Hall sensor trigger sensitivity screening device

Abstract

The utility model relates to the field of electronic component testing, in particular to a Hall sensor trigger sensitivity screening device which comprises a testing seat, a magnetic field generating mechanism and a trigger indicating mechanism, the testing seat is provided with at least two testing positions, and the magnetic field generating mechanism is suitable for forming a magnetic field with set strength at the testing positions. The trigger indication mechanism comprises a plurality of Hall insertion ports, the Hall insertion ports are arranged opposite to the test positions, so that the Hall insertion ports can be connected with Hall sensors through the Hall insertion ports, and the Hall sensors can be connected with the Hall sensors through the Hall insertion ports. And the trigger state of the Hall sensor is indicated through the trigger indication mechanism, so that the trigger sensitivity of the Hall sensor can be quickly tested, and the Hall sensors with different trigger sensitivities can be reasonably utilized.

Description

Technical Field

[0001] This application relates to the field of electronic component testing, and in particular to a Hall sensor trigger sensitivity screening device. Background Technology

[0002] A Hall sensor is a magnetic sensor based on the Hall effect that can detect magnetic fields and their changes. It has the advantages of small size, ease of use, and high measurement sensitivity. It is widely used in various magnetic field-related applications for converting physical quantities such as current, magnetic field, displacement, angle, rotation speed, and pressure into electrical signals for measurement and automatic control.

[0003] The Hall effect refers to the phenomenon where, when a current flows through a semiconductor perpendicular to an external magnetic field, charge carriers are deflected, creating an additional electric field perpendicular to both the current and the magnetic field. This generates a potential difference across the semiconductor, known as the Hall potential difference or Hall voltage. The minimum external magnetic field strength required for a Hall sensor to generate a Hall electromotive force is called the sensor's trigger sensitivity. During the manufacturing process, variations in production techniques and control conditions result in Hall sensors with different trigger sensitivities, allowing for applications in diverse scenarios. Hall sensors with higher trigger sensitivities typically have greater practical value.

[0004] Traditional Hall sensor trigger sensitivity testing devices typically require changing the strength of the external magnetic field during the testing process. The detection circuit measures the output voltage generated by the Hall sensor after triggering under different external magnetic fields, and a gaussmeter is used to measure the magnetic field strength at the trigger point. This method is complex, time-consuming, and difficult to perform large-scale trigger sensitivity testing on Hall sensors. To ensure the effectiveness of Hall sensors, they are usually sampled from the same batch, and the lowest trigger sensitivity obtained from the sample is used as the trigger sensitivity for that batch. This results in high-sensitivity Hall sensors not being utilized effectively. Utility Model Content

[0005] To quickly test the trigger sensitivity of Hall sensors and ensure that Hall sensors with different trigger sensitivities can be used reasonably, this application provides a Hall sensor trigger sensitivity screening device.

[0006] The Hall sensor trigger sensitivity screening device provided in this application adopts the following technical solution:

[0007] A Hall sensor trigger sensitivity screening device includes a test base, a magnetic field generating mechanism, and a trigger indicating mechanism. The test base is provided with at least two test positions. The magnetic field generating mechanism is adapted to generate a magnetic field of a set intensity at the test positions, and the magnetic field intensity generated at different test positions is different. The trigger indicating mechanism includes multiple Hall connectors, which are arranged opposite to the test positions so as to be connected to the Hall sensor through the Hall connectors, and the trigger indicating mechanism indicates the trigger state of the Hall sensor.

[0008] By employing the above technical solution, the triggering state of the Hall sensor under different magnetic fields of varying intensities generated at different test positions by the magnetic field generating mechanism can be detected. This allows for the testing of the Hall sensor's triggering sensitivity level, facilitating the screening of Hall sensors according to their triggering sensitivity levels and ensuring their rational utilization based on these levels. Furthermore, by utilizing a triggering indicator mechanism with multiple Hall interface pins positioned opposite different test positions, the Hall sensor can be rapidly tested at multiple test positions, indicating its triggering state under different magnetic fields and thus obtaining its triggering sensitivity level.

[0009] In one specific implementation, a Hall positioning groove is provided on the test position, the Hall positioning groove is disposed opposite to the Hall connector, the width of the Hall positioning groove is adapted to the Hall sensor, and the Hall connector is disposed at the end of the Hall positioning groove, including multiple pin connectors corresponding to the pins of the Hall sensor.

