Testing tool
By designing a test tool that adapts to the shape of the encoder, the fast fixation and signal acquisition of the encoder is achieved using the snap device and the test probe, which solves the problem of inconvenient signal acquisition of the encoder and achieves a fast and stable test effect.
Patent Information
- Application Number
- CN202421975442.3
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-08-15
- Publication Date
- 2025-08-08
- Estimated Expiration
- 2034-08-15
AI Technical Summary
In the prior art, the signal acquisition of the encoder cannot be tested quickly during the production process, especially the test point data on the encoder printed circuit board cannot be read through direct connection, and the method of welding the lead-out signal lines is not suitable for rapid testing.
A test tool is designed, including a mount, a snap device and a test probe. The mount shape is adapted to the encoder size. The snap device is fixed by radial rotation. The test probe is directly in contact with the encoder circuit board for quick connection and removal.
It realizes fast, stable fixation and signal acquisition of the encoder, simple operation, suitable for a variety of encoders, saves time and does not easily damage the probes and encoder contacts.
Smart Images
Figure CN223204945U_ABST
Abstract
Description
Technical Field
[0001] The utility model relates to the field of production and processing of encoders, and more specifically, to a testing tool for testing encoders. Background Art
[0002] During motor testing, signals from the speed sensor (i.e., encoder) are typically acquired using a connector. However, sometimes it is necessary to acquire data from certain test points on the encoder's printed circuit board (PCB), making it impossible to read the signal through a direct connection.
[0003] Currently, operators perform this by welding out signal wires. Although this method can collect signals, it is not suitable for rapid testing during the production process. Utility Model Content
[0004] In view of this, the present invention proposes a testing tool to at least solve the above problems.
[0005] According to an embodiment of the present invention, a test tool includes a mounting base, a clamping device and a test probe. The shape and size of the mounting base are adapted to the shape and size of the encoder to be tested, including a first end face and a second end face arranged opposite to each other up and down, and a first end and a second end arranged opposite to each other horizontally. The clamping device includes a first clamp and a second clamp. The first clamp and the second clamp are respectively arranged at the first end and the second end perpendicular to the mounting base, and the first clamp and the second clamp are arranged to be able to rotate along the radial direction of the mounting base; the test probe is arranged on the first end face of the circuit board corresponding to the encoder to be tested.
[0006] The test fixture based on this embodiment has a simple structure and is easy to operate. It can be conveniently fixed to the encoder to be tested, and the test probe at the bottom thereof is used to test the test end of the encoder to be tested, which saves test time.
[0007] Furthermore, the first end and the second end of the mounting base are respectively provided with a first card slot and a second card slot, and the first clip and the second clip are respectively rotatably provided in the first card slot and the second card slot.
[0008] Based on the structure of this embodiment, the first buckle and the second buckle are installed on both sides of the mounting base by adopting an ingenious structure, which saves space and facilitates operation.
[0009] Furthermore, the buckle device also includes a fixing column, which is vertically arranged on the second end face. The first buckle is connected to the fixing column through a first spring member, and the second buckle is connected to the fixing column through a second spring member.
[0010] Through this embodiment, elastic control of the first buckle and the second buckle is achieved, thereby easily fixing or releasing the encoder to be tested.
[0011] Furthermore, the lower ends of the first clip and the second clip are respectively provided with a first clamping groove and a second clamping groove adapted to the thickness of the encoder to be tested.
[0012] Through this embodiment, the fixation of the encoder to be tested is further made more stable, thereby ensuring the test effect to a certain extent.
[0013] Furthermore, a positioning pin corresponding to the encoder opening on the encoder to be tested is provided on the first end surface. Through this embodiment, rapid positioning can be achieved to facilitate fixing of the encoder to be tested.
[0014] Furthermore, a limit post is provided on the first end surface. This embodiment makes it easier and more accurate to fix the test fixture and the encoder to be tested.
[0015] Furthermore, the mounting base is formed by connecting a first mounting base located below and a second mounting base located above. The second mounting base has a first opening at the top. One end of the test probe passes through the first end surface and the other end passes through the first opening. Through this embodiment, the test probe is fixedly mounted.
[0016] Furthermore, the test fixture is provided with two or more sets of matching first openings. Through this embodiment, the test fixture can be used to detect more than one set of encoder contacts to be tested.
[0017] Furthermore, the test probe is a retractable probe. According to this embodiment, the contact points of the test probe and the encoder to be tested are not easily damaged.
[0018] Furthermore, a first opening is vertically provided between the first mounting seat and the second mounting seat, and the fixing post is passed through the first opening. Through this embodiment, the installation and fixation of the buckle device is achieved.
