Tool for aging resistance test of chip

Abstract

The utility model discloses a tool for testing aging resistance of a chip, which comprises a test box, universal wheels arranged at the bottom of the test box, a plurality of groups of U-shaped sliding seats arranged inside the test box, a bearing plate connected between each group of U-shaped sliding seats in a sliding manner, and a plurality of U-shaped limiting frames arranged on the surface of the bearing plate, a first fixing block and a second fixing block are arranged at the front and rear ends of the top of the bearing plate respectively, a threaded rod is arranged between the first fixing block and the second fixing block, an adjusting turntable is arranged at the front end of the threaded rod, a plurality of limiting plates sleeve the surface of the threaded rod, and protective pads are arranged on the surfaces of the limiting plates. According to the device, a plurality of chips are respectively placed in the U-shaped limiting frame, then the adjusting turntable is manually rotated, the adjusting turntable drives the threaded rod to rotate, and the threaded rod drives the limiting plate to move, so that the plurality of chips are limited and fixed at the same time, the phenomenon that the chips deviate in the testing process can be avoided, and the testing efficiency is improved. The accuracy of chip testing is ensured, and the testing efficiency is greatly improved.

Description

Technical Field

[0001] The utility model relates to the technical field of chip testing, in particular to a tooling for chip aging resistance testing. Background Art

[0002] In the field of chip testing, the leveling of conventional chips is very simple. However, for some chips with special-shaped packaging structures, the leveling operation is very time-consuming and labor-intensive. When testing the chip, it is not possible to position it more accurately, which easily leads to chip deflection during testing, and the accuracy of chip testing cannot be guaranteed. In addition, only a single chip can be tested during testing, and the test efficiency is low, which cannot meet the needs of users. Therefore, a solution is needed. Utility Model Content

[0003] 1. Technical issues to be resolved

[0004] In view of the deficiencies in the prior art, the utility model provides a chip aging resistance test tool to solve the problems raised in the above background technology.

[0005] (II) Technical solution

[0006] To achieve the above purpose, the utility model is implemented through the following technical solutions: a chip aging test tool, including a test box, a universal wheel is arranged at the bottom of the test box, a plurality of groups of U-shaped slides are arranged inside the test box, a bearing plate is slidably connected between each group of the U-shaped slides, a plurality of U-shaped limit frames are arranged on the surface of the bearing plate, a first fixed block and a second fixed block are respectively arranged at the front and rear ends of the top of the bearing plate, a threaded rod is arranged between the first fixed block and the second fixed block, an adjusting dial is arranged at the front end of the threaded rod, a plurality of limit plates are sleeved on the surface of the threaded rod, and a protective pad is arranged on the surface of the limit plate;

[0007] A mounting sleeve is provided at the bottom of the U-shaped slide seat, a baffle is provided inside the mounting sleeve, a pull rod is provided at the bottom of the baffle, a return spring is sleeved on the surface of the pull rod, a positioning pin is provided at the top of the baffle, and the baffle, pull rod and positioning pin are integrally formed by stamping.

[0008] Preferably, two sliding blocks are symmetrically arranged at the bottom of the limiting plate, and a sliding groove matching the sliding blocks is opened on the surface of the bearing plate.

[0009] Preferably, a positioning hole is formed at the bottom of the supporting plate, and the diameter of the positioning hole is consistent with the diameter of the positioning pin.

[0010] Preferably, adsorption holes are equidistantly formed on the surface of the protective pad, and the adsorption holes are in a cone-shaped structure.

[0011] Preferably, the top of the universal wheel is threadedly connected to the bottom of the test box via bolts, and a matching brake pad is provided on the universal wheel.