[0010] By adopting the above technical solution and utilizing a Hall positioning slot with a width adapted to the Hall sensor, accurate positioning of the Hall sensor on the test position can be achieved, ensuring that the Hall sensor is in a fixed position during detection and guaranteeing the consistency of magnetic field strength when different Hall sensors are detected. The relative arrangement of the Hall positioning slot and the Hall connector allows the Hall sensor to be pushed along the positioning slot, facilitating convenient and quick connection of the Hall sensor's pins to the connector.

[0011] In one specific implementation scheme, Hall positioning posts are provided on both sides of the Hall positioning groove, and the shape and position of the Hall positioning posts are adapted to the mounting holes of the Hall sensor.

[0012] By adopting the above technical solution, the Hall positioning posts set on both sides of the Hall positioning groove can limit the position of the Hall sensor in the Hall positioning groove, so that when the pin of the Hall sensor is plugged into the pin interface, the Hall sensor can be located in a fixed position in the Hall positioning groove, ensuring that the Hall sensor is in the same magnetic field environment when detecting the Hall sensor.

[0013] In one specific implementation scheme, the magnetic field generating mechanism includes multiple magnetic field elements, and the test base is provided with multiple magnetic component mounting positions, which are arranged opposite to the test positions one by one. The magnetic field elements are respectively arranged in the magnetic component mounting positions, and a magnetic field guiding hole is provided between the magnetic component mounting positions and the test positions.

[0014] By adopting the above technical solution, multiple magnetic field elements set at the corresponding positions of the test positions on the test base can be used to conveniently form magnetic fields of different magnetic field strengths at multiple test positions, thereby creating different trigger sensitivity detection environments for Hall sensors, which are used to detect and screen the trigger sensitivity of Hall sensors.

[0015] In one specific implementation, the magnetic field element is an electromagnet, and the magnetic field generating mechanism further includes a power supply circuit. The magnetic field element is electrically connected to the power supply circuit, and the power supply circuit is capable of generating a DC power supply with a set voltage.

[0016] By adopting the above technical solution and using an electromagnet as a magnetic field element, it is easy to control the magnetic field strength generated by the magnetic field element, which is beneficial for screening Hall sensors according to different trigger sensitivity requirements. A DC power supply with a set voltage value generated by the power supply circuit can generate a constant electromagnetic field of a set intensity through the electromagnet, thereby forming stable magnetic fields of different set intensities at different test positions.

[0017] In one specific implementation, the power supply circuit includes a DC-DC adjustable regulated power supply module.

[0018] By adopting the above technical solution, the output voltage of the power supply circuit can be easily adjusted using the DC-DC adjustable voltage regulator module, reducing the ripple of the output voltage and improving the stability of the electromagnetic field generated by the electromagnet.

[0019] In one specific implementation scheme, the triggering indicator mechanism includes multiple triggering indicator circuits, each of which is equipped with a light-emitting element. The triggering indicator circuit is connected to the Hall interface in a one-to-one correspondence, so as to control the illumination of the light-emitting element according to the triggering state of the Hall sensor.

[0020] By adopting the above technical solution and utilizing multiple trigger indicator circuits that correspond one-to-one with the Hall interface, the trigger state of the Hall sensor in magnetic fields of different intensities can be indicated by the light-emitting element in the trigger indicator circuit, thereby conveniently determining the trigger sensitivity level of the Hall sensor.

[0021] In one specific implementation, the light-emitting element is an LED, and different colors of LEDs are used for the light-emitting elements in different trigger indicator circuits.

[0022] By adopting the above technical solution and using LEDs of different colors, it is possible to improve the convenience of judging the trigger sensitivity level of the Hall sensor and reduce the judgment error when screening the trigger sensitivity level of the Hall sensor.

[0023] In one specific implementation scheme, the Hall sensor trigger sensitivity screening device of this application further includes a test instrument box. The magnetic field generating mechanism includes a magnetic field element and a power supply circuit connected to each other. The trigger indicating mechanism includes a Hall interface and a trigger indicating circuit connected to each other. The power supply circuit and the trigger indicating circuit are disposed in the test instrument box. The Hall interface is disposed on the wall of the test instrument box and is disposed opposite to the test base. The magnetic field element is disposed on the test base and is disposed opposite to the test position.

