Mixed clock frequency detection module
By designing a mixed clock frequency detection module of MCU module, channel switching module, signal shaping module and reference source module, the problem of large size and high cost of frequency detection equipment in the prior art is solved, and small, low cost and high precision are achieved frequency detection, suitable for large-scale testing.
Patent Information
- Application Number
- CN202420248425.3
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-02-01
- Publication Date
- 2025-01-07
- Estimated Expiration
- 2034-02-01
AI Technical Summary
In the prior art, the frequency detection equipment is large in size, high in cost, and cannot measure special signals, making it difficult to meet the needs of integrating into batch testing equipment.
A mixed clock frequency detection module including MCU module, channel switching module, signal shaping module and reference source module is designed. Signal processing is performed through signal shaping module, MCU module analyzes signals, reference source module provides reference clock, and channel switching module Achieve rapid switching tests of multiple products to be tested, with a small overall structure and low cost.
It realizes a small and low-cost frequency detection module, which can detect the frequencies of multiple products to be tested in batch testing equipment with high accuracy, is suitable for large-scale testing needs and is not affected by temperature.
Smart Images
Figure CN222319047U_ABST
Abstract
Description
Technical Field
[0001] The utility model is applied to the technical field of detection modules, and particularly relates to a hybrid clock frequency detection module. Background Art
[0002] With the continuous development of integrated circuits, more and more functional chips are integrated on PCB boards. Communication and collaboration between chips has become an indispensable part of the collaboration between various functional modules, which will significantly affect the stability of the product and user experience. Among them, the accuracy of the product's communication output frequency is the basis of communication timing control. For this reason, it is necessary to test the product's output frequency and calibrate it according to the test results to ensure that the product's clock meets the requirements of work and normal peripheral communication.
[0003] The conventional detection method on the market now is to use an external frequency meter, connect it to the frequency output terminal, make corresponding input settings, and obtain relevant data information from the frequency meter. Then adjust the parameters of the frequency meter and read the readings of the frequency meter. Its advantages are high resolution and accurate data. Its disadvantages are that the frequency meter is too large, expensive, and cannot measure some special signals. Utility Model Content
[0004] The technical problem to be solved by the utility model is to overcome the deficiencies of the prior art and provide a hybrid clock frequency detection module which is small in size, low in cost and easy to be integrated into batch testing equipment.
[0005] The technical solution adopted by the utility model is: the utility model includes an MCU module, a channel switching module, a signal shaping module and a reference source module, several input ends of the channel switching module are connected to the product to be tested, the reference source module is connected to the acquisition port of the MCU module, the signal shaping module includes a voltage comparator and a digital-to-analog converter, the positive input end of the voltage comparator is connected to the output end of the digital-to-analog converter, the input end of the digital-to-analog converter is connected to the MCU module, the output end of the channel switching module is connected to the negative input end of the voltage comparator, and the output end of the voltage comparator is connected to the IO port of the MCU module.
[0006] It can be seen from the above scheme that the signal output by the product to be tested is shaped by the signal shaping module, so that the MCU module can better analyze the signal of the product to be tested. The internal crystal oscillator used by the MCU module by default is usually not accurate and easily affected by temperature, resulting in temperature drift that affects the test accuracy. Therefore, the reference source module is used to provide a reference clock to ensure the accuracy of the frequency test. The channel switching module is used to connect multiple products to be tested at the same time and perform fast switching tests to meet the needs of integration in the test equipment during large-scale testing. The overall structure of the utility model is compact, low-cost and easy to integrate in the test equipment for large-scale testing.
[0007] A preferred solution is that the utility model also includes a power supply module connected to the MCU module, the channel switching module, the signal shaping module and the reference source module, and the power supply module includes a linear regulator and a filter resistor and a filter capacitor.
[0008] A preferred solution is that the reference source module includes a temperature-compensated oscillator, and a CLK port of the temperature-compensated oscillator is connected to the MCU module.
[0009] A preferred solution is that the channel switching module includes several groups of single-pole double-throw switches, the S2 ports and IN ports of several of the single-pole double-throw switches are connected to the corresponding products to be tested, and the D ports of several of the single-pole double-throw switches are connected to the negative input terminal of the voltage comparator. BRIEF DESCRIPTION OF THE DRAWINGS
[0010] Figure 1 It is a system block diagram of the utility model;
[0011] Figure 2 is a circuit schematic diagram of the signal shaping module;
[0012] Figure 3 is a circuit schematic diagram of the reference source module;
[0013] Figure 4 is a circuit schematic diagram of the power module;
[0014] Figure 5 is a circuit schematic diagram of the channel switching module;
[0015] Figure 6 is a circuit schematic diagram of the first part of the MCU module;
[0016] Figure 7 It is the circuit schematic diagram of the second part of the MCU module. DETAILED DESCRIPTION
[0017] like Figures 1 to 7As shown, in this embodiment, the utility model includes an MCU module 1, a channel switching module 2, a signal shaping module 3 and a reference source module 4, several input ends of the channel switching module 2 are connected to the product to be tested, the reference source module 4 is connected to the acquisition port of the MCU module 1, the signal shaping module 3 includes a voltage comparator U4 of model TLV3501 and a digital-to-analog converter U1901 of model MCP4725, the positive input end of the voltage comparator U4 is connected to the output end of the digital-to-analog converter U1901, the input end of the digital-to-analog converter U1901 is connected to the MCU module 1, the output end of the channel switching module 2 is connected to the negative input end of the voltage comparator U4, and the output end of the voltage comparator U4 is connected to the IO port of the MCU module 1.
