Detection equipment and circuit board detection assembly line

By designing support devices and drive devices, the probe set moves along the X-axis and Y-axis to conflict with multiple detection points, and moves along the Z-axis to conflict with the first detection point, solving the problem of slow speed of existing detection equipment and improving detection Efficiency and reduce the risk of missed and missed inspections.

CN222365061UActive Publication Date: 2025-01-17SHENZHEN YANMADE TECH CO LTD
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Patent Information

Application Number
CN202323564157.0
Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
Filing Date
2023-12-22
Publication Date
2025-01-17
Estimated Expiration
2033-12-22

AI Technical Summary

Technical Problem

Existing detection devices are slower in detecting flexible circuit boards, especially in scenarios where multiple circuits need to be detected, resulting in inefficiency and possible missed or missed detection.

Method used

A detection device is designed, including a support device, a drive device and a probe set, which respectively contacts multiple detection points of the circuit board by driving the probe set along the X-axis and Y-axis, and moves along the Z-axis through the first probe. Resist the first detection point, reduce the number of probe movements, and improve detection efficiency.

Benefits of technology

It improves detection efficiency, reduces the possibility of missed and missed inspections, and reduces the labor intensity of the operator.

✦ Generated by Eureka AI based on patent content.

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Abstract

The utility model relates to detection equipment and a circuit board detection assembly line. The detection equipment comprises a supporting device, a first driving device, a second driving device, a first probe, a probe group and a detection device, the supporting device is used for placing a to-be-tested circuit board; the first driving device is used for driving the first probe to move; the probe group comprises a plurality of second probes, and the second driving device is used for driving the second probes to move; the first probe is connected with a first detection end of the detection device, and each second probe is connected with a second detection end of the detection device. During detection, each second probe can abut against each second detection point, and then the first probe is moved in sequence to abut against each first detection point, so that each to-be-detected circuit can be detected in sequence, the moving times of the probes connected with the second detection end of the detection device can be reduced, operation is convenient, and the detection efficiency is improved. And the detection efficiency can be improved.
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Description

Technical Field

[0001] The utility model belongs to the technical field of circuit board production equipment, and in particular relates to a detection device and a circuit board detection production line. Background Art

[0002] With the continuous development of science and technology, electronic products such as smart phones, smart watches, and tablet computers have become an important part of people's daily lives. Today's electronic products are pursuing high performance while also requiring smaller size and weight, which places higher requirements on product integration. Flexible circuit boards are widely used in circuit connections in electronic products due to their excellent flexibility.

[0003] In order to ensure the performance of the flexible circuit board, the corresponding circuit on the flexible circuit board needs to be tested. The circuit to be tested on the flexible circuit board usually includes two detection points. When testing a circuit to be tested, the detection device usually tests it at these two detection points.

[0004] In the related technology, the detection equipment usually includes a detection module and a probe module, wherein the probe module usually includes two probes, and the two probes are respectively connected to the two detection ends of the detection module. When working, the two probes are respectively pressed against two detection points of the same circuit, so that the detection module can detect the circuit.

[0005] However, the detection speed of this detection device is low, especially in the scenario where there are multiple circuits on the flexible circuit board that need to be detected. When detecting each circuit, it is necessary to simultaneously control two probes to collide with two detection points of the circuit respectively. Utility Model Content

[0006] The technical problem to be solved by the utility model is: to provide a detection device and a circuit board detection line in view of the problem that the detection speed of the detection device in the related technology is low.

[0007] In order to solve the above problems, on the one hand, an embodiment of the utility model provides a detection device for detecting a circuit board to be tested having multiple circuits to be tested, wherein each circuit to be tested has a first detection point and a second detection point, and the detection device includes a supporting device, a first driving device, a second driving device, a first probe, a probe group and a detection device; the supporting device is used to place the circuit board to be tested; the first driving device is used to drive the first probe to move so that the first probe can respectively contact the first detection points of the circuit board to be tested; the probe group includes a needle mold and a plurality of second probes, and each of the second probes is connected to the needle mold; the second driving device is used to drive the needle mold to move, so as to drive each of the second probes to move, so that each of the second probes can respectively contact different second detection points of the circuit board to be tested; the first probe is connected to the first detection end of the detection device, and each of the second probes is connected to the second detection end of the detection device.