[0024] By adopting the above technical solution, the test instrument box can accommodate and house the power supply circuit, trigger indicator circuit, and Hall interface, facilitating the connection between the various components in the Hall sensor trigger sensitivity screening device of this application and providing protection for each component. The test socket, positioned opposite the Hall interface, facilitates the connection and positioning of the Hall sensor with the Hall sensor trigger sensitivity screening device of this application, improving the convenience and efficiency of Hall sensor trigger sensitivity screening.

[0025] In one specific implementation, the test positions are arranged linearly on the test socket, the test socket is fixed on the test instrument box, and the Hall effect connector is disposed on the side wall of the same side of the test instrument box, corresponding one-to-one with the test positions.

[0026] By adopting the above technical solution, using the test base fixed on the test instrument box and multiple test positions arranged linearly on the test base, the Hall sensor can be conveniently plugged into multiple Hall connectors. The light-emitting element in the trigger indicator circuit indicates the trigger state of the Hall sensor in magnetic fields of different intensities, thereby conveniently determining the trigger sensitivity level of the Hall sensor.

[0027] In summary, this application includes at least one of the following beneficial technical effects:

[0028] 1. By generating magnetic fields of different intensities at different test positions through a magnetic field generating mechanism, Hall sensors located at different test positions can be placed in magnetic field environments of different intensities. The triggering state of the Hall sensors in magnetic fields of different intensities can be tested to determine the triggering sensitivity level of the Hall sensors. This allows for the rapid screening of Hall sensors with different triggering sensitivity levels, and the full and rational utilization of Hall sensors with different triggering sensitivities.

[0029] 2. By setting the multiple Hall effect connectors of the trigger indicator mechanism to be positioned opposite to different test positions, Hall effect sensors can be quickly connected to the trigger indicator mechanism from different test positions to detect the trigger state of the Hall effect sensor in different magnetic field strengths. Based on the magnetic field strength when the trigger state of the Hall effect sensor changes as indicated by the trigger indicator mechanism, the trigger sensitivity level of the Hall effect sensor can be quickly determined.

[0030] 3. By setting a Hall positioning groove of a set width at the test position, and Hall positioning strips on the bottom and / or sides of the Hall positioning groove, the Hall sensor can be confined to a set position in the magnetic field, ensuring the consistency of the magnetic field strength when performing trigger state detection.

[0031] 4. By setting an electromagnet at a designated magnetic mounting position and connecting it to a DC-DC adjustable regulated power supply module, the magnetic field strength of the electromagnetic field generated by the electromagnet can be easily adjusted by regulating the output voltage of the DC-DC adjustable regulated power supply module. This allows the required magnetic field strength to be generated at different test positions according to different screening requirements for the trigger sensitivity of the Hall sensor. Attached Figure Description

[0032] Figure 1 This is a schematic diagram of the structure of one embodiment of this application.

[0033] Figure 2 This is a schematic diagram of the test seat portion structure in one embodiment of this application.

[0034] Figure 3 This is a schematic cross-sectional view of the test stand in one embodiment of this application.

[0035] Figure 4 This is a circuit diagram of a magnetic field generating mechanism in one embodiment of this application.

[0036] Figure 5 This is a schematic diagram of the trigger indicator mechanism circuit in one embodiment of this application.

[0037] Explanation of reference numerals in the attached drawings: 1. Test base; 11. Test position; 111. Hall positioning groove; 112. Hall positioning strip; 12. Magnetic component mounting position; 13. Magnetic field guide hole; 2. Magnetic field generating mechanism; 21. Magnetic field element; 22. Power supply circuit; 221. DC-DC adjustable regulated power supply module; 3. Trigger indicator mechanism; 31. Hall interface; 311. Pin interface; 32. Trigger indicator circuit; 321. Light-emitting element; 4. Test instrument box; 5. Hall sensor. Detailed Implementation

[0038] The specific embodiments of this application will now be described in detail with reference to the accompanying drawings. It should be understood that the specific embodiments described herein are for illustration and explanation only and are not intended to limit this application.

