Chip testing and sorting device

Abstract

The utility model relates to the technical field of chip testing, and discloses a chip testing and sorting device which comprises a working table, a detector is connected to the working table, a first supporting frame is arranged on the working table, the detector is arranged on the first supporting frame, a through hole is formed under the detector on the working table, a testing plate is rotationally arranged in the through hole, and the testing plate is arranged on the working table. A chip fixing structure is arranged above the test plate, a controller is arranged on the support frame I, the controller is electrically connected with the detector, the chip fixing structure comprises an electric telescopic rod, support frames II are symmetrically arranged on the workbench, electric telescopic rods are arranged on the support frames II, and the electric telescopic rods are electrically connected with the controller. According to the device, the chip is fixed during detection, so that the position of the chip is prevented from deviating, the detection error rate is reduced, and the detection efficiency is improved.

Description

Technical Field

[0001] The utility model relates to the technical field of chip testing, in particular to a chip testing and sorting device. Background Art

[0002] Chip is a general term for semiconductor component products. In electronics, a chip is a way to miniaturize circuits (mainly semiconductor devices, but also passive components, etc.), and is often manufactured on the surface of a semiconductor wafer.

[0003] Before the chip is put into use, it needs to be tested to see if it is qualified, so as to sort out the unqualified ones. During the chip testing process, the chip usually needs to be placed under the detector to facilitate the detection of the detector. However, the existing device is equipped with a structure to fix the chip, and the chip placement position is prone to deviation or being accidentally touched and offset during the detection, resulting in inaccurate detection results and reduced test efficiency. Utility Model Content

[0004] 1. Technical issues to be solved

[0005] The technical problem to be solved by the utility model is to overcome the defect that the chip is not fixed during the detection process and is prone to position deviation, and to provide a chip testing and sorting device.

[0006] (II) Technical solution

[0007] In order to solve the above technical problems, the technical solution provided by the utility model is: a chip testing and sorting device, comprising a workbench, a detector is connected to the workbench, a support frame 1 is provided on the workbench, the detector is provided on the support frame 1, a through hole is opened on the workbench directly below the detector, a test board is rotatably arranged in the through hole, a chip fixing structure is provided above the test board, a controller is provided on the support frame 1, the controller is electrically connected to the detector, the chip fixing structure comprises an electric telescopic rod, a support frame 2 is symmetrically provided on the workbench, an electric telescopic rod is provided on the support frame 2, and the telescopic end of the electric telescopic rod is connected to a pressure plate with a leakage hole structure.

[0008] As an improvement: the upper and lower surfaces of the test plate are provided with anti-collision pads made of rubber material, the size of the anti-collision pads is adapted to the pressure plate, and the anti-collision pads are used to cushion the impact of the test plate when the pressure plate is pressed down, so as to extend the service life of the test plate.

[0009] As an improvement: a cavity is provided inside the workbench, a partition is provided in the cavity, a collection box 1 is placed on the partition, the collection box 1 is located directly below the test board, and the diameter of the collection box is larger than the size of the test board, a door body is symmetrically hinged on the workbench, the collection box 1 is used to hold qualified chips, and at the same time, qualified chips can be stored in the cavity.

[0010] As an improvement: a placement rack is provided on one side of the workbench, and a second collection box is provided in the placement rack. The second collection box is used to hold unqualified chips to facilitate subsequent centralized processing.

[0011] As an improvement: a PLC single chip microcomputer is provided in the controller, and an alarm and an indicator light are provided on the controller respectively. The PLC single chip microcomputer is electrically connected to the alarm and the indicator light respectively, and the indicator light and the alarm are used to remind the staff to reduce the error rate of chip sorting.

[0012] As an improvement: groove one and groove two are respectively provided on both sides of the through hole on the upper surface of the workbench, a driving motor is provided in the groove one, a rotating shaft is provided in the groove two, two ends of the test board are respectively connected to the output end of the driving motor and the rotating shaft, the driving motor and the electric telescopic rod are respectively electrically connected to the PLC single chip microcomputer, the driving motor is started by the PLC single chip microcomputer, the driving motor can drive the test board to rotate, so that qualified chips automatically fall into the collection box one.

[0013] As an improvement: moving wheels are respectively connected to the four corners below the workbench to facilitate pushing the device to the required use position, thereby improving the practicality of the device.

