Loss testing device for resistance-capacitance network product

Abstract

The utility model discloses a loss testing device for resistance-capacitance network products, which relates to the technical field of testing equipment and comprises a base, a lifting mechanism, a probe platform, a product placing table and a plurality of probe devices. The lifting mechanism and the product placing table are fixedly arranged on the base; the lifting mechanism has a lifting end; the probe platform is fixedly arranged at the lifting end; the probe platform is provided with an avoiding groove penetrating up and down. The probes are fixed on the probe platform at intervals in the circumferential direction of the avoiding groove; one end, close to the avoiding groove, of each prober is provided with a test probe, each test probe is used for being in one-to-one correspondence with each front gold electrode of a test product, each test probe can be gathered into a positive wire through each cable, and each test probe can be communicated with each other through the positive wire; the upper surface of the product placing table is used for placing a test product; and a negative electrode wire connected with a back electrode of the tested product is arranged on the product placing table. The test is simple, the damage to the product is reduced, and the application range is wide.

Description

Technical Field

[0001] This utility model relates to the field of testing equipment technology, and in particular to a loss testing device for resistive-capacitive network products. Background Technology

[0002] A resistive-capacitive network (RC network) is a product that integrates capacitance and resistance. The front electrode of the RC network consists of a resistive film layer and a gold electrode layer. The resistive film layer is integrated between the gold electrodes, and the overall resistivity is higher than that of pure gold electrodes. Traditional fixtures for testing capacitance and loss have two test probes, which can only test a single front electrode and a back electrode of the RC network. The measured loss tangent value is composed of "product loss value + resistive film layer loss value", and the obtained loss value is higher than the actual product loss value.

[0003] Because the resistive film layer between the electrodes of the RC network affects the loss value of the product, the current process flow is as follows to eliminate the influence of the resistive film layer: the RC network is bonded to the test substrate with conductive adhesive, the front gold electrodes of the RC network are connected in series using gold wires with a bonding machine, the resistive film layer is short-circuited to eliminate the influence of the resistive film layer, and a single needle test stage is used to test any front electrode and back electrode at the same time, which can test the capacitance and loss tangent of the RC network.

[0004] However, the existing testing program has the following problems:

[0005] 1. Cumbersome process and product damage: The current testing process involves first bonding the resistive-capacitive network (RC network) to the test board using conductive adhesive, which requires 170°C and 4 hours to cure; then, gold wire bonding is used to connect the gold electrodes on the front of the RRC network in series. The product must be left to stand at room temperature for 12 hours before testing. This process is characterized by long testing cycles, cumbersome procedures, and high testing difficulty.

[0006] 2. Damaged product: Gold wires are bonded to gold electrodes on the front side of the resistive-capacitive network. The bonding process involves pressing the gold wires onto the electrode surface. After testing, removing the gold wires with external force will cause defects in the gold layer, resulting in product damage.

[0007] 3. Narrow scope of application: Products tested using the current testing process all have test marks and damage. Therefore, the current testing process is only suitable for testing the electrical performance of resistor-capacitor networks during the test process and cannot be used for product performance testing before shipment. Utility Model Content

[0008] The purpose of this invention is to provide a loss testing device for resistor-capacitor network products, so as to solve the problems existing in the prior art, simplify the test, reduce damage to the product, and have a wide range of applications.

[0009] To achieve the above objectives, this utility model provides the following solution:

[0010] This utility model provides a loss testing device for resistive-capacitive network products, including a base, a lifting mechanism, a probe platform, a product shelf, and multiple probes; the lifting mechanism and the product shelf are arranged opposite to each other and both are fixedly mounted on the base; the lifting mechanism has a lifting end capable of vertically lifting; the probe platform is fixedly mounted on the lifting end; the probe platform has a vertically penetrating clearance groove; each probe is circumferentially fixed on the probe platform around the clearance groove; each probe has a test probe at one end near the clearance groove, and each test probe is used to correspond one-to-one with each front gold electrode of the test product; each test probe can be converged into a positive line through various cables, and each test probe can be interconnected through the positive line; in the vertical projection, the product shelf corresponds to the clearance groove of the probe platform; the upper surface of the product shelf is used to place the test product; and the product shelf is provided with a negative line connected to the back electrode of the test product.

[0011] Preferably, in the vertical direction, the end of each test probe that is used to contact the front gold electrode of the test product is bent downwards.

