Test piece for IPM test and clamp thereof

Abstract

The utility model discloses a tester for IPM testing and a clamp thereof. Two testers for IPM testing can be stacked to form a testing tester group. A plurality of contact pins of the two IPM testing testers in one testing testers group abut against the testing board, the testing board is a circuit board which is a PVC printed circuit board, a copper layer is printed on the circuit board, and the plurality of contact pins are pressed against the copper layer of the testing board. The plurality of pressure testing elastic arms of the two IPM testing testers can abut against the plurality of input pins in a one-to-one correspondence manner under the driving of the clamp, so that the IPM module can be tested, that is, two testing points are designed on a testing machine circuit so as to form a loop to test a contact resistance value, the IPM module is specifically a formed IPM module, and the testing efficiency of the IPM module is greatly improved. Therefore, the problem that an existing tester cannot be suitable for testing after the IPM module is formed is solved, and the 100% yield of products before warehousing is ensured.

Description

Technical Field

[0001] The utility model relates to the technical field of IPM manufacturing, in particular to a tester and a fixture for IPM testing. Background Art

[0002] In the semiconductor packaging and testing process, there is a key process before the product is put into storage: testing. The main function of the test is to check whether the quality of the semiconductor chip meets certain standards, so as to eliminate defective products and improve the reliability of the chip. The test function of the product needs to be realized by the tester. One end of the tester contacts the product pin and the other end is connected to the test board. The test board communicates the test signal through the connecting wire and the tester to complete the test. Specifically, the contact impedance value can be tested to achieve the test effect.

[0003] In the existing testing process, the IPM module is tested after cutting the pins, and then molded after the test. This testing process is prone to cause stress, which can easily cause damage to the product, and the yield rate of warehousing cannot be guaranteed. In addition, the original tester process has poor testing effect, which can easily cause misjudgment of poor contact. Therefore, in order to ensure 100% yield of products before warehousing, it is necessary to adjust the testing process to test after molding. However, the existing tester cannot adapt to the test of IPM modules after molding, and the tester structure needs to be redesigned. Utility Model Content

[0004] The utility model aims to provide a tester and a fixture for IPM testing, aiming to solve the technical problem that the tester in the related art cannot be adapted to the test after the IPM module is formed.

[0005] In order to solve the above problems, according to one aspect of the present application, an embodiment of the utility model provides an IPM test probe, which is installed on a fixture to test the IPM module installed on the fixture. The IPM test probe includes two insulating films and a plurality of spaced substrates clamped between the two insulating films, the two ends of the substrate are bent to form a contact pin and a pressure test spring arm, and two IPM test probes can be stacked to form a test probe group;

[0006] The multiple contact pins of two IPM test probes in a group of the test probes are all in contact with the test board, and the multiple pressure test spring arms of the two IPM test probes are driven by the fixture to contact with the multiple input pins one by one.

[0007] In some embodiments, the IPM module also has multiple test pins, and the multiple contact pins of the two IPM test probes of another group of the test probes are abutted against the test board, and the multiple pressure test spring arms of the two IPM test probes are abutted against the multiple test pins one by one under the drive of the fixture.

[0008] In some embodiments, the substrate is made of gold-plated beryllium copper; and / or the substrate is a long sheet structure with a thickness of 0.3±0.05 mm.

[0009] In some embodiments, the insulating film is made of a PI film; and / or the insulating film has a thickness of 0.075±0.005 mm.

[0010] In some embodiments, the pressure test spring arms corresponding to the two IPM test probes in the test probe group are arranged to overlap with each other in upper and lower intervals, and both extend toward the IPM module corresponding to the IPM module.

[0011] In some embodiments, the end of the upper pressure-detection spring arm of the two pressure-detection spring arms that are overlapped and spaced apart from each other is configured with a first extension section that is parallel to the input pin.

[0012] In some embodiments, the corresponding contact pins of the two IPM test probes in the test probe group extend in opposite directions.

[0013] In some embodiments, the end of the contact pin is configured with a second extension section arranged parallel to the test board.

[0014] According to another aspect of the present application, an embodiment of the present utility model further provides a fixture, wherein the fixture includes the IPM test probe as described above.

