Probe module and detection device

Abstract

The utility model relates to a probe module and a detection device. The probe module comprises a first carrier plate, a second carrier plate, a probe assembly and an elastic assembly. The second carrier plate and the probe assembly are connected with the first carrier plate, and the probe assembly is arranged between the first carrier plate and the second carrier plate; the probe assembly comprises a plurality of probe units, one probe unit comprises a plurality of probes, and the plurality of probes in one probe unit can abut against one detection point of the circuit board to be detected at the same time; when one probe has deviation due to needle insertion, other probes in the probe unit where the probe is located can also electrically abut against the target detection point, so that the problem of inaccurate detection caused by deviation due to needle insertion of one probe in the prior art can be avoided; through the arrangement of the embodiment, the detection precision of the circuit board to be detected can be improved. Besides, the second carrier plate can protect the probe, so that the probe is effectively prevented from being damaged by collision of foreign objects, and the detection precision of the circuit board to be detected can be improved.

Description

Technical Field

[0001] The utility model belongs to the technical field of circuit board production equipment, and in particular relates to a probe module and a detection device. Background Art

[0002] FPC (FPC is the abbreviation of Flexible Printed Circuit Board, and its Chinese name is flexible circuit board) is widely used in electronic devices. The integrity of its internal circuits and the consistency with the required values ​​are crucial. Therefore, testing the corresponding circuits on FPC is an important part of the FPC production process.

[0003] In FPC testing, it is necessary to measure the resistance of the relevant circuit (i.e. the circuit to be tested) on the FPC. During the test, the probe module is used to contact the two test points of the circuit to be tested, and the circuit can be tested through the detector electrically connected to the probe module.

[0004] Among them, in the related art, two-line detection is used for testing the circuit to be tested, that is, the probe module includes two probes. During the detection, one probe contacts a detection point of the circuit to be tested, and the other probe contacts another detection point of the circuit to be tested. This two-line detection method has low detection accuracy and can no longer meet the needs. Utility Model Content

[0005] The utility model provides a probe module and a detection device, aiming to improve the detection accuracy of a circuit to be tested.

[0006] In order to solve the above problems, on the one hand, an embodiment of the utility model provides a probe module, including a first carrier plate, a second carrier plate, a probe assembly and an elastic assembly; the second carrier plate and the probe assembly are both connected to the first carrier plate, and the probe assembly is arranged between the first carrier plate and the second carrier plate; the probe assembly includes a plurality of probe units, one of the probe units includes a plurality of probes, and the plurality of probes in one of the probe units can simultaneously contact a detection point of the circuit board to be tested; a storage area is provided on the surface of the second carrier plate facing away from the first carrier plate, and the storage area is used to place the circuit board to be tested; the storage area is provided with avoidance holes, and the avoidance holes penetrate the first carrier plate and the second carrier plate along the arrangement direction of the first carrier plate. The second carrier plate; the second carrier plate can move relative to the first carrier plate to switch between a first position away from the first carrier plate and a second position close to the first carrier plate; when the second carrier plate is at the first position, the probe does not protrude from the surface of the second carrier plate away from the first carrier plate; when the second carrier plate is at the second position, the probe can collide with the detection point of the circuit board to be tested placed in the storage area at the avoidance hole; the elastic component is arranged between the first carrier plate and the second carrier plate, and when the second carrier plate is close to the first carrier plate, the elastic component can generate elastic deformation, so that the second carrier plate can be reset from the second position to the first position under the elastic force of the elastic component.

[0007] Optionally, the probe assembly also includes a supporting seat, which is connected to the first carrier board; the probe includes a connecting portion and a suspended portion, the connecting portion is connected to the supporting seat, the suspended portion is suspended and is used to contact the detection point of the circuit board to be tested; along the direction from the first carrier board to the second carrier board, the suspended portion gradually approaches the second carrier board; the suspended portion is elastic, so that the suspended portion can produce elastic deformation when subjected to pressure along the direction from the first carrier board to the second carrier board.

[0008] Optionally, the probe further includes a contact portion having a first end close to the first carrier board and a second end away from the first carrier board, the first end being connected to an end of the suspended portion facing away from the connecting portion, and the second end being used to contact with a detection point of the circuit board to be tested.

