Double-needle-tail probe seat and double-needle-tail probe

Abstract

The utility model relates to the technical field of semiconductor detection, in particular to a double-needle-tail probe seat and a double-needle-tail probe, which comprise a conductive probe comprising two needle tails and a needle rod, the needle tails and the needle rod are combined into a probe sharing one needle point through laser welding, the needle tails are arranged in parallel and are perpendicular to the plane of the needle rod, and the needle tails are arranged in parallel and are perpendicular to the plane of the needle rod. The two needle rods are in the same plane and have a certain angle, and the intersection point is a welding combination point; the main body part of the conductive probe is adopted to form a structure with an n-L-shaped geometrical characteristic, and a tapered design is formed in the longitudinal extension direction of the probe head, so that a detected object can be more accurately contacted, the probability that the conductive probe is in contact with other contact points is effectively reduced, and the accuracy and sensitivity of detection are improved; meanwhile, a smaller contact area with the surface of a measured object can be formed, so that the density and the strength of signal acquisition are increased, and the reliability and the accuracy of a measurement result are improved.

Description

Technical Field

[0001] This utility model relates to the field of semiconductor testing technology, and in particular to a dual-needle tail probe holder and a dual-needle tail probe. Background Technology

[0002] Probe testing refers to a technical method that uses a metal probe with a fine tip to contact the surface of the object being tested in order to obtain the required information and perform the test. Currently, it is commonly used to test the performance and function of electronic devices, circuit boards, or integrated circuit chips.

[0003] Currently, metal probes are usually fastened to the probe holder with bolts. Because the metal probes themselves are small, during the installation process, the bolts can easily rotate and press against the metal probe, causing it to twist and deform. This not only changes the original length of the metal probe and increases the error of subsequent detection, but the twisting and deformation may also interfere with signal transmission, causing signal distortion or loss, and affecting the accuracy and reliability of the detection results.

[0004] Therefore, a dual-needle tail probe holder and a dual-needle tail probe are proposed to solve the above problems. Utility Model Content

[0005] The purpose of this invention is to provide a double-needle-tail probe holder and a double-needle-tail probe to solve the above problems, thereby improving the problem that existing double-needle probe holders are prone to twisting and damaging the probes during the probe installation process, which affects subsequent testing.

[0006] This utility model achieves the above-mentioned objective through the following technical solution: a double-needle tail probe holder, comprising: a mounting base, two connecting rods, and two locking mechanisms, wherein the connecting rods are hinged to one end of the mounting base, and one end of the connecting rods is provided with a threaded hole;

[0007] The locking mechanism includes a locking spring piece fixedly connected to one end of the connecting rod. One end of the locking spring piece has an insertion hole, and a screw that is threadedly connected to the threaded hole is inserted into the insertion hole. The middle section of the locking spring piece is laterally raised and forms a U-shaped positioning part.

[0008] Preferably, one end of the connecting rod has a groove communicating with the threaded hole, and the locking spring is disposed inside the groove, the height of the locking spring being the same as the vertical cross-sectional height of the groove.

[0009] Preferably, the locking spring has rounded corners, and the locking spring is a beryllium copper material component.

[0010] Preferably, the locking spring is fixedly connected to one end of the connecting rod by laser welding, and the locking spring is in a compressed state at this time.

[0011] A dual-needle-tail probe includes a conductive probe with two needle tails and a needle rod. The two needle tails and the needle rod are laser-welded together to form a probe sharing a single needle tip. The needle tails are arranged in parallel and perpendicular to the plane of the needle rod. The two needle rods are on the same plane and have a certain angle. The intersection point is the welding joint point.

[0012] Preferably, the main body of the conductive probe is configured with a cross-sectional structure having an approximately ┌─┐ shaped geometric feature, and a tapering design is formed in its longitudinal extension direction. Specifically, the cross-sectional area decreases from the proximal end to the distal end of the needle seat, and the needle tip of the conductive probe gradually shrinks along the probe axis direction, thereby forming a gradient conductive contact interface.

[0013] The beneficial effects of this utility model are:

[0014] 1. This application uses a screw to actively drive the positioning spring to rotate and wrap around and lock the conductive probe. This can effectively reduce the probability of the conductive probe torturing and deforming during the locking process, so as to ensure that the conductive probe can operate normally. At the same time, the design of wrapping and locking the conductive probe can lock the conductive probe in all directions, further reducing the probability of the conductive probe shaking or tilting during operation, thereby improving the accuracy of subsequent detection.