[0012] (III) Beneficial effects

[0013] The utility model provides a chip aging resistance test tool, which has the following beneficial effects:

[0014] The chip aging resistance test fixture places multiple chips into a U-shaped limit frame respectively, and then manually rotates an adjusting dial. The adjusting dial drives a threaded rod to rotate, and the threaded rod drives a limit plate to move, thereby limiting and fixing multiple chips at the same time. This can avoid chip deviation during the test, ensure the accuracy of chip testing, and greatly improve the test efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0015] Figure 1 It is a schematic diagram of the overall structure of the utility model;

[0016] Figure 2 It is a structural schematic diagram of the carrying plate of the utility model;

[0017] Figure 3 for Figure 1 Schematic diagram of the structure enlarged at point A in the middle.

[0018] Figure 4 It is a structural schematic diagram of the protective pad described in the utility model.

[0019] In the figure, 1. test box; 2. U-shaped slide; 3. load-bearing plate; 4. universal wheel; 5. U-shaped limit frame; 6. first fixed plate; 7. second fixed plate; 8. threaded rod; 9. adjusting turntable; 10. limit plate; 11. slide groove; 12. slider; 13. mounting sleeve; 14. baffle; 15. pull rod; 16. reset spring; 17. positioning pin; 18. positioning hole; 19. protective pad; 20. adsorption hole. DETAILED DESCRIPTION

[0020] The following will be combined with the drawings in the embodiments of the utility model to clearly and completely describe the technical solutions in the embodiments of the utility model. Obviously, the described embodiments are only part of the embodiments of the utility model, not all of the embodiments. Based on the embodiments in the utility model, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the utility model.

[0021] See also Figure 1-4The embodiment of the utility model provides a technical solution: a chip aging resistance test tool, including a test box 1, a universal wheel 4 is arranged at the bottom of the test box 1, a plurality of groups of U-shaped slides 2 are arranged inside the test box 1, a carrying plate 3 is slidably connected between each group of U-shaped slides 2, a plurality of U-shaped limit frames 5 are arranged on the surface of the carrying plate 3, a first fixing block 6 and a second fixing block 7 are arranged at the front and rear ends of the top of the carrying plate 3, a threaded rod 8 is arranged between the first fixing block 6 and the second fixing block 7, an adjusting dial 9 is arranged at the front end of the threaded rod 8, a plurality of limit plates 10 are sleeved on the surface of the threaded rod 8, and a protective pad 19 is arranged on the surface of the limit plate 10. By manually rotating the adjusting dial 9, the adjusting dial 9 drives the threaded rod 8 to rotate, and the threaded rod 8 drives the limit plate 10 to move, so that multiple chips are limited and fixed at the same time, which can avoid the chip from being offset during the test.

[0022] Effectively, a mounting sleeve 13 is provided at the bottom of the U-shaped slide 2, a baffle 14 is provided inside the mounting sleeve 13, a pull rod 15 is provided at the bottom of the baffle 14, a return spring 16 is sleeved on the surface of the pull rod 15, a positioning pin 17 is provided on the top of the baffle 14, the baffle 14, the pull rod 15 and the positioning pin 17 are integrally formed by stamping, and the positioning pin 17 is inserted into the bottom of the bearing plate 3, so as to fix the bearing plate 3 on the U-shaped slide 2.

[0023] Furthermore, two sliders 12 are symmetrically arranged at the bottom of the limiting plate 10, and a slide groove 11 matching the slider 12 is opened on the surface of the bearing plate 3. The moving direction of the limiting plate 10 is limited by the cooperation of the slide groove 11 and the slider 12.

[0024] Furthermore, a positioning hole 18 is opened at the bottom of the carrier plate 3 , and the diameter of the positioning hole 18 is consistent with the diameter of the positioning pin 17 . The positioning hole 18 and the positioning pin 17 are used in coordination to fix the carrier plate 3 .

[0025] Furthermore, adsorption holes 20 are equidistantly provided on the surface of the protection pad 19, and the adsorption holes 20 are in a cone-shaped structure. The adsorption holes 20 are provided to increase the adsorption capacity of the protection pad 19, and further increase the limiting and fixing effect of the limiting plate 10 on the chip.

