Rapid temperature change test box

Abstract

The utility model relates to the technical field of temperature change experiments, and discloses a rapid temperature change test box which comprises a test box body, a temperature blocking partition plate is fixedly connected to the inner wall of the test box body, a high-temperature area is arranged above the temperature blocking partition plate, and a low-temperature area is arranged below the temperature blocking partition plate. Temperature and humidity sensors are fixedly arranged on the inner walls of the high-temperature area and the low-temperature area; a rectangular mounting hole is formed in the surface of the temperature blocking partition plate, and rotary supporting columns are rotationally arranged on the left inner wall and the right inner wall of the rectangular mounting hole correspondingly. According to the utility model, the interior of the temperature change test box can be divided into a high-temperature area and a low-temperature area by arranging the temperature blocking partition plate inside the temperature change test box, so that high-temperature or low-temperature tests can be carried out by respectively utilizing the high-temperature area and the low-temperature area, and a test article can be driven to turn over by utilizing the conversion bottom plate in the test process by arranging the conversion bottom plate; therefore, the test article can be rapidly switched from the high-temperature environment to the low-temperature environment, so that the test article can be conveniently subjected to rapid temperature change test.

Description

Technical Field

[0001] The utility model relates to the technical field of temperature change experiments, and more specifically to a rapid temperature change test box. Background Art

[0002] The temperature change test chamber is used to detect the temperature stress of parts with high and low temperature changes. The temperature change test chamber adopts a heating device and a refrigeration device and guides cold air or hot air into the interior of the box through the circulation systems equipped respectively to achieve the effect of heating and cooling the interior of the box.

[0003] However, existing temperature change test chambers usually heat up and cool down inside the same chamber, and the internal temperature change speed is slow. When the temperature rises and wants to quickly reach a low temperature, the temperature cannot be quickly lowered in a short period of time, resulting in low test efficiency. There are also some temperature change test chambers with two chambers, high temperature and low temperature. When the temperature changes from hot to cold, the test items need to be quickly taken out from one chamber to another, which is more troublesome and may even cause burns or frostbite to the operator.

[0004] To this end, we designed a rapid temperature change test chamber that can solve the defects and problems mentioned above. Utility Model Content

[0005] In order to overcome the above-mentioned defects of the prior art, the utility model provides a rapid temperature change test chamber, which has the advantages of rapid conversion of hot and cold environments, so as to solve the problems existing in the above-mentioned background technology.

[0006] The utility model provides the following technical solutions: a rapid temperature change test box, comprising a test box body, the inner wall of the test box body is fixedly connected with a temperature-blocking baffle, the upper part of the temperature-blocking baffle is a high-temperature zone, and the lower part of the temperature-blocking baffle is a low-temperature zone, the inner walls of the high-temperature zone and the low-temperature zone are both fixedly provided with temperature and humidity sensors, and the temperature sensors can monitor the temperature and humidity inside the high-temperature zone and the low-temperature zone, so as to facilitate high-temperature or low-temperature testing;

[0007] A rectangular mounting hole is provided on the surface of the temperature-blocking baffle plate, and rotating support columns are rotatably provided on the left and right inner walls of the rectangular mounting hole, and a conversion base plate is fixedly connected to the opposite ends of the two rotating support columns, and the size of the conversion base plate 8 matches the rectangular mounting hole 6. Limiting mechanisms are fixedly provided on the upper and lower surfaces of the conversion base plate, and the limiting mechanisms are used to limit and fix the test product. The conversion base plate is used to drive the test product to switch between the high temperature zone and the low temperature zone, and the high temperature zone and the low temperature zone are used to perform high temperature or low temperature tests respectively. By setting the conversion base plate, the test product can be turned over by using the conversion base plate during the test, so that the test product can be quickly switched from a high temperature environment to a low temperature environment;

