Thickness measuring device
By designing a thickness measuring device equipped with a sliding measuring part and a roller, the problem of low accuracy and efficiency of thickness measurement of PEM electrolytic cell components in the prior art is solved, and high-precision and automated thickness measurement are achieved.
Patent Information
- Application Number
- CN202420412957.6
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-03-04
- Publication Date
- 2025-03-07
- Estimated Expiration
- 2034-03-04
AI Technical Summary
In the prior art, when measuring the thickness of the PEM electrolytic cell component, due to human factors, the measurement accuracy cannot be guaranteed and the efficiency is low.
A thickness measuring device is designed, including a base and two measuring parts. The measuring part is slidable and equipped with a roller, which can automatically calculate and store measurement results, and automatically measure measurements are achieved using sensors and processors.
It improves measurement efficiency and accuracy, reduces human error, realizes automated calculation and storage, is easy to operate, and is suitable for high-precision thickness measurement.
Smart Images
Figure CN222579152U_ABST
Abstract
Description
Technical Field
[0001] The present application relates to the technical field of PEM electrolyzer production, and in particular to a thickness measuring device capable of measuring the thickness of a component of a PEM electrolyzer. Background Art
[0002] The PEM electrolyzer includes bipolar plates, insulating plates, membrane electrode frames and other components. The thickness of these components is a key parameter that affects the sealing performance and pressure-bearing performance of the PEM electrolyzer. Therefore, in order to ensure the production quality of the PEM electrolyzer, it is necessary to measure the thickness of these components during the production process and determine whether the thickness of these components is qualified.
[0003] At present, the measurement is mainly carried out manually with a handheld vernier caliper. This kind of detection is affected by human factors, the measurement accuracy cannot be guaranteed and the measurement efficiency is low.
[0004] In view of this, how to improve measurement efficiency and measurement accuracy is a technical problem that needs to be solved by technical personnel in this field. Utility Model Content
[0005] In order to solve the above technical problems, the present application provides a thickness measuring device, characterized in that the thickness measuring device includes a base and two measuring parts, the two measuring parts are assembled on the base, at least one of the two measuring parts can slide relative to the base, so that the two measuring parts can approach or move away from each other, and the two measuring parts each include a roller that can rotate relative to the base. During measurement, the rollers of the two measuring parts respectively abut against the two sides of the measured component.
[0006] In one implementation manner of the thickness measuring device, the thickness measuring device comprises an elastic reset member for resetting the measuring part to an initial position.
[0007] An embodiment of a thickness measuring device, the thickness measuring device includes a sensor and a processor, the sensor detects the sliding amount of the measuring part relative to the substrate, the processor includes a first calculation module and a storage module, the first calculation module is communicatively connected to the sensor, so that the first calculation module can calculate the thickness of a single measured position of the measured component based on the detection data of the sensor, and the storage module is communicatively connected to the first calculation module, so that the storage module can store the calculation results of the first calculation module.
[0008] In one embodiment of the thickness measuring device, the processor further includes a first judgment module, and the thickness measuring device further includes a first input structure, wherein the first input structure allows a user to input a thickness acceptance range of a single measurement position of the measured component into the processor, and the first judgment module is communicatively connected to the first calculation module, so that the first judgment module can judge whether the thickness of each measured position of the measured component is within the acceptance range.
[0009] In one embodiment of the thickness measuring device, the processor also includes a second calculation module, which is communicatively connected to the storage module, so that the second calculation module can select the thicknesses of multiple measured positions of the measured component from the storage module as samples to calculate the average thickness of the samples, and the storage module can store the calculation results of the second calculation module.
[0010] In one embodiment of the thickness measuring device, the processor also includes a second judgment module, and the thickness measuring device also includes a second input structure and a selection structure, the second input structure allows the user to input the qualified range of the sample thickness mean into the processor, and the selection structure allows the user to select the first judgment module or the second judgment module, and the second judgment module is communicatively connected to the second calculation module, so that the second judgment module can judge whether the sample thickness mean is within the qualified range.
[0011] In one implementation of the thickness measuring device, the thickness measuring device further comprises a setting structure, wherein the setting structure allows a user to set a sampling distance and / or a sampling number of samples and select a judgment module.