[0019] As can be seen from the above technical solution, the test fixture according to the embodiment of the utility model includes a mounting base, a snap-fit device and a test probe. The snap-fit device provided on the mounting base can be used to fix the test fixture to the encoder to be tested. The test probe provided on the mounting base can be used to contact the test points required for testing on the circuit board of the encoder to be tested to collect and read its signal, thereby achieving rapid testing. This test fixture is simple to operate, can be quickly connected and removed, and is universal for this type of encoder. BRIEF DESCRIPTION OF THE DRAWINGS
[0020] The preferred embodiments of the present invention will be described in detail below with reference to the accompanying drawings, so that those skilled in the art will have a clearer understanding of the above and other features and advantages of the present invention. In the accompanying drawings:
[0021] Figure 1 This is a schematic structural diagram of a first end surface of a testing fixture according to an embodiment of the present utility model;
[0022] Figure 2 This is a schematic structural diagram of a second end surface of a testing fixture according to an embodiment of the present utility model;
[0023] Figure 3 Schematic diagram of the structure of a buckle device of a test fixture according to an embodiment of the present invention;
[0024] The accompanying drawings are numerals as follows:
[0025] 1 mounting base 11 first buckle 12 second buckle 20 test probe
[0026] 30 fixed column 31 main body 33 extension 35 blocking member
[0027] 41 first spring member 42 second spring member 50 positioning pin 60 limiting column
[0028] 70 first opening 80 first opening DETAILED DESCRIPTION
[0029] In order to make the purpose, technical solutions and advantages of the present invention more clear, the present invention is further described in detail with reference to the following embodiments.
[0030] Figure 1 This is a schematic structural diagram of a first end surface of a testing fixture according to an embodiment of the present utility model; Figure 2 This is a schematic structural diagram of a second end surface of a testing fixture according to an embodiment of the present utility model;
[0031] like Figure 1 and Figure 2 As shown, the test fixture includes a mounting base 1, a clamping device and a test probe 20. The shape and size of the mounting base 1 are adapted to the shape and size of the encoder to be tested, including a first end face and a second end face arranged opposite to each other up and down, and a first end and a second end arranged opposite to each other horizontally. The clamping device includes a first clamp 11 and a second clamp 12. The first clamp 11 and the second clamp 12 are respectively arranged at the first end and the second end perpendicular to the mounting base 1, and the first clamp 11 and the second clamp 12 are arranged to be able to rotate along the radial direction of the mounting base 1; the test probe 20 is arranged on the first end face of the circuit board corresponding to the encoder to be tested.
[0032] Specifically, the mounting base 1 is adapted to the circular structure of the encoder to be tested and is also configured as a circular structure; the mounting base 1 is made of plastic, for example.
[0033] Furthermore, a first card slot and a second card slot are respectively provided at the first end and the second end of the mounting base 1 , and the first card buckle 11 and the second card buckle 12 are respectively provided in the first card slot and the second card slot.
[0034] Specifically, the first clip 11 is passed through a horizontally arranged first movable pin so as to be rotatably mounted on opposite sides of the first slot of the mounting base 1, and the second clip 12 is passed through a horizontally arranged second movable pin so as to be rotatably mounted on opposite sides of the second slot of the mounting base 1; in this way, the first clip 11 and the second clip 12 can rotate along the radial direction of the mounting base 1, for example, when rotating outward at the same time, the clamping of the circuit board of the encoder to be tested is released, and when rotating inward at the same time, the circuit board of the encoder to be tested is clamped.
[0035] Further, such as Figure 1 and Figure 2 As shown, the lower ends of the first and second clips 11 and 12 are respectively provided with a first clamping groove and a second clamping groove adapted to the thickness of the encoder to be tested. Therefore, the first and second clips 11 and 12 can firmly clamp the circuit board of the encoder to be tested, making the test effect more stable.
[0036] Furthermore, the buckle device also includes a fixing column 30, which is vertically arranged on the second end face. The first buckle 11 is connected to the fixing column 30 through a first spring member 41, and the second buckle 12 is connected to the fixing column 30 through a second spring member 42.
[0037] Figure 3 Schematic diagram of the structure of a buckle device of a test fixture according to an embodiment of the present invention;
[0038] like Figure 2 and Figure 3 As shown, the mounting base 1 comprises a first mounting base 1 positioned below and a second mounting base 1 positioned above, secured together by fasteners such as bolts and nuts. A first opening 80 is vertically provided between the first and second mounting bases 1, and the fixing post 30 is disposed within the first opening 80. Specifically, the diameter of the main portion 31 of the fixing post 30 is greater than the diameter of the extension 33 below it. The bottom of the extension 33 is fitted through a plugging member 35 and secured to the bottom of the first opening 80, thereby securing the fixing post 30 within the mounting base 1. A first spring member 41 and a second spring member 42 are mounted within the second mounting base 1, making the fixture simple, aesthetically pleasing, and convenient to use.