[0008] The inner wall of the test box is fixedly connected to a drive motor, the output shaft of the drive motor is fixedly connected to a worm, the left end of the rotating support column is fixedly connected to a linkage rod, the left end of the linkage rod extends to the left side of the temperature-blocking baffle and is fixedly connected to a worm gear, the worm gear is meshed with the worm gear, and the drive motor is used to drive the conversion bottom plate to flip;

[0009] The front and rear surfaces of the conversion base plate are both provided with strip grooves, the inner wall of the rectangular mounting hole is provided with a limiting guide groove, a micro motor is fixed to the inner wall of the limiting guide groove, a driving screw is fixed to the output shaft of the micro motor, a movable strip is threadedly connected to the surface of the driving screw, the size of the movable strip matches the strip groove, by setting the movable strip, when the conversion base plate is in a horizontal state, the micro motor can be used to drive the movable strip to be inserted into the strip groove on the surface of the conversion base plate, the movable strip and the strip groove can be used to block the gap between the conversion base plate and the rectangular mounting hole, thereby facilitating improving the sealing effect between the low temperature zone and the high temperature zone and reducing the loss of heat and cold.

[0010] Furthermore, a fixed partition is fixedly connected to the inner wall of the test box, a cooling mechanism is fixedly connected to the lower surface of the fixed partition, the position of the cooling mechanism corresponds to the low temperature zone, and the cooling mechanism is used to cool the low temperature zone.

[0011] Furthermore, the cooling mechanism includes a cooling box fixed on the lower surface of the fixed partition, the inner wall of the cooling box is fixedly connected to a mounting plate, a plurality of semiconductor refrigeration plates are fixedly embedded on the surface of the mounting plate, and a first circulating pump and a second circulating pump are fixedly provided on the left and right sides of the cooling box respectively.

[0012] Furthermore, the output end of the first circulation pump extends to the interior of the cooling box, and the input end of the first circulation pump is fixedly connected to the first air duct, the left end of the first air duct is fixedly connected to the air inlet pipe, and the air inlet end of the air inlet pipe extends upward to the interior of the low temperature zone.

[0013] Furthermore, the input end of the second circulation pump extends to the interior of the cooling box, and the output end of the second circulation pump is fixedly connected to the second air duct, the right end of the second air duct is fixedly connected to the air outlet duct, and the air outlet end of the air outlet duct extends upward to the interior of the low temperature zone.

[0014] Furthermore, a heat dissipation ventilation hole is opened on the back side of the test box, and a heat dissipation fan is fixedly connected to the inner wall of the heat dissipation ventilation hole. The position of the heat dissipation fan corresponds to that of the cooling box. The heat dissipation fan is used to dissipate heat from the hot end of the semiconductor refrigeration plate. When cooling the low-temperature zone, the semiconductor refrigeration plate can be used to cool and cool the air inside the cooling box, and then the first circulation pump and the second circulation pump are used to circulate and exchange the cold air in the cooling box with the air inside the low-temperature zone through the air outlet pipe and the air inlet pipe, so that the air inside the low-temperature zone can be continuously cooled and cooled.

[0015] Furthermore, a heating mechanism is fixedly connected to the inner top wall of the test box, and the heating mechanism includes a heating hood. A plurality of electric heating tubes are fixedly arranged on the inner wall of the heating hood, and a plurality of heating through holes are opened on the lower surface of the heating hood. The plurality of electric heating tubes inside the heating hood can be used to heat the inside of the high temperature zone, thereby testing the test items working in a high temperature environment.

[0016] Furthermore, the limiting mechanism includes a positioning shell, the inner wall of the positioning shell is rotatably connected to a bidirectional screw rod, the surface of the bidirectional screw rod is threadedly connected to two movable blocks, the surface of the movable block is fixedly connected to a clamping plate, and the inner sides of the two clamping plates are provided with a plurality of rubber anti-slip strips. The bidirectional screw rod can be used to drive the two clamping plates to clamp and fix the object, thereby improving the limiting effect of the object and preventing the object from falling off during the flipping process.