[0018] The input signal is converted into a stable square wave by the voltage comparator U4. For the two input terminals of the voltage comparator U4, one is connected to the measured signal, and the other is connected to the reference voltage output by the digital-to-analog converter U1901. The output terminal of the voltage comparator U4 is directly connected to the IO port of the MCU module 1. Signal shaping is performed by adopting falling edge recognition. The utility model uses TI's TLV3501, which has extremely rich and diverse functional characteristics and is easy to use. TLV3501 is a single-channel high-speed push-pull output comparator with a delay time of 4.5ns and a power supply voltage of +2.7V to +5.5V. It has an input common mode range that exceeds the swing amplitude, making it an ideal choice for low-voltage applications. The rail-to-rail output can directly drive CMOS or TTL logic. The MCU module 1 outputs the reference voltage required for setting the shaping signal of the voltage comparator U4 through the digital-to-analog converter U1901. A peak detection circuit is formed by this reference voltage and the voltage comparator U4. When the voltage of the clock signal to be measured is higher or lower than the reference voltage, an edge jump will be generated at the output end of the voltage comparator U4, and finally a square wave will be displayed, which can be easily detected by the subsequent circuit to calculate the frequency. The corresponding frequency can be measured by setting the reference voltage according to the peak value of the signal to be measured. This structure is only limited by the speed of the voltage comparator U4, and when the response speed of the voltage comparator U4 is very fast, a very high frequency can be measured, thereby satisfying the frequency detection of signals of different amplitudes.
[0019] like Figure 4As shown, in this embodiment, the utility model also includes a power supply module connected to the MCU module 1, the channel switching module 2, the signal shaping module 3 and the reference source module 4, the power supply module includes a linear regulator U802 of model TLV1117-33IDCYR, a filter resistor R805 and a filter capacitor C808, the linear regulator U802 converts the input 5V voltage into a 3.3V voltage and outputs it to each module, one end of the filter resistor R805 is connected to the output end of the linear regulator U802, the other end of the filter resistor R805 is connected to one end of the filter capacitor C808, and the other end of the filter capacitor C808 is grounded.
[0020] like Figure 3 As shown, in this embodiment, the reference source module 4 includes a temperature-compensated oscillator U5 of SiTime company model SiT5156, and the CLK port of the temperature-compensated oscillator U5 is connected to the MCU module 1. SiT5156 has extremely high stability (±0.5ppm to ±2.5ppm), and the reference clock provided by the external temperature-compensated oscillator U5 ensures the accuracy of the frequency test.
[0021] like Figure 5 As shown, the channel switching module 2 includes several groups of single-pole double-throw switches of model ADG749, the S2 ports and IN ports of several of the single-pole double-throw switches are connected to the corresponding products to be tested, and the D ports of several of the single-pole double-throw switches are connected to the negative input terminal of the voltage comparator U4. By using several groups of single-pole double-throw switches, different signal terminals can be selected for testing when there are multiple clock signals to be tested.
[0022] Although the embodiments of the present invention are described with practical solutions, they do not constitute limitations on the meaning of the present invention. For those skilled in the art, it is obvious to modify the implementation scheme and combine it with other solutions based on this description.
Claims
1. A hybrid clock frequency detection module, comprising an MCU module (1), characterized in that: It also comprises a channel switching module (2), a signal shaping module (3) and a reference source module (4), wherein a plurality of input terminals of the channel switching module (2) are connected to a product to be tested, the reference source module (4) is connected to an acquisition port of the MCU module (1), the signal shaping module (3) comprises a voltage comparator (U4) and a digital-to-analog converter (U1901), the positive input terminal of the voltage comparator (U4) is connected to the output terminal of the digital-to-analog converter (U1901), the input terminal of the digital-to-analog converter (U1901) is connected to the MCU module (1), the output terminal of the channel switching module (2) is connected to the negative input terminal of the voltage comparator (U4), and the output terminal of the voltage comparator (U4) is connected to an IO port of the MCU module (1).
2. A hybrid clock frequency detection module according to claim 1, characterized in that: It also includes a power supply module connected to the MCU module (1), the channel switching module (2), the signal shaping module (3) and the reference source module (4) for power supply, and the power supply module includes a linear regulator (U802) and a filter resistor (R805) and a filter capacitor (C808).
3. The hybrid clock frequency detection module according to claim 1, characterized in that: The reference source module (4) comprises a temperature-compensated oscillator (U5), and a CLK port of the temperature-compensated oscillator (U5) is connected to the MCU module (1).
4. The hybrid clock frequency detection module according to claim 1, characterized in that: The channel switching module (2) comprises a plurality of groups of single-pole double-throw switches, the S2 ports and IN ports of the plurality of single-pole double-throw switches being connected to corresponding products to be tested, and the D ports of the plurality of single-pole double-throw switches being connected to the negative input terminal of the voltage comparator (U4).