[0015] In some embodiments, when the IPM module includes multiple test pins, the fixture includes a base mounted on the test board, two first fixed seats arranged on both sides of the base, a second fixed seat arranged above the base, and a driving component arranged on both sides of the two first fixed seats, the IPM module is mounted on the second fixed seat, and the multiple input pins and the multiple test pins are respectively located on the opposite sides of the second fixed seat and the two first fixed seats, two pairs of the test probe groups are respectively clamped between the base and the two first fixed seats, one driving component can drive the multiple pressure measuring spring arms of the two IPM test probes in one group of the test probe groups to abut against the multiple input pins in a one-to-one manner, and the other driving component can drive the multiple pressure measuring spring arms of the IPM test probes in another group of the test probe groups to abut against the multiple test pins in a one-to-one manner.

[0016] In some embodiments, the IPM module has at least two first positioning holes, and the second fixing seat is provided with first positioning pins that are plugged into the at least two first positioning holes in a one-to-one correspondence; and / or, the second fixing seat has at least two second positioning holes, and the IPM module is provided with second positioning pins that are plugged into the at least two second positioning holes in a one-to-one correspondence.

[0017] Compared with the prior art, the IPM tester of the utility model has at least the following beneficial effects:

[0018] The utility model discloses an IPM test probe, which includes two insulating films and a plurality of spaced substrates clamped between the two insulating films, two ends of the substrates are bent to form contact pins and pressure test spring arms, and two IPM test probes can be stacked to form a test probe group;

[0019] Multiple contact pins of two IPM test probes in a group of test probes are all in contact with the test board. The test board is a circuit board that is a PVC printed circuit board. The circuit board has a copper layer printed on it. Multiple contact pins are pressed tightly against the copper layer of the test board. Multiple pressure test spring arms of the two IPM test probes can be driven by the fixture to contact with multiple input pins one by one. At this time, the input pins of the IPM module and the circuit board are connected through the contact pins and input pins of the two IPM test probes in a group of test probes, so that the IPM module can be tested. That is, the utility model designs two test points in the test machine circuit to form a loop test contact impedance value.

[0020] The test probe group of the utility model stacks two IPM test probes, and because of the separation of the insulating film, no short circuit will be caused between the two IPM test probes.

[0021] Since the IPM module of the utility model is specifically a formed IPM module, the problem that the existing tester is not suitable for testing the formed IPM module is solved, thereby ensuring 100% yield rate of the product before storage.

[0022] During the testing process, the use of IPM test probes often causes wear and deformation due to frequent clamping. Therefore, IPM test probes are consumable parts that need to be replaced regularly during use. Based on the characteristics of the above probes, this embodiment uses an IPM test probe with a simple structure, consisting only of an insulating film and a substrate bonded together, with a simple processing technology, easy processing, low manufacturing cost, good comprehensive performance, and higher cost performance. On the other hand, the IPM test probe is also easy to replace, effectively reducing the replacement time of technical workers.

[0023] On the other hand, the fixture provided by the present invention is manufactured based on the above-mentioned IPM test probe. Its beneficial effects refer to the beneficial effects of the above-mentioned IPM test probe, which will not be described in detail here.

[0024] The above description is only an overview of the technical solution of the utility model. In order to more clearly understand the technical means of the utility model and implement it according to the contents of the specification, the following is a detailed description of the preferred embodiments of the utility model in conjunction with the accompanying drawings. BRIEF DESCRIPTION OF THE DRAWINGS

[0025] In order to more clearly illustrate the technical solutions of the embodiments of the utility model, the drawings required for use in the description of the embodiments will be briefly introduced below. Obviously, the drawings described below are some embodiments of the utility model. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.

[0026] Figure 1 A schematic diagram of the structure of a tester for IPM testing provided by an embodiment of the utility model;

[0027] Figure 2 A schematic diagram of the structure of a test probe group consisting of two IPM test probes provided in an embodiment of the utility model;

[0028] Figure 3 A schematic diagram of the structure of another test probe group consisting of two IPM test probes provided in an embodiment of the utility model;

[0029] Figure 4 A schematic diagram of the structure of a fixture with a tester for IPM testing provided by an embodiment of the utility model;

[0030] Figure 5 A schematic diagram of the structure of the IPM module after molding provided by an embodiment of the utility model;

[0031] Figure 6 A schematic diagram of the structure of a first fixing seat of a fixture with an IPM test probe provided in an embodiment of the utility model;

[0032] Figure 7 A schematic diagram of the exploded structure of a fixture with a tester for IPM testing provided by an embodiment of the utility model;

[0033] Figure 8 The figure is a schematic diagram of the structure of an existing fixture for testing an IPM module after pin cutting.

