Testing device
By designing a test device for photovoltaic cells, the line resistance and contact resistance of gate lines can be effectively obtained, and the problems of wasted testing resources and high costs in the prior art are solved, and cost reduction and testing efficiency improvement are achieved.
Patent Information
- Application Number
- CN202421167748.6
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-05-27
- Publication Date
- 2025-02-25
- Estimated Expiration
- 2034-05-27
AI Technical Summary
Existing photovoltaic cell grid line tests have problems of waste of resources and high costs.
A test device is designed, including a plurality of first test components and a second test component, each of which has two test pieces for connection with the gate wire of the cell to be tested. Through the test circuit and the processing circuit, the line resistance of each gate line and the contact resistance between different gate lines are obtained.
Effective testing of photovoltaic cell grid line resistance and contact resistance is achieved, reducing sample, manpower and machine costs.
Smart Images
Figure CN222531664U_ABST
Abstract
Description
Technical Field
[0001] The present application relates to the field of photovoltaic technology, and in particular to a testing device. Background Art
[0002] At present, there are more and more types of photovoltaic cells. The mainstream products include PERC (Passivated Emitter RearCell), TOPCON (Tunnel Oxide Passivated Contact), HJT (Heterojunction with Intrinsic Thin-film), various BC (Back Contact)... These cells require metal grid lines to conduct current, so the testing of battery grid lines is very important.
[0003] However, the current testing of battery grid lines has the problem of wasting testing resources, which increases the testing cost. Utility Model Content
[0004] The embodiment of the present application provides a testing device that can effectively utilize testing resources and reduce testing costs.
[0005] The present application provides a testing device, comprising:
[0006] A plurality of first test assemblies and a plurality of second test assemblies, each test assembly comprising two test pieces, the two test pieces of the first test assembly are respectively used to connect to the same grid line of the battery cell to be tested, and the two test pieces of the second test assembly are respectively used to connect to two grid lines of the battery cell to be tested;
[0007] A test circuit, connected to each test piece, for obtaining a first test parameter of each gate line based on the first test component, and obtaining a second test parameter between different gate lines based on the second test component;
[0008] A processing circuit is connected to the test circuit, and is used to obtain the gate line resistance of the battery cell to be tested based on the first test parameter, and to obtain the contact resistance between the gate line and the battery cell based on the second test parameter.
[0009] In one embodiment, the two test pieces of each of the first test components are respectively connected to the first test position and the second test position of each of the gate lines; the test circuit includes:
[0010] A plurality of first test units, each of which is connected to two test pieces of the first test assembly, and is used to measure the first test parameter between the first test position and the test position of each gate line based on the first test assembly;
[0011] Multiple second test units, each of which is connected to the two test pieces of the second test component respectively, and is used to measure the second test parameters between two target test positions of two different gate lines based on the second test component, and each of the target test positions includes one of the first test position and the second test position.
[0012] In one embodiment, the first test assembly and the second test assembly connected to the same target test position share a test piece, a detection end of the test piece is connected to the target test position, and a transmission end of the test piece is connected to the first test unit and the second test unit respectively; the test circuit further includes:
[0013] A plurality of switch units, wherein a first end of each of the switch units is respectively connected to the first test position, the first test unit, and the second test unit corresponding to a gate line, and a second end of each of the switch units is respectively connected to the first test unit and the second test position corresponding to the same gate line;
[0014] Among them, when the multiple switch units are all in the disconnected state, the multiple first test units are in the test state, and the test circuit obtains multiple first test parameters; when the multiple switch units are all in the on state, the multiple second test units are in the test state, and the test circuit obtains multiple second test parameters.
[0015] In one embodiment, the battery cell to be tested is provided with a first gate line and a plurality of second gate lines, the plurality of second test components share a test piece, the test piece is connected to the first gate line, the plurality of second test units are respectively connected to the first gate line through the test piece of the plurality of second test components, and each of the second test units is connected to a second gate line through another test piece of the second test component.
[0016] In one embodiment, the first gate line and a plurality of the second gate lines are arranged at equal intervals along a first direction; the processing circuit obtains the contact resistance between the gate line and the battery cell according to a fitting straight line based on a linear fitting of a plurality of the second test parameters.