[0008] Optionally, the supporting device includes a workbench, a supporting plate, a fixing seat and a cover plate; the supporting plate and the fixing seat are arranged on the workbench at intervals; the supporting plate and the fixing seat are respectively used to support the two ends of the circuit board to be tested; and the cover plate is used to press the circuit board to be tested onto the fixing seat.

[0009] Optionally, the fixing seat includes a base, a first support block and a second support block; the first support block and the second support block are arranged at intervals on the base; the cover plate is rotatably connected to the first support block and can be rotated to contact the second support block to press the circuit board to be tested located between the first support block and the second support block onto the base.

[0010] Optionally, the base includes a fixed block and a mounting block; the fixed block is connected to the workbench; the mounting block is detachably connected to the fixed block; a placement area is provided on the mounting block, and the placement area is used to support and place the circuit board to be tested; the first support block and the second support block are both detachably connected to the fixed block, and the first support block and the second support block respectively abut against opposite ends of the mounting block.

[0011] Optionally, the fixing seat also includes a clamping block and an elastic member; the clamping block is rotatably connected to the second support block so as to be switchable between a first position and a second position; when the clamping block is in the first position, the clamping block presses the cover plate onto the second support block; when the clamping block is in the second position, the cover plate can be rotated away from the second support block so as to be offset from the spacing area between the first support block and the second support block; the elastic member is arranged between the clamping block and the second support block, for keeping the clamping block in the first position, and when the clamping block is rotated from the first position to the second position, the elastic member can be elastically deformed.

[0012] Optionally, the support plate is provided with a suction hole, and the suction hole is connected to a negative pressure device so as to adsorb the circuit board to be tested placed on the support plate.

[0013] Optionally, the first driving device can drive the first probe to move along the X-axis, Y-axis and Z-axis respectively; the second driving device can drive the needle mold to move along the X-axis and Y-axis respectively; wherein the axis of the first probe is parallel to the Z-axis, and the axis of the second probe is parallel to the Y-axis.

[0014] Optionally, the detection equipment also includes a scanning device, which is used to scan and identify the identification code of the circuit board to be tested placed on the supporting device; the scanning device is connected to the first driving device; and the first driving device can drive the scanning device and the first probe to move synchronously.

[0015] Optionally, the circuit board to be tested includes a circuit board body and a connector, the circuit to be tested is arranged on the circuit board body, and the second detection point of each circuit to be tested is connected to the connector; the detection equipment also includes a visual recognition device, which is used to photograph the connector of the circuit board to be tested placed on the supporting device.

[0016] In order to solve the above problems, on the other hand, an embodiment of the utility model provides a circuit board detection line, including any one of the detection devices described above.

[0017] In the detection equipment and circuit board detection assembly line provided by the embodiments of the utility model, when detecting each circuit to be tested, each second probe can be respectively brought into contact with the second detection point of each circuit to be tested, and then the first probe can be moved in sequence to make it contact with the first detection point of each circuit to be tested, so that each circuit to be tested can be detected in sequence. This can reduce the number of times the probe connected to the second detection end of the detection device is moved, thereby facilitating operation and improving detection efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] Figure 1It is a partial structural schematic diagram of a supporting device of a detection device provided by an embodiment of the utility model;

[0019] Figure 2 It is a partial structural schematic diagram of the second driving device of the detection device provided by one embodiment of the utility model;

[0020] Figure 3 It is a partial structural schematic diagram of a first driving device of a detection device provided by an embodiment of the utility model;

[0021] Figure 4 It is a schematic diagram of the local structure of the fixing seat of the detection device provided by one embodiment of the utility model.