[0039] In the description of this application, it should be noted that, unless otherwise expressly specified and limited, the terms "set" and "connection" should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral connection; they can refer to a direct connection or an indirect connection through an intermediate medium; they can refer to the internal communication of two elements or the interaction between two elements. Those skilled in the art can understand the specific meaning of the above terms in this application according to the specific circumstances.

[0040] One embodiment of the Hall sensor-triggered sensitivity screening device of this application is as follows: Figures 1 to 5 As shown, the device includes a test base 1, a magnetic field generating mechanism 2, and a trigger indicating mechanism 3. The test base 1, used to support and position the Hall sensor 5 to be screened, is typically made of a non-ferromagnetic material, such as hard plastic or bakelite. At least two test positions 11 are provided on the test base 1 for testing the Hall sensor 5. Each test position 11 is used to test the trigger state of the Hall sensor 5 under a specific magnetic field strength. By testing at multiple test positions 11 and observing the changes in the trigger state of the Hall sensor at different test positions 11, the trigger sensitivity level of the Hall sensor 5 can be accurately determined. In this application, "multiple" refers to two or more.

[0041] The test base 1 typically has 2-4 test positions 11. The more test positions 11 there are, the finer the screening result of the Hall sensor 5's trigger sensitivity, but the more time is spent on the screening test. The trigger sensitivity of Hall sensors 5 produced in a batch usually does not differ significantly, and setting 2-4 test positions is generally sufficient for practical applications. Of course, this application does not preclude setting more test positions 11; setting more test positions 11 still falls within the scope of protection of this application.

[0042] The magnetic field generating mechanism 2 can be any mechanism capable of generating a magnetic field of a certain intensity at each test position 11. It can be a single component or a component composed of multiple components. The magnetic field generating mechanism 2 can generate magnetic fields of different intensities at different test positions 11, thereby enabling the testing of the triggering state of the Hall sensor 5 in magnetic fields of different intensities, and thus determining the triggering sensitivity level of the Hall sensor 5.

[0043] The trigger indicator mechanism 3 can be any mechanism capable of indicating the trigger state of the Hall sensor 5. By indicating the trigger state of the Hall sensor 5 in magnetic fields of different intensities, the trigger sensitivity level of the Hall sensor 5 can be obtained. The trigger indicator mechanism 3 is provided with multiple Hall connectors 31, each Hall connector 31 corresponding to a test position 11, for connecting the Hall sensor 5 at that test position to the trigger indicator mechanism 3. The trigger indicator mechanism 3 can output a detection voltage to the power supply pin of the Hall sensor 5 at each test position 11, detect the output signal of the output pin of the Hall sensor 5, and indicate the trigger state of the Hall sensor 5 based on the output signal.

[0044] In some embodiments of the Hall sensor trigger sensitivity screening device of this application, such as Figure 1 As shown, a Hall positioning groove 111 is provided at the test position 11. The Hall positioning groove 111 is positioned towards the Hall connector 31 and extends to the Hall connector 31. The width of the Hall positioning groove 111 is slightly smaller than the width of the Hall sensor 5, so that the Hall sensor 5 can be smoothly placed in the Hall positioning groove 111, while restricting the lateral movement of the Hall sensor 5 in the Hall positioning groove 111.

[0045] The Hall interface 31 is usually located at the end of the Hall positioning groove 111. Multiple pin interfaces 311 are provided on the Hall interface 31. The number and position of the pin interfaces 311 correspond to the number and position of the pins of the Hall sensor 5 to be tested. By moving the Hall sensor 5 in the Hall positioning groove 111, each pin of the Hall sensor 5 can be easily connected to the corresponding pin interface 311 of the Hall interface 31, forming a reliable connection between the Hall sensor 5 and the trigger indicator mechanism 3.

[0046] In a preferred embodiment of the Hall sensor trigger sensitivity screening device of this application, such as Figure 1 and Figure 3 As shown, Hall positioning posts 112 are provided on both sides of the Hall positioning groove 111. The shape and position of the Hall positioning posts 112 are adapted to the mounting holes on the Hall sensor 5. This allows the Hall sensor 5 to be placed in the Hall positioning groove 111, with the wing plate of the Hall sensor 5 located outside the Hall positioning groove 111. The mounting holes on the wing plate are fitted onto the Hall positioning posts 112, defining the position of the Hall sensor 5 in the Hall positioning groove 111. This ensures that Hall sensors 5 tested at the same test position 11 are located in the same position on the test position 11, which helps to ensure the consistency of magnetic field strength when different Hall sensors 5 are tested at the same test position 11.