[0034] Description of reference numerals:

[0035] 1. IPM module; 11. Input pin; 12. Test pin; 13. First positioning hole;

[0036] 2. Test measuring subgroup; 21. Base; 22. Insulating film; 211. Contact pin; 212. Pressure measuring spring arm; 213. First extension section; 214. Second extension section;

[0037] 31. base; 32. first fixing seat; 321. mounting slot; 322. third positioning pin; 33. second fixing seat; 331. first positioning pin;

[0038] 41. Tester; 42. Cylinder; 43. Product pressing block; 44. Spacer block; 45. Product guide rail. DETAILED DESCRIPTION

[0039] In order to further explain the technical means and effects adopted by the utility model to achieve the predetermined utility model purpose, the specific implementation methods, structures, features and effects of the utility model application are described in detail below in conjunction with the accompanying drawings and preferred embodiments. In the following description, different "one embodiment" or "embodiment" does not necessarily refer to the same embodiment. In addition, specific features, structures, or characteristics in one or more embodiments may be combined in any suitable form.

[0040] In the description of the present invention, it should be clarified that the terms "first", "second", etc. in the specification and claims of the present invention and the above-mentioned drawings are used to distinguish similar objects, and are not necessarily used to describe a specific order or sequence; the terms "vertical", "lateral", "longitudinal", "front", "rear", "left", "right", "up", "down", "horizontal", etc. indicate directions or positional relationships based on the directions or positional relationships shown in the drawings, and are only for the convenience of describing the present invention, and do not mean that the referred device or element must have a specific direction or position, and therefore cannot be understood as a limitation on the present invention.

[0041] In the description of the present invention, it should be noted that, unless otherwise clearly specified and limited, the terms "installation", "connection" and "connection" should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection or an indirect connection through an intermediate medium. For ordinary technicians in this field, the specific meanings of the above terms in the present invention can be understood according to specific circumstances.

[0042] like Figure 8 The figure shows a schematic diagram of the structure of an existing fixture for testing IPM modules after cutting. The fixture includes a cylinder 42, a product pressure block 43, a cushion block 44, a product guide rail 45 and a probe 41. In the testing process, the IPM module is tested after cutting and then molded. The testing process of molding after testing is prone to cause stress, which can easily cause damage to the product, and the yield rate of warehousing cannot be guaranteed. In addition, the original probe process has a poor testing effect, which can easily cause misjudgment of poor contact, and the probe is not suitable for testing the IPM module after molding.

[0043] Example 1

[0044] like Figure 1-7 As shown, an embodiment of the utility model provides an IPM test probe, which is mounted on a fixture to test an IPM module 1 mounted on the fixture, wherein the IPM module 1 has a plurality of input pins 11, and the fixture is mounted on a test board. The IPM test probe comprises two insulating films 22 and a plurality of spaced substrates 21 clamped between the two insulating films 22, wherein two ends of the substrate 21 are respectively bent to form a contact pin 211 and a pressure test spring arm 212, and two IPM test probes can be stacked to form a test probe group 2;

[0045] The multiple contact pins 211 of the two IPM test probes in a group of the test probe group 2 are all in contact with the test board, and the multiple pressure test spring arms 212 of the two IPM test probes are driven by the fixture to contact with the multiple input pins 11 one by one.

[0046] In this embodiment, the IPM test probe is installed on the fixture, and is used to test the IPM module 1 installed on the fixture. The IPM module 1 of this embodiment is specifically a molded IPM module. The IPM module 1 has a plurality of input pins 11. The fixture is installed on the test board. The IPM test probe includes two insulating films 22 and a plurality of spaced substrates 21 clamped between the two insulating films 22. The substrate 21 is made of a conductive material. The two ends of the substrate 21 are bent to form a contact pin 211 and a pressure test spring arm 212. Two IPM test probes can be stacked to form a test probe group 2.

