SPI Flash performance tester

Abstract

The utility model belongs to the technical field of testing, particularly relates to an SPI (Serial Peripheral Interface) Flash performance tester, and provides the following scheme aiming at the problems that the environment in a cabin is dry, the performance of an SPI Flash memory in a humid environment is difficult to effectively show, and the intelligent tester of a flash memory chip is inconvenient to adjust in position due to large occupied area. Comprising a flash memory chip intelligent tester body, a bin door is movably installed at a bin opening of a test bin of the flash memory chip intelligent tester body, and a plurality of test disks used for placing SPI Flash memories are connected to a test frame in the test bin of the flash memory chip intelligent tester body in a sliding mode. When the universal wheel supporting device is used, the real humid environment can be simulated through the humid environment simulation assembly, the authenticity of test data is improved, the vertical position of the universal wheel can be conveniently adjusted through the adjusting assembly, the universal wheel can be conveniently ejected out and stored, and therefore the supporting stability is ensured.

Description

Technical Field

[0001] The utility model relates to the technical field of SPI Flash memory performance testing, in particular to a SPI Flash performance tester. Background Art

[0002] SPI Flash performance tester is used to test the performance parameters of Serial Peripheral Interface (SPI) Flash memory, including but not limited to read speed, write speed, erase time, data retention capability, durability (number of program / erase cycles) and error rate, etc. The commonly used test instrument is the flash memory chip intelligent tester, which is an advanced test equipment specially used for automated performance testing of various types of flash memory chips. These devices usually integrate high-precision test hardware and intelligent software control systems, and can execute a series of complex test programs to evaluate the key performance indicators of flash memory chips such as read and write speed, erase time, durability, data retention capability, error rate, etc.

[0003] At present, when the intelligent tester for flash memory chips tests the performance of SPI Flash memory, the environment in the warehouse is dry, and it is difficult to effectively show the performance of SPI Flash memory in a humid environment. In addition, the intelligent tester for flash memory chips occupies a large area, and it is not convenient to adjust the position.

[0004] In view of the above problems, this utility model document proposes a SPI Flash performance tester. Utility Model Content

[0005] The utility model provides an SPI Flash performance tester, which solves the problems in the prior art that when a flash memory chip intelligent tester tests the performance of a SPI Flash memory, the environment in the chamber is dry, and it is difficult to effectively show the performance of the SPI Flash memory in a humid environment, and the flash memory chip intelligent tester occupies a large area and is inconvenient to adjust its position.

[0006] The utility model provides the following technical solutions:

[0007] A SPI Flash performance tester, comprising:

[0008] A flash memory chip intelligent tester body, wherein a compartment door is movably installed at the test compartment of the flash memory chip intelligent tester body, a test rack in the test compartment of the flash memory chip intelligent tester body is slidably connected with a plurality of test trays for placing SPIFlash memory, a hollow base is fixedly arranged at the bottom of the flash memory chip intelligent tester body, two sliding plates are symmetrically arranged in the hollow base, a sliding groove for slidably installing the end of the sliding plate is arranged on the inner wall of the hollow base, and a plurality of universal wheels are fixedly arranged at the bottom of the sliding plate;

[0009] The humid environment simulation component is located in the test chamber of the flash memory chip intelligent tester body, which is used to simulate the performance of the SPI Flash memory in a humid environment and improve the authenticity of the test data;

[0010] The adjustment component is arranged in the hollow base and is used to drive the universal wheel to move up and down so as to push the flash memory chip intelligent tester body to adjust its position, while ensuring good supporting stability after movement.

[0011] In one possible design, the humid environment simulation component includes a water mist spray plate fixedly mounted on the top of the inner wall of the test chamber of the flash memory chip intelligent tester body, and a plurality of small nozzles are connected to the water mist spray plate. A water tank is provided on the top of the outer wall of the flash memory chip intelligent tester body, and the inner wall of the water tank is connected to the input end of the water mist spray plate through a water pipe.

