Test device and test system

Abstract

The utility model relates to a test device and a test system. The test equipment comprises a four-quadrant power supply provided with a power supply circuit and a detection circuit, the power supply circuit is used for connecting to-be-tested equipment, and the power supply circuit is used for charging the to-be-tested equipment in an external sink current output constant voltage mode and discharging the to-be-tested equipment in an external sink current output constant voltage mode; the detection circuit is used for detecting charging information of the power supply circuit for charging the to-be-detected device and discharging information of the power supply circuit for discharging the to-be-detected device. Therefore, the test equipment can perform charging test in an external charging current output constant voltage mode and discharging test in an external suction current output constant voltage mode on different charging interfaces (such as a VBUS charger charging interface and a VBAT battery charging interface) of the to-be-tested equipment through the power supply circuit; and the charging information and the discharging information in the charging and discharging test process are detected through the detection circuit of the four-quadrant power supply, so that the integration level of the detection equipment is improved, and the test cost is reduced.

Description

Technical Field

[0001] The present application relates to the technical field of testing equipment, and in particular to testing equipment and testing systems. Background Art

[0002] In the field of test equipment technology, in order to perform charge and discharge tests on the device under test, the test equipment is usually equipped with a charge and discharge circuit, which uses a simulated battery circuit. However, there are many disadvantages in using a simulated battery circuit for charge and discharge circuits, such as the inability to simulate the internal resistance changes of the real voltage under different states, the inability to simulate the complex characteristics of the battery, the lack of flexibility in controlling current and voltage, resulting in inaccurate test results, the need for additional components and equipment construction, and increased equipment costs. Utility Model Content

[0003] Based on this, it is necessary to provide a test device and a test system to address the above technical issues.

[0004] In a first aspect, the present application provides a testing device, the testing device comprising:

[0005] A four-quadrant power supply includes a power supply circuit and a detection circuit, wherein the power supply circuit is connected to the detection circuit and is used to connect to a device under test, wherein the power supply circuit is used to charge the device under test in a constant voltage output mode for external current injection and to discharge the device under test in a constant current output mode for external current absorption; and wherein the detection circuit is used to detect charging information of the power supply circuit charging the device under test and discharge information of the power supply circuit discharging the device under test.

[0006] In one embodiment, the testing device further comprises:

[0007] Infrared LED test module, used to connect to the infrared driver module in the device under test;

[0008] A first current sampling module, connected to the infrared LED test module, for collecting a first working current when the infrared LED test module is working under the driving action of the infrared driving module;

[0009] The first AC voltage collection module is connected to the infrared LED test module and is used to collect the first working voltage of the infrared LED test module when the infrared LED test module is working under the driving action of the infrared driving module.

[0010] In one embodiment, the testing device further comprises:

[0011] Backlight LED test module, used to connect to the backlight driver module of the device under test;

[0012] A second current sampling module, connected to the backlight LED test module, for collecting a second working current when the backlight LED test module is working under the driving action of the backlight driving module;

[0013] The second AC voltage collection module is connected to the backlight LED test module and is used to collect the second working voltage of the backlight LED test module when the backlight LED test module is working under the driving action of the backlight driving module.

[0014] In one embodiment, the testing device further comprises:

[0015] The first DC voltage acquisition module is used to connect to the device under test to acquire the system voltage of the device under test.

[0016] In one embodiment, the testing device further comprises:

[0017] Display peripheral module, used to connect to the display driver module of the device under test;

[0018] The second DC voltage acquisition module is connected to the display peripheral module and is used to connect to the display driver module to respectively acquire the first display analog signal when the display peripheral module is unloaded and the second display analog signal when connected to the display peripheral module.

[0019] In one embodiment, the testing device further comprises:

[0020] An audio test module, used for connecting to a device under test to output a test signal to the device under test;

[0021] A speaker peripheral module, connected to the audio test module, used to connect to the device under test to receive the test signal after amplification by the device under test, and generate a corresponding audio signal;

[0022] The audio test module is also used to collect the audio signal.

[0023] In one embodiment, the testing device further comprises:

[0024] The button test module is used to connect to the device under test to output a button signal to the device under test; the button signal is used to represent the signal received by the device under test when the button is pressed.

