plate, a probe head, a connecting column, a special structure for replacing the probe head and a special structure for installing the probe plate, and the top end of the connecting column is provided with a structure for installing the probe plate. The test probe base is simple in structure, and solves the problem that a common test probe is fixed on the probe base, so that when a single test probe is damaged and replaced, the operation is troublesome, thereby enabling the replacement of the test probe to be more convenient, and greatly improving the replacement efficiency of the test probe.

Description

Technical Field

[0001] The utility model relates to the technical field of PCB board testing, in particular to a PCB board function testing machine with a structure that facilitates the replacement of test probes. Background Art

[0002] PCB board function tester is a general-purpose automated test system designed for lagging manual testing and to meet the needs of PCBA testing for ease of operation. PCB board function tester is one of the important tools to ensure the quality and reliability of PCB boards, and is of great significance to the production and quality control of electronic products. The test probe of PCB board function tester is a metal needle used to contact and detect electronic components on PCB boards. Its material, structure, performance and service life will affect the accuracy and stability of the test. The material of the test probe is generally selected from metal materials with high conductivity, high hardness, high wear resistance and corrosion resistance. The test probe of PCB board function tester is one of the important tools for achieving accurate and efficient testing. However, general test probes are fixed on the probe base. Therefore, when a single test probe is damaged and replaced, the operation is more troublesome. Therefore, the entire test probe board needs to be replaced, resulting in a waste of resources. In addition, it is also troublesome to install and remove the existing test probe board from the tester, which greatly reduces the replacement efficiency of the test probe. For this reason, we propose a PCB board function tester that is easy to replace the test probe structure. Utility Model Content

[0003] In view of the deficiencies in the prior art, the utility model provides a PCB board function tester which is convenient for replacing a test probe structure, thereby solving the above-mentioned problems.

[0004] To achieve the above-mentioned purpose, the utility model provides the following technical solution: a structure of a PCB board function tester that is convenient for replacing test probes, including a probe board, a probe head, a connecting column, a special structure for replacing the probe head, and a special structure for installing the probe board, characterized in that:

[0005] The special structure for replacing the probe head comprises a mounting tube, a blocking ring, a clamping ring, a clamping plate and a nut, the bottom end of the probe plate is fixedly connected with four mounting tubes, the outer surfaces of the four mounting tubes are fixedly connected with four blocking rings, and the outer surfaces of the four mounting tubes are threadedly connected with four nuts corresponding to the bottom ends of the four blocking rings, and the four mounting tubes are movably connected with four clamping rings inside, and one end of the four clamping rings is fixedly connected with four clamping plates;

[0006] The special structure for installing the probe plate includes a mounting plate, a limiting rod, a connecting plate, a cylinder, a fixed block, a movable rod, a threaded rod and a spring. The outer surface of the connecting column is movably connected to the inner wall of the cylinder, and the outer surface of the cylinder is fixedly connected to two connecting plates. One end of the two connecting plates is fixedly connected to two limiting rods, and one end of the two limiting rods is fixedly connected to the mounting plate. The bottom end of the mounting plate is fixedly connected with a fixed block corresponding to the two limiting rods, the bottom end of the fixed block is movably connected with two movable rods, a spring is fixedly connected between the two movable rods, and the top ends of the two movable rods are threadedly connected with threaded rods.

[0007] Preferably, the four clamping plates are formed by fixedly connecting a conical tube and a circular ring, and the interiors of the four clamping plates are hollow, and the thinner end of the conical tube is fixedly connected to the clamping ring, and the thicker end of the conical tube and the circular ring are evenly divided into four parts.

[0008] Preferably, the bottom ends of the four nuts are provided with circular holes, and the bottom end of the clamping plate is movably connected to the inside of the nuts, and the diameter of the circular holes provided in the nuts is larger than the diameter of the outer surface of the circular ring of the clamping plate.

[0009] Preferably, a movable groove is formed at the bottom end of the fixed block, and the top ends of the two movable rods are movably connected inside the movable groove, and one end of the threaded rod passes through one of the movable rods and is threadedly connected to one side of the other movable rod.

[0010] Preferably, a semicircular clamping column is respectively arranged on both sides of the connecting column corresponding to one end of the two movable rods, and the two clamping columns are both made of anti-slip rubber material for clamping and fixing the connecting column.

[0011] Compared with the prior art, the utility model provides a PCB board function tester which is convenient for replacing the test probe structure and has the following beneficial effects:

[0012] 1. The PCB board function tester is convenient for replacing the test probe structure. The nut is screwed off the mounting tube by twisting it, so that the clamping end of the clamping plate inside the mounting tube is opened, so that the probe head can be taken out. Then, the nut is twisted on the mounting tube, and the clamping plate is contracted through the circular hole opened in the nut, so that the clamping plate can install and clamp the probe head, which solves the problem of cumbersome operation when replacing a single test probe that is damaged, making it more convenient to replace the test probe and greatly increasing the efficiency of replacing the test probe.