[0012] In a possible design, the adjustment assembly includes two mounting and rotating plates fixedly disposed in a hollow base, two first screw rods are rotatably mounted between the two mounting and rotating plates, and the sliding plate is threadedly connected to the corresponding first screw rods.

[0013] In a possible design, second screws are rotatably installed at both ends of the inner wall of the hollow base, a driving motor for driving the second screw to rotate is fixedly installed on the outer wall of the hollow base, two second bevel gears are fixedly provided on the second screw, the top end of the first screw passes through the top of the uppermost rotating plate and is fixedly provided with a first bevel gear, and the first bevel gear is meshed with the corresponding second bevel gear.

[0014] In a possible design, a control keyboard is slidably installed in a groove on the front side of the flash memory chip intelligent tester body, so as to prevent dust from accumulating on the control keyboard when it is not in use.

[0015] In a possible design, the warehouse door is provided with an observation window for conveniently observing the situation inside the warehouse, and anti-fog glass is embedded in the observation window.

[0016] It should be understood that the above general description and the following detailed description are merely exemplary and do not limit the present invention.

[0017] In this application, when in use, the door is opened, the SPI Flash memory to be tested is placed in the test tray on the test rack, the door is closed to ensure that the test environment is closed, the test command is input by operating the keyboard, the tester is controlled to start working, and the control system inside the tester starts the humid environment simulation component, that is, the small nozzle on the water mist spray plate starts to spray water mist to simulate the humid environment. The SPI Flash memory is tested in the simulated humid environment, and its performance data is recorded in real time and displayed on the display screen;

[0018] If it is necessary to move the flash memory chip intelligent tester body, the drive motor can be started to drive the second screw to rotate. The rotation of the second screw drives the first bevel gear to rotate through the second bevel gear, and then the first screw rotates. Since the sliding plate is threadedly connected to the first screw, the rotation of the first screw will cause the sliding plate to move downward in the slide groove. The movement of the sliding plate drives the universal wheel at the bottom to lift up, and then the flash memory chip intelligent tester body is pushed to adjust the position. After reaching the target position, the second screw is driven by the drive motor to rotate in the opposite direction until the universal wheel is stored back in the hollow base, thereby ensuring the support stability after the position adjustment.

[0019] The utility model has the following beneficial effects:

[0020] The utility model can simulate a real humid environment through a humid environment simulation component, ensure that the performance of the SPI Flash memory under similar actual application conditions is accurately evaluated, and improve the authenticity of the test data.

[0021] The utility model can conveniently adjust the up and down positions of the universal wheels through the adjustment components, so as to push the flash memory chip intelligent tester body to adjust the position, and after reaching the target position, the universal wheels can be stored back into the hollow base, thereby ensuring the support stability.

[0022] The control keyboard of the utility model is installed by sliding, so that it can be stored in the groove when not in use, thereby avoiding dust accumulation and keeping the tester clean and tidy. BRIEF DESCRIPTION OF THE DRAWINGS

[0023] Figure 1 A three-dimensional structural schematic diagram of an SPI Flash performance tester provided by an embodiment of the utility model;

[0024] Figure 2 A schematic structural diagram of another viewing angle of an SPI Flash performance tester provided by an embodiment of the utility model;

[0025] Figure 3 A schematic diagram of the internal structure of a test chamber of an SPI Flash performance tester provided by an embodiment of the utility model;

[0026] Figure 4 A schematic diagram of the internal structure of a hollow base of an SPI Flash performance tester provided by an embodiment of the utility model.

[0027] Figure numerals: 1. Flash memory chip intelligent tester body; 2. Compartment door; 3. Control keyboard; 4. Groove; 5. Test stand; 6. Test tray; 7. Water mist spray plate; 8. Water tank; 9. Observation window; 10. Hollow base; 11. Rotating plate; 12. First screw; 13. Sliding plate; 14. Universal wheel; 15. Second screw; 16. First bevel gear; 17. Second bevel gear; 18. Driving motor; 19. Slide groove. DETAILED DESCRIPTION

[0028] The following will be combined with the drawings in the embodiments of the utility model to clearly and completely describe the technical solutions in the embodiments of the utility model. Obviously, the described embodiments are only part of the embodiments of the utility model, not all of the embodiments. Based on the embodiments of the utility model, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the utility model.