[0017] In one embodiment, the first test parameter and the second test parameter are resistance values, respectively, and the first test unit and the second test unit are resistance measuring instruments, respectively.
[0018] In one embodiment, the first test position and the second test position of the same gate line are spaced apart by a preset distance; the processing circuit obtains the line resistance based on the preset distance of each gate line and the first test parameter, and obtains the gate line resistance of the battery cell to be tested based on multiple line resistances corresponding to multiple gate lines.
[0019] In one embodiment, the preset intervals corresponding to the plurality of gate lines are the same, and the processing circuit obtains the line resistance of the battery cell to be tested based on an average value of a plurality of line resistances corresponding to the plurality of gate lines.
[0020] In one embodiment, the testing device further includes a substrate; the battery cell to be tested is disposed on one side of the substrate and spaced apart from the substrate, the gate line is located on a side of the battery cell to be tested close to the substrate, and each of the test pieces is disposed on the substrate and extends in a direction perpendicular to the substrate to connect with each of the gate lines.
[0021] In one embodiment, the test piece is a metal probe.
[0022] The above-mentioned test device includes multiple first test components and multiple second test components, a test circuit and a processing circuit. Each test component includes two test pieces. The two test pieces of the first test component are respectively used to connect to the same gate line of the battery cell to be tested, and the two test pieces of the second test component are respectively used to connect to two gate lines of the battery cell to be tested. Therefore, the test circuit can obtain the first test parameter of each gate line based on the first test component, and obtain the second test parameter between different gate lines based on the second test component, so that the processing circuit obtains the line resistance of the battery cell to be tested based on the first test parameter, and obtains the contact resistance between the gate line and the battery cell based on the second test parameter. Therefore, the test device can realize the test characterization of the gate line resistance and contact resistance based on the same battery cell to be tested, reducing the sample cost, labor cost and machine cost. BRIEF DESCRIPTION OF THE DRAWINGS
[0023] In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.
[0024] FIG1 is a structural block diagram of a testing device according to an embodiment;
[0025] FIG2 is a second structural block diagram of a testing device according to an embodiment;
[0026] FIG3 is a schematic diagram of a grid line arrangement of a battery cell to be tested according to an embodiment;
[0027] FIG4 is a third structural block diagram of a testing device according to an embodiment;
[0028] FIG5 is a second schematic diagram of the grid line arrangement of a battery cell to be tested according to an embodiment;
[0029] FIG6 is a front view of a test piece pressing down a battery cell to be tested according to an embodiment;
[0030] FIG7 is a schematic diagram of the structure of a battery cell and a gate line to be tested in one embodiment;
[0031] FIG8 is a front view of a probe row pressing down a battery cell to be tested in one embodiment;
[0032] FIG9 is a side view of a probe row pressing down a battery cell to be tested in one embodiment;
[0033] FIG10 is a schematic diagram of a circuit lead-out of a probe row in an embodiment;
[0034] FIG11 is a schematic diagram of a circuit for testing resistance values in one embodiment;
[0035] FIG. 12 is a diagram showing a contact resistance fitting coordinate calculation in one embodiment. DETAILED DESCRIPTION
[0036] In order to make the purpose, technical solution and advantages of the present application more clearly understood, the present application is further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present application and are not used to limit the present application.
[0037] It is understood that the terms "first", "second", etc. used in this application can be used to describe various elements in this article, but these elements are not limited by these terms. These terms are only used to distinguish the first element from another element, and cannot be understood as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, the features defined as "first" and "second" can explicitly or implicitly include at least one of the features. In the description of this application, the meaning of "multiple" is at least two, such as two, three, etc., unless otherwise clearly and specifically defined. It should be noted that when an element is referred to as "arranged on" another element, it can be directly on another element or there can also be a centered element. When an element is considered to be "connected" to another element, it can be directly connected to another element or there may be a centered element at the same time.
[0038] FIG1 is a structural block diagram of a test device according to an embodiment. Referring to FIG1 , in this embodiment, the test device includes: a plurality of first test components 110 and a plurality of second test components 120 , a test circuit 130 and a processing circuit 140 .