[0012] Preferably, the probe includes a test probe, a probe holder, an upper probe holder, and a lower probe holder; the test probe is fixed to one end of the probe holder, and the other end of the probe holder is fixedly connected to the upper probe holder; the lower probe holder is fixedly disposed on the probe platform, and the upper probe holder is located above the lower probe holder; the upper and lower probe holders are provided with multiple sets of holes, and each set of holes, in conjunction with a corresponding fixing connector, can change and lock the relative position of the upper and lower probe holders.

[0013] Preferably, a heightening platform is fixedly disposed below the lifting mechanism; the heightening platform is fixedly disposed on the base; the lifting mechanism includes a support base, a longitudinal slide, a connecting rod, and a handle; the support base is fixedly disposed on the heightening platform, the longitudinal slide is slidably disposed on the support base in a vertical direction, and a horizontal plate is fixedly disposed at the upper end of the longitudinal slide, the horizontal plate being located above the upper end of the support base; the upper end of the connecting rod is fixedly connected to the longitudinal slide, and the lower end of the connecting rod is fixedly connected to the probe platform; a through hole is provided on the connecting rod, the handle is rotatably disposed in the through hole around a first axis, and both ends of the handle protrude from the through hole respectively; one end of the handle is rotatably disposed on the heightening platform around a second axis; both the first axis and the second axis are parallel to the horizontal direction.

[0014] Preferably, the horizontal plate has a through threaded hole, and an adjusting knob rod is threaded into the threaded hole. The lower end of the adjusting knob rod passes through the threaded hole and can abut against the bracket.

[0015] Preferably, the upper surface of the product placement platform has a recessed product placement plane for placing the test product; and the product placement plane is provided with an upwardly convex first positioning surface and a second positioning surface, which can abut against the corresponding side wall of the test product and restrict the movement of the test product in one direction.

[0016] Preferably, the product shelf includes a bottom support frame, an insulating block, and an electrode block; the lower end of the bottom support frame is fixedly mounted on the base, and the upper end of the bottom support frame has a first through-hole; the insulating block is fixedly mounted in the first mounting hole; the insulating block has a second mounting hole, and the electrode block is fixedly mounted in the second mounting hole; the upper surface of the electrode block has a product placement surface, a first positioning surface, and a second positioning surface; the negative electrode wire passes through the first mounting hole and is energized and fixedly connected to the electrode block.

[0017] Preferably, the end of the handle away from the riser is the grip end, the grip end is located above the product shelf, and the grip end is bent upwards away from the product shelf.

[0018] Preferably, the end of the handle near the raising platform is a rotating end, and a rotating seat is detachably fixed on the raising platform. The rotating end is rotatably mounted on the rotating seat around the second axis.

[0019] Preferably, a sliding seat is fixedly provided on the bracket base, and the longitudinal slide is slidably provided on the sliding seat in the vertical direction; a side plate is fixedly provided on one side of the sliding seat, and a through sliding elongated hole is provided on the side plate; a locking threaded hole is provided on the longitudinal slide, and a locking screw is internally threaded into the locking threaded hole, and a locking knob is fixedly provided at one end of the locking screw that passes through the sliding elongated hole.

[0020] The present invention achieves the following technical advantages over the prior art:

[0021] The loss testing device for RC network products provided by this utility model employs multiple interconnected probes, each with a test probe pressed against the gold electrodes on the front side of the test product, and then connected to form a single positive wire. The test product is placed on a product shelf, and the test probes are pressed against their corresponding gold electrodes. This method offers a short testing cycle, a simple process, and lower testing difficulty compared to existing methods. Furthermore, after testing, the test probes can be moved upwards, minimizing damage to the test product. This testing device can be used for product testing during the testing process or for performance testing of products before shipment, making it widely applicable. Attached Figure Description

[0022] To more clearly illustrate the technical solutions in the embodiments of this utility model or the prior art, the drawings used in the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this utility model. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0023] Figure 1 A schematic diagram of the overall structure of the loss testing device for resistor-capacitor network products provided by this utility model.

[0024] Figure 2 A schematic diagram of the probe in the loss testing device for RC network products provided by this utility model;

[0025] Figure 3 An exploded view of the probe in the loss testing device for RC network products provided by this utility model;

[0026] Figure 4 A partial structural schematic diagram of the lifting mechanism in the loss testing device for resistor-capacitor network products provided by this utility model.