[0009] Optionally, a receiving hole is provided on the surface of the support seat close to the second carrier plate; a mounting hole is provided on the inner side surface of the receiving hole, and the mounting hole passes through the outer surface of the support seat; the connecting part is installed in the mounting hole; the suspended part is located in the receiving hole, and along the direction from the first carrier plate to the second carrier plate, one end of the suspended part facing away from the connecting part protrudes out of the support seat.

[0010] Optionally, the probe assembly further includes an adapter plate, which is used to electrically connect to the detector; the adapter plate is connected to a surface of the support base facing away from the second carrier plate, and one end of the connecting portion facing away from the suspended portion is electrically connected to the adapter plate.

[0011] Optionally, the probe assembly also includes a support seat and an adapter plate, the probe is mounted on the support seat, and the support seat is mounted on the adapter plate; the adapter plate is electrically connected to the probe and is used to electrically connect to the detector; a limiting structure is provided on the first carrier plate, and the limiting structure cooperates with the adapter plate to limit the relative position of the first carrier plate and the adapter plate.

[0012] Optionally, the probe assembly further includes an adapter, which is mounted on the adapter board and electrically connected to the probe via a circuit on the adapter board; the adapter is located on the outside of the first carrier board and on the outside of the second carrier board.

[0013] Optionally, the probe module also includes multiple connecting parts, which include connecting structures and resisting structures connected in sequence; the second carrier is provided with multiple connecting holes, and the connecting holes pass through the second carrier along the arrangement direction of the first carrier and the second carrier; one connecting hole corresponds to one connecting part; the connecting structure is passed through the corresponding connecting hole and is connected to the first carrier; when the second carrier moves from the first position to the second position, the resisting structure can resist the second carrier; wherein, when the resisting structure resists the second carrier, the second carrier is located at the second position.

[0014] Optionally, the storage area is provided with a positioning structure, which is used to limit the placement position of the connector of the circuit board to be tested in the storage area; the detection point of the circuit board to be tested is located on the connector of the circuit board to be tested; and / or the probe module also includes a guide component, which connects the first carrier board and the second carrier board and is used to guide the movement of the second carrier board relative to the first carrier board.

[0015] In order to solve the above problems, on the other hand, an embodiment of the present invention provides a detection device, including any one of the probe modules described above.

[0016] In the probe module and detection device provided in the embodiment of the utility model, multiple probes (i.e., a probe unit) can contact with a detection point at the same time. In this way, when a probe deviates due to needle insertion, other probes in the probe unit where the probe is located can also electrically contact with the target detection point, thereby avoiding the problem of inaccurate detection caused by the deviation of one probe in the prior art. That is, the configuration of this embodiment can improve the detection accuracy of the circuit board to be tested.

[0017] In addition, when not working, the second carrier plate can be in the first position under the action of the probe assembly, so that the probe does not protrude from the second carrier plate away from the surface of the first carrier plate. In this way, the second carrier plate can protect the probe and effectively prevent the probe from being damaged by collision with foreign objects, which can also improve the detection accuracy of the circuit board to be tested. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] Figure 1 It is a structural schematic diagram of a probe module provided by an embodiment of the utility model;

[0019] Figure 2 is an exploded view of a probe module provided by an embodiment of the utility model;

[0020] Figure 3 It is a structural schematic diagram of a probe module probe assembly provided by an embodiment of the utility model;

[0021] Figure 4 yes Figure 3 Magnified view of the area within the middle dashed circle.

[0022] The reference numerals in the specification are as follows:

[0023] 100. Probe module;

[0024] 1. first carrier plate; 11. limiting structure; 12. first side surface; 13. second side surface; 14. limiting protrusion;

[0025] 2. second carrier plate; 21. avoidance hole; 22. first plate surface; 23. second plate surface;

[0026] 3. Probe assembly; 31. Probe; 311. Suspended portion; 312. Interference portion; 32. Support seat; 321. Accommodating hole; 33. Adapter plate; 331. Limiting notch; 34. Adapter;

[0027] 4. Elastic component; 41. Elastic column;

[0028] 5. Connecting piece; 51. Connecting structure; 52. Resisting structure;

[0029] 6. Guide assembly; 61. Guide column; 62. Linear bearing. DETAILED DESCRIPTION

[0030] In order to make the technical problems, technical solutions and beneficial effects solved by the utility model more clear, the utility model is further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the utility model and are not used to limit the utility model.