[0047] In some embodiments of the Hall sensor trigger sensitivity screening device of this application, such as Figures 1 to 3As shown, the magnetic field generating mechanism 2 has multiple magnetic field elements 21. The magnetic field elements 21 can be magnets with a set magnetic field strength or electromagnets capable of generating a magnetic field of a set strength. The number of magnetic field elements 21 is the same as the number of test positions 11 on the test base 1. At the same time, multiple magnetic component mounting positions 12 are provided on the test base 1, and each magnetic component mounting position 12 corresponds to one test position 11, usually located on the side of the test base 1 opposite to the test position 11.

[0048] A magnetic field guide hole 13 is provided between the magnetic component mounting position 12 and the test position 11. Each magnetic field element 21 is installed in a corresponding magnetic component mounting position 12. The magnetic field generated by the magnetic field element 21 passes through the test position 11 along the direction of the magnetic field guide hole 13, so that the Hall sensor 5 can be triggered under the action of the magnetic field.

[0049] Typically, the magnetic field elements 21 are mounted in the magnetic mounting position 12 with the same magnetic pole orientation, so that the magnetic field lines of the magnetic field elements 21 pass through the Hall sensor 5 in the same direction. In this embodiment, the magnetic field elements 21 are all mounted in the magnetic mounting position 12 with their S pole facing the test position 11.

[0050] In a preferred embodiment of the Hall sensor trigger sensitivity screening device of this application, such as Figure 2 and Figure 4 As shown, the magnetic field element 21 uses an electromagnet, which includes an electromagnetic coil and an iron core inserted into the electromagnetic coil. Simultaneously, the magnetic field generating mechanism 2 is also equipped with a power supply circuit 22, which typically contains multiple power supply units. Each magnetic field element 21 is connected to one of the power supply units in the power supply circuit 22. Different power supply units provide each electromagnet with a DC current of different voltages, thereby generating electromagnetic fields of different magnetic field strengths at the test position 11 through different electromagnets.

[0051] As one specific embodiment of the Hall sensor trigger sensitivity screening device of this application, such as Figure 4 As shown, the power supply unit in the power supply circuit 22 is constructed using a DC-DC adjustable voltage regulator module 221. In this embodiment, the YS-JDC125 3A adjustable step-down DC-DC regulator module manufactured by Shenzhen Aolong Electronics Technology Co., Ltd. is used. Of course, any other suitable voltage regulator module can be used, or a voltage management integrated circuit, such as LM2596, can be used to construct the DC-DC adjustable voltage regulator module 221 using the circuit recommended by the manufacturer.

[0052] In some embodiments of the Hall sensor trigger sensitivity screening device of this application, such as Figure 1 and Figure 5As shown, the trigger indicator mechanism 3 is provided with multiple trigger indicator circuits 32, and each trigger indicator circuit 32 is provided with a light-emitting element 321.

[0053] Each trigger indicator circuit 32 is connected to a Hall effect connector 31, and each Hall effect connector 31 is also connected to a test power supply. When the pin of the Hall sensor 5 on the test position 11 is plugged into the Hall effect connector 31, the pin of the Hall sensor 5 is connected to the test power supply and the trigger indicator circuit 32 respectively through the corresponding pin connector 311. The test power supply provides the power required for the Hall sensor 5 to trigger, and the trigger signal of the Hall sensor 5 is transmitted to the trigger indicator circuit 32 through its signal output pin to control the light-emitting element 321 to turn on or off. Specifically, when the Hall sensor 5 is triggered by the magnetic field of the test position 11, the light-emitting element 321 emits light; otherwise, the light-emitting element 321 turns off.

[0054] In a preferred embodiment of the Hall sensor trigger sensitivity screening device of this application, such as Figure 1 and Figure 5 As shown, LEDs are used as light-emitting elements 321. Different colored LEDs are typically used as light-emitting elements 321 in different trigger indicator circuits 32. In this way, when the Hall sensor 5 is triggered in different test positions 11, different light-emitting elements 11 emit light of different colors, indicating that the Hall sensor 5 has different trigger sensitivities.