[0027] Figure 5 A schematic diagram of the handle-related parts in the loss testing device for resistor-capacitor network products provided by this utility model;

[0028] Figure 6 This is a schematic diagram of the product placement platform in the loss testing device for resistor-capacitor network products provided by this utility model.

[0029] In the picture:

[0030] 10-Base; 11-Raising platform;

[0031] 20-Lifting mechanism; 21-Bracket base; 22-Sliding seat; 23-Longitudinal slide; 231-Horizontal plate; 24-Connecting rod; 25-Handle; 251-Rotating seat; 26-Adjusting knob rod; 27-Side plate; 28-Locking knob; 29-Connecting plate;

[0032] 30-Probe Platform;

[0033] 40 - Probe; 41 - Test probe; 42 - Probe holder; 43 - Upper probe mounting plate; 431 - First longitudinal elongated hole; 432 - First longitudinal elongated hole; 433 - Second longitudinal elongated hole; 434 - Second longitudinal elongated hole; 435 - Small hole; 44 - Lower probe mounting plate; 441 - First positioning pin; 442 - Second transverse elongated hole; 443 - Third longitudinal elongated hole; 444 - Second positioning pin; 445 - First through threaded hole; 45 - First eccentric screw; 46 - Second eccentric screw;

[0034] 50 - Product shelf; 51 - Bottom support frame; 52 - Insulating block; 53 - Electrode block; 54 - First positioning surface; 55 - Second positioning surface. Detailed Implementation

[0035] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the protection scope of the present utility model.

[0036] The purpose of this invention is to provide a loss testing device for resistor-capacitor network products, so as to solve the problems existing in the prior art, simplify the test, reduce damage to the product, and have a wide range of applications.

[0037] To make the above-mentioned objectives, features and advantages of this utility model more apparent and understandable, the utility model will be further described in detail below with reference to the accompanying drawings and specific embodiments.

[0038] Example 1

[0039] This embodiment provides a loss testing device for resistive-capacitive network products, such as... Figures 1-6As shown, the device includes a base 10, a lifting mechanism 20, a probe platform 30, a product shelf 50, and multiple probes 40. The lifting mechanism 20 and the product shelf 50 are arranged opposite to each other and are both fixedly mounted on the base 10. The lifting mechanism 20 has a lifting end capable of vertically raising and lowering. The probe platform 30 is fixedly mounted on the lifting end. The probe platform 30 has a through-hole groove. Each probe 40 is circumferentially fixed on the probe platform 30 around the through-hole. Each probe 40 has a test probe 41 at one end near the through-hole, and each test probe 41 is used to correspond one-to-one with each front gold electrode of the test product. 41 can be connected to a single positive line through various cables (the positive line can be further divided into two positive branches to connect to the corresponding equipment as needed), and each test probe 41 can be interconnected through the positive line; in the vertical projection, the product shelf 50 corresponds to the clearance slot of the probe platform 30 (the probe platform 30 is C-shaped, and the clearance slot is also C-shaped); the upper surface of the product shelf 50 is used to place the test product; and the product shelf 50 is provided with a negative line connected to the back electrode of the test product (there can be two negative lines, or a single bus connected to the back electrode of the test product, with two branches branching off at the other end of the bus).

[0040] By employing multiple interconnected probes 40, each with a test probe 41, to press-fit and connect with the gold electrodes on the front side of the test product, and then converging them into a single positive wire, the test product can be placed on the product shelf 50, and the test probes 41 can be pressed into contact with the corresponding gold electrodes on the front side. For testing, the cycle is short, the process is simple, and the testing difficulty is lower than that of existing testing methods. Moreover, after the test is completed, each test probe 41 can be moved upwards, which can reduce damage to the test product. This testing device can be used for product testing during the testing process, as well as for performance testing of products before shipment, and has a wide range of applications.

