Signal generation card for function test of board to be tested

Abstract

The utility model discloses a signal generation card for a function test of a board to be tested, which comprises two groups of waveform generation modules, a group of digital-to-analog conversion modules and two groups of filtering operational amplifier systems, and the input end of each group of waveform generation module is controlled by SPI communication. The output end of each waveform generation module is connected with the input end of a filtering operational amplifier system, and the output end of the filtering operational amplifier system is connected with a detection output end. The output end of the digital-to-analog conversion module is respectively connected with the output end of each group of filtering operational amplifier system; according to the utility model, the I2C and SPI communication protocols are adopted, the flexible communication and switching of the low-frequency and radio-frequency modules are realized, the requirements of generating low-frequency and radio-frequency signals are met, the frequency range is wide, the stability is high, the communication protocol bus performance is strong, the density is high, and the signal synthesis and processing efficiency is improved, so that the design is greatly simplified, the equipment volume is small, and the cost is low. Layout is centralized, unified control is achieved, and resources are saved.

Description

Technical Field

[0001] The utility model relates to the technical field related to automated testing, in particular to a signal generating card for functional testing of a board to be tested. Background Art

[0002] In the field of automated testing, it is necessary to provide a stable wide-frequency signal source to perform functional tests on DUTs such as server motherboards and large switches. In view of the differences in functions and characteristics of different DUTs, it is necessary to provide signals of different frequencies to test the DUTs. Therefore, the signal source must have the ability to provide wide-frequency signals. Existing technologies provide a single low-frequency or high-frequency signal source according to the needs of the board to be tested, or independently provide low-frequency or radio-frequency signal sources. The low-frequency and radio-frequency signal sources are not integrated on the board. The control is relatively independent, more consideration is required in communication, the layout is discrete, and a lot of resources are wasted. Therefore, it is urgent to propose a wide-frequency signal generation card to solve the above problems. Utility Model Content

[0003] In order to solve the defects of the prior art that the low frequency and radio frequency signal sources are not integrated on the board, the control is relatively independent, more consideration is needed in communication, the layout is discrete, and a large amount of resources is wasted, the utility model provides a signal generating card for functional testing of the board to be tested.

[0004] In order to solve the above technical problems, the utility model provides the following technical solutions:

[0005] The utility model discloses a signal generation card for function test of a board to be tested, comprising two groups of waveform generation modules, one group of digital-to-analog conversion modules and two groups of filtering operational amplifier systems. The input end of each group of the waveform generation modules is controlled by SPI communication, and the output end of each group of the waveform generation modules is connected to the input end of one group of filtering operational amplifier systems, and the output end of the filtering operational amplifier systems is connected to a detection output end; the input end of the digital-to-analog conversion module is controlled by I2C communication, and the output end of the digital-to-analog conversion module is respectively connected to the output end of each group of filtering operational amplifier systems.

[0006] As a preferred technical solution of the utility model, the filtering operational amplifier system includes a first filtering operational amplifier module, a second filtering operational amplifier module and a third filtering operational amplifier module. The output ends of the first filtering operational amplifier module and the second filtering operational amplifier module are connected to the input end of the third filtering operational amplifier module, and the output end of the third filtering operational amplifier module is connected to the detection output end; the input end of the first filtering operational amplifier module is connected to a group of waveform generation modules; the input end of the second filtering operational amplifier module is connected to the output end of the digital-to-analog conversion module.

[0007] As a preferred technical solution of the utility model, the models of the first filter operational amplifier module and the third filter operational amplifier module are both AD8066ARZ, and the model of the second filter operational amplifier module is both ADA4522-2ARZ.

[0008] As a preferred technical solution of the utility model, it also includes a radio frequency synthesis module, a clock module, an IO expansion module, two groups of buffer modules, two groups of attenuator modules and two groups of RF80 radio frequency modules;

[0009] The input ports SDI and SCK of the RF synthesis module are respectively connected to the MOSI and SCLK signals of SPI communication, the input ports SDA and SCL of the clock module are respectively connected to the SDA and SCL signals of I2C communication, the output ports OUTP and UOTN of the clock module are respectively connected to the OSCINP and OSCINM ports of the RF synthesis module, the SDA and SCL input ports of the IO expansion module are respectively connected to the SDA and SCL signals of I2C communication, the I / O1.0 port of the IO expansion module is connected to the 1OE port of the buffer module, the I / O1.1 port is connected to the 2OE port of the buffer module, the I / O0.0 port of the buffer module is connected to the 1OE port of another group of attenuator modules, the output end of the RF synthesis module is connected to the input ends of the two groups of attenuator modules, and the output port RFOUT of the attenuator module is respectively connected to the No. 1 port of the two groups of RF80 RF modules.

