Delay time measurement circuit and delay time measurement method

Abstract

Disclosed are a delay time measurement circuit and a delay time measurement method. The delay time measurement circuit is connected with a to-be-measured circuit and used for measuring delay time of the to-be-measured circuit, and comprises a signal generation source, a D-trigger and an AND gate circuit, wherein a first output end of the signal generation source is connected with a first input end of the AND gate circuit, a second output end of the signal generation source is connected with an input end of the to-be-measured circuit, an output end of the to-be-measured circuit is connected with a first input end of the D-trigger, a third output end of the signal generation source is coupled with a second input end of the D-trigger, and an output end of the D-trigger is connected with a second input end of the AND gate circuit. When the voltage of the output end of the AND gate circuit jumps to low level from high level, the signal time difference between the second output end and the third output end of the signal generation source is the delay time of the to-be-measured circuit. The delay time measurement circuit and the delay time measurement method can measure delay time of the to-be-measured circuit simply and accurately.

Description

technical field [0001] The invention relates to the technical field of integrated circuits, in particular to a delay time measurement circuit and a delay time measurement method. Background technique [0002] Delay time is a physical characteristic of the electronic device itself or wiring, and its meaning is the time required for a signal to pass through the electronic device or wiring. For example: In a logic circuit, the output and input terminals are not in the same phase of excitation and response. When the input terminal starts to have a voltage at zero seconds, the output terminal may have a voltage after 100 milliseconds. At this time, the delay time of the logic circuit is 100 milliseconds. Therefore, in integrated circuit design, it is necessary to measure the delay time of each electronic device, circuit or wiring. [0003] refer to figure 1 As shown, it shows a schematic structural diagram of a delay time measuring circuit in the prior art. The delay time mea...

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Problems solved by technology

[0009] However, the circuit for measuring the delay time in the prior art is relatively complicated and occupies a relatively large area, such as: a signal generating source, two D flip-flops and an inverter are required

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