[0039] A plurality of first test components 110 and a plurality of second test components 120, each test component comprising two test pieces 111, the two test pieces 111 of the first test component 110 are respectively used to connect to the same gate line of the battery cell to be tested, and the two test pieces 111 of the second test component 120 are respectively used to connect to two gate lines of the battery cell to be tested; a test circuit 130, respectively connected to each test piece 111, for obtaining a first test parameter of each gate line based on the first test component 110, and for obtaining a second test parameter between different gate lines based on the second test component 120; a processing circuit 140, connected to the test circuit 130, for obtaining the line resistance of the battery cell to be tested based on the first test parameter, and for obtaining the contact resistance between the gate line and the battery cell based on the second test parameter.
[0040] Among them, the cell to be tested can be understood as a test sample, which is provided with a gate line with a line resistance and a contact resistance to be tested, and the gate line is used to support the collection and transmission of photogenerated carriers to realize the conversion of solar energy into electricity. The line resistance can be understood as the resistance of the gate line itself, and the contact resistance can be understood as the resistance when the gate line contacts the cell, or the contact resistance between the slurry and the cell. Based on the test characterization of the line resistance and the contact resistance, the performance of the gate line of the cell to be tested for collecting and transmitting photogenerated carriers can be analyzed.
[0041] Wherein, in the case where the battery cell to be tested needs to be subjected to relevant tests, the gate line of the battery cell to be tested can be connected to the first test component 110 group and the second test component 120. Specifically, the two test pieces 111 of the first test component 110 are respectively used to connect to the same gate line of the battery cell to be tested, and the two test pieces 111 of the second test component 120 are respectively used to connect to the two gate lines of the battery cell to be tested. Thus, based on the first test component 110 and the second test component 120, it is possible to achieve connection with different positions of the same gate line and to achieve connection with different positions of different gate lines, so as to facilitate the subsequent combination with the test circuit 130, and to achieve measurement of the first detection parameter of the gate line and measurement of the second detection parameter of the gate line. Optionally, the first test component 110 and the second test component 120 are elastically connected to the gate line of the battery cell to be tested, and can also be detachably connected to the gate line of the battery cell to be tested, and this embodiment is not limited to this.
[0042] Among them, the test circuit 130 is connected to each test piece 111 and the processing circuit 140 respectively. The test circuit 130 can measure each gate line of the battery cell to be tested through each test piece 111 to obtain the corresponding test parameters. Specifically, the test circuit 130 can be based on the two test pieces 111 of the first test component 110 as the detection end to test and obtain the first test parameter of each gate line. The first test parameter can be understood as a physical parameter related to the line resistance, and the parameter is in a mapping relationship with the line resistance; the test circuit 130 can be based on the two test pieces 111 of the second test component 120 as the detection end to test and obtain the second test parameter between different gate lines. The second test parameter is a parameter associated between different gate lines, which can be understood as a physical parameter related to the contact resistance. The contact resistance can be obtained based on the conversion processing of the parameter. The processing circuit 140 can obtain the gate line resistance of the battery cell to be tested and the contact resistance between the gate line and the battery cell to be tested based on the first test parameter and the second test parameter measured and obtained by the test circuit 130, thereby realizing the test characterization of the two parameters of line resistance and contact resistance.
[0043] In the related art, there are many metallization technologies for the grid lines of battery cells, such as printing, transfer, electroplating, etc. However, no matter which technology is used, the grid lines are mainly measured by two parameters: line resistance and contact voltage. That is, line resistance and contact voltage are essential for characterizing and analyzing metallized batteries. Generally, in this field, the characterization of line resistance and contact voltage can only be tested independently, resulting in a waste of sample costs, labor costs and machine costs.
[0044] The test device provided in this embodiment includes multiple first test components 110 and multiple second test components 120, a test circuit 130 and a processing circuit 140, each test component includes two test pieces 111, the two test pieces 111 of the first test component 110 are respectively used to connect to the same gate line of the battery cell to be tested, and the two test pieces 111 of the second test component 120 are respectively used to connect to two gate lines of the battery cell to be tested. Therefore, the test circuit 130 can obtain the first test parameter of each gate line based on the first test component 110, and obtain the second test parameter between different gate lines based on the second test component 120, so that the processing circuit 140 obtains the line resistance of the battery cell to be tested based on the first test parameter, and obtains the contact resistance between the gate line and the battery cell based on the second test parameter, so that the test device can realize the test characterization of the gate line resistance and contact resistance based on the same battery cell to be tested, thereby reducing the sample cost, labor cost and machine cost.