[0010] As a preferred technical solution of the utility model, the clock module is a clock oscillator circuit, model LMK61E2-SIAR, and the radio frequency synthesis module is model LMX2592.

[0011] As a preferred technical solution of the present utility model, the buffer module is of model SN74SN74AHCT244.

[0012] As a preferred technical solution of the present utility model, the I / O expansion module is a CAT9555 model, and the attenuator module is a MAAD-011021 model.

[0013] The beneficial effects of the utility model are:

[0014] This signal generation card for functional testing of the board under test adopts I2C and SPI communication protocols, realizes flexible communication and switching between low-frequency and RF modules, meets the needs of generating low-frequency and RF signals, has a wide frequency range and high stability, and has strong performance and high density of the communication protocol bus, which improves the efficiency of signal synthesis and processing, thereby greatly simplifying the design, making the equipment small in size, centralized in layout, unified in control, and saving resources. BRIEF DESCRIPTION OF THE DRAWINGS

[0015] The accompanying drawings are used to provide a further understanding of the present invention and constitute a part of the specification. Together with the embodiments of the present invention, they are used to explain the present invention and do not constitute a limitation of the present invention. In the accompanying drawings:

[0016] Figure 1 It is a structural schematic diagram of a signal generating card for functional testing of a board to be tested according to the utility model;

[0017] Figure 2 This is a schematic diagram of a low-frequency signal circuit of a signal generating card for functional testing of a board to be tested according to the utility model;

[0018] Figure 3 It is a schematic diagram of a radio frequency signal circuit of a signal generating card for functional testing of a board to be tested according to the utility model;

[0019] Figure 4 The utility model discloses a test connection schematic diagram of a signal generating card for functional testing of a board to be tested.

[0020] In the figure: 1. waveform generation module; 2. digital-to-analog conversion module; 3. filter amplifier system; 301. first filter amplifier module; 302. second filter amplifier module; 303. third filter amplifier module; 4. RF synthesis module; 5. clock module; 6. IO expansion module; 7. buffer module; 8. attenuator module; 9. RF80 RF module. DETAILED DESCRIPTION

[0021] The preferred embodiments of the present invention are described below in conjunction with the accompanying drawings. It should be understood that the preferred embodiments described herein are only used to illustrate and explain the present invention, and are not used to limit the present invention.

[0022] Example: Figure 1 , Figure 2 , Figure 3 and Figure 4As shown, the utility model is a signal generation card for testing the function of a board to be tested, including two groups of waveform generation modules 1, one group of digital-to-analog conversion modules 2 and two groups of filter amplifier systems 3. The input end of each group of waveform generation modules 1 is controlled by SPI communication, and the output end of each group of waveform generation modules 1 is connected to the input end of a group of filter amplifier systems 3, and the output end of the filter amplifier system 3 is connected to the detection output end; the input end of the digital-to-analog conversion module 2 is controlled by I2C communication, and the output end of the digital-to-analog conversion module 2 is respectively connected to the output end of each group of filter amplifier systems 3. The filter amplifier system 3 includes a first filter amplifier module 301, a second filter amplifier module 302 and a third filter amplifier module 303. The filter amplifier system 3 includes a first filter amplifier module 301, a second filter amplifier module 302 and a third filter amplifier module 303, the output ends of the first filter amplifier module 301 and the second filter amplifier module 302 are connected to the input end of the third filter amplifier module 303, and the output end of the third filter amplifier module 303 is connected to the detection output end; the input end of the first filter amplifier module 301 is connected to a group of waveform generation modules 1; the input end of the second filter amplifier module 302 is connected to the output end of the digital-to-analog conversion module 2. The utility model adopts I2C and SPI communication protocols, realizes flexible communication and switching of low-frequency and radio frequency modules, meets the needs of generating low-frequency and radio frequency signals, has a wide frequency range and high stability, and has strong performance and high density of the communication protocol bus, which improves the efficiency of signal synthesis and processing, thereby greatly simplifying the design, making the device small in size, centralized in layout, unified in control, and saving resources.