[0013] 2. The PCB board functional testing machine is convenient for replacing the test probe structure. The top end of the connecting column is passed through the inside of the cylinder and placed between the two movable rods, and then the threaded rod is connected to the threaded connection between the two movable rods, so that the two movable rods are connected through the threaded rod. The two movable rods are rotated inside the movable grooves opened in the fixed block, so that the two movable rods clamp and fix the connecting column, which solves the problem that the existing test probe board needs to be manually installed and disassembled from the test machine, which is relatively troublesome, thereby greatly improving the replacement efficiency of the test probe board. BRIEF DESCRIPTION OF THE DRAWINGS

[0014] Figure 1 It is a schematic diagram of the structure of the utility model;

[0015] Figure 2 A schematic diagram of the structure replaced by the utility model;

[0016] Figure 3 A schematic diagram of the structure of the utility model installation;

[0017] Figure 4 This is a schematic diagram of the internal structure of the fixed block of the utility model.

[0018] In the figure: 1. probe plate; 2. probe head; 3. mounting tube; 4. blocking ring; 5. clamping ring; 6. clamping plate; 7. nut; 8. mounting plate; 9. limit rod; 10. connecting plate; 11. cylinder; 12. connecting column; 13. fixing block; 14. movable groove; 15. movable rod; 16. threaded rod; 17. spring. DETAILED DESCRIPTION

[0019] The following will be combined with the drawings in the embodiments of the utility model to clearly and completely describe the technical solutions in the embodiments of the utility model. Obviously, the described embodiments are only part of the embodiments of the utility model, not all of the embodiments. Based on the embodiments in the utility model, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the utility model.

[0020] See also Figure 1-4 A structure of a PCB board function tester for facilitating replacement of test probes comprises a probe board 1, a probe head 2, a connecting column 12, a special structure for replacing the probe head 2 and a special structure for installing the probe board 1, characterized in that:

[0021] The special structure for replacing the probe head 2 includes a mounting tube 3, a blocking ring 4, a clamping ring 5, a clamping plate 6 and a nut 7. The bottom end of the probe plate 1 is fixedly connected with four mounting tubes 3, the outer surfaces of the four mounting tubes 3 are fixedly connected with four blocking rings 4, and the outer surfaces of the four mounting tubes 3 are threadedly connected with four nuts 7 corresponding to the bottom ends of the four blocking rings 4, and the four mounting tubes 3 are movably connected with four clamping rings 5 ​​inside, and one end of the four clamping rings 5 ​​is fixedly connected with four clamping plates 6;

[0022] The special structure for installing the probe plate 1 includes a mounting plate 8, a limiting rod 9, a connecting plate 10, a cylinder 11, a fixed block 13, a movable rod 15, a threaded rod 16 and a spring 17. The outer surface of the connecting column 12 is movably connected to the inner wall of the cylinder 11. The outer surface of the cylinder 11 is fixedly connected to two connecting plates 10. One end of the two connecting plates 10 is fixedly connected to two limiting rods 9. One end of the two limiting rods 9 is fixedly connected to the mounting plate 8. The bottom end of the mounting plate 8 is fixedly connected with a fixed block 13 corresponding to the two limiting rods 9. The bottom end of the fixed block 13 is movably connected with two movable rods 15. A spring 17 is fixedly connected between the two movable rods 15. The top ends of the two movable rods 15 are threadedly connected with a threaded rod 16.

[0023] Furthermore, the four clamping plates 6 are all formed by fixedly connecting a conical tube and a circular ring, and the interiors of the four clamping plates 6 are all hollow, and the thinner end of the conical tube is fixedly connected to the clamping ring 5, and the thicker end of the conical tube and the circular ring are evenly divided into four parts;

[0024] Furthermore, circular holes are formed at the bottom ends of the four nuts 7 , and the bottom end of the clamping plate 6 is movably connected to the inside of the nuts 7 , and the diameter of the circular holes formed in the nuts 7 is larger than the diameter of the outer surface of the circular ring of the clamping plate 6 .

[0025] Furthermore, a movable groove 14 is formed at the bottom end of the fixed block 13 , and the top ends of the two movable rods 15 are movably connected inside the movable groove 14 , and one end of the threaded rod 16 passes through one of the movable rods 15 and is threadedly connected to one side of the other movable rod 15 .

[0026] Furthermore, a semicircular clamping column is respectively provided on both sides of the connecting column 12 corresponding to one end of the two movable rods 15, and the two clamping columns are both made of anti-slip rubber material for clamping and fixing the connecting column 12.

