Semiconductor detection platform with limiting function

Abstract

The utility model discloses a semiconductor detection platform with a limiting function, which comprises a bottom plate, the top of the bottom plate is fixedly connected with an electric push rod, the top end of the electric push rod is fixedly connected with a tray, the top of the bottom plate is fixedly connected with a first motor, and the output end of the first motor is fixedly connected with a first sliding table. A first two-way lead screw is rotatably inserted between the inner walls of the two ends of the first sliding table, the outer wall of the first two-way lead screw is sleeved with two second sliding tables in a threaded mode, a first clamping plate is fixedly connected between the inner walls of the two ends of each second sliding table, and third motors are fixedly connected to the outer walls of the two ends of each second sliding table; and the output end of the third motor is fixedly connected with a clamping rod. According to the utility model, the clamping rods are driven by the third motor to rotate, so that the plurality of clamping rods are in contact with the top and the bottom of the semiconductor, and the semiconductor is limited and clamped from the top and the bottom of the semiconductor, thereby facilitating the subsequent overturning of the semiconductor.

Description

Technical Field

[0001] The utility model relates to the technical field of semiconductors, in particular to a semiconductor detection platform with a limiting function. Background Art

[0002] Semiconductors are materials with electrical conductivity between that of insulators and conductors. Their electrical conductivity is easily controlled and they can be used as component materials for information processing. In order to ensure that semiconductor products are qualified, stable and reliable, semiconductors need to undergo process testing.

[0003] After searching, the Chinese patent with announcement number CN218927744U discloses a semiconductor detection platform with a limiting function. The above patent realizes the function of clamping and limiting the semiconductor by setting an adjustment mechanism above the clamping plate. However, the platform can only clamp the semiconductor on all sides, and cannot clamp and limit the upper and lower positions of the semiconductor, resulting in the inability to flip the semiconductor. In order to advance the industry technology, better realize the clamping and limiting function, and improve the competitiveness of core technologies, this application proposes a new implementation plan that is different from the prior art. Utility Model Content

[0004] The utility model aims to solve the shortcomings of the prior art that the upper and lower positions of semiconductors are not limited and cannot be turned over, and proposes a semiconductor detection platform with a limiting function.

[0005] In order to achieve the above purpose, the utility model adopts the following technical solutions:

[0006] A semiconductor detection platform with a limiting function comprises a base plate, an electric push rod is fixedly connected to the top of the base plate, a tray is fixedly connected to the top of the electric push rod, a first motor is fixedly connected to the top of the base plate, a first slide is fixedly connected to the output end of the first motor, a first bidirectional screw rod is rotatably inserted between the inner walls at both ends of the first slide, two second slides are threadedly sleeved on the outer wall of the first bidirectional screw rod, a first clamping plate is fixedly connected between the inner walls at both ends of the second slide, a third motor is fixedly connected to the outer walls at both ends of the second slide, a clamping rod is fixedly connected to the output end of the third motor, the other end of the clamping rod is rotatably connected to the outer wall of the other end of the second slide, a second bidirectional screw rod is rotatably connected in the second slide, and two second clamping plates are threadedly sleeved on the outer wall of the second bidirectional screw rod.

[0007] Furthermore, a plurality of supporting legs are fixedly connected to the bottom of the base plate.

[0008] Furthermore, a mounting frame is fixedly connected to the top of the base plate, and a plurality of ellipsometers are fixedly connected to one side of the mounting frame.

[0009] Furthermore, a non-slip pad is bonded to the top of the tray.

[0010] Furthermore, a second motor is fixedly connected to an outer wall of one end of the first slide, and an output end of the second motor is fixedly connected to one end of the first bidirectional screw rod.

[0011] Furthermore, a fourth motor is fixedly connected to the inner wall of one end of the second slide, and an output end of the fourth motor is fixedly connected to one end of the second bidirectional lead screw.

[0012] Furthermore, a first buffer pad is fixedly connected to one side of the first clamping plate.

[0013] Furthermore, a second buffer pad is fixedly connected to one side of the second clamping plate.