[0025] In one embodiment, the testing device further comprises:

[0026] A main control module is connected to the power supply circuit and the detection circuit, and is used to output a control signal to control the power supply circuit to charge the device under test in a constant voltage mode for external current injection or to discharge the device under test in a constant current absorption mode, and to receive the charging information and discharging information detected by the detection circuit.

[0027] In one embodiment, the main control module includes:

[0028] An ARM processing unit, connected to the power supply circuit, and configured to output the control signal;

[0029] The FPGA processing unit is connected to the detection circuit and is used to receive the charging information and the discharging information.

[0030] In a second aspect, the present application also provides a testing system, comprising:

[0031] VR motherboard;

[0032] The testing device as mentioned above is used to connect to the VR mainboard to perform functional testing on the VR mainboard.

[0033] The above-mentioned test equipment and test system, the test equipment includes a four-quadrant power supply, the four-quadrant power supply includes a power supply circuit and a detection circuit, the power supply circuit is connected to the detection circuit, and the power supply circuit is used to connect the device to be tested, the power supply circuit is used to charge the device to be tested in a constant voltage mode of external current injection output, and discharge the device to be tested in a constant mode of external current absorption output; the detection circuit is used to detect the charging information of the power supply circuit charging the device to be tested and the discharge information of the power supply circuit discharging the device to be tested. Therefore, the four-quadrant power supply in the test equipment of the present application integrates the power supply circuit and the detection circuit, and can perform external current injection output constant voltage mode charging test and external current absorption output constant mode discharge test on different charging interfaces of the device to be tested (such as VBUS charger charging interface and VBAT battery charging interface) through the power supply circuit, and detect the charging information and discharge information during the charging and discharging test through the detection circuit of the four-quadrant power supply itself, thereby improving the integration of the detection equipment, reducing the test cost, and being able to flexibly simulate the internal resistance changes of the real battery of the device to be tested in different states, ensuring the test accuracy. BRIEF DESCRIPTION OF THE DRAWINGS

[0034] Figure 1 This is one of the structural schematic diagrams of a testing device in one embodiment of the present application;

[0035] Figure 2 Schematic diagram of the structure of a four-quadrant power supply in one embodiment of the present application;

[0036] Figure 3 This is a second structural diagram of a testing device in an embodiment of the present application;

[0037] Figure 4 Schematic diagram of the structure of a test system in one embodiment of the present application.

[0038] Description of Figure Numbers:

[0039] Test equipment: 100; four-quadrant power supply: 110; power supply circuit: 111; detection circuit: 112; infrared LED test module: 120; first current sampling module: 130; first AC voltage acquisition module: 140; backlight LED test module: 150; second current sampling module: 160; second AC voltage acquisition module: 170; first DC voltage acquisition module: 180; display peripheral module: 190; second DC voltage acquisition module: 1100; audio test module: 1200; speaker peripheral module: 1300; button test module: 1400; main control module: 1500. DETAILED DESCRIPTION

[0040] In order to make the above-mentioned purposes, features and advantages of the present application more obvious and easy to understand, the specific implementation methods of the present application are described in detail below in conjunction with the accompanying drawings. In the following description, many specific details are set forth to facilitate a full understanding of the present application. However, the present application can be implemented in many other ways different from those described herein, and those skilled in the art can make similar improvements without violating the connotation of the present application, so the present application is not limited by the specific embodiments disclosed below.

[0041] In addition, the terms "first" and "second" are used for descriptive purposes only and should not be understood as indicating or implying relative importance or implicitly indicating the number of the indicated technical features. Therefore, the features defined as "first" and "second" may explicitly or implicitly include at least one of the features. In the description of this application, the meaning of "plurality" is at least two, such as two, three, etc., unless otherwise clearly and specifically defined.

[0042] In this application, unless otherwise clearly specified and limited, the terms "installed", "connected", "connected", "fixed" and the like should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection or an indirect connection through an intermediate medium, it can be the internal connection of two elements or the interaction relationship between two elements, unless otherwise clearly defined. For ordinary technicians in this field, the specific meanings of the above terms in this application can be understood according to specific circumstances.