[0045] In one embodiment, the two test pieces 111 of each first test assembly 110 are respectively connected to the first test position and the second test position of each gate line, the first test position and the second test position are different positions of the gate line, and the gate line can transfer carriers between the first test position and the second test position. In this embodiment, the test circuit 130 may include: a plurality of first test units and a plurality of second test units.
[0046] Each first test unit is respectively connected to the two test pieces 111 of the first test assembly 110, and is used to measure the first test parameter between the first test position and the test position of each gate line based on the first test assembly 110. Thus, based on each first test unit of the test circuit 130 and the first test assembly 110 connected to it, the first test parameter related to the line resistance of each gate line can be measured. Optionally, the first test parameter can be a resistance value, a voltage value, a current value, etc., and accordingly, the first test unit can correspond to a resistance measuring instrument, a voltage measuring instrument, a current measuring instrument, etc. Based on the measurement of the resistance value, the voltage value, and the current value, the line resistance can be directly or indirectly calculated.
[0047] Each second test unit is connected to two test pieces 111 of the second test assembly 120, respectively, and is used to measure the second test parameter between two target test positions of two different gate lines based on the second test assembly 120, and each target test position includes one of the first test position and the second test position. For example, the second test unit can be connected to the first test position of a gate line, and connected to the first test position of another gate line, thereby measuring the second test parameter between the first test position of a gate line and the first test position of another gate line; for example, the second test unit can be connected to the first test position of a gate line, and connected to the second test position of another gate line, thereby measuring the second test parameter between the first test position of a gate line and the second test position of another gate line. Thus, based on each second test unit of the test circuit 130 and the correspondingly connected second test assembly 120, the second test parameter related to the contact resistance between different gate lines can be measured.
[0048] Based on the first test unit and the second test unit, the test circuit 130 can simultaneously implement the test characterization of the first test parameter and the second test parameter of the gate line based on the same battery cell to be tested, with a simple structure and convenient testing.
[0049] In one embodiment, as shown in FIG. 2 (the processing circuit 140 is not shown in the figure), the first test component 110 and the second test component 120 connected to the same target test position share a test piece 111 (the figure takes the test piece A1 as an example, and the test pieces A1 and B1 in the figure are combined into the first test component 110, and the test pieces A1 and A2 in the figure are combined into the second test component 120), a detection end of the test piece 111 is connected to the target test position, and a transmission end of the test piece 111 is respectively connected to the first test unit 131 and the second test unit 132; the test circuit 130 also includes: a plurality of switch units 133.
[0050] The first end of each switch unit 133 is respectively connected to a first test position corresponding to a gate line, the first test unit 131, and the second test unit 132. The second end of each switch unit 133 is respectively connected to the first test unit 131 and the second test position corresponding to the same gate line.
[0051] Among them, when the plurality of switch units 133 are in the disconnected state, the plurality of first test units 131 are in the test state, and the test circuit 130 obtains the plurality of first test parameters. Specifically, when each switch unit 133 is in the disconnected state, the corresponding first test unit 131 is respectively connected to the two test pieces 111 of the first test assembly 110, so as to be connected to the first test position and the second test position through the two test pieces 111, thereby testing and obtaining the first test parameters between the first test position and the second test position of the gate line. Optionally, each switch unit 133 can use a single-pole single-throw switch.
[0052] In which, when the plurality of switch units 133 are all in the on state, the plurality of second test units 132 are in the test state, and the test circuit 130 obtains the plurality of second test parameters. At this time, since the switch unit 133 is on, the first test unit 131 is short-circuited by the switch unit 133, and only the corresponding second test unit 132 is respectively connected to the two test pieces 111 of the second test assembly 120, so as to be connected to the first test position and the second test position through the two test pieces 111, thereby testing and obtaining the second test parameters between the first test position and the second test position of the gate line.