[0014] (III) Beneficial effects

[0015] The advantages of the utility model compared with the prior art are:

[0016] 1. A pressing plate is connected to the workbench, which is controlled by an electric telescopic rod to rise and fall. An anti-collision pad is provided on the test board to limit the chip placement area. The chip position is limited and fixed by the pressing plate to prevent deviation of the chip test position and detection errors, thereby improving detection efficiency;

[0017] 2. The controller controls the electric telescopic rod and the driving motor to realize the automatic collection of qualified chips, reduce manual operation, thereby reducing the probability of manual errors and improving sorting efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] Figure 1 The utility model is a schematic diagram of the structure of a chip testing and sorting device.

[0019] Figure 2 The utility model is a schematic diagram of the local A enlarged structure of a chip testing and sorting device.

[0020] Figure 3 The utility model is a schematic diagram of a local B-enlarged structure of a chip testing and sorting device.

[0021] Figure 4 The utility model is a schematic diagram of the rear side structure of a chip testing and sorting device.

[0022] Figure 5 The utility model is a schematic diagram of a partial cross-sectional structure of a chip testing and sorting device in a front view.

[0023] As shown in the figure: 1. Workbench; 2. Tester; 3. Support frame 1; 4. Through hole; 5. Test board; 6. Controller; 7. Electric telescopic rod; 8. Support frame 2; 9. Press plate; 10. Anti-collision pad; 11. Cavity; 12. Partition; 13. Collection box 1; 14. Door; 15. Placement rack; 16. Collection box 2; 17. PLC single chip computer; 18. Alarm; 19. Indicator light; 20. Groove 1; 21. Groove 2; 22. Drive motor; 23. Rotating shaft; 24. Moving wheel. DETAILED DESCRIPTION

[0024] The present invention will be described in further detail below in conjunction with the accompanying drawings, wherein the same components are indicated by the same reference numerals.

[0025] It should be noted that the words "front", "rear", "left", "right", "up" and "down" used in the following description refer to directions in the drawings, and the words "inside" and "outside" refer to directions toward or away from the geometric center of a specific component, respectively.

[0026] In order to make the contents of the present invention more clearly understood, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention.

[0027] Embodiment 1

[0028] Combined with Figure 1 and Figure 2 As shown, a chip testing and sorting device comprises a workbench 1, to which a detector 2 is connected, a support frame 3 is provided on the workbench 1, on which the detector 2 is provided, a through hole 4 is opened on the workbench 1 directly below the detector 2, a test board 5 is rotatably provided in the through hole 4, a chip fixing structure is provided above the test board 5, a controller 6 is provided on the support frame 3, and the controller 6 is electrically connected to the detector 2, the chip fixing structure comprises an electric telescopic rod 7, a support frame 2 8 is symmetrically provided on the workbench 1, the support frame 2 8 is provided with an electric telescopic rod 7, and the telescopic end of the electric telescopic rod 7 is connected to a pressure plate 9 with a leak structure.

[0029] Through the above structure, the chip is placed on the test board 5, and the electric telescopic rod 7 drives the pressure plate 9 to descend, so as to limit and fix the chip, avoid the chip position from being offset or the placement position from deviating from the detection position of the detector 2, thereby ensuring the accuracy of the test and indirectly improving the test efficiency.

[0030] Combined with Figure 1 , Figure 2 and Figure 4 As shown, the upper and lower surfaces of the test plate 5 are provided with anti-collision pads 10 made of rubber material, the size of the anti-collision pads 10 is adapted to the pressure plate 9, a cavity 11 is provided inside the workbench 1, a partition 12 is provided in the cavity 11, a collection box 13 is placed on the partition 12, the collection box 13 is located directly below the test plate 5, and the diameter of the collection box 13 is larger than the size of the test plate 5, a door body 14 is symmetrically hinged on the workbench 1, a placement rack 15 is provided on one side of the workbench 1, a collection box 2 16 is provided in the placement rack 15, and moving wheels 24 are respectively connected to the four corners below the workbench 1.

[0031] Through the above structure, the anti-collision pad 10 is used to buffer the impact of the pressure plate 9 on the test plate 5 when it is pressed down, so as to extend the service life of the test plate 5. The collection box 13 is used to hold qualified chips, and at the same time, qualified chips can be stored in the cavity 11. The collection box 2 16 is used to hold unqualified chips, which is convenient for subsequent centralized processing. The setting of the moving wheel 24 facilitates pushing the device to the desired use position, thereby improving the practicality of the device.