[0031] like Figures 1 to 3 As shown, in one embodiment, the probe module 100 includes a first carrier board 1, a second carrier board 2, a probe assembly 3 and an elastic assembly 4; the second carrier board 2 and the probe assembly 3 are both connected to the first carrier board 1, and the probe assembly 3 is arranged between the first carrier board 1 and the second carrier board 2; the probe assembly 3 includes a plurality of probe units, and one probe unit includes a plurality of probes 31, and the plurality of probes 31 in one probe unit can simultaneously contact one detection point of the circuit board to be tested. Among them, "plurality" means greater than or equal to two, and "plurality" has the same meaning in each embodiment, which will not be repeated in the following text.

[0032] A storage area is provided on the surface of the second carrier board 2 facing away from the first carrier board 1, and the storage area is used to place the circuit board to be tested; an avoidance hole 21 is provided in the storage area, and the avoidance hole 21 penetrates the second carrier board 2 along the arrangement direction of the first carrier board 1 and the second carrier board 2; along the arrangement direction of the first carrier board 1 and the second carrier board 2, the carrier board has a first board surface 22 and a second board surface 23 arranged opposite to each other, the first board surface 22 is the surface of the second carrier board 2 close to the first carrier board 1, the second board surface 23 is the surface of the second carrier board 2 facing away from the first carrier board 1, the storage area is a part of the second board surface 23, and the avoidance hole 21 penetrates from the first board surface 22 to the second board surface 23.

[0033] The second carrier board 2 can move relative to the first carrier board 1 to switch between a first position away from the first carrier board 1 and a second position close to the first carrier board 1. When the second carrier board 2 is at the first position, the probe 31 does not protrude from the surface of the second carrier board 2 away from the first carrier board 1; when the second carrier board 2 is at the second position, the probe 31 can collide with the detection point of the circuit board to be tested placed in the storage area at the avoidance hole 21.

[0034] The elastic component 4 is arranged between the first carrier plate 1 and the second carrier plate 2, and is used to support the second carrier plate 2. When the second carrier plate 2 is close to the first carrier plate 1, the elastic component 4 can produce elastic deformation, so that the second carrier plate 2 can be reset from the second position to the first position under the elastic force of the elastic component 4.

[0035] In this embodiment, multiple probes 31 (i.e., a probe unit) can contact one detection point at the same time, so that when a probe 31 deviates due to needle insertion, other probes in the probe unit where the probe 31 is located can also electrically contact the target detection point, which can avoid the problem of inaccurate detection caused by the deviation of one probe 31 in the prior art. That is, the setting of this embodiment can improve the detection accuracy of the circuit board to be tested.

[0036] In addition, when not in operation, the second carrier plate 2 can be in the first position under the action of the elastic component 4, so that the probe 31 does not protrude from the surface of the second carrier plate 2 away from the first carrier plate 1, so that the second carrier plate 2 can protect the probe 31 and effectively prevent the probe 31 from being damaged by collision with foreign objects, which can also improve the detection accuracy of the circuit board to be tested.

[0037] In this embodiment, when working, the circuit board to be tested is placed in the storage area, and then a pressure is applied to the second carrier board 2 toward the first carrier board 1, so that the second carrier board 2 drives the circuit board to be tested to move toward the first carrier board 1. When the second carrier board 2 moves to the second position, the probe 31 can electrically contact the detection point of the circuit board to be tested. At this time, the detector electrically connected to the probe 31 can detect the circuit board to be tested.

[0038] It should be noted that when the second carrier board is at the first position, the probe 31 does not protrude from the second board surface, which means that the probe 31 does not protrude from the second board surface 23 along the direction from the first board surface 22 to the second board surface 23 .

[0039] In an actual use scenario, the first carrier plate 1 is located below the second carrier plate 2, and the second position is located below the first position. When the second carrier plate 2 moves downward, it can approach the first carrier plate 1.