[0043] The test equipment provided in this application is used to perform FCT test (Functional Circuit Test) on the device under test. The FCT test mainly provides a simulated operating environment (excitation and load) for the test target board, so that it works in various design states, thereby obtaining the parameters of each state to verify the function of the test target board. A test method. Simply put, it is to load a suitable excitation to the test target board and measure whether the output response meets the requirements. Generally refers to the functional test of PCBA (Printed Circuit Board + Assembly, i.e., PCB empty board, circuit board after SMT loading, or after the entire process of DIP plug-in). That is, the device under test can be any PCB empty board, such as a VR (Virtual Reality) motherboard. VR is a new type of electronic product that has come out in recent years, mainly used to realize virtual scenes to simulate the human body. VR products have high functional integration, and the functions that need to be tested are also relatively cumbersome. The current technical solutions mainly use standard desktop instruments for testing, such as external meters, oscilloscopes, power supplies, electronic loads, frequency generators and audio equipment, etc. These test environments are composed of a large number of instruments. The test environment is bloated and the communication is independent, which increases the instability of the connection in the test. At the same time, the cost of standard desktop instruments is expensive, which increases the production test cost.

[0044] In one embodiment, the present application provides a testing device 100, referring to Figure 1 , Figure 1 One of the structural schematic diagrams of the test device 100 in an embodiment of the present application is shown. The test device 100 in this embodiment includes a four-quadrant power supply 110, and the four-quadrant power supply 110 includes a power supply circuit 111 and a detection circuit 112. The power supply circuit 111 is connected to the detection circuit 112, and the power supply circuit 111 is used to connect to the device under test 200. The power supply circuit 111 is used to charge the device under test 200 in a constant voltage mode of external current injection output, and to discharge the device under test 200 in a constant current absorption output mode; the detection circuit 112 is used to detect the charging information of the power supply circuit 111 charging the device under test 200 and the discharge information of the power supply circuit 111 discharging the device under test 200.

[0045] The power supply circuit 111 includes a power supply branch and a control branch, the power supply branch is connected to the control branch, and the control branch controls the power supply branch to charge the device under test 200 in a constant voltage mode for external current injection or discharge the device under test 200 in a constant current output mode for external current absorption. It can be understood that when the device under test 200 is subjected to charge and discharge tests, the charging test and the discharge test are usually performed in time division, and the power supply circuit 111 is used to connect different power supply interfaces of the device under test 200, such as the VBUS charger interface and the VBAT battery interface. When the VBUS charger interface is connected, the control branch can control the power supply branch to charge the device under test 200 in a constant voltage mode for external current injection, and when the VBAT battery interface is connected, the control branch can control the power supply branch to discharge the device under test 200 in a constant current output mode for external current absorption. The detection circuit 112 is connected to the power supply circuit 111, and can detect in real time the charging information when the power supply circuit 111 performs a charging test on the device under test 200 and the discharging information when the discharge test is performed. The charging information includes the charging voltage and the charging current, and the discharging information includes the discharging voltage and the discharging current.

[0046] Among them, the power supply circuit 111 of the four-quadrant power supply 110 can provide accurate voltage output when charging the device under test 200 in the mode of outputting constant voltage to the external current, and the current can change according to the load change. Compared with the traditional DC power supply, the traditional DC power supply can usually only work in the first quadrant, that is, the output current changes with the load when the positive voltage is output, or the output voltage changes with the load when the output current is constant. The four-quadrant power supply 110 can work in the four quadrants of the coordinate system, which means that it can provide energy as a power supply in the first and third quadrants and absorb energy as a load in the second and fourth quadrants. In the mode of outputting constant voltage to the external current, the power supply circuit 111 of the four-quadrant power supply 110 can maintain a fixed voltage value to charge the device under test 200, and the current can change according to the load change, that is, the power supply circuit 111 of the four-quadrant power supply 110 can flexibly adapt to different load conditions, which is conducive to flexible and accurate control of voltage and current, and is suitable for various power application requirements of the device under test 200.

[0047] The constant mode of the external current absorption output of the four-quadrant power supply 110 is a working state capable of absorbing current. In the second and fourth quadrants, the power supply circuit 111 of the four-quadrant power supply 110 can absorb current as a load. This means that the power supply can not only provide energy, but also absorb energy, thereby controlling the discharge behavior of the device under test 200. Compared with traditional DC power supplies, the four-quadrant power supply 110 provides more flexibility and control capabilities. It can not only provide a constant voltage or current, but also absorb current as needed, simplifying the internal structure of the test device 100, saving space for the test device 100, and reducing costs, while being able to flexibly and accurately perform discharge tests on the device under test 200.