[0053] Therefore, the switch unit 133 can switch the electrical connection relationship between the first test unit 131, the second test unit 132 and the corresponding test component based on its on-off state, so as to realize the reuse of the first test unit 131 and the second test unit 132 for the test piece 111, greatly reduce the number of test pieces 111, and reduce costs.
[0054] In one embodiment, as shown in FIG3 , the battery cell to be tested is provided with a first gate line (150 is a gate line in the figure, gate line 1 is used as an example in the figure, and gate line 1 is connected to test pieces A1 and B1) and a plurality of (two are used as examples in the figure) second gate lines (gate line 2 is used as an example in the figure), as shown in FIG4 , a plurality of second test components 120 share a test piece 111 (test piece 111A1 is used as an example in the figure), a test piece 111 is connected to the first gate line, a plurality of second test units 132 are respectively connected to the first gate line through a test piece 111 of a plurality of second test components 120, and each second test unit 132 is connected to a second gate line through another test piece 111 of a second test component 120. Thus, a plurality of second test units 132 can respectively measure the second test parameters between the first gate line and a second gate line, so that there is a correlation between the measured plurality of second test parameters, which is more convenient for the subsequent processing circuit 140 to obtain the contact resistance with convenience and accuracy, and at the same time, the number of test pieces 111 can be reduced, thereby reducing costs.
[0055] In one embodiment, as shown in FIG5 , the first gate line and a plurality of second gate lines are arranged at equal intervals along a first direction (such as F1 in the figure) (the interval is, for example, L in the figure), so that the intervals between the first gate line and the plurality of second gate lines are L, 2L, 3L, 4L, 5L, etc. The processing circuit 140 obtains the contact resistance between the gate line and the battery cell according to the fitting straight line based on the linear fitting of the plurality of second test parameters. For example, each second test parameter and a multiple of the interval can be used as a coordinate, and the plurality of coordinates can be linearly fitted to obtain a fitting straight line, and the corresponding intercept is obtained according to the fitting straight line, thereby obtaining the contact resistance.
[0056] In one embodiment, the first test parameter and the second test parameter are resistance values, respectively, and the first test unit 131 and the second test unit 132 are resistance measuring instruments, respectively. Thus, each test unit measures the resistance value between different test positions of the corresponding gate line and the resistance value between different test positions of different gate lines based on the test piece 111 of each correspondingly connected test assembly, respectively, so that the processing circuit 140 obtains the line resistance and the contact resistance based on the resistance value obtained by each test unit.
[0057] In one embodiment, the first test position and the second test position of the same gate line are spaced apart by a preset distance; the processing circuit 140 obtains the line resistance based on the preset distance and the first test parameter of each gate line, and obtains the line resistance of the battery cell to be tested based on multiple line resistances corresponding to multiple gate lines.
[0058] Among them, the battery cell to be tested has multiple gate lines, and the first test position and the second test position of each gate line are separated by a preset interval. The processing circuit 140 can obtain the line resistance of the corresponding gate line based on the preset interval of each gate line and the resistance between the two test positions obtained by the test, for example, based on the ratio of the resistance between the two test positions and the preset interval, to obtain the line resistance of the corresponding gate line.
[0059] In one embodiment, please continue to refer to Figure 5. As shown in Figure 5, the preset spacing corresponding to multiple gate lines is the same (such as D in the figure), and the processing circuit 140 obtains the line resistance of the battery cell to be tested based on the average value of multiple line resistances corresponding to the multiple gate lines.
[0060] The spacing between the first test position and the second test position of each gate line is the same, therefore, the size between the first test position and the second test position of the gate line corresponding to each first test component 110 is the same, so that the first test parameter of each gate line obtained by the test circuit 130 is correlated. The processing circuit 140 can obtain multiple correlated line resistances based on each preset spacing and the correlated first test parameter, and the processing circuit 140 obtains the line resistance of the battery cell to be tested based on the average value of the multiple line resistances, thereby reducing the randomness and noise of the test data, making the test result of the line resistance more accurate and reliable.