[0040] In addition, the circuit to be tested on the circuit board to be tested usually includes two detection points. During detection, the probes 31 of the two detection units need to respectively contact the two detection points to detect the circuit to be tested. Among them, two probe units used to detect the same circuit to be tested are defined as a probe module. When working, one probe module can detect one circuit to be tested. A probe module 100 can have multiple probe modules. When working, each probe module can contact two detection points of a circuit to be tested, so that the detector can detect multiple circuits to be tested at the same time, thereby improving the detection efficiency of the circuit board to be tested.

[0041] In one embodiment, one probe unit includes two probes 31 , so that one circuit to be tested can be tested by four probes 31 .

[0042] In one embodiment, when the second carrier board 2 is in the first position, a portion of the probe 31 may be located in the avoidance hole 21; or, when the second carrier board 2 is in the first position, the probe 31 may be located between the first carrier board 1 and the second carrier board 2, and the probe 31 does not extend into the avoidance hole 21. When the second carrier board 2 is in the second position, the probe 31 extends into the avoidance hole 21, and at this time, the probe 31 may not protrude from the second board surface 23. At this time, the detection point of the circuit to be tested is located in the avoidance hole 21, and the detection point of the circuit board to be tested and the probe 31 collide in the avoidance hole 21.

[0043] like Figure 3 As shown, in one embodiment, the probe assembly 3 further includes a support seat 32, which is connected to the first carrier 1; the probe 31 includes a connecting portion and a suspended portion 311, which is connected to the suspended portion 311, and the connecting portion is connected to the support seat 32, and the suspended portion 311 is suspended and used to contact the detection point of the circuit board to be tested; along the direction from the first carrier 1 to the second carrier 2, the suspended portion 311 gradually approaches the second carrier 2; the suspended portion 311 is elastic, so that the suspended portion 311 can produce elastic deformation when subjected to pressure along the direction from the first carrier 1 to the second carrier 2. This arrangement can increase the service life of the probe 31.

[0044] It should be understood that the probes 31 of each probe unit are connected to the support base 32 .

[0045] like Figure 4 As shown, the probe 31 also includes a contact portion 312, the contact portion 312 has a first end close to the first carrier 1 and a second end away from the first carrier 1, the first end is connected to an end of the suspended portion 311 away from the connecting portion, and the second end is used to contact with the detection point of the circuit board to be tested. The contact portion 312 is also suspended, and the circuit board to be tested is pressed on the second end of the contact portion 312 during operation, so that the suspended portion 311 can be deformed. In addition, the contact portion 312 is usually arranged vertically, in which case the first end is the lower end of the contact portion 312, and the second end is the upper end of the contact portion 312.

[0046] like Figure 3 As shown, in one embodiment, a receiving hole 321 is provided on the surface of the support seat 32 close to the second carrier board 2; a mounting hole is provided on the inner side of the receiving hole 321, and the mounting hole penetrates to the outer surface of the support seat 32; the connecting portion is installed in the mounting hole; the suspended portion 311 is located in the receiving hole 321, and along the direction from the first carrier board 1 to the second carrier board 2, one end of the suspended portion 311 away from the connecting portion protrudes from the support seat 32. When the circuit board to be tested is tested, the end of the suspended portion 311 away from the connecting portion conflicts with the testing point of the circuit board to be tested.

[0047] The receiving hole 321 may be a rectangular hole, and the two probe units in one probe module may be respectively arranged on both sides of the receiving hole 321 in the width direction. A plurality of probe modules 100 may be arranged in sequence and spaced along the length direction of the receiving hole 321. The length direction of the receiving hole 321 is perpendicular to the width direction of the receiving hole 321, and both the length direction of the receiving hole 321 and the width direction of the receiving hole 321 are perpendicular to the arrangement direction of the first carrier 1 and the second carrier 2. The mounting hole may be a side wall of the receiving hole 321 that passes through the receiving hole 321 in the width direction of the receiving hole 321.

[0048] In addition, one probe 31 may be matched with one mounting hole, or each probe 31 in one probe unit may be mounted in one mounting hole. The protruding support seat 32 at one end of the suspended portion 311 away from the connecting portion may mean that, along the direction from the first carrier 1 to the second carrier 2, the protruding support seat 32 at one end of the suspended portion 311 away from the connecting portion is close to the surface of the second carrier 2.