[0048] For example, Figure 2The schematic diagram of the structure of the four-quadrant power supply 110 shown in the figure, wherein the power supply circuit 111 includes resistors R1 to R5, MOS transistors Q1 to Q4, a DAC module, a power amplifier AMP and a MOSFET driving source, the gate of the MOS transistor Q1 and one end of the resistor R1 are connected to the positive power supply terminal of the power amplifier AMP, the other end of the resistor R1 is connected to the drain of the MOS transistor Q1, the source of the MOS transistor Q1 is connected to the output end of the power amplifier AMP and the drain of the MOS transistor Q2, the gate, source and one end of the MOS transistor Q2 are connected to the negative power supply terminal of the power amplifier The non-inverting input terminal of the power amplifier AMP is connected to the DAC module, the inverting input terminal of the power amplifier AMP is connected to one end of the resistor R3, the other end of the resistor R3 is connected to the ground terminal, the output terminal of the power amplifier AMP is also connected to the first end of the detection circuit 112, the two ends of the resistor R4 are respectively connected to the inverting input terminal of the power amplifier AMP and the second end of the detection circuit 112, the drain of the MOS tube Q3 is connected to the third end of the detection circuit 112, the source of the MOS tube Q3 is connected to the source of the MOS tube Q4, and the drain of the MOS tube Q4 is connected to the second end of the detection circuit 112, The gates of the MOS tubes Q3 and Q4 are connected to the driving source of the MOSFET, and the two ends of the resistor R5 are respectively connected to the second end of the detection circuit 112 and the ground terminal GND; the detection circuit 112 includes a resistor R6, a differential operational amplifier OPA, a follower BUFFER and an ADC module, and the two ends of the resistor R6 are respectively connected to the output end of the power amplifier AMP and the drain of the MOS tube Q3 as the first end and the third end of the detection circuit 112, and the first end and the third end of the resistor R3 are also respectively connected to the two input ends of the differential operational amplifier OPA, and the differential operational amplifier OPA The output end is connected to the ADC module, and the input end of the follower BUFFER is connected to the resistor R4, the drain of the MOS tube Q4 and one end of the resistor R5 as the second end of the detection circuit 112; the DAC module receives an external control signal to generate a corresponding voltage signal, which acts on the power amplifier AMP. When the MOS tube Q1 is turned on, the device under test 200 is charged in a constant voltage mode for external current injection output, and when the MOS tube Q2 is turned on, the device under test 200 is discharged in a constant mode for external current absorption output, and the charging information and the discharging information are collected through the ADC module. The four-quadrant power supply 110 in this embodiment is composed of analog devices and can provide a 60W power supply circuit 111. The power supply circuit 111 has a four-quadrant characteristic, that is, it can work in any state of injecting positive and negative voltage and current or absorbing positive and negative voltage and current, and the voltage has an output linear adjustment range of -14V to 14V, and the current has an output capacity of -5A to 5A. At the same time, the voltage and current detection functions can be realized through its own detection circuit 112, and the voltage and current values ​​in the charging and discharging detection process can be read at any time.

[0049] It is understandable that the conditions for the power supply circuit 111 to charge the device under test 200 in the external current input constant voltage output mode and the conditions for discharging the device under test 200 in the external current absorption constant output mode can be flexibly set based on actual needs. For example, by setting up a main control module in the test device 100, the main control module can be a switch or a processor. Taking the switch as an example, the switch can be manually controlled. When the switch is in the first state (such as being connected to the charging end of the power supply circuit 111), the power supply circuit 111 charges the device under test 200 in the external current input constant voltage output mode. When the switch is in the second state (such as being connected to the discharge end of the power supply circuit 111), the power supply circuit 111 discharges the device under test 200 in the external current absorption constant output mode.