[0015] 2. The design uses laser welding technology to connect two conductive probes together. Laser welding not only has the advantages of precise positioning and high-precision welding, but also effectively reduces the problems of poor welding accuracy, low welding quality and poor consistency of existing solder welding. At the same time, no other materials need to be added during the laser welding process, which can keep the resistance from the tip of the probe to the two probe tails consistent and stable, thereby reducing interference in electrical conduction. Furthermore, it can avoid interference and pollution from solder during subsequent recycling and use, reducing the emission of harmful substances and meeting the environmental protection requirements of modern manufacturing industry.

[0016] 3. The main body of the conductive probe is constructed with an approximate ┌─┐ geometric feature, and its tip has a tapering design in the longitudinal direction. This not only allows for more precise contact with the object being measured, but also effectively reduces the probability of the conductive probe coming into contact with other contact points, thereby improving the accuracy and sensitivity of the detection. At the same time, it also forms a smaller contact area with the surface of the object being measured, thereby increasing the density and intensity of signal acquisition and improving the reliability and accuracy of the measurement results. Attached Figure Description

[0017] Figure 1 This is a front view of the overall structure of this utility model;

[0018] Figure 2 This is a rear view of the overall structure of this utility model;

[0019] Figure 3 This is a schematic diagram showing a partial structure of the present invention;

[0020] Figure 4 for Figure 2 Enlarged view of A in the middle;

[0021] Figure 5 This is a schematic diagram of the conductive probe in this utility model.

[0022] In the diagram: 100, mounting base; 200, connecting rod; 210, threaded hole; 220, groove; 300, locking mechanism; 310, locking spring; 311, insertion hole; 312, positioning part; 320, screw; 400, conductive probe. Detailed Implementation

[0023] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the protection scope of the present utility model.

[0024] In practical implementation: such as Figure 1-5 As shown, a dual-needle tail probe holder includes: a mounting base 100, two connecting rods 200, and two locking mechanisms 300; the connecting rods 200 are hinged to one end of the mounting base 100, and one end of the connecting rods 200 has a threaded hole 210; one end of the connecting rods 200 has a mounting hole, and the mounting end of the conductive probe 400 is inserted into the mounting hole.

[0025] like Figure 2 , Figure 3 , Figure 4 and Figure 5As shown, the locking mechanism 300 includes a locking spring 310 fixedly connected to one end of the connecting rod 200. One end of the locking spring 310 has an insertion hole 311, into which a screw 320, threadedly connected to a threaded hole 210, is inserted. The middle section of the locking spring 310 is laterally raised, forming a U-shaped positioning portion 312. One end of the connecting rod 200 has a groove 220 communicating with the threaded hole 210. The locking spring 310 is disposed inside the groove 220, and the height of the locking spring 310 is the same as the vertical cross-sectional height of the groove 220. The groove 220 can prevent the locking spring 310 from engaging with the threaded hole 210. As the screw 320 rotates, the locking spring 310 can smoothly lock the conductive probe 400. The corners of the locking spring 310 are rounded. The locking spring 310 is made of beryllium copper, which reduces the probability of the conductive probe 400 being scratched by the locking spring 310 during installation. The locking spring 310 is made of beryllium copper, which has excellent elasticity, conductivity and wear resistance, and a high elastic modulus, and can maintain stable rebound ability after repeated deformation. It should be noted that the locking spring 310 can also be made of materials including but not limited to copper or brass. The specific material needs to be selected according to the actual situation, which will not be elaborated here.

[0026] The locking spring 310 is fixedly connected to one end of the connecting rod 200 by laser welding. The locking spring 310 is in a compressed state at this time. After the locking spring 310 is locked by the screw 320, the locking spring 310 can push the screw 320 in the opposite direction. This can increase the thread friction between the screw 320 and the threaded hole 210, and lock the conductive probe 400 more stably on the connecting rod 200.

[0027] like Figure 1-5 As shown, a dual-needle-tail probe includes a conductive probe 400 with two needle tails and a needle rod. The two needle tails and needle rods are laser-welded together to form a probe sharing a single needle tip. The needle tails are arranged in parallel, and the two needle rods are on the same plane and at a certain angle. The intersection point is the welding joint point.

[0028] When it is necessary to connect two sets of circuits to detect the same location, the most common method is to use wires or solder the two probes together. However, due to differences in wire resistance or soldering materials, the resistance of the two circuits will differ. In chip testing, any difference in circuit resistance will lead to unsatisfactory test results.