[0032] Embodiment 2

[0033] Based on the first embodiment, combined with the attached Figure 3 and Figure 5 As shown, the controller 6 is provided with a PLC single chip computer 17, and the controller 6 is respectively provided with an alarm 18 and an indicator light 19, and the PLC single chip computer 17 is electrically connected to the alarm 18 and the indicator light 19, respectively. A groove 1 20 and a groove 2 21 are respectively provided on both sides of the through hole 4 on the upper surface of the workbench 1, and a driving motor 22 is provided in the groove 1 20, and a rotating shaft 23 is provided in the groove 2 21. The two ends of the test board 5 are respectively connected to the output end of the driving motor 22 and the rotating shaft 23, and the driving motor 22 and the electric telescopic rod 7 are respectively electrically connected to the PLC single chip computer 17.

[0034] Through the above structure, the indicator light 19 and the alarm 18 can remind the staff to reduce the error rate of chip sorting. The drive motor 22 is started by the PLC microcontroller 17, and the drive motor 22 can drive the test plate 5 to rotate, so that the qualified chips automatically fall into the collection box 13.

[0035] The specific usage is as follows:

[0036] Place the chip in the circle of the anti-collision pad 10, start the electric telescopic rod 7, so that it drives the pressing plate 9 to press down and fix the chip. The detector 2 detects the chip. When the chip is qualified, the signal is transmitted to the PLC single chip computer 17. After being processed by the PLC single chip computer 17, the signal value indicator light 19, the drive motor 22 and the electric telescopic rod 7 are respectively sent, so that the indicator light 19 at the qualified position is lit, and then the electric telescopic rod 7 drives the pressing plate 9 to rise. After the pressing plate 9 is lifted, the drive motor 22 is started to rotate the test plate 5, and the chip is put into the collection box 13 below;

[0037] When the chip fails the test, the PLC microcontroller 17 sends a signal to light up the indicator light 19 of the failed part, and the alarm 18 issues a warning. The electric telescopic rod 7 drives the pressing plate 9 to rise, and the staff pushes the chip to the collection box 2 16.

[0038] The above description of the utility model and its implementation methods is not restrictive. The drawings show only one implementation method of the utility model, and the actual structure is not limited thereto. In short, if ordinary technicians in this field are inspired by it and design structural methods and embodiments similar to the technical solution without creativity without departing from the purpose of the invention of the utility model, they should all fall within the protection scope of the utility model.

Claims

1. A chip testing and sorting device, comprising a workbench (1), wherein a detector (2) is connected to the workbench (1), and characterized in that: The workbench (1) is provided with a support frame (3), a detector (2) is provided on the support frame (3), a through hole (4) is provided on the workbench (1) directly below the detector (2), a test board (5) is rotatably provided in the through hole (4), a chip fixing structure is provided above the test board (5), a controller (6) is provided on the support frame (3), and the controller (6) is electrically connected to the detector (2); The chip fixing structure comprises an electric telescopic rod (7), a second support frame (8) is symmetrically arranged on the workbench (1), the second support frame (8) is provided with an electric telescopic rod (7), and the telescopic end of the electric telescopic rod (7) is connected to a pressure plate (9) provided with a leak structure.

2. A chip testing and sorting device according to claim 1, characterized in that: The upper surface and the lower surface of the test plate (5) are both provided with anti-collision pads (10) made of rubber material, and the size of the anti-collision pads (10) is compatible with the pressing plate (9).

3. A chip testing and sorting device according to claim 1, characterized in that: The workbench (1) is provided with a cavity (11) inside, a partition (12) is provided inside the cavity (11), a collection box (13) is placed on the partition (12), the collection box (13) is located directly below the test plate (5), and the diameter of the collection box (13) is larger than the size of the test plate (5), and a door body (14) is symmetrically hinged on the workbench (1).

4. A chip testing and sorting device according to claim 1, characterized in that: A placement rack (15) is provided on one side of the workbench (1), and a second collection box (16) is provided in the placement rack (15).

5. A chip testing and sorting device according to claim 1, characterized in that: The controller (6) is provided with a PLC single chip computer (17), the controller (6) is provided with an alarm (18) and an indicator light (19), and the PLC single chip computer (17) is electrically connected to the alarm (18) and the indicator light (19).

6. A chip testing and sorting device according to claim 5, characterized in that: A groove 1 (20) and a groove 2 (21) are respectively arranged on both sides of the through hole (4) on the upper surface of the workbench (1); a driving motor (22) is arranged in the groove 1 (20); a rotating shaft (23) is arranged in the groove 2 (21); two ends of the test board (5) are respectively connected to the output end of the driving motor (22) and the rotating shaft (23); and the driving motor (22) and the electric telescopic rod (7) are respectively electrically connected to the PLC single chip computer (17).

7. A chip testing and sorting device according to claim 1, characterized in that: Moving wheels (24) are respectively connected to the four corners below the workbench (1).

Images