[0012] An embodiment of a thickness measuring device, the thickness measuring device includes a display panel, the display panel is communicatively connected to the first calculation module and the second calculation module, so that the display panel can display the calculation results of the first calculation module and the calculation results of the second calculation module, and the display panel is also communicatively connected to the first judgment module and the second judgment module, so that the display panel can display whether the thickness is qualified or not.
[0013] In one implementation manner of the thickness measuring device, the thickness measuring device includes a voice announcer, and the voice announcer is communicatively connected with the first judgment module and the second judgment module, so that the voice announcer can announce whether the thickness is qualified or not.
[0014] In one implementation manner of the thickness measuring device, the surface of the substrate is provided with a scale.
[0015] The thickness measuring device provided by the present application can slide the measuring part relative to the base and the roller abutting the measured part can rotate, so the measured position can be flexibly switched without separating the roller from the measured part. That is to say, when the roller is in abutment with the current measured position of the measured part, the thickness measuring device is directly moved. At this time, the roller will roll along the surface of the measured part to the next measured position of the measured part and abut with the next measured position of the measured part. Therefore, the measurement efficiency is improved. And because the roller is used to contact the measured part, the contact between the roller and the measured part is point-line contact, which is less likely to be skewed than surface contact, so the measurement accuracy is improved.
[0016] Furthermore, the thickness measuring device provided in the present application can realize automatic calculation and storage of measurement results. The user can flexibly select different judgment modules to judge whether the thickness is qualified or not according to the different components being measured. The user can flexibly set the qualified thickness range according to the different components being measured. The operation is simple and the requirements for the operator are low. BRIEF DESCRIPTION OF THE DRAWINGS
[0017] Figure 1 A schematic diagram of an embodiment of a thickness measuring device provided in the present application;
[0018] Figure 2 for Figure 1 Left view of the middle roller;
[0019] Figure 3 A schematic diagram of various modules of an embodiment of a processor of a thickness measurement device provided by the present application;
[0020] Figure 4 A schematic diagram of an embodiment of the setting structure of the thickness measuring device provided in the present application;
[0021] Figure 5 A schematic diagram of an embodiment of a display panel of the thickness measuring device provided in the present application.
[0022] The following are the descriptions of the reference numerals:
[0023] 1 base, 11 scale, 2 measuring part, 21 roller, 22 connecting column, 3 processor, 4 first input structure, 5 second input structure, 6 selection structure, 7 display panel, 8 voice announcer, 9 sensor, 10 setting structure, 11 setting panel. DETAILED DESCRIPTION
[0024] In order to enable those skilled in the art to better understand the technical solution of the present application, the present application is further described in detail below in conjunction with the accompanying drawings and specific implementation methods.
[0025] like Figure 1 and Figure 2As shown, the thickness measuring device provided by the present application includes a substrate 1 and two measuring parts 2 .
[0026] The two measuring parts 2 are assembled on the base 1. At least one of the two measuring parts 2 can slide relative to the base 1, so that the two measuring parts 2 can move closer to each other or farther away from each other. The two measuring parts 2 include a roller 21 that can rotate relative to the base 1.
[0027] The thickness measuring device can be used to measure the thickness of bipolar plates, insulating plates, membrane electrode frames and other components of a PEM electrolyzer. During measurement, the component to be measured is extended between the rollers 21 of the two measuring parts 2, and the outer peripheral surfaces of the rollers 21 of the two measuring parts 2 are respectively abutted against the thickness of the component to be measured on both sides. After abutting, the distance between the outer peripheral surfaces of the rollers 21 of the two measuring parts 2 is the thickness of the component to be measured.
[0028] In the thickness measuring device, since the measuring part 2 can slide relative to the base 1 and the roller 21 abutting against the measured part can rotate, the measured position can be flexibly switched without separating the roller 21 from the measured part, that is, when the roller 21 abuts against the current measured position of the measured part, the thickness measuring device is directly moved, and the roller 21 rolls along the surface of the measured part to the next measured position and abuts against the next measured position of the measured part. Therefore, the measurement efficiency is improved.
[0029] The thickness measuring device utilizes the roller 21 to contact the measured component, and the contact between the roller 21 and the measured component is point-line contact, which is less likely to be skewed than surface contact, thereby improving the measurement accuracy.
[0030] In one embodiment, in the illustrated embodiment, the two measuring parts 2 each include a connecting column 22 , the roller 21 is rotatably sleeved on one end of the connecting column 22 , and the other end of the connecting column 22 is slidably assembled on the base 1 .