[0039] Based on the above embodiment, a first opening 70 is provided on the top of the second mounting base 1, and one end of the test probe 20 passes through the first end surface, and the other end passes through the first opening 70. Specifically, Figure 2 As shown, the end of the test probe 20 used for connecting to the cable faces upward, with the test probe tip facing downward and inserted through the first opening 70. The probe then passes through the fixing hole on the bottom plate of the second mounting base 1, and then through the first mounting base 1 and the first end surface. The method for securing the test probe 20 in the fixing hole is well known to those skilled in the art and need not be described in detail here.
[0040] Furthermore, the test fixture is provided with two or more sets of matching first openings 70. For example Figure 1 and Figure 2 As shown, there are two first openings 70 for installing the test probes 20 as needed.
[0041] Furthermore, the test fixture includes a locating pin 50, which is vertically disposed on the first end surface. Specifically, the locating pin 50 is disposed on the first end surface of the mounting base 1, corresponding to the encoder opening on the circuit board of the encoder to be tested. This allows for rapid positioning of the circuit board. For example, two locating pins 50 may be symmetrically disposed.
[0042] Furthermore, the first end surface is further provided with a limiting post 60. For example, it includes two symmetrically arranged limiting posts 60. The positioning pin 50 and the limiting post 60 work together to achieve rapid alignment.
[0043] Furthermore, the test probe 20 is a retractable probe.
[0044] like Figure 1 As shown, the first end surface of the base is further provided with a second opening corresponding to, for example, a display portion of the encoder to be tested.
[0045] In summary, according to the test fixture of the present invention, the circuit board of the encoder can be tested very conveniently and quickly through the easy-to-operate snap device and the setting of the test probe 20.
[0046] The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention. Any modifications, equivalent replacements, improvements, etc. made within the spirit and principles of the present invention should be included in the scope of protection of the present invention.
Claims
1. A test fixture for testing an encoder to be tested, characterized in that: The invention comprises a mounting seat (1), a snap-fit device and a test probe (20); the shape and size of the mounting seat (1) are adapted to the shape and size of the encoder to be tested, and the mounting seat (1) comprises a first end face and a second end face arranged opposite to each other vertically, and a first end and a second end arranged opposite to each other horizontally; the snap-fit device comprises a first snap-fit (11) and a second snap-fit (12); the first snap-fit (11) and the second snap-fit (12) are arranged at the first end and the second end, respectively, perpendicular to the mounting seat (1); the first snap-fit (11) and the second snap-fit (12) are arranged to be rotatable along the radial direction of the mounting seat (1); and the test probe (20) is arranged on the first end face of the circuit board corresponding to the encoder to be tested.
2. The test fixture according to claim 1, characterized in that: The first end and the second end of the mounting seat (1) are respectively provided with a first card slot and a second card slot, and the first clip (11) and the second clip (12) are respectively rotatably arranged in the first card slot and the second card slot.
3. The test fixture according to claim 1, characterized in that: The buckle device further comprises a fixing column (30), wherein the fixing column (30) is vertically arranged on the second end face, the first buckle (11) is connected to the fixing column (30) via a first spring member (41), and the second buckle (12) is connected to the fixing column (30) via a second spring member (42).
4. The test fixture according to claim 1, characterized in that: The lower ends of the first buckle (11) and the second buckle (12) are respectively provided with a first clamping groove and a second clamping groove adapted to the thickness of the encoder to be tested.
5. The test fixture according to claim 1, characterized in that: A positioning pin (50) corresponding to an encoder opening on the encoder to be tested is provided on the first end surface.
6. The test fixture according to claim 1, characterized in that: A limiting column (60) is also provided on the first end surface.
7. The test fixture according to claim 3, characterized in that: The mounting base (1) is formed by connecting a first mounting base (1) located below and a second mounting base (1) located above. A first opening (70) is provided on the top of the second mounting base (1). One end of the test probe (20) passes through the first end surface, and the other end passes through the first opening (70).
8. The test fixture according to claim 7, characterized in that: The test fixture is provided with two or more sets of matching first openings (70).
9. The test fixture according to claim 1, characterized in that: The test probe (20) is a retractable probe.
10. The test fixture according to claim 7, characterized in that: A first opening (80) is vertically provided between the first mounting seat (1) and the second mounting seat (1), and the fixing column (30) is passed through the first opening (80).