Chip testing device
By using conveyor wheels in the chip test device for chip support and reducing friction through limiting and rolling, the problems of chip conveying and chip friction in the prior art are solved, and uniform feed detection and adaptation of the chip are achieved.
Patent Information
- Application Number
- CN202420969551.8
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-05-07
- Publication Date
- 2025-03-21
- Estimated Expiration
- 2034-05-07
AI Technical Summary
The existing chip detection devices cannot adapt to chip conveying operations of different sizes, and the chip is prone to friction with the support plate when pushing feed, resulting in damage to the chip surface.
A chip testing device is designed, using a conveyor wheel on the support plate for chip support. When the chip reaches a designated position, the conveyor wheel contact limit is pushed to reduce friction through the rolling of the conveyor wheel, and adapt to chips of different sizes by adjusting the distance between vertical conveyor belts.
The uniform feed detection of the chip is achieved, the friction between the chip and the support plate is reduced, the chip surface is prevented, and the chip surface can be adapted to chip feeding work of different sizes.
Smart Images
Figure CN222646890U_ABST
Abstract
Description
Technical Field
[0001] The utility model belongs to the technical field of chip detection, and in particular relates to a chip testing device. Background Art
[0002] In the field of semiconductor chips, existing chip testing mostly uses a conveying mechanism to move the chip to achieve continuous testing.
[0003] The chips to be tested are distributed vertically on the feeding mechanism, and the chips are moved upward by the conveyor belts on both sides. Then the top chip is pushed into the testing table for testing. However, the existing feeding mechanism has a simple structure and cannot adapt to the conveying of chips of different sizes. At the same time, the chip is supported by the support plate on the surface of the conveyor belt. When pushing the chip to feed, it will cause friction between the chip and the support plate, resulting in damage to the chip surface. Utility Model Content
[0004] In view of the problems existing in the prior art, the purpose of the utility model is to provide a chip testing device, which can realize uniform feeding detection of chips and adapt to the feeding of chips of different sizes. The chip is supported by a conveying wheel on a support plate. When it reaches the specified position, the conveying wheel contacts the limit. At this time, the chip can be pushed to reduce friction by the rolling of the conveying wheel.
[0005] In order to achieve the above purpose, the utility model provides the following technical solutions:
[0006] A chip testing device comprises a testing platform, a testing instrument is across the upper surface of the testing platform, a horizontal conveying mechanism is transversely installed on the upper surface of the testing platform, the testing instrument is across the horizontal conveying mechanism, a feeding mechanism is arranged at the feeding end of the testing platform, the feeding mechanism comprises a base plate placed on the ground, moving blocks are symmetrically arranged on both sides of the upper surface of the base plate, vertical plates are symmetrically arranged on the top of the moving blocks, a bracket is arranged above the side of two vertical plates facing away from the testing platform, a pushing mechanism is fixed on the top of the bracket, a vertical conveyor belt is installed between two vertical plates in the same group, support plates are evenly arranged on the outer surface of the vertical conveyor belt, chips are evenly laid between the two groups of vertical plates, and the chips are supported by two support plates of the same height, a support platform A is fixed to the lower surface of the support plate, an extension shaft is passed through the inner side of the support platform A through a bearing, a conveying wheel is arranged at the end of the extension shaft, the conveying wheel exceeds the upper surface of the support plate, and the upper surface of the conveying wheel contacts the chip.
[0007] Furthermore, a support platform B is provided on the lower surface of the support plate, a connecting rod is slidably installed inside the support platform B, the connecting rod is vertically distributed with the extension axis, and a moving bar is provided at one end of the connecting rod close to the extension axis.
[0008] Furthermore, an arc-shaped friction plate is provided at one end of the moving bar away from the connecting rod, and the arc-shaped friction plate is in contact with a side surface of the extension shaft away from the support platform B.
[0009] Furthermore, an extrusion head is provided at one end of the connecting rod away from the moving bar, the end of the extrusion head is hemispherical, and the end of the extrusion head exceeds the side surface of the support plate.