[0041] The following are the relevant settings for the lifting mechanism 20:

[0042] Among the optional solutions in this embodiment, the more preferred one is as follows: Figure 1 and Figure 4 and Figure 5As shown, a lifting platform 11 is fixedly installed below the lifting mechanism 20; the lifting platform 11 is fixedly installed on the base 10; the lifting mechanism 20 includes a support base 21, a longitudinal slide 23, a connecting rod 24, and a handle 25; the support base 21 is fixedly installed on the lifting platform 11, the longitudinal slide 23 is slidably installed on the support base 21 in the vertical direction, and a horizontal plate 231 is fixedly installed at the upper end of the longitudinal slide 23, the horizontal plate 231 is located above the upper end of the support base 21; the upper end of the connecting rod 24 is fixedly connected to the longitudinal slide 23 (the connecting rod 24 is fixedly connected to the longitudinal slide 23 through a connecting plate 29), and the lower end of the connecting rod 24 is fixedly connected to the probe platform 30; a through hole is opened on the connecting rod 24, the handle 25 rotates around the first axis and passes through the through hole, and both ends of the handle 25 respectively pass through the through hole; one end of the handle 25 rotates around the second axis and is installed on the lifting platform 11; both the first axis and the second axis are parallel to the horizontal direction. Through the coordinated design of the handle 25 and the connecting rod 24, and utilizing the lever principle, the operator can raise the probe platform 30 with the probe 40 by lifting the handle 25, thereby facilitating the placement and removal of the test product on the product placement platform.

[0043] Specifically, the lower end of the connecting rod 24 is provided with a connecting block and a fixed connecting hole. The probe platform 30 is provided with a connecting groove and a fixed connecting hole at the corresponding position. The connecting block is located in the connecting groove, and a fixed standard part, such as a bolt, is inserted into the corresponding fixed connecting hole. The connection is a conventional connection method, which will not be described in detail here.

[0044] Among the optional solutions in this embodiment, the more preferred one is as follows: Figure 1 and Figure 4 As shown, a through threaded hole is provided on the horizontal plate 231, and an adjustment knob 26 is threaded into the threaded hole. The lower end of the adjustment knob 26 passes through the threaded hole and abuts against the support base 21. By rotating the adjustment knob 26, the distance between the horizontal plate 231 and the support base 21 can be precisely adjusted. Since the horizontal plate 231 is connected to the longitudinal slide 23, the height of the probe platform 30 can be precisely controlled. When performing loss testing on RC network products, the electrode heights of different products may have slight differences. This precise adjustment function ensures that the test probe 41 maintains optimal contact with the gold electrode on the front of the product, improving the accuracy and reliability of the test data.

[0045] Specifically, the height of the probe platform 30 can be adjusted by adjusting the knob 26 to meet the testing needs of products with different thicknesses.

[0046] Among the optional solutions in this embodiment, the more preferred one is as follows: Figure 1 and Figure 4As shown, a sliding seat 22 is fixedly mounted on the support base 21, and a longitudinal slide 23 is slidably mounted on the sliding seat 22 in the vertical direction. A side plate 27 is fixedly mounted on one side of the sliding seat 22, and a through sliding elongated hole is opened on the side plate 27. A locking threaded hole is opened on the longitudinal slide 23, and a locking screw is threaded into the locking threaded hole. A locking knob 28 is fixedly mounted on one end of the locking screw that passes through the sliding elongated hole. The locking screw is threadedly connected to the locking threaded hole on the longitudinal slide 23 and passes through the sliding elongated hole on the side plate 27. A locking knob 28 is fixedly mounted on one end. When the longitudinal slide 23 is adjusted to a suitable position, the locking knob 28 is tightened, and the locking screw will firmly fix the longitudinal slide 23 on the sliding seat 22, preventing the longitudinal slide 23 from sliding due to external interference or other factors during the test. This ensures the stability of the probe platform 30 position during the test and helps to obtain stable and accurate test data.

[0047] Among the optional solutions in this embodiment, the more preferred one is as follows: Figure 1 and Figure 5 As shown, the end of the handle 25 furthest from the riser platform 11 is the grip end, which is located above the product shelf 50 and bends upwards away from the product shelf 50. This grip end, positioned above the product shelf 50 and bent away from it, provides sufficient operating space for the operator. During testing, the operator can easily operate above the product shelf 50 without being hindered by the product or other components. It also prevents accidental contact with the test product on the product shelf 50 while operating the handle 25, ensuring both convenience and safety of operation.

[0048] Among the optional solutions in this embodiment, the more preferred one is as follows: Figure 1 and Figure 5 As shown, the end of the handle 25 near the riser platform 11 is the rotating end. A rotating seat 251 is detachably fixed on the riser platform 11, and the rotating end is rotatably mounted on the rotating seat 251 around the second axis. The rotating seat 251 provides a stable support point for the rotating end of the handle 25, making the handle 25 more stable and reliable when rotating around the second axis. This stable structure ensures that there will be no shaking or deviation during the process of adjusting the height of the probe platform 30 by operating the handle 25, ensuring that the test probe 41 can accurately align with the gold electrode of the RC network product, thereby improving the accuracy and reliability of the test.