[0023] Specifically, the SCLK, SDATA and FSYNC ports of the waveform generation module 1 are connected to the SCLK, MOSI and CS_CH1 signals of the SPI communication respectively, the output port of the first group of waveform generation modules 1 is connected to the negative input terminal of the first filter amplifier module 301, the reference voltage is connected to the positive input terminal of the first filter amplifier module 301, and the output terminal of the first filter amplifier module 301 is connected to the negative input terminal of the third filter amplifier module 303. The models of the first filter amplifier module 301 and the third filter amplifier module 303 are both AD8066ARZ, and the model of the second filter amplifier module 302 is ADA4522-2AR. The SCL and SDA ports of the digital-to-analog conversion module 2 are connected to the I2C communication port, the VREF port is connected to the positive input terminal of the first filter amplifier module, and the two output ports VoutA and VoutB of the digital-to-analog conversion module 2 are respectively connected to the positive input terminals of the second filter amplifier module 302 in the two groups of filter amplifier systems 3.

[0024] In this embodiment, based on the above, the output terminal of the second filtering operational amplifier module 302 is connected to the positive input terminal of the third filtering operational amplifier module 303 .

[0025] It also includes a radio frequency synthesis module 4, a clock module 5, an IO expansion module 6, two groups of buffer modules 7, two groups of attenuator modules 8 and two groups of RF80 radio frequency modules 9; the clock module 5 is a clock oscillator circuit, model LMK61E2-SIAR, the radio frequency synthesis module 4 is model LMX2592, the buffer module 7 is model SN74SN74AHCT244, the I / O expansion module 6 is model CAT9555, and the attenuator module 8 is model MAAD-011021.

[0026] The input ports SDI and SCK of the RF synthesis module 4 are respectively connected to the MOSI and SCLK signals of the SPI communication, the input ports SDA and SCL of the clock module 5 are respectively connected to the SDA and SCL signals of the I2C communication, the output ports OUTP and UOTN of the clock module 5 are respectively connected to the OSCINP and OSCINM ports of the RF synthesis module 4, and the SDA and SCL input ports of the IO expansion module 6 are respectively connected to the SDA and SCL signals of the I2C communication.

[0027] The specific circuit connection is as follows: the I / O1.0 port of the IO expansion module 6 is connected to the 1OE port of the buffer module 7, the I / O1.1 port is connected to the 2OE port of the buffer module 7, the I / O0.0 port of the buffer module 7 is connected to the 1OE port of another group of attenuator modules 8, the input ports SDA and SCL of the clock module are respectively connected to the SDA and SCL signals of the I2C communication, and the output ports OUTP and UOTN of the clock module are respectively connected to the OSCINP and OSCINM ports of the RF synthesis module. The RFOUTAM and RFOUTBM output ports of the RF synthesis module are connected to the RFIN port of the attenuator module, and the output port RFOUT of the attenuator module 8 is respectively connected to the No. 1 port of the two groups of RF80 RF modules 9; the IO expansion module model is CAT9555, which is a port expansion with 400KHZ compatible I2C bus and provides 16-bit parallel input or output. Any one of the 16 I / O ports can be configured as input and output through the configuration register and has high driving capability.

[0028] Among them, the SDA and SCL input ports of the IO expansion module are respectively connected to the SDA and SCL signals of the I2C communication, the I / O1.0 port is connected to the 1OE port of the buffer module, the I / O1.1 port is connected to the 2OE port of the buffer module, and the I / O1.2, I / O1.3, I / O1.4, I / O1.5, I / O1.6, and I / O1.7 ports are respectively connected to the 1A1, 1A2, 1A3, 1A4, 2A1, 2A2, 2A3, and 2A4 ports of the buffer module.