[0049] like Figure 3 As shown, in one embodiment, the probe assembly 3 further includes an adapter plate 33; the adapter plate 33 is connected to the surface of the support seat 32 away from the second carrier plate 2, and one end of the connection portion away from the suspended portion 311 is electrically connected to the adapter plate 33. The adapter plate 33 is a circuit board, such as a PCB. Subsequently, the adapter plate 33 is electrically connected to the detector, wherein the detector is electrically connected to each probe 31 through the adapter plate 33.

[0050] In one embodiment, the probe assembly 3 may include a support seat 32 and an adapter plate 33 at the same time, the probe 31 is mounted on the support seat 32 and electrically connected to the adapter plate 33, and the support seat 32 is mounted on the adapter plate 33; wherein the connecting portion (the end of the connecting portion facing away from the suspended portion 311) may extend from the mounting hole of the support seat 32, and then be electrically connected to the corresponding circuit on the adapter plate 33 through a conductive wire.

[0051] like Figure 2 As described above, in one embodiment, a limiting structure 11 is provided on the first carrier plate 1 , and the limiting structure 11 cooperates with the adapter plate 33 to limit the relative position of the first carrier plate 1 and the adapter plate 33 , thereby facilitating the installation of the probe assembly 3 on the first carrier plate 1 .

[0052] like Figure 2 As described above, a limiting groove is provided on the surface of the first carrier plate 1 close to the second carrier plate 2, and the adapter plate 33 is installed in the limiting groove. The adapter plate 33 can be limited by the groove wall of the limiting groove.

[0053] The bottom surface of the limit groove contacts the adapter plate 33, and the adapter plate 33 can be limited in the vertical direction; the groove wall of the limit groove can limit the adapter plate 33 in the horizontal direction. In the width direction and the length direction of the receiving hole 321, the groove wall of the limit groove can contact the adapter plate 33.

[0054] like Figure 2 As shown, in one embodiment, the limiting groove passes through the first side surface 12 of the first carrier plate 1 along the first direction, and passes through the second side surface 13 of the first carrier plate 1 along the second direction, wherein the first direction is parallel to the width direction of the accommodating hole 321; the second direction is parallel to the length direction of the accommodating hole 321, and a limiting protrusion 14 is formed between the limiting groove and the first side surface 12.

[0055] A limiting notch 331 is provided on the adapter plate 33. When the adapter plate 33 is placed in the limiting groove, the limiting protrusion 14 is engaged in the limiting notch 331. The cooperation of the two can limit the adapter plate 33 in the first direction.

[0056] In addition, the adapter plate 33 can extend out of the limiting groove from the first side surface 12 so as to be connected with the detector. In addition, the adapter plate can also be connected with the first carrier plate by bolts or the like.

[0057] like Figure 3 As shown, in one embodiment, the probe assembly 3 further includes an adapter 34, which is mounted on the adapter plate 33 and electrically connected to the probe 31 through the circuit on the adapter plate 33; the adapter 34 is located outside the first carrier plate 1 and outside the second carrier plate 2. The adapter 34 can be a connector, which is used to integrate the circuits on the adapter plate 33 for connecting with the detector. Subsequently, the detector is electrically connected to each probe 31 through the adapter 34 and the adapter plate 33. In addition, the adapter 34 can be a cow horn adapter, etc.

[0058] The adapter 34 may be mounted on the portion of the adapter plate 33 extending from the first side surface 12 .

[0059] The adapter 34 being located at the outer side of the first carrier plate 1 may mean that the adapter 34 and the first carrier plate 1 do not overlap in the vertical direction (i.e., the arrangement direction of the first carrier plate 1 and the second carrier plate 2); the adapter 34 being located at the outer side of the second carrier plate 2 may mean that the adapter 34 and the second carrier plate 2 do not overlap in the vertical direction (i.e., the arrangement direction of the first carrier plate 1 and the second carrier plate 2).