[0029] This application uses laser welding to process the conductive probe 400. Compared with the existing soldering process, laser welding not only has the advantages of precise positioning and high-precision welding, but also effectively reduces the problems of poor welding accuracy, low welding quality and poor consistency that exist in the existing soldering. At the same time, no other materials need to be added during the laser welding process, which can keep the resistance from the tip to the two tails consistent and stable, thereby reducing interference in electrical conduction. Furthermore, it can avoid interference and pollution from solder during subsequent recycling and use, reducing the emission of harmful substances and meeting the environmental protection requirements of modern manufacturing industry.

[0030] The main body of the conductive probe 400 is configured with a cross-sectional structure having an approximate ┌─┐ geometric feature. It features a tapering design along its longitudinal extension direction, specifically a decreasing cross-sectional area from the proximal end to the distal end of the probe base. The probe tip of the conductive probe 400 gradually tapers along the probe axis, forming a gradient-type conductive contact interface. This not only allows for more precise contact with the object being measured, effectively reducing the probability of the conductive probe 400 contacting other contact points, thus improving the accuracy and sensitivity of the detection, but also creates a smaller contact area with the surface of the object being measured, thereby increasing the density and intensity of signal acquisition and improving the reliability and accuracy of the measurement results.

[0031] In use, the conductive probe 400 is first inserted into the mounting hole, and then the screw 320 is threaded through the insertion hole 311 and threaded into the threaded hole 210. As the screw 320 spirals deeper into the threaded hole 210, it drives the locking spring 310 closer to the conductive probe 400 until the positioning part 312 wraps around and presses against the conductive probe 400, and the screw 320 is fastened in the threaded hole 210. During this process, the locking spring 310 locks the conductive probe 400 by rotation, which can effectively reduce the probability of the conductive probe 400 twisting and deforming during the locking process, so as to ensure that the conductive probe 400 can operate normally. At the same time, the design of wrapping and locking the conductive probe 400 can lock the conductive probe 400 in all directions, further reducing the probability of the conductive probe 400 shaking or tilting during operation, thereby improving the accuracy of subsequent detection.

[0032] Furthermore, it should be understood that although this specification describes embodiments, not every embodiment contains only one independent technical solution. This narrative style is merely for clarity. Those skilled in the art should consider the specification as a whole, and the technical solutions in each embodiment can also be appropriately combined to form other embodiments that can be understood by those skilled in the art.

Claims

1. A dual-needle tail probe holder, characterized in that, include: Mounting base (100); There are two connecting rods (200), which are hinged to one end of the mounting base (100), and one end of the connecting rod (200) is provided with a threaded hole (210). The locking mechanism (300) consists of two locking mechanisms (300), each including a locking spring (310) fixedly connected to one end of a connecting rod (200). One end of the locking spring (310) has an insertion hole (311), into which a screw (320) is inserted and threadedly connected to a threaded hole (210). The middle section of the locking spring (310) is laterally raised and forms a U-shaped positioning part (312).

2. The dual-needle tail probe holder according to claim 1, characterized in that: One end of the connecting rod (200) is provided with a groove (220) that communicates with the threaded hole (210). The locking spring (310) is disposed inside the groove (220). The height of the locking spring (310) is the same as the vertical cross-sectional height of the groove (220).

3. A dual-needle tail probe holder according to claim 1, characterized in that: The locking spring (310) has rounded corners, and the locking spring (310) is a beryllium copper material component.

4. A dual-needle tail probe holder according to claim 1, characterized in that: The locking spring (310) is fixedly connected to one end of the connecting rod (200) by laser welding process, and the locking spring (310) is in a compressed state at this time.

5. A dual-needle-tail probe, comprising a dual-needle-tail probe holder according to any one of claims 1-4 and a conductive probe (400) containing two needle tails and a needle shaft, characterized in that: The two needle tails and needle shafts are laser welded together to form a probe sharing a single needle tip. The needle tails are arranged in parallel and perpendicular to the plane of the needle shaft. The two needle shafts are on the same plane and have a certain angle, with the intersection point being the welding joint point.

6. A dual-needle tail probe according to claim 5, characterized in that: The main body of the conductive probe (400) is configured as a cross-sectional structure with an approximate ┌─┐ geometric feature. It has a tapered design in its longitudinal extension direction. Specifically, the cross-sectional area decreases from the proximal end to the distal end of the needle seat. The needle tip of the conductive probe (400) gradually shrinks along the probe axis direction, thereby forming a gradient conductive contact interface.

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