[0047] Specifically, multiple contact pins 211 of two IPM test probes in a test probe group 2 are all in contact with the test board. The test board is a circuit board that is a PVC printed circuit board. A copper layer is printed on the circuit board. Multiple contact pins 211 are all pressed against the copper layer of the test board. Multiple pressure test spring arms 212 of the two IPM test probes can be driven by the fixture to contact with multiple input pins 11 one by one. At this time, the input pins 11 of the IPM module 1 and the circuit board are connected through the contact pins 211 and input pins 11 of the two IPM test probes in a test probe group 2, so that the IPM module can be tested. That is, this embodiment designs two test points in the test machine circuit to form a loop test contact impedance value.

[0048] This embodiment specifically utilizes the Kelvin test principle for testing. The Kelvin test principle is one of the commonly used test methods for analog circuit testing, also known as Kelvin four-terminal sensing, also known as four-terminal sensing (4T sensing). Four-wire sensing is also known as Kelvin four-wire sensing, which was invented by William Thomson, Lord Kelvin in 1861 to measure low resistance using the Kelvin bridge. Every two-wire connection can be called a Kelvin connection.

[0049] During the testing process, the use of IPM test probes often causes wear and deformation due to frequent clamping. Therefore, IPM test probes are consumable parts that need to be replaced regularly during use. Based on the characteristics of the above probes, the IPM test probe selected in this embodiment has a simple structure and is only composed of an insulating film 22 and a substrate 21 bonded together. The substrate 21 is made of a conductive material, and has a simple processing technology, is easy to process, and has a low production cost. It has good comprehensive performance and a higher cost-effectiveness. On the other hand, the IPM test probe is also easy to replace, which effectively reduces the replacement time of technical workers.

[0050] Since the IPM module 1 of this embodiment is specifically a formed IPM module, the problem that the existing tester is not suitable for testing the formed IPM module is solved, thereby ensuring 100% yield of the product before storage.

[0051] The number of the multiple contact pins 211 and the multiple pressure test spring arms 212 of the two IPM test testers in the test tester group 2 of this embodiment is equal to the number of the input pins 11 of the IPM module 1 .

[0052] IPM (Intelligent Power Module) is a powerful integrated circuit module that can be used to control and drive high-power electronic devices such as AC motor drives, frequency converters, inverters, etc.

[0053] In some embodiments, the IPM module 1 also has a plurality of test pins 12, and the plurality of contact pins 211 of the two IPM test probes of another group of the test probe group 2 are all abutted against the test board, and the plurality of pressure test spring arms 212 of the two IPM test probes are abutted against the plurality of test pins 12 one by one under the drive of the fixture.

[0054] In this embodiment, the IPM module 1 also has multiple test pins 12, and the multiple contact pins 211 of the two IPM test probes of another group of test probe groups 2 can be abutted against the test board. The multiple pressure test spring arms 212 of the two IPM test probes are driven by the fixture to abut against the multiple test pins 12 one by one, thereby realizing the connectivity of the test path.

[0055] The number of the multiple contact pins 211 and the multiple pressure test spring arms 212 of the two IPM test testers in the test tester group 2 of this embodiment is equal to the number of the test pins 12 of the IPM module 1 .

[0056] In some embodiments, the substrate 21 is made of gold-plated beryllium copper. The material of the substrate 21 is beryllium copper with gold plating on the surface. Beryllium copper has good comprehensive properties. After quenching and tempering, it has high strength, elasticity, and wear resistance. It also has high conductivity and is non-magnetic. Therefore, beryllium copper is an excellent material for measuring. The quenching and tempering range is 31-42HRC. In addition, the thickness of the gold plating layer on the surface of the substrate 21 is 0.3±0.05um, which further increases the conductivity and reduces the contact resistance.

[0057] In some embodiments, the substrate 21 is a long sheet structure with a thickness of 0.3±0.05 mm. It can be seen that the IPM test probe of this embodiment is a thin probe with a light overall structure and is easy to process.

[0058] In some embodiments, the insulating film 22 is made of PI film, which mainly serves as insulation and protection; it effectively isolates the substrate 21 from contact with external conductors and can well meet the requirements for high-voltage test characteristics of the IPM module 1.

[0059] PI film is a polyimide material, the full name is polyimide film, which is generally transparent yellow and has been widely used in many solar energy utilization industries. It has excellent high and low temperature resistance, electrical insulation, adhesion, radiation resistance, and medium resistance. It can be used for a long time in the temperature range of -269℃ to 280℃, and can reach a high temperature of 400℃ for a short time.