[0010] Furthermore, a spring is sleeved on the surface of the connecting rod, and the spring is placed between the extrusion head and the support platform B.
[0011] Furthermore, the inner surfaces of the vertical plates close to each other are provided with protrusions, the protrusions are at the same height as the rollers on the vertical conveyor belt, and the positions of the protrusions correspond to the extrusion heads.
[0012] Furthermore, a track groove is transversely opened on the upper surface of the bottom plate, a double-threaded rod is installed inside the track groove through a bearing, and the bottoms of the two moving blocks are symmetrically screwed on the surface of the double-threaded rod.
[0013] Compared with the prior art, the beneficial effects of the utility model are: the chips to be tested are evenly placed in the feeding mechanism, the chips are controlled to move up one by one through the synchronous rotation of the vertical conveyor belts on both sides, and the top chip is pushed to the testing table through the pushing mechanism on the other side. During the process of the chip moving up, the conveying wheel supporting it is kept fixed. When the chip moves to the top, the conveying wheel is released from the limit and can rotate. At this time, pushing the chip to move can drive the conveying wheel to rotate to reduce friction and prevent damage to the chip. At the same time, the distance between the two vertical conveyor belts can be adjusted according to actual usage to adapt to the conveying of chips of different sizes. BRIEF DESCRIPTION OF THE DRAWINGS
[0014] Figure 1 It is a schematic diagram of the overall structure of the utility model;
[0015] Figure 2 It is a three-dimensional structural schematic diagram of the feeding mechanism of the utility model;
[0016] Figure 3 This is a schematic diagram of the three-dimensional structure of the support plate of the utility model;
[0017] Figure 4 It is a schematic diagram of the convex strip installation structure of the utility model.
[0018] In the accompanying drawings, the components represented by the reference numerals are listed as follows:
[0019] 1. Testing table; 2. Testing instrument; 3. Horizontal conveying mechanism; 4. Bottom plate; 5. Moving block; 6. Track groove; 7. Double threaded rod; 8. Vertical plate; 801. Bump; 9. Vertical conveyor belt; 10. Support plate; 101. Support table A; 11. Bracket; 12. Pushing mechanism; 13. Conveying wheel; 14. Extension shaft; 15. Support table B; 16. Moving bar; 17. Arc friction plate; 18. Connecting rod; 19. Extrusion head; 20. Spring. DETAILED DESCRIPTION
[0020] In order to make the purpose and advantages of the utility model more clear, the utility model is specifically described in combination with the following embodiments. It should be understood that the following text is only used to describe one or several specific implementations of the utility model, and does not strictly limit the protection scope of the specific request of the utility model.
[0021] Please refer to Figure 1-Figure 4 As shown, a chip testing device comprises a testing platform 1, a testing instrument 2 is across the upper surface of the testing platform 1, a horizontal conveying mechanism 3 is transversely installed on the upper surface of the testing platform 1, the testing instrument 2 is across the horizontal conveying mechanism 3, a feeding mechanism is arranged at the feeding end of the testing platform 1, the feeding mechanism comprises a bottom plate 4 placed on the ground, moving blocks 5 are symmetrically arranged on both sides of the upper surface of the bottom plate 4, vertical plates 8 are symmetrically arranged on the top of the moving blocks 5, a bracket 11 is arranged above the side of the two vertical plates 8 away from the testing platform 1, a pushing mechanism 12 is fixed on the top of the bracket 11, a vertical conveying belt 9 is installed between two vertical plates 8 in the same group, support plates 10 are evenly arranged on the outer surface of the vertical conveying belt 9, chips are evenly laid between the two groups of vertical plates 8, and the chips are supported by two support plates 10 of the same height The support is used to keep the chip in a horizontal state. The vertical conveyor belts 9 on both sides rotate at the same speed and in opposite directions, so that the inner side of the vertical conveyor belt 9 is in an upward state. A support platform A101 is symmetrically fixed to the lower surface of the support plate 10, wherein the lower surface refers to the support plate 10 whose inner side is in an ascending state. An extension shaft 14 is passed through the inner side of the support platform A101 through a bearing. A conveying wheel 13 is provided at the end of the extension shaft 14. The diameter of the conveying wheel 13 is larger than that of the extension shaft 14. Since the extension shaft 14 is installed on the support platform A101, the extension shaft 14 does not contact the lower surface of the support plate 10, the conveying wheel 13 exceeds the upper surface of the support plate 10, and the upper surface of the conveying wheel 13 contacts the chip, and the chip is supported by the upper surfaces of the two conveying wheels 13.
