TOF system for distinguishing ions of different valence states of Hall thruster
Through the TOF system, the different valence ions of Hall thrusts are distinguished by the time of flight method, which solves the problem of measurement difficulties of traditional E×B probes, and realizes more accurate ion distribution analysis and propulsion efficiency optimization, simplifies structural design and improves the spacecraft performance.
Patent Information
- Application Number
- CN202421196257.4
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-05-28
- Publication Date
- 2025-01-07
- Estimated Expiration
- 2034-05-28
AI Technical Summary
Among the existing Hall thrusts, traditional E×B probes are difficult to effectively measure the distribution of multivalent ion due to uneven magnetic field distribution and structural complexity, which limits the optimization of propulsion efficiency and the improvement of spacecraft performance.
Using the TOF system, the thrust is equipped with a pedal, door electrode, ion current collection probe, sampling resistor, sampling oscilloscope and signal generator, and the time of flight method is used to distinguish ions in different valence states, avoiding the use of magnets or electromagnetic coil structures. Simplified structural design.
It realizes accurate resolution of ions in different valence states of Hall thrusts, avoids uneven magnetic field distribution and magnetic leakage problems, has a simple structure, is convenient to produce and install, and improves measurement accuracy and application range.
Smart Images

Figure CN222315299U_ABST
Abstract
Description
Technical Field
[0001] The utility model relates to the technical field of space electric propulsion, and in particular to a TOF system for distinguishing ions of different valence states of a Hall thruster. Background Art
[0002] The working principle of Hall thrusters is to propel spacecraft by ionizing the working fluid and accelerating the ions produced by ionization. The importance of Hall thrusters in detecting the valence distribution of plume ions lies in optimizing propulsion efficiency. Plumes with different ion valence states have different thrust efficiencies and motion characteristics. By understanding the valence distribution of ions, the working state of the thruster can be adjusted, the propulsion efficiency can be optimized, and the performance and service life of the spacecraft can be improved.
[0003] At present, the common method for obtaining the valence state distribution of Hall thrusters is to use traditional E×B probes. When this type of probe uses a permanent magnet with strong magnetic properties to provide a fixed-position magnetic field, it is difficult to measure due to problems such as uneven magnetic field distribution and magnetic leakage. Although a relatively stable and controllable magnetic field can be achieved by using electromagnets instead of permanent magnets, in order to achieve the same field strength as that of permanent magnets, the required electromagnetic coil structure space is too large, which limits its application range when the vacuum cabin space of the test vacuum equipment is limited. In addition, the E×B probe has its own complex structure, high design difficulty, and the length and aperture selection of the entrance collimator have a great influence on the measurement results.
[0004] In response to the testing requirements for the distribution of multivalent ions in Hall thrusters and the shortcomings of the current E×B probes, a system that uses the TOF principle to achieve the testing purpose has been developed. Utility Model Content
[0005] The technical problem to be solved by the utility model is to provide a TOF system for distinguishing ions of different valence states of a Hall thruster.
[0006] In order to solve the above problems, the utility model adopts the following technical solutions:
[0007] A TOF system for distinguishing ions of different valence states of a Hall thruster comprises a thruster mounting stand, a gate electrode, an ion current collecting probe, a sampling resistor, a sampling oscilloscope, a probe power supply and a signal generator.
[0008] The thruster mounting stand is used for placing the Hall thruster.
[0009] Wherein, the gate electrode comprises a first grounding grid, a switch gate grid, a second grounding grid, a front copper clamping plate, a rear copper clamping plate and a plurality of grid insulating ceramic gaskets.
[0010] The first grounding grid and the second grounding grid are used to be connected to the wall surface of the vacuum chamber of the grounded vacuum equipment through a wire.
[0011] The switch gate grid is connected to the signal generator via a wire.
[0012] The ion current collection probe comprises a collection plate, a protection ring and a ceramic insulating component.
[0013] The protection ring is connected to the negative electrode of the probe power supply through a wire.