[0050] In another exemplary embodiment, the main control module includes a processor as an example for explanation. The main control module is connected to the power supply circuit 111 and the detection circuit 112, and is used to output a first control signal to control the power supply circuit 111 to charge the device under test 200 in a constant voltage mode for external current injection, or output a second control signal to control the power supply circuit 111 to discharge the device under test 200 in a constant voltage mode for external current absorption, and receive the charging information and discharging information detected by the detection circuit 112. Specifically, in combination with the attached Figure 2 When the DAC module receives the first control signal, the MOS tube Q1 is turned on, and the power supply circuit 111 charges the device under test 200 in a constant voltage output mode for external current injection. When the DAC module receives the second control signal, the MOS tube Q2 is turned on, and the power supply circuit 111 discharges the device under test 200 in a constant voltage output mode for external current absorption. Further, the processor in the main control module may include an FPGA (Field-Programmable Gate Array) processor chip and an ARM (Advanced RISC Machines) processor chip. The ARM processor chip runs the processing system carried by the ARM processor chip, which is mainly responsible for the command and data interaction on the Ethernet with the external IPC (Inter-Process Communication) and outputs the corresponding control signal to the four-quadrant power supply 110; the FPGA processor chip is responsible for processing the complex operation of the data and the control instructions from the ARM processor chip, for example, the FPGA processor chip receives the charging information and the discharging information, and performs data analysis and comparison on the charging information and the discharging information to determine whether the charging and discharging performance of the device under test 200 meets the preset requirements.

[0051] In this embodiment, the four-quadrant power supply 110 in the test device 100 integrates a power supply circuit 111 and a detection circuit 112, and can perform external current input constant voltage mode charging test and external current output constant mode discharge test on different charging interfaces of the device under test 200 (such as the VBUS charger charging interface and the VBAT battery charging interface) through the power supply circuit 111, and detect the charging information and discharge information during the charging and discharging test through the detection circuit 112 of the four-quadrant power supply 110 itself, thereby improving the integration of the detection equipment, reducing the testing cost, and being able to flexibly simulate the internal resistance changes of the real battery of the device under test 200 in different states, thereby ensuring the test accuracy.

[0052] In one embodiment, the test device also includes an infrared LED test module, a first current sampling module and a first AC voltage acquisition module. The infrared LED test module is used to connect to the infrared driving module in the device to be tested; the first current sampling module is connected to the infrared LED test module, and is used to collect the first working current of the infrared LED test module when it is working under the driving action of the infrared driving module; the first AC voltage acquisition module is connected to the infrared LED test module, and is used to collect the first working voltage of the infrared LED test module when it is working under the driving action of the infrared driving module.

[0053] Among them, the infrared LED test module can be understood as an infrared light-emitting diode corresponding to the device under test, which is used to connect the infrared driving module of the device under test. The infrared driving module applies a pulse of a preset period to the infrared LED test module to start the infrared LED test module to work. At this time, the first current sampling module can collect the first working current when the infrared LED test module is working, and the first AC voltage acquisition module converts the AC analog signal into a digital signal (i.e., the first working voltage) and records it. The acquisition conversion rate can reach up to 4M / s. It can be understood that the test device can also be connected to an external processor, and the processor performs waveform analysis processing on the first working current and the first working voltage, such as filtering processing. Specifically, the processor restores the first working voltage to an analog signal waveform, thereby accurately obtaining the high-level data in the waveform, and calculating the average value or effective value of the high level, and it can be judged based on the analysis result whether the infrared LED drive of the device under test meets the preset requirements.

[0054] In one embodiment, the testing device also includes a backlight LED testing module, a second current sampling module and a second AC voltage acquisition module. The backlight LED testing module is used to connect to the backlight driving module of the device to be tested; the second current sampling module is connected to the backlight LED testing module, and is used to collect the second working current of the backlight LED testing module when it is working under the driving action of the backlight driving module; the second AC voltage acquisition module is connected to the backlight LED testing module, and is used to collect the second working voltage of the backlight LED testing module when it is working under the driving action of the backlight driving module.

[0055] Among them, the backlight LED test module can be understood as a light-emitting diode module used for liquid crystal display of the device under test. The backlight LED test module is used to connect to the backlight driver module of the device under test. The backlight driver module applies a switch signal with a preset frequency and duty cycle to the backlight LED test module, so that the backlight LED test module is regularly turned on and off. At this time, the second current sampling module and the second AC voltage acquisition module collect the second working current and the second working voltage generated by the backlight LED test module. It can be understood that when the test device is connected to an external processor, the processor can calculate the corresponding current value and voltage value based on the waveform of the second working current and the second working voltage. Further judging the current value and voltage value can determine whether the backlight LED driving performance of the device under test meets the preset requirements.

[0056] In one embodiment, the testing device further includes a first DC voltage acquisition module, and the first DC voltage acquisition module is used to connect to the device under test to acquire the system voltage of the device under test.