[0060] like Figure 2As shown, in one embodiment, the elastic component 4 includes a plurality of elastic columns 41, each of which is mounted on the first support plate, wherein in the direction from the first carrier plate 1 to the second carrier plate 2, each of the elastic columns 41 protrudes from the surface of the first carrier plate 1 close to the second carrier plate 2, and at the same time, each of the elastic columns 41 is in contact with the second carrier plate 2, and the second carrier plate can be supported by the elastic columns 41 to keep it in the first position.

[0061] In addition, a plurality of matching holes are provided on the first carrier plate 1 , and one elastic column 41 is installed in one matching hole. The elastic column 41 and the matching hole may be in interference fit.

[0062] In other embodiments, the elastic component 4 may also include a spring, which is arranged between the first carrier plate 1 and the second carrier plate 2. The second carrier plate 2 is supported by the spring to maintain it in the first position. When the second carrier plate 2 moves to the second position, the spring can be compressed.

[0063] like Figure 2 As shown, in one embodiment, the probe module 100 also includes a plurality of connecting members 5, and the connecting members 5 include a connecting structure 51 and a resisting structure 52 connected in sequence; a plurality of connecting holes are provided on the second carrier 2, and the connecting holes penetrate the second carrier 2 along the arrangement direction of the first carrier 1 and the second carrier 2; one connecting hole corresponds to one connecting member 5; the connecting structure 51 is passed through the corresponding connecting hole and is connected to the first carrier 1; when the second carrier 2 moves from the second position to the first position, the resisting structure 52 can contact the second carrier 2, so as to avoid the second carrier 2, the connecting member 5 and the first carrier 1 from being out of coordination; wherein, when the resisting structure 52 contacts the second carrier 2, the second carrier 2 is located at the first position.

[0064] The connecting member 5 may be a copper sleeve, the connecting structure 51 may be a cylindrical structure, the retaining structure 52 may be a flange on the side wall of the cylindrical structure, and the connecting structure 51 and the connecting hole may be clearance-fitted.

[0065] In addition, a plurality of assembly holes are provided on the surface of the first carrier plate 1 close to the second carrier plate 2 , one assembly hole corresponds to one connector 5 , and the connection structure 51 and the corresponding assembly hole are interference fit to achieve the connection between the connector 5 and the first carrier plate 1 .

[0066] In addition, when the second carrier plate 2 moves close to the first carrier plate 1 and contacts the first carrier plate 1 , the second carrier plate 2 is located at the second position.

[0067] In one embodiment, the storage area is provided with a positioning structure, which is used to limit the placement position of the connector of the circuit board to be tested in the storage area; the detection point of the circuit board to be tested is located on the connector of the circuit board to be tested. The positioning structure can be the avoidance hole 21, or the positioning structure is only a part of the avoidance hole 21.

[0068] like Figure 2 As shown, in one embodiment, the probe module 100 further includes a guide assembly 6 , which connects the first carrier plate 1 and the second carrier plate 2 and is used to guide the movement of the second carrier plate 2 relative to the first carrier plate 1 .

[0069] Among them, the guide assembly 6 includes multiple guide columns 61 and multiple linear bearings 62, one guide column 61 cooperates with a linear axis, each guide column 61 is installed on the second carrier plate 2, and each linear bearing 62 is installed on the first carrier plate 1. Through the cooperation of the guide columns 61 and the linear bearings 62, the movement of the second carrier plate 2 approaching or moving away from the first carrier plate 1 can be guided.

[0070] The embodiment of the utility model further provides a detection device, which includes the probe module 100 described in any one of the above embodiments. The detection device further includes a detector, which is electrically connected to the probe 31 of the probe module 100.

[0071] The technical features of the above-described embodiments may be arbitrarily combined. To make the description concise, not all possible combinations of the technical features in the above-described embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0072] The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention. Any modifications, equivalent substitutions and improvements made within the spirit and principles of the present invention should be included in the protection scope of the present invention.