[0014] The collecting plate is connected in series to the negative electrode of the probe power supply through a wire and a sampling resistor.
[0015] The sampling signals at both ends of the sampling resistor are read by the oscilloscope.
[0016] The TOF system for distinguishing ions of different valence states of a Hall thruster provided by at least one embodiment of the present disclosure further includes a structural mounting base plate.
[0017] The thruster mounting platform, gate electrode and ion current collection probe are all assembled on the structural mounting base plate.
[0018] In the TOF system for distinguishing ions of different valence states of a Hall thruster provided by at least one embodiment of the present disclosure, the distance between the gate electrode and the thruster mounting platform is 20 cm.
[0019] In the TOF system for distinguishing ions of different valence states of a Hall thruster provided by at least one embodiment of the present disclosure, the interval between the ion current collection probe and the gate electrode is 34 cm.
[0020] In the TOF system for distinguishing ions of different valence states of a Hall thruster provided by at least one embodiment of the present disclosure, the thruster mounting stand, the gate electrode and the ion current collection probe are all bolted to the structural mounting base plate.
[0021] In the TOF system for distinguishing ions of different valence states of a Hall thruster provided by at least one embodiment of the present disclosure, four grid insulating ceramic gaskets are configured.
[0022] The first grounding grid, the switch gate grid, the second grounding grid and the grid insulation ceramic gasket are all fixed between the front copper clamping plate and the rear copper clamping plate.
[0023] Four grid insulating ceramic spacers are used to separate the front copper clamping plate, the first grounding grid, the switch gate grid, the second grounding grid and the rear copper clamping plate.
[0024] In the TOF system for distinguishing ions of different valence states of a Hall thruster provided by at least one embodiment of the present disclosure, the central axes of the collecting plate and the guard ring coincide with the central axis of the ceramic insulating component.
[0025] In the TOF system for distinguishing ions of different valence states of a Hall thruster provided by at least one embodiment of the present disclosure, a plurality of alignment holes are provided on the front copper clamping plate and the rear copper clamping plate.
[0026] The beneficial effects of the utility model are:
[0027] The different flying speeds of ions of different valence states produced by the Hall thruster are fully utilized, and the time-of-flight method is used to distinguish the valence state distribution of the ions in the thruster.
[0028] Compared with the traditional E×B method, the present disclosure does not require the use of a magnet or an electromagnetic coil structure, thus avoiding test errors caused by problems such as uneven magnetic field distribution and magnetic leakage.
[0029] The structure is relatively simple, and the production and installation are relatively convenient. BRIEF DESCRIPTION OF THE DRAWINGS
[0030] In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the drawings required for use in the description of the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without creative work.
[0031] Figure 1 The utility model is a schematic diagram of the overall structure of a TOF system for distinguishing ions of different valence states of a Hall thruster.
[0032] Figure 2 It is a three-dimensional diagram of the gate electrode.
[0033] Figure 3 A cross-sectional view of the gate electrode.
[0034] Figure 4 A perspective view of the ion current collection probe.
[0035] Figure 5 Cross-sectional view of the ion current collection probe.
[0036] In the figure:
[0037] 1.Thruster installation stand;
[0038] 2. Gate electrode; 21. Front copper clamping plate; 22. Rear copper clamping plate; 23. Grid insulation ceramic gasket; 211. Alignment hole; 24. First grounding grid; 25. Switch gate grid; 26. Second grounding grid;
[0039] 3. Ion current collection probe; 31. Guard ring; 32. Collection plate; 33. Ceramic insulating component; 321. First thread; 311. Second thread;
[0040] 4. Sampling resistor;
[0041] 5. Signal generator;
[0042] 6. Probe power supply;
[0043] 7. Structural installation base plate. DETAILED DESCRIPTION
[0044] The technical solutions in the embodiments will be described clearly and completely below in conjunction with the drawings in the embodiments. Obviously, the described embodiments are only a part of the embodiments, rather than all the embodiments.