[0029] In the description of the present invention, it should be understood that the terms "opening", "upper", "middle", "length", "inside" and the like indicating orientation or positional relationship are only for the convenience of describing the present invention and simplifying the description, and do not indicate or imply that the components or elements referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore should not be understood as a limitation on the present invention.

[0030] In order to keep the following description of the embodiments of the present invention clear and concise, the present invention omits detailed descriptions of known functions and known components.

[0031] Embodiment 1

[0032] Please refer to Figure 1-4 , a tester comprising:

[0033] A flash memory chip intelligent tester body 1, model is Advantest T5503HS, a compartment door 2 is movably installed at the test compartment of the flash memory chip intelligent tester body 1, a test rack 5 in the test compartment of the flash memory chip intelligent tester body 1 is slidably connected with a plurality of test trays 6 for placing SPI Flash memory, a hollow base 10 is fixedly arranged at the bottom of the flash memory chip intelligent tester body 1, two sliding plates 13 are symmetrically arranged in the hollow base 10, a slide groove 19 for slidably installing the end of the sliding plate 13 is arranged on the inner wall of the hollow base 10, and a plurality of universal wheels 14 are fixedly arranged at the bottom of the sliding plate 13;

[0034] A humid environment simulation component is arranged in the test chamber of the flash chip intelligent tester body 1, and is used to simulate the performance of the SPI Flash memory in a humid environment to improve the authenticity of the test data. The humid environment simulation component includes a water mist spray plate 7 fixedly installed on the top of the inner wall of the test chamber of the flash chip intelligent tester body 1. The water mist spray plate 7 is connected to a plurality of small nozzles for simulating a humid environment during the test. A water tank 8 is arranged on the top of the outer wall of the flash chip intelligent tester body 1. The inner wall of the water tank 8 is connected to the input end of the water mist spray plate 7 through a water pipe to provide a water source for the water mist spray plate 7. Before the test starts, water can be added to the water tank 8, and the opening and closing of the water mist spray plate 7 can be controlled to simulate different degrees of humid environments to test the performance of the SPI Flash memory in a humid environment.

[0035] The adjustment component is arranged in the hollow base 10, and is used to drive the universal wheel 14 to move up and down, so as to push the flash memory chip intelligent tester body 1 to adjust the position, and at the same time ensure that it has good support stability after the movement. The adjustment component includes two rotating plates 11 fixedly arranged in the hollow base 10, and two first screw rods 12 are rotatably installed between the two rotating plates 11. The sliding plate 13 is threadedly connected with the corresponding first screw rods 12. By rotating the first screw rods 12, the sliding plate 13 can be moved up and down;

[0036] In order to more conveniently control the rotation of the first screw 12, second screws 15 are rotatably installed at both ends of the inner wall of the hollow base 10, and a driving motor 18 for driving the second screw 15 to rotate is fixedly installed on the outer wall of the hollow base 10, and its output shaft is connected to the second screw 15. Two second bevel gears 17 are fixedly provided on the second screw 15. The top of the first screw 12 passes through the top of the uppermost rotating plate 11 and is fixedly provided with a first bevel gear 16. The first bevel gear 16 is meshed with the corresponding second bevel gear 17. By starting the driving motor 18, the second screw 15 can be driven to rotate, and then the first screw 12 is rotated through the bevel gear transmission, thereby realizing the adjustment of the position of the sliding plate 13, so as to complete the ejection and storage of the universal wheel 14.

[0037] The present application can be used for SPI Flash memory performance testing, and can also be used in other fields applicable to the present application.