[0022] The reference numerals in the specification are as follows:

[0023] 1. Support device; 11. Workbench; 12. Support plate; 13. Fixed seat; 131. Base; 132. First support block; 133. Second support block; 134. Fixed block; 135. Mounting block; 136. Placement area; 137. Protrusion; 138. Block; 139. Connecting plate; 140. Pressing plate; 141. Body; 142. Connecting block; 143. Inclined surface; 144. Second guide structure; 14. Cover plate;

[0024] 2. First driving device; 21. First driving module; 22. Second driving module; 23. Third driving module;

[0025] 3. A second driving device;

[0026] 4. The first probe;

[0027] 5. Probe group; 51. Needle mold; 52. Second probe; 53. First guide structure;

[0028] 6. Visual recognition device;

[0029] 7. Scanning device. DETAILED DESCRIPTION

[0030] In order to make the technical problems, technical solutions and beneficial effects solved by the utility model more clear, the utility model is further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the utility model and are not used to limit the utility model.

[0031] In this embodiment, the detection device is used to detect a circuit board to be tested having multiple circuits to be tested, wherein each circuit to be tested has a first detection point and a second detection point, and usually, each circuit to be tested has a first detection point and a second detection point. When working, the detection device can electrically contact the first detection point and the second detection point of a circuit to be tested at the same time, and then detect the circuit to be tested.

[0032] like Figures 1 to 3 As shown, the detection device includes a supporting device 1, a first driving device 2, a second driving device 3, a first probe 4, a probe group 5 and a detection device; the supporting device 1 is used to place the circuit board to be tested; the first driving device 2 is used to drive the first probe 4 to move, so that the first probe 4 can respectively contact each first detection point of the circuit board to be tested.

[0033] The probe group 5 includes a needle mold 51 and multiple second probes 52, and each second probe 52 is connected to the needle mold 51; the second driving device 3 is used to drive the needle mold 51 to move, so as to drive each second probe 52 to move, so that each second probe 52 can respectively contact different second detection points of the circuit board to be tested; the first probe 4 is connected to the first detection end of the detection device, and each second probe 52 is connected to the second detection end of the detection device.

[0034] When working, the probe group 5 can be driven to move first, so that each second probe 52 can collide with the corresponding second detection point, so that the second detection end of the detection device can be electrically connected to multiple second detection points of the circuit board to be tested through the probe group 5 at the same time; then the first probe 4 can be driven to collide with the first detection point, so that the second detection end of the detection device can electrically collide with the moving first detection point through the first probe 4, wherein the second detection point of the circuit to be tested where the first detection point is located collide with the second probe 52, so that the detection device can detect the circuit to be tested. Subsequently, the first probe 4 is moved to collide with another first detection point, so that the detection device can detect another circuit to be tested.

[0035] That is, according to the arrangement of this embodiment, when testing each circuit to be tested, each second probe 52 can be respectively brought into contact with the second detection point of each circuit to be tested, and then the first probe 4 can be moved in sequence to make it contact with the first detection point of each circuit to be tested, so that each circuit to be tested can be tested in sequence. This can reduce the number of times the probe connected to the second detection end of the detection device is moved, thereby facilitating operation and improving detection efficiency.

[0036] In addition, in the related art (background art), when the circuit board is detected, it is usually carried out in a manual operation mode, that is, the operator is required to respectively contact the two probes with the two detection points of different circuits to be tested, which is not only inefficient, but also easy to miss or misdetect (for example, one probe contacts the first detection point of a circuit to be tested, and the other probe contacts the second detection point of another circuit to be tested), thereby reducing the detection accuracy. In the setting of the present embodiment, each second probe 52 in the probe group 5 can respectively contact the second detection point of each circuit to be tested, and then move the first probe 4 to make it contact with each first detection point in turn, so as to avoid the occurrence of missed detection and misdetection problems. Moreover, the setting of the present embodiment can drive the first probe 4 and the probe group 5 to move respectively by two driving devices, and can also reduce the labor intensity of the operator.