[0049] The following are the settings instructions for probe platform 30 and prober 40:

[0050] Among the optional solutions in this embodiment, the more preferred one is as follows: Figures 1-3As shown, the prober 40 includes a test probe 41, a probe holder 42, an upper probe holder 43, and a lower probe holder 44. The test probe 41 is fixed to one end of the probe holder 42, and the other end of the probe holder 42 is fixedly connected to the upper probe holder 43. The lower probe holder 44 is fixedly mounted on the probe platform 30, and the upper probe holder 43 is located above the lower probe holder 44. Multiple sets of holes are provided on the upper probe holder 43 and the lower probe holder 44. Each set of holes, in conjunction with a corresponding fixing connector, can change and lock the relative position of the upper probe holder 43 and the lower probe holder 44. By using a combination of holes and fixed connectors to change and lock the relative positions of the upper fixing plate 43 and the lower fixing plate 44 of the probe, the position of the test probe 41 can be precisely adjusted. Since the electrode positions of RC network products may vary, this design allows the test probe 41 to be accurately aligned with the test point of the product, ensuring the accuracy and reliability of the test data and reducing test errors caused by probe position deviation. Different models and specifications of RC network products may have different electrode spacing, layout, etc. This setting can flexibly adjust the position of the probe according to the characteristics of the specific product, so that the test device can adapt to the testing needs of various products, improving the versatility and applicability of the test device, and eliminating the need to customize a test device for each product.

[0051] Specifically, the relevant settings for the hole group are as follows:

[0052] The probe mounting plate 43 is provided with the following sequentially formed features: a first longitudinal elongated oval hole 431 (where longitudinal refers to the direction consistent with the length of the probe mounting plate 43, and the same applies to other locations), a first longitudinal elongated oval hole 432, a second longitudinal elongated oval hole 433, a second positioning longitudinal elongated oval hole 434, and a first transverse elongated oval hole (where transverse refers to the direction consistent with the width of the probe mounting plate 43, and the same applies to other locations); (specifically, the first transverse elongated oval hole on the probe mounting plate 43 can form a through-hole structure through a small hole 435 above it, or it can form a vertical through-hole structure at this location).

[0053] The probe lower fixing plate 44 is sequentially provided with a first positioning pin 441, a second transverse elongated hole 442, a third longitudinal elongated hole 443, a second positioning pin 444, and a first through threaded hole 445.

[0054] The first positioning pin 441 is fixedly connected to the probe lower fixing plate 44, and the first positioning pin 441 is located in the first positioning longitudinal elongated hole 431;

[0055] The first longitudinal elongated hole 432 corresponds to the second transverse elongated hole 442, and a position locking bolt is inserted inside. The lower end of the position locking bolt is used to connect with a threaded hole on the probe platform 30, and the lower edge of the upper end of the position locking bolt presses on the first longitudinal elongated hole 432.

[0056] The second longitudinal elongated hole 433 corresponds to the third longitudinal elongated hole 443, and a first eccentric screw 45 is inserted in the third longitudinal elongated hole 443. The lower end of the first eccentric screw 45 is used to connect with a threaded hole on the probe platform 30, and the upper end of the first eccentric screw 45 is lower than the position of the second longitudinal elongated hole 433.

[0057] The second positioning pin 444 is fixedly connected to the probe lower fixing plate 44, and the second positioning pin 444 is located in the second positioning longitudinal elongated hole 434;

[0058] The first transverse elongated hole corresponds to the first through threaded hole 445, and a second eccentric screw 46 is inserted inside it. The upper end of the second eccentric screw 46 is located inside the first transverse elongated hole; the lower end of the second eccentric screw 46 is threadedly connected to a light hole on the probe platform 30 after the first through threaded hole 445.

[0059] The above hole groups work together to achieve three functions:

[0060] First, the upper fixing plate 43 of the probe moves relative to the lower fixing plate 44 of the probe along its length direction: rotating the second eccentric screw 46, due to the cooperation between the second eccentric screw 46 and the first transverse elongated hole and the first through threaded hole 445, the upper end of the second eccentric screw 46 presses against the inner wall of the first transverse elongated hole, and is also achieved based on the restriction of the first positioning pin 441 and the first positioning longitudinal elongated hole 431, and the second positioning pin 444 and the second positioning longitudinal elongated hole 434; at this time, the position locking bolt is not installed;

[0061] Second, the upper fixing plate 43 and the lower fixing plate 44 of the probe swing around the axis of the second eccentric screw 46: the first eccentric screw 45 is rotated, and the upper end of the first eccentric screw 45 presses against the inner wall of the third longitudinal elongated hole 443, which is achieved based on the cooperation between the lower end of the first eccentric screw 45 and the optical hole of the probe platform 30; at this time, the position locking bolt is not installed.