[0017] Technical effects and advantages of the utility model:

[0018] 1. The utility model can divide the interior of the temperature change test box into a high temperature zone and a low temperature zone by arranging a temperature-blocking partition inside the test box, so that the high temperature zone and the low temperature zone are used to perform high temperature or low temperature tests respectively, and by arranging a conversion bottom plate, the conversion bottom plate can be used to drive the test object to flip during the test, so that the test object can be quickly switched from a high temperature environment to a low temperature environment, thereby facilitating a rapid temperature change test of the test object, which can not only improve the speed of the temperature change switching, but also eliminate the need to manually open the test box to transfer the objects, thereby reducing the loss of hot and cold energy inside the test box.

[0019] 2. The utility model provides limiting mechanisms on both the upper and lower surfaces of the conversion base plate. When in use, a bidirectional screw rod can be used to drive two clamping plates to clamp and fix objects, thereby improving the limiting effect on objects and preventing objects from falling off during the flipping process. In addition, hot and cold temperature change tests can be performed on two objects at the same time, thereby improving the efficiency of the testing work.

[0020] 3. The utility model is provided with a cooling mechanism. When cooling the low-temperature zone, the semiconductor refrigeration sheet can be used to cool and cool the air inside the cooling box. Then, the first circulation pump and the second circulation pump are used to circulate the cold air in the cooling box with the air inside the low-temperature zone through the air outlet pipe and the air inlet pipe. In this way, the air inside the low-temperature zone can be continuously cooled and the cooling effect inside the low-temperature zone can be improved. BRIEF DESCRIPTION OF THE DRAWINGS

[0021] Figure 1 This is a schematic diagram of the overall structure of the test box of the utility model;

[0022] Figure 2 This is a schematic diagram of a partial cross-sectional structure of the test box of the utility model;

[0023] Figure 3 for Figure 2 The enlarged structural diagram at A in the middle;

[0024] Figure 4 This is a schematic diagram of the conversion bottom plate flipping structure of the utility model;

[0025] Figure 5 This is a schematic diagram of a partial side section structure of the heat-shielding baffle of the utility model;

[0026] Figure 6 It is a schematic diagram of the front section structure of the limiting mechanism of the utility model.

[0027] The accompanying drawings are marked as follows: 1. test box; 2. temperature-blocking baffle; 3. cooling mechanism; 4. heating mechanism; 5. temperature and humidity sensor; 6. rectangular mounting hole; 7. rotating support column; 8. conversion bottom plate; 9. limit mechanism; 10. driving motor; 11. worm; 12. linkage rod; 13. worm wheel; 14. strip groove; 15. micro motor; 16. driving screw; 17. movable bar; 18. fixed baffle; 19. high temperature zone; 20. low temperature zone;

[0028] Cooling box; 302, semiconductor refrigeration sheet; 303, first circulation pump; 304, second circulation pump; 305, first air duct; 306, air inlet duct; 307, second air duct; 308, air outlet duct; 309, cooling fan;

[0029] Heating cover; 402, electric heating tube; 403, heating through hole;

[0030] 901, positioning shell; 902, bidirectional screw rod; 903, clamping plate; 904, rubber anti-slip strip. DETAILED DESCRIPTION

[0031] The technical solution of the present invention will be clearly and completely described below in conjunction with the drawings in the present invention. In addition, the forms of the various structures recorded in the following embodiments are merely illustrative. The rapid temperature change test chamber involved in the present invention is not limited to the various structures recorded in the following embodiments. All other implementations obtained by ordinary technicians in this field without making creative work are within the scope of protection of the present invention.

[0032] Reference Figure 1-6 The utility model provides a rapid temperature change test box, including a test box body 1, the inner wall of the test box body 1 is fixedly connected with a temperature barrier baffle 2, the upper part of the temperature barrier baffle 2 is a high temperature zone 19, and the lower part of the temperature barrier baffle 2 is a low temperature zone 20, the inner walls of the high temperature zone 19 and the low temperature zone 20 are fixedly provided with temperature and humidity sensors 5, and the temperature sensor 5 can monitor the temperature and humidity inside the high temperature zone 19 and the low temperature zone 20, so as to facilitate high temperature or low temperature testing.