[0037] It should be noted that the first driving device 2 drives the first probe 4 to respectively contact the first detection points of the circuit board to be tested, which means that the first probe 4 electrically contacts one first detection point at a time. After the detection of one circuit to be tested is completed, the first driving device 2 drives the first probe 4 to move to electrically contact another first detection point until the first probe 4 electrically contacts all the first detection points.

[0038] That each second probe 52 can respectively contact different second detection points of the circuit board to be tested means that each second probe 52 electrically contacts the corresponding second detection point, and the number of second probes 52 is equal to the number of second detection points, and one second probe 52 electrically contacts one second detection point.

[0039] In addition, the circuit board to be tested may be a flexible circuit board, a hard circuit board, etc., and the circuit board to be tested may also be provided with corresponding electronic components. The first probe 4 and the second probe 52 may both be double-ended probes, etc.

[0040] like Figure 1 and Figure 4 As shown, in one embodiment, the supporting device 1 includes a workbench 11, a supporting plate 12, a fixing seat 13 and a cover plate 14; the supporting plate 12 and the fixing seat 13 are arranged on the workbench 11 at intervals; the supporting plate 12 and the fixing seat 13 are respectively used to support the two ends of the circuit board to be tested; the cover plate 14 is used to press the circuit board to be tested onto the fixing seat 13.

[0041] Such an arrangement can reduce the length of the object in the supporting device 1 used to support the circuit board to be tested, and can reduce the cost to a certain extent.

[0042] In one embodiment, the support plate 12 is provided with a suction hole, which is connected to the negative pressure device so as to absorb the circuit board to be tested placed on the support plate 12. The circuit board to be tested is usually placed on the upper surface of the support plate 12, and the suction hole is provided on the upper surface of the support plate 12. When the negative pressure device is evacuated, negative pressure can be generated at the suction hole to absorb the circuit board to be tested placed on the support plate 12.

[0043] like Figure 4 As shown, in one embodiment, the fixing seat 13 includes a base 131, a first support block 132 and a second support block 133; the base 131 is connected to the workbench 11, and the first support block 132 and the second support block 133 are arranged on the base 131 at intervals; the cover plate 14 is rotatably connected to the first support block 132, and can be rotated to contact the second support block 133, so as to press the circuit board to be tested located between the first support block 132 and the second support block 133 onto the base 131.

[0044] That is, during operation, one end of the circuit board to be tested placed on the fixing seat 13 is actually placed on the base 131 and is located between the first support block 132 and the second support block 133. When the cover plate 14 rotates and contacts the second support block 133, the circuit board to be tested is pressed tightly against the base 131. In addition, the second support block 133 can limit the position of the cover plate 14 to prevent the cover plate 14 from rotating too much and crushing the circuit board to be tested.

[0045] like Figure 4 As shown, in one embodiment, the base 131 includes a fixed block 134 and a mounting block 135; the fixed block 134 is connected to the workbench 11; the mounting block 135 is detachably connected to the fixed block 134; a placement area 136 is provided on the mounting block 135, and the placement area 136 is used to support and place the circuit board to be tested; the first support block 132 and the second support block 133 are both detachably connected to the fixed block 134, and the first support block 132 and the second support block 133 are respectively in contact with the opposite ends of the mounting block 135.

[0046] Since the circuit board to be tested is placed on the mounting block 135, the mounting block 135 is more easily damaged than the fixing block 134. The two are arranged to be detachably connected. When the mounting block 135 is damaged, only the mounting block 135 needs to be replaced, thereby reducing maintenance costs.

[0047] In addition, the first support block 132 and the second support block 133 are detachably connected to the fixing block 134, which can also reduce maintenance costs. Moreover, the first support block 132 and the second support block 133 are respectively abutted against the two ends of the mounting block 135, so that the first support block 132 and the second support block 133 can be positioned by the mounting block 135 to facilitate assembly.