[0061] In one embodiment, as shown in FIG. 6 , the testing device further includes a substrate 160; the battery cell 170 to be tested is disposed on one side of the substrate 160 and is spaced apart from the substrate 160, the gate line is located on the side of the battery cell 170 to be tested close to the substrate 160, and each test piece 111 is disposed on the substrate 160 and extends in a direction perpendicular to the substrate 160 to connect with each gate line.
[0062] Among them, the substrate 160 can be understood as a fixing plate of each test piece 111, so as to fix each test piece 111 at each fixed position, so that when the test device contacts the battery cell 170 to be tested, each test piece 111 can be fixed at a certain position, and extend in a direction perpendicular to the substrate 160 to connect with each test position of each gate line, so as to realize the test function and improve the reliability of the test of each test piece 111. It can be understood that fixing here can be understood as the test piece 111 can be fixed on the substrate 160 at a certain moment, a certain period of time, or can be permanently fixed on the substrate 160, and this embodiment does not limit this.
[0063] In one embodiment, please continue to refer to FIG. 6. As shown in FIG. 6, the test piece 111 is a metal probe, and the metal probe can connect the gate line and the test circuit 130, so that the test circuit 130 can test and obtain the first test parameter and the second test parameter by transmitting a certain current and frequency. Further, it can be a spring probe, which can elastically abut against the gate line by pressing down to achieve electrical connection with the gate line. Further, it can be a double-acting needle or a single-acting needle. It can be understood that in other embodiments, the test piece 111 can also be other conductive parts, and this embodiment does not further limit this.
[0064] The test device is further described below with a specific embodiment:
[0065] As shown in FIG7 , the battery cell 170 to be tested is a long strip of battery cell formed by laser cutting. The detection components are probes, with a total of 12 probes. The probes are fixed by a substrate 160. The distance between two probes on the same gate line is D, and the distance between two adjacent gate lines is L. As shown in FIG8 and FIG9 , the long strip of battery cell is placed under the probes, and the probes are pressed down at the positions corresponding to the gate lines. As shown in FIG10 , the 12 probes are respectively led out with wires (such as 180 in the figure), and the led-out wires are connected according to the circuit diagram shown in FIG11 , and each switch unit 133 in the figure uses a single-pole single-throw switch (such as K1, K2, K3, K4, K5, and K6 in the figure).
[0066] When each single-pole single-throw switch is in the off state, the resistance measuring instrument selected by each first test unit 131 respectively tests and obtains the resistance values of R1, R2, R3, R4, R5, and R6, and the above-mentioned resistances correspond to the resistance values between A1 and B1, A2 and B2, A3 and B3, A4 and B4, A5 and B5, and A6 and B6, respectively.
[0067] When each SPST switch is in the on state, the resistance measuring instrument selected by each second test unit 132 respectively tests and obtains the resistance values of Ra, Rb, Rc, Rd, and Re, which correspond to the resistance values between A1 and A2, A1 and A3, A1 and A4, A1 and A5, and A1 and A6. Since each SPST switch is turned on, the resistance values of Ra, Rb, Rc, Rd, and Re are also the resistance values between B1 and B2, B1 and B3, B1 and B4, B1 and B5, and B1 and B6.
[0068] According to the above test values, enter the following formula:
[0069] RL1=R1 / D, RL2=R2 / D, RL3=R3 / D, RL4=R4 / D, RL5=R5 / D, RL6=R6 / D, and the line resistance data are RL1, RL2, RL3, RL4, RL5, RL6. The average value is the line resistance RL of the battery cell 170 to be tested. RL=(RL1+RL2+RL3+RL4+RL5+RL6) / 6.
[0070] Place Ra, Rb, Rc, Rd, and Re in the coordinate system with coordinate points (1, Ra), (2, Rb), (3, Rc), (4, Rd), and (5, Re), as shown in Figure 12. The intercept of the fitting straight line on the y-axis is Y, and the contact resistance Ry is Ry=0.5*Y.
[0071] Based on the test device of this embodiment, the test characterization of the gate line resistance and the contact resistance is realized based on the same battery cell 170 to be tested. The circuit architecture is simple, the test is convenient, and the sample cost, labor cost and machine cost are reduced.
[0072] The technical features of the above embodiments may be combined arbitrarily. To make the description concise, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.