[0022] Please refer to Figure 3As shown, a support platform B15 is provided on the lower surface of the support plate 10, and a connecting rod 18 is slidably installed on the inner side of the support platform B15. The connecting rod 18 is vertically distributed with the extension shaft 14, and a moving bar 16 is provided at one end of the connecting rod 18 close to the extension shaft 14. The moving bar 16 slides between the extension shaft 14 and the support plate 10. An arc-shaped friction plate 17 is provided at one end of the moving bar 16 away from the connecting rod 18. The arc-shaped friction plate 17 is in contact with a side surface of the extension shaft 14 away from the support platform B15. When the two are in contact, the friction between the two can prevent the extension shaft 14 from rotating, thereby ensuring the stability of the conveying wheel 13.
[0023] Among them, an extrusion head 19 is provided at the end of the connecting rod 18 away from the moving bar 16. The end of the extrusion head 19 is hemispherical, and the hemispherical shape can reduce friction. The end of the extrusion head 19 exceeds the side surface of the support plate 10. The lateral width of the support plate 10 is smaller than the vertical conveyor belt 9. Therefore, there is a gap between the side surface of the support plate 10 and the vertical plate 8. At this time, the end of the extrusion head 19 is placed in the gap, and a spring 20 is sleeved on the surface of the connecting rod 18. The spring 20 is placed between the extrusion head 19 and the support platform B15. The elastic force of the spring 20 is used to make the extrusion head 19 always have an outward force, and drive the arc friction plate 17 at the other end to squeeze the extension shaft 14 to keep it fixed.
[0024] Please refer to Figure 2 and Figure 4 As shown, the inner surfaces of the vertical plates 8 that are close to each other are provided with protrusions 801, and the protrusions 801 are at the same height as the rollers on the vertical conveyor belt 9. The positions of the protrusions 801 correspond to the extrusion heads 19. When the chip moves to the top, the extrusion heads 19 will be squeezed by the protrusions 801 to push the extrusion heads 19 to move toward the center position, so that the arc-shaped friction plate 17 is separated from the extrusion of the extension shaft 14.
[0025] Please refer to Figure 1 and Figure 2 As shown, a track groove 6 is horizontally opened on the upper surface of the bottom plate 4, and a double-threaded rod 7 is installed inside the track groove 6 through a bearing. The bottoms of the two moving blocks 5 are symmetrically screwed on the surface of the double-threaded rod 7. Rotating the double-threaded rod 7 can control the distance between the two moving blocks 5, and then control the distance between the vertical conveyor belts 9 on both sides to accommodate chips of different sizes.
[0026] The working principle of the utility model is as follows: first, the chips to be tested are placed between the two sets of vertical plates 8, and the vertical conveyor belt 9 is driven to rotate by an external driving motor, so that the vertical conveyor belt 9 moves upward on the side close to the rear, so that the chip moves upward step by step. At the same time, due to the presence of the spring 20, the extrusion head 19 exceeds the side surface of the support plate 10. At this time, the arc-shaped friction plate 17 can be pulled to contact the extension shaft 14 to increase the friction force, and prevent the extension shaft 14 and the conveying wheel 13 from rotating. The lower surfaces on both sides of the chip are supported by the two conveying wheels 13 respectively, but due to the conveying wheel 1 3 is limited to ensure the stability of the chip when it moves up and down. When it moves to the highest position, the extrusion head 19 will be squeezed by the protrusion 801, so that the extrusion head 19 moves toward the center, and then the spring 20 can be squeezed and stored to make the moving bar 16 move. At this time, the arc friction plate 17 is separated from the extension shaft 14 and no longer squeezes the extension shaft 14. The conveying wheel 13 can rotate freely and push the top chip to the inside of the horizontal conveying mechanism 3 through the pushing mechanism 12, so that it can move horizontally through the horizontal conveying mechanism 3 and pass under the detector 2 to realize the detection.