[0048] like Figure 4As described above, bumps 137 are arranged around the placement area 136 , and the bumps 137 can limit the circuit board to be tested placed in the placement area 136 .

[0049] like Figure 4 As shown, in one embodiment, the fixing seat 13 further includes a clamping block 138 and an elastic member; the clamping block 138 is rotatably connected to the second support block 133 so as to be switchable between the first position and the second position; when the clamping block 138 is in the first position, the clamping block 138 presses the cover plate 14 against the second support block 133, so as to prevent the cover plate 14 from shaking, so that the circuit board to be tested can be more stably limited on the fixing seat 13; when the clamping block 138 is in the second position, the cover plate 14 can be rotated away from the second support block 133 so as to be staggered with the interval area between the first support block 132 and the second support block 133, so as to facilitate the placement of the circuit board to be tested between the first support block 132 and the second support block 133, or to facilitate the removal of the circuit board to be tested between the first support block 132 and the second support block 133; the elastic member is arranged between the clamping block 138 and the second support block 133, so as to keep the clamping block 138 in the first position, and when the clamping block 138 is rotated from the first position to the second position, the elastic member can be elastically deformed. Initially, the block 138 is located at the first position. When the block 138 is driven by an external force, it can rotate from the first position to the second position. When the external force is removed, the block 138 can be reset to the first position under the deformation force of the elastic member. The elastic member can be a spring or the like.

[0050] like Figure 4 As shown, the block 138 includes a connecting plate 139 and a pressing block 140, wherein the connecting plate 139 is rotatably connected to the second support block 133, and the pressing block 140 is arranged on the connecting plate 139. When the block 138 is in the first position, the pressing block 140 presses the cover plate 14 on the second support block 133. When the block 138 is in the second position, the pressing block 140 is staggered from the cover plate 14 that abuts against the second support block 133, so that the cover plate 14 can rotate.

[0051] In addition, the cover plate 14 can switch between a third position and a fourth position when rotating; when the cover plate 14 is in the third position, it conflicts with the second support block 133, and at this time, the pressing block 140 can press the cover plate 14 against the second support block 133; when the cover plate 14 is in the fourth position, it is staggered with the interval area between the first support block 132 and the second support block 133.

[0052] like Figure 4As shown, the second support block 133 includes a body 141 and a connecting block 142, the body 141 abuts against the surface of the mounting block 135 away from the first support block 132, the connecting block 142 is installed on the surface of the body 141 away from the first support block 132, the connecting plate 139 is rotatably connected to the connecting block 142, when the clamping block 138 is located at the first position, the pressing block 140 is located above the upper surface of the body 141 and is spaced from the upper surface of the body 141. When the cover plate 14 is located at the third position, the cover plate 14 abuts against the upper surface of the body 141, and when the clamping block 138 is located at the first position, the pressing block 140 presses the cover plate 14 against the upper surface of the body 141.

[0053] In addition, the pressing block 140 has an inclined surface 143. When the clamping block 138 is in the first position, the distance between the inclined surface 143 and the first supporting block 132 gradually decreases from top to bottom. When the clamping block 138 is in the first position, the cover plate 14 will contact the inclined surface 143 during the rotation of the cover plate 14 from the fourth position to the third position, so that the clamping block 138 drives the connecting plate 139 to rotate toward the second position, until the cover plate 14 rotates to the third position, and the cover plate 14 moves to the bottom of the pressing block 140. At this time, the pressing block 140 is reset to the first position to be pressed on the cover plate 14.

[0054] In one embodiment, the first driving device 2 can drive the first probe 4 to move along the X-axis, Y-axis and Z-axis respectively; the second driving device 3 can drive the needle mold 51 to move along the X-axis and Y-axis respectively; wherein the axis of the first probe 4 is parallel to the Z-axis, and the axis of the second probe 52 is parallel to the Y-axis.