[0057] It is understandable that there are various system voltages on the device under test. When performing functional tests on the device under test, it is also necessary to collect these system voltages to further determine whether they exceed the specifications of the device under test based on the collected system voltages. In this embodiment, the system voltage is collected by the first DC voltage collection module, and the collected system voltage can be filtered to achieve stable analog-to-digital conversion. At the same time, the conversion rate can reach up to 250K / s, thereby achieving efficient system voltage collection.

[0058] In one embodiment, the test device also includes a display peripheral module and a second DC voltage acquisition module, the display peripheral module is used to connect to the display driver module of the device under test; the second DC voltage acquisition module is connected to the display peripheral module and is used to connect to the display driver module to respectively collect the first display analog signal when the display peripheral module is unloaded and the second display analog signal when connected to the display peripheral module.

[0059] Among them, the display peripheral module can be understood as an interface module in the device under test for interacting with the external environment, such as the camera module of a VR product, a head-mounted display device, etc. The display peripheral module simulates the loading of the display analog signal of the device under test, and the second DC voltage sampling module collects the display analog signal of the device under test before and after loading, such as the first display analog signal when unloaded and the second display analog signal when connected to the display peripheral module, and performs filtering and analog-to-digital conversion on the display analog signal, and the conversion rate can reach up to 250K / s. It can be understood that when the test module is also connected to an external processor, the processor can compare the amplitudes of the first display analog signal and the second display analog signal after filtering, and judge whether the display drive of the device under test meets the preset requirements based on the comparison results.

[0060] In one embodiment, the test device also includes an audio test module and a speaker peripheral module. The audio test module is used to connect to the device under test to output a test signal to the device under test; the speaker peripheral module is connected to the audio test module, and is used to connect to the device under test to receive the test signal after amplification and processing by the device under test, and generate a corresponding audio signal; the audio test module is also used to collect audio signals.

[0061] Among them, the audio test module can be understood as the audio amplifier module of the device under test. The audio test module first outputs a test signal in the form of a digital signal in the PDM (Pulse Density Modulation) format to the device under test. When the device under test receives the test signal, it parses the digital test signal into a test signal in the form of an analog signal, and amplifies the analog signal through the power amplifier circuit inside the device under test and outputs it to the speaker peripheral module. The speaker peripheral module generates a corresponding audio signal based on the amplified analog signal. At this time, the audio test module collects the audio signal in the form of an analog signal. It can be understood that when the test device is connected to an external processor, the processor can further obtain corresponding signal parameters (such as frequency and amplitude) based on the audio signal in the form of an analog signal, so as to judge whether the audio function of the device under test meets the preset requirements based on the signal parameters.

[0062] In one embodiment, the test device further includes a button test module, which is used to connect to the device under test to output a button signal to the device under test; the button signal is used to represent a signal received by the device under test when the button is pressed.

[0063] Among them, the button test module can be understood as a module that implements the button function in the device under test. The button function of the device under test is simulated through the button test module. When the button test module is pressed, the corresponding generated button signal is input into the device under test. The device under test responds to the corresponding button function based on the button signal. Based on whether the response conforms to the preset button function, it can be judged whether the button control circuit of the device under test is normal.

[0064] In one embodiment, Figure 3 The second structural diagram of the test device 100 shown in the figure, the test device 100 in this embodiment includes a four-quadrant power supply 110, an infrared LED test module 120, a first current sampling module 130, a first AC voltage acquisition module 140, a backlight LED test module 150, a second current sampling module 160, a second AC voltage acquisition module 170, a first DC voltage acquisition module 180, a display peripheral module 190, a second DC voltage acquisition module 1100, an audio test module 1200, a speaker peripheral module 1300, a button test module 1400 and a main control module 1500. The functional connection relationship of each module of the test device in this embodiment is the same as the connection relationship and function of the corresponding modules in any of the above embodiments, so it will not be repeated here.

[0065] The test device in this embodiment integrates multiple functional test modules, which can meet the various functional test requirements of the test device. At the same time, multiple functional test modules are integrated into the same test device, ensuring stable communication, and only requiring one power supply interface and one communication interface to implement multiple functional tests. Compared with existing standard test instruments, which require separate power supply and communication, are complex to use and control, and have a short test time, the test device in this embodiment has a high degree of integration, which further improves the communication efficiency and the production capacity of the test equipment.