[0031] In one embodiment, the thickness measuring device further includes an elastic reset member. When the two measuring parts 2 move away from each other, the compression amount of the elastic reset member increases, accumulating elastic energy. After the measurement, the elastic energy is released, so that the measuring part 2 is reset to the initial position. In addition, during the measurement process, under the elastic force of the elastic reset member, the rollers 21 of the two measuring parts 2 can abut the measured component more closely, which is conducive to improving the measurement accuracy.
[0032] In one embodiment, the thickness measuring device may further include a sensor 9 and a processor 3 .
[0033] The sensor 9 detects the sliding amount of the measuring part 2 relative to the base 1. The type of the sensor 9 is not limited, and a sensor with high sensitivity is preferred.
[0034] The processor 3 includes a first calculation module and a storage module. The first calculation module is connected to the sensor 9 in communication, so that the first calculation module can calculate the thickness of a single measured position of the measured component according to the detection data of the sensor 9. The storage module is connected to the first calculation module in communication, so that the storage module can store the calculation result of the first calculation module. The storage module can be a storage structure known in the industry such as a random access memory (RAM), a memory, a read-only memory (ROM), a programmable memory, a disk, etc.
[0035] With this design, the thickness measuring device can automatically calculate and store the thickness of the current measured position of the measured component, which is more conducive to improving the measurement accuracy compared to manually reading the measurement results.
[0036] In one embodiment, a scale 11 is provided on the surface of the substrate 1, so that the measurement result can be read manually and compared with the automatically calculated result, so as to facilitate timely discovery of device failure.
[0037] In one embodiment, the processor 3 also includes a first judgment module. The thickness measuring device also includes a first input structure 4. The first input structure 4 allows the user to input the qualified range of the thickness of a single measured position of the measured component into the processor 3. The first judgment module is communicatively connected to the first calculation module, so that the first judgment module can judge whether the thickness of a single measured position of the measured component is within the qualified range. When measuring the thickness of components such as the bipolar plates, insulating plates, and membrane electrode frames of a PEM electrolyzer, the thickness of multiple positions of the measured component is usually measured. When the thickness of each measured position is within the qualified range, it can be determined that the thickness of the measured component is qualified.
[0038] In one embodiment, the processor 3 further includes a second calculation module. The second calculation module is in communication connection with the storage module, so that the second calculation module can select the thickness of multiple measured positions of the measured component from the storage module as samples to calculate the average thickness of the samples, and the storage module can store the calculation results of the second calculation module.
[0039] In one embodiment, the processor 3 further includes a second judgment module. The thickness measuring device further includes a second input structure 5 and a selection structure 6. The second input structure 5 allows the user to input the qualified range of the sample thickness mean into the processor 3. The selection structure 6 allows the user to select the first judgment module or the second judgment module. The second judgment module is connected to the second calculation module in communication, so that the second judgment module can judge whether the sample thickness mean is within the qualified range.
[0040] The user can flexibly select the judgment module by selecting structure 6 according to the thickness accuracy requirement of the measured part: when the thickness accuracy requirement of the measured part is relatively high, the first judgment module is selected to judge whether the thickness of the measured part is qualified, that is, the thickness of each measured position is judged to be qualified only when it is within the qualified range. When the thickness accuracy requirement of the measured part is relatively low, the second judgment module is used to judge whether the thickness of the measured part is qualified, that is, as long as the average thickness of the sample is within the qualified range, the thickness is judged to be qualified.
[0041] More specifically, the first input structure 4, the second input structure 5 and the selection structure 6 can be physical keys or virtual keys built into the panel. In the illustrated embodiment, the first input structure 4, the second input structure 5 and the selection structure 6 are all virtual keys built into the panel.
[0042] In one embodiment, the thickness measuring device further includes a setting structure 10, and the setting structure 10 allows the user to set the sampling distance and / or the number of samples of the sample. The sampling distance refers to the distance between two adjacent measured positions in the sample. In this way, the user can select a suitable sampling distance and number of samples according to the size of the measured component.
[0043] More specifically, the setting structure 10 can be a physical key or a virtual key built into the panel. In the illustrated embodiment, the setting structure 10 is a virtual key built into the panel. The setting structure 10 and the first input structure 4, the second input structure 5 and the selection structure 6 are all built into the same setting panel 11.