[0055] Among them, the X-axis may be parallel to the left-right direction, the Y-axis may be parallel to the front-back direction, and the Z-axis may be parallel to the up-down direction.

[0056] like Figure 3 As shown, in one embodiment, the first driving device 2 includes a first driving module 21, a second driving module 22 and a third driving module 23; the first driving module 21 is connected to the workbench 11, the second driving module 22 is connected to the first driving module 21, the third driving module 23 is connected to the second driving module 22, and the first probe 4 is connected to the third driving module 23. The first driving module 21 can drive the second driving module 22, the third driving module 23 and the first probe 4 to synchronously reciprocate along the X-axis direction, the second driving module 22 can drive the third driving module 23 and the first probe 4 to synchronously reciprocate along the Y-axis direction, and the third driving module 23 can drive the first probe 4 to reciprocate along the Z-axis direction.

[0057] The support plate 12 and the fixing seat 13 may be spaced apart along the X-axis direction. The first support block 132 and the second support block 133 may also be spaced apart along the X-axis, and the mounting block 135 may be located above the fixing block 134 .

[0058] In addition, the second driving device 3 includes a third driving module 23 and a fourth driving module; the third driving module 23 is connected to the workbench 11, the fourth driving module is connected to the third driving module 23, and the needle mold 51 is connected to the fourth driving module. The third driving module 23 can drive the fourth driving module, the needle mold 51 and each second probe 52 to synchronously reciprocate along the X-axis direction, and the fourth driving module can drive the needle mold 51 and each second probe 52 to synchronously reciprocate along the Y-axis direction.

[0059] like Figure 2 and Figure 4 As shown, in one embodiment, the probe group 5 further includes a first guide structure 53, and a second guide structure 144 is provided on the fixing seat 13. The first guide structure 53 and the second guide structure 144 cooperate to guide the movement of the second probe driven by the second driving module 3 along the Y-axis direction. The first guide structure 53 can be a guide column, and the second guide structure 144 can be a guide hole. Of course, in other embodiments, the first guide structure 53 can be a guide hole, and the second guide structure 144 can be a guide column.

[0060] In one scenario, the circuit board to be tested includes a circuit board body and a connector, the circuit to be tested is arranged on the circuit board body, and the second detection point of each circuit to be tested is connected to the connector; the detection device also includes a visual recognition device 6 (reference Figure 2 ,in, Figure 2 The structure shown can be installed in Figure 1 The visual recognition device 6 is used to photograph the connector of the circuit board to be tested placed on the supporting device 1 to detect whether the connector is damaged. When the connector is not damaged, the second driving module 22 drives each second probe 52 to move so as to collide with each second detection point.

[0061] The visual recognition device 6 includes a fifth driving module and a camera. The fifth driving module is installed on the workbench 11 and is used to drive the camera to move along the X direction. When the connector needs to be inspected, the fifth driving module drives the camera to move relative to the connector (the connector is usually limited in the placement area 136). When the recognition is completed, the camera is driven to move in the opposite direction and reset to avoid interfering with the movement of the second probe 52.

[0062] like Figure 3As shown, the detection device also includes a scanning device 7, which is used to scan and identify the identification code of the circuit board to be tested placed on the supporting device 1; the scanning device 7 is connected to the first driving device 2; the first driving device 2 can drive the scanning device 7 and the first probe 4 to move synchronously. Among them, the scanning device 7 can also be installed on the third driving module 23. When working, the scanning device 7 scans and identifies the identification code on the circuit board to be tested located below it.

[0063] The embodiment of the utility model also provides a circuit board inspection line, which includes the inspection device described in any of the above embodiments. In addition, the circuit board inspection line can also include a loading device and a unloading device, the loading device can place the circuit board to be tested on the support device 1, and when the inspection is completed, the unloading device can move the circuit board on the support device 1 out of the support device.