[0060] In some embodiments, the thickness of the insulating film 22 is 0.075±0.005 mm, which effectively isolates the substrate 21 from contact with external conductors and can well meet the requirements for high-voltage test characteristics of the IPM module 1.

[0061] In some embodiments, the corresponding pressure measuring spring arms 212 in the two IPM test probes in the test probe group 2 are overlapped with each other in upper and lower intervals, and both extend in the direction of the IPM module 1 corresponding to the IPM module 1, so that when the fixture is driven, the multiple pressure measuring spring arms 212 of the two IPM test probes can be in one-to-one contact with the multiple input pins 11.

[0062] In some embodiments, the end of the upper pressure-test spring arm 212 of the two pressure-test spring arms 212 that are overlapped with each other is configured with a first extension section 213 parallel to the input pin 11, in order to increase the contact surface between the pressure-test spring arm 212 and the input pin 11 to ensure good contact during testing.

[0063] In some embodiments, the corresponding contact pins 211 of the two IPM test probes in the test probe group 2 extend in opposite directions, so that the multiple contact pins 211 of the two IPM test probes are in contact with the test board.

[0064] In some embodiments, the end of the contact pin 211 is configured with a second extension section 214 arranged parallel to the test board, in order to make parallel contact with the copper layer on the test board and increase the contact surface for good contact during testing.

[0065] Example 2

[0066] The embodiment of the utility model further provides a fixture, which includes the IPM test probe of embodiment 1.

[0067] In some embodiments, when the IPM module 1 includes multiple test pins 12, the fixture includes a base 31 installed on the test board, two first fixed seats 32 arranged on both sides of the base 31, a second fixed seat 33 arranged above the base 31, and a driving component arranged on both sides of the two first fixed seats 32, the IPM module 1 is installed on the second fixed seat 33, and the multiple input pins 11 and the multiple test pins 12 are respectively located on the opposite sides of the second fixed seat 33 and the two first fixed seats 32, two pairs of the test probe groups 2 are respectively clamped between the base 31 and the two first fixed seats 32, one driving component can drive the multiple pressure test spring arms 212 of two IPM test probes in one group of the test probe groups 2 to abut against the multiple input pins 11 in a one-to-one manner, and the other driving component can drive the multiple pressure test spring arms 212 of the IPM test probes in another group of the test probe groups 2 to abut against the multiple test pins 12 in a one-to-one manner.

[0068] In this embodiment, the driving component can be a driving member such as a cylinder, and a driving component is used to push the base 21 in one group of the test probe groups 2 close to the position of the pressure measuring spring arm 212, so as to drive the multiple pressure measuring spring arms 212 of two IPM test probes in one group of the test probe groups 2 to abut against the multiple input pins 11 in a one-to-one correspondence; another driving component is used to push the base 21 in another group of the test probe groups 2 close to the position of the pressure measuring spring arm 212, so as to drive the multiple pressure measuring spring arms 212 of two IPM test probes in another group of the test probe groups 2 to abut against the multiple test pins 12 in a one-to-one correspondence;

[0069] During the testing process, the use of IPM test probes will often cause wear and deformation due to frequent clamping. Therefore, IPM test probes are consumable parts that need to be replaced regularly during use. Taking into account the characteristics of the above probes, the IPM test probe selected in this embodiment has a simple structure and is only composed of an insulating film 22 and a substrate 21 bonded together. The processing technology is simple, easy to process, and the production cost is low. The comprehensive performance is good and it has a higher cost performance. On the other hand, the IPM test probe is also easy to replace. It can be replaced by removing the first fixing seat 32 on both sides of the base 31. After simple training for the equipment operator, the replacement can be completed by themselves, and the replacement time of technical workers is effectively reduced.

[0070] In some embodiments, the IPM module 1 has at least two first positioning holes 13 , and the second fixing seat 33 is provided with first positioning pins 331 corresponding to and plugged into the at least two first positioning holes 13 , so as to ensure accurate positioning of the IPM module 1 .

[0071] In some embodiments, the second fixing seat 33 has at least two second positioning holes, and the IPM module 1 is provided with second positioning pins that are plugged into the at least two second positioning holes in a one-to-one correspondence, so as to ensure the precise positioning of the IPM module 1.