[0014] The beneficial effects of the utility model are:

[0015] 1. The first bidirectional screw is rotated under the drive of the second motor, so that the two first clamping plates gather toward the middle, thereby clamping the semiconductor from both sides. Then, the second bidirectional screw is rotated under the drive of the fourth motor, thereby driving the two second clamping plates to gather toward the middle, and then clamping from the other two sides of the semiconductor, thereby better clamping the semiconductor.

[0016] 2. The clamping rods are rotated under the drive of the third motor, so that the multiple clamping rods are in contact with the top and bottom of the semiconductor, and then the semiconductor is limited and clamped from the top and bottom, so as to subsequently flip the semiconductor.

[0017] 3. The first buffer pad and the second buffer pad can be provided to protect the semiconductor when it is clamped, so as to avoid damage to the semiconductor. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] Figure 1 This is a schematic diagram of the three-dimensional structure of a semiconductor testing platform with a limiting function proposed by the utility model;

[0019] Figure 2 This is a partial structural schematic diagram of a semiconductor testing platform with a limiting function proposed by the utility model;

[0020] Figure 3 This is a schematic diagram of a partial cross-sectional structure of a semiconductor testing platform with a limiting function proposed by the utility model.

[0021] In the figure: 1. base plate; 2. support foot; 3. mounting frame; 4. ellipsometer; 5. electric push rod; 6. tray; 7. anti-slip pad; 8. first motor; 9. first slide; 10. second motor; 11. first bidirectional lead screw; 12. second slide; 13. third motor; 14. clamping rod; 15. fourth motor; 16. second bidirectional lead screw; 17. first clamping plate; 18. first buffer pad; 19. second clamping plate; 20. second buffer pad. DETAILED DESCRIPTION

[0022] The technical solutions in the embodiments of the present invention will be described clearly and completely below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, rather than all of the embodiments.

[0023] Reference Figure 1-Figure 3 A semiconductor detection platform with a limiting function comprises a bottom plate 1, an electric push rod 5 is fixed to the top of the bottom plate 1 by bolts, a tray 6 is fixed to the top of the electric push rod 5 by bolts, a first motor 8 is fixed to the top of the bottom plate 1 by bolts, a first slide 9 is fixed to the output end of the first motor 8 by bolts, a first bidirectional screw rod 11 is rotatably inserted between the inner walls at both ends of the first slide 9 by bearings, two second slides 12 are threadedly sleeved on the outer wall of the first bidirectional screw rod 11, a first clamping plate 17 is fixed to the inner walls at both ends of the second slide 12 by bolts, a second motor 10 is fixed to the outer wall of one end of the first slide 9 by bolts, the output end of the second motor 10 is fixedly connected to one end of the first bidirectional screw rod 11, the first bidirectional screw rod 11 is rotated under the drive of the second motor 10, thereby driving the second slide 12 to move, and then the two first clamping plates 17 are gathered to the middle, so that the semiconductor is moved from the two ends. The second slide 12 is clamped on the side, and the outer walls of both ends of the second slide 12 are fixed with a third motor 13 by bolts. The output end of the third motor 13 is fixed with a clamping rod 14 by bolts. The clamping rod 14 rotates under the drive of the third motor 13, so that multiple clamping rods 14 contact the top and bottom of the semiconductor, and then limit clamping is performed from the top and bottom of the semiconductor, and the other end of the clamping rod 14 is rotatably connected to the outer wall of the other end of the second slide 12, and a second bidirectional screw rod 16 is rotatably connected in the second slide 12, and two second clamping plates 19 are threadedly sleeved on the outer wall of the second bidirectional screw rod 16, and a fourth motor 15 is fixed to the inner wall of one end of the second slide 12 by bolts, and the output end of the fourth motor 15 is fixedly connected to one end of the second bidirectional screw rod 16. The second bidirectional screw rod 16 rotates under the drive of the fourth motor 15, thereby driving the two second clamping plates 19 to gather toward the middle, and then clamping is performed from the other two sides of the semiconductor.