[0064] The technical features of the above-described embodiments may be arbitrarily combined. To make the description concise, not all possible combinations of the technical features in the above-described embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0065] The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention. Any modifications, equivalent substitutions and improvements made within the spirit and principles of the present invention should be included in the protection scope of the present invention.

Claims

1. A testing device for testing a circuit board having a plurality of circuits to be tested, each circuit to be tested having a first testing point and a second testing point, characterized in that: The detection device comprises a supporting device, a first driving device, a second driving device, a first probe, a probe group and a detection device; The supporting device is used for placing the circuit board to be tested; The first driving device is used to drive the first probe to move so that the first probe can respectively contact the first detection point of each circuit to be tested of the circuit board to be tested; The probe group includes a needle mold and a plurality of second probes, each of the second probes is connected to the needle mold; The second driving device is used to drive the needle mold to move, so as to drive each of the second probes to move, so that each of the second probes can respectively contact different second detection points of the circuit board to be tested; The first probe is connected to the first detection end of the detection device, and each of the second probes is connected to the second detection end of the detection device.

2. The detection device according to claim 1, characterized in that: The supporting device comprises a workbench, a supporting plate, a fixing seat and a cover plate; The support plate and the fixing seat are arranged on the workbench at intervals; The support plate and the fixing seat are respectively used to support two ends of the circuit board to be tested; The cover plate is used to press the circuit board to be tested onto the fixing seat.

3. The detection device according to claim 2, characterized in that: The fixing seat comprises a base, a first supporting block and a second supporting block; The first supporting block and the second supporting block are arranged on the base at intervals; The cover plate is rotatably connected to the first support block and can be rotated to contact the second support block so as to press the circuit board to be tested between the first support block and the second support block onto the base.

4. The detection device according to claim 3, characterized in that: The base includes a fixing block and a mounting block; The fixing block is connected to the workbench; The mounting block is detachably connected to the fixing block; The mounting block is provided with a placement area, and the placement area is used to support and place the circuit board to be tested; The first supporting block and the second supporting block are both detachably connected to the fixing block, and the first supporting block and the second supporting block respectively abut against two opposite ends of the mounting block.

5. The detection device according to claim 3, characterized in that: The fixing seat also includes a clamping block and an elastic member; The clamping block is rotatably connected to the second supporting block so as to be switchable between a first position and a second position; When the clamping block is in the first position, the clamping block presses the cover plate onto the second supporting block; When the clamping block is in the second position, the cover plate can rotate away from the second support block so as to be offset from the interval area between the first support block and the second support block; The elastic member is disposed between the clamping block and the second supporting block, and is used to keep the clamping block at the first position. When the clamping block rotates from the first position to the second position, the elastic member can be elastically deformed.

6. The detection device according to claim 2, characterized in that: The support plate is provided with a suction hole, and the suction hole is connected to the negative pressure device so as to absorb the circuit board to be tested placed on the support plate.

7. The detection device according to claim 1, characterized in that: The first driving device can drive the first probe to move along the X-axis, the Y-axis and the Z-axis respectively; The second driving device can drive the needle mold to move along the X-axis and the Y-axis respectively; The axis of the first probe is parallel to the Z axis, and the axis of the second probe is parallel to the Y axis.

8. The detection device according to claim 1, characterized in that: The detection device further comprises a scanning device, which is used to scan and identify the identification code of the circuit board to be tested placed on the supporting device; The scanning device is connected to the first driving device; The first driving device can drive the scanning device and the first probe to move synchronously.

9. The detection device according to claim 1, characterized in that: The circuit board to be tested comprises a circuit board body and a connector. The circuit to be tested is arranged on the circuit board body, and the second detection point of each circuit to be tested is connected to the connector. The detection device further comprises a visual recognition device, which is used to photograph the connector of the circuit board to be tested placed on the supporting device.

10. A circuit board inspection line, characterized in that: A detection device comprising any one of claims 1 to 9.