[0033] The inner top wall of the test box 1 is fixedly connected with a heating mechanism 4, and the heating mechanism 4 includes a heating cover 401. A plurality of electric heating tubes 402 are fixedly provided on the inner wall of the heating cover 401, and a plurality of heating through holes 403 are opened on the lower surface of the heating cover 401. The plurality of electric heating tubes 402 inside the heating cover 401 can heat the inside of the high temperature zone 19, so as to test the test items working in a high temperature environment.

[0034] A rectangular mounting hole 6 is provided on the surface of the heat-shielding partition 2 , and rotating support columns 7 are rotatably provided on the left and right inner walls of the rectangular mounting hole 6 . A conversion base plate 8 is fixedly connected to the opposite ends of the two rotating support columns 7 , and the size of the conversion base plate 8 matches the rectangular mounting hole 6 .

[0035] The upper and lower surfaces of the conversion base plate 8 are fixedly provided with a limiting mechanism 9, which includes a positioning shell 901, the inner wall of the positioning shell 901 is rotatably connected with a bidirectional screw rod 902, the surface of the bidirectional screw rod 902 is threadedly connected with two movable blocks, the surface of the movable block is fixedly connected with a clamping plate 903, the inner sides of the two clamping plates 903 are provided with a plurality of rubber anti-slip strips 904, the surface of the positioning shell 901 is provided with a strip-shaped limiting hole, and the movable block is slidably connected to the inner wall of the strip-shaped limiting hole.

[0036] The limiting mechanism 9 is used to limit and fix the test product, and the conversion base plate 8 is used to drive the test product to switch between the high temperature zone 19 and the low temperature zone 20. By arranging the limiting mechanism 9 on the upper and lower surfaces of the conversion base plate 8, hot and cold temperature change tests can be carried out on two objects at the same time, thereby improving the efficiency of the test work. When in use, the knob can be used to drive the bidirectional screw rod 902 to rotate, thereby driving the two clamping plates 903 to clamp and fix the object, thereby improving the limiting effect of the object and preventing the object from falling off during the flipping process.

[0037] The inner wall of the test box 1 is fixedly connected with a fixed partition 18, and the lower surface of the fixed partition 18 is fixedly connected with a cooling mechanism 3. The position of the cooling mechanism 3 corresponds to the low-temperature zone 20. The cooling mechanism 3 is used to cool the low-temperature zone 20. The cooling mechanism 3 includes a cooling box 301 fixed to the lower surface of the fixed partition 18. The inner wall of the cooling box 301 is fixedly connected with a mounting plate, and a plurality of semiconductor refrigeration plates 302 are fixedly embedded on the surface of the mounting plate. The left and right sides of the cooling box 301 are respectively fixedly provided with a first circulation pump 303 and a second circulation pump 304.

[0038] The output end of the first circulation pump 303 extends to the interior of the cooling box 301, and the input end of the first circulation pump 303 is fixedly connected to the first air duct 305, the left end of the first air duct 305 is fixedly connected to the air inlet pipe 306, and the air inlet end of the air inlet pipe 306 extends upward to the interior of the low temperature zone 20.

[0039] The input end of the second circulation pump 304 extends to the interior of the cooling box 301, and the output end of the second circulation pump 304 is fixedly connected to the second air duct 307, the right end of the second air duct 307 is fixedly connected to the air outlet duct 308, and the air outlet end of the air outlet duct 308 extends upward to the interior of the low temperature zone 20.

[0040] It is worth noting that by setting up the cooling mechanism 3, when cooling the low-temperature zone 20, the semiconductor refrigeration plate 302 is first used to cool and cool the air inside the cooling box 301, and then the first circulation pump 303 and the second circulation pump 304 are used to pass the cold air in the cooling box 301 through the first air duct 305 and the second air duct 307, and then the air inlet pipe 306 and the air outlet pipe 308 are used to circulate the cold air inside the cooling box 301 and the air inside the low-temperature zone 20, so that the air inside the low-temperature zone 20 can be continuously cooled and cooled, thereby improving the cooling effect inside the low-temperature zone 20.