Claims

1. A probe module, characterized in that: It includes a first carrier plate, a second carrier plate, a probe assembly and an elastic assembly; The second carrier plate and the probe assembly are both connected to the first carrier plate, and the probe assembly is arranged between the first carrier plate and the second carrier plate; The probe assembly includes a plurality of probe units, one of the probe units includes a plurality of probes, and the plurality of probes in one of the probe units can simultaneously contact a detection point on the circuit board to be tested; A storage area is provided on a surface of the second carrier board facing away from the first carrier board, and the storage area is used to place the circuit board to be tested; The storage area is provided with an avoidance hole, and along the arrangement direction of the first carrier plate and the second carrier plate, the avoidance hole penetrates the second carrier plate; The second carrier plate is capable of moving relative to the first carrier plate to switch between a first position away from the first carrier plate and a second position close to the first carrier plate; When the second carrier is located at the first position, the probe does not protrude from the surface of the second carrier away from the first carrier; When the second carrier is located at the second position, the probe can collide with a detection point of the circuit board to be tested placed in the storage area at the avoidance hole; The elastic component is arranged between the first carrier plate and the second carrier plate. When the second carrier plate is close to the first carrier plate, the elastic component can generate elastic deformation, so that the second carrier plate can be reset from the second position to the first position under the elastic force of the elastic component.

2. The probe module according to claim 1, characterized in that: The probe assembly further comprises a support base, and the support base is connected to the first carrier plate; The probe comprises a connecting portion and a suspended portion, wherein the connecting portion is connected to the supporting seat, and the suspended portion is suspended and used to contact a detection point of the circuit board to be tested; Along the direction from the first carrier plate to the second carrier plate, the suspended portion gradually approaches the second carrier plate; The suspended portion has elasticity, so that the suspended portion can generate elastic deformation when subjected to pressure in a direction from the first carrier plate to the second carrier plate.

3. The probe module according to claim 2, characterized in that: The probe also includes a contact portion, which has a first end close to the first carrier and a second end away from the first carrier, the first end is connected to an end of the suspended portion away from the connecting portion, and the second end is used to contact the detection point of the circuit board to be tested.

4. The probe module according to claim 2, characterized in that: The support base is provided with a receiving hole on the surface close to the second carrier plate; The inner side surface of the receiving hole is provided with a mounting hole, and the mounting hole penetrates to the outer surface of the supporting seat; The connecting portion is installed in the mounting hole; The suspended portion is located in the accommodating hole, and along the direction from the first carrier plate to the second carrier plate, one end of the suspended portion away from the connecting portion protrudes out of the supporting seat.

5. The probe module according to claim 4, characterized in that: The probe assembly also includes an adapter plate, and the adapter plate is used to electrically connect the detector; The adapter plate is connected to a surface of the support base facing away from the second carrier plate, and one end of the connecting portion facing away from the suspended portion is electrically connected to the adapter plate.

6. The probe module according to claim 1, characterized in that: The probe assembly further comprises a support seat and an adapter plate, the probe is mounted on the support seat, and the support seat is mounted on the adapter plate; The adapter plate is electrically connected to the probe and is used to electrically connect to the detector; The first carrier plate is provided with a limiting structure, and the limiting structure cooperates with the adapter plate to limit the relative position of the first carrier plate and the adapter plate.

7. The probe module according to claim 6, characterized in that: The probe assembly also includes an adapter, which is mounted on the adapter board and is electrically connected to the probe through a circuit on the adapter board; The adapter is located on the outer side of the first carrier plate and on the outer side of the second carrier plate.

8. The probe module according to claim 1, characterized in that: The probe module further comprises a plurality of connecting members, wherein the connecting members comprise a connecting structure and a resisting structure connected in sequence; The second carrier is provided with a plurality of connection holes, and along the arrangement direction of the first carrier and the second carrier, the connection holes penetrate the second carrier; one connection hole corresponds to one connection member; The connecting structure is inserted into the corresponding connecting hole and connected to the first carrier board; When the second carrier plate moves from the first position to the second position, the retaining structure can abut against the second carrier plate; wherein, when the retaining structure abuts against the second carrier plate, the second carrier plate is located at the second position.

9. The probe module according to claim 1, characterized in that: The storage area is provided with a positioning structure, and the positioning structure is used to limit the placement position of the connector of the circuit board to be tested in the storage area; the detection point of the circuit board to be tested is located on the connector of the circuit board to be tested; and / or, The probe module further includes a guide component, which connects the first carrier plate and the second carrier plate and is used to guide the movement of the second carrier plate relative to the first carrier plate.

10. A detection device, characterized in that: A probe module comprising any one of claims 1 to 9.

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