[0062] Third, the position of the upper probe fixing plate 43 and the lower probe fixing plate 44 relative to the probe platform 30 is fixed: the position locking bolts are inserted into the first longitudinal elongated hole 432 and the second transverse elongated hole 442 and locked.

[0063] Among the optional solutions in this embodiment, the more preferred one is as follows: Figures 1-3As shown, in the vertical direction, the end of each test probe 41 that contacts the gold electrode on the front side of the test product is bent downwards. This downward bending design makes the contact between the test probe 41 and the gold electrode on the front side of the RC network product more stable. During testing, it can better adapt to minor unevenness on the product surface, maintain a tight fit with the gold electrode, reduce poor contact caused by vibration, displacement, and other factors, ensure the stability of test signal transmission, and thus improve the accuracy and reliability of test data.

[0064] The following are the settings instructions for the product shelf 50:

[0065] Among the optional solutions in this embodiment, the more preferred one is as follows: Figure 1 and Figure 6 As shown, the upper surface of the product placement platform 50 has a recessed product placement plane for placing the test product. The product placement plane also has an upwardly protruding first positioning surface 54 and a second positioning surface 55. These surfaces can abut against the corresponding sidewalls of the test product and restrict its movement in one direction. The abutment between the first positioning surface 54 and the second positioning surface 55 on the product placement plane precisely defines the position of the test product in one direction, thus determining its location.

[0066] Among the optional solutions in this embodiment, the more preferred one is as follows: Figure 1 and Figure 6 As shown, the product shelf 50 includes a bottom support frame 51, an insulating block 52, and an electrode block 53. The lower end of the bottom support frame 51 is fixedly mounted on the base 10, and the upper end of the bottom support frame 51 has a first mounting hole that runs vertically through it. The insulating block 52 is fixedly mounted in the first mounting hole. The insulating block 52 has a second mounting hole, and the electrode block 53 is fixedly mounted in the second mounting hole. The upper surface of the electrode block 53 is provided with a product placement surface, a first positioning surface 54, and a second positioning surface 55. The negative electrode wire passes through the first mounting hole and is energized and fixedly connected to the electrode block 53. The product shelf 50 adopts a modular design, consisting of components such as a bottom support frame 51, an insulating block 52, and an electrode block 53. The components are fixedly connected through mounting holes. This structure facilitates assembly and debugging during production, improving production efficiency. In later maintenance, if a component is damaged or malfunctions, it can be easily disassembled and replaced, reducing maintenance costs and difficulty, and improving the maintainability of the testing device. The insulating block 52 isolates the electrode block 53 from potentially charged components such as the bottom support frame 51, ensuring safety.

[0067] Specifically, the first positioning surface 54 and the second positioning surface 55 can form a right-angle structure, thereby limiting one corner of the test product. Specifically, only one right-angle limit is set on the electrode block 53, so that test products of different sizes can be placed on the product placement plane.

[0068] Specifically, electrode block 53 has a gold-plated surface and a threaded hole at the bottom for securing the test cable (negative wire).

[0069] Regarding other related settings:

[0070] Specifically, the base 10 is a flat plate structure.

[0071] Specifically, the riser platform 11 is equipped with SAM connectors for the wire harness to pass through.

[0072] This utility model uses specific examples to illustrate its principles and implementation methods. The above description of the embodiments is only for the purpose of helping to understand the method and core idea of ​​this utility model. At the same time, for those skilled in the art, there will be changes in the specific implementation methods and application scope based on the idea of ​​this utility model. In summary, the content of this specification should not be construed as a limitation of this utility model.

Claims

1. A loss testing device for a blocking capacitor network product, characterized by: The probe device comprises a base, a lifting mechanism, a probe platform, a product resting table and a plurality of probes. The lifting mechanism and the product resting table are oppositely arranged and fixed on the base, and the lifting mechanism has a lifting end capable of lifting in the vertical direction. The probe platform is fixed on the lifting end, and the probe platform has an avoiding slot penetrating from top to bottom. Each probe is fixed on the probe platform in a circumferential interval around the avoiding slot, and each probe has a test probe at one end close to the avoiding slot.