[0041] A heat dissipation vent is provided on the back of the test box 1 , and a heat dissipation fan 309 is fixedly connected to the inner wall of the heat dissipation vent. The position of the heat dissipation fan 309 corresponds to that of the cooling box 301 . The heat dissipation fan 309 is used to dissipate the heat from the hot end of the semiconductor cooling sheet 302 .

[0042] The inner wall of the test box 1 is fixedly connected with a drive motor 10, and the output shaft of the drive motor 10 is fixedly connected with a worm 11. The left end of the rotating support column 7 is fixedly connected with a linkage rod 12. The left end of the linkage rod 12 extends to the left side of the temperature-blocking baffle 2 and is fixedly connected with a worm gear 13. The worm 11 is meshed with the worm gear 13. The drive motor 10 is used to drive the conversion bottom plate 8 to flip;

[0043] The front and rear surfaces of the conversion base plate 8 are provided with strip grooves 14, and the inner wall of the rectangular mounting hole 6 is provided with a limit guide groove, and a micro motor 15 is fixed to the inner wall of the limit guide groove, and the output shaft of the micro motor 15 is fixed with a driving screw 16, and the surface of the driving screw 16 is threadedly connected with a movable bar 17, and the size of the movable bar 17 matches the strip groove 14. It should be noted that by setting the movable bar 17, when the conversion base plate 8 is in a horizontal state, the micro motor 15 can be used to drive the movable bar 17 to be inserted into the strip groove 14 on the surface of the conversion base plate 8, so that the movable bar 17 and the strip groove 14 can be used to seal the gap between the conversion base plate 8 and the rectangular mounting hole 6 to a certain extent, which is beneficial to improve the sealing effect between the low temperature zone 20 and the high temperature zone 19.

[0044] It is worth noting that by providing a temperature-blocking partition 2 inside the temperature change test box, the interior of the test box can be divided into a high temperature zone 19 and a low temperature zone 20. Not only can the high temperature zone 19 and the low temperature zone 20 be used to test the test object at high or low temperatures respectively, but also during the test, the drive motor 10 can be used to drive the worm 11 to rotate, the worm 11 drives the worm wheel 13 and the connecting rod 12 to rotate, the connecting rod 12 drives the conversion base plate 8 to rotate, and then the conversion base plate 8 is used to drive the object to flip 180 degrees, so that the test object can be quickly switched from a high temperature environment to a low temperature environment, so as to perform a rapid temperature change test on the test object, which can not only improve the speed of the temperature change switching, but also eliminate the need to manually open the test box to transfer the object, thereby reducing the loss of hot and cold energy inside the test box.

[0045] Finally, it should be noted that the drawings of the embodiments disclosed in the present utility model only involve structures related to the embodiments disclosed in the present utility model. The above description is only a preferred embodiment of the present utility model and is not used to limit the present utility model. Any modifications, equivalent substitutions, improvements, etc. made within the spirit and principles of the present utility model should be included in the protection scope of the present utility model.