[0024] A plurality of legs 2 are welded to the bottom of the base plate 1 to support the base plate 1, a mounting frame 3 is welded to the top of the base plate 1, a plurality of ellipsometers 4 are fixed to one side of the mounting frame 3 by bolts, an anti-skid pad 7 is bonded to the top of the tray 6, and the design of the anti-skid pad 7 increases the friction between the tray 6 and the semiconductor, thereby improving the stability of the semiconductor placement, a first buffer pad 18 is bonded to one side of the first clamping plate 17, and a second buffer pad 20 is bonded to one side of the second clamping plate 19, and the first buffer pad 18 and the second buffer pad 20 are used to protect the semiconductor when clamping it to avoid damage to the semiconductor.

[0025] Working principle: When in use, first, place the semiconductor on the tray 6, then, driven by the second motor 10, the first bidirectional screw 11 rotates, thereby driving the second slide 12 to move, and then the two first clamping plates 17 gather toward the middle, so as to clamp the semiconductor from both sides, then, driven by the fourth motor 15, the second bidirectional screw 16 rotates, thereby driving the two second clamping plates 19 to gather toward the middle, and then clamping from the other two sides of the semiconductor, then, driven by the third motor 13, the clamping rod 14 rotates, so that multiple clamping rods 14 contact the top and bottom of the semiconductor, and then limit clamping from the top and bottom of the semiconductor, then, the semiconductor is inspected, and during the inspection process, the tray 6 is driven to move downward under the contraction of the electric push rod 5, thereby lowering the tray 6, and then, driven by the first motor 8, the first slide 9 rotates, thereby clamping the semiconductor for rotation, and then flipping the semiconductor, so as to fully inspect the semiconductor.

[0026] The above description is only a preferred specific implementation manner of the present invention, but the protection scope of the present invention is not limited thereto. Any technician familiar with the technical field can make equivalent replacements or changes within the technical scope disclosed by the present invention according to the technical scheme and the utility model concept of the present invention, which should be covered by the protection scope of the present invention.

Claims

1. A semiconductor testing platform with a limiting function, comprising a base plate (1), characterized in that: The top of the base plate (1) is fixedly connected to an electric push rod (5), the top of the electric push rod (5) is fixedly connected to a tray (6), the top of the base plate (1) is fixedly connected to a first motor (8), the output end of the first motor (8) is fixedly connected to a first slide (9), a first bidirectional screw rod (11) is rotatably inserted between the inner walls at both ends of the first slide (9), the outer wall of the first bidirectional screw rod (11) is threadedly sleeved with two second slides (12), a first clamping plate (17) is fixedly connected between the inner walls at both ends of the second slide (12), the outer walls at both ends of the second slide (12) are fixedly connected to a third motor (13), the output end of the third motor (13) is fixedly connected to a clamping rod (14), the other end of the clamping rod (14) is rotatably connected to the outer wall of the other end of the second slide (12), a second bidirectional screw rod (16) is rotatably connected inside the second slide (12), the outer wall of the second bidirectional screw rod (16) is threadedly sleeved with two second clamping plates (19).

2. A semiconductor testing platform with a limiting function according to claim 1, characterized in that: A plurality of supporting legs (2) are fixedly connected to the bottom of the base plate (1).

3. The semiconductor testing platform with a limiting function according to claim 1, characterized in that: A mounting frame (3) is fixedly connected to the top of the base plate (1), and a plurality of ellipsometers (4) are fixedly connected to one side of the mounting frame (3).

4. The semiconductor testing platform with a limiting function according to claim 1, characterized in that: An anti-slip pad (7) is bonded to the top of the tray (6).

5. The semiconductor testing platform with a limiting function according to claim 1, characterized in that: A second motor (10) is fixedly connected to an outer wall at one end of the first slide table (9), and an output end of the second motor (10) is fixedly connected to one end of a first bidirectional screw rod (11).

6. The semiconductor testing platform with a limiting function according to claim 1, characterized in that: A fourth motor (15) is fixedly connected to the inner wall of one end of the second slide table (12), and an output end of the fourth motor (15) is fixedly connected to one end of the second bidirectional screw rod (16).

7. The semiconductor testing platform with a limiting function according to claim 1, characterized in that: A first buffer pad (18) is fixedly connected to one side of the first clamping plate (17).

8. The semiconductor testing platform with a limiting function according to claim 1, characterized in that: A second buffer pad (20) is fixedly connected to one side of the second clamping plate (19).

Images