[0055] In some embodiments of the Hall sensor trigger sensitivity screening device of this application, such as Figure 1 As shown, the Hall sensor trigger sensitivity screening device of this application also includes a test instrument box 4. The magnetic field generating mechanism 2 includes a magnetic field element 21 and a power supply circuit 22 connected to each other, and the trigger indicating mechanism 3 includes a Hall interface 31 and a trigger indicating circuit 32 connected to each other. The power supply circuit 22 and the trigger indicating circuit 32 are disposed in the test instrument box 4, and the test instrument box 4 protects the power supply circuit 22 and the trigger indicating circuit 32; the Hall interface 31 is disposed on the wall of the test instrument box 4, which facilitates the insertion of the Hall sensor 5 into the Hall interface 31 from the outside of the test instrument box 4, and its connection to the trigger indicating circuit 32 inside the test instrument box 4.

[0056] The Hall interface 31 is positioned opposite to the test base 1, specifically corresponding to the Hall positioning slots 111 on different test positions 11. The magnetic field element 21 is mounted and fixed on the test base 1, specifically mounted on the side opposite to the test position 11, at the position opposite to the Hall sensor 5 on the test position 11.

[0057] In a preferred embodiment of the Hall sensor trigger sensitivity screening device of this application, such as Figure 1As shown, the test positions 11 are arranged linearly at the same spacing on the test base 1. Simultaneously, Hall effect interfaces 31 are also located on the side wall of the test instrument box 4, arranged linearly at the same spacing on the side wall of the test instrument box 4. The test base 1 is fixed to the side wall of the test instrument box 4 and located below the Hall effect interfaces 31, such that each test position 11, typically the Hall effect positioning slot 111 on each test position 11, corresponds one-to-one with the test position 11.

[0058] Typically, the magnetic field elements 21 are installed in ascending order of magnetic field strength on different test positions 11. During the screening test of the trigger sensitivity of the Hall sensor 5, the Hall sensor 5 is inserted sequentially onto test positions 11 with different magnetic field strengths in ascending order of strength. Once the light-emitting element 321 corresponding to a certain test position 11 emits light, it indicates that the trigger sensitivity of the Hall sensor 5 is within the magnetic field strength level corresponding to that test position 11. At this point, testing is no longer performed on test positions 11 with higher magnetic field strengths.

[0059] For example, the trigger sensitivity of Hall sensor 5 is tested using a Hall sensor trigger sensitivity screening device with two test positions 11. The two test positions 11 are respectively set on the left and right sides of the test base 1. The light-emitting element 321 corresponding to the test position 11 on the left is a green LED, and the magnetic field strength formed by the magnetic field element 21 is 50Gs; the light-emitting element 321 corresponding to the test position 11 on the right is a red LED, and the magnetic field strength formed by the magnetic field element 21 is 70Gs. When testing the trigger sensitivity of Hall sensor 5, first connect Hall sensor 5 to Hall connector 31 on the left test position 11. If the green LED lights up, it indicates that the trigger sensitivity of Hall sensor 5 is below a magnetic field strength of less than 50 Gs, indicating high trigger sensitivity. This Hall sensor 5 does not need to be tested on the right test position 11. If the green LED does not light up, then connect Hall sensor 5 to Hall connector 31 on the right test position 11. If the red LED lights up, it indicates that the trigger sensitivity of Hall sensor 5 is below a magnetic field strength of less than 70 Gs, indicating low trigger sensitivity. If the red LED does not light up, it indicates that the trigger sensitivity of Hall sensor 5 is above a magnetic field strength of 70 Gs or is damaged. The trigger sensitivity of Hall sensor 5 does not meet the requirements, and this Hall sensor 5 should be discarded. This allows for convenient screening of the trigger sensitivity of Hall sensor 5, enabling the application of Hall sensor 5 with different trigger sensitivities to different scenarios and improving the usability of Hall sensor 5.

[0060] In the description of this application, the references to terms such as "an embodiment," "specific embodiment," and "preferred embodiment" indicate that a specific feature, structure, material, or characteristic described in connection with that embodiment or example is included in at least one embodiment or example of this application. In this application, the illustrative expressions of the above terms do not necessarily refer to the same embodiment or example. Furthermore, the specific features, structures, materials, or characteristics described may be combined in any suitable manner in one or more embodiments or examples.