Claims

1. A rapid temperature change test chamber, comprising a test chamber (1), characterized in that: The inner wall of the test box (1) is fixedly connected to a temperature-blocking baffle (2); the upper part of the temperature-blocking baffle (2) is a high-temperature zone (19), and the lower part of the temperature-blocking baffle (2) is a low-temperature zone (20); the inner walls of the high-temperature zone (19) and the low-temperature zone (20) are both fixedly provided with temperature and humidity sensors (5); A rectangular mounting hole (6) is provided on the surface of the temperature-blocking baffle (2), and a rotating support column (7) is rotatably provided on the left and right inner walls of the rectangular mounting hole (6), and a conversion base plate (8) is fixedly connected to the opposite ends of the two rotating support columns (7), and a limiting mechanism (9) is fixedly provided on the upper and lower surfaces of the conversion base plate (8), and the limiting mechanism (9) is used to limit and fix the test product, and the conversion base plate (8) is used to drive the test product to switch between the high temperature zone (19) and the low temperature zone (20); The inner wall of the test box (1) is fixedly connected to a drive motor (10), the output shaft of the drive motor (10) is fixedly connected to a worm (11), the left end of the rotating support column (7) is fixedly connected to a linkage rod (12), the left end of the linkage rod (12) extends to the left side of the temperature-shielding baffle (2) and is fixedly connected to a worm gear (13), the worm gear (11) is meshed with the worm gear (13), and the drive motor (10) is used to drive the conversion base plate (8) to flip; The front and rear surfaces of the conversion base plate (8) are both provided with strip grooves (14), the inner wall of the rectangular mounting hole (6) is provided with a limit guide groove, a micro motor (15) is fixed to the inner wall of the limit guide groove, a driving screw (16) is fixed to the output shaft of the micro motor (15), a movable strip block (17) is threadedly connected to the surface of the driving screw rod (16), and the size of the movable strip block (17) matches the strip groove (14).

2. A rapid temperature change test chamber according to claim 1, characterized in that: A fixed partition (18) is fixedly connected to the inner wall of the test box (1), and a cooling mechanism (3) is fixedly connected to the lower surface of the fixed partition (18). The position of the cooling mechanism (3) corresponds to the low temperature zone (20), and the cooling mechanism (3) is used to cool the low temperature zone (20).

3. A rapid temperature change test chamber according to claim 2, characterized in that: The cooling mechanism (3) comprises a cooling box (301) fixed to the lower surface of a fixed partition (18); the inner wall of the cooling box (301) is fixedly connected to a mounting plate; a plurality of semiconductor cooling plates (302) are fixedly embedded on the surface of the mounting plate; and a first circulating pump (303) and a second circulating pump (304) are fixedly arranged on the left and right sides of the cooling box (301), respectively.

4. A rapid temperature change test chamber according to claim 3, characterized in that: The output end of the first circulation pump (303) extends to the interior of the cooling box (301), and the input end of the first circulation pump (303) is fixedly connected to the first air guide pipe (305), the left end of the first air guide pipe (305) is fixedly connected to the air inlet pipe (306), and the air inlet end of the air inlet pipe (306) extends upward to the interior of the low temperature zone (20).

5. A rapid temperature change test chamber according to claim 4, characterized in that: The input end of the second circulation pump (304) extends to the interior of the cooling box (301), and the output end of the second circulation pump (304) is fixedly connected to the second air guide pipe (307), the right end of the second air guide pipe (307) is fixedly connected to the air outlet pipe (308), and the air outlet end of the air outlet pipe (308) extends upward to the interior of the low temperature zone (20).

6. A rapid temperature change test chamber according to claim 5, characterized in that: The back of the test box (1) is provided with a heat dissipation ventilation hole, and the inner wall of the heat dissipation ventilation hole is fixedly connected to a heat dissipation fan (309), the position of the heat dissipation fan (309) corresponds to that of the cooling box (301), and the heat dissipation fan (309) is used to dissipate heat from the hot end of the semiconductor cooling plate (302).

7. A rapid temperature change test chamber according to claim 6, characterized in that: A heating mechanism (4) is fixedly connected to the inner top wall of the test box (1), the heating mechanism (4) comprising a heating cover (401), a plurality of electric heating tubes (402) are fixedly arranged on the inner wall of the heating cover (401), and a plurality of heating through holes (403) are provided on the lower surface of the heating cover (401).

8. The rapid temperature change test chamber according to claim 7, characterized in that: The limiting mechanism (9) comprises a positioning shell (901), the inner wall of which is rotatably connected to a bidirectional screw rod (902), the surface of which is threadedly connected to two movable blocks, the surface of which is fixedly connected to a clamping plate (903), and the inner sides of the two clamping plates (903) are each provided with a plurality of rubber anti-slip strips (904).

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