[0073] The above embodiments only express several implementation methods of the present application, and the descriptions thereof are relatively specific and detailed, but they cannot be understood as limiting the scope of the present application. It should be pointed out that, for a person of ordinary skill in the art, several modifications and improvements can be made without departing from the concept of the present application, and these all belong to the protection scope of the present application. Therefore, the protection scope of the present application shall be subject to the attached claims.
Claims
1. A testing device, characterized in that: include: A plurality of first test assemblies and a plurality of second test assemblies, each test assembly comprising two test pieces, the two test pieces of the first test assembly are respectively used to connect to the same grid line of the battery cell to be tested, and the two test pieces of the second test assembly are respectively used to connect to two grid lines of the battery cell to be tested; A test circuit, connected to each test piece, for obtaining a first test parameter of each gate line based on the first test component, and obtaining a second test parameter between different gate lines based on the second test component; The processing circuit is connected to the test circuit and is used to obtain the gate line resistance of the battery cell to be tested based on the first test parameter and to obtain the contact resistance between the gate line and the battery cell to be tested based on the second test parameter.
2. The testing device according to claim 1, characterized in that: The two test pieces of each of the first test components are respectively connected to the first test position and the second test position of each of the gate lines; the test circuit includes: A plurality of first test units, each of which is connected to two test pieces of the first test assembly, and is used to measure the first test parameter between the first test position and the test position of each gate line based on the first test assembly; Multiple second test units, each of which is connected to the two test pieces of the second test component respectively, and is used to measure the second test parameters between two target test positions of two different gate lines based on the second test component, and each of the target test positions includes one of the first test position and the second test position.
3. The testing device according to claim 2, characterized in that: The first test assembly and the second test assembly connected to the same target test position share a test piece, a detection end of the test piece is connected to the target test position, and a transmission end of the test piece is connected to the first test unit and the second test unit respectively; The test circuit further comprises: A plurality of switch units, wherein a first end of each of the switch units is respectively connected to the first test position, the first test unit, and the second test unit corresponding to a gate line, and a second end of each of the switch units is respectively connected to the first test unit and the second test position corresponding to the same gate line; Among them, when the multiple switch units are all in the disconnected state, the multiple first test units are in the test state, and the test circuit obtains multiple first test parameters; when the multiple switch units are all in the on state, the multiple second test units are in the test state, and the test circuit obtains multiple second test parameters.
4. The testing device according to claim 2, characterized in that: The battery cell to be tested is provided with a first gate line and a plurality of second gate lines, the plurality of second test components share a test piece, the test piece is connected to the first gate line, the plurality of second test units are respectively connected to the first gate line through the test piece of the plurality of second test components, and each of the second test units is connected to a second gate line through another test piece of the second test component.
5. The testing device according to claim 4, characterized in that: The first gate lines and a plurality of the second gate lines are arranged at equal intervals along a first direction; the processing circuit obtains the contact resistance between the gate lines and the battery cell according to a fitting straight line based on linear fitting of a plurality of the second test parameters.
6. The testing device according to claim 2, characterized in that: The first test parameter and the second test parameter are resistance values, respectively. The first test unit and the second test unit are resistance measuring instruments, respectively.
7. The testing device according to claim 6, characterized in that: The first test position and the second test position of the same gate line are spaced apart by a preset distance; the processing circuit obtains the line resistance based on the preset distance of each gate line and the first test parameter, and obtains the gate line resistance of the battery cell to be tested based on multiple line resistances corresponding to multiple gate lines.
8. The testing device according to claim 7, characterized in that: The preset intervals corresponding to the plurality of gate lines are the same, and the processing circuit obtains the line resistance of the battery cell to be tested based on an average value of a plurality of line resistances corresponding to the plurality of gate lines.
9. The testing device according to any one of claims 1 to 8, characterized in that: The testing device also includes a substrate; the battery cell to be tested is arranged on one side of the substrate and is spaced apart from the substrate, the gate line is located on the side of the battery cell to be tested close to the substrate, and each of the test pieces is arranged on the substrate and extends in a direction perpendicular to the substrate to connect with each of the gate lines.
10. The testing device according to claim 9, characterized in that: The test piece is a metal probe.