[0027] Working principle: When the test probe needs to be replaced, first unscrew it from the mounting tube 3 by twisting the nut 7, so that the clamping end of the clamping plate 6 inside the mounting tube 3 opens, so that the probe head 2 can be taken out, and then the probe head 2 to be replaced is placed into the inside of the clamping plate 6, and then the nut 7 is twisted on the mounting tube 3, and the clamping plate 6 is contracted through the circular hole opened in the nut 7, so that the clamping plate 6 can install and clamp the probe head 2, and then the probe head 2 is installed on the bottom end of the probe plate 1 through the mounting tube 3 and the clamping plate 6, so that the replacement of the test probe is more convenient and the efficiency of replacing the test probe is greatly increased. When the entire probe plate 1 needs to be replaced, the top end of the connecting column 12 is passed through the cylinder 11. The threaded rod 16 is inserted between the two movable rods 15, and then the threaded connection between the two movable rods 15 is achieved through the threaded rod 16, so that the two movable rods 15 are connected through the threaded rod 16, so that the two movable rods 15 are rotated inside the movable groove 14 opened in the fixed block 13, so that the two movable rods 15 clamp and fix the connecting column 12. Conversely, the threaded rod 16 is rotated so that one end of the threaded rod 16 leaves one of the movable rods 15, and then the elastic force of the spring 17 is used to make the two movable rods 15 open in two directions, so that the two movable rods 15 release the connecting column 12, and then the connecting column 12 is pulled out from the inside of the cylinder 11. When the probe plate 1 needs to be replaced, the above operation can be repeated.

[0028] Although embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that various changes, modifications, substitutions and variations may be made to the embodiments without departing from the principles and spirit of the present invention, and that the scope of the present invention is defined by the appended claims and their equivalents.

Claims

1. A PCB board function tester is convenient for replacing a test probe structure, comprising a probe board (1), a probe head (2), a connecting column (12), a special structure for replacing the probe head (2) and a special structure for installing the probe board (1), characterized in that: The special structure for replacing the probe head (2) comprises a mounting tube (3), a blocking ring (4), a clamping ring (5), a clamping plate (6) and a nut (7); the bottom end of the probe plate (1) is fixedly connected with four mounting tubes (3); the outer surfaces of the four mounting tubes (3) are fixedly connected with four blocking rings (4); the outer surfaces of the four mounting tubes (3) are threadedly connected with four nuts (7) corresponding to the bottom ends of the four blocking rings (4); the four mounting tubes (3) are movably connected with four clamping rings (5) inside; and one end of the four clamping rings (5) is fixedly connected with four clamping plates (6); The special structure for installing the probe plate (1) comprises a mounting plate (8), a limiting rod (9), a connecting plate (10), a cylinder (11), a fixed block (13), a movable rod (15), a threaded rod (16) and a spring (17); the outer surface of the connecting column (12) is movably connected to the inner wall of the cylinder (11); the outer surface of the cylinder (11) is fixedly connected to two connecting plates (10); one end of the two connecting plates (10) is fixedly connected to two limiting rods (9); one end of the two limiting rods (9) is fixedly connected to the mounting plate (8); the bottom end of the mounting plate (8) is fixedly connected to a fixing block (13) corresponding to the two limiting rods (9); the bottom end of the fixing block (13) is movably connected to two movable rods (15); a spring (17) is fixedly connected between the two movable rods (15); and the top ends of the two movable rods (15) are threadedly connected to the threaded rod (16).

2. The PCB function tester according to claim 1 is convenient for replacing the test probe structure, characterized in that: The four clamping plates (6) are all formed by fixedly connecting a conical tube and a circular ring, and the interiors of the four clamping plates (6) are all hollow, and the thinner end of the conical tube is fixedly connected to the clamping ring (5), and the thicker end of the conical tube and the circular ring are evenly divided into four parts.

3. The PCB function tester according to claim 2 is convenient for replacing the test probe structure, characterized in that: The bottom ends of the four nuts (7) are provided with circular holes, and the bottom end of the clamping plate (6) is movably connected to the inside of the nuts (7), and the diameter of the circular holes provided in the nuts (7) is larger than the diameter of the outer surface of the circular ring of the clamping plate (6).

4. The PCB function tester according to claim 1 is convenient for replacing the test probe structure, characterized in that: A movable groove (14) is formed at the bottom end of the fixed block (13), and the top ends of the two movable rods (15) are movably connected inside the movable groove (14), and one end of the threaded rod (16) passes through one of the movable rods (15) and is threadedly connected to one side of the other movable rod (15).

5. The PCB function tester according to claim 1 is convenient for replacing the test probe structure, characterized in that: One end of the two movable rods (15) is provided with a semicircular clamping column on both sides of the corresponding connecting column (12), and the two clamping columns are both made of non-slip rubber material and are used to clamp and fix the connecting column (12).

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