[0061] The above are all preferred embodiments of the present application, and are not intended to limit the scope of protection of the present application. Therefore, any equivalent changes made based on the structure, shape, and principle of the present application should be included in the scope of protection of the present application.

Claims

1. A Hall sensor-triggered sensitivity screening device, characterized in that, The device includes a test base (1), a magnetic field generating mechanism (2), and a trigger indicating mechanism (3). The test base (1) is provided with at least two test positions (11). The magnetic field generating mechanism (2) is adapted to form a magnetic field of a set intensity at the test positions (11), and the magnetic field intensity formed at different test positions (11) is different. The trigger indicating mechanism (3) includes multiple Hall effect connectors (31). The Hall effect connectors (31) are arranged opposite to the test positions (11) so that they can be connected to Hall sensors through the Hall effect connectors (31) and the trigger indicating mechanism (3) indicates the trigger state of the Hall sensor.

2. The Hall sensor trigger sensitivity screening device according to claim 1, characterized in that, The test position (11) is provided with a Hall positioning groove (111), which is opposite to the Hall connector (31). The width of the Hall positioning groove (111) is adapted to the Hall sensor. The Hall connector (31) is located at the end of the Hall positioning groove (111) and includes multiple pin connectors (311) corresponding to the pins of the Hall sensor.

3. The Hall sensor trigger sensitivity screening device according to claim 2, characterized in that, Hall positioning posts (112) are provided on both sides of the Hall positioning groove (111), and the shape and position of the Hall positioning posts (112) are adapted to the mounting holes of the Hall sensor.

4. The Hall sensor trigger sensitivity screening device according to claim 2, characterized in that, The magnetic field generating mechanism (2) includes multiple magnetic field elements (21). The test base (1) is provided with multiple magnetic component mounting positions (12). The magnetic component mounting positions (12) are arranged opposite to the test positions (11). The magnetic field elements (21) are respectively arranged in the magnetic component mounting positions (12). A magnetic field guiding hole (13) is provided between the magnetic component mounting positions (12) and the test positions (11).

5. The Hall sensor trigger sensitivity screening device according to claim 4, characterized in that, The magnetic field element (21) is an electromagnet, and the magnetic field generating mechanism (2) also includes a power supply circuit (22). The magnetic field element (21) is electrically connected to the power supply circuit (22), and the power supply circuit (22) can generate a DC power supply with a set voltage.

6. The Hall sensor trigger sensitivity screening device according to claim 5, characterized in that, The power supply circuit (22) includes a DC-DC adjustable regulated power supply module (221).

7. The Hall sensor trigger sensitivity screening device according to claim 1, characterized in that, The trigger indicator mechanism (3) includes multiple trigger indicator circuits (32), each of which is equipped with a light-emitting element (321). The trigger indicator circuit (32) is connected to the Hall interface (31) in a one-to-one correspondence, so as to control the light-emitting element (321) to turn on or off according to the trigger state of the Hall sensor.

8. The Hall sensor trigger sensitivity screening device according to claim 7, characterized in that, The light-emitting element (321) is an LED, and the light-emitting element (321) in different trigger indicator circuits (32) uses LEDs of different colors.

9. The Hall sensor trigger sensitivity screening device according to any one of claims 1-8, characterized in that, It also includes a test instrument box (4), the magnetic field generating mechanism (2) includes a magnetic field element (21) and a power supply circuit (22) connected to each other, the trigger indicator mechanism (3) includes a Hall interface (31) and a trigger indicator circuit (32) connected to each other, the power supply circuit (22) and the trigger indicator circuit (32) are disposed in the test instrument box (4), the Hall interface (31) is disposed on the wall of the test instrument box (4) and is disposed opposite to the test base (1), the magnetic field element (21) is disposed on the test base (1) and is disposed opposite to the test position (11).

10. The Hall sensor trigger sensitivity screening device according to claim 9, characterized in that, The test positions (11) are arranged linearly on the test base (1), the test base (1) is fixed on the test instrument box (4), and the Hall interface (31) is set on the side wall of the same side of the test instrument box (4), corresponding one-to-one with the test positions (11).

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