[0026] Furthermore, the top of the universal wheel 4 is threadedly connected to the bottom of the test box 1 by bolts, and a matching brake pad is provided on the universal wheel 4. The setting of the universal wheel 4 facilitates the movement of the test box 1, and the universal wheel 4 is locked by the brake pad to prevent the test box 1 from moving.

[0027] Working principle: When in use, the staff first moves the device to the designated test area through the universal wheel 4, locks the universal wheel 4 through the brake pad to prevent the device from moving, then opens the test box 1, and places the multiple chips to be tested into the U-shaped limit frame 5 respectively, and then manually rotates the adjustment dial 9, the adjustment dial 9 drives the threaded rod 8 to rotate, and the threaded rod 8 drives the limit plate 10 to move, so that multiple chips are limited and fixed at the same time, which can avoid the chip from shifting during the test process, ensure the accuracy of the chip test, and greatly improve the test efficiency.

[0028] The above shows and describes the basic principles and main features of the utility model and the advantages of the utility model. For those skilled in the art, it is obvious that the utility model is not limited to the details of the above exemplary embodiments, and can be implemented in other specific forms without departing from the spirit or basic features of the utility model. Therefore, no matter from which point of view, the embodiments should be regarded as exemplary and non-restrictive. The scope of the utility model is limited by the attached claims rather than the above description, and it is intended to include all changes within the meaning and scope of the equivalent elements of the claims. Any figure mark in the claims should not be regarded as limiting the claims involved.

[0029] In addition, it should be understood that although the present specification is described according to implementation modes, not every implementation mode contains only one independent technical solution. This description of the specification is only for the sake of clarity. Those skilled in the art should regard the specification as a whole. The technical solutions in each embodiment may also be appropriately combined to form other implementation modes that can be understood by those skilled in the art.

Claims

1. A chip aging test tool, characterized by: The test box (1) comprises a test box (1), wherein a universal wheel (4) is arranged at the bottom of the test box (1), a plurality of groups of U-shaped slide seats (2) are arranged inside the test box (1), a bearing plate (3) is slidably connected between each group of the U-shaped slide seats (2), a plurality of U-shaped limit frames (5) are arranged on the surface of the bearing plate (3), a first fixed block (6) and a second fixed block (7) are arranged at the front and rear ends of the top of the bearing plate (3), a threaded rod (8) is arranged between the first fixed block (6) and the second fixed block (7), an adjusting dial (9) is arranged at the front end of the threaded rod (8), a plurality of limit plates (10) are sleeved on the surface of the threaded rod (8), and a protective pad (19) is arranged on the surface of the limit plate (10); A mounting sleeve (13) is provided at the bottom of the U-shaped slide seat (2), a baffle (14) is provided inside the mounting sleeve (13), a pull rod (15) is provided at the bottom of the baffle (14), a return spring (16) is sleeved on the surface of the pull rod (15), a positioning pin (17) is provided at the top of the baffle (14), and the baffle (14), the pull rod (15) and the positioning pin (17) are integrally formed by stamping.

2. The chip aging test tool according to claim 1, characterized in that: Two sliding blocks (12) are symmetrically arranged at the bottom of the limiting plate (10), and a sliding groove (11) matching the sliding blocks (12) is opened on the surface of the bearing plate (3).

3. The chip aging test tool according to claim 1, characterized in that: A positioning hole (18) is provided at the bottom of the carrier plate (3), and the diameter of the positioning hole (18) is consistent with the diameter of the positioning pin (17).

4. The chip aging test tool according to claim 1, characterized in that: The surface of the protective pad (19) is provided with adsorption holes (20) at equal intervals, and the adsorption holes (20) are in a cone-shaped structure.

5. The chip aging test tool according to claim 1, characterized in that: The top of the universal wheel (4) is threadedly connected to the bottom of the test box (1) via bolts, and a matching brake pad is provided on the universal wheel (4).

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