[0029] The I / O0.0 port is connected to the 1OE port of another buffer module, the I / O0.1 port is connected to the 2OE port of the buffer module, and the I / O0.2, I / O0.3, I / O0.4, I / O0.5, I / O0.6, and I / O0.7 ports are respectively connected to the 1A1, 1A2, 1A3, 1A4, 2A1, 2A2, 2A3, and 2A4 ports of the buffer module. The attenuator module model is MAAD-011021, and its two output ports RFOUT are respectively connected to the No. 1 port of two groups of RF80 radio frequency modules.

[0030] Finally, it should be noted that the above description is only a preferred embodiment of the utility model and is not intended to limit the utility model. Although the utility model is described in detail with reference to the above embodiments, those skilled in the art can still modify the technical solutions recorded in the above embodiments or replace some of the technical features therein by equivalents. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the utility model shall be included in the protection scope of the utility model.

Claims

1. A signal generating card for functional testing of a board under test, characterized in that: The invention comprises two groups of waveform generation modules (1), one group of digital-to-analog conversion modules (2) and two groups of filter amplifier systems (3); the input end of each group of waveform generation modules (1) is controlled by SPI communication, and the output end of each group of waveform generation modules (1) is connected to the input end of one group of filter amplifier systems (3); the output end of the filter amplifier system (3) is connected to the detection output end; the input end of the digital-to-analog conversion module (2) is controlled by I2C communication, and the output end of the digital-to-analog conversion module (2) is respectively connected to the output end of each group of filter amplifier systems (3).

2. A signal generating card for functional testing of a board under test according to claim 1, characterized in that: The filter amplifier system (3) comprises a first filter amplifier module (301), a second filter amplifier module (302) and a third filter amplifier module (303); the output ends of the first filter amplifier module (301) and the second filter amplifier module (302) are connected to the input end of the third filter amplifier module (303), and the output end of the third filter amplifier module (303) is connected to the detection output end; the input end of the first filter amplifier module (301) is connected to a group of waveform generation modules (1); and the input end of the second filter amplifier module (302) is connected to the output end of the digital-to-analog conversion module (2).

3. A signal generating card for functional testing of a board under test according to claim 2, characterized in that: The models of the first filtering operational amplifier module (301) and the third filtering operational amplifier module (303) are both AD8066ARZ, and the model of the second filtering operational amplifier module (302) is both ADA4522-2ARZ.

4. A signal generating card for functional testing of a board under test according to claim 1, characterized in that: It also includes a radio frequency synthesis module (4), a clock module (5), an IO expansion module (6), two groups of buffer modules (7), two groups of attenuator modules (8) and two groups of RF80 radio frequency modules (9); The input ports SDI and SCK of the radio frequency synthesis module (4) are respectively connected to the MOSI and SCLK signals of the SPI communication, the input ports SDA and SCL of the clock module (5) are respectively connected to the SDA and SCL signals of the I2C communication, the output ports OUTP and UOTN of the clock module (5) are respectively connected to the OSCINP and OSCINM ports of the radio frequency synthesis module (4), the SDA and SCL input ports of the IO expansion module (6) are respectively connected to the SDA and SCL signals of the I2C communication. The I / O1.0 port of the IO expansion module (6) is connected to the 1OE port of the buffer module (7), the I / O1.1 port is connected to the 2OE port of the buffer module (7), the I / O0.0 port of the buffer module (7) is connected to the 1OE port of another group of attenuator modules (8), the output end of the radio frequency synthesis module (4) is connected to the input ends of the two groups of attenuator modules (8), and the output port RFOUT of the attenuator module (8) is respectively connected to the No. 1 port of the two groups of RF80 radio frequency modules (9).

5. A signal generating card for functional testing of a board under test according to claim 4, characterized in that: The clock module (5) is a clock oscillator circuit, model LMK61E2-SIAR, and the radio frequency synthesis module (4) is model LMX2592.

6. A signal generating card for functional testing of a board under test according to claim 4, characterized in that: The buffer module (7) is of model SN74SN74AHCT244.

7. A signal generating card for functional testing of a board under test according to claim 4, characterized in that: The I / O expansion module (6) is a CAT9555 model, and the attenuator module (8) is a MAAD-011021 model.

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