[0072] In some embodiments, a card slot 321 can be opened on the side of the first fixing seat 32 facing the base 31, the test probe group 2 can be inserted into the card slot 321, a third positioning pin 322 is set at the bottom of the card slot 321, and a third positioning hole is opened on the IPM test probe. The installation accuracy of the test probe group 2 can be guaranteed by the coordination of the third positioning pin 322 and the third positioning hole.

[0073] In summary, those skilled in the art can clearly understand that, for the convenience and brevity of description, the specific working processes of the above-described equipment, devices and units can refer to the corresponding processes in the aforementioned method embodiments and will not be repeated here.

[0074] The above is only a specific implementation of the utility model, but the protection scope of the utility model is not limited thereto. Any technician familiar with the technical field can easily think of various equivalent modifications or replacements within the technical scope disclosed by the utility model, and these modifications or replacements should be included in the protection scope of the utility model. Therefore, the protection scope of the utility model should be based on the protection scope of the claims.

Claims

1. A probe for IPM testing, characterized in that: The IPM test probe is mounted on a fixture to test an IPM module mounted on the fixture, the IPM module has a plurality of input pins, the fixture is mounted on a test board, the IPM test probe comprises two insulating films and a plurality of spaced substrates clamped between the two insulating films, the two ends of the substrate are bent to form a contact pin and a pressure test spring arm, and two IPM test probes can be stacked to form a test probe group; The multiple contact pins of two IPM test probes in a group of the test probes are all in contact with the test board, and the multiple pressure test spring arms of the two IPM test probes are driven by the fixture to contact with the multiple input pins one by one.

2. The IPM test probe according to claim 1, characterized in that: The IPM module also has multiple test pins, and the multiple contact pins of the two IPM test probes of another group of test probes are all abutted against the test board, and the multiple pressure test spring arms of the two IPM test probes are abutted against the multiple test pins one by one under the drive of the clamp.

3. The IPM test probe according to claim 1 or 2, characterized in that: The substrate is made of gold-plated beryllium copper; and / or the substrate is a long sheet structure with a thickness of 0.3±0.05 mm.

4. The IPM test probe according to claim 1 or 2, characterized in that: The insulating film is made of PI film; and / or the thickness of the insulating film is 0.075±0.005 mm.

5. The IPM test probe according to claim 1 or 2, characterized in that: The corresponding pressure test spring arms in the two IPM test probes in the test probe group are arranged to overlap with each other in upper and lower intervals, and both extend toward the IPM module corresponding to the IPM module.

6. The IPM test probe according to claim 5, characterized in that: The end of the upper pressure-detection spring arm of the two pressure-detection spring arms which are overlapped and spaced from each other is configured with a first extension section which is parallel to the input pin.

7. The IPM test probe according to claim 1 or 2, characterized in that: The corresponding contact pins in the two IPM test probes in the test probe group extend in opposite directions.

8. The IPM test probe according to claim 7, characterized in that: The end of the contact pin is configured with a second extension section arranged parallel to the test board.

9. A clamp, characterized in that: The fixture comprises the IPM test probe according to any one of claims 1-8.

10. The clamp according to claim 9, characterized in that When the IPM module includes multiple test pins, the fixture includes a base installed on the test board, two first fixed seats arranged on both sides of the base, a second fixed seat arranged above the base, and a driving component arranged on both sides of the two first fixed seats. The IPM module is installed on the second fixed seat, and the multiple input pins and the multiple test pins are respectively located on the opposite sides of the second fixed seat and the two first fixed seats. Two pairs of the test probe groups are respectively clamped between the base and the two first fixed seats. One driving component can drive the multiple pressure measuring spring arms of two IPM test probes in one group of the test probe groups to abut against the multiple input pins in a one-to-one correspondence, and the other driving component can drive the multiple pressure measuring spring arms of the IPM test probes in another group of the test probe groups to abut against the multiple test pins in a one-to-one correspondence.

11. The clamp according to claim 10, characterized in that The IPM module has at least two first positioning holes, and the second fixing seat is provided with first positioning pins that are plugged into the at least two first positioning holes in a one-to-one correspondence; and / or, the second fixing seat has at least two second positioning holes, and the IPM module is provided with second positioning pins that are plugged into the at least two second positioning holes in a one-to-one correspondence.

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