[0045] like Figures 1 to 5 As shown, a TOF system for distinguishing ions of different valence states of a Hall thruster includes a thruster mounting stand 1, a gate electrode 2, an ion current collection probe 3, a sampling resistor 4, a sampling oscilloscope, a probe power supply 6, a signal generator 5 and a structural mounting base plate 7.
[0046] Specifically, the thruster mounting platform 1 is used to place the Hall thruster.
[0047] Exemplarily, the Hall thruster may be mounted on the thruster mounting pedestal by bolting.
[0048] Specifically, the sampling signal is read through an oscilloscope at both ends of the sampling resistor 4. The resistance value of the sampling resistor 4 is 1000Ω.
[0049] Specifically, the gate electrode 2 includes a first grounding grid 24 , a switch gate grid 25 , a second grounding grid 26 , a front copper clamping plate 21 , a rear copper clamping plate 22 and a plurality of grid insulating ceramic gaskets 23 .
[0050] Furthermore, after the first grounding grid 24 and the second grounding grid 26 are connected by the same wire, the wire is connected to the wall of the vacuum cabin of the vacuum equipment to be tested, and the vacuum cabin is grounded; the switch gate grid 25 is connected to the signal generator 5 by another wire. The first grounding grid 24 and the second grounding grid 26 are used to eliminate the influence of the switch gate grid 25 on the thruster plume and ion motion characteristics when it is charged.
[0051] Specifically, the ion current collecting probe 3 includes a collecting plate 32 , a guard ring 31 and a ceramic insulating component 33 .
[0052] Furthermore, the protection ring 31 is provided with a first plug hole, and the ceramic insulating component 33 is provided with a second plug hole; one end of the ceramic insulating component 33 is inserted into the first plug hole, and the other end of the ceramic insulating component 33 is located outside the first plug hole;
[0053] Furthermore, one end of the collecting plate 32 passes through the first plug hole and the second plug hole in sequence and is located outside the ceramic insulating component 33; the other end of the collecting plate 32 is located in the first plug hole.
[0054] Furthermore, the ceramic insulating member 33 and the collecting plate 32 are inserted in opposite directions.
[0055] Furthermore, the central axes of the collecting plate 32 and the protection ring 31 coincide with the central axis of the ceramic insulating component 33 .
[0056] Furthermore, the guard ring 31 is connected to the negative electrode of the probe power supply 6 through a wire; the collecting plate 32 is connected in series to the negative electrode of the probe power supply 6 through a wire and a sampling resistor 4 .
[0057] Specifically, the collecting plate 32 is connected to the corresponding wire through the first thread 321 on itself; the protection ring 31 is connected to the corresponding wire through the second thread 311 in the middle of itself, and both are biased by -30V through the probe power supply. The negative bias applied by the collecting plate 32 is to attract ions, so that the current collected there is the corresponding ion saturation current. The collecting area of the collecting plate 32 is 0.2cm 2 The role of the negative bias applied by the guard ring 31 is to isolate the electrons and prevent them from being collected by the collecting plate 32. The saturated ion current collected by the collecting plate 32 is converted into a voltage signal through a sampling resistor, and the signal is collected by an oscilloscope for subsequent data processing.
[0058] In this embodiment, the thruster mounting platform 1 , the gate electrode 2 and the ion current collecting probe 3 are all assembled on the structural mounting base plate 7 .
[0059] Specifically, the thruster mounting platform 1 , the gate electrode 2 and the ion current collecting probe 3 are all bolted to the structural mounting base plate 7 .
[0060] In this embodiment, the distance between the gate electrode 2 and the thruster mounting platform 1 is 20 cm, and the distance between the ion current collection probe 3 and the gate electrode 2 is 34 cm.
[0061] In this embodiment, four grid insulating ceramic gaskets 23 are configured; the first grounding grid 24 , the switch gate grid 25 , the second grounding grid 26 and the grid insulating ceramic gasket 23 are all fixed between the front copper clamping plate 21 and the rear copper clamping plate 22 .
[0062] Specifically, four grid insulating ceramic spacers 23 are used to separate the front copper clamping plate 21 , the first grounding grid 24 , the switch gate grid 25 , the second grounding grid 26 and the rear copper clamping plate 22 .