[0038] Embodiment 2

[0039] Improvements based on Example 1:

[0040] A SPI Flash performance tester is used in the field of SPI Flash memory performance testing;

[0041] Please refer to Figure 1In order to prevent the control keyboard 3 from accumulating dust when not in use, the control keyboard 3 is slidably installed in the groove 4 on the front side of the flash memory chip intelligent tester body 1. In addition, an observation window 9 is provided on the compartment door 2 for convenient observation of the situation in the compartment. Anti-fog glass is embedded in the observation window 9 to observe the situation in the test compartment during the test.

[0042] However, as is well known to those skilled in the art, the working principles and wiring methods of the flash memory chip intelligent tester body 1, the water mist spray plate 7 and the drive motor 18 are commonplace, and are conventional means or common knowledge, and will not be elaborated here. Those skilled in the art can make any optional selections according to their needs or convenience.

[0043] The above are only specific implementations of the utility model, but the protection scope of the utility model is not limited to them. Any technician familiar with the technical field can easily think of changes or substitutions within the technical scope disclosed by the utility model, which should be included in the protection scope of the utility model; in the absence of conflicts, the embodiments of the utility model and the features in the embodiments can be combined with each other. Therefore, the protection scope of the utility model shall be based on the protection scope of the claims.

Claims

1. A SPI Flash performance tester, characterized in that: include: A flash memory chip intelligent tester body (1) is provided, wherein a chamber door (2) is movably installed at a chamber opening of a test chamber of the flash memory chip intelligent tester body (1), a plurality of test trays (6) for placing SPI Flash memories are slidably connected to a test rack (5) in the test chamber of the flash memory chip intelligent tester body (1), a hollow base (10) is fixedly provided at the bottom of the flash memory chip intelligent tester body (1), two sliding plates (13) are symmetrically provided in the hollow base (10), a sliding groove (19) for slidably installing the end of the sliding plate (13) is provided on the inner wall of the hollow base (10), and a plurality of universal wheels (14) are fixedly provided at the bottom of the sliding plate (13); A humid environment simulation component is arranged in a test chamber of a flash memory chip intelligent tester body (1) and is used to simulate the performance of the SPI Flash memory in a humid environment to improve the authenticity of the test data; The adjustment component is arranged in the hollow base (10) and is used to drive the universal wheel (14) to move up and down so as to push the flash memory chip intelligent tester body (1) to adjust the position, while ensuring good support stability after the movement.

2. A SPI Flash performance tester according to claim 1, characterized in that, The humid environment simulation component comprises a water mist spray plate (7) fixedly mounted on the top of the inner wall of the test chamber of the flash memory chip intelligent tester body (1), the water mist spray plate (7) being connected to a plurality of small spray heads, a water tank (8) being arranged on the top of the outer wall of the flash memory chip intelligent tester body (1), the inner wall of the water tank (8) being connected to the input end of the water mist spray plate (7) via a water pipe.

3. A SPI Flash performance tester according to claim 1, characterized in that, The adjustment assembly comprises two rotating plates (11) fixedly arranged in a hollow base (10), two first screw rods (12) are rotatably mounted between the two rotating plates (11), and the sliding plate (13) is threadedly connected to the corresponding first screw rods (12).

4. A SPI Flash performance tester according to claim 3, characterized in that, A second screw rod (15) is rotatably mounted on both ends of the inner wall of the hollow base (10); a driving motor (18) for driving the second screw rod (15) to rotate is fixedly mounted on the outer wall of the hollow base (10); two second bevel gears (17) are fixedly mounted on the second screw rod (15); the top end of the first screw rod (12) passes through the top of the uppermost rotating plate (11) and is fixedly mounted with a first bevel gear (16); the first bevel gear (16) is meshed with the corresponding second bevel gear (17).

5. A SPI Flash performance tester according to claim 1, characterized in that, A control keyboard (3) is slidably mounted in the groove (4) on the front side of the flash memory chip intelligent tester body (1), thereby preventing dust from accumulating on the control keyboard (3) when it is not in use.

6. A SPI Flash performance tester according to claim 1, characterized in that: The warehouse door (2) is provided with an observation window (9) for conveniently observing the situation in the warehouse, and anti-fog glass is embedded in the observation window (9).

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