[0044] In one embodiment, the thickness measuring device further includes a display panel 7, which is connected to the first calculation module and the second calculation module in communication, so that the display panel 7 can display the calculation results of the first calculation module and the second calculation module, and the display panel 7 is also connected to the first judgment module and the second judgment module in communication, so that the display panel 7 can display whether the thickness is qualified or not. More specifically, the display panel 7 and the above-mentioned setting panel 11 can be the same panel or different panels.
[0045] In one embodiment, the thickness measuring device includes a voice announcer 8, which is communicatively connected with the first judgment module and the second judgment module, so that the voice announcer 8 can announce whether the thickness is qualified or not.
[0046] The above embodiments can be freely combined without conflict.
[0047] The above specific examples are used to illustrate the principles and implementation methods of the present application. The description of the above embodiments is only used to help understand the method and core ideas of the present application. It should be pointed out that for ordinary technicians in this technical field, without departing from the principles of the present application, several improvements and modifications can be made to the present application, and these improvements and modifications also fall within the scope of protection of the claims of the present application.
Claims
1. A thickness measuring device, characterized in that: The thickness measuring device comprises a base (1) and two measuring parts (2), the two measuring parts (2) are both assembled on the base (1), at least one of the two measuring parts (2) can slide relative to the base (1) so that the two measuring parts (2) can approach or move away from each other, and the two measuring parts (2) each comprise a roller (21) that can rotate relative to the base (1), and when measuring, the outer peripheral surfaces of the rollers (21) of the two measuring parts (2) respectively abut against the thickness of the component to be measured on both sides.
2. The thickness measuring device according to claim 1, characterized in that: The thickness measuring device comprises an elastic reset element, which is used to reset the measuring part (2) to an initial position.
3. The thickness measuring device according to claim 1, characterized in that: The thickness measuring device comprises a sensor (9) and a processor (3), wherein the sensor (9) detects the sliding amount of the measuring part (2) relative to the substrate (1), and the processor (3) comprises a first calculation module and a storage module, wherein the first calculation module is connected in communication with the sensor (9) so that the first calculation module can calculate the thickness of a single measured position of the measured component according to the detection data of the sensor (9), and the storage module is connected in communication with the first calculation module so that the storage module can store the calculation result of the first calculation module.
4. The thickness measuring device according to claim 3, characterized in that: The processor (3) further comprises a first judgment module, and the thickness measuring device further comprises a first input structure (4), wherein the first input structure (4) allows a user to input a thickness acceptance range of a single measurement position of the measured component into the processor (3), and the first judgment module is communicatively connected with the first calculation module, so that the first judgment module can judge whether the thickness of each measured position of the measured component is within the acceptance range.
5. The thickness measuring device according to claim 4, characterized in that: The processor (3) also includes a second calculation module, which is in communication with the storage module, so that the second calculation module can select the thickness of multiple measured positions of the measured component from the storage module as samples to calculate the average thickness of the samples, and the storage module can store the calculation results of the second calculation module.
6. The thickness measuring device according to claim 5, characterized in that: The processor (3) further comprises a second judgment module, and the thickness measuring device further comprises a second input structure (5) and a selection structure (6), wherein the second input structure (5) allows a user to input a qualified range of a sample thickness mean into the processor (3), and the selection structure (6) allows a user to select the first judgment module or the second judgment module, and the second judgment module is communicatively connected with the second calculation module, so that the second judgment module can judge whether the sample thickness mean is within the qualified range.
7. The thickness measuring device according to claim 6, characterized in that: The thickness measuring device further comprises a setting structure (10), wherein the setting structure (10) allows a user to set a sampling distance and / or a sampling number of samples and select a judgment module.
8. The thickness measuring device according to claim 6, characterized in that: The thickness measuring device comprises a display panel (7), wherein the display panel (7) is communicatively connected to the first calculation module and the second calculation module, so that the display panel (7) can display the calculation results of the first calculation module and the calculation results of the second calculation module, and the display panel (7) is also communicatively connected to the first judgment module and the second judgment module, so that the display panel (7) can display whether the thickness is qualified or not.
9. The thickness measuring device according to claim 6, characterized in that: The thickness measuring device comprises a voice announcer (8), and the voice announcer (8) is communicatively connected with the first judgment module and the second judgment module, so that the voice announcer (8) can announce whether the thickness is qualified or not.
10. The thickness measuring device according to any one of claims 1 to 9, characterized in that: The surface of the base body (1) is provided with scales (11).