[0027] The above is only a preferred embodiment of the present invention. It should be noted that, for ordinary technicians in the technical field, several improvements and modifications can be made without departing from the principle of the present invention, and these improvements and modifications should also be regarded as the protection scope of the present invention. The structures, devices and operating methods not specifically described and explained in the present invention shall be implemented according to the conventional means in the field unless otherwise specified and limited.
Claims
1. A chip testing device, comprising a testing platform (1), a testing instrument (2) straddling the upper surface of the testing platform (1), a horizontal conveying mechanism (3) being laterally mounted on the upper surface of the testing platform (1), the testing instrument (2) straddling the upper surface of the horizontal conveying mechanism (3), characterized in that: The feeding end of the detection platform (1) is provided with a feeding mechanism, and the feeding mechanism comprises a bottom plate (4) placed on the ground, movable blocks (5) are symmetrically arranged on both sides of the upper surface of the bottom plate (4), and vertical plates (8) are symmetrically arranged on the top of the movable blocks (5), and a bracket (11) is arranged above the side of the two vertical plates (8) facing away from the detection platform (1), and a pushing mechanism (12) is fixed on the top of the bracket (11), and a vertical conveyor belt (9) is installed between the two vertical plates (8) in the same group, and the vertical conveyor belt (9) ) is evenly provided with support plates (10) on the outer surface, chips are evenly laid between the two groups of vertical plates (8), and the chips are supported by two support plates (10) of equal height, a support platform A (101) is fixed on the lower surface of the support plate (10), an extension shaft (14) is passed through the inner side of the support platform A (101) through a bearing, and a conveying wheel (13) is provided at the end of the extension shaft (14), the conveying wheel (13) exceeds the upper surface of the support plate (10), and the upper surface of the conveying wheel (13) is in contact with the chip.
2. A chip testing device according to claim 1, characterized in that: A support platform B (15) is arranged on the lower surface of the support plate (10), a connecting rod (18) is slidably mounted on the inner side of the support platform B (15), the connecting rod (18) is vertically distributed with the extension shaft (14), and a movable bar (16) is arranged at one end of the connecting rod (18) close to the extension shaft (14).
3. A chip testing device according to claim 2, characterized in that: An arc-shaped friction plate (17) is provided at one end of the moving bar (16) away from the connecting rod (18), and the arc-shaped friction plate (17) is in contact with a side surface of the extension shaft (14) away from the support platform B (15).
4. A chip testing device according to claim 3, characterized in that: An extrusion head (19) is provided at one end of the connecting rod (18) away from the moving bar (16); the end of the extrusion head (19) is hemispherical and extends beyond the side surface of the support plate (10).
5. A chip testing device according to claim 4, characterized in that: The surface of the connecting rod (18) is sleeved with a spring (20), and the spring (20) is placed between the extrusion head (19) and the support platform B (15).
6. A chip testing device according to claim 5, characterized in that: The inner surfaces of the vertical plates (8) that are close to each other are provided with protrusions (801), the protrusions (801) are at the same height as the roller shaft on the vertical conveyor belt (9), and the position of the protrusions (801) corresponds to the extrusion head (19).
7. A chip testing device according to claim 1, characterized in that: A track groove (6) is transversely provided on the upper surface of the bottom plate (4), a double-threaded rod (7) is installed inside the track groove (6) via a bearing, and the bottoms of the two moving blocks (5) are symmetrically screwed onto the surface of the double-threaded rod (7).