Disclosed are a
delay time measurement circuit and a
delay time measurement method. The
delay time measurement circuit is connected with a to-be-measured circuit and used for measuring
delay time of the to-be-measured circuit, and comprises a
signal generation source, a D-trigger and an
AND gate circuit, wherein a first output end of the
signal generation source is connected with a first input end of the
AND gate circuit, a second output end of the
signal generation source is connected with an input end of the to-be-measured circuit, an output end of the to-be-measured circuit is connected with a first input end of the D-trigger, a third output end of the signal generation source is coupled with a second input end of the D-trigger, and an output end of the D-trigger is connected with a second input end of the
AND gate circuit. When the
voltage of the output end of the AND gate circuit jumps to low level from high level, the signal
time difference between the second output end and the third output end of the signal generation source is the
delay time of the to-be-measured circuit. The
delay time measurement circuit and the delay time measurement method can measure delay time of the to-be-measured circuit simply and accurately.