[0066] In one embodiment, the present application also provides a testing system, such as Figure 4 The structural diagram of the test system shown in the figure, the test system in this embodiment includes a VR mainboard and the test device in any of the above embodiments, and the test device is used to connect to the VR mainboard to perform functional tests on the VR mainboard.

[0067] It can be understood that the test system in this embodiment uses the test equipment in the above-mentioned embodiments for testing. On the one hand, the four-quadrant power supply accurately and flexibly performs charge and discharge tests on the device under test, and simultaneously obtains charging information and discharging information, thereby improving test accuracy and test efficiency. On the other hand, the test equipment in the above-mentioned embodiments of the present application can meet various functional test requirements, has a high degree of integration, and further improves the communication efficiency and the production capacity of the test equipment.

[0068] The technical features of the above-described embodiments may be arbitrarily combined. To make the description concise, not all possible combinations of the technical features in the above-described embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0069] The above-described embodiments only express several implementation methods of the present application, and the descriptions thereof are relatively specific and detailed, but they cannot be construed as limiting the scope of the application. It should be noted that, for a person of ordinary skill in the art, several variations and improvements may be made without departing from the concept of the present application, and these all belong to the protection scope of the present application. Therefore, the protection scope of the patent of the present application shall be subject to the attached claims.

Claims

1. A testing device, characterized in that: The test equipment includes: A four-quadrant power supply includes a power supply circuit and a detection circuit, wherein the power supply circuit is connected to the detection circuit and is used to connect to a device under test, wherein the power supply circuit is used to charge the device under test in a constant voltage output mode for external current injection and to discharge the device under test in a constant current output mode for external current absorption; and wherein the detection circuit is used to detect charging information of the power supply circuit charging the device under test and discharge information of the power supply circuit discharging the device under test.

2. The test device according to claim 1, characterized in that The testing equipment also includes: Infrared LED test module, used to connect to the infrared driver module in the device under test; A first current sampling module, connected to the infrared LED test module, for collecting a first working current when the infrared LED test module is working under the driving action of the infrared driving module; The first AC voltage collection module is connected to the infrared LED test module and is used to collect the first working voltage of the infrared LED test module when the infrared LED test module is working under the driving action of the infrared driving module.

3. The testing device according to claim 1, characterized in that The testing equipment also includes: Backlight LED test module, used to connect to the backlight driver module of the device under test; A second current sampling module, connected to the backlight LED test module, for collecting a second working current when the backlight LED test module is working under the driving action of the backlight driving module; The second AC voltage collection module is connected to the backlight LED test module and is used to collect the second working voltage of the backlight LED test module when the backlight LED test module is working under the driving action of the backlight driving module.

4. The testing device according to claim 1, characterized in that The testing equipment also includes: The first DC voltage acquisition module is used to connect to the device under test to acquire the system voltage of the device under test.

5. The testing device according to claim 1, characterized in that The testing equipment also includes: Display peripheral module, used to connect to the display driver module of the device under test; The second DC voltage acquisition module is connected to the display peripheral module and is used to connect to the display driver module to respectively acquire the first display analog signal when the display peripheral module is unloaded and the second display analog signal when connected to the display peripheral module.

6. The testing device according to claim 1, characterized in that The testing equipment also includes: An audio test module, used for connecting to a device under test to output a test signal to the device under test; A speaker peripheral module, connected to the audio test module, used to connect to the device under test to receive the test signal after amplification by the device under test, and generate a corresponding audio signal; The audio test module is also used to collect the audio signal.

7. The testing device according to claim 1, characterized in that The testing equipment also includes: The button test module is used to connect to the device under test to output a button signal to the device under test; the button signal is used to represent the signal received by the device under test when the button is pressed.

8. The testing device according to claim 1, characterized in that The testing equipment also includes: A main control module is connected to the power supply circuit and the detection circuit, and is used to output a control signal to control the power supply circuit to charge the device under test in a constant voltage mode for external current injection or to discharge the device under test in a constant current absorption mode, and to receive the charging information and discharging information detected by the detection circuit.

9. The testing device according to claim 8, characterized in that The main control module comprises: An ARM processing unit, connected to the power supply circuit, and configured to output the control signal; The FPGA processing unit is connected to the detection circuit and is used to receive the charging information and the discharging information.

10. A testing system, characterized in that: include: VR motherboard; The test device as claimed in any one of claims 1 to 9, used to connect the VR motherboard to perform functional testing on the VR motherboard.

Images