[0063] Furthermore, the first grounding grid 24 is clamped by the first and second grid insulating ceramic gaskets; the switch gate grid 25 is clamped by the second and third insulating ceramic gaskets; and the second grounding grid 26 is clamped by the third and fourth insulating ceramic gaskets.
[0064] In this embodiment, a plurality of alignment holes 211 are provided on the first grounding grid 24 , the switch gate grid 25 , the second grounding grid 26 , the front copper clamping plate 21 , the rear copper clamping plate 22 and the four grid insulating ceramic gaskets 23 .
[0065] Furthermore, the first grounding grid 24, the switch gate grid 25, the second grounding grid 26, the front copper clamping plate 21, the rear copper clamping plate 22 and the four grid insulating ceramic gaskets 23 are aligned through the alignment holes 211, screws are passed through the alignment holes 211, and fixed with nuts.
[0066] Exemplarily, four alignment holes are provided.
[0067] Although the embodiments of the present application have been shown and described above, the scope of protection of the present invention is not limited thereto, and any changes or substitutions that are not conceivable through creative work should be included in the scope of protection of the present invention; unless explicitly stated, any element, action or instruction used in this document should not be interpreted as critical or necessary.
Claims
1. A TOF system for distinguishing ions of different valence states in a Hall thruster, characterized in that: include: thruster mounting rig, gate electrode, ion current collection probe, sampling resistor, sampling oscilloscope, probe power supply and signal generator; The thruster mounting stand is used to place the Hall thruster; Wherein, the gate electrode comprises a first grounding grid, a switch gate grid, a second grounding grid, a front copper clamping plate, a rear copper clamping plate and a plurality of grid insulating ceramic gaskets; The first grounding grid and the second grounding grid are used to connect to the vacuum cabin wall surface of the grounded vacuum equipment; The switch gate grid is electrically connected to the signal generator; The ion current collection probe comprises a collection plate, a guard ring and a ceramic insulating component; The guard ring is connected to the negative electrode of the probe power supply; The collecting plate and the sampling resistor are connected in series to the negative electrode of the probe power supply; The sampling signals at both ends of the sampling resistor are read by the oscilloscope.
2. A TOF system for distinguishing ions of different valence states of a Hall thruster according to claim 1, characterized in that: Also included is a structural mounting base plate; The thruster mounting platform, gate electrode and ion current collection probe are all assembled on the structural mounting base plate.
3. A TOF system for distinguishing ions of different valence states of a Hall thruster according to claim 2, characterized in that: The distance between the gate electrode and the thruster mounting frame is 20 cm.
4. A TOF system for distinguishing ions of different valence states of a Hall thruster according to claim 3, characterized in that: The distance between the ion current collection probe and the gate electrode is 34 cm.
5. A TOF system for distinguishing ions of different valence states of a Hall thruster according to claim 2, characterized in that: The thruster mounting platform, gate electrode and ion current collection probe are all bolted to the structural mounting base plate.
6. A TOF system for distinguishing ions of different valence states of a Hall thruster according to claim 1, characterized in that: The grid insulating ceramic spacers are configured with four; The first grounding grid, the switch gate grid, the second grounding grid and the grid insulation ceramic gasket are all fixed between the front copper clamping plate and the rear copper clamping plate; Four grid insulating ceramic spacers are used to separate the front copper clamping plate, the first grounding grid, the switch gate grid, the second grounding grid and the rear copper clamping plate.
7. A TOF system for distinguishing ions of different valence states of a Hall thruster according to claim 1, characterized in that: The central axes of the collecting plate and the protection ring coincide with the central axis of the ceramic insulating component.
8. A TOF system for distinguishing ions of different valence states of a Hall thruster according to claim 6, characterized in that: The first grounding grid, the switch gate grid, the second grounding grid, the front copper clamping plate, the rear copper clamping plate and the grid insulating ceramic gasket are all provided with a plurality of alignment holes.