2. The device for loss testing of a product of a capacitance-resistance network according to claim 1, characterized in that: Each test probe is used to correspond to each front gold electrode of a test product, and each test probe can be gathered into a positive electrode wire through a cable.

3. The device for loss testing of a capacitor network product according to claim 1, wherein: In the vertical direction, the product resting table corresponds to the avoiding slot of the probe platform in position. Each test probe is used to contact the front gold electrode of the test product in the vertical direction. The probe device comprises the test probe, a probe fixing member, a probe upper fixing plate and a probe lower fixing plate.

4. The device for loss testing of a capacitor network product according to claim 1, wherein: The test probe is fixed at one end of the probe fixing member, and the other end of the probe fixing member is fixedly connected with the probe upper fixing plate. The probe lower fixing plate is fixed on the probe platform, and the probe upper fixing plate is above the probe lower fixing plate. The probe upper fixing plate and the probe lower fixing plate are provided with a plurality of hole groups, and each hole group can change and lock the relative position of the probe upper fixing plate and the probe lower fixing plate through a corresponding fixed connecting member.

5. The device for loss testing of a product of a capacitance-resistance network according to claim 4, characterized in that: A height increasing table is fixed below the lifting mechanism.

6. The device for loss testing of a capacitor network product of claim 1, wherein: The height increasing table is fixed on the base. The lifting mechanism comprises a bracket seat, a longitudinal sliding table, a connecting rod and a handle. The bracket seat is fixed on the height increasing table, the longitudinal sliding table is vertically slidably arranged on the bracket seat, and the upper end of the longitudinal sliding table is fixed with a horizontal plate above the upper end of the bracket seat. The upper end of the connecting rod is fixedly connected with the longitudinal sliding table, and the lower end of the connecting rod is fixedly connected with the probe platform. The connecting rod is provided with a through hole, the handle is rotatably arranged in the through hole around a first axis, and the two ends of the handle respectively pass through the through hole. One end of the handle is rotatably arranged on the height increasing table around a second axis. The first axis and the second axis are parallel to the horizontal direction. The horizontal plate is provided with a threaded hole penetrating therethrough, and an adjusting knob rod is threadedly connected in the threaded hole. The lower end of the adjusting knob rod passes through the threaded hole and can abut against the bracket seat. The upper surface of the product resting table has a sunken product placing plane for placing the test product. The product placing plane is provided with a first positioning surface and a second positioning surface protruding upward, and the first positioning surface and the second positioning surface can abut against the corresponding side wall of the test product and limit the movement of the test product in one direction.

7. The device for loss testing of a product of a capacitance-resistance network according to claim 6, characterized in that: The product resting table comprises a bottom support frame, an insulating block and an electrode block; The lower end of the bottom support frame is fixedly arranged on the base, and the upper end of the bottom support frame is provided with a first mounting hole penetrating upward and downward; the insulating block is fixedly arranged in the first mounting hole; the insulating block is provided with a second mounting hole, and the electrode block is fixedly arranged in the second mounting hole; the upper surface of the electrode block is provided with the product placing surface, the first positioning surface and the second positioning surface; The negative electrode wire is in electrically connected and fixed connection with the electrode block through the first mounting hole.

8. The device for loss testing of a capacitance network product according to claim 4, wherein: The end of the handle away from the heightening table is a holding end, the holding end is located above the product resting table, and the holding end is bent away from the upper position of the product resting table.

9. The device for loss testing of a capacitance network product according to claim 4, wherein: The end of the handle close to the heightening table is a rotating end, the heightening table is detachably and fixedly provided with a rotating seat, and the rotating end is rotatably arranged on the rotating seat around the second axis.

10. The device for loss testing of a capacitance network product according to claim 4, wherein: The bracket seat is fixedly provided with a sliding seat, and the longitudinal sliding table is slidably arranged on the sliding seat in the vertical direction; One side of the sliding seat is fixedly provided with a side plate, the side plate is provided with a sliding long hole penetrating through, the longitudinal sliding table is provided with a locking screw hole, a locking screw is threadedly connected in the locking screw hole, and one end of the locking screw penetrating through the sliding